IDT7054L35GB [IDT]
HIGH-SPEED 4K x 8 FourPort STATIC RAM; HIGH -SPEED 4K ×8 FourPort静态RAM型号: | IDT7054L35GB |
厂家: | INTEGRATED DEVICE TECHNOLOGY |
描述: | HIGH-SPEED 4K x 8 FourPort STATIC RAM |
文件: | 总11页 (文件大小:100K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IDT7054S/L
HIGH-SPEED
4K x 8 FourPortTM
STATIC RAM
◆
TTL-compatible; single 5V (±10%) power supply
Available in 128 pin Thin Quad Flatpack and 108 pin PGA
packages
Industrial temperature range (–40°C to +85°C) is available
for selected speeds
ꢀeatures
High-speed access
◆
◆
– Commercial:20/25/35ns (max.)
– Industrial:25ns (max.)
◆
– Military:25/35ns(max.)
Low-power operation
◆
Description
– IDT7054S
Active:750mW(typ.)
Standby: 7.5mW (typ.)
– IDT7054L
Active:750mW(typ.)
Standby: 1.5mW (typ.)
True FourPort memory cells which allow simultaneous
TheIDT7054isahigh-speed4Kx8FourPort™StaticRAMdesigned
to be used in systems where multiple access into a common RAM is
required.ThisFourPortStaticRAMoffersincreasedsystemperformance
inmultiprocessorsystemsthathaveaneedtocommunicateinrealtimeand
alsooffersaddedbenefitforhigh-speedsystemsinwhichmultipleaccess
is requiredinthe same cycle.
◆
access of the same memory locations
Fully asynchronous operation from each of the four ports:
P1, P2, P3, and P4
TheIDT7054is alsodesignedtobeusedinsystems whereon-chip
hardware port arbitration is not needed. This part lends itself to those
systems whichcannottoleratewaitstates oraredesignedtobeableto
◆
ꢀunctionalBlockDiagram
R/WP1
CEP1
R/WP4
CEP4
OEP1
OEP4
COLUMN
I/O
COLUMN
I/O0P1-I/O7P1
I/O0P4-I/O7P4
I/O
PORT 1
PORT 4
ADDRESS
DECODE
LOGIC
ADDRESS
DECODE
LOGIC
A0P1 - A11P1
A0P2 - A11P2
A0P4 - A11P4
MEMORY
ARRAY
PORT 2
ADDRESS
DECODE
LOGIC
PORT 3
ADDRESS
DECODE
LOGIC
A0P3 - A11P3
COLUMN
I/O
COLUMN
I/O
I/O0P2-I/O7P2
I/O0P3-I/O7P3
OEP2
OEP3
CEP2
CEP3
R/WP3
R/WP2
3241 drw 01
NOVEMBER 2001
1
DSC 3241/11
©2001IntegratedDeviceTechnology,Inc.
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
externallyarbitratedorwithstandcontentionwhenallportssimultaneously
accessthesameFourPortRAMlocation.
Fabricated using IDT’s CMOS high-performance technology, this
FourPortSRAMtypicallyoperatesononly750mWofpower.Low-power
TheIDT7054providesfourindependentportswithseparatecontrol, (L)versionsofferbatterybackupdataretentioncapability,witheachport
address,andI/Opinsthatpermitindependent, asynchronousaccessfor typicallyconsuming50µWfroma2Vbattery.
readsorwritestoanylocationinmemory.Itistheuser’sresponsibilityto
TheIDT7054ispackagedinaceramic108-pinPinGridArray(PGA)
ensuredataintegritywhensimultaneouslyaccessingthesamememory and a 128-pin Thin Quad Flatpack (TQFP). The military grade product
locationfromallports.Anautomaticpowerdownfeature,controlledbyCE, ismanufacturedincompliancewiththelatestrevisionofMIL-PRF-38535
permitstheon-chipcircuitryofeachporttoenteraverylowpowerstandby QML,makingitideallysuitedtomilitarytemperatureapplicationsdemand-
powermode.
ingthehighestlevelofperformanceandreliability.
