GPR25L3203F [GENERALPLUS]

3V, 32M-BIT [x 1/x 2/x 4] CMOS MXSMIO(SERIAL MULTI I/O) FLASH MEMORY;
GPR25L3203F
型号: GPR25L3203F
厂家: Generalplus Technology Inc.    Generalplus Technology Inc.
描述:

3V, 32M-BIT [x 1/x 2/x 4] CMOS MXSMIO(SERIAL MULTI I/O) FLASH MEMORY

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GPR25L3203F  
3V, 32M-BIT [x 1/x 2/x 4] CMOS  
MXSMIO® (SERIAL MULTI I/O)  
FLASH MEMORY  
Jul. 09, 2015  
Version 1.0  
GENERALPLUS TECHNOLOGY INC. reserves the right to change this documentation without prior notice. Information provided by GENERALPLUS  
TECHNOLOGY INC. is believed to be accurate and reliable. However, GENERALPLUS TECHNOLOGY INC. makes no warranty for any errors which may  
appear in this document. Contact GENERALPLUS TECHNOLOGY INC. to obtain the latest version of device specifications before placing your order. No  
responsibility is assumed by GENERALPLUS TECHNOLOGY INC. for any infringement of patent or other rights of third parties which may result from its use.  
In addition, GENERALPLUS products are not authorized for use as critical components in life support devices/systems or aviation devices/systems, where a  
malfunction or failure of the product may reasonably be expected to result in significant injury to the user, without the express written approval of Generalplus.  
GPR25L3203F  
Table of Contents  
PAGE  
1. FEATURES.................................................................................................................................................................................................. 4  
1.1. GENERAL............................................................................................................................................................................................ 4  
1.2. PERFORMANCE................................................................................................................................................................................. 4  
1.3. SOFTWARE FEATURES..................................................................................................................................................................... 4  
1.4. HARDWARE FEATURES .................................................................................................................................................................... 4  
2. GENERAL DESCRIPTION.......................................................................................................................................................................... 4  
3. PIN CONFIGURATIONS ............................................................................................................................................................................. 5  
3.1. 8-PIN SOP (200MIL) ............................................................................................................................................................................. 5  
4. PIN DESCRIPTION...................................................................................................................................................................................... 5  
5. BLOCK DIAGRAM ...................................................................................................................................................................................... 6  
6. DATA PROTECTION................................................................................................................................................................................... 7  
7. MEMORY ORGANIZATION ........................................................................................................................................................................ 9  
8. DEVICE OPERATION ............................................................................................................................................................................... 10  
9. HOLD FEATURE....................................................................................................................................................................................... 11  
10.COMMAND DESCRIPTION ...................................................................................................................................................................... 12  
10.1.WRITE ENABLE (WREN)...................................................................................................................................................................... 13  
10.2.WRITE DISABLE (WRDI) ...................................................................................................................................................................... 13  
10.3.READ IDENTIFICATION (RDID).............................................................................................................................................................. 14  
10.4.READ STATUS REGISTER (RDSR)........................................................................................................................................................ 14  
10.5.READ CONFIGURATION REGISTER (RDCR)........................................................................................................................................... 14  
10.6.WRITE STATUS REGISTER (WRSR)...................................................................................................................................................... 16  
10.7.READ DATA BYTES (READ)................................................................................................................................................................. 18  
10.8.READ DATA BYTES AT HIGHER SPEED (FAST_READ) ......................................................................................................................... 18  
10.9.DUAL OUTPUT MODE (DREAD) ........................................................................................................................................................... 18  
10.10. 2 X I/O READ MODE (2READ) ......................................................................................................................................................... 18  
10.11. QUAD READ MODE (QREAD).......................................................................................................................................................... 19  
10.12. 4 X I/O READ MODE (4READ) ......................................................................................................................................................... 19  
10.13. PERFORMANCE ENHANCE MODE ..................................................................................................................................................... 20  
10.14. PERFORMANCE ENHANCE MODE RESET .......................................................................................................................................... 20  
10.15. BURST READ................................................................................................................................................................................... 20  
10.16. SECTOR ERASE (SE)....................................................................................................................................................................... 21  
10.17. BLOCK ERASE (BE)......................................................................................................................................................................... 21  
10.18. BLOCK ERASE (BE32K) .................................................................................................................................................................. 21  
10.19. CHIP ERASE (CE) ........................................................................................................................................................................... 21  
10.20. PAGE PROGRAM (PP) ..................................................................................................................................................................... 22  
10.21. 4 X I/O PAGE PROGRAM (4PP) ........................................................................................................................................................ 22  
10.22. DEEP POWER-DOWN (DP)............................................................................................................................................................... 25  
10.23. RELEASE FROM DEEP POWER-DOWN (RDP), READ ELECTRONIC SIGNATURE (RES)......................................................................... 25  
10.24. READ ELECTRONIC MANUFACTURER ID & DEVICE ID (REMS).......................................................................................................... 25  
10.25. ENTER SECURED OTP (ENSO)....................................................................................................................................................... 26  
10.26. EXIT SECURED OTP (EXSO) .......................................................................................................................................................... 26  
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10.27. READ SECURITY REGISTER (RDSCUR)........................................................................................................................................... 26  
10.28. WRITE SECURITY REGISTER (WRSCUR)......................................................................................................................................... 27  
10.29. PROGRAM SUSPEND AND ERASE SUSPEND...................................................................................................................................... 27  
10.29.1. Program Suspend............................................................................................................................................................... 28  
10.30. PROGRAM RESUME AND ERASE RESUME ......................................................................................................................................... 28  
10.31. NO OPERATION (NOP) .................................................................................................................................................................... 28  
10.32. SOFTWARE RESET (RESET-ENABLE (RSTEN) AND RESET (RST)) .................................................................................................... 28  
10.33. READ SFDP MODE (RDSFDP) ....................................................................................................................................................... 29  
11.POWER-ON STATE .................................................................................................................................................................................. 34  
12.ELECTRICAL SPECIFICATIONS ............................................................................................................................................................. 35  
12.1.ABSOLUTE MAXIMUM RATINGS............................................................................................................................................................. 35  
12.2.CAPACITANCE TA = 25°C, F = 1.0 MHZ................................................................................................................................................ 35  
13.TIMING ANALYSIS.................................................................................................................................................................................... 39  
14.OPERATING CONDITIONS ...................................................................................................................................................................... 41  
14.1.INITIAL DELIVERY STATE ....................................................................................................................................................................... 43  
15.ERASE AND PROGRAMMING PERFORMANCE.................................................................................................................................... 43  
16.DATA RETENTION ........................................................................................................................................................................................ 43  
17.LATCH-UP CHARACTERISTICS ............................................................................................................................................................. 43  
18.PACKAGE/PAD LOCATIONS ................................................................................................................................................................... 44  
18.1.ORDERING INFORMATION ..................................................................................................................................................................... 44  
18.2.PACKAGE INFORMATION ....................................................................................................................................................................... 45  
18.2.1. Package Outline for SOP 8L (200MIL)............................................................................................................................... 45  
19.DISCLAIMER............................................................................................................................................................................................. 46  
20.REVISION HISTORY................................................................................................................................................................................. 47  
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Version: 1.0  
GPR25L3203F  
3V, 32M-BIT [x 1/x 2/x 4] CMOS MXSMIO®  
(SERIAL MULTI I/O) FLASH MEMORY  
1. FEATURES  
1.1. GENERAL  
Auto Erase and Auto Program Algorithms  
­
Automatically erases and verifies data at selected sector  
Automatically programs and verifies data at selected page  
by an internal algorithm that automatically times the  
program pulse width (Any page to be programmed should  
have page in the erased state first.)  
­
Supports Serial Peripheral Interface -- Mode 0 and Mode 3  
33,554,432 x 1 bit structure or 16,777,216 x 2 bits (two I/O  
read mode) structure or 8,388,608 x 4 bits (four I/O mode)  
structure  
Status Register Feature  
Command Reset  
Program/Erase Suspend  
Program/Erase Resume  
Electronic Identification  
1024 Equal Sectors with 4K bytes each  
­
Any Sector can be erased individually  
128 Equal Blocks with 32K bytes each  
Any Block can be erased individually  
64 Equal Blocks with 64K bytes each  
Any Block can be erased individually  
Power Supply Operation  
2.65 ~ 3.6 volt for read, erase, and program operations  
­
­
JEDEC 1-byte Manufacturer ID and 2-byte Device ID  
­
­
RES command for 1-byte Device ID  
Support Serial Flash Discoverable Parameters (SFDP) mode  
­
Latch-up protected to 100mA from -1V to Vcc +1V  
1.4. HARDWARE FEATURES  
SCLK Input  
1.2. PERFORMANCE  
­
Serial clock input  
SI/SIO0  
Serial Data Input or Serial Data Input/Output for 2 x I/O  
mode or Serial Data Input/Output for 4 x I/O mode  
SO/SIO1  
Serial Data Output or Serial Data Input/Output for 2 x I/O  
mode or Serial Data Input/Output for 4 x I/O mode  
WP#/SIO2  
Hardware write protection or serial data Input/Output for 4 x  
I/O mode  
HOLD#/SIO3  
To pause the device without deselecting the device or serial  
data Input/Output for 4 x I/O mode  
PACKAGE  
High Performance  
VCC = 2.65~3.6V  
­
­
­
­
­
Normal read  
50MHz  
Fast read  
­
FAST_READ, DREAD, QREAD: 133MHz with 8 dummy  
cycles  
­
­
­
­
2READ: 104MHz with 4 dummy cycle, 133MHz with 8  
dummy cycle  
­
4READ: 104MHz with 6 dummy cycle, 133MHz with 10  
dummy cycle  
­
Configurable dummy cycle number for 2READ and 4READ  
operation  
8/16/32/64 byte Wrap-Around Burst Read Mode  
­
8-pin SOP (200mil)  
Low Power Consumption  
Typical 100,000 erase/program cycles  
­
All devices are RoHS Compliant and Halogen-free  
1.3. SOFTWARE FEATURES  
2. GENERAL DESCRIPTION  
Input Data Format  
GPR25L3203F is 32Mb bits Serial Flash memory, which is  
configured as 4,194,304 x 8 internally. When it is in four I/O mode,  
the structure becomes 8,388,608 bits x 4. When it is in two I/O  
mode, the structure becomes 16,777,216 bits x 2. GPR25L3203F  
features a serial peripheral interface and software protocol  
allowing operation on a simple 3-wire bus while it is in single I/O  
mode. The three bus signals are a clock input (SCLK), a serial  
data input (SI), and a serial data output (SO). Serial access to the  
­
1-byte Command code  
Advanced Security Features  
Block Lock Protection  
­
The BP0-BP3 and T/B status bits define the site of the area to be  
protected against program and erase instructions.  
Additional 4K bits secured OTP  
­
Features unique identifier  
­
Factory locked identifiable and customer lockable  
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GPR25L3203F  
3. PIN CONFIGURATIONS  
device is enabled by CS# input.  
GPR25L3203F, MXSMIO® (Serial Multi I/O) flash memory,  
provides sequential read operation on the whole chip and  
multi-I/O features.  
3.1. 8-PIN SOP (200mil)  
When it is in quad I/O mode, the SI pin, SO pin, WP# pin and  
HOLD# pin become SIO0 pin, SIO1 pin, SIO2 pin and SIO3 pin  
for address/dummy bits input and data Input/Output.  
After program/erase command is issued, auto program/erase  
algorithms which program/erase and verify the specified page or  
sector/block locations will be executed. Program command is  
executed on byte basis, or page (256 bytes) basis. Erase  
command is executed on 4K-byte sector, 32K-byte/64K-byte  
block, or whole chip basis.  
4. PIN DESCRIPTION  
SYMBOL  
CS#  
DESCRIPTION  
To provide user with ease of interface, a status register is  
included to indicate the status of the chip. The status read  
command can be issued to detect completion status of a program  
or erase operation via WIP bit.  
Chip Select  
SI/SIO0  
Serial Data Input (for 1xI/O)/ Serial Data  
Input & Output (for 2xI/O mode and  
4xI/O mode)  
When the device is not in operation and CS# is high, it is put in  
standby mode.  
SO/SIO1  
Serial Data Output (for 1xI/O)/Serial  
Data Input & Output (for 2xI/O mode and  
4xI/O mode)  
The GPR25L3203F utilizes Macronix's proprietary memory cell,  
which reliably stores memory contents even after 100,000  
program and erase cycles.  
