HSD32M72D16R-12N [HANBIT]

Synchronous DRAM Module 256Mbyte (32Mx64bit), DIMM with based on 16Mx8, 4Banks, 4K Ref., 3.3V; 同步DRAM模组256Mbyte ( 32Mx64bit ) , DIMM基于16Mx8 , 4Banks , 4K参考, 3.3V
HSD32M72D16R-12N
型号: HSD32M72D16R-12N
厂家: HANBIT ELECTRONICS CO.,LTD    HANBIT ELECTRONICS CO.,LTD
描述:

Synchronous DRAM Module 256Mbyte (32Mx64bit), DIMM with based on 16Mx8, 4Banks, 4K Ref., 3.3V
同步DRAM模组256Mbyte ( 32Mx64bit ) , DIMM基于16Mx8 , 4Banks , 4K参考, 3.3V

动态存储器
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HANBit  
HSD32M64D16R  
Synchronous DRAM Module256Mbyte (32Mx64bit), DIMM with based on 16Mx8,  
4Banks, 4K Ref., 3.3V  
Part No. HSD32M64D16R  
GENERAL DESCRIPTION  
The HSD32M64D16R is a 32M x 64 bit Synchronous Dynamic RAM high-density memory module. The module consists  
of sixteen CMOS 16M x 8 bit with 4banks Synchronous DRAMs in TSOP-II 400mil packages and 2K EEPROM in 8-pin  
TSSOP package on a 168-pin glass-epoxy. One 0.22uF and two 0.0022uF decoupling capacitors are mounted on the  
printed circuit board in parallel for each SDRAM. The HSD32M72D18AR is a DIMM (Dual in line Memory Module) and is  
intended for mounting into 168-pin edge connector sockets. Synchronous design allows precise cycle control with the use  
of system clock. I/O transactions are possible on every clock cycle. Range of operating frequencies, programmable  
latencies allows the same device to be useful for a variety of high bandwidth, high performance memory system  
applications All module components may be powered from a single 3.3V DC power supply and all inputs and outputs are  
LVTTL-compatible.  
FEATURES  
Part Identification  
HSD32M64D16R : 100MHz (CL=2, CL=3)  
HSD32M64D16R : 133MHz (CL=3)  
Burst mode operation  
Auto & self refresh capability (4096 Cycles/64ms)  
LVTTL compatible inputs and outputs  
Single 3.3V ±0.3V power supply  
MRS cycle with address key programs  
- Latency (Access from column address)  
- Burst length (1, 2, 4, 8 & Full page)  
- Data scramble (Sequential & Interleave)  
All inputs are sampled at the positive going edge of the system clock  
The used device is 4M x 8bit x 4Banks SDRAM  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 1 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
PIN ASSIGNMENT  
PIN Symbol  
PIN  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
Symbol  
DQM1  
/CE0  
NC  
PIN  
57  
58  
59  
60  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
73  
74  
75  
76  
77  
78  
79  
80  
81  
82  
83  
84  
Symbol  
DQ18  
DQ19  
Vcc  
PIN  
85  
Symbol  
Vss  
PIN  
113  
114  
115  
116  
117  
118  
119  
120  
121  
122  
123  
124  
125  
126  
127  
128  
129  
130  
131  
132  
Symbol  
DQM5  
/CE1  
/RAS  
Vss  
PIN  
141  
142  
143  
144  
145  
146  
147  
148  
149  
150  
151  
152  
153  
154  
155  
156  
157  
158  
159  
160  
161  
162  
163  
164  
165  
166  
167  
168  
Symbol  
DQ50  
DQ51  
Vcc  
1
Vss  
DQ0  
DQ1  
DQ2  
DQ3  
Vcc  
2
86  
DQ32  
DQ33  
DQ34  
DQ35  
Vcc  
3
87  
4
Vss  
DQ20  
NC  
88  
DQ52  
NC  
5
A0  
89  
A1  
6
A2  
NC  
90  
A3  
NC  
7
DQ4  
DQ5  
DQ6  
DQ7  
DQ8  
Vss  
A4  
NC  
91  
DQ36  
DQ37  
DQ38  
DQ39  
DQ40  
Vss  
A5  
REGE  
Vss  
8
A6  
Vss  
92  
A7  
9
A8  
DQ21  
DQ22  
DQ23  
Vss  
93  
A9  
DQ53  
DQ54  
DQ55  
Vss  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
A10  
94  
BA0  
A11  
Vcc  
BA1  
Vcc  
95  
96  
DQ9  
DQ10  
DQ11  
DQ12  
DQ13  
Vcc  
Vcc  
DQ24  
DQ25  
DQ26  
DQ27  
Vcc  
