IDT6168LA20DB [IDT]

CMOS STATIC RAM 16K (4K x 4-BIT); CMOS静态RAM 16K ( 4K ×4位)
IDT6168LA20DB
型号: IDT6168LA20DB
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

CMOS STATIC RAM 16K (4K x 4-BIT)
CMOS静态RAM 16K ( 4K ×4位)

存储 内存集成电路 静态存储器
文件: 总9页 (文件大小:93K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CMOS Static RAM  
16K (4K x 4-Bit)  
IDT6168SA  
IDT6168LA  
Features  
High-speed (equal access and cycle time)  
CMOStechnology.Thisstate-of-the-arttechnology,combinedwithinno-  
vativecircuitdesigntechniques,providesacost-effectiveapproachfor  
high-speedmemoryapplications.  
Military:25/45ns(max.)  
Industrial:25ns (max.)  
– Commercial:15/20/25ns (max.)  
Low power consumption  
Battery backup operation2V data retention voltage  
(IDT6168LA only)  
Available in high-density 20-pin ceramic or plastic DIP and  
20-pin leadless chip carrier (LCC)  
Produced with advanced CMOS high-performance  
technology  
CMOS process virtually eliminates alpha particle  
soft-error rates  
Bidirectional data input and output  
Military product compliant to MIL-STD-883, Class B  
Access times as fast 15ns are available. The circuit also offers a  
reduced power standby mode. When CS goes HIGH, the circuit will  
automaticallygoto,andremainin,astandbymodeaslongasCSremains  
HIGH.Thiscapabilityprovidessignificantsystem-levelpowerandcooling  
savings. The low-power(LA)versionalsooffers a batterybackupdata  
retention capability where the circuit typically consumes only 1µW  
operating off a 2V battery. All inputs and outputs of the IDT6168 are  
TTL-compatibleandoperatefromasingle5Vsupply.  
The IDT6168 is packaged in either a space saving 20-pin, 300-mil  
ceramic or plastic DIP or a 20-pin LCC providing high board-level  
packingdensities.  
Military grade product is manufactured in compliance with the  
latest revision of MIL-STD-883, Class B, making it ideally suited to  
military temperature applications demanding the highest level of  
performanceandreliability.  
Description  
The IDT6168 is a 16,384-bit high-speed static RAM organized  
as 4K x4. Itis fabricatedusinglDT’s high-performance, high-reliability  
FunctionalBlockDiagram  
A0  
VCC  
GND  
ADDRESS  
DECODER  
16,384-BIT  
MEMORY ARRAY  
A11  
I/O0  
I/O CONTROL  
I/O1  
INPUT  
DATA  
CONTROL  
I/O2  
I/O3  
,
CS  
3090 drw 01  
WE  
FEBRUARY 2001  
1
©2000IntegratedDeviceTechnology,Inc.  
DSC-3090/05  
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
PinConfigurations  
Truth Table(1)  
CS  
WE  
X
Mode  
Output  
High-Z  
DOUT  
DIN  
Power  
Standby  
Active  
Standby  
H
L
L
VCC  
A11  
A10  
A9  
A0  
A1  
A2  
1
20  
Read  
Write  
H
2
3
19  
18  
L
Active  
P20-1  
D20-1  
L20-1  
3
A
3090 tbl 03  
4
5
17  
16  
NOTE:  
1. H = VIH, L = VIL, X = Don't Care  
A4  
A5  
8
A
6
15  
14  
13  
12  
11  
I/O3  
I/O2  
I/O1  
I/O0  
WE  
A6  
7
AbsoluteMaximumRatings(1)  
Symbol  
A7  
8
Rating  
Com'l.  
Mil.  
Unit  
CS  
9
VTERM  
Terminal Voltage  
with Respect  
to GND  
-0.5 to +7.0  
-0.5 to +7.0  
V
GND  
10  
,
3090 drw 02  
Operating  
0 to +70  
-55 to +125  
-65 to +135  
oC  
oC  
TA  
DIP/LCC  
Top View  
Temperature  
Temperature  
Under Bias  
-55 to +125  
TBIAS  
TSTG  
PT  
Storage Temperature -55 to +125  
-65 to +150  
oC  
W
Power Dissipation  
DC Output Current  
1.0  
50  
1.0  
50  
PinDescriptions  
IOUT  
mA  
3090 tbl 04  
Name  
A0 - A11  
CS  
Description  
Address Inputs  
Chip Select  
Write Enable  
Data Input/Output  
Power  
NOTE:  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS  
may cause permanent damage to the device. This is a stress rating only  
and functional operation of the device at these or any other conditions above  
those indicated in the operational sections of this specification is not implied.  
