HY62KF16403E-SD70I [HYNIX]

Standard SRAM, 256KX16, 55ns, CMOS, PDSO44, 0.400 INCH, TSOP2-44;
HY62KF16403E-SD70I
型号: HY62KF16403E-SD70I
厂家: HYNIX SEMICONDUCTOR    HYNIX SEMICONDUCTOR
描述:

Standard SRAM, 256KX16, 55ns, CMOS, PDSO44, 0.400 INCH, TSOP2-44

静态存储器 光电二极管 内存集成电路
文件: 总10页 (文件大小:85K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HY62KF16403E Series  
256Kx16bit full CMOS SRAM  
Document Title  
256K x 16bit 2.7 ~ 3.6V Super low Power FCMOS Slow SRAM  
Revision History  
Revision No History  
Draft Date  
Remark  
00  
Initial Draft  
Dec.26.2001  
Preliminary  
This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility  
for use of circuits described. No patent licenses are implied.  
Rev.00 / Dec.01  
Hynix Semiconductor  
HY62KF16403E Series  
DESCRIPTION  
FEATURES  
The HY62KF16403E is a high speed, super low  
power and 4Mbit full CMOS SRAM organized as  
256K words by 16bits. The HY62KF16403E uses  
high performance full CMOS process technology  
and is designed for high speed and low power  
circuit technology. It is particularly well-suited for  
the high density low power system application.  
This device has a data retention mode that  
guarantees data to remain valid at a minimum  
power supply voltage of 1.2V.  
·
·
·
Fully static operation and Tri-state output  
TTL compatible inputs and outputs  
Battery backup  
-. 1.2V(min) data retention  
Standard pin configuration  
·
-. 44pin 400mil TSOP-II (Forward)  
Standby  
Temperature  
Current(uA)  
Voltage  
Operation  
Current/Icc(mA)  
Product No.  
Speed (ns)  
55/70  
(V)  
(°C)  
SL  
6
LL  
15  
HY62KF16403E-I 2.7~3.6  
4
-40~85  
Note 1. I : Industrial  
2. Current value is max.  
PIN CONNECTION  
BLOCK DIAGRAM  
ROW  
DECODER  
A4  
A3  
A2  
A1  
A0  
A5  
A6  
A7  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
A0  
I/O1  
I/O8  
I/O9  
I/O16  
/OE  
/UB  
/LB  
I/O16  
I/O15  
I/O14  
I/O13  
Vss  
Vcc  
I/O12  
I/O11  
I/O10  
I/O9  
NC  
/CS  
I/O1  
I/O2  
I/O3  
I/O4  
Vcc  
Vss  
I/O5  
I/O6  
I/O7  
I/O8  
/WE  
A17  
A16  
A15  
A14  
A13  
MEMORY ARRAY  
256K x 16  
A17  
/CS  
A8  
A9  
A10  
A11  
A12  
/OE  
/LB  
/UB  
TSOPII  
(Forward)  
/WE  
PIN DESCRIPTION  
Pin Name  
Pin Function  
Chip Select  
Write Enable  
Output Enable  
Lower Byte Control (I/O1~I/O8)  
Pin Name  
I/O1~I/O16  
A0~A17  
Vcc  
Pin Function  
Data Inputs/Outputs  
Address Inputs  
Power (2.7~3.6V)  
Ground  
/CS  
/WE  
/OE  
/LB  
Vss  
/UB  
Upper Byte Control (I/O9~I/O16) NC  
No Connection  
Rev.00 / Dec.01  
2
HY62KF16403E Series  
ORDERING INFORMATION  
Part No.  
HY62KF16403E-SD(I)  
HY62KF16403E-DD(I)  
Speed  
55/70  
55/70  
Power  
SL-part  
LL-part  
Temp.  
Package  
TSOP-II  
TSOP-II  
I
I
Note 1. I : Industrial  
ABSOLUTE MAXIMUM RATINGS (1)  
Symbol  
VIN, VOUT  
Vcc  
TA  
TSTG  
Parameter  
Input/Output Voltage  
Power Supply  
Operating Temperature  
Storage Temperature  
Power Dissipation  
Rating  
Unit  
V
V
°C  
°C  
Remark  
-0.3 to VCC+0.3V  
-0.3 to 4.6  
-40 to 85  
-55 to 150  
1.0  
HY62KF16403E-I  
PD  
W
TSOLDER  
Ball Soldering Temperature & Time  
260 · 10  
°C·sec  
Note  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent  
damage to the device. This is stress rating only and the functional operation of the device under these or  
any other conditions above those indicated in the operation of this specification is not implied.  