97  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
Vcc  
CLK1  
NC  
DQ56  
DQ57  
DQ58  
DQ59  
Vcc  
CLK0  
Vss  
98  
99  
Vss  
NC  
100  
101  
102  
103  
104  
105  
106  
107  
108  
109  
110  
111  
112  
CKE0  
/CE3  
DQM6  
DQM7  
NC  
/CE2  
DQM2  
DQM3  
NC  
DQ28  
DQ29  
DQ30  
DQ31  
Vss  
DQ60  
DQ61  
DQ62  
DQ63  
Vss  
DQ14  
DQ15  
NC(CB0)  
NC(CB1)  
Vss  
DQ46  
DQ47  
Vcc  
NC(CB4) 133  
NC(CB5) 134  
Vcc  
NC  
NC  
NC  
CLK2  
NC  
Vss  
NC  
135  
NC  
CLK3  
NC  
NC  
NC(CB2)  
NC(CB3)  
Vss  
136 NC(CB6)  
137 NC(CB7)  
NC  
WP  
NC  
SA0  
Vcc  
SDA  
SCL  
Vcc  
138  
139  
140  
Vss  
SA1  
/WE  
DQ16  
DQ17  
/CAS  
DQM4  
DQ48  
DQ49  
SA2  
DQM0  
Vcc  
Vcc  
* These pins are not used in this module ** These pins should be NC in the system which does not support SPD  
*Pin Names  
A0~A11: Address input (Multiplexed)  
BA0~BA1: Select bank  
CLK0: Clock input  
DQ0~DQ63: Data input/output  
CKE0: Clock enable input  
/CE0~/CE3: Chip select input  
/CAS: Coulmn address strobe  
DQM0~7: DQM  
/RAS: Row address strobe  
REGE: Register enable  
/WE: Write enable  
VCC: Power supply(3.3V)  
*VREF:Power supply for reference  
SA0~2: Address in EEPROM  
NC: No connection  
VSS: Ground  
SDA: Serial data I/O  
SCL: Serial clock  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 2 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
FUNCTIONAL BLOCK DIAGRAM  
** This module not used D4 and D13. ( NO Parity)  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 3 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
PIN FUNCTION DESCRIPTION  
Pin  
Name  
System clock  
Chip enable  
Input Function  
CLK  
/CE  
Active on the positive going edge to sample all inputs.  
Disables or enables device operation by masking or enabling all inputs except  
CLK, CKE and DQM  
CKE  
Clock enable  
Masks system clock to freeze operation from the next clock cycle.  
CKE should be enabled at least one cycle prior to new command.  
Disable input buffers for power down in standby.  
CKE should be enabled 1CLK+tss prior to valid command.  
Row/column addresses are multiplexed on the same pins.  
Row address : RA0 ~ RA11, Column address : CA0 ~ CA9  
A0 ~ A11  
BA0 ~ BA1  
/RAS  
Address  
Bank select address Selects bank to be activated during row address latch time.  
Selects bank for read/write during column address latch time.  
Row address strobe Latches row addresses on the positive going edge of the CLK with /RAS low.  
Enables row access & precharge.  
/CAS  
Column address  
strobe  
Latches column addresses on the positive going edge of the CLK with /CAS low.  
Enables column access.  
/WE  
Write enable  
Enables write operation and row precharge.  
Latches data in starting from /CAS, /WE active.  
DQM0 ~ 7  
REGE  
Data input/output  
mask  
Makes data output Hi-Z, tsHZ after the clock and masks the output.  
Blocks data input when DQM active. (Byte masking)  
The device operates in the transparent mode when REGE is low. When REGE is  
high, the  
Register enable  
device operates in the registered mode. In registered mode, the Address and  
control inputs are latched if CLK is held at a high or low logic level. The inputs are  
strobed in the latch/flip-flop on the riging edge of CLK. REGE is tied to VDD  
through 10K ohm register on PCB. So if REGE of module is floating, this module  
will be operated as registerd mode.  
DQ0 ~ 63  
WP  
Data input/output  
Write Protection  
Data inputs/outputs are multiplexed on the same pins.  