Exposure to absolute maximum rating conditions for extended periods may  
affect reliability.  
WE  
I/O0 - I/O3  
VCC  
RecommendedDCOperating  
Conditions  
GND  
Ground  
3090 tbl 01  
Symbol  
Parameter  
Min.  
Typ.  
Max. Unit  
VCC  
Supply Voltage  
4.5  
5.0  
5.5  
0
V
V
V
GND Ground  
0
0
____  
VIH  
VIL  
Input High Voltage  
Input Low Voltage  
2.2  
6.0  
0.8  
Capacitance (TA = +25°C, f = 1.0MHz)  
-0.5(1 )  
V
____  
Symbol  
Parameter(1 )  
Input Capacitance  
I/O Capacitance  
Conditions  
Max.  
Unit  
3090 tbl 05  
CIN  
VIN = 0V  
7
pF  
NOTE:  
1. VIL (min.) = –3.0V for pulse width less than 20ns, once per cycle.  
CI/O  
VOUT = 0V  
7
pF  
3090 tbl 02  
NOTE:  
1. This parameter is determined by device characterization, but is not production  
tested.  
RecommendedOperating  
TemperatureandSupplyVoltage  
Grade  
Temperature  
-55OC to +125OC  
-45OC to +85OC  
0OC to +70OC  
GND  
Vcc  
Military  
0V  
5V± 10%  
5V± 10%  
5V± 10%  
Industrial  
0V  
Commercial  
0V  
3090 tbl 06  
2
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
DC Electrical Characteristics(1)  
(VCC = 5.0V ± 10%, VLC = 0.2V, VHC = VCC - 0.2V)  
6168SA15  
6168SA20  
6168LA20  
6168SA25  
6168LA25  
6168SA45  
6168LA45  
Com'l.  
Mil.  
Com'l.  
Mil.  
Com'l.  
& Ind.  
Mil.  
Com'l.  
Mil.  
Power  
Symbol  
Parameter  
Unit  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
I
Operating Power Supply Current  
SA  
LA  
SA  
LA  
110  
90  
70  
90  
100  
80  
100  
80  
mA  
CC1  
CS < VIL, Outputs Open  
(2 )  
____  
70  
VCC = Max., f = 0  
I
Dynamic Operating Current  
mA  
mA  
CC2  
145  
120  
100  
110  
90  
120  
100  
110  
80  
CS < VIL, Outputs Open  
(2 )  
____  
VCC = Max., f = fMAX  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
I
Standby Power Supply Current  
(TTL Level)  
SB  
SA  
LA  
SA  
LA  
55  
45  
30  
35  
25  
3
45  
30  
10  
0.3  
35  
25  
10  
0.3  
CS > VIH, Outputs Open  
____  
(2 )  
VCC = Max., f = fMAX  
I
Full Standby Power Supply  
Current (CMOS Level)  
mA  
SB1  
20  
20  
CS > VHC, VCC = Max.,  
____  
VIN < VLC or VIN > VHC, f = 0(2 )  
0.5  
0.5  
3090 tbl 07  
NOTES:  
1. All values are maximum guaranteed values.  
2. fMAX = 1/tRC, only address inputs are cycling at fMAX. f = 0 means no address inputs are changing.  
DC Electrical Characteristics  
VCC = 5.0V ± 10%  
IDT6168SA  
IDT6168LA  
Symbol  
Parameter  
Test Conditions  
Min.  
Max.  
Min.  
Max.  
Unit  
____  
____  
____  
____  
Input Leakage Current  
|ILI|  
VCC = Max.,  
VIN = GND to VCC  
MIL.  
COM'L.  
10  
2
5
2
µA  
____  
____  
____  
____  
|ILO|  
Output Leakage Current  
Output LOW Voltage  
VCC = Max., CS = VIH,  
MIL.  
COM'L.  
10  
2
5
2
VOUT = GND to VCC  
µA  
V
____  
____  
____  
____  
IOL = 10mA, VCC = Min.  
IOL = 8mA, VCC = Min.  
IOH = -4mA, VCC = Min.  
0.5  
0.5  
VOL  
0.4  
0.4  
____  
____  
VOH  
Output HIGH Voltage  
2.4  
2.4  
V
3090 tbl 09  
6.42  
3
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
Data Retention Characteristics (LA Version Only)  
VLC = 0.2V, VHC = VCC – 0.2V  
IDT6168LA  
Symbol  
VDR  
ICCDR  
Parameter  
VCC for Data Retention  
Test Condition  
Min.  
