GS880Z18BGT-225T [GSI]
ZBT SRAM, 512KX18, 6ns, CMOS, PQFP100, TQFP-100;型号: | GS880Z18BGT-225T |
厂家: | GSI TECHNOLOGY |
描述: | ZBT SRAM, 512KX18, 6ns, CMOS, PQFP100, TQFP-100 静态存储器 |
文件: | 总23页 (文件大小:684K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
GS880Z18/36BT-250/225/200/166/150/133
100-Pin TQFP
Commercial Temp
Industrial Temp
250 MHz–133 MHz
9Mb Pipelined and Flow Through
2.5 V or 3.3 V VDD
2.5 V or 3.3 V I/O
Synchronous NBT SRAM
Features
Functional Description
• NBT (No Bus Turn Around) functionality allows zero wait
read-write-read bus utilization; Fully pin-compatible with
both pipelined and flow through NtRAM™, NoBL™ and
ZBT™ SRAMs
The GS880Z18/36BT is a 9Mbit Synchronous Static SRAM.
GSI's NBT SRAMs, like ZBT, NtRAM, NoBL or other
pipelined read/double late write or flow through read/single
late write SRAMs, allow utilization of all available bus
bandwidth by eliminating the need to insert deselect cycles
when the device is switched from read to write cycles.
• 2.5 V or 3.3 V +10%/–10% core power supply
• 2.5 V or 3.3 V I/O supply
• User-configurable Pipeline and Flow Through mode
• LBO pin for Linear or Interleave Burst mode
• Pin compatible with 2M, 4M, and 18M devices
• Byte write operation (9-bit Bytes)
Because it is a synchronous device, address, data inputs, and
read/ write control inputs are captured on the rising edge of the
input clock. Burst order control (LBO) must be tied to a power
rail for proper operation. Asynchronous inputs include the
Sleep mode enable (ZZ) and Output Enable. Output Enable can
be used to override the synchronous control of the output
drivers and turn the RAM's output drivers off at any time.
Write cycles are internally self-timed and initiated by the rising
edge of the clock input. This feature eliminates complex off-
chip write pulse generation required by asynchronous SRAMs
and simplifies input signal timing.
• 3 chip enable signals for easy depth expansion
• ZZ Pin for automatic power-down
• JEDEC-standard 100-lead TQFP package
-250 -225 -200 -166 -150 -133 Unit
Pipeline
3-1-1-1
t
2.5 2.7 3.0 3.4 3.8 4.0 ns
4.0 4.4 5.0 6.0 6.7 7.5 ns
KQ
tCycle
Curr (x18) 280 255 230 200 185 165 mA
Curr (x36) 330 300 270 230 215 190 mA
3.3 V
2.5 V
The GS880Z18/36BT may be configured by the user to
operate in Pipeline or Flow Through mode. Operating as a
pipelined synchronous device, meaning that in addition to the
rising edge triggered registers that capture input signals, the
device incorporates a rising-edge-triggered output register. For
read cycles, pipelined SRAM output data is temporarily stored
by the edge triggered output register during the access cycle
and then released to the output drivers at the next rising edge of
clock.
Curr (x18) 275 250 230 195 180 165 mA
Curr (x36) 320 295 265 225 210 185 mA
Flow
Through
2-1-1-1
t
5.5 6.0 6.5 7.0 7.5 8.5 ns
5.5 6.0 6.5 7.0 7.5 8.5 ns
KQ
tCycle
Curr (x18) 175 165 160 150 145 135 mA
Curr (x36) 200 190 180 170 165 150 mA
3.3 V
2.5 V
Curr (x18) 175 165 160 150 145 135 mA
Curr (x36) 200 190 180 170 165 150 mA
The GS880Z18/36BT is implemented with GSI's high
performance CMOS technology and is available in a JEDEC-
Standard 100-pin TQFP package.
Flow Through and Pipelined NBT SRAM Back-to-Back Read/Write Cycles
Clock
Address
A
R
B
C
R
D
E
R
F
Read/Write
W
W
W
Flow Through
Data I/O
Q
D
Q
D
D
Q
E
A
B
C
D
Pipelined
Data I/O
Q
Q
D
Q
E
A
B
C
D
Rev: 1.00b 12/2002
1/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
NoBL is a trademark of Cypress Semiconductor Corp.. NtRAM is a trademark of Samsung Electronics Co.. ZBT is a trademark of Integrated Device Technology, Inc.