WP pin is connected to Vcc.  
When WP is high, EEPROM Programming will be inhibited and the entire  
memory will be write-protected.  
VDD/VSS  
Power  
Power and ground for the input buffers and the core logic.  
supply/ground  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 4 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
Voltage on Any Pin Relative to Vss  
Voltage on Vcc Supply Relative to Vss  
Power Dissipation  
SYMBOL  
VIN ,OUT  
Vcc  
RATING  
-1V to 4.6V  
-1V to 4.6V  
16W  
PD  
o
o
Storage Temperature  
TSTG  
-55 C to 150 C  
Short Circuit Output Current  
IOS  
50mA  
Notes:  
Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded. Functional operation should be  
restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum  
rating conditions for extended periods may affect device reliability.  
DC OPERATING CONDITIONS  
(Recommended operating conditions (Voltage referenced to Vss = 0V, TA = 0 to 70°C) )  
PARAMETER  
Supply Voltage  
SYMBOL  
Vcc  
VIH  
MIN  
3.0  
2.0  
-0.3  
2.4  
-
TYP.  
MAX  
3.6  
UNIT  
V
NOTE  
3.3  
Input High Voltage  
Input Low Voltage  
Output High Voltage  
Output Low Voltage  
3.0  
Vcc+0.3  
0.8  
V
1
VIL  
0
-
V
2
VOH  
VOL  
-
V
IOH = -2mA  
IOL = 2mA  
3
-
0.4  
V
Input leakage current  
I LI  
-10  
-
10  
uA  
Notes :  
1. VIH (max) = 5.6V AC. The overshoot voltage duration is £ 3ns.  
2. VIL (min) = -2.0V AC. The undershoot voltage duration is £ 3ns.  
3. Any input 0V £ VIN £ VDDQ  
.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.  
CAPACITANCE  
(Vcc = 3.3V, TA = 23°C, f = 1MHz, VREF =1.4V ± 200 mV)  
DESCRIPTION  
Input capacitance(A0~A11)  
SYMBOL  
CIN1  
MIN  
MAX  
19  
19  
33  
12  
12  
12  
12  
19  
19  
UNITS  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
Input capacitance(/RAS, /CAS,/WE)  
Input capacitance(CKE0)  
CIN2  
CIN3  
Input capacitance(CLK0)  
CIN4  
Input capacitance(/CE0~/CE3)  
Input capacitance(DQM0~DQM7)  
Input capacitance(BA0~BA1)  
CIN5  
CIN3  
CIN3  
Data input/output capacitance (DQ0 ~ DQ63)  
Data input/output capacitance (CB0 ~ CB7)  
COUT  
COUT1  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 5 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
DC CHARACTERISTICS  
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C)  
TEST  
VERSION  
-1L  
PARAMETER  
SYMBOL  
UNIT  
NOTE  
CONDITION  
Burst length = 1  
-1H  
-13  
Operating current  
(One bank active)  
ICC1  
tRC ³ tRC(min)  
1760  
1920  
mA  
1
IO = 0mA  
CKE £ VIL(max)  
Precharge  
standby ICC2  
P
16  
16  
mA  
mA  
3
3
tCC=10ns  
current in power-down  
mode  
CKE & CLK £ VIL(max)  
tCC=¥  
ICC2PS  
CKE ³ VIH(min)  
/CE ³ VIH(min), tcc=10ns  
Input signals are changed  
one time during 20ns  
CKE ³ VIH(min)  
ICC2  
N
320  
Precharge  
standby  
current in non power-  
down mode  
mA  
mA  
mA  
3
3
3
ICC2NS  
CLK £ VIL(max), tcc=¥  
Input signals are stable  
CKE £ VIL(max), tcc=10ns  
CKE&CLK £ VIL(max)  
tcc=¥  
112  
ICC3  
P
80  
80  
Active standby current in  
power-down mode  
ICC3PS  
CKE³ VIH(min),  
/CE³ VIH(min), tcc=10ns  
Input signals are changed  
one time during 20ns  
CKE³ VIH(min)  
ICC3  
N
480  
320  
Active standby current in  
non power-down mode  
(One bank active)  
ICC3NS  
CLK £VIL(max), tcc=¥  
Input signals are stable  
IO = 0 mA  
Operating current  
(Burst mode)  
Page burst  
ICC4  
2000  
3360  
2400  
3520  
mA  
1
4Banks Activated  
tCCD = 2CLKs  
Refresh current  
ICC5  
ICC6  
tRC ³ tRC(min)  
mA  
mA  
2
3
Self refresh current  
CKE £ 0.2V  
24  
Notes:  