SCLK  
Clock Input  
WP#/SIO2  
Write protection Active Low or Serial  
Data Input & Output (for 4xI/O mode)  
To pause the device without deselecting  
the device or Serial data Input/Output for  
4 x I/O mode  
HOLD#/SIO3  
VCC  
GND  
NC  
+ 3.0V Power Supply  
Ground  
No Connection  
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GPR25L3203F  
5. BLOCK DIAGRAM  
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GPR25L3203F  
6. DATA PROTECTION  
During power transition, there may be some false system level  
signals which result in inadvertent erasure or programming. The  
device is designed to protect itself from these accidental write  
cycles.  
set the Write Enable Latch bit (WEL) before other command to  
change data.  
• Deep Power Down Mode: By entering deep power down mode,  
the flash device also is under protected from writing all commands  
except Release from Deep Power Down mode command (RDP)  
and Read Electronic Signature command (RES).  
The state machine will be reset as standby mode automatically  
during power up. In addition, the control register architecture of the  
device constrains that the memory contents can only be changed  
after specific command sequences have completed successfully.  
In the following, there are several features to protect the system  
from the accidental write cycles during VCC power-up and  
power-down or from system noise.  
I. Block lock protection  
- The Software Protected Mode (SPM) uses (TB, BP3, BP2, BP1,  
BP0) bits to allow part of memory to be protected as read only. The  
protected area definition is shown as table of "Table 1. Protected  
Area Sizes", the protected areas are more flexible which may  
protect various areas by setting value of TB, BP0-BP3 bits.  
- The Hardware Protected Mode (HPM) uses WP#/SIO2 to protect  
the (BP3, BP2, BP1, BP0, TB) bits and SRWD bit.  
• Valid command length checking: The command length will be  
checked whether it is at byte base and completed on byte  
boundary.  
• Write Enable (WREN) command: WREN command is required to  
Table1. Protected Area Sizes  
Protected Area Sizes (T/B bit = 0)  
Status bit  
Protect Level  
BP3  
0
BP2  
0
BP1  
0
BP0  
0
32Mb  
0 (none)  
0
0
0
1
1 (1block, block 63rd)  
0
0
1
0
2 (2blocks, block 62nd-63rd)  
3 (4blocks, block 60th-63rd)  
4 (8blocks, block 56th-63rd)  
5 (16blocks, block 48th-63rd)  
6 (32blocks, block 32nd-63rd)  
7 (64blocks, protect all)  
8 (64blocks, protect all)  
9 (64blocks, protect all)  
10 (64blocks, protect all)  
11 (64blocks, protect all)  
12 (64blocks, protect all)  
13 (64blocks, protect all)  
14 (64blocks, protect all)  
15 (64blocks, protect all)  
0
0
1
1
0
1
0
0
0
1
0
1
0
1
1
0
0
1
1
1
1
0
0
0
1
0
0
1
1
0
1
0
1
0
1
1
1
1
0
0
1
1
0
1
1
1
1
0
1
1
1
1
Protected Area Sizes (T/B bit = 1)  
Status bit  
Protect Level  
32Mb  
BP3  
BP2  
BP1  
BP0  
0
0
0
0
0
0
0
0
0
1
0
0
1
1
0
0
1
0
1
0
0 (none)  
1 (1block, block 0th)  
2 (2blocks, block 0th-1st)  
3 (4blocks, block 0th-3rd)  
4 (8blocks, block 0th-7th)  
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GPR25L3203F  
Status bit  
Protect Level  
32Mb  
BP3  
0
BP2  
1
BP1  
0
BP0  
1
5 (16blocks, block 0th-15th)  
0
1
1
0
6 (32blocks, block 0th-31st)  
7 (64blocks, protect all)  
8 (64blocks, protect all)  
9 (64blocks, protect all)  
10 (64blocks, protect all)  
11 (64blocks, protect all)  
12 (64blocks, protect all)  
13 (64blocks, protect all)  
14 (64blocks, protect all)  
15 (64blocks, protect all)  
0
1
1
1
1
0
0
0
1
0
0
1
1
0
1
0
1
0
1
1
1
1
0
0
1
1
0
1
1
1
1
0
1
1
1
1
Note: The device is ready to accept a Chip Erase instruction if, and only if, all Block Protect (BP3, BP2, BP1, BP0) are 0.  
II. Additional 4K-bit secured OTP for unique identifier: to provide  
4K-bit One-Time Program area for setting device unique serial  
number - Which may be set by factory or system maker.  
- Security register bit 0 indicates whether the chip is locked by  
factory or not.  
- Customer may lock-down the customer lockable secured OTP by  
writing WRSCUR(write security register) command to set customer  
lock-down bit1 as "1". Please refer to "Table 7. Security Register  
Definition" for security register bit definition and "Table 2. 4K-bit  
Secured OTP Definition" for address range definition.  
Note: Once lock-down whatever by factory or customer, it cannot be  
changed any more. While in 4K-bit Secured OTP mode, array access is not  
allowed.  
- To program the 4K-bit secured OTP by entering 4K-bit secured  
OTP mode (with ENSO command), and going through normal  
program procedure, and then exiting 4K-bit secured OTP mode by  
writing EXSO command.  
Table2. 4K-bit Secured OTP Definition  
Address range  
Size  
Standard Factory Lock  
Customer Lock  
xxx000~xxx1FF  
4096-bit  
Determined by Customer  
Determined by customer  
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7. MEMORY ORGANIZATION  
Table 3. Memory Organization  
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GPR25L3203F  
8. DEVICE OPERATION  
1. Before a command is issued, status register should be checked  
to ensure device is ready for the intended operation.  
2. When incorrect command is inputted to this device, it enters  
standby mode and remains in standby mode until next CS#  
falling edge. In standby mode, SO pin of the device is High-Z.  
3. When correct command is inputted to this device, it enters  
active mode and remains in active mode until next CS# rising  
edge.  
5. For the following instructions: RDID, RDSR, RDSCUR, READ,  
FAST_READ, RDSFDP, 4READ, QREAD, 2READ, DREAD,  
RDCR, RES, and REMS the shifted-in instruction sequence is  
followed by a data-out sequence. After any bit of data being  
shifted out, the CS# can be high. For the following instructions:  
WREN, WRDI, WRSR, SE, BE, BE32K, CE, PP, 4PP, Suspend,  
Resume, NOP, RSTEN, RST, ENSO, EXSO, WRSCUR, the  
CS# must go high exactly at the byte boundary; otherwise, the  
instruction will be rejected and not executed.  
4. For standard single data rate serial mode, input data is latched  
on the rising edge of Serial Clock(SCLK) and data is shifted out  
on the falling edge of SCLK. The difference of Serial mode 0  
and mode 3 is shown as "Figure 1. Serial Modes Supported (for  
Normal Serial mode)".  
6. While a Write Status Register, Program, or Erase operation is in  
progress, access to the memory array is neglected and will not  
affect the current operation of Write Status Register, Program,  
Erase.  
Figure 1. Serial Modes Supported (for Normal Serial mode)  
Note:  
CPOL indicates clock polarity of Serial master, CPOL=1 for SCLK high while idle, CPOL=0 for SCLK low while not transmitting. CPHA indicates clock phase.  
The combination of CPOL bit and CPHA bit decides which Serial mode is supported.  
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GPR25L3203F  
9. HOLD FEATURE  
HOLD# pin signal goes low to hold any serial communications with  
the device. The HOLD feature will not stop the operation of write  
status register, programming, or erasing in progress.  
HOLD operation will not start until Serial Clock signal being low).  
The HOLD condition ends on the rising edge of HOLD# pin signal  
while Serial Clock(SCLK) signal is being low (if Serial Clock signal  
is not being low, HOLD operation will not end until Serial Clock  
being low).  
The operation of HOLD requires Chip Select (CS#) keeping low  
and starts on falling edge of HOLD# pin signal while Serial Clock  
(SCLK) signal is being low (if Serial Clock signal is not being low,  
Figure2. Hold Condition Operation  
During the HOLD operation, the Serial Data Output (SO) is high  
impedance when Hold# pin goes low and will keep high  
impedance until Hold# pin goes high. The Serial Data Input (SI) is  
don't care if both Serial Clock (SCLK) and Hold# pin goes low and  
will keep the state until SCLK goes low and Hold# pin goes high. If  
Chip Select (CS#) drives high during HOLD operation, it will reset  
the internal logic of the device. To re-start communication with chip,  
the HOLD# must be at high and CS# must be at low.  
Note: The HOLD feature is disabled during Quad I/O mode.  
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GPR25L3203F  
10. COMMAND DESCRIPTION  
Table4. Command Sets  
Read Commands  
I/O  
1
1
2
2
4
4
Command  
READ  
FAST READ  
2READ  
(2 x I/O read  
command)  
BB (hex)  
ADD1(4)  
ADD2(4)  
ADD3(4)  
Dummy*  
DREAD  
(1I / 2O read  
command)  
3B (hex)  
4READ  
(4 x I/O read  
command)  
EB (hex)  
ADD1(2)  
ADD2(2)  
ADD3(2)  
Dummy*  
QREAD (1I/4O  
read command)  
(normal read)  
(fast read data)  
1st byte  
2nd byte  
3rd byte  
4th byte  
5th byte  
03 (hex)  
ADD1(8)  
ADD2(8)  
ADD3(8)  
0B (hex)  
ADD1(8)  
ADD2(8)  
ADD3(8)  
Dummy(8)  
6B (hex)  
ADD1(8)  
ADD2(8)  
ADD3(8)  
Dummy(8)  
ADD1(8)  
ADD2(8)  
ADD3(8)  
Dummy(8)  
Action  
n bytes read out n bytes read out n bytes read out n bytes read out Quad I/O read  
until CS# goes until CS# goes by 2 x I/O until by Dual Output with configurable  
high  
high  
CS# goes high  
until CS# goes dummy cycles  
high  
Note: *Dummy cycle number will be different, depending on the bit6 (DC) setting of Configuration Register. Please refer to "Configuration Register" Table.  
Other Commands  
WRSR (write  
WRDI  
(write  
RDSR (read RDCR (read  
4PP (quad  
page  
WREN  
status/  
configuration  
register)  
SE  
Command  
status  
configuration  
register)  
(write enable)  
(sector erase)  
disable)  
register)  
program)  
1st byte  
2nd byte  
3rd byte  
4th byte  
06 (hex)  
04 (hex)  
05 (hex)  
15 (hex)  
01 (hex)  
Values  
Values  
38 (hex)  
ADD1  
ADD2  
ADD3  
20 (hex)  
ADD1  
ADD2  
ADD3  
Action  
sets the (WEL) resets  
the to read out the to read out the to write new quad input to to erase the  
write values of the values of the values of the program the selected  
latch status register configuration configuration/ selected page sector  
write  
enable (WEL)  
enable  
latch bit  
bit  
register  
status register  
PGM/ERS  
Suspend  
BE 32K  
BE  
RDP (Release  
from deep  
CE  
PP  
DP (Deep  
Command  
(block erase  
32KB)  
(block erase  
64KB)  
(chip erase) (page program) power down)  
(Suspends  
power down)  
Program/ Erase)  
1st byte  
2nd byte  
3rd byte  
4th byte  
Action  
52 (hex)  
ADD1  
ADD2  
ADD3  
D8 (hex)  
ADD1  
60 or C7 (hex)  
02 (hex)  
ADD1  
ADD2  
ADD3  
B9 (hex)  
AB (hex)  
75/B0 (hex)  
ADD2  
ADD3  
to erase the to erase the to erase whole to program the enters  
deep release  
down deep  
from program/erase  
power operation  
selected 32KB selected 64KB chip  
block block  
selected page  
power  
mode  
is  
down mode  
interrupted  
suspend  
by  
command  
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GPR25L3203F  
Command  
PGM/ERS  
RDID  
RES  
(read REMS  
(read ENSO  
(enter  
Resume  
(read  
electronic ID)  
electronic secured OTP)  
(Resumes  
Program/Erase)  
identification)  
manufacturer &  
device ID)  
1st byte  
2nd byte  
3rd byte  
4th byte  
Action  
7A/30 (hex)  
9F (hex)  
AB (hex)  
90 (hex)  
B1 (hex)  
x
x
x
x
x
ADD  
to  
continue outputs JEDEC to read out 1-byte output  
the to enter the 4K-bit  
performing  
suspended  
program/erase  
sequence  
the ID:  
1-byte Device ID  
Manufacturer ID secured  
OTP  
Manufacturer ID  
& Device ID  
mode  
& 2-byte Device  
ID  
Command EXSO (exit RDSCUR  
WRSCUR  
(write  
RSTEN  
RST  
RDSFDP  
SBL  
(Set NOP  
(No  
(byte)  
secured  
OTP)  
(read  
(Reset  
(Reset  
Memory)  
Burst  
Length)  
security  
register)  
security  
register)  
Enable)  
Operation)  
1st byte  
2nd byte  
3rd byte  
4th byte  
5th byte  
Action  
C1 (hex)  
2B (hex)  
2F (hex)  
66 (hex)  
99 (hex)  
5A (hex) C0/ 77 (hex)  
ADD1(8)  
00 (hex)  
ADD2(8)  
Value  
ADD3(8)  
Dummy(8)  
to exit the  
4K-bit  
to read value to set the  
of security lock-down  
register  
n bytes read to set Burst  
out until CS# length  
goes high  
secured  
OTP mode  
bit as "1"  
(once  
lock-down,  
cannot  
be  
update)  
Note 1: It is not recommended to adopt any other code not in the command definition table, which will potentially enter the hidden mode.  