Typ.(1 )  
Max.  
Unit  
V
____  
____  
2.0  
____  
____  
Data Retention Current  
MIL.  
0.5(2 )  
1.0(3 )  
100(2 )  
150(3 )  
µA  
CS > VHC  
VIN > VHC  
or < VLC  
(2 )  
____  
____  
COM'L.  
0.5(2 )  
1.0(3 )  
20  
µA  
(3 )  
30  
(5)  
____  
____  
____  
tCDR  
Chip Deselect to Data  
Retention Time  
0
ns  
(5 )  
(4 )  
____  
tR  
Operation Recovery Time  
tRC  
ns  
3090 tbl 10  
NOTES:  
1. TA = +25°C.  
2. at VCC = 2V  
3. at VCC = 3V  
4. tRC = Read Cycle Time.  
5. This parameter is guaranteed by device characterization, but is not production tested.  
Low VCC Data Retention Waveform  
DATA  
RETENTION  
MODE  
VCC  
4.5V  
4.5V  
VDR 2V  
tCDR  
tR  
,
VIH  
VIH  
CS  
VDR  
3090 drw 03  
AC Test Conditions  
Input Pulse Levels  
GND to 3.0V  
Input Rise/Fall Times  
5ns  
1.5V  
Input Timing Reference Levels  
Output Reference Levels  
AC Test Load  
1.5V  
See Figures 1 and 2  
3090 tbl 11  
5V  
5V  
480  
480  
OUT  
DATA  
OUT  
DATA  
255Ω  
30pF*  
255Ω  
5pF*  
3090 drw 04  
3090 drw 05  
Figure 1. AC Test Load  
Figure 2. AC Test Load  
(for tCHZ, tCLZ, tWHZ and tOW)  
*Includes scope and jig capacitances  
4
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
AC Electrical Characteristics (VCC = 5.0V ± 10%, All Temperature Ranges)  
6168SA15(1 )  
6168SA20(1 )  
6168SA25  
6168LA25  
6168SA45(2 )  
6168LA20(1 )  
6168LA45(2 )  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Symbol  
Parameter  
Unit  
Read Cycle  
____  
____  
____  
____  
tRC  
tAA  
Read Cycle Time  
Address Access Time  
15  
20  
25  
45  
ns  
ns  
ns  
ns  
____  
____  
____  
____  
15  
20  
25  
45  
____  
____  
____  
____  
tACS  
Chip Select Access Time  
15  
20  
25  
45  
____  
____  
____  
____  
(3)  
Chip Select to Output in Low-Z  
Chip Deselect to Output in High-Z  
Output Hold from Address Change  
Chip Select to Power Up Time  
Chip Deselect to Power Down Time  
3
5
5
5
tCL Z  
____  
____  
____  
____  
(3)  
8
10  
10  
25  
ns  
ns  
ns  
tCHZ  
____  
____  
____  
____  
tOH  
3
3
3
3
____  
____  
____  
____  
(3)  
0
0
0
0
tPU  
____  
____  
____  
____  
(3)  
35  
20  
25  
40  
ns  
tPD  
3090 tbl 12  
NOTES:  
1. 0° to +70°C temperature range only.  
2. –55°C to +125°C temperature range only.  
3. This parameter is guaranteed with AC Test load (Figure 2) by device characterization, but is not production tested.  
Timing Waveform of Read Cycle No. 1(1, 2)  
tRC  
ADDRESS  
tAA  
tOH  
DATAOUT  
PREVIOUS DATA VALID  
DATA VALID  
3090 drw 06  
,
Timing Waveform of Read Cycle No. 2(1, 3)  
tRC  
CS  
tACS  
(3)  
tCHZ  
(4)  
tCLZ  
HIGH IMPEDANCE  
DATAOUT  
DATAOUT VALID  
HIGH IMPEDANCE  
tPU  
tPD  
ICC  
VCC  
SUPPLY  
CURRENT  
ISB  
,
3090 drw 07  
NOTES:  
