HY62UF16403A [HYNIX]
256Kx16bit full CMOS SRAM; 256Kx16bit全CMOS SRAM
| 型号： | HY62UF16403A |
| 厂家： | 
HYNIX SEMICONDUCTOR |
| 描述： | 256Kx16bit full CMOS SRAM |
| 文件： | 总10页 (文件大小：188K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
HY62UF16403A Series
256Kx16bit full CMOS SRAM
Document Title
256K x16 bit 2.7 ~ 3.3V Super Low Power FCMOS Slow SRAM
Revision History
Revision No History
Draft Date
Remark
Final
09
Marking Information add
Dec.18.2000
tBLZ / tOLZ value is changed
Output Load is redefined
Isb, Isb1, Vdr, Iccdr are redefined
10
11
Changed Logo
Mar.23.2001
Jun.07.2001
Final
Final
Changed Isb1 values
This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility
for use of circuits described. No patent licenses are implied.
Rev.11 / Jun.01
Hynix Semiconductor
HY62UF16403A Series
DESCRIPTION
FEATURES
The HY62UF16403A is a high speed, super low
power and 4Mbit full CMOS SRAM organized as
256K words by 16bits. The HY62UF16403A uses
high performance full CMOS process technology
and is designed for high speed and low power
circuit technology. It is particularly well-suited for
the high density low power system application.
This device has a data retention mode that
guarantees data to remain valid at a minimum
power supply voltage of 1.2V.
·
·
·
Fully static operation and Tri-state output
TTL compatible inputs and outputs
Battery backup
-. 1.2V(min) data retention
Standard pin configuration
-. 48-ball uBGA
·
Standby
Temperature
Current(uA)
Voltage
Operation
Current/Icc(mA)
Product No.
Speed (ns)
(V)
(°C)
LL
15
15
SL
6
HY62UF16403A
2.7~3.3
HY62UF16403A-I 2.7~3.3
55/70/85
55/70/85
5
5
0~70
6
-40~85(I)
Note 1. Blank : Commercial, I : Industrial
2. Current value is max.
PIN CONNECTION
BLOCK DIAGRAM
1
2
3
4
5
6
ROW
DECODER
I/O1
I/O8
I/O9
I/O16
A0
/LB /OE A0
A1
A2
NC
A
IO9
A3
A5
A4
A6
IO1
/UB
/CS
B
C
D
E
F
IO10
Vss
IO2 IO3
IO4 Vcc
IO11
IO12
IO13
IO14
A17 A7
MEMORY ARRAY
256K x 16
Vcc
NC A16 IO5 Vss
A14 A15 IO6 IO7
IO15
A17
/CS
IO16 NC A12 A13 /WE IO8
G
H
NC
A9
A10 A11 NC
A8
/OE
/LB
uBGA
/UB
/WE
PIN DESCRIPTION
Pin Name
Pin Function
Chip Select
Write Enable
Output Enable
Pin Name
I/O1~I/O16
A0~A17
Vcc
Pin Function
Data Inputs/Outputs
Address Inputs
Power (2.7~3.3V)
Ground
/CS
/WE
/OE
/LB
Lower Byte Control (I/O1~I/O8)
Vss
/UB
Upper Byte Control (I/O9~I/O16) NC
No Connection
Rev.11 / Jun.01
2
HY62UF16403A Series
ORDERING INFORMATION
Part No.
Speed
Power
LL-part
SL-part
LL-part
SL-part
Temp.
Package
uBGA
uBGA
uBGA
uBGA
HY62UF16403ALLM
HY62UF16403ASLM
HY62UF16403ALLM-I
HY62UF16403ASLM-I
55/70/85
55/70/85
55/70/85
55/70/85
I
I
Note 1. Blank : Commercial, I : Industrial
ABSOLUTE MAXIMUM RATINGS (1)
Symbol
VIN, VOUT
Vcc
Parameter
Input/Output Voltage
Power Supply
Rating
-0.3 to 3.6
Unit
V
V
°C
°C
Remark
-0.3 to 4.6
0 to 70
-40 to 85
-55 to 150
1.0
TA
Operating Temperature
HY62UF16403A
HY62UF16403A-I
TSTG
PD
Storage Temperature
Power Dissipation
°C
W
TSOLDER
Ball Soldering Temperature & Time
260 · 10
°C·sec
Note
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent
damage to the device. This is stress rating only and the functional operation of the device under these or
any other conditions above those indicated in the operation of this specification is not implied.