Note 2: Before executing RST command, RSTEN command must be executed. If there is any other command to interfere, the reset operation will be disabled.  
10.1. Write Enable (WREN)  
10.2. Write Disable (WRDI)  
The Write Enable (WREN) instruction is for setting Write Enable  
Latch (WEL) bit. For those instructions like PP, 4PP, SE, BE,  
BE32K, CE, and WRSR which are intended to change the device  
content, should be set every time after the WREN instruction  
setting the WEL bit.  
The Write Disable (WRDI) instruction is for resetting Write Enable  
Latch (WEL) bit.  
The sequence of issuing WRDI instruction is: CS# goes low  
sending WRDI instruction codeCS# goes high.  
The WEL bit is reset by following situations:  
- Power-up  
The sequence of issuing WREN instruction is: CS# goes low→  
sending WREN instruction codeCS# goes high.  
The SIO[3:1] are don't care.  
- WRDI command completion  
- WRSR command completion  
Figure 3. Write Enable (WREN) Sequence (Command 06)  
- PP command completion  
- 4PP command completion  
- SE command completion  
- BE32K command completion  
- BE command completion  
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- CE command completion  
- PGM/ERS Suspend command completion  
- Softreset command completion  
- WRSCUR command completion  
Figure 4. Write Disable (WRDI) Sequence (Command 04)  
10.5. Read Configuration Register (RDCR)  
The RDCR instruction is for reading Configuration Register Bits.  
The Read Configuration Register can be read at any time (even in  
program/erase/write configuration register condition). It is  
recommended to check the Write in Progress (WIP) bit before  
sending a new instruction when a program, erase, or write  
configuration register operation is in progress.  
10.3. Read Identification (RDID)  
The RDID instruction is for reading the manufacturer ID of 1-byte  
and followed by Device ID of 2-byte. The Macronix Manufacturer  
ID and Device ID are listed as table of "Table 6. ID Definitions".  
The sequence of issuing RDID instruction is: CS# goes low→  
sending RDID instruction code 24-bits ID data out on SOto  
end RDID operation can use CS# to high at any time during data  
out.  
The sequence of issuing RDCR instruction is: CS# goes  
lowsending RDCR instruction codeConfiguration  
Register data out on SO.  
The SIO[3:1] are don't care.  
Figure 7. Read Configuration Register (RDCR) Sequence  
While Program/Erase operation is in progress, it will not decode  
the RDID instruction, so there's no effect on the cycle of  
program/erase operation which is currently in progress. When  
CS# goes high, the device is at standby stage.  
Figure 5. Read Identification (RDID) Sequence (Command 9F)  
Status Register  
The definition of the status register bits is as below:  
WIP bit. The Write in Progress (WIP) bit, a volatile bit, indicates  
whether the device is busy in program/erase/ write status register  
progress. When WIP bit sets to 1, which means the device is busy  
in program/erase/write status register progress. When WIP bit sets  
to 0, which means the device is not in progress of program/erase/  
write status register cycle.  
10.4. Read Status Register (RDSR)  
The RDSR instruction is for reading Status Register. The Read  
Status Register can be read at any time (even in  
program/erase/write status register condition) and continuously. It  
is recommended to check the Write in Progress (WIP) bit before  
sending a new instruction when a program, erase, or write status  
register operation is in progress.  
WEL bit. The Write Enable Latch (WEL) bit, a volatile bit, indicates  
whether the device is set to internal write enable latch. When WEL  
bit sets to "1", which means the internal write enable latch is set,  
the device can accept program/erase/write status register  
instruction. When WEL bit sets to 0, which means no internal write  
enable latch; the device will not accept program/erase/write status  
register instruction. The program/erase command will be ignored  
and will reset WEL bit if it is applied to a protected memory area.  
To ensure both WIP bit & WEL bit are both set to 0 and available  
for next program/erase/operations, WIP bit needs to be confirm to  
be 0 before polling WEL bit. After WIP bit confirmed, WEL bit  
needs to be confirm to be 0.  
The sequence of issuing RDSR instruction is: CS# goes low→  
sending RDSR instruction codeStatus Register data out on SO.  
The SIO[3:1] are don't care.  
Figure 6. Read Status Register (RDSR) Sequence (Command  
05)  
BP3, BP2, BP1, BP0 bits. The Block Protect (BP3, BP2, BP1,  
BP0) bits, non-volatile bits, indicate the protected area (as defined  
in "Table 1. Protected Area Sizes") of the device to against the  
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program/erase instruction without hardware protection mode being  
set. To write the Block Protect (BP3, BP2, BP1, BP0) bits requires  
the Write Status Register (WRSR) instruction to be executed.  
Those bits define the protected area of the memory to against  
Page Program (PP), Sector Erase (SE), Block Erase (BE) and  
Chip Erase (CE) instructions (only if all Block Protect bits set to 0,  
the CE instruction can be executed). The BP3, BP2, BP1, BP0 bits  
are "0" as default. Which is un-protected.  
other word, if the system goes into four I/O mode (QE=1), the  
feature of HPM will be disabled.  
SRWD bit. The Status Register Write Disable (SRWD) bit,  
non-volatile bit, default value is "0". SRWD bit is operated together  
with Write Protection (WP#/SIO2) pin for providing hardware  
protection mode. The hardware protection mode requires SRWD  
sets to 1 and WP#/SIO2 pin signal is low stage. In the hardware  
protection mode, the Write Status Register (WRSR) instruction is  
no longer accepted for execution and the SRWD bit and Block  
Protect bits (BP3, BP2, BP1, BP0) are read only. The SRWD bit  
defaults to be "0".  
QE bit. The Quad Enable (QE) bit, non-volatile bit, while it is "0"  
(factory default), it performs non-Quad and WP# is enable. While  
QE is "1", it performs Quad I/O mode and WP# is disabled. In the  
Status Register  
bit7  
bit6  
bit5  
bit4  
bit3  
bit2  
bit1  
bit0  
SRWD (status  
register write  
protect)  
BP3  
BP2  
BP1  
BP0  
WEL  
(write enable  
latch)  
WIP  
QE  
(level of  
(level of  
(level of  
(level of  
(write in  
(Quad Enable)  
protected block) protected block) protected block) protected block)  
progress bit)  
1=write  
1=status  
register write  
disable  
1= Quad Enable  
0=not Quad  
Enable  
1=write enable  
0=not write  
enable  
operation  
0=not in write  
operation  
volatile bit  
(note 1)  
(note 1)  
(note 1)  
(note 1)  
Non-volatile bit Non-volatile bit Non-volatile bit Non-volatile bit Non-volatile bit Non-volatile bit  
volatile bit  
Note: see the "Table 1. Protected Area Sizes".  
Configuration Register  
executed.  
The Configuration Register is able to change the default status of  
Flash memory. Flash memory will be configured after the CR bit is  
set.  
TB bit  
The Top/Bottom (TB) bit is a OTP bit. The Top/Bottom (TB) bit is  
used to configure the Block Protect area by BP bit (BP3, BP2, BP1,  
BP0), starting from TOP or Bottom of the memory array. The TB bit  
is defaulted as “0”, which means Top area protect. When it is set  
as “1”, the protect area will change to Bottom area of the memory  
device. To write the TB bit requires the Write Status Register  
(WRSR) instruction to be executed.  
ODS bit  
The output driver strength ODS bit are volatile bits, which indicate  
the output driver level of the device. The Output Driver Strength is  
defaulted=1 when delivered from factory. To write the ODS bit  
requires the Write Status Register (WRSR) instruction to be  
Configuration Register  
bit7  
bit6  
bit5  
bit4  
bit3  
bit2  
bit1  
bit0  
DC  
TB  
Reserved  
Reserved  
Reserved  
Reserved  
Reserved  
ODS  
(Dummy Cycle)  
(top/bottom selected)  
0,Output driver  
strength=1  
0=Top area protect  
1=Bottom area protect  
(Default=0)  
2READ/4READ  
Dummy Cycle  
x
x
x
x
x
x
x
x
x
x
1,Output driver  
strength=1/4  
(Default=0)  
volatile  
volatile  
OTP  
Note: See "Dummy Cycle and Frequency Table", with "Don't Care" on other Reserved Configuration Registers.  
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Dummy Cycle and Frequency Table  
DC  
Numbers of Dummy Cycles  
Freq. (MHz)  
104  
0 (default)  
4
8
2READ  
4READ  
1
0 (default)  
1
133  
6
104  
10  
133  
10.6. Write Status Register (WRSR)  
The WRSR instruction is for changing the values of Status  
Register Bits and Configuration Register Bits. Before sending  
WRSR instruction, the Write Enable (WREN) instruction must be  
decoded and executed to set the Write Enable Latch (WEL) bit in  
advance. The WRSR instruction can change the value of Block  
Protect (BP3, BP2, BP1, BP0) bits to define the protected area of  
memory (as shown in "Table 1. Protected Area Sizes"). The WRSR  
also can set or reset the Quad enable (QE) bit and set or reset the  
Status Register Write Disable (SRWD) bit in accordance with Write  
Protection (WP#/SIO2) pin signal, but has no effect on bit1(WEL)  
and bit0 (WIP) of the status register. The WRSR instruction cannot  
be executed once the Hardware Protected Mode (HPM) is en-  
tered.  
Figure 8. Write Status Register (WRSR) Sequence (Command 01)  
The CS# must go high exactly at the byte boundary; otherwise, the  
instruction will be rejected and not executed. The self-timed Write  
Status Register cycle time (tW) is initiated as soon as Chip Select  
(CS#) goes high. The Write in Progress (WIP) bit still can be  
checked out during the Write Status Register cycle is in progress.  
The WIP sets 1 during the tW timing, and sets 0 when Write Status  
Register Cycle is completed, and the Write Enable Latch (WEL) bit  
is reset.  
The sequence of issuing WRSR instruction is: CS# goes low→  
sending WRSR instruction codeStatus Register data on SI→  
CS# goes high.  
Table 5. Protection Modes  
Mode  
Status register condition  
WP# and SRWD bit status  
Memory  
Status register can be written in (WEL WP#=1 and SRWD bit=0, or  
bit is set to "1") and the SRWD, WP#=0 and SRWD bit=0, or  
Software protection  
mode (SPM)  
The protected area cannot  
be program or erase.  
BP0-BP3 bits can be changed  
The SRWD, BP0-BP3, TB of  
status register bits cannot be  
changed  
WP#=1 and SRWD=1  
Hardware protection  
mode (HPM)  
The protected area cannot  
be program or erase.  
WP#=0, SRWD bit=1  
Note: As defined by the values in the Block Protect (BP3, BP2, BP1, BP0, TB) bits of the Status Register, as shown in "Table 1. Protected Area Sizes".  
As the table above showing, the summary of the Software Protected Mode (SPM) and Hardware Protected Mode (HPM):  
Software Protected Mode (SPM):  
- When SRWD bit=0, no matter WP#/SIO2 is low or high, the WREN instruction may set the WEL bit and can change the values of SRWD,  
BP3, BP2, BP1, BP0. The protected area, which is defined by BP3, BP2, BP1, BP0, is at software protected mode (SPM).  
