SI3447 [FAIRCHILD]

P-Channel 1.8V Specified PowerTrench MOSFET; P沟道1.8V指定的PowerTrench MOSFET
SI3447
型号: SI3447
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

P-Channel 1.8V Specified PowerTrench MOSFET
P沟道1.8V指定的PowerTrench MOSFET

文件: 总5页 (文件大小:91K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2001  
Si3447DV  
P-Channel 1.8V Specified PowerTrench MOSFET  
General Description  
Features  
This P-Channel 1.8V specified MOSFET uses  
Fairchild’s low voltage PowerTrench process. It has  
been optimized for battery power management  
applications.  
–5.5 A, –20 V. RDS(ON) = 33 m@ VGS = –4.5 V  
RDS(ON) = 43 m@ VGS = –2.5 V  
DS(ON) = 60 m@ VGS = –1.8 V  
R
Fast switching speed.  
Applications  
High performance trench technology for extremely  
Battery management  
Load switch  
low RDS(ON)  
Battery protection  
S
D
D
1
2
3
6
5
4
G
D
SuperSOT TM-6  
D
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
V
–20  
VGSS  
ID  
Gate-Source Voltage  
Drain Current – Continuous  
– Pulsed  
V
A
±8  
–5.5  
(Note 1a)  
–20  
PD  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
1.6  
W
0.8  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +150  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
78  
30  
RθJA  
°C/W  
°C/W  
RθJC  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
.447  
Si3447DV  
7’’  
8mm  
3000 units  
Si3447DV Rev A (W)  
2001 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
–20  
V
V
GS = 0 V, ID = –250 µA  
Breakdown Voltage Temperature  
Coefficient  
–12  
BVDSS  
TJ  
ID = –250 µA,Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = –16 V, VGS = 0 V  
–1  
µA  
nA  
nA  
IGSSF  
IGSSR  
VGS = 8 V,  
VGS = –8 V  
VDS = 0 V  
VDS = 0 V  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
–0.4  
–20  
–0.7  
3
–1.5  
V
V
DS = VGS, ID = –250 µA  
Gate Threshold Voltage  
Temperature Coefficient  
VGS(th)  
TJ  
ID = –250 µA,Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = –4.5 V, ID = –5.5 A  
V
VGS = –1.8 V, ID = –4.0 A  
24  
30  
42  
33  
43  
60  
mΩ  
GS = –2.5 V, ID = –4.8 A  
ID(on)  
gFS  
On–State Drain Current  
VGS = –4.5 V,  
VDS = –5 V,  
VDS = –5 V  
ID = –3.5 A  
A
S
Forward Transconductance  
23  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
1926  
530  
pF  
pF  
pF  
VDS = –10 V,  
f = 1.0 MHz  
V GS = 0 V,  
Output Capacitance  
Reverse Transfer Capacitance  
185  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
13  
11  
90  
45  
19  
4
23  
20  
ns  
ns  
VDD = –10 V,  
VGS = –4.5 V,  
ID = –1 A,  
RGEN = 6 Ω  
144  
72  
ns  
ns  
Qg  
Qgs  
Qgd  
30  
nC  
nC  
nC  
VDS = –10 V,  
ID = –3.5 A,  
V
GS = –4.5 V  
7.5  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
–1.3  
–1.2  
A
V
VSD  
Drain–Source Diode Forward  
Voltage  
VGS = 0 V, IS = –1.3 A (Note 2)  
–0.7  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient resistance where the case thermal reference is defined as the solder mounting surface of the drain  
pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a. 78°C/W when mounted on a 1in2 pad of 2oz copper on FR-4 board.  
b. 156°C/W when mounted on a minimum pad.  
2. Pulse Test: Pulse Width 300 µs, Duty Cycle 2.0%  
Si3447DV Rev A(W)  
Typical Characteristics  
20  
3
2.5  
2
VGS = -1.5V  
VGS = -4.5V  
-2.0V  
-2.5V  
15  
-1.8V  
-1.8V  
10  
5
-2.0V  
1.5  
1
-2.5V  
-1.5V  
-4.5V  
15  
0.5  
0
0
5
10  
-ID, DRAIN CURRENT (A)  
20  
0
1
2
3
-VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.12  
0.09  
0.06  
0.03  
0
1.5  
ID = -2.8 A  
ID = -5.5A  
GS = -4.5V  
1.4  
1.3  
1.2  
1.1  
1
V
TA = 125oC  
0.9  
0.8  
0.7  
TA = 25oC  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
1
2
3
4
5
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation  
withTemperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
10  
20  
15  
10  
5
VGS = 0V  
TA = -55oC  
25oC  
VDS = -5V  
1
TA = 125oC  
125oC  
0.1  
25oC  
-55oC  
0.01  
0.001  
0.0001  
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
0
0.5  
1
1.5  
2
2.5  
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
Si3447DV Rev A(W)  
Typical Characteristics  
5
3500  
3000  
2500  
2000  
1500  
1000  
500  
VDS = -5V  
ID = -5.5A  
f = 1MHz  
GS = 0 V  
-10V  
V
4
3
2
1
0
-15V  
CISS  
COSS  
CRSS  
0
0
5
10  
15  
20  
0
5
10  
15  
20  
25  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
5
4
3
2
1
0
100  
10  
SINGLE PULSE  
RθJA = 156oC/W  
TA = 25oC  
RDS(ON) LIMIT  
µ
100  
s
1ms  
10ms  
100ms  
1
1s  
DC  
VGS = -4.5V  
0.1  
0.01  
SINGLE PULSE  
RθJA = 156oC/W  
TA = 25oC  
0.1  
1
10  
100  
0.1  
1
10  
100  
-VDS, DRAIN-SOURCE VOLTAGE (V)  
SINGLE PULSE TIME (SEC)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D
=
0 .5  
0 .2  
R θ J A (t)  
R θ J A  
=
r(t)  
+ R θ J A  
=
15 6 °C /W  
0 .1  
P (pk)  
0.1  
0 .05  
t1  
T A  
T J  
-
P
*
R θ J A (t)  
t1 t2  
t2  
0.0 1  
D u ty C y,  
D
=
/
0 .0 2  
0 .0 1  
S IN G LE P U LS E  
0.00 1  
0 .000 1  
0.001  
0.01  
0.1  
1
1 0  
100  
10 00  
t
1 , T IM E (se c)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
Si3447DV Rev A(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Star* Power™  
Stealth™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H1  

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