N7788B [HP]
Optical Component Analyzer; 光学元件分析仪
| 型号： | N7788B |
| 厂家： | 
HEWLETT-PACKARD |
| 描述： | Optical Component Analyzer |
| 文件： | 总6页 (文件大小：230K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Agilent N7788B/BD
Optical Component
Analyzer
Data Sheet
Figure 1. N7788BD bench-top mainframe with built-in PC
Figure 2. N7788B bench-top mainframe
Introduction
Key Benefits
Agilent Technologies pushes the limits of component
measurements with the N7788B component analyzer.
Its proprietary technology is comparable with the well-
known Jones-Matrix-Eigenanalysis (JME) which is
the standard method for measuring polarization mode
dispersion (PMD) or differential group delay (DGD) of
optical devices.
●
Highest accuracy in a single sweep:
no averaging over multiple sweeps
required
High measurement speed: Complete
measurement across C/L-band in less
than 10 seconds (no need to wait for
many averages)
●
●
Compared to the JME, Agilent’s new single scan technology
offers a range of advantages:
Robustness against fiber movement/
vibration and drift: Fixing fibers with
sticky tape on the table or even operation
on isolated optical table is not required!
No limitation on optical path length
of component
A complete set of parameters:
●
●
●
●
●
●
●
DGD/PMD
PDL
Power/loss
TE/TM-loss
Jones matrices
Mueller matrices
2nd-order PMD
(depolarization + PCD)
Principal states of
polarization (PSPs)
●
●
●
The internal referencing scheme guarantees
reliable and accurate measurements.
The instrument setup is shown in the Figure 3. A LiNbO3
polarization controller determines the input polarization to
the DUT. While the tunable laser source is sweeping over
the desired wavelength range, a polarimeter analyzes the
output state of polarization while input polarization is being
modified. The result will be a highly accurate device charac-
terization with respect to DGD/PDL/loss, etc. Furthermore,
the internal optical switch provides continuous self calibra-
tion for excellent repeatability.
Applications
●
Fiber characterization: SMF, PMF, DCF
●
Passive component testing: filters, isolators,
circulators
●
Dynamic component / module testing:
OADM / ROADM
●
●
Active component testing: EDFAs, SOAs, VOAs
Link test: in-channel measurements across amplifiers
Resolving TE/TM insertion loss
The TE/TM-function allows accurate determination of the
minimum and maximum loss of the DUT at each wavelength.
Designed for the manufacturing floor
Due to birefringence, optical filters tend to show different
transmission functions depending on the polarization state.
As shown in Figure 4, these functions are typically shifted
in wavelength depending on the amount of birefringence.
High throughput
A complete analysis across the C and the L band is per-
formed in less than 10 seconds!
Software drivers
A range of software drivers is available for external control
of the system. This allows easy integration in common ERP
systems.
0
-10
-20
-30
-40
-50
Remote control
Control of the instrument through LAN or via the Internet
is supported. This supports automation as well as trouble
shooting.
Report generation
Generating PDF reports is supported. The content including
layout is configurable by the user.
Real time power readout
High throughput measurement of non-connectorized
components is supported by providing a real time power
readout which enables fiber coupling of the new device
1560
1561
1559
Wavelength [nm]
Figure 4. Polarization-dependent wavelength shift (PD-λ) of a filter.
Barcode scanner
Barcode scanning is supported for quick transfer of the
DUT serial number
The capability of performing quick PMD-measurements
makes this measurement system well-suited for collecting
long-term PMD data. The PC software allows to continuously
collect the spectral PMD data and store it on the hard disc.
The data can then be visualized as pseudo-color plot
(see Figure 5).
Agilent N7788B Instrument Setup and
Application Examples
DUT
Laser in
PMF
SMF
Polarimeter
LiNbO polarization controller
3
Trigger in
Trigger out
Power In
Microcontroller board
GPIB
USB
Figure 3. Instrument setup
2
DGD
Wavelength
Wavelength
DGD
Figure 5. Long term DGD measurements.
Due to the excellent spectral resolution, the Agilent N7788B
is best suited for intra-channel DGD/PDL characterization.
Particularly for characterizing optical filters, the high dynamic
range of the N7788B allows accurate resolution of the
filter’s side lobes.
The all-parameter-JME algorithm allows flexible adjustments
of the wavelength resolution without the need to repeat
the measurement. This allows the user to easily find the
optimum trade-off between PDL/DGD accuracy and
wavelength resolution.
The internal reference path allows measurement of insertion
loss spectra with excellent accuracy, minimizing the influ-
ence of the power characteristics of the tunable laser source.
0
0
-10
-20
-20
-30
-40
-60
1521.2
1521.3
1521.4
1521.5
1545
1546
1547
1548
1549
Wavelength [nm]
Wavelength [nm]
Figure 7. Loss curve of a DPSK demodulator.
Figure 6. Side lobes of an optical filter.
3
Table 1: Specifications1) N7788B/BD Optical Component Analyzer
Wavelength
Specification wavelength range
1270 nm ... 1375 nm (Opt 300, O-Band)
1270 nm ... 1375 nm, 1460 nm ... 1620 nm (Opt 400, O/C/L-Band)
1460 nm ... 1620 nm (Opt 500, C/L-Band)
Operating wavelength range2)
Differential Delay
1260 nm ... 1640 nm
DGD uncertainty
Resolution 2,0 nm:
Resolution 0,1 nm:
0 ... 1000 ps
(30 fs + 2.0ꢀ ꢁ DGD)
3 fs
(30 fs + 0.3ꢀ ꢁ DGD)
(30 fs + 3.0ꢀ ꢁ DGD)
DGD measurement range3)
PMD uncertainty4)
PMD repeatability (typical)
PMD measurement range4)
Loss
0 ... 300 ps
PDL uncertainty (typical)5)
C/L-Band:
O-Band:
(0.05 dB + 4ꢀ ꢁ PDL)
(0.05 dB + 4ꢀ ꢁ PDL)
PDL repeatability (typical)
5 mdB
C/L-Band:
O-Band:
Insertion loss uncertainty (typical)3)
0.03 dB
0.07 dB
Insertion loss dynamic range (typical)3)
> 41 dB
(for higher TLS power levels, increase value accordingly)
Polarization Analysis
See N7781B
1) Ambient temperature change max 0.5ꢂC since normalization. Valid for 81600B Tunable Laser Source Family. TLS power set to -6
dBm. Sweep over specification wavelength range. Specification does not include instability in test device. Specified loss ranges include
loss of test device and any additional switches or connections in the optical path. Specification valid on day of calibration.
2) SOP/DOP measurements are only possible outside the specification wavelength range if the user performs a manual calibration.
3) DUT properties: Insertion loss < 30 dB, PDL < 1 dB, DGD < 150 ps. Specification is typical for DGD > 150 ps.
4) DUT properties: Insertion loss < 41 dB, PDL < 3 dB, PMD < 50 ps. Applies for highly mode-coupled devices such as single mode
fibers. Specification applies for PMD being averaged DGD over a wavelength span of 100 nm. Specification is typical for PMD < 50 ps.
5) DUT properties: Insertion loss < 25 dB, PDL < 6 dB. Note: DUT connectors are considered as being part of the DUT. Thus, angled con-
nectors will add to the device PDL.
4
5
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Revised: May 7, 2007
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Product specifications and descriptions in this
document subject to change without notice.
© Agilent Technologies, Inc. 2008
Printed in USA, April 29, 2008
5989-8116EN
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