Exposure to the absolute maximum rating conditions for extended period may affect reliability.  
TRUTH TABLE  
I/O Pin  
/CS  
H
/WE  
/OE /LB /UB  
Mode  
Power  
Standby  
Active  
I/O1~I/O8  
I/O9~I/O16  
X
H
X
X
H
X
X
X
H
L
H
L
X
X
H
H
L
Deselected  
High-Z  
High-Z  
L
Output Disabled  
High-Z  
High-Z  
DOUT  
High-Z  
DOUT  
DIN  
High-Z  
DIN  
High-Z  
DOUT  
DOUT  
High-Z  
DIN  
L
L
H
L
L
Read  
Write  
Active  
Active  
L
L
H
L
H
L
L
X
DIN  
Note:  
1. H=VIH, L=VIL, X=don't care (VIL or VIH)  
2. /UB, /LB(Upper, Lower Byte enable)  
These active LOW inputs allow individual bytes to be written or read.  
When /LB is LOW, data is written or read to the lower byte, I/O 1 -I/O 8.  
When /UB is LOW, data is written or read to the upper byte, I/O 9 -I/O 16.  
Rev.00 / Dec.01  
2
HY62KF16403E Series  
RECOMMENDED DC OPERATING CONDITION  
Symbol  
Vcc  
Vss  
VIH  
VIL  
Parameter  
Supply Voltage  
Ground  
Input High Voltage  
Input Low Voltage  
Min.  
2.7  
0
Typ  
3.0 or 3.3  
Max.  
3.6  
0
Vcc+0.3  
0.6  
Unit  
V
V
V
V
0
-
-
2.2  
-0.31.  
Note : 1. Undershoot : VIL = -1.5V for pulse width less than 30ns  
2. Undershoot is sampled, not 100% tested.  
DC ELECTRICAL CHARACTERISTICS  
TA = -40°C to 85°C  
Sym  
ILI  
Parameter  
Input Leakage Current  
Test Condition  
Vss < VIN < Vcc  
Min Typ1.  
Max  
1
Unit  
uA  
-1  
-
Vss < VOUT < Vcc, /CS = VIH or  
/OE = VIH or /WE = VIL  
/CS = VIL,  
ILO  
Icc  
Output Leakage Current  
-1  
-
1
4
uA  
Operating Power Supply Current  
mA  
VIN = VIH or VIL, II/O = 0mA  
/CS = VIL,  
VIN = VIH or VIL, Cycle  
Time = Min,  
3.0~ 55ns  
3.6V  
2.7~ 55ns  
25  
20  
20  
15  
mA  
mA  
mA  
mA  
70ns  
100% Duty, II/O = 0mA  
3.3V  
70ns  
ICC1  
Average Operating Current  
/CS < 0.2V,  
VIN < 0.2V or VIN > Vcc-0.2V,  
Cycle Time = 1us,  
100% Duty, II/O = 0mA  
/CS = VIH  
3
mA  
ISB  
Standby Current (TTL Input)  
Standby Current (CMOS Input)  
300  
uA  
VIN = VIH or VIL  
/CS > Vcc - 0.2V,  
SL  
LL  
SL  
LL  
0.2  
0.2  
0.2  
0.2  
-
6
15  
6
12  
0.4  
-
uA  
uA  
uA  
uA  
V
3.0~  
VIN > Vcc - 0.2V or  
VIN < Vss + 0.2V  
3.6V  
2.7~  
3.3V  
ISB1  
VOL  
VOH  
Output Low  
Output High  
IOL = 2.1mA  
IOH = -1.0mA  
-
2.4  
-
V
Note  
1. Typical values are at Vcc = 3.0V TA = 25°C  
2. Typical values are not 100% tested  
CAPACITANCE  
(Temp = 25°C, f= 1.0MHz)  
Symbol  
CIN  
COUT  
Parameter  
Input Capacitance (Add, /CS, /WE, /OE)  
Output Capacitance (I/O)  
Condition  
VIN = 0V  
VI/O = 0V  
Max.  
