SI6415DQ [FAIRCHILD]

30V P-Channel PowerTrench MOSFET; 30V P沟道PowerTrench MOSFET
SI6415DQ
型号: SI6415DQ
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

30V P-Channel PowerTrench MOSFET
30V P沟道PowerTrench MOSFET

晶体 小信号场效应晶体管 开关 光电二极管
文件: 总5页 (文件大小:110K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
September 2001  
Si6415DQ  
30V P-Channel PowerTrench MOSFET  
General Description  
Features  
This P-Channel MOSFET is a rugged gate version of  
Fairchild Semiconductor’s advanced PowerTrench  
process. It has been optimized for power management  
applications requiring a wide range of gave drive  
voltage ratings (–4.5V – 20V).  
–6.5 A, –30 V RDS(ON) = 19 m@ VGS = –10 V  
DS(ON) = 30 m@ VGS = –4.5 V  
R
Extended VGSS range (±20V) for battery applications  
High performance trench technology for extremely  
Applications  
low RDS(ON)  
Battery protection  
DC/DC conversion  
Power management  
Load switch  
Low profile TSSOP-8 package  
D
S
5
6
7
8
4
3
2
1
S
D
G
S
S
D
TSSOP-8  
Pin 1  
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
–30  
V
V
A
VGSS  
Gate-Source Voltage  
± 20  
ID  
Drain Current – Continuous  
(Note 1)  
–6.5  
– Pulsed  
–30  
1.3  
PD  
Power Dissipation  
(Note 1a)  
(Note 1b)  
W
0.6  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +150  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
(Note 1a)  
(Note 1b)  
87  
RθJA  
°C/W  
114  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
6415  
Si6415DQ  
13’’  
16mm  
3000 units  
Si6415DQ Rev B(W)  
2001 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
–30  
V
VGS = 0 V,  
ID = –250 µA  
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
–21  
ID = –250 µA, Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = –24 V, VGS = 0 V  
–1  
µA  
nA  
nA  
IGSSF  
IGSSR  
VGS = 20 V,  
VDS = 0 V  
100  
VGS = –20 V, VDS = 0 V  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
–1  
–1.7  
5
–3  
V
VDS = VGS  
,
ID = –250 µA  
VGS(th)  
TJ  
Gate Threshold Voltage  
Temperature Coefficient  
ID = –250 µA, Referenced to 25°C  
mV/°C  
mΩ  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = –10 V, ID = –6.5 A  
VGS = –4.5 V, ID = –5.2 A  
VGS=–10 V, ID =–6.5A, TJ=125°C  
15  
21  
19  
19  
30  
30  
ID(on)  
gFS  
On–State Drain Current  
VGS = –10 V, VDS = –5 V  
VDS = –10 V, ID = –6.5 A  
–20  
A
S
Forward Transconductance  
24  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
1604  
408  
pF  
pF  
pF  
VDS = –15 V, V GS = 0 V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
202  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
13  
13.5  
42  
25  
17  
5
30  
30  
ns  
ns  
VDD = –15 V, ID = –1 A,  
VGS = –10 V, RGEN = 6 Ω  
110  
60  
ns  
ns  
Qg  
Qgs  
Qgd  
70  
nC  
nC  
nC  
VDS = –15 V, ID = –6.5 A,  
V
GS = –10 V  
6
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
–1.1  
–1.2  
A
V
Drain–Source Diode Forward  
VSD  
VGS = 0 V, IS = –1.1 A (Note 2)  
–0.7  
Voltage  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) RθJA is 87 °C/W (steady state) when mounted on a 1 inch² copper pad on FR-4.  
b) RθJA is 114 °C/W (steady state) when mounted on a minimum copper pad on FR-4.  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
Si6415DQ Rev B(W)  
Typical Characteristics  
2
1.8  
1.6  
1.4  
1.2  
1
50  
VGS = -10V  
-6.0V  
-4.5V  
VGS=-4.0V  
-4.0V  
40  
30  
20  
10  
0
-4.5V  
-3.5V  
-5.0V  
-6.0V  
-7.0V  
-3.0V  
-8.0V  
40  
-10V  
0.8  
0
1
2
3
0
10  
20  
30  
50  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
-ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
1.6  
1.4  
1.2  
1
0.07  
ID = -6.4A  
VGS = -10V  
ID = -3.2A  
0.06  
0.05  
0.04  
TA = 125oC  
0.03  
0.02  
TA = 25oC  
0.8  
0.6  
0.01  
0.00  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
40  
VGS =0V  
VDS = -5V  
TA = -55oC  
25oC  
125oC  
10  
TA = 125oC  
30  
20  
10  
0
1
25oC  
0.1  
-55oC  
0.01  
0.001  
0.0001  
1.5  
2
2.5  
3
3.5  
4
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
-VGS, GATE TO SOURCE VOLTAGE (V)  
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
Si6415DQ Rev B(W)  
Typical Characteristics  
10  
2500  
2000  
1500  
1000  
500  
f = 1 MHz  
VGS = 0 V  
ID = -6.4A  
VDS = -5V  
-10V  
8
6
4
2
0
-15V  
CISS  
COSS  
CRSS  
0
0
6
12  
18  
24  
30  
0
5
10  
15  
20  
25  
30  
Qg, GATE CHARGE (nC)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
10  
50  
40  
30  
20  
10  
0
100us  
SINGLE PULSE  
RθJA = 114°C/W  
RDS(ON) LIMIT  
1ms  
T
A = 25°C  
10ms  
100ms  
1s  
10s  
DC  
1
VGS = -10V  
SINGLE PULSE  
RθJA = 114oC/W  
0.1  
0.01  
T
A = 25oC  
0.1  
1
10  
100  
0.001  
0.01  
0.1  
1
10  
100  
1000  
-VDS, DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RθJA(t) = r(t) * RθJA  
0.2  
RθJA =114 °C/W  
0.1  
0.1  
0.05  
P(pk)  
0.02  
t1  
0.01  
t2  
0.01  
TJ - TA = P * RθJA(t)  
Duty Cycle, D = t1 / t2  
SINGLE PULSE  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
Si6415DQ Rev B(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
â
SMART START™  
STAR*POWER™  
Stealth™  
VCX™  
FAST  
ACEx™  
Bottomless™  
CoolFET™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
FASTr™  
FRFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
CROSSVOLT™  
DenseTrench™  
DOME™  
POP™  
Power247™  
PowerTrenchâ  
QFET™  
EcoSPARK™  
E2CMOSTM  
TinyLogic™  
QS™  
EnSignaTM  
TruTranslation™  
UHC™  
QT Optoelectronics™  
Quiet Series™  
SILENTSWITCHERâ  
FACT™  
FACT Quiet Series™  
UltraFETâ  
STAR*POWER is used under license  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOT ASSUME ANY LIABILITYARISING OUT OF THE APPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICESORSYSTEMSWITHOUTTHEEXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H4  

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