PinConfigurations(1,2,3)
11/14/01
81
80
77
78
82
85
89
93
98
74
76
79
72
73
75
69
70
71
68
67
66
65
64
62
63
61
58
60
59
55
52
48
44
57
56
51
49
46
43
40
37
34
32
29
54
53
50
47
45
42
41
38
36
33
A
P2
5
A
5
P3
R/
W
P2
A
11
P2
A
7
P2
A
3
P2
A
0
P2
A
0
P3
A
3
P3
A
7
P3
A
11
P3
R/
W
P3
12
11
84
87
90
92
95
96
99
83
86
88
91
94
97
NC
NC
OE
P2
OE
P3
A
P2
8
A
10
A
4
P2
A
1
P2
A
1
P3
A
P3
4
A
10
P3
A
8
P3
P2
CE
P2
A
6
P2
CE
P3
A
2
P1
A
1
P1
A
9
P2
A
2
P2
A
2
P3
A
P3
6
A
9
P3
A
P4
1
A
2
P4
10
09
08
07
06
05
04
03
02
01
A
P4
3
A
5
A
3
P1
A
P1
0
A
0
P4
A
5
P4
P1
A
10
A
6
P1
A
4
P1
A
4
P4
A
P4
6
A
10
P4
P1
IDT7054G
G108-1(4)
A
8
P4
GND
A
P4
7
A
8
A
7
P1
V
CC
P1
39
108-Pin PGA
Top View(5)
CE
P1
CE
P4
A
9
P4
A
9
P1
A
11
P1
A
11
P4
100
102
35
OE
P4
OE
P1
GND
R/
P4
W
R/W
I/O
P1
0
P1
101
103
106
31
I/O
P4
7
NC
I/O
1
P1
GND
GND
NC
104
105
1
5
6
4
7
9
8
12
17
16
15
21
25
22
20
28
24
23
I/O
P1
2
I/O
P1
3
I/O
P1
6
V
CC
GND
V
CC
V
CC
GND
V
CC
I/O
P4
2
I/O
P4
5
I/O
P4
6
107
2
3
10
13
19
30
I/O
P2
2
I/O
P3
1
I/O
P3
3
I/O
P4
4
I/O
4
I/O
7
I/O
0
I/O
4
I/O
6
I/O
P3
7
I/O
3
I/O
5
P1
P1
P2
P2
P2
P4
P3
108
11
14
18
26
27
NC
B
I/O
1
P2
I/O
5
P2
I/O
4
P3
I/O
5
I/O
3
I/O
7
I/O
0
I/O
2
I/O
6
I/O
0
I/O
1
P1
P2
P2
P3
P3
P3
P4
P4
A
C
D
E
F
G
H
J
K
L
M
INDEX
NOTES:
3241 drw 02
1. All VCC pins must be connected to the power supply.
2. All GND pins must be connected to the ground supply.
3. Package body is approximately 1.21 in x 1.21 in x .16 in.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
6.42
2
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
Pin Configurations(1,2,3) (con't.)
11/14/01
INDEX
CE
R/WP3
N/C
N/C
N/C
P3
1
2
3
4
5
6
7
8
102
101
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
CEP2
OEP2
N/C
N/C
N/C
N/C
N/C
N/C
N/C
A0P4
A1P4
A2P4
A3P4
A4P4
A5P4
A6P4
A10P4
GND
A7P4
A8P4
A9P4
A11P4
CEP4
R/WP4
OEP4
N/C
N/C
N/C
N/C
N/C
GND
N/C
I/O7P4
I/O6P4
I/O5P4
GND
I/O4P4
I/O3P4
I/O2P4
I/O1P4
A0P1
A1P1
A2P1
A3P1
A4P1
A5P1
A6P1
A10P1
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
V
CC
A7P1
A8P1
A9P1
IDT7054PRF
PK128-1(4)
A
11P1
128-Pin TQFP
Top View(5)
CE
P1
R/WP1
OEP1
N/C
N/C
N/C
N/C
N/C
27
28
29
30
31
32
33
34
35
36
37
38
N/C
I/O
0P1
I/O1P1
I/O
I/O
2P1
3P1
GND
I/O
4P1
5P1
6P1
7P1
I/O
I/O
I/O
.