8
10  
Unit  
pF  
pF  
Note : These parameters are sampled and not 100% tested  
Rev.00 / Dec.01  
3
HY62KF16403E Series  
AC CHARACTERISTICS  
TA = -40°C to 85°C, unless otherwise specified  
55ns  
70ns  
#
Symbol  
Parameter  
Unit  
Min. Max. Min.  
Max.  
READ CYCLE  
1
2
3
4
5
6
7
8
9
tRC  
tAA  
tACS  
tOE  
tBA  
tCLZ  
tOLZ  
tBLZ  
tCHZ  
Read Cycle Time  
Address Access Time  
Chip Select Access Time  
Output Enable to Output Valid  
/LB, /UB Access Time  
Chip Select to Output in Low Z  
Output Enable to Output in Low Z  
/LB, /UB Enable to Output in Low Z  
Chip Deselection to Output in High Z  
Out Disable to Output in High Z  
/LB, /UB Disable to Output in High Z  
Output Hold from Address Change  
55  
-
-
-
-
10  
5
10  
0
0
0
-
70  
-
-
-
-
10  
5
10  
0
0
0
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
55  
55  
30  
55  
-
-
-
20  
20  
20  
-
70  
70  
35  
70  
-
-
-
25  
25  
25  
-
10 tOHZ  
11 tBHZ  
12 tOH  
10  
10  
WRITE CYCLE  
13 tWC  
14 tCW  
15 tAW  
16 tBW  
17 tAS  
18 tWP  
19 tWR  
20 tWHZ  
21 tDW  
22 tDH  
23 tOW  
Write Cycle Time  
55  
50  
50  
50  
0
45  
0
0
-
-
-
-
-
-
-
20  
-
-
70  
60  
60  
60  
0
50  
0
0
-
-
-
-
-
-
-
20  
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Chip Selection to End of Write  
Address Valid to End of Write  
/LB, /UB Valid to End of Write  
Address Set-up Time  
Write Pulse Width  
Write Recovery Time  
Write to Output in High Z  
Data to Write Time Overlap  
Data Hold from Write Time  
Output Active from End of Write  
25  
0
5
30  
0
5
-
-
AC TEST CONDITIONS  
TA = -40°C to 85°C, unless otherwise specified  
Parameter  
Value  
Input Pulse Level  
Input Rise and Fall Time  
0.4V to 2.2V  
5ns  
Input and Output Timing Reference Level  
Output Load tCLZ, tOLZ, tCHZ, tOHZ, tWHZ, tOW  
Others  
1.5V  
CL = 5pF + 1TTL Load  
CL = 30pF + 1TTL Load  
AC TEST LOADS  
VTM=2.8V  
1029 Ohm  
DOUT  
CL(1)  
1728 Ohm  
Note 1. Including jig and scope capacitance  
Rev.00 / Dec.01  
4
HY62KF16403E Series  
TIMING DIAGRAM  
READ CYCLE 1 (Note 1,4)  
tRC  
ADDR  
/CS  
tAA  
tACS  
tOH  
tCHZ(3)  
tBA  
/UB ,/ LB  
/OE  
tBHZ(3)  
tOE  
tOLZ(3)  
tBLZ(3)  
tOHZ(3)  
tCLZ(3)  
Data  
High-Z  
Out  
Data Valid  
READ CYCLE 2 (Note 1,2,4)  
tRC  
ADDR  
tAA  
tOH  
tOH  
Data  
Previous Data  
Out  
Data Valid  
READ CYCLE 3(Note 1,2,4)  
/CS  
/UB, /LB  
tACS  
tCLZ(3)  
tCHZ(3)  
Data  
Out  
Data Valid  
Notes:  
1. A read occurs during the overlap of a low /OE, a high /WE, a low /CS and /UB and/or /LB .  
2. /OE = VIL  
3. Transition is measured + 200mV from steady state voltage.  
This parameter is sampled and not 100% tested.  