GS880Z18/36BT-250/225/200/166/150/133
GS880Z18BT Pinout
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
A18
NC
NC
V
SS
NC
DQA9
DQA8
DQA7
NC
NC
NC
1
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
2
3
V
4
DDQ
DDQ
V
V
5
SS
NC
NC
6
7
8
DQB1
DQB2
9
512K x 18
Top View
V
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
V
SS
DDQ
SS
V
V
DDQ
DQA6
DQB3
DQB4
FT
DQA5
V
SS
NC
V
V
DD
DD
SS
V
DD
ZZ
V
DQA4
DQA3
DQB5
DQB6
V
V
V
DDQ
DDQ
SS
V
SS
DQA2
DQA1
NC
DQB7
DQB8
DQB9
NC
NC
V
V
V
SS
DDQ
SS
V
DDQ
NC
NC
NC
NC
NC
NC
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 1.00b 12/2002
2/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
GS880Z36BT Pinout
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
DQB9
DQB8
DQB7
DQC9
DQC8
DQC7
1
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
2
3
V
V
4
DDQ
DDQ
SS
V
V
5
SS
DQB6
DQB5
DQB4
DQB3
DQC6
DQC5
DQC4
DQC3
6
7
8
9
256K x 36
Top View
V
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
V
SS
DDQ
SS
V
V
DDQ
DQB2
DQC2
DQC1
FT
DQB1
V
SS
NC
V
V
DD
DD
SS
V
DD
ZZ
V
DQA1
DQA2
DQD1
DQD2
DDQ
V
V
V
DDQ
SS
V
SS
DQA3
DQA4
DQA5
DQA6
DQD3
DQD4
DQD5
DQD6
V
V
V
SS
DDQ
SS
V
DDQ
DQA7
DQA8
DQA9
DQD7
DQD8
DQD9
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 1.00b 12/2002
3/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
100-Pin TQFP Pin Descriptions
Symbol
Type
In
Description
A0, A1
Burst Address Inputs; Preload the burst counter
A2–A17
A18
In
Address Inputs
Address Input (x18 Version Only)
In
CK
In
Clock Input Signal
BA
In
Byte Write signal for data inputs DQA1–DQA9; active low
Byte Write signal for data inputs DQB1–DQB9; active low
Byte Write signal for data inputs DQC1–DQC9; active low
Byte Write signal for data inputs DQD1–DQD9; active low
Write Enable; active low
BB
In
BC
In
BD
In
W
In
E1
In
Chip Enable; active low
E2
In
Chip Enable; Active High. For self decoded depth expansion
Chip Enable; Active Low. For self decoded depth expansion
Output Enable; active low
E3
G
In
In
ADV
In
Advance/Load; Burst address counter control pin
Clock Input Buffer Enable; active low
No Connect
CKE
In
NC
—
I/O
I/O
I/O
I/O
In
DQA1–DQA9
DQB1–DQB9
DQC1–DQC9
DQD1–DQD9
ZZ
Byte A Data Input and Output pins
Byte B Data Input and Output pins
Byte C Data Input and Output pins
Byte D Data Input and Output pins
Power down control; active high
FT
In
Pipeline/Flow Through Mode Control; active low
Linear Burst Order; active low
LBO
In
V
In
Core power supply
DD
V
In
In
Ground
SS
V
Output driver power supply
DDQ
Rev: 1.00b 12/2002
4/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
GS880Z18/36B NBT SRAM Functional Block Diagram
n s e e S A m p s
s
i t r e W D r i v e r
Rev: 1.00b 12/2002
5/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Functional Details
Clocking
Deassertion of the Clock Enable (CKE) input blocks the Clock input from reaching the RAM's internal circuits. It may be used to
suspend RAM operations. Failure to observe Clock Enable set-up or hold requirements will result in erratic operation.