- When SRWD bit=1 and WP#/SIO2 is high, the WREN instruction may set the WEL bit can change the values of SRWD, BP3, BP2, BP1,  
BP0. The protected area, which is defined by BP3, BP2, BP1, BP0, is at software protected mode (SPM)  
Hardware Protected Mode (HPM):  
- When SRWD bit=1, and then WP#/SIO2 is low (or WP#/SIO2 is low before SRWD bit=1), it enters the hardware protected mode (HPM).  
The data of the protected area is protected by software protected mode by BP3, BP2, BP1, BP0, TB and hardware protected mode by the  
WP#/SIO2 to against data modification.  
Note:  
To exit the hardware protected mode requires WP#/SIO2 driving high once the hardware protected mode is entered. If the WP#/SIO2 pin is permanently  
connected to high, the hardware protected mode can never be entered; only can use software protected mode via BP3, BP2, BP1, BP0, TB.  
If the system goes into four I/O mode, the feature of HPM will be disabled.  
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Figure 9. WRSR flow  
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10.7. Read Data Bytes (READ)  
The read instruction is for reading data out. The address is latched  
on rising edge of SCLK, and data shifts out on the falling edge of  
SCLK at a maximum frequency fR. The first address byte can be  
at any location. The address is automatically increased to the next  
higher address after each byte data is shifted out, so the whole  
memory can be read out at a single READ instruction. The  
address counter rolls over to 0 when the highest address has  
been reached.  
The sequence of issuing READ instruction is: CS# goes low→  
sending READ instruction code3-byte address on SI data out  
on SOto end READ operation can use CS# to high at any time  
during data out.  
10.9. Dual Output Mode (DREAD)  
Figure 10. Read Data Bytes (READ) Sequence (Command 03)  
The DREAD instruction enable double throughput of Serial Flash  
in read mode. The address is latched on rising edge of SCLK, and  
data of every two bits (interleave on 2 I/O pins) shift out on the  
falling edge of SCLK at a maximum frequency fT. The first address  
byte can be at any location. The address is automatically  
increased to the next higher address after each byte data is  
shifted out, so the whole memory can be read out at a single  
DREAD instruction. The address counter rolls over to 0 when the  
highest address has been reached. Once writing DREAD  
instruction, the following data out will perform as 2-bit instead of  
previous 1-bit.  
10.8. Read Data Bytes at Higher Speed (FAST_READ)  
The FAST_READ instruction is for quickly reading data out. The  
address is latched on rising edge of SCLK, and data of each bit  
shifts out on the falling edge of SCLK at a maximum frequency fC.  
The first address byte can be at any location. The address is  
automatically increased to the next higher address after each byte  
data is shifted out, so the whole memory can be read out at a  
single FAST_READ instruction. The address counter rolls over to  
0 when the highest address has been reached.  
The sequence of issuing DREAD instruction is: CS# goes low →  
sending DREAD instruction 3-byte address on SI 8-bit  
dummy cycle data out interleave on SO1 & SO0 to end  
DREAD operation can use CS# to high at any time during data  
out.  
While Program/Erase/Write Status Register cycle is in progress,  
DREAD instruction is rejected without any impact on the  
Program/Erase/Write Status Register current cycle.  
The sequence of issuing FAST_READ instruction is: CS# goes  
lowsending FAST_READ instruction code3-byte address on  
SI1-dummy byte (default) address on SIdata out on SOto  
end FAST_READ operation can use CS# to high at any time  
during data out. (Please refer to "Figure 11. Read at Higher Speed  
(FAST_ READ) Sequence (Command 0B)")  
Figure 12.Dual Read Mode Sequence (Command 3B)  
While Program/Erase/Write Status Register cycle is in progress,  
FAST_READ instruction is rejected without any impact on the  
Program/Erase/Write Status Register current cycle.  
Figure 11. Read at Higher Speed (FAST_READ) Sequence  
(Command 0B)  
10.10.2 x I/O Read Mode (2READ)  
The 2READ instruction enables Double Transfer Rate of Serial  
Flash in read mode. The address is latched on rising edge of  
SCLK, and data of every two bits (interleave on 2 I/O pins) shift  
out on the falling edge of SCLK at a maximum frequency fT. The  
first address byte can be at any location. The address is  
automatically increased to the next higher address after each byte  
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data is shifted out, so the whole memory can be read out at a  
single 2READ instruction. The address counter rolls over to 0  
when the highest address has been reached. Once writing 2READ  
instruction, the following address/dummy/data out will perform as  
2-bit instead of previous 1-bit.  
The sequence of issuing 2READ instruction is: CS# goes low→  
sending 2READ instruction24-bit address interleave on SIO1 &  
SIO04 dummy cycles(default) on SIO1 & SIO0data out  
interleave on SIO1 & SIO0to end 2READ operation can use  
CS# to high at any time during data out.  
10.12.4 x I/O Read Mode (4READ)  
While Program/Erase/Write Status Register cycle is in progress,  
2READ instruction is rejected without any impact on the  
Program/Erase/Write Status Register current cycle.  
The 4READ instruction enables quad throughput of Serial Flash in  
read mode. A Quad Enable (QE) bit of status Register must be set  
to "1" before sending the 4READ instruction. The address is  
latched on rising edge of SCLK, and data of every four bits  
(interleave on 4 I/O pins) shift out on the falling edge of SCLK at a  
maximum frequency fQ. The first address byte can be at any  
location. The address is automatically increased to the next higher  
address after each byte data is shifted out, so the whole memory  
can be read out at a single 4READ instruction. The address  
counter rolls over to 0 when the highest address has been  
reached. Once writing 4READ instruction, the following  
address/dummy/data out will perform as 4-bit instead of previous  
1-bit.  
Figure 13. 2 x I/O Read Mode Sequence (Command BB)  
Note: SI/SIO0 or SO/SIO1 should be kept "0h" or "Fh" in the first two  
dummy cycles. In other words, P2=P0 or P3=P1 is necessary.  
The sequence of issuing 4READ instruction is: CS# goes low→  
sending 4READ instruction24-bit address interleave on SIO3,  
SIO2, SIO1 & SIO02+4 dummy cycles (default) data out  
interleave on SIO3, SIO2, SIO1 & SIO0to end 4READ  
operation can use CS# to high at any time during data out.  
(Please refer to figure below)  
10.11.Quad Read Mode (QREAD)  
The QREAD instruction enable quad throughput of Serial Flash in  
read mode. The address is latched on rising edge of SCLK, and  
data of every four bits (interleave on 4 I/O pins) shift out on the  
falling edge of SCLK at a maximum frequency fQ. The first  
address byte can be at any location. The address is automatically  
increased to the next higher address after each byte data is  
shifted out, so the whole memory can be read out at a single  
QREAD instruction. The address counter rolls over to 0 when the  
highest address has been reached. Once writing QREAD  
instruction, the following data out will perform as 4-bit instead of  
previous 1-bit.  
Figure 15. 4 x I/O Read Mode Sequence (Command EB)  
The sequence of issuing QREAD instruction is: CS# goes low→  
sending QREAD instruction 3-byte address on SI 8-bit  
dummy cycle data out interleave on SIO3, SIO2, SIO1 &  
SIO0to end QREAD operation can use CS# to high at any time  
during data out.  
Notes:  
1. Hi-impedance is inhibited for the two clock cycles.  
2. P7P3, P6P2, P5P1 & P4P0 (Toggling) is inhibited.  
3. The Configurable Dummy Cycle is set by Configuration Register Bit.  
Please see "Dummy Cycle and Frequency Table"  
While Program/Erase/Write Status Register cycle is in progress,  
QREAD instruction is rejected without any impact on the  
Program/Erase/Write Status Register current cycle.  
Another sequence of issuing 4READ instruction especially useful  
Figure 14. Quad Read Mode Sequence (Command 6B)  
in random access is  
: CS# goes lowsending 4READ  
instruction3-bytes address interleave on SIO3, SIO2, SIO1 &  
SIO0 performance enhance toggling bit P[7:0]4 dummy  
cycles data out until CS# goes high CS# goes low (reduce  
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P4=P0, ex: AA, 00, FF  
4READ instruction) 24-bit random access address (Please refer  
to "Figure 16. 4 x I/O Read enhance performance Mode Sequence  
(Command EB) (SPI Mode)" ).  
2. The Configurable Dummy Cycle is set by Configuration Register Bit.  
Please see "Dummy Cycle and Frequency Table"  
In the performance-enhancing mode (Notes of "Figure 16. 4 x I/O  
Read enhance performance Mode Sequence (Command EB) (SPI  
Mode)"), P[7:4] must be toggling with P[3:0]; likewise P[7:0]=A5h,  
5Ah, F0h or 0Fh can make this mode continue and reduce the  
next 4READ instruction. Once P[7:4] is no longer toggling with  
P[3:0]; likewise P[7:0]=FFh, 00h, AAh or 55h. These commands  
will reset the performance enhance mode. And afterwards CS# is  
raised and then lowered, the system then will return to normal  
operation.  
10.14.Performance Enhance Mode Reset  
To conduct the Performance Enhance Mode Reset operation in  
SPI mode, FFh data cycle, 8 clocks, should be issued in 1I/O  
sequence.  
If the system controller is being Reset during operation, the flash  
device will return to the standard SPI operation.  
The SIO[3:1] are don't care.  
Figure 17. Performance Enhance Mode Reset for Fast Read Quad  
I/O  
While Program/Erase/Write Status Register cycle is in progress,  
4READ instruction is rejected without any impact on the  
Program/Erase/Write Status Register current cycle.  
10.13.Performance Enhance Mode  
The device could waive the command cycle bits if the two cycle  
bits after address cycle toggles. (Please note "Figure 16. 4 x I/O  
Read enhance performance Mode Sequence (Command EB) (SPI  
Mode)")  
10.15.Burst Read  
Performance enhance mode is supported for 4READ mode.  
“EBh” commands support enhance mode.  
To set the Burst length, following command operation is required.  
Issuing command: “C0h” or “77h” in the first Byte (8-clocks),  
following 4 clocks defining wrap around enable with “0h” and  
disable with“1h”.  
After entering enhance mode, following CS# go high, the device  
will stay in the read mode and treat CS# go low of the first clock as  
address instead of command cycle.  
Next 4 clocks is to define wrap around depth. Definition as  
following table:  
To exit enhance mode, a new fast read command whose first two  
dummy cycles is not toggle then exit. Or issue ”FFh” data cycles to  
exit enhance mode.  
Data  
00h  
01h  
02h  
03h  
1xh  
Wrap Around  
Wrap Depth  
8-byte  
Yes  
Yes  
Yes  
Yes  
No  
Figure 16. 4 x I/O Read enhance performance Mode Sequence  
(Command EB) (SPI Mode)  
16-byte  
32-byte  
64-byte  
X
The wrap around unit is defined within the wrap-around depth  
specified region. For example, if it is set to 32- byte wrap depth,  
then address above A5 will be kept, it will read wrap around within  
A[21:A5] specified page. To exit wrap around, it is required to  
issue another “C0h” or “77h” command in which data=‘1xh”.  
Otherwise, wrap around status will be retained until power down or  
reset command. To change wrap around depth, it is requried to  
issue another “C0h” or “77h” command in which data=“0xh”. “EBh”  
support wrap around feature after wrap around enable. The  
Device ID default without Burst read.  
Note:  
1. Performance enhance mode, if P7P3 & P6P2 & P5P1 & P4P0  
(Toggling), ex: A5, 5A, 0F, if not using performance enhance recommend to  
keep 1 or 0 in performance enhance indicator.  
Figure 18. Burst Read  
Reset the performance enhance mode, if P7=P3 or P6=P2 or P5=P1 or  
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Chip Select (CS#) goes high. The Write in Progress (WIP) bit still  
can be checked while the Sector Erase cycle is in progress. The  
WIP sets during the tBE timing, and clears when Sector Erase  
Cycle is completed, and the Write Enable Latch (WEL) bit is  
cleared. If the block is protected by BP3~0, the array data will be  
protected (no change) and the WEL bit still be reset.  
10.16.Sector Erase (SE)  
Figure 20. Block Erase (BE) Sequence (Command D8)  
The Sector Erase (SE) instruction is for erasing the data of the  
chosen sector to be "1". The instruction is used for any 4K-byte  
sector. A Write Enable (WREN) instruction must execute to set the  
Write Enable Latch (WEL) bit before sending the Sector Erase  
(SE). Any address of the sector (see "Table 3. Memory  
Organization" ) is a valid address for Sector Erase (SE) instruction.  
