SI3446DVL99Z [FAIRCHILD]

Small Signal Field-Effect Transistor, 6.2A I(D), 20V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SUPERSOT-6;
SI3446DVL99Z
型号: SI3446DVL99Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Small Signal Field-Effect Transistor, 6.2A I(D), 20V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SUPERSOT-6

开关 光电二极管 晶体管
文件: 总5页 (文件大小:93K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2001  
SI3446DV  
Ò
Single N-Channel, 2.5V Specified PowerTrench MOSFET  
General Description  
Features  
This N-Channel 2.5V specified MOSFET is produced  
using Fairchild Semiconductor's advanced  
PowerTrench process that has been especially tailored  
to minimize on-state resistance and yet maintain low  
gate charge for superior switching performance.  
6.2 A, 20 V. RDS(on) = 0.024 @ VGS = 4.5 V  
RDS(on) = 0.032 @ VGS = 2.5 V  
Fast switching speed.  
These devices have been designed to offer exceptional  
power dissipation in a very small footprint compared  
with bigger SO-8 and TSSOP-8 packages.  
Low gate charge (10.5nC typical).  
High performance trench technology for extremely  
low RDS(ON)  
.
Applications  
SuperSOTTM-6 package: small footprint (72% smaller  
than standard SO-8); low profile (1mm thick).  
DC/DC converter  
Load switch  
Battery Protection  
S
1
6
5
4
D
D
2
3
G
D
SuperSOT TM-6  
D
Absolute Maximum Ratings TA = 25°C unless otherwise noted  
Symbol  
Parameter  
SI3446DV  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
20  
V
V
12  
±
Drain Current - Continuous  
Drain Current - Pulsed  
6.2  
20  
A
(Note 1a)  
PD  
Power Dissipation for Single Operation  
1.6  
W
(Note 1a)  
(Note 1b)  
0.8  
TJ, Tstg  
Operating and Storage Junction Temperature Range  
-55 to +150  
C
°
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
78  
30  
Rθ  
(Note 1a)  
(Note 1)  
C/W  
C/W  
°
JA  
Thermal Resistance, Junction-to-Case  
Rθ  
°
JC  
Package Outlines and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape Width  
Quantity  
.637  
FDC637AN  
7’’  
8mm  
3000 units  
2001 Fairchild Semiconductor Corporation  
SI3446DV Rev. A1  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
BVDSS  
Drain-Source Breakdown Voltage  
20  
V
VGS = 0 V, I = 250  
A
µ
D
Breakdown Voltage Temperature  
Coefficient  
14  
I = 250 A, Referenced to 25 C  
mV/ C  
°
µ
°
D
T
J
IDSS  
IGSSF  
IGSSR  
Zero Gate Voltage Drain Current  
VDS = 16 V, VGS = 0 V  
GS = 12 V, VDS = 0 V  
1
A
µ
Gate-Body Leakage Current, Forward  
V
100  
-100  
nA  
nA  
Gate-Body Leakage Current, Reverse VGS = -12 V, VDS = 0 V  
On Characteristics (Note 2)  
VGS(th)  
Gate Threshold Voltage  
0.4  
10  
0.82  
-3  
1.5  
V
VDS = VGS, I = 250  
A
µ
D
Gate Threshold Voltage  
Temperature Coefficient  
V
I =250 A,Referenced to 125 C  
mV/ C  
µ
°
°
GS(th)  
D
T
J
RDS(on)  
Static Drain-Source  
On-Resistance  
VGS = 4.5 V,ID = 6.2 A  
0.019 0.024  
0.028 0.041  
0.025 0.032  
VGS = 4.5 V,I = 6.2 A,T =125 C  
°
D
J
VGS = 2.5 V, ID = 5.2 A  
ID(on)  
gFS  
On-State Drain Current  
VGS = 4.5 V, VDS = 5 V  
A
S
Forward Transconductance  
VDS = 5 V, ID = 6.2 A  
7.4  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
V
DS = 10 V, VGS = 0 V,  
1125  
290  
pF  