Pipeline Mode Read and Write Operations
All inputs (with the exception of Output Enable, Linear Burst Order and Sleep) are synchronized to rising clock edges. Single cycle
read and write operations must be initiated with the Advance/Load pin (ADV) held low, in order to load the new address. Device
activation is accomplished by asserting all three of the Chip Enable inputs (E1, E2 and E3). Deassertion of any one of the Enable
inputs will deactivate the device.
Function
Read
W
H
L
BA
X
BB
X
BC
X
BD
X
Write Byte “a”
Write Byte “b”
Write Byte “c”
Write Byte “d”
Write all Bytes
Write Abort/NOP
L
H
L
H
H
L
H
H
H
L
L
H
H
H
L
L
H
H
L
L
H
L
L
L
L
H
H
H
H
Read operation is initiated when the following conditions are satisfied at the rising edge of clock: CKE is asserted Low, all three
chip enables (E1, E2, and E3) are active, the write enable input signals W is deasserted high, and ADV is asserted low. The address
presented to the address inputs is latched in to address register and presented to the memory core and control logic. The control
logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At
the next rising edge of clock the read data is allowed to propagate through the output register and onto the output pins.
Write operation occurs when the RAM is selected, CKE is active, and the Write input is sampled low at the rising edge of clock.
The Byte Write Enable inputs (BA, BB, BC, & BD) determine which bytes will be written. All or none may be activated. A write
cycle with no Byte Write inputs active is a no-op cycle. The pipelined NBT SRAM provides double late write functionality,
matching the write command versus data pipeline length (2 cycles) to the read command versus data pipeline length (2 cycles). At
the first rising edge of clock, Enable, Write, Byte Write(s), and Address are registered. The Data In associated with that address is
required at the third rising edge of clock.
Flow Through Mode Read and Write Operations
Operation of the RAM in Flow Through mode is very similar to operations in Pipeline mode. Activation of a Read Cycle and the
use of the Burst Address Counter is identical. In Flow Through mode the device may begin driving out new data immediately after
new address are clocked into the RAM, rather than holding new data until the following (second) clock edge. Therefore, in Flow
Through mode the read pipeline is one cycle shorter than in Pipeline mode.
Write operations are initiated in the same way, but differ in that the write pipeline is one cycle shorter as well, preserving the ability
to turn the bus from reads to writes without inserting any dead cycles. While the pipelined NBT RAMs implement a double late
write protocol, in Flow Through mode a single late write protocol mode is observed. Therefore, in Flow Through mode, address
and control are registered on the first rising edge of clock and data in is required at the data input pins at the second rising edge of
clock.
Rev: 1.00b 12/2002
6/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Synchronous Truth Table
Operation
Deselect Cycle, Power Down
Deselect Cycle, Power Down
Deselect Cycle, Power Down
Deselect Cycle, Continue
Read Cycle, Begin Burst
Read Cycle, Continue Burst
NOP/Read, Begin Burst
Dummy Read, Continue Burst
Write Cycle, Begin Burst
Write Cycle, Continue Burst
NOP/Write Abort, Begin Burst
Write Abort, Continue Burst
Clock Edge Ignore, Stall
Sleep Mode
Type Address E1 E2 E3 ZZ ADV W Bx G CKE CK DQ Notes
D
D
D
D
R
B
None
None
H
X
X
X
L
X
X
L
X
H
X
X
L
L
L
L
L
L
L
L
L
L
L
L
L
L
H
L
L
X
X
X
X
H
X
H
X
L
X
X
X
X
X
X
X
X
L
X
X
X
X
L
L
L
L
L
L
L
L
L
L
L
L
L
H
X
L-H High-Z
L-H High-Z
L-H High-Z
L-H High-Z
None
L
None
X
H
X
H
X
H
X
H
X
X
X
H
L
1
External
Next
L-H
L-H
Q
Q
X
L
X
L
H
L
L
1,10
2
R
B
External
Next
H
H
X
X
X
X
X
X
L-H High-Z
X
L
X
L
H
L
L-H High-Z 1,2,10
W
B
External
Next
L-H
L-H
D
D
3
X
L
X
L
H
L
X
L
L
1,3,10
2,3
W
B
None
H
H
X
X
L-H High-Z
Next
X
X
X
X
X
X
H
X
X
X
X
X
L-H High-Z 1,2,3,10
Current
None
L-H
X
-
4
High-Z
Notes:
1. Continue Burst cycles, whether read or write, use the same control inputs. A Deselect continue cycle can only be entered into if a Dese-
lect cycle is executed first.