Exposure to the absolute maximum rating conditions for extended period may affect reliability.
TRUTH TABLE
I/O Pin
/CS
/WE
/OE /LB /UB
Mode
Power
Standby
Active
I/O1~I/O8
I/O9~I/O16
H
X
X
X
X
X
X
H
L
X
L
X
H
X
L
H
L
Deselected
High-Z
High-Z
L
H
H
Output Disabled
High-Z
High-Z
DOUT
High-Z
DOUT
DIN
High-Z
DIN
High-Z
DOUT
DOUT
High-Z
DIN
L
H
L
Read
Write
Active
Active
H
L
L
L
H
L
H
L
L
L
L
X
DIN
Note:
1. H=VIH, L=VIL, X=don't care (VIL or VIH)
2. /UB, /LB(Upper, Lower Byte enable)
These active LOW inputs allow individual bytes to be written or read.
When /LB is LOW, data is written or read to the lower byte, I/O 1 -I/O 8.
When /UB is LOW, data is written or read to the upper byte, I/O 9 -I/O 16.
Rev.11 / Jun.01
2
HY62UF16403A Series
RECOMMENDED DC OPERATING CONDITION
Symbol
Vcc
Vss
VIH
VIL
Parameter
Supply Voltage
Ground
Input High Voltage
Input Low Voltage
Min.
2.7
0
Typ
3.0
0
-
-
Max.
3.3
0
Vcc+0.3
0.6
Unit
V
V
V
V
2.2
-0.31.
Note : 1. Undershoot : VIL = -1.5V for pulse width less than 30ns
2. Undershoot is sampled, not 100% tested.
DC ELECTRICAL CHARACTERISTICS
TA = 0°C to 70°C / -40°C to 85°C (I)
Sym
ILI
Parameter
Input Leakage Current
Test Condition
Vss < VIN < Vcc
Vss < VOUT < Vcc, /CS = VIH or
/OE = VIH or /WE = VIL or
/UB = VIH , /LB = VIH
/CS = VIL,
Min Typ1.
Max
1
Unit
uA
-1
-1
-
-
1
uA
ILO
Icc
Output Leakage Current
5
mA
mA
Operating Power Supply Current
VIN = VIH or VIL, II/O = 0mA
/CS = VIL,
50
VIN = VIH or VIL, Cycle Time = Min,
100% Duty, II/O = 0mA
/CS < 0.2V,
ICC1
Average Operating Current
5
mA
VIN < 0.2V or VIN > Vcc-0.2V,
Cycle Time = 1us,
100% Duty, II/O = 0mA
/CS = VIH or /UB, /LB = VIH
VIN = VIH or VIL
/CS > Vcc - 0.2V or
/UB, /LB > Vcc - 0.2V
VIN > Vcc - 0.2V or
VIN < Vss + 0.2V
IOL = 2.1mA
0.5
6
mA
uA
uA
ISB
Standby Current (TTL Input)
Standby Current (CMOS Input)
SL
LL
0.2
0.2
ISB1
15
VOL
VOH
Output Low
Output High
-
-
-
0.4
-
V
V
IOH = -1.0mA
2.4
Note
1. Typical values are at Vcc = 3.0V TA = 25°C
2. Typical values are not 100% tested
CAPACITANCE
(Temp = 25°C, f= 1.0MHz)
Symbol
CIN
COUT
Parameter
Input Capacitance(Add, /CS,/LB,/UB, /WE, /OE)
Output Capacitance(I/O)
Condition
VIN = 0V
VI/O = 0V
Max.
8
10
Unit
pF
pF
Note : These parameters are sampled and not 100% tested
Rev.11 / Jun.01
3
HY62UF16403A Series
AC CHARACTERISTICS
TA = 0°C to 70°C / -40°C to 85°C (I), unless otherwise specified
55ns
70ns
85ns
#
Symbol
Parameter
Unit
Min. Max. Min. Max.
Min
Max.