The CS# must go high exactly at the byte boundary (the least  
significant bit of the address has been latched-in); otherwise, the  
instruction will be rejected and not executed.  
10.18.Block Erase (BE32K)  
The Block Erase (BE32K) instruction is for erasing the data of the  
chosen block to be "1". The instruction is used for 32K-byte block  
erase operation. A Write Enable (WREN) instruction must be  
executed to set the Write Enable Latch (WEL) bit before sending  
the Block Erase (BE32K). Any address of the block (see "Table 3.  
Memory Organization" ) is a valid address for Block Erase (BE32K)  
instruction. The CS# must go high exactly at the byte boundary  
(the least significant bit of address byte has been latched-in);  
otherwise, the instruction will be rejected and not executed.  
The sequence of issuing BE32K instruction is: CS# goes low →  
sending BE32K instruction code 3-byte address on SI CS#  
goes high.  
The sequence of issuing SE instruction is: CS# goes low →  
sending SE instruction code3-byte address on SI CS# goes  
high.  
The SIO[3:1] are don't care.  
The self-timed Sector Erase Cycle time (tSE) is initiated as soon  
as Chip Select (CS#) goes high. The Write in Progress (WIP) bit  
still can be checked while the Sector Erase cycle is in progress.  
The WIP sets during the tSE timing, and clears when Sector Erase  
Cycle is completed, and the Write Enable Latch (WEL) bit is  
cleared. If the sector is protected by BP3~0, the array data will be  
protected (no change) and the WEL bit still be reset.  
The SIO[3:1] are don't care.  
Figure 19. Sector Erase (SE) Sequence (Command 20)  
The self-timed Block Erase Cycle time (tBE32K) is initiated as  
soon as Chip Select (CS#) goes high. The Write in Progress (WIP)  
bit still can be checked while the Sector Erase cycle is in progress.  
The WIP sets during the tBE32K timing, and clears 0 when Sector  
Erase Cycle is completed, and the Write Enable Latch (WEL) bit is  
cleared. If the block is protected by BP3~0, the array data will be  
protected (no change) and the WEL bit still be reset.  
10.17.Block Erase (BE)  
Figure 21. Block Erase 32KB (BE32K) Sequence (Command 52)  
The Block Erase (BE) instruction is for erasing the data of the  
chosen block to be "1". The instruction is used for 64K-byte block  
erase operation. A Write Enable (WREN) instruction must be  
executed to set the Write Enable Latch (WEL) bit before sending  
the Block Erase (BE). Any address of the block (see "Table 3.  
Memory Organization") is a valid address for Block Erase (BE)  
instruction. The CS# must go high exactly at the byte boundary  
(the least significant bit of address byte has been latched-in);  
otherwise, the instruction will be rejected and not executed.  
The sequence of issuing BE instruction is: CS# goes low →  
sending BE instruction code 3-byte address on SI CS# goes  
high.  
10.19.Chip Erase (CE)  
The Chip Erase (CE) instruction is for erasing the data of the  
whole chip to be "1". A Write Enable (WREN) instruction must be  
executed to set the Write Enable Latch (WEL) bit before sending  
the Chip Erase (CE). The CS# must go high exactly at the byte  
boundary; otherwise, the instruction will be rejected and not  
executed.  
The SIO[3:1] are don't care.  
The self-timed Block Erase Cycle time (tBE) is initiated as soon as  
The sequence of issuing CE instruction is: CS# goes low →  
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sending CE instruction code CS# goes high.  
be protected (no change) and the WEL bit will still be reset.  
The SIO[3:1] are don't care.  
The SIO[3:1] are don't care.  
The self-timed Chip Erase Cycle time (tCE) is initiated as soon as  
Chip Select (CS#) goes high. The Write in Progress (WIP) bit still  
can be checked while the Chip Erase cycle is in progress. The  
WIP sets during the tCE timing, and clears when Chip Erase Cycle  
is completed, and the Write Enable Latch (WEL) bit is cleared. If  
the chip is protected the Chip Erase (CE) instruction will not be  
executed, but WEL will be reset.  
Figure 23. Page Program (PP) Sequence (Command 02)  
Figure 22. Chip Erase (CE) Sequence (Command 60 or C7)  
10.21.4 x I/O Page Program (4PP)  
The Quad Page Program (4PP) instruction is for programming the  
memory to be "0". A Write Enable (WREN) instruction must be  
executed to set the Write Enable Latch (WEL) bit and Quad  
Enable (QE) bit must be set to "1" before sending the Quad Page  
Program (4PP). The Quad Page Programming takes four pins:  
SIO0, SIO1, SIO2, and SIO3, which can raise programmer  
performance and the effectiveness of application of lower clock  
less than 133MHz. For system with faster clock, the Quad page  
program cannot provide more performance, because the required  
internal page program time is far more than the time data flows in.  
Therefore, we suggest that while executing this command  
(especially during sending data), user can slow the clock speed  
down to 133MHz below. The other function descriptions are as  
same as standard page program.  
10.20.Page Program (PP)  
The Page Program (PP) instruction is for programming the  
memory to be "0". A Write Enable (WREN) instruction must be  
executed to set the Write Enable Latch (WEL) bit before sending  
the Page Program (PP). The device programs only the last 256  
data bytes sent to the device. The last address byte (the eight  
least significant address bits, A7-A0) should be set to 0 for 256  
bytes page program. If A7-A0 are not all zero, transmitted data  
that exceed page length are programmed from the starting  
address (24-bit address that last 8 bit are all 0) of currently  
selected page. If the data bytes sent to the device exceeds 256,  
the last 256 data byte is programmed at the requested page and  
previous data will be disregarded. If the data bytes sent to the  
device has not exceeded 256, the data will be programmed at the  
request address of the page. There will be no effort on the other  
data bytes of the same page.  
The sequence of issuing 4PP instruction is: CS# goes low→  
sending 4PP instruction code3-byte address on SIO[3:0]at  
least 1-byte on data on SIO[3:0]CS# goes high.  
The sequence of issuing PP instruction is: CS# goes low→  
sending PP instruction code3-byte address on SIat least  
1-byte on data on SICS# goes high.  
If the page is protected by BP3~0, the array data will be protected  
(no change) and the WEL bit will still be reset.  
Figure 24. 4 x I/O Page Program (4PP) Sequence (Command 38)  
The CS# must be kept to low during the whole Page Program  
cycle; The CS# must go high exactly at the byte boundary (the  
latest eighth bit of data being latched in), otherwise, the instruction  
will be rejected and will not be executed.  
The self-timed Page Program Cycle time (tPP) is initiated as soon  
as Chip Select (CS#) goes high. The Write in Progress (WIP) bit  
still can be checked while the Page Program cycle is in progress.  
The WIP sets during the tPP timing, and clears when Page  
Program Cycle is completed, and the Write Enable Latch (WEL)  
bit is cleared. If the page is protected by BP3~0, the array data will  
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The Program/Erase function instruction function flow is as follows:  
Figure 25. Program/Erase Flow(1) with read array data  
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Figure 26. Program/Erase Flow(2) without read array data  
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10.22.Deep Power-down (DP)  
program/erase/write cycles in progress.  
The SIO[3:1] are don't care when during this mode.  
The Deep Power-down (DP) instruction is for setting the device to  
minimum power consumption (the standby current is reduced from  
ISB1 to ISB2). The Deep Power-down mode requires the Deep  
Power-down (DP) instruction to enter, during the Deep  
Power-down mode, the device is not active and all  
Write/Program/Erase instructions are ignored. When CS# goes  
high, the device is in standby mode not deep power-down mode.  
The sequence of issuing DP instruction is: CS# goes low→  
sending DP instruction codeCS# goes high.  
The RES instruction is ended by CS# goes high after the ID been  
read out at least once. The ID outputs repeatedly if continuously  
send the additional clock cycles on SCLK while CS# is at low. If  
the device was not previously in Deep Power-down mode, the  
device transition to standby mode is immediate. If the device was  
previously in Deep Power-down mode, there's a delay of tRES2 to  
transit to standby mode, and CS# must remain to high at least  
tRES2(max). Once in the standby mode, the device waits to be  
selected, so it can receive, decode, and execute instruction.  
The RDP instruction is for releasing from Deep Power-down Mode.  
Figure 28. Release from Deep Power-down and Read Electronic  
Signature (RES) Sequence (Command AB)  
The SIO[3:1] are don't care when during this mode.  
Once the DP instruction is set, all instructions will be ignored  
except the Release from Deep Power-down mode (RDP) and  
Read Electronic Signature (RES) instruction. (those instructions  
allow the ID being reading out). When Power-down, the deep  
power-down mode automatically stops, and when power-up, the  
device automatically is in standby mode. For RDP instruction the  
CS# must go high exactly at the byte boundary (the latest eighth  
bit of instruction code has been latched-in); otherwise, the  
instruction will not be executed. As soon as Chip Select (CS#)  
goes high, a delay of tDP is required before entering the Deep  
Power-down mode and reducing the current to ISB2.  
Figure 29. Release from Deep Power-down (RDP) Sequence  
Figure 27. Deep Power-down (DP) Sequence (Command B9)  
10.24.Read Electronic Manufacturer ID & Device ID  
(REMS)  
10.23.Release from Deep Power-down (RDP), Read  
Electronic Signature (RES)  
The REMS instruction is an alternative to the Release from  
Power-down/Device ID instruction that provides both the JEDEC  
assigned manufacturer ID and the specific device ID.  
The Release from Deep Power-down (RDP) instruction is  
completed by driving Chip Select (CS#) High. When Chip Select  
(CS#) is driven High, the device is put in the standby Power mode.  
If the device was not previously in the Deep Power-down mode,  
the transition to the standby Power mode is immediate. If the  
device was previously in the Deep Power-down mode, though, the  
transition to the standby Power mode is delayed by tRES2, and  
Chip Select (CS#) must remain High for at least tRES2(max), as  
specified in "Table 15. AC Characteristics". Once in the standby  
mode, the device waits to be selected, so that it can receive,  
decode and execute instructions.  
The REMS instruction is very similar to the Release from  
Power-down/Device ID instruction. The instruction is initiated by  
driving the CS# pin low and shift the instruction code "90h"  
followed by two dummy bytes and one bytes address (A7~A0).  
After which, the Manufacturer ID for Macronix (C2h) and the  
Device ID are shifted out on the falling edge of SCLK with most  
significant bit (MSB) first. The Device ID values are listed in "Table  
6. ID Definitions". If the one-byte address is initially set to 01h,  
then the device ID will be read first and then followed by the  
Manufacturer ID. The Manufacturer and Device IDs can be read  
continuously, alternating from one to the other. The instruction is  
completed by driving CS# high.  
RES instruction is for reading out the old style of 8-bit Electronic  
Signature, whose values are shown as "Table 6. ID Definitions".  
This is not the same as RDID instruction. It is not recommended to  
use for new design. For new design, please use RDID instruction.  
Even in Deep power-down mode, the RDP and RES are also  
allowed to be executed, only except the device is in progress of  
program/erase/write cycles; there's no effect on the current  
Figure 30. Read Electronic Manufacturer & Device ID (REMS)  
Sequence  
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The sequence of issuing EXSO instruction is: CS# goes low→  
sending EXSO instruction to exit Secured OTP modeCS# goes  
high.  
The SIO[3:1] are don't care.  
10.27.Read Security Register (RDSCUR)  
The RDSCUR instruction is for reading the value of Security  
Register. The Read Security Register can be read at any time  
(even in program/erase/write status register/write security register  
condition) and continuously.  
The sequence of issuing RDSCUR instruction is : CS# goes low→  
sending RDSCUR instruction Security Register data out on  
SOCS# goes high.  
Notes:  
(1) ADD=00H will output the manufacturer's ID first and ADD=01H will output  
device ID first.  
The SIO[3:1] are don't care.  
Table 6. ID Definitions  
Figure 31. Read Security Register (RDSCUR) Sequence  
(Command 2B)  
Command Type  
GPR25L3203F  
Manufactory  
Memory  
Memory  
density  
16  
RDID  
ID  
type  
C2  
20  
Electronic ID  
15  
RES  
Manufactory  
Device ID  
15  
REMS  
ID  
The definition of the Security Register is as below:  
C2  
Secured OTP Indicator bit. The Secured OTP indicator bit shows  
the chip is locked by factory or not. When it is "0", it indicates  
non-factory lock; "1" indicates factory- lock.  