2. Dummy Read and Write abort can be considered NOPs because the SRAM performs no operation. A Write abort occurs when the W
pin is sampled low but no Byte Write pins are active so no write operation is performed.
3. G can be wired low to minimize the number of control signals provided to the SRAM. Output drivers will automatically turn off during
write cycles.
4. If CKE High occurs during a pipelined read cycle, the DQ bus will remain active (Low Z). If CKE High occurs during a write cycle, the bus
will remain in High Z.
5. X = Don’t Care; H = Logic High; L = Logic Low; Bx = High = All Byte Write signals are high; Bx = Low = One or more Byte/Write
signals are Low
6. All inputs, except G and ZZ must meet setup and hold times of rising clock edge.
7. Wait states can be inserted by setting CKE high.
8. This device contains circuitry that ensures all outputs are in High Z during power-up.
9. A 2-bit burst counter is incorporated.
10. The address counter is incriminated for all Burst continue cycles.
Rev: 1.00b 12/2002
7/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Pipeline and Flow Through Read Write Control State Diagram
D
B
Deselect
R
D
D
W
New Read
New Write
R
R
W
B
B
R
W
W
R
Burst Read
Burst Write
B
B
D
D
Key
Notes:
Input Command Code
1. The Hold command (CKE Low) is not
shown because it prevents any state change.
ƒ
Transition
2. W, R, B and D represent input command
codes ,as indicated in the Synchronous Truth Table.
Current State (n)
Next State (n+1)
n
n+1
n+2
n+3
Clock (CK)
Command
ƒ
ƒ
ƒ
ƒ
Current State
Next State
Current State and Next State Definition for Pipeline and Flow Through Read/Write Control State Diagram
Rev: 1.00b 12/2002
8/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Pipeline Mode Data I/O State Diagram
Intermediate
Intermediate
R
B
W
B
Intermediate
R
Data Out
(Q Valid)
High Z
(Data In)
W
D
Intermediate
D
Intermediate
W
R
High Z
B
D
Intermediate
Key
Notes:
Input Command Code
1. The Hold command (CKE Low) is not
shown because it prevents any state change.
ƒ
Transition
Transition
2. W, R, B, and D represent input command
codes as indicated in the Truth Tables.
Current State (n)
Next State (n+2)
Intermediate State (N+1)
n
n+1
n+2
n+3
Clock (CK)
Command
ƒ
ƒ
ƒ
ƒ
Intermediate
State
Current State
Next State
Current State and Next State Definition for Pipeline Mode Data I/O State Diagram
Rev: 1.00b 12/2002
9/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Flow Through Mode Data I/O State Diagram
R
B
W
B
R
Data Out
(Q Valid)
High Z
(Data In)
W
D
D
W
R
High Z
B
D
Key
Notes
Input Command Code
1. The Hold command (CKE Low) is not
shown because it prevents any state change.
ƒ
Transition
2. W, R, B and D represent input command
codes as indicated in the Truth Tables.
Current State (n)
Next State (n+1)
n
n+1
n+2
n+3
Clock (CK)
Command
ƒ
ƒ
ƒ
ƒ
Current State
Next State
Current State and Next State Definition for: Pipeline and Flow Through Read Write Control State Diagram
Rev: 1.00b 12/2002
10/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Burst Cycles
Although NBT RAMs are designed to sustain 100% bus bandwidth by eliminating turnaround cycle when there is transition from
read to write, multiple back-to-back reads or writes may also be performed. NBT SRAMs provide an on-chip burst address
generator that can be utilized, if desired, to further simplify burst read or write implementations. The ADV control pin, when
driven high, commands the SRAM to advance the internal address counter and use the counter generated address to read or write
the SRAM. The starting address for the first cycle in a burst cycle series is loaded into the SRAM by driving the ADV pin low, into
Load mode.