READ CYCLE
1
2
3
4
5
6
7
8
9
tRC
tAA
tACS
tOE
tBA
tCLZ
tOLZ
tBLZ
tCHZ
Read Cycle Time
Address Access Time
Chip Select Access Time
Output Enable to Output Valid
/LB, /UB Access Time
Chip Select to Output in Low Z
Output Enable to Output in Low Z
/LB, /UB Enable to Output in Low Z
Chip Deselection to Output in High Z
Out Disable to Output in High Z
/LB, /UB Disable to Output in High Z
Output Hold from Address Change
55
-
-
-
-
10
5
10
0
0
0
-
70
-
-
-
-
10
5
10
0
0
0
-
85
-
-
-
-
10
5
10
0
0
0
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
55
55
30
55
-
-
-
30
30
30
-
70
70
35
70
-
-
-
30
30
30
-
85
85
40
85
-
-
-
30
30
30
-
10 tOHZ
11 tBHZ
12 tOH
10
10
10
WRITE CYCLE
13 tWC
14 tCW
15 tAW
16 tBW
17 tAS
18 tWP
19 tWR
20 tWHZ
21 tDW
22 tDH
23 tOW
Write Cycle Time
55
50
50
50
0
45
0
0
-
-
-
-
-
-
-
20
-
-
70
60
60
60
0
50
0
0
-
-
-
-
-
-
-
20
-
-
85
70
70
70
0
60
0
0
-
-
-
-
-
-
-
25
-
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Chip Selection to End of Write
Address Valid to End of Write
/LB, /UB Valid to End of Write
Address Set-up Time
Write Pulse Width
Write Recovery Time
Write to Output in High Z
Data to Write Time Overlap
Data Hold from Write Time
Output Active from End of Write
25
0
5
30
0
5
35
0
5
-
-
-
AC TEST CONDITIONS
TA = 0°C to 70°C / -40°C to 85°C (I), unless otherwise specified
Parameter
Input Pulse Level
Input Rise and Fall Time
Value
0.4V to 2.2V
5ns
Input and Output Timing Reference Level
Output Load tCLZ, tOLZ, tBLZ, tCHZ, tOHZ, tBHZ, tWHZ, tOW
Others
1.5V
CL = 5pF + 1TTL Load
CL = 30pF + 1TTL Load
AC TEST LOADS
VTM=2.8V
1029 Ohm
DOUT
CL(1)
1728 Ohm
Note 1. Including jig and scope capacitance.
Rev.11 / Jun.01
4
HY62UF16403A Series
TIMING DIAGRAM
READ CYCLE 1 (Note 1,4)
tRC
ADDR
/CS
tAA
tACS
tOH
tCHZ(3)
tBA
/UB ,/ LB
/OE
tBHZ(3)
tOE
tOLZ(3)
tBLZ(3)
tOHZ(3)
tCLZ(3)
Data
High-Z
Out
Data Valid
READ CYCLE 2 (Note 1,2,4)
tRC
ADDR
tAA
tOH
tOH
Data
Previous Data
Out
Data Valid
READ CYCLE 3(Note 1,2,4)
/CS
/UB, /LB
tACS
tCLZ(3)
tCHZ(3)
Data
Out
Data Valid
Notes:
1. A read occurs during the overlap of a low /OE, a high /WE, a low /CS and /UB and/or /LB .
2. /OE = VIL
3. Transition is measured + 200mV from steady state voltage.
This parameter is sampled and not 100% tested.
4. /CS in high for the standby, low for active
/UB and /LB in high for the standby, low for active
Rev.11 / Jun.01
5
HY62UF16403A Series
WRITE CYCLE 1 (1,4,8) (/WE Controlled)
tWC
tCW
ADDR
tWR(2)
/CS
tAW
tBW
/UB,/LB
tWP
/WE
tAS
tDW
Data Valid
tDH
Data In
High-Z
tWHZ(3,7)
(5)
(6)
tOW
Data
Out
WRITE CYCLE 2 (Note 1,4,8) (/CS Controlled)
tWC
ADDR
tAS
tWR(2)
tCW
/CS
tAW
tBW
/UB,/LB
/WE
tWP
tDW
Data Valid
tDH
High-Z
Data In
High-Z
Data
Out
Rev.11 / Jun.01
6
HY62UF16403A Series
Notes:
1. A write occurs during the overlap of a low /WE, a low /CS and a low /UB and/or /LB .
2. tWR is measured from the earlier of /CS, /LB, /UB, or /WE going high to the end of write cycle.