3241 drw 03
NOTES:
1. All VCC pins must be connected to the power supply.
2. All GND pins must be connected to the ground supply.
3. Package body is approximately 14mm x 20mm x 1.4mm.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
6.42
3
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
PinConfigurations(1,2)
Capacitance(1)
(TA = +25°C, f = 1.0MHz) TQꢀP ONLY
Symbol
Pin Name
Symbol
CIN
Parameter
Conditions(2)
Max. Unit
A0 P1 - A11 P1
Address Lines - Port 1
Address Lines - Port 2
Address Lines - Port 3
Address Lines - Port 4
Data I/O - Port 1
Input Capacitance
VIN = 0V
9
pF
pF
A0 P2 - A11 P2
A0 P3 - A11 P3
A0 P4 - A11 P4
I/O0 P1 - I/O7 P1
I/O0 P2 - I/O7 P2
I/O0 P3 - I/O7 P3
I/O0 P4 - I/O7 P4
R/W P1
Output
Capacitance
VOUT = 0V
10
COUT
3241 tbl 03
NOTES:
1. This parameter is determined by device characterization but is not production
tested.
2. 3dV references the interpolated capacitance when the input and the output
signals switch from 0V to 3V or from 3V to 0V.
Data I/O - Port 2
Data I/O - Port 3
Data I/O - Port 4
Read/Write - Port 1
Read/Write - Port 2
Read/Write - Port 3
Read/Write - Port 4
Ground
MaximumOperatingTemperature
andSupplyVoltage(1)
Ambient
R/W P2
R/W P3
Grade
Temperature
-55°C to +125°C
0°C to +70°C
GND
Vcc
R/W P4
5.0V 10%
+
Military
0V
GND
5.0V 10%
+
Commercial
Industrial
0V
Chip Enable - Port 1
Chip Enable - Port 2
Chip Enable - Port 3
Chip Enable - Port 4
Output Enable - Port 1
Output Enable - Port 2
Output Enable - Port 3
Output Enable - Port 4
Power
CE P1
5.0V 10%
+
-40°C to +85°C
0V
CE P2
3241 tbl 04
NOTES:
CE P3
1. This is the parameter TA. This is the "instant on" case temperature.
CE P4
OE P1
OE P2
AbsoluteMaximumRatings(1)
OE P3
OE P4
Symbol
Rating
Commercial
& Industrial
Military
Unit
VCC
(2)
VTERM
Terminal Voltage
with Respect
to GND
-0.5 to +7.0
-0.5 to +7.0
V
3241 tbl 01
NOTES:
1. All VCC pins must be connected to the power supply.
2. All GND pins must be connected to the ground supply.
TBIAS
TSTG
Temperature
Under Bias
-55 to +125
-65 to +150
50
-65 to +135
-65 to +150
50
oC
oC
Storage
Temperature
RecommendedDCOperating
Conditions
IOUT
DC Output Current
mA
3241 tbl 05
NOTES:
Symbol
Parameter
Min.
Typ.
Max.
5.5
0
Unit
V
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those
indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect
reliability.
V
CC
Supply Voltage
4.5
5.0
GND Ground
0
0
V
VIH
VIL
Input High Voltage
Input Low Voltage
2.2
6.0(2)
0.8
V
____
2. VTERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of VTERM > VCC + 10%.
-0.5(1)
V
____
3241 tbl 02
NOTES:
1. VIL > -1.5V for pulse width less than 10ns.
2. VTERM must not exceed Vcc + 10%.
6.42
4
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range(1,5) (VCC = 5.0V ± 10%)
7054X20
Com'l Only
7054X25
Com'l, Ind
& Military
7054X35
Com'l &
Military
Symbol
Parameter
Condition
Version
COM'L.
TYP.(2)
Max.
TYP.(2)
Max.
TYP.(2)
Max.