Burst Order
The burst address counter wraps around to its initial state after four addresses (the loaded address and three more) have been
accessed. The burst sequence is determined by the state of the Linear Burst Order pin (LBO). When this pin is low, a linear burst
sequence is selected. When the RAM is installed with the LBO pin tied high, Interleaved burst sequence is selected. See the tables
below for details.
Mode Pin Functions
Mode Name
Pin Name State
Function
Linear Burst
Interleaved Burst
Active
L
Burst Order Control
LBO
H
L or NC
Power Down Control
ZZ
Standby, I = I
H
DD SB
Note:
There is a pull-up device on the and FT pin and a pull-down device on the ZZ pin, so those input pins can be unconnected and the chip will
operate in the default states as specified in the above tables.
Burst Counter Sequences
Linear Burst Sequence
Interleaved Burst Sequence
A[1:0] A[1:0] A[1:0] A[1:0]
A[1:0] A[1:0] A[1:0] A[1:0]
1st address
2nd address
3rd address
4th address
00
01
10
11
01
10
11
00
10
11
00
01
11
00
01
10
1st address
2nd address
3rd address
4th address
00
01
10
11
01
00
11
10
10
11
00
01
11
10
01
00
Note: The burst counter wraps to initial state on the 5th clock.
Note: The burst counter wraps to initial state on the 5th clock.
BPR 1999.05.18
Rev: 1.00b 12/2002
11/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Sleep Mode
During normal operation, ZZ must be pulled low, either by the user or by it’s internal pull down resistor. When ZZ is pulled high,
the SRAM will enter a Power Sleep mode after 2 cycles. At this time, internal state of the SRAM is preserved. When ZZ returns to
low, the SRAM operates normally after ZZ recovery time.
Sleep mode is a low current, power-down mode in which the device is deselected and current is reduced to I 2. The duration of
SB
Sleep mode is dictated by the length of time the ZZ is in a high state. After entering Sleep mode, all inputs except ZZ become
disabled and all outputs go to High-Z The ZZ pin is an asynchronous, active high input that causes the device to enter Sleep mode.
When the ZZ pin is driven high, I 2 is guaranteed after the time tZZI is met. Because ZZ is an asynchronous input, pending
SB
operations or operations in progress may not be properly completed if ZZ is asserted. Therefore, Sleep mode must not be initiated
until valid pending operations are completed. Similarly, when exiting Sleep mode during tZZR, only a deselect or read commands
may be applied while the SRAM is recovering from Sleep mode.
Sleep Mode Timing Diagram
CK
tZZR
ZZ
Sleep
tZZS
tZZH
Designing for Compatibility
The GSI NBT SRAMs offer users a configurable selection between Flow Through mode and Pipeline mode via the FT signal found
on Pin 14. Not all vendors offer this option, however most mark Pin 14 as V or V
on pipelined parts and V on flow
SS
DD
DDQ
through parts. GSI NBT SRAMs are fully compatible with these sockets.
Pin 66, a No Connect (NC) on GSI’s GS880Z18B/36 NBT SRAM, the Parity Error open drain output on GSI’s GS881Z18/36B
NBT SRAM, is often marked as a power pin on other vendor’s NBT compatible SRAMs. Specifically, it is marked V or V
DD
DDQ
on pipelined parts and V on flow through parts. Users of GSI NBT devices who are not actually using the ByteSafe™ parity
SS
feature may want to design the board site for the RAM with Pin 66 tied high through a 1k ohm resistor in Pipeline mode
applications or tied low in Flow Through mode applications in order to keep the option to use non-configurable devices open. By
using the pull-up resistor, rather than tying the pin to one of the power rails, users interested in upgrading to GSI’s ByteSafe NBT
SRAMs (GS881Z18/36B), featuring Parity Error detection and JTAG Boundary Scan, will be ready for connection to the active
low, open drain Parity Error output driver at Pin 66 on GSI’s TQFP ByteSafe RAMs.