4. /CS in high for the standby, low for active  
/UB and /LB in high for the standby, low for active  
Rev.00 / Dec.01  
5
HY62KF16403E Series  
WRITE CYCLE 1 (1,4,8) (/WE Controlled)  
tWC  
tCW  
ADDR  
tWR(2)  
/CS  
tAW  
tBW  
/UB,/LB  
tWP  
/WE  
tAS  
tDW  
Data Valid  
tDH  
Data In  
High-Z  
tWHZ(3,7)  
(5)  
(6)  
tOW  
Data  
Out  
WRITE CYCLE 2 (Note 1,4,8) (/CS Controlled)  
tWC  
ADDR  
tAS  
tWR(2)  
tCW  
/CS  
tAW  
tBW  
/UB,/LB  
/WE  
tWP  
tDW  
Data Valid  
tDH  
High-Z  
Data In  
High-Z  
Data  
Out  
Rev.00 / Dec.01  
6
HY62KF16403E Series  
Notes:  
1. A write occurs during the overlap of a low /WE, a low /CS and a low /UB and/or /LB .  
2. tWR is measured from the earlier of /CS, /LB, /UB, or /WE going high to the end of write cycle.  
3. During this period, I/O pins are in the output state so that the input signals of opposite phase to the  
output must not be applied.  
4. If the /CS, /LB and /UB low transition occur simultaneously with the /WE low transition or after the  
/WE transition, outputs remain in a high impedance state.  
5. Q(data out) is the same phase with the write data of this write cycle.  
6. Q(data out) is the read data of the next address.  
7. Transition is measured + 200mV from steady state.  
This parameter is sampled and not 100% tested.  
8. /CS in high for the standby, low for active  
/UB and /LB in high for the standby, low for active  
DATA RETENTION ELECTRIC CHARACTERISTIC  
TA = -40°C to 85°C  
Symbol  
Parameter  
Test Condition  
/CS > Vcc - 0.2V,  
Min  
Typ1. Max  
Unit  
VDR  
Vcc for Data Retention  
VIN > Vcc - 0.2V or  
VIN < Vss + 0.2V  
Vcc=1.5V,  
/CS > Vcc - 0.2V or  
VIN > Vcc - 0.2V or  
VIN < Vss + 0.2V  
1.2  
-
3.6  
V
SL  
LL  
-
-
0.1  
0.1  
3
uA  
uA  
Iccdr  
Data Retention Current  
10  
Chip Deselect to Data  
Retention Time  
Operating Recovery Time  
tCDR  
tR  
0
-
-
-
-
ns  
ns  
See Data Retention Timing Diagram  
tRC  
Notes:  
1. Typical values are under the condition of TA = 25°C.  
2. Typical value are sampled and not 100% tested  
DATA RETENTION TIMING DIAGRAM  
DATA RETENTION MODE  
VCC  
2.7V  
tCDR  
tR  
VIH  
VDR  
/CS >VCC-0.2V  
/CS  
VSS  
Rev.00 / Dec.01  
7
HY62KF16403E Series  
PACKAGE INFORMATION  
44pin 400mil Thin Small Outline Package Forward (D)  
#44  
#23  
Max.  
UNIT : INCH(mm)  
Min.  
0.470(11.938)  
0.462(11.735)  
#1  
#22  
0.729(18.517)  
0.721(18.313)  
0.404(10.262)  
0.396(10.058)  
0.047(1.194)  
0.039(0.991)  
0.0083(0.21)  
0.0047(0.120)  
0.10MAX  
0.004MAX  
0.0235(0.597)  
0~5  
0.0160(0.406)  
0.016(0.4)  
0.012(0.3)  
0.0059(0.150)  
0.002(0.050)  
0.0315(0.800)  
BSC  
Rev.00 / Dec.01  
8
HY62KF16403E Series  
MARKING INFORMATION  
Package  
Marking Example  
h
H
K
y
Y
O
n
6
i
x
y
y
c
w
s
w
s
p
t
TSOP-II  
(Forward)  
2
E
K
A
F
6
4
0
3
E
R
Index  
hynix  
: hynix Logo  
yy  
: Year ( ex : 02 = year 2002, 03 = year 2002 )  
: Work Week ( ex : 12 = ww12 )  
: Process Code  
ww  
p  
HY62KF6403E  
c  
: Part Name  
: Power Consumption  
- D  
- S  
: Low Low Power  
: Super Low Power  
ss  
: Speed  
- 55  
- 70  
: 55ns  
: 70ns  
t
: Temperature  
- I  
°
: Industrial ( -40 ~ 85 C )  
KOREA  
: Origin Country  
Note  
- Capital Letter  
- Small Letter  
: Fixed Item  
: Non-fixed Item (Except hynix)  
Rev.00 / Dec.01  
9

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