Unit
CC1
I
Operating Power
Supply Current
(All Ports Active)
S
L
150
150
300
250
150
150
300
250
150
150
300
250
mA
IL
CE = V
Outputs Disabled
(3)
f = 0
____
____
____
____
MIL. &
IND.
S
L
150
150
360
300
150
150
360
300
mA
mA
mA
mA
mA
mA
CC2
I
Dynamic Operating
Current
(All Ports Active)
COM'L.
S
L
240
210
370
325
225
195
350
305
210
180
335
290
IL
CE = V
Outputs Disabled
(4)
f = fMAX
____
____
____
____
MIL. &
IND.
S
L
225
195
400
340
210
180
395
330
ISB
Standby Current
(All Ports - TTL Level
Inputs)
COM'L.
S
L
70
60
95
80
60
50
85
70
40
35
75
60
CE = VIH
(4)
f = fMAX
____
____
____
____
MIL. &
IND.
S
L
60
50
115
85
40
35
110
80
ISB1
Full Standby Current
(All Ports - All
CMOS Level Inputs)
All Ports
COM'L.
S
L
1.5
0.3
15
1.5
1.5
0.3
15
1.5
1.5
0.3
15
1.5
CE > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < 0.2V, f = 0(3)
____
____
____
____
MIL. &
IND.
S
L
1.5
0.3
30
4.5
1.5
0.3
30
4.5
mA
3241 tbl 06
NOTES:
1. 'X' in part number indicates power rating (S or L).
2. VCC = 5V, TA = +25°C and are not production tested.
3. f = 0 means no address or control lines change.
4. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC, and using “AC Test Conditions” of input
levels of GND to 3V.
5. For the case of one port, divide the appropriate current above by four.
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (VCC = 5.0V ± 10%)
7054S
7054L
Symbol
|ILI|
Parameter
Test Conditions
VCC = 5.5V, VIN = 0V to VCC
CE = VIH, VOUT = 0V to VCC
IOL = 4mA
Min.
Max.
10
Min.
Max.
5
Unit
µA
µA
V
(1)
___
___
Input Leakage Current
Output Leakage Current
Output Low Voltage
___
___
___
___
|ILO|
10
5
VOL
0.4
0.4
___
___
VOH
Output High Voltage
IOH = -4mA
2.4
2.4
V
2674 tbl 07
NOTE:
1. At Vcc < 2.0V input leakages are undefined.
6.42
5
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
AC Test Conditions
Input Pulse Levels
GND to 3.0V
3ns Max.
1.5V
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
1.5V
Figures 1 and 2
3241 tbl 08
5V
5V
893Ω
893Ω
DATAOUT
DATAOUT
5pF*
Ω
347
347Ω
30pF
3241 drw 04
Figure 2. Output Test Load
Figure 1. AC Output Test Load
(for tLZ, tHZ, tWZ, tOW)
*Including scope and jig
Timing Waveform of Read Cycle No. 1, Any Port(1)
tRC
ADDRESS
tAA
tOH
tOH
DATAOUT
PREVIOUS DATA VALID
DATA VALID
3241 drw 05
NOTE:
1. R/W = VIH, OE = VIL, and CE = VIL.
6.42
6
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
OperatingTemperatureandSupplyVoltage(3)
7054X20
Com'l Only
7054X25
Com'l, Ind
& Military
7054X35
Com'l &
Military
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
READ CYCLE
____
____
____
tRC
tAA
tACE
tAOE
tOH
tLZ
Read Cycle Time
20
25
35
ns
ns
ns
ns
ns
ns
ns
ns
____
____
____
Address Access Time
Chip Enable Access Time
Output Enable Access Time
20
20
25
25
35
35
____
____
____
____
____
____
10
15
25
____
____
____
Output Hold from Address Change
Output Low-Z Time(1,2)
0
0
0
____
____
____
5
5
5
Output High-Z Time(1,2)
12
15
15
____
____
____
tHZ
tPU
tPD
Chip Enable to Power Up Time(2)
Chip Disable to Power Down Time(2)
0
0
0
____
____
____
____
____
____
20
25
35
ns
3241 tbl 09
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization but is not production tested.