Rev: 1.00b 12/2002
12/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Absolute Maximum Ratings
(All voltages reference to V
)
SS
Symbol
Description
Value
Unit
V
V
Voltage on V Pins
–0.5 to 4.6
DD
DD
V
Voltage in V
Pins
DDQ
–0.5 to 4.6
V
DDQ
V
–0.5 to V
+0.5 (≤ 4.6 V max.)
DDQ
Voltage on I/O Pins
Voltage on Other Input Pins
Input Current on Any Pin
Output Current on Any I/O Pin
Package Power Dissipation
Storage Temperature
V
I/O
V
–0.5 to V +0.5 (≤ 4.6 V max.)
V
IN
DD
I
+/–20
+/–20
mA
mA
W
IN
I
OUT
P
1.5
D
o
T
–55 to 125
–55 to 125
C
STG
o
T
Temperature Under Bias
C
BIAS
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended
Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended period of time, may affect reliability of
this component.
Rev: 1.00b 12/2002
13/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Power Supply Voltage Ranges
Parameter
Symbol
Min.
3.0
Typ.
3.3
Max.
3.6
Unit
Notes
V
3.3 V Supply Voltage
2.5 V Supply Voltage
V
V
V
V
DD3
V
2.3
2.5
2.7
DD2
3.3 V V
2.5 V V
I/O Supply Voltage
I/O Supply Voltage
V
3.0
3.3
3.6
DDQ
DDQ
DDQ3
V
2.3
2.5
2.7
DDQ2
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
V
Range Logic Levels
Parameter
DDQ3
Symbol
Min.
2.0
Typ.
—
Max.
Unit
Notes
V
Input High Voltage
V
V
+ 0.3
DD
V
V
V
V
1
DD
IH
V
Input Low Voltage
V
–0.3
2.0
—
0.8
+ 0.3
1
DD
IL
V
I/O Input High Voltage
I/O Input Low Voltage
V
V
—
1,3
1,3
DDQ
IHQ
DDQ
V
V
–0.3
—
0.8
DDQ
ILQ
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
3. VIHQ (max) is voltage on VDDQ pins plus 0.3 V.
V
Range Logic Levels
Parameter
DDQ2
Symbol
Min.
Typ.
—
Max.
Unit
Notes
V
Input High Voltage
V
0.6*V
V
+ 0.3
DD
V
V
V
V
1
DD
IH
DD
V
Input Low Voltage
V
0.3*V
DD
–0.3
—
1
DD
IL
V
I/O Input High Voltage
I/O Input Low Voltage
V
0.6*V
V
+ 0.3
DDQ
—
1,3
1,3
DDQ
IHQ
DD
V
V
0.3*V
DD
–0.3
—
DDQ
ILQ
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
3. VIHQ (max) is voltage on VDDQ pins plus 0.3 V.
Rev: 1.00b 12/2002
14/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Recommended Operating Temperatures
Parameter
Symbol
Min.
0
Typ.
25
Max.
70
Unit
°C
Notes
T
Ambient Temperature (Commercial Range Versions)
2
2
A
T
Ambient Temperature (Industrial Range Versions)
Note:
–40
25
85
°C
A
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
Undershoot Measurement and Timing
Overshoot Measurement and Timing
V
IH
20% tKC
V
+ 2.0 V
50%
DD
V
SS
50%
V
DD
V
– 2.0 V
SS
20% tKC
V
IL
Capacitance
o
(T = 25 C, f = 1 MHZ, V = 2.5 V)
A
DD
Parameter
Symbol
Test conditions
Typ.
Max.
Unit
pF
C
V
= 0 V
Input Capacitance
4
6
5
7
IN
IN
C
V
OUT
= 0 V
Input/Output Capacitance
pF
I/O
Note: These parameters are sample tested.
Package Thermal Characteristics
Rating
Junction to Ambient (at 200 lfm)
Junction to Ambient (at 200 lfm)
Junction to Case (TOP)
Notes:
Layer Board
Symbol
Max
40
Unit
Notes
1,2
R
R
R
single
four
—
°C/W
°C/W
°C/W
ΘJA
ΘJA
ΘJC
24
1,2
9
3
1. Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient. Temper-
ature air flow, board density, and PCB thermal resistance.