1. WE is HIGH for Read cycle.  
2. CS is LOW for Read cycle.  
3. Device is continuously selected, CS is LOW.  
3. Address valid prior to or coincident with CS transition LOW.  
4. Transition is measured ±200mV from steady state.  
6.42  
5
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
AC Electrical Characteristics (VCC = 5.0V ± 10%, All Temperature Ranges)  
6168SA15(1 )  
6168SA20(1 )  
6168LA20(1 )  
6168SA25  
6168LA25  
6168SA45(2 )  
6168LA45(2 )  
Symbol  
Parameter  
Unit  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Write Cycle  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
tWC  
tCW  
tAW  
tAS  
Write Cycle Time  
Chip Select to End-of-Write  
15  
15  
15  
0
20  
20  
20  
0
20  
20  
20  
0
40  
40  
40  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Valid to End-of-Write  
Address Set-up Time  
tWP  
tWR  
tDW  
tDH  
Write Pulse Width  
15  
0
20  
0
20  
0
40  
0
Write Recovery Time  
Data to Valid to End-of-Write  
Data Hold Time  
9
10  
10  
20  
0
0
0
3
____  
____  
____  
____  
(3)  
Write Enable to Output in High-Z  
6
7
7
20  
tWHZ  
____  
____  
____  
____  
(3)  
Output Active from End-of-Write  
0
0
0
0
ns  
tOW  
3090 tbl 13  
NOTES:  
1. 0° to +70°C temperature range only.  
2. –55°C to +125°C temperature range only.  
3. This parameter is guaranteed with the AC Load (Figure 2) by device characterization, but is not production tested.  
6
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
Timing Waveform of Write Cycle No. 1 (WE Controlled Timing)(1,2,5)  
tWC  
ADDRESS  
tAW  
CS  
(3)  
tWP  
tWR  
t AS  
WE  
(6)  
CHZ  
(6)  
tWHZ  
(6)  
t
tOW  
(4)  
DATA  
VALID (4)  
DATAOUT  
DATAIN  
PREVIOUS DATA VALID  
t DW  
t DH  
,
DATA VALID  
3090 drw 08  
Timing Waveform of Write Cycle No. 2 (CS Controlled Timing)(1,2,5)  
t WC  
ADDRESS  
t AW  
CS  
(3)  
tWR  
tAS  
tCW  
WE  
t DW  
t DH  
DATAIN  
DATA VALID  
,
3090 drw 09  
NOTES:  
1. WE or CS must be HIGH during all address transitions.  
2. A write occurs during the overlap of a LOW CS and a LOW WE.  
3. tWR is measured from the earlier of CS or WE going HIGH to the end of the write cycle.  
4. During this period, the I/O pins are in the output state and input signals should not be applied.  
5. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in the high impedance state.  
6. Transition is measured ±200mV from steady state.  
6.42  
7
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
Ordering Information -- Commercial & Industrial  
IDT 6168  
XX  
XXX  
XX  
X
Device  
Type  
Power  
Speed  
Package  
Process/  
Temperature  
Range  
Commercial (0°C to +70°C)  
Industrial (-45°C to +85°C)  
Blank  
I
P
300mil Plastic DIP (P20-1) (Commercial & Industrial only)  
15*  
20  
Commercial Only  
Commercial Only  
Speed in nanoseconds  
25  
Commercial &Industrial  
SA  
LA  
Standard Power  
Low Power  
*Standard power only.  
3090 drw 10  
Ordering Information -- Military  
IDT 6168  
XX  
XXX  
XX  
X
Device  
Type  
Power  
Speed  
Package  
Process/  
Temperature  
Range  
B
Military (-55°C to +125°C)  
Compliant to MIL-STD-883, Class B  
D
L
300mil Ceramic DIP (D20-1)  
20-pin Leadless Chip Carrier (L20-1)  
25  
45  
Speed in nanoseconds  
SA  
LA  
Standard Power  
Low Power  
3090 drw 10a  
*Standard power only.  
8
IDT6168SA/LA  
CMOS Static RAM 16K (4K x 4-Bit)  
Military, Industrial, and Commercial Temperature Ranges  
DatasheetDocumentHistory  
11/22/99  
Updatedtonewformat  
AddedDatasheetDocumentHistory  
Pg. 8  
Pg. 1, 2, 3, 5, 6, 8  
Pg. 1, 2, 8  
AddedIndustrialTemperaturerangeofferings  
Revisedpackageofferings  
Notrecommendedfornewdesigns  
01/07/00  
08/09/00  
02/01/01  
Removed"Notrecommendedfornewdesigns"  
CORPORATE HEADQUARTERS  
2975StenderWay  
Santa Clara, CA 95054  
for SALES:  
for Tech Support:  
sramhelp@idt.com  
800 544-7726, x4033  
800-345-7015 or 408-727-6116  
fax:408-492-8674  
www.idt.com  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
6.42  
9

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