pF  
pF  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
145  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
V
V
DD = 10 V, ID = 1 A,  
GS = 4.5 V, RGEN = 6  
9
13  
18  
24  
42  
20  
16  
ns  
ns  
26  
ns  
11  
ns  
Qg  
Qgs  
Qgd  
V
V
DS = 5 V, ID = 6.2 A,  
GS = 4.5 V  
10.5  
1.5  
2.2  
nC  
nC  
nC  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
1.3  
1.2  
A
V
VSD  
Drain-Source Diode Forward Voltage VGS = 0 V, IS = 1.3 A  
0.7  
(Note 2)  
Notes:  
1.  
RθJA is the sum of the junction-to-case and case-to-ambient resistance where the case thermal reference is defined as the solder mounting surface  
of the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) 78° C/W when mounted on a 1.0 in2 pad of 2 oz. copper.  
b) 156° C/W when mounted on a minimum pad of 2 oz.copper.  
2. Pulse Test: Pulse Width 300 µs, Duty Cycle 2.0%  
SI3446DV Rev. A1  
Typical Characteristics  
20  
2.5  
2
VGS= 4.5V  
2.5V  
3.0V  
16  
12  
8
2.0V  
VGS= 2.0V  
1.5  
1
2.5V  
3.0V  
4.5V  
15  
4
1.5V  
0.5  
0
0
5
10  
ID, DRAIN CURRENT (A)  
20  
0
0.4  
0.8  
1.2  
1.6  
2
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation  
with Drain Current and Gate Voltage.  
0.08  
0.06  
0.04  
0.02  
0
1.5  
1.4  
1.3  
1.2  
1.1  
1
ID= 6.2A  
ID= 6.2A  
VGS= 4.5V  
TJ= 125oC  
25oC  
0.9  
0.8  
0.7  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
1
2
3
4
5
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation  
with Temperature.  
Figure 4. On-Resistance Variation  
with Gate-to-Source Voltage.  
100  
10  
1
20  
15  
10  
5
TJ= -55oC  
25oC  
VGS = 0  
VDS= 5V  
125oC  
TJ= 125oC  
25oC  
0.1  
-55oC  
0.01  
0.001  
0.0001  
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
0.5  
1
1.5  
2
2.5  
VSD, BODY DIODE VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature.  
SI3446DV Rev. A1  
Typical Characteristics (continued)  
1800  
1500  
1200  
900  
600  
300  
0
5
VDS = 5V  
f = 1MHz  
VGS = 0V  
ID = 6.2A  
10V  
15V  
4
3
2
1
0
Ciss  
Coss  
Crss  
0
2
4
6
8
10  
12  
14  
0
5
10  
15  
20  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate-Charge Characteristics  
Figure 8. Capacitance Characteristics  
5
4
3
2
1
0
100  
10  
SINGLE PULSE  
R
θJA = 156oC/W  
TA = 25oC  
100  
s
µ
RDS(ON) LIMIT  
1ms  
10ms  
100ms  
1s  
1
DC  
VGS= 4.5V  
SINGLE PULSE  
RθJA= 156oC/W  
TA= 25oC  
0.1  
0.01  
0.1  
1
10  
100  
0.1  
1
10  
100  
1000  
VDS, DRAIN-SOURCE VOLTAGE (V)  
SINGLE PULSE TIME (SEC)  
Figure 9. Maximum Safe Operating Area  
Figure 10. Single Pulse Maximum  
Power Dissipation  
1
D = 0.5  
0.5  
R
(t) = r(t) * R  
θ
θJA  
R
JA  
= 156°C/W  
θJA  
0.2  
0.2  
0.1  
0.1  
P(pk)  
0.05  
0.05  
t
1
t
2
0.02  
T
- T = P * R  
(t)  
θJA  
J
A
0.02  
0.01  
Duty Cycle, D = t / t  
1
2
Single Pulse  
0.01  
0.005  
0.00001  
0.0001  
0.001  
0.01  
0.1  
, TIME (sec)  
1
10  
100  
300  
t
1
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient themal response will change depending on the circuit board design.  
SI3446DV Rev. A1  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Star* Power™  
Stealth™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H1  

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