2. SCMI G-38-87
3. Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1
Rev: 1.00b 12/2002
15/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
AC Test Conditions
Parameter
Conditions
V
– 0.2 V
Input high level
Input low level
DD
0.2 V
1 V/ns
/2
Input slew rate
V
Input reference level
DD
V
/2
Output reference level
Output load
DDQ
Fig. 1
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
Output Load 1
DQ
*
50Ω
30pF
V
DDQ/2
* Distributed Test Jig Capacitance
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
I
V = 0 to V
IN DD
–1 uA
1 uA
IL
V
≥ V ≥ V
IN
–1 uA
–1 uA
1 uA
100 uA
DD
IH
IH
I
I
ZZ Input Current
FT Input Current
IN1
IN2
0 V ≤ V ≤ V
IN
V
≥ V ≥ V
IN
–100 uA
–1 uA
1 uA
1 uA
DD
IL
IL
0 V ≤ V ≤ V
IN
I
Output Disable, V
= 0 to V
DD
Output Leakage Current
Output High Voltage
Output High Voltage
Output Low Voltage
–1 uA
1.7 V
2.4 V
—
1 uA
—
OL
OUT
DDQ
DDQ
V
V
I
I
= –8 mA, V
= –8 mA, V
= 2.375 V
= 3.135 V
OH2
OH3
OH
OH
—
V
I
= 8 mA
OL
0.4 V
OL
Rev: 1.00b 12/2002
16/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Rev: 1.00b 12/2002
17/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
AC Electrical Characteristics
-250
-225
-200
-166
-150
-133
Parameter
Symbol
Unit
Min Max Min Max Min Max Min Max Min Max Min Max
Clock Cycle Time
Clock to Output Valid
Clock to Output Invalid
Clock to Output in Low-Z
Setup time
tKC
tKQ
4.0
—
—
2.5
—
—
—
—
—
5.5
—
—
—
—
—
—
4.4
—
—
2.7
—
—
—
—
—
6.0
—
—
—
—
—
—
5.0
—
—
3.0
—
—
—
—
—
6.5
—
—
—
—
—
—
6.0
—
—
3.4
—
—
—
—
—
7.0
—
—
—
—
—
—
6.7
—
—
3.8
—
—
—
—
—
7.5
—
—
—
—
—
—
7.5
—
1.5
1.5
1.5
0.5
8.5
—
3.0
3.0
1.5
0.5
1.7
2
—
4.0
—
—
—
—
—
8.5
—
—
—
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tKQX
1.5
1.5
1.2
0.2
5.5
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.3
0.3
6.0
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.4
0.4
6.5
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.5
0.5
7.0
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.5
0.5
7.5
—
3.0
3.0
1.5
0.5
1.5
1.7
Pipeline
1
tLZ
tS
tH
Hold time
Clock Cycle Time
Clock to Output Valid
Clock to Output Invalid
Clock to Output in Low-Z
Setup time
tKC
tKQ
tKQX
Flow
Through
1
tLZ
tS
tH
Hold time
Clock HIGH Time
Clock LOW Time
tKH
tKL
Clock to Output in
High-Z
1
1.5
2.5
1.5
2.7
1.5
3.0
1.5
3.0 1.5 3.0 1.5 3.0
ns
tHZ
G to Output Valid
G to output in Low-Z
G to output in High-Z
ZZ setup time
tOE
—
0
2.5
—
2.5
—
—
—
—
0
2.7
—
2.7
—
—
—
—
0
3.2
—
3.0
—
—
—
—
0
3.5
—
3.0
—
—
—
—
0
3.8
—
3.0
—
—
—
—
0
4.0
—
3.0
—
—
—
ns
ns
ns
ns
ns
ns
1
tOLZ
tOHZ
1
—
5
—
5
—
5
—
5
—
5
—
5
2
tZZS
tZZH
2
ZZ hold time
1
1
1
1
1
1
ZZ recovery
tZZR
20
20
20
20
20
20
Notes:
1. These parameters are sampled and are not 100% tested.
2. ZZ is an asynchronous signal. However, in order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold
times as specified above.