1. Measured with outputs open.  
2. Refresh period is 64ms.  
3. Measured with 1PLL & 3 Drive Ics.  
4. Unless otherwise noticed, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ).  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 6 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
AC OPERATING TEST CONDITIONS  
(vcc = 3.3V ± 0.3V, TA = 0 to 70°C)  
PARAMETER  
Value  
2.4/0.4  
1.4  
UNIT  
V
AC Input levels (Vih/Vil)  
Input timing measurement reference level  
Input rise and fall time  
V
tr/tf = 1/1  
1.4  
ns  
V
Output timing measurement reference level  
Output load condition  
See Fig. 2  
+3.3V  
1200W  
V =1.4V  
tt  
DOUT  
870  
W
50pF*  
50W  
VOH (DC) = 2.4V, IOH = -2mA  
VOL (DC) = 0.4V, IOL = 2mA  
DOUT  
Z0=50W  
vss  
50pF  
(Fig. 1) DC output load circuit  
(Fig. 2) AC output load circuit  
OPERATING AC PARAMETER  
(AC operating conditions unless otherwise noted)  
VERSION  
PARAMETER  
SYMBOL  
UNIT  
NOTE  
-1H  
20  
20  
20  
50  
-1L  
20  
20  
20  
50  
-13  
15  
20  
20  
45  
Row active to row active delay  
/RAS to /CAS delay  
tRRD(min)  
tRCD(min)  
tRP(min)  
ns  
ns  
ns  
ns  
1
1
1
1
Row precharge time  
tRAS(min)  
tRAS(max)  
Row active time  
100  
70  
ns  
Row cycle time  
tRC(min)  
tRDL(min)  
tDAL(min)  
tCDL(min)  
tBDL(min)  
tCCD(min)  
70  
65  
ns  
CLK  
-
1
2,5  
5
Last data in to row precharge  
Last data in to Active delay  
Last data in to new col. address delay  
Last data in to burst stop  
2
2 CLK + 20 ns  
1
CLK  
CLK  
CLK  
2
1
2
Col. address to col. address delay  
1
3
CAS latency=3  
CAS latency=2  
2
Number of valid output data  
ea  
4
1
-
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 7 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
Notes :  
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and  
then rounding off to the next higher integer.  
2. Minimum delay is required to complete write.  
3. All parts allow every cycle column address change.  
4. In case of row precharge interrupt, auto precharge and read burst stop.  
.5. For -1H/1L, tRDL=1CLK and tDAL=1CLK+20ns is also supported .  
( recommend : tRDL=2CLK and tDAL=2CLK + 20ns.)  
AC CHARACTERISTICS  
(AC operating conditions unless otherwise noted)  
SYMBO  
L
-1H  
-1L  
-13  
PARAMETER  
UNIT  
ns  
NOTE  
1
MIN  
10  
10  
6
MAX  
MIN  
10  
MAX  
MIN  
7.5  
-
MAX  
CLK cycle time CAS latency=3  
CAS latency=2  
tCC  
tSAC  
tOH  
1000  
1000  
1000  
12  
CLK to valid  
output delay  
``Output data  
hold time  
CAS latency=3  
CAS latency=2  
CAS latency=3  
CAS latency=2  
6
7
5.4  
-
ns  
1,2  
1,2  
6
3
3
3
2.7  
-
ns  
3
CLK high pulse width  
CLK low pulse width  
Input setup time  
tCH  
tCL  
3
3
3
2
1
1
6
7
2.5  
2.5  
1.5  
0.8  
1
ns  
ns  
ns  
ns  
ns  
ns  
ns  
3
3
3
3
2
1
1
3
tSS  
tSH  
tSLZ  
2
Input hold time  
1
CLK to output in Low-Z  
1
CLK to output  
in Hi-Z  
CAS latency=3  
CAS latency=2  
6
6
5.4  
-
tSHZ  
Notes :  
1. Parameters depend on programmed CAS latency.  
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.  