10.25.Enter Secured OTP (ENSO)  
Lock-down Secured OTP (LDSO) bit. By writing WRSCUR  
instruction, the LDSO bit may be set to "1" for customer lock-down  
purpose. However, once the bit is set to "1" (lock-down), the LDSO  
bit and the 4K-bit Secured OTP area cannot be updated any more.  
Program Suspend Status bit. Program Suspend Bit (PSB)  
indicates the status of Program Suspend operation. Users may  
use PSB to identify the state of flash memory. After the flash  
memory is suspended by Program Suspend command, PSB is set  
to "1". PSB is cleared to "0" after program operation resumes.  
Erase Suspend Status bit. Erase Suspend Bit (ESB) indicates  
the status of Erase Suspend operation. Users may use ESB to  
identify the state of flash memory. After the flash memory is  
suspended by Erase Suspend command, ESB is set to "1". ESB is  
cleared to "0" after erase operation resumes.  
The ENSO instruction is for entering the additional 4K-bit Secured  
OTP mode. While the device is in 4K-bit Secured OTP mode, array  
access is not available. The additional 4K-bit Secured OTP is  
independent from main array, and may be used to store unique  
serial number for system identifier. After entering the Secured OTP  
mode, follow standard read or program procedure to read out the  
data or update data. The Secured OTP data cannot be updated  
again once it is lock-down.  
The sequence of issuing ENSO instruction is: CS# goes low→  
sending ENSO instruction to enter Secured OTP modeCS#  
goes high.  
The SIO[3:1] are don't care.  
Please note that WRSR/WRSCUR/CE/BE/SE/BE32K commands  
are not acceptable during the access of secure OTP region, once  
Security OTP is locked down, only read related commands are  
valid.  
Program Fail Flag bit. While a program failure happened, the  
Program Fail Flag bit would be set. If the program operation fails  
on a protected memory region or locked OTP region, this bit will  
also be set. This bit can be the failure indication of one or more  
program operations. This fail flag bit will be cleared automatically  
after the next successful program operation.  
10.26.Exit Secured OTP (EXSO)  
The EXSO instruction is for exiting the additional 4K-bit Secured  
OTP mode.  
Erase Fail Flag bit. While an erase failure happened, the Erase  
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Fail Flag bit would be set. If the erase operation fails on a  
protected memory region or locked OTP region, this bit will also be  
set. This bit can be the failure indication of one or more erase  
operations. This fail flag bit will be cleared automatically after the  
next successful erase operation.  
Table 7. Security Register Definition  
bit7  
bit6  
bit5  
bit4  
bit3  
bit2  
bit1  
bit0  
LDSO  
(lock-down  
4K-bit  
Secured OTP  
Indicator bit  
(4K-bit  
ESB (Erase  
PSB (Program  
Reserved  
E_FAIL  
P_FAIL  
Reserved  
Suspend status) Suspend status)  
Secured OTP) Secured OTP)  
0 = not  
0=normal  
Program  
0=normal Erase  
succeed  
0=Erase is not  
suspended  
1=Erase is  
suspended  
(default=0)  
0=Program is  
not suspended  
1=Program is  
suspended  
lockdown  
1 = lock-down  
(cannot  
0 = nonfactory  
lock  
succeed  
Reserved  
1=indicate  
Reserved  
volatile bit  
1=indicate  
Program failed  
(default=0)  
volatile bit  
Read Only  
1 = factory  
lock  
Erase failed  
(default=0)  
program/ erase  
OTP)  
(default=0)  
non-volatile bit  
Reserved  
volatile bit  
Read Only  
volatile bit  
Read Only  
volatile bit  
Read Only  
non-volatile bit non-volatile bit  
OTP Read Only  
10.28. Write Security Register (WRSCUR)  
Table 8. Readable Area of Memory While a Program or Erase  
Operation is Suspended  
The WRSCUR instruction is for changing the values of Security  
Register Bits. Unlike write status register, the WREN instruction is  
required before sending WRSCUR instruction. The WRSCUR  
instruction may change the values of bit1 (LDSO bit) for customer  
to lock-down the 4K-bit Secured OTP area. Once the LDSO bit is  
set to "1", the Secured OTP area cannot be updated any more.  
The sequence of issuing WRSCUR instruction is :CS# goes low→  
sending WRSCUR instruction CS# goes high.  
Suspended Operation Readable Region of Memory Array  
Page Program  
All but the Page being programmed  
All but the 4KB Sector being erased  
All but the 32KB Block being erased  
All but the 64KB Block being erased  
Sector Erase (4KB)  
Block Erase (32KB)  
Block Erase (64KB)  
When the serial flash receives the Suspend instruction, there is a  
latency of tPSL or tESL ("Figure 33. Suspend to Read Latency")  
before the Write Enable Latch (WEL) bit clears to “0” and the PSB  
or ESB sets to “1”, after which the device is ready to accept one of  
the commands listed in "Table 9. Acceptable Commands During  
Program/Erase Suspend after tPSL/tESL" (e.g. FAST READ).  
Refer to "Table 15. AC Characteristics" for tPSL and tESL timings.  
"Table 10. Acceptable Commands During Suspend (tPSL/tESL not  
required)" lists the commands for which the tPSL and tESL  
latencies do not apply. For example, RDSR, RDSCUR, RSTEN,  
and RST can be issued at any time after the Suspend instruction.  
Security Register bit 2 (PSB) and bit 3 (ESB) can be read to check  
the suspend status. The PSB (Program Suspend Bit) sets to “1”  
when a program operation is suspended. The ESB (Erase  
Suspend Bit) sets to “1” when an erase operation is suspended.  
The PSB or ESB clears to “0” when the program or erase  
operation is resumed.  
The SIO[3:1] are don't care.  
The CS# must go high exactly at the boundary; otherwise, the  
instruction will be rejected and not executed.  
Figure 32. Write Security Register (WRSCUR) Sequence  
(Command 2F) (SPI mode)  
10.29. Program Suspend and Erase Suspend  
The Suspend instruction interrupts a Page Program, Sector Erase,  
or Block Erase operation to allow access to the memory array.  
After the program or erase operation has entered the suspended  
state, the memory array can be read except for the page being  
programmed or the sector or block being erased ("Table 8.  
Readable Area of Memory While a Program or Erase Operation is  
Suspended").  
Table 9. Acceptable Commands During Program/Erase Suspend  
after tPSL/tESL  
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Programming is permitted in any unprotected memory except  
within the sector of a suspended Sector Erase operation or within  
the block of a suspended Block Erase operation. The Write Enable  
(WREN) instruction must be issued before any Page Program  
instruction.  
Suspend Type  
Command  
Name  
Command  
Code  
Program  
Erase  
Suspend  
Suspend  
READ  
FAST READ  
DREAD  
QREAD  
2READ  
4READ  
RDSFDP  
RDID  
03h  
0Bh  
A Page Program operation initiated within a suspended erase  
cannot itself be suspended and must be allowed to finish before  
the suspended erase can be resumed. The Status Register can be  
polled to determine the status of the Page Program operation. The  
WEL and WIP bits of the Status Register will remain “1” while the  
Page Program operation is in progress and will both clear to “0”  
when the Page Program operation completes.  
3Bh  
6Bh  
BBh  
EBh  
5Ah  
9Fh  
REMS  
90h  
Figure 35.Suspend to Program Latency  
ENSO  
B1h  
EXSO  
C1h  
SBL  
C0h or 77h  
06h  
WREN  
RESUME  
PP  
7Ah or 30h  
02h  
10.30. Program Resume and Erase Resume  
The Resume instruction resumes a suspended Page Program,  
Sector Erase, or Block Erase operation. Before issuing the  
Resume instruction to restart a suspended erase operation, make  
sure that there is no Page Program operation in progress.  
Immediately after the serial flash receives the Resume instruction,  
the WEL and WIP bits are set to “1” and the PSB or ESB is cleared  
to “0”. The program or erase operation will continue until finished  
("Figure 36. Resume to Read Latency") or until another Suspend  
instruction is received. A resume-to-suspend latency of tPRS or  
tERS must be observed before issuing another Suspend  
instruction ("Figure 34. Resume to Suspend Latency").  
4PP  
38h  
Table 10.Acceptable Commands During Suspend (tPSL/tESL not  
required)  
Suspend Type  
Suspend  
Type  
Suspend  
Type  
Program  
Suspend  
Erase  
Suspend  
WRDI  
RDSR  
RDCR  
RDSCUR  
RES  
04h  
05h  
15h  
2Bh  
ABh  
66h  
99h  
00h  
Please note that the Resume instruction will be ignored if the serial  
flash is in “Performance Enhance Mode”. Make sure the serial  
flash is not in “Performance Enhance Mode” before issuing the  
Resume instruction.  
RSTEN  
RST  
Figure 36.Resume to Read Latency  
NOP  
Figure 33.Suspend to Read Latency  
10.31. No Operation (NOP)  
The "No Operation" command is only able to terminate the Reset  
Enable (RSTEN) command and will not affect any other command.  
Figure 34.Resume to Suspend Latency  
10.32. Software Reset (Reset-Enable (RSTEN) and  
Reset (RST))  
The Software Reset operation combines two instructions:  
Reset-Enable (RSTEN) command and Reset (RST) command. It  
returns the device to a standby mode. All the volatile bits and  
settings will be cleared then, which makes the device return to the  
10.29.1. Program Suspend  
The “Erase Suspend to Program” feature allows Page  
Programming while an erase operation is suspended. Page  
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default status as power on.  
The concept is similar to the one found in the Introduction of  
JEDEC Standard, JESD68 on CFI.  
To execute Reset command (RST), the Reset-Enable (RSTEN)  
command must be executed first to perform the Reset operation. If  
there is any other command to interrupt after the Reset-Enable  
command, the Reset-Enable will be invalid.  
The sequence of issuing RDSFDP instruction is CS# goes  
lowsend RDSFDP instruction (5Ah)send 3 address bytes on  
SI pinsend 1 dummy byte on SI pinread SFDP code on  
SOto end RDSFDP operation can use CS# to high at any time  
during data out.  
If the Reset command is executed during program or erase  
operation, the operation will be disabled, the data under  
processing could be damaged or lost.  
SFDP is a JEDEC Standard, JESD216.  
The reset time is different depending on the last operation. Longer  
latency time is required to recover from a program operation than  
from other operations.  
Figure 38.Read Serial Flash Discoverable Parameter (RDSFDP)  
Sequence  
Figure 37.Software Reset Recovery  
10.33. Read SFDP Mode (RDSFDP)  
The Serial Flash Discoverable Parameter (SFDP) standard  
provides a consistent method of describing the functional and  
feature capabilities of serial flash devices in a standard set of  
internal parameter tables. These parameter tables can be  
interrogated by host system software to enable adjustments  
needed to accommodate divergent features from multiple vendors.  
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Table 11. Signature and Parameter Identification Data Values  
Add (h)  
(Byte)  
DW Add  
(Bit)  
Data (h/b)  
(Note1)  
Data  
(h)  
Description  
Comment  
00h  
01h  
02h  
03h  
04h  
05h  
07:00  
15:08  
23:16  
31:24  
07:00  
15:08  
53h  
46h  
44h  
50h  
00h  
01h  
53h  
46h  
44h  
50h  
00h  
01h  
SFDP Signature  
Fixed: 50444653h  
SFDP Minor Revision Number  
SFDP Major Revision Number  
Start from 00h  
Start from 01h  
This number is 0-based. Therefore,  
indicates 1 parameter header.  
0
Number of Parameter Headers  
06h  
23:16  
01h  
01h  
Unused  
07h  
08h  
31:24  
07:00  
FFh  
00h  
FFh  
00h  
ID number (JEDEC)  
Parameter Table Minor Revision  
Number  
00h: it indicates a JEDEC specified header.  