Rev: 1.00b 12/2002
18/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Rev: 1.00b 12/2002
19/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Rev: 1.00b 12/2002
20/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
TQFP Package Drawing
θ
L
c
L1
Symbol
Description
Standoff
Min. Nom. Max
A1
A2
b
0.05
1.35
0.20
0.09
0.10
1.40
0.30
—
0.15
1.45
0.40
0.20
20.1
20.1
16.1
14.1
—
Body Thickness
Lead Width
c
Lead Thickness
D
Terminal Dimension 21.9
Package Body 19.9
Terminal Dimension 15.9
22.0
20.0
16.0
14.0
0.65
0.60
1.00
—
e
D1
E
b
E1
e
Package Body
Lead Pitch
13.9
—
L
Foot Length
Lead Length
Coplanarity
Lead Angle
0.45
—
0.75
—
L1
Y
A1
A2
E1
E
—
0.10
7°
θ
0°
—
Notes:
1. All dimensions are in millimeters (mm).
2. Package width and length do not include mold protrusion.
BPR 1999.05.18
Rev: 1.00b 12/2002
21/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
Ordering Information—GSI NBT Synchronous SRAM
2
Speed
3
1
Org
Type
Package
Status
T
Part Number
A
(MHz/ns)
512K x 18
512K x 18
512K x 18
512K x 18
512K x 18
512K x 18
256K x 36
256K x 36
256K x 36
256K x 36
256K x 36
256K x 36
512K x 18
512K x 18
512K x 18
512K x 18
512K x 18
512K x 18
256K x 36
256K x 36
256K x 36
256K x 36
256K x 36
256K x 36
Notes:
GS880Z18BT-250
GS880Z18BT-225
GS880Z18BT-200
GS880Z18BT-166
GS880Z18BT-150
GS880Z18BT-133
GS880Z36BT-250
GS880Z36BT-225
GS880Z36BT-200
GS880Z36BT-166
GS880Z36BT-150
GS880Z36BT-133
GS880Z18BT-250I
GS880Z18BT-225I
GS880Z18BT-200I
GS880Z18BT-166I
GS880Z18BT-150I
GS880Z18BT-133I
GS880Z36BT-250I
GS880Z36BT-225I
GS880Z36BT-200I
GS880Z36BT-166I
GS880Z36BT-150I
GS880Z36BT-133I
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
NBT Pipeline/Flow Through
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
250/5.5
225/6
C
C
C
C
C
C
C
C
C
C
C
C
I
200/6.5
166/7
150/7.5
133/8.5
250/5.5
225/6
200/6.5
166/7
150/7.5
133/8.5
250/5.5
225/6
I
200/6.5
166/7
I
I
150/7.5
133/8.5
250/5.5
225/6
I
I
I
I
200/6.5
166/7
I
I
150/7.5
133/8.5
I
I
1. Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: Gs880Z18BT-150IT.
2. The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each
device is Pipeline/Flow Through mode-selectable by the user.
3. T = C = Commercial Temperature Range. T = I = Industrial Temperature Range.
A
A
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which are
covered in this data sheet. See the GSI Technology web site (www.gsitechnology.com) for a complete listing of current offerings
Rev: 1.00b 12/2002
22/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880Z18/36BT-250/225/200/166/150/133
9Mb Sync SRAM Data Sheet Revision History
DS/DateRev. Code: Old;
New
Types of Changes
Format or Content
Page;Revisions;Reason
• Creation of new datasheet
880Z18B_r1
Rev: 1.00b 12/2002
23/23
© 2001, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
相关型号:
SI9130DB
5- and 3.3-V Step-Down Synchronous ConvertersWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9135LG-T1
SMBus Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9135LG-T1-E3
SMBus Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9135_11
SMBus Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9136_11
Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9130CG-T1-E3
Pin-Programmable Dual Controller - Portable PCsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9130LG-T1-E3
Pin-Programmable Dual Controller - Portable PCsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9130_11
Pin-Programmable Dual Controller - Portable PCsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9137
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9137DB
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9137LG
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
SI9122E
500-kHz Half-Bridge DC/DC Controller with Integrated Secondary Synchronous Rectification DriversWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
-
VISHAY
©2020 ICPDF网 联系我们和版权申明