3. Assumed input rise and fall time (tr & tf) = 1ns.  
If tr & tf is longer than 1ns, transient time compensation should be considered  
i.e., [(tr + tf)/2-1]ns should be added to the parameter.  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 8 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
SIMPLIFIED TRUTH TABLE  
/R  
A
S
/C  
A
S
D
Q
M
CKE  
CKE  
n
/C  
E
/W  
E
BA  
0,1  
A10/  
AP  
A11  
A9~A0  
n-1  
COMMAND  
NOTE  
Register  
Refresh  
Mode register set  
Auto refresh  
H
X
H
L
L
L
L
L
L
X
OP code  
X
1,2  
3
H
L
L
H
X
Entry  
3
Self  
refres  
h
L
H
L
H
X
L
H
X
H
H
X
H
3
Exit  
L
H
X
X
X
X
3
Bank active & row addr.  
H
V
V
Row address  
Auto  
precharge  
Read &  
column  
address  
L
H
L
Column  
Address  
(A0 ~ A9)  
4
4,5  
4
disable  
Auto  
H
H
X
X
L
L
H
H
L
L
H
H
X
X
precharge  
precharge  
precharge  
eable  
Auto  
Write &  
column  
address  
Column  
Address  
(A0 ~ A9)  
disable  
Auto  
V
L
L
L
H
4,5  
6
enable  
Burst Stop  
H
H
X
X
L
L
H
L
H
H
X
X
X
Precharg Bank selection  
V
X
L
X
e
All banks  
H
H
L
X
V
X
X
H
X
V
X
V
X
X
H
X
V
X
V
X
X
H
X
V
Entry  
Exit  
H
L
L
H
L
X
X
X
Clock suspend or  
active power down  
X
X
X
H
L
Entry  
H
Precharge power  
down mode  
H
L
Exit  
L
H
H
H
X
X
V
X
DQM  
X
X
X
7
H
L
X
H
X
X
H
No operation command  
H
(V=Valid, X=Don't care, H=Logic high, L=Logic low)  
Notes :  
1. OP Code : Operand code  
A0 ~ A11 & BA0 ~ BA1 : Program keys. (@ MRS)  
2. MRS can be issued only at all banks precharge state.  
A new command can be issued after 2 CLK cycles of MRS.  
3. Auto refresh functions are as same as CBR refresh of DRAM.  
The automatical precharge without row precharge command is meant by "Auto".  
Auto/self refresh can be issued only at all banks precharge state.  
4. BA0 ~ BA1 : Bank select addresses.  
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.  
If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank B is selected.  
If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank C is selected.  
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.  
If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected.  
5. During burst read or write with auto precharge, new read/write command can not be issued.  
Another bank read/write command can be issued after the end of burst.  
New row active of the associated bank can be issued at tRP after the end of burst.  
6. Burst stop command is valid at every burst length.  
7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0),  
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 9 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
TIMING DIAGRAMS  
td, tr = Delay of register (74LVC162835)  
Notes : 1.In case of module timing, command cycles 1CLK with respect to external input timing at the address  
and input signal because of the buffering in register (74LVC162835). Therefore, Input/Output signals of read/write function  
should be issued 1CLK earlier as compared to Unbuffered DIMMs.  
2. DIN is to be issued 1 clock after write command in external timing because DIN is issued directly to module.  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 10 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
PACKAGING INFORMATION  
Unit : inch [mm]  
Front Side  
TOLERANCE  
:
±0.008 [ ±0.20 ]  
Rear-Side  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 11 -  
HANBit Electronics Co.,Ltd  
HANBit  
HSD32M64D16R  
ORDERING INFORMATION  
Part Number  
Density  
Org.  
Package  
Ref.  
Vcc  
MODE  
MAX.frq  
CL3  
100MHz  
CL2  
HSD32M72D16R-10L  
HSD32M72D16R 10  
HSD32M72D16R 12N  
HSD32M72D16R 13N  
256MByte  
256MByte  
256MByte  
256MByte  
32M x 64 168 Pin-DIMM  
32M x 64 168 Pin-DIMM  
32M x 64 168 Pin-DIMM  
32M x 64 168 Pin-DIMM  
4K  
4K  
4K  
4K  
3.3V  
3.3V  
3.3V  
3.3V  
SDRAM  
SDRAM  
SDRAM  
SDRAM  
100MHz  
CL3  
125MHz  
CL3  
133MHz  
URL:www.hbe.co.kr  
REV.1.0 (August.2002).  
- 12 -  
HANBit Electronics Co.,Ltd  

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