Start from 00h  
09h  
0Ah  
0Bh  
15:08  
23:16  
31:24  
00h  
01h  
09h  
00h  
01h  
09h  
Parameter Table Major Revision  
Number  
Start from 01h  
Parameter Table Length  
(in double word)  
How many DWORDs in the Parameter table  
0Ch  
0Dh  
0Eh  
0Fh  
07:00  
15:08  
23:16  
31:24  
30h  
00h  
00h  
FFh  
30h  
00h  
00h  
FFh  
First address of JEDEC Flash Parameter  
table  
Parameter Table Pointer (PTP)  
Unused  
ID number  
it indicates Macronix manufacturer ID  
Start from 00h  
10h  
11h  
12h  
13h  
07:00  
15:08  
23:16  
31:24  
C2h  
00h  
01h  
04h  
C2h  
00h  
01h  
04h  
(Macronix manufacturer ID)  
Parameter Table Minor Revision  
Number  
Parameter Table Major Revision  
Number  
Start from 01h  
Parameter Table Length  
(in double word)  
How many DWORDs in the Parameter table  
14h  
15h  
16h  
17h  
07:00  
15:08  
23:16  
31:24  
60h  
00h  
00h  
FFh  
60h  
00h  
00h  
FFh  
First address of Macronix Flash Parameter  
table  
Parameter Table Pointer (PTP)  
Unused  
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Table 12. Parameter Table (0): JEDEC Flash Parameter Tables  
Add (h)  
(Byte)  
DW Add  
(Bit)  
Data (h/b)  
(Note1)  
Data  
(h)  
Description  
Comment  
00: Reserved, 01: 4KB erase, 10: Reserved,  
11: not support 4KB erase  
Block/Sector Erase sizes  
Write Granularity  
01:00  
02  
01b  
1b  
E5h  
0: 1Byte, 1: 64Byte or larger  
Write  
Required for Writing to Volatile 1: required 00h to be written to the status  
Status Registers register  
Enable  
Instruction 0: not required  
03  
04  
0b  
0b  
30h  
Write Enable Opcode Select for 0: use 50h opcode,1: use 06h opcodeNote:  
Writing to Volatile Status If target flash status register is nonvolatile,  
Registers  
then bits 3 and 4 must be set to 00b.  
Unused  
Contains 111b and can never be changed  
07:05  
15:08  
16  
111b  
20h  
1b  
4KB Erase Opcode  
(1-1-2) Fast Read (Note2)  
31h  
32h  
20h  
F1h  
FFh  
0=not support 1=support  
Address Bytes Number used in 00: 3Byte only, 01: 3 or 4Byte,10: 4Byte  
18:17  
19  
00b  
0b  
addressing flash array  
Double Transfer Rate (DTR)  
Clocking  
only, 11: Reserved  
0=not support 1=support  
(1-2-2) Fast Read  
(1-4-4) Fast Read  
(1-1-4) Fast Read  
Unused  
0=not support 1=support  
0=not support 1=support  
0=not support 1=support  
20  
21  
1b  
1b  
22  
1b  
23  
1b  
Unused  
33h  
31:24  
31:00  
FFh  
Flash Memory Density  
37h:34h  
01FF FFFFh  
(1-4-4) Fast Read Number of 0 0000b: Not supported; 0 0100b: 4  
Wait states (Note3) 0 0110b: 6; 0 1000b: 8  
(1-4-4) Fast Read Number of Mode Bits:  
04:00  
0 0100b  
38h  
39h  
3Ah  
3Bh  
3Ch  
3Dh  
3Eh  
44h  
EBh  
08h  
6Bh  
08h  
3Bh  
04h  
07:05  
15:08  
20:16  
010b  
EBh  
Mode Bits (Note4)  
000b: Not supported; 010b: 2 bits  
(1-4-4) Fast Read Opcode  
(1-1-4) Fast Read Number of 0 0000b: Not supported; 0 0100b: 4  
0 1000b  
Wait states  
0 0110b: 6; 0 1000b: 8  
(1-1-4) Fast Read Number of Mode Bits:  
23:21  
31:24  
04:00  
000b  
6Bh  
Mode Bits  
000b: Not supported; 010b: 2 bits  
(1-1-4) Fast Read Opcode  
(1-1-2) Fast Read Number of 0 0000b: Not supported; 0 0100b: 4  
0 1000b  
Wait states  
0 0110b: 6; 0 1000b: 8  
(1-1-2) Fast Read Number of Mode Bits:  
07:05  
15:08  
20:16  
000b  
3Bh  
Mode Bits  
000b: Not supported; 010b: 2 bits  
(1-1-2) Fast Read Opcode  
(1-2-2) Fast Read Number of 0 0000b: Not supported; 0 0100b: 4  
0 0100b  
Wait states  
0 0110b: 6; 0 1000b: 8  
(1-2-2) Fast Read Number of Mode Bits:  
23:21  
000b  
Mode Bits  
000b: Not supported; 010b: 2 bits  
(1-2-2) Fast Read Opcode  
(2-2-2) Fast Read  
Unused  
3Fh  
40h  
31:24  
00  
BBh  
0b  
BBh  
EEh  
0=not support 1=support  
03:01  
111b  
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Add (h)  
(Byte)  
DW Add  
(Bit)  
Data (h/b)  
(Note1)  
Data  
(h)  
Description  
Comment  
(4-4-4) Fast Read  
Unused  
0=not support 1=support  
04  
0b  
07:05  
31:08  
15:00  
111b  
FFh  
FFh  
Unused  
43h:41h  
45h:44h  
FFh  
FFh  
Unused  
(2-2-2) Fast Read Number of 0 0000b: Not supported; 0 0100b: 4  
Wait states 0 0110b: 6; 0 1000b: 8  
(2-2-2) Fast Read Number of Mode Bits:  
20:16  
23:21  
0 0000b  
000b  
46h  
00h  
Mode Bits  
000b: Not supported; 010b: 2 bits  
(2-2-2) Fast Read Opcode  
47h  
31:24  
15:00  
FFh  
FFh  
FFh  
FFh  
Unused  
49h:48h  
(4-4-4) Fast Read Number of 0 0000b: Not supported; 0 0100b: 4  
20:16  
0 0000b  
Wait states  
0 0110b: 6; 0 1000b: 8  
4Ah  
00h  
(4-4-4) Fast Read Number of Mode Bits:  
23:21  
31:24  
07:00  
15:08  
23:16  
31:24  
07:00  
000b  
FFh  
0Ch  
20h  
0Fh  
52h  
10h  
Mode Bits  
000b: Not supported; 010b: 2 bits  
(4-4-4) Fast Read Opcode  
4Bh  
4Ch  
4Dh  
4Eh  
4Fh  
50h  
FFh  
0Ch  
20h  
0Fh  
52h  
10h  
Sector/block size = 2^N bytes (Note5)0Ch:  
4KB; 0Fh: 32KB; 10h: 64KB  
Sector Type 1 Size  
Sector Type 1 erase Opcode  
Sector Type 2 Size  
Sector/block size = 2^N bytes  
00h: N/A; 0Fh: 32KB; 10h: 64KB  
Sector Type 2 erase Opcode  
Sector Type 3 Size  
Sector/block size = 2^N bytes  
00h: N/A; 0Fh: 32KB; 10h: 64KB  
Sector Type 3 erase Opcode  
Sector Type 4 Size  
51h  
52h  
53h  
15:08  
23:16  
31:24  
D8h  
00h  
FFh  
D8h  
00h  
FFh  
00h: N/A, This sector type doesn't exist  
Sector Type 4 erase Opcode  
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Table 13. Parameter Table (1): Macronix Flash Parameter Tables  
Add (h)  
(Byte)  
DW Add  
(Bit)  
Data (h/b)  
(Note1)  
Data  
(h)  
Description  
Comment  
07:00  
15:08  
00h  
36h  
00h  
36h  
Vcc Supply Maximum Voltage  
2000h=2.000V2700h=2.700V3600h=3.600V  
61h:60h  
1650h=1.650V, 1750h=1.750V  
2250h=2.250V, 2300h=2.300V  
23:16  
31:24  
50h  
26h  
50h  
26h  
Vcc Supply Minimum Voltage  
63h:62h  
2350h=2.350V,  
2650h=2.650V  
2700h=2.700V  
H/W Reset# pin  
H/W Hold# pin  
0=not support 1=support  
0=not support 1=support  
0=not support 1=support  
0=not support 1=support  
00  
01  
02  
03  
0b  
1b  
Deep Power Down Mode  
S/W Reset  
1b  
1b  
1001  
1001b  
(99h)  
1b  
Reset Enable (66h) should be issued before  
Reset Opcode  
65h:64h  
F99Eh  
S/W Reset Opcode  
11:04  
Program Suspend/Resume  
Erase Suspend/Resume  
Unused  
0=not support 1=support  
0=not support 1=support  
12  
13  
14  
15  
1b  
1b  
Wrap-Around Read mode  
0=not support 1=support  
1b  
Wrap-Around  
Opcode  
Read  
mode  
66h  
67h  
23:16  
77h  
77h  
64h  
08h:support  
8B  
wrap-around  
Wrap-Around Read data length  
read16h:8B&16B32h:8B&16B&32B64h:8B&  
16B&32B&64B  
31:24  
64h  
Individual block lock  
Individual block lock bit  
(Volatile/Nonvolatile)  
0=not support 1=support  
00  
01  
0b  
1b  
0=Volatile 1=Nonvolatile  
1111 1111b  
(FFh)  
Individual block lock Opcode  
09:02  
10  
Individual block lock Volatile  
protect bit default protect status  
Secured OTP  
CFFEh  
0=protect 1=unprotect  
1b  
6Bh:68h  
0=not support 1=support  
0=not support 1=support  
0=not support 1=support  
11  
12  
1b  
0b  
Read Lock  
Permanent Lock  
Unused  
13  
0b  
15:14  
31:16  
31:00  
11b  
FFh  
FFh  
Unused  
FFh  
FFh  
Unused  
6Fh:6Ch  
Notes:  
1: h/b is hexadecimal or binary.  
2: (x-y-z) means I/O mode nomenclature used to indicate the number of active pins used for the opcode (x), address (y), and data (z). At the present time, the  
only valid Read SFDP instruction modes are: (1-1- 1), (2-2-2), and (4-4-4)  
3: Wait States is required dummy clock cycles after the address bits or optional mode bits.  
4: Mode Bits is optional control bits that follow the address bits. These bits are driven by the system  
controller if they are specified. (eg, read performance enhance toggling bits)  
5: 4KB=2^0Ch, 32KB=2^0Fh, 64KB=2^10h  
6: All unused and undefined area data is blank FFh for SFDP Tables that are defined in Parameter. Identification Header. All other areas beyond defined  
SFDP Table are reserved by Macronix.  
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11. POWER-ON STATE  
The device is at the following states after power-up:  
- Standby mode  
For further protection on the device, if the VCC does not reach the  
VCC minimum level, the correct operation is not guaranteed. The  
read, write, erase, and program command should be sent after the  
time delay:  
- Write Enable Latch (WEL) bit is reset  
The device must not be selected during power-up and  
power-down stage until the VCC reaches the following levels:  
- VCC minimum at power-up stage and then after a delay of tVSL  
- GND at power-down  
- tVSL after VCC reached VCC minimum level  
The device can accept read command after VCC reached VCC  
minimum and a time delay of tVSL.  
Please note that a pull-up resistor on CS# may ensure a safe and  
proper power-up/down level.  
Note:  
- To stabilize the VCC level, the VCC rail decoupled by a suitable  
capacitor close to package pins is recommended. (generally  
around 0.1uF)  
An internal Power-on Reset (POR) circuit may protect the device  
from data corruption and inadvertent data change during power up  
state.  
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12. ELECTRICAL SPECIFICATIONS  
12.1. Absolute Maximum Ratings  
Rating  
Value  
Ambient Operating Temperature  
Storage Temperature  
Applied Input Voltage  
Applied Output Voltage  
Industrial grade  
-40°C to 85°C  
-65°C to 150°C  
-0.5V to 4.6V  
-0.5V to 4.6V  
-0.5V to 4.6V  
VCC to Ground Potential  
NOTICE:  
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is stress rating only and functional  
operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability.  
2. Specifications contained within the following tables are subject to change.  
3. During voltage transitions, all pins may overshoot Vss to -2.0V and Vcc to +2.0V for periods up to 20ns, see the figures below.  
12.2. Capacitance TA = 25°C, f = 1.0 MHz  
Symbol  
CIN  
Parameter  
Min.  
Typ.  
Max.  
Unit  
pF  
Conditions  
VIN = 0V  
Input Capacitance  
Output Capacitance  
-
-
-
-
6
8
COUT  
pF  
VOUT = 0V  
Figure 41. Input Test Waveforms and Measurement Level  
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Figure 42.Output Loading  
Table 14. DC Characteristics  
Temperature = -40°C to 85°C for Industrial grade  
Symbol  
Parameter  
Notes  
Min.  