3. During this period, I/O pins are in the output state so that the input signals of opposite phase to the
output must not be applied.
4. If the /CS, /LB and /UB low transition occur simultaneously with the /WE low transition or after the
/WE transition, outputs remain in a high impedance state.
5. Q(data out) is the same phase with the write data of this write cycle.
6. Q(data out) is the read data of the next address.
7. Transition is measured + 200mV from steady state.
This parameter is sampled and not 100% tested.
8. /CS in high for the standby, low for active
/UB and /LB in high for the standby, low for active
DATA RETENTION ELECTRIC CHARACTERISTIC
TA=0°C to 70°C /-40°C to 85°C (I)
Symbol
Parameter
Test Condition
/CS > Vcc - 0.2V or
Min
1.2
Typ1. Max
Unit
V
-
3.3
/UB, /LB > Vcc - 0.2V,
VIN > Vcc - 0.2V or
VIN < Vss + 0.2V
Vcc=1.5V,
/CS > Vcc - 0.2V or
/UB, /LB > Vcc - 0.2V
VIN > Vcc - 0.2V or
VIN < Vss + 0.2V
VDR
Vcc for Data Retention
SL
LL
-
-
0.1
0.1
3
uA
uA
Iccdr
Data Retention Current
10
Chip Deselect to Data
Retention Time
Operating Recovery Time
0
-
-
-
-
ns
ns
tCDR
tR
See Data Retention Timing Diagram
tRC
Notes:
1. Typical values are under the condition of TA = 25°C.
2. Typical value are sampled and not 100% tested
DATA RETENTION TIMING DIAGRAM
DATA RETENTION MODE
VCC
2.7V
tCDR
tR
VIH
VDR
/CS >VCC-0.2V
/CS
VSS
Rev.11 / Jun.01
7
HY62UF16403A Series
PACKAGE INFORMATION
48ball Micro Ball Grid Array Package(M)
BOTTOM VIEW
TOP VIEW
B
A
A1 CORNER
INDEX AREA
6
5
4
3
2
1
A
A
B
C
D
C
C1
E
3.0 X 5.0 MIN
FLAT AREA
F
G
H
C1/2
B1/2
B1
SIDE VIEW
5
E1
E2
C
E
SEATING PLANE
4
A
r
3
D(DIAMETER)
Note
Symbol
Min.
-
-
8.3
-
7.1
0.3
0.85
0.6
0.2
-
Typ.
0.75
3.75
8.4
5.25
7.2
0.35
0.9
0.65
0.25
-
Max.
-
-
8.5
-
7.3
0.4
0.95
0.7
0.3
0.08
A
B
B1
C
C1
D
E
E1
E2
r
1. DIMENSIONING AND TOLERANCING PER ASME Y14. 5M-1994.
2. ALL DIMENSIONS ARE MILLIMETERS.
3. DIMENSION “D” IS MEASURED AT THE MAXIMUM SOLDER
BALL DIAMETER IN A PLANE PARALLEL TO DATUM C.
4. PRIMARY DATUM C(SEATING PLANE) IS DEFINED BY THE
CROWN OF THE SOLDER BALLS.
5. THIS IS A CONTROLLING DIMENSION.
Rev.11 / Jun.01
8
HY62UF16403A Series
MARKING INFORMATION
Package
Marking Example
H
Y
U
F
6
4
y
3
A
c
s
x
s
x
t
y
x
w
K
w
O
p
uBGA
x
x
R
Index
• HYUF643A
• c
: Part Name
: Power Consumption
- L
- S
: Low Low Power
: Super Low Power
• ss
: Speed
- 55
: 55ns
: 70ns
: 85ns
- 70
- 85
• t
: Temperature
- C
- I
: Industrial ( -0 ~ 70 °C )
: Industrial ( -40 ~ 85 °C )
• yy
: Year (ex : 00 = year 2000, 01= year 2001)
: Work Week ( ex : 12 = work week 12 )
: Process Code
• ww
• p
• xxxxx
• KOR
: Lot No.
: Origin Country
Note
- Capital Letter
- Small Letter
: Fixed Item
: Non-fixed Item
Rev.11 / Jun.01
9
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