Typ.  
Max.  
Units  
Test Conditions  
VCC = VCC Max,  
VIN = VCC or GND  
VCC = VCC Max,  
VOUT = VCC or GND  
VIN = VCC or GND,  
CS# = VCC  
ILI  
Input Load Current  
1
± 2  
uA  
ILO  
Output Leakage Current  
VCC Standby Current  
1
1
± 2  
50  
20  
uA  
uA  
uA  
ISB1  
ISB2  
10  
3
VIN = VCC or GND,  
CS# = VCC  
Deep Power-down Current  
f=50MHz,  
2.5  
10  
5
mA  
mA  
SCLK=0.1VCC/0.9VCC,  
SO=Open  
ICC1  
VCC Read  
1
1
fQ=133MHz  
(4  
x
I/O  
17  
read)SCLK=0.1VCC/0.9VCC,  
SO=Open  
Program in Progress,  
CS# = VCC  
ICC2  
ICC3  
ICC4  
ICC5  
VCC Program Current (PP)  
10  
10  
10  
10  
15  
15  
15  
15  
mA  
mA  
mA  
mA  
VCC Write Status Register  
(WRSR) Current  
Program status register in  
progress, CS#=VCC  
Erase in Progress,  
CS#=VCC  
VCC Sector Erase Current  
(SE)  
1
1
VCC Chip Erase Current  
(CE)  
Erase in Progress,  
CS#=VCC  
VIL  
Input Low Voltage  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
-0.5  
0.8  
VCC+0.4  
0.4  
V
V
V
V
VIH  
VOL  
0.7VCC  
IOL = 1.6mA  
IOH = -100uA  
VOH  
VCC-0.2  
Notes :  
1. Typical values at VCC = 3.3V, T = 25°C. These currents are valid for all product versions (package and speeds).  
2. Typical value is calculated by simulation.  
3. The value guaranteed by characterization, not 100% tested in production.  
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Table 15. AC Characteristics  
Temperature = -40°C to 85°C for Industrial grade  
Symbol  
Alt.  
Parameter  
Min.  
Typ.  
Max.  
Unit  
Clock Frequency for the following instructions:  
FAST_READ, PP, SE, BE32K, BE, CE, RES,  
WREN, WRDI, RDID, RDSR, WRSR  
fSCLK  
fC  
D.C.  
133  
MHz  
fRSCLK  
fR  
fT  
Clock Frequency for READ instructions  
50  
MHz  
MHz  
Clock  
Frequency  
for  
2READ/DREAD  
133  
instructions  
fTSCLK  
Clock  
Frequency  
for  
4READ/QREAD  
fQ  
133  
133  
MHz  
MHz  
ns  
instructions  
f4PP  
Clock Frequency for 4PP (Quad page program)  
Clock High Time  
Others (fSCLK)  
45% x  
tCH(1)  
tCLH  
tCLL  
(1/fSCLK)  
Normal Read (fRSCLK)  
Others (fSCLK)  
9
ns  
Clock Low Time  
45% x  
ns  
tCL(1)  
(1/fSCLK)  
Normal Read (fRSCLK)  
9
0.1  
0.1  
4
ns  
V/ns  
V/ns  
ns  
tCLCH (2)  
tCHCL (2)  
tSLCH  
Clock Rise Time (peak to peak)  
Clock Fall Time (peak to peak)  
tCSS  
CS# Active Setup Time (relative to SCLK)  
CS# Not Active Hold Time (relative to SCLK)  
Data In Setup Time  
tCHSL  
4
ns  
tDVCH  
tCHDX  
tCHSH  
tSHCH  
tDSU  
tDH  
2
ns  
Data In Hold Time  
3
ns  
CS# Active Hold Time (relative to SCLK)  
CS# Not Active Setup Time (relative to SCLK)  
4
ns  
4
ns  
CS# Deselect Time  
Read  
15  
50  
ns  
tSHSL  
tCSH  
tDIS  
Write/Erase/Program  
2.65V-3.6V  
3.0V-3.6V  
ns  
Output Disable Time  
10  
8
ns  
tSHQZ (2)  
ns  
tHLCH  
tCHHH  
tHHCH  
tCHHL  
HOLD# Setup Time (relative to SCLK)  
HOLD# Hold Time (relative to SCLK)  
HOLD Setup Time (relative to SCLK)  
HOLD Hold Time (relative to SCLK)  
5
5
5
5
ns  
ns  
ns  
ns  
HOLD to Output Low-Z  
Loading=30pF  
2.65V-3.6V  
3.0V-3.6V  
2.65V-3.6V  
3.0V-3.6V  
10  
8
ns  
tHHQX  
tHLQZ  
tLZ  
ns  
HOLD# to Output High-Z  
Loading=30pF  
10  
8
ns  
tHZ  
ns  
Clock Low to Output Loading: 15pF  
6
ns  
tCLQV  
tV  
Valid  
Loading: 30pF  
8
ns  
VCC=2.65V~3.6V  
tCLQX  
tHO  
Output Hold Time  
1
ns  
ns  
ns  
us  
us  
tWHSL (3)  
tSHWL (3)  
tESL(4)  
Write Protect Setup Time  
Write Protect Hold Time  
Erase Suspend Latency  
Program Suspend Latency  
20  
100  
20  
20  
tPSL(4)  
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Symbol  
Alt.  
Parameter  
Min.  
Typ.  
Max.  
Unit  
Latency between Program Resume and next  
Suspend  
tPRS (5)  
0.3  
100  
us  
Latency between Erase Resume and next  
Suspend  
tERS (6)  
0.3  
200  
us  
tRCR  
tRCP  
tRCE  
tDP  
Recovery Time from Read  
20  
20  
12  
us  
us  
ms  
us  
Recovery Time from Program  
Recovery Time from Erase  
CS# High to Deep Power-down Mode  
CS# High to Standby Mode without Electronic  
Signature Read  
10  
tRES1  
tRES2  
100  
us  
us  
CS# High to Standby Mode with Electronic  
Signature Read  
100  
tW  
Write Status Register Cycle Time  
Byte-Program  
40  
50  
1.2  
200  
0.6  
1
ms  
us  
ms  
ms  
s
tBP  
10  
0.33  
25  
tPP  
Page Program Cycle Time  
tSE  
Sector Erase Cycle Time (4KB)  
Block Erase Cycle Time (32KB)  
Block Erase Cycle Time (64KB)  
Chip Erase Cycle Time  
tBE32K  
tBE  
0.14  
0.25  
10  
s
tCE  
30  
1
s
tWSR  
Write Security Register Time  
ms  
Notes:  
1. tCH + tCL must be greater than or equal to 1/ fC.  
2. The value guaranteed by characterization, not 100% tested in production.  
3. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.  
4. Latency time is required to complete Erase/Program Suspend operation until WIP bit is "0".  
5. For tPRS, minimum timing must be observed before issuing the next program suspend command. However, a period equal to or longer than the typical  
timing is required in order for the program operation to make progress.  
6. For tERS, minimum timing must be observed before issuing the next erase suspend command. However, a period equal to or longer than the typical timing is  
required in order for the erase operation to make progress.  
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13. TIMING ANALYSIS  
Figure 43. Serial Input Timing  
Figure 44.Output Timing  
Figure 45.Hold Timing  
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Figure 46.WP# Setup Timing and Hold Timing during WRSR when SRWD=1  
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14. OPERATING CONDITIONS  
At Device Power-Up and Power-Down  
AC timing illustrated in "Figure 47. AC Timing at Device Power-Up" and "Figure 48. Power-Down Sequence" are for the supply voltages and  
the control signals at device power-up and power-down. If the timing in the figures is ignored, the device will not operate correctly.  
During power-up and power-down, CS# needs to follow the voltage applied on VCC to keep the device not to be selected. The CS# can be  
driven low when VCC reach Vcc(min.) and wait a period of tVSL.  
Figure 47. AC Timing at Device Power-Up  
Symbol  
Parameter  
VCC Rise Time  
Notes  
Min.  
Max.  
Unit  
tVR  
1
20  
500000  
us/V  
Notes :  
1. Sampled, not 100% tested.  
2. For AC spec tCHSL, tSLCH, tDVCH, tCHDX, tSHSL, tCHSH, tSHCH, tCHCL, tCLCH in the figure, please refer to "Table 15. AC Characteristics".  
Figure 48. Power-Down Sequence  
During power-down, CS# needs to follow the voltage drop on VCC to avoid mis-operation.  
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Figure 49.Power-up Timing  
Figure 50.Power Up/Down and Voltage Drop  
For Power-down to Power-up operation, the VCC of flash device must below VPWD for at least tPWD timing. Please check the table below  
for more detail.  
Table 16. Power-Up/Down Voltage and Timing  
Symbol  
tVSL  
Parameter  
Min.  
800  
1.5  
Max.  
Unit  
us  
V
VCC(min.) to device operation  
Write Inhibit Voltage  
VWI  
2.5  
0.9  
VPWD  
tPWD  
tVR  
VCC voltage needed to below VPWD for ensuring initialization will occur  
The minimum duration for ensuring initialization will occur  
VCC Rise Time  
V
300  
20  
us  
us/V  
V
500000  
3.6  
VCC  
VCC Power Supply  
2.65  
Note: These parameters are characterized only.  
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14.1. Initial Delivery State  
The device is delivered with the memory array erased: all bits are set to 1 (each byte contains FFh). The Status Register contains 00h (all  
Status Register bits are 0).  
15. ERASE AND PROGRAMMING PERFORMANCE  
Parameter  
Typ. (1)  
Max. (2)  
40  
Unit  
ms  
ms  
s
Write Status Register Cycle Time  
Sector Erase Time (4KB)  
Block Erase Time (64KB)  
Block Erase Time (32KB)  
Chip Erase Time  
25  
0.25  
0.14  
10  
200  
1
0.6  
30  
s
s
Byte Program Time (via page program command)  
Page Program Time  
10  
50  
us  
0.33  
100,000  
1.2  
ms  
cycles  
Erase/Program Cycle  
Notes:  
1. Typical program and erase time assumes the following conditions: 25°C, 3.3V, and checkerboard pattern.  
2. Under worst conditions of 85°C and 2.65V.  
3. System-level overhead is the time required to execute the first-bus-cycle sequence for the programming command.  
16. Data Retention  
Parameter  
Condition  
Min.  
Max.  
UNIT  
years  
Data retention  
55˚C  
20  
-
17. LATCH-UP CHARACTERISTICS  
Min.  
Max.  
Input Voltage with respect to GND on all power pins, SI, CS#  
Input Voltage with respect to GND on SO  
Current  
-1.0V  
-1.0V  
2 VCCmax  
VCC + 1.0V  
+100mA  
-100mA  
Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time.  
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18. PACKAGE/PAD LOCATIONS  
18.1. Ordering Information  
Product Number  
Package Type  
SOP 8L 200mil-Halogen Free Package  
GPR25L3203F-QS13x  
Note: x = 1 - 9, serial number.  
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18.2. Package Information  
18.2.1. Package Outline for SOP 8L (200MIL)  
18.2.1.1. Dimensions (Inch dimensions are derived from the original mm dimensions)  
Reference  
DWG. NO.  
Revision  
Issue Date  
JEDEC  
EIAJ  
6110-1406  
5
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19. DISCLAIMER  
The information appearing in this publication is believed to be accurate.  
Integrated circuits sold by Generalplus Technology are covered by the warranty and patent indemnification provisions stipulated in the terms  
of sale only. GENERALPLUS makes no warranty, express, statutory implied or by description regarding the information in this publication  
or regarding the freedom of the described chip(s) from patent infringement. FURTHERMORE, GENERALPLUS MAKES NO WARRANTY  
OF MERCHANTABILITY OR FITNESS FOR ANY PURPOSE. GENERALPLUS reserves the right to halt production or alter the  
specifications and prices at any time without notice. Accordingly, the reader is cautioned to verify that the data sheets and other  
information in this publication are current before placing orders. Products described herein are intended for use in normal commercial  
applications. Applications involving unusual environmental or reliability requirements, e.g. military equipment or medical life support  
equipment, are specifically not recommended without additional processing by GENERALPLUS for such applications. Please note that  
application circuits illustrated in this document are for reference purposes only.  
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20. REVISION HISTORY  
Date  
Revision  
Description  
Page  
Jul. 09, 2015  
1.0  
Original  
47  
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