3. 'X' in part number indicates power rating (S or L).
Timing Waveform of Read Cycle No. 2, Any Port(1, 2)
tACE
CE
tAOE
tHZ
OE
tLZ
tHZ
DATAOUT
VALID DATA
tLZ
tPU
tPD
ICC
50%
CURRENT
50%
ISB
3241 drw 06
NOTES:
1. R/W = VIH for Read Cycles.
2. Addresses valid prior to or coincident with CE transition LOW.
6.42
7
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating TemperatureandSupplyVoltage(5)
7054X20
Com'l Only
7054X25
Com'l, Ind
& Military
7054X35
Com'l &
Military
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
WRITE CYCLE
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
tWC
tEW
tAW
tAS
Write Cycle Time
20
15
15
0
25
20
20
0
35
30
30
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Chip Enable to End-of-Write
Address Valid to End-of-Write
Address Set-up Time
Write Pulse Width(3)
tWP
15
0
20
0
30
0
tWR
tDW
tHZ
Write Recovery Time
Data Valid to End-of-Write
Output High-Z Time(1,2)
Data Hold Time
15
15
20
____
____
____
15
15
15
____
____
____
tDH
0
0
0
(1,2)
____
____
____
tWZ
tOW
tWDD
tDDD
Write Enable to Output in High-Z
Output Active from End-of-Write(1,2)
Write Pulse to Data Delay(4)
12
15
15
____
____
____
0
0
0
____
____
____
35
30
45
35
55
45
Write Data Valid to Read Data Delay(4)
ns
____
____
____
3241 tbl 10
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization but is not production tested.
3. If OE = VIL during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off data to be placed on
the bus for the required tDW. If OE = VIH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified
tWP. Specified for OE = VIH (refer to “Timing Waveform of Write Cycle”, Note 8).
4. Port-to-port delay through RAM cells from writing port to reading port, refer to “Timing Waveform of Write with Port-to-Port Read”.
5. 'X' in part number indicates power rating.
6.42
8
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing(5,8)
tWC
ADDRESS
(6)
tAS
OE
(3)
AW
t
tWR
CE
(7)
tHZ
(2)
tWP
R/W
(7)
(7)
tWZ
tHZ
tLZ
tOW
(4)
(4)
DATAOUT
tDH
tDW
IN
DATA
3241 drw 07
Timing Waveform of Write Cycle No. 2, CE Controlled Timing(1,5)
tWC
ADDRESS
tAW
CE
(3)
(6)
(2)
tAS
tWR
tEW
R/W
tDW
tDH
DATAIN
3241 drw 08
NOTES:
1. R/W or CE = VIH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of a CE = VIL and a R/W = VIL.
3. tWR is measured from the earlier of CE or R/W = VIH to the end of write cycle.
4. During this period, the I/O pins are in the output state, and input signals must not be applied.
5. If the CE LOW transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal is asserted last, CE or R/W.
7. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed but is not production tested.
8. If OE = VIL during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off data to be placed
on the bus for the required tDW. If OE = VIH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the
specified tWP.
6.42
9
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Port-to-Port Read(1, 2)
tWC
MATCH
ADDR"A"
tWP
R/W"A"
tDW
VALID
tDH
DATAIN"A"
ADDR"B"
MATCH
tWDD
VALID
DATA"B"
tDDD
3241 drw 09
NOTES:
1. OE = VIL for the reading ports.
2. All timing is the same for left and right ports. Port "A" may be either of the four ports and Port "B" is any other port.
Table I Read/Write Control
Any Port(1)
ꢀunctionalDescription
TheIDT7054providesfourportswithseparatecontrol,address,and
I/Opinsthatpermitindependentaccessforreadsorwritestoanylocation
in memory. These devices have an automatic power down feature
controlled by CE. The CE controls on-chip power down circuitry
thatpermitstherespectiveporttogointostandbymodewhennotselected
(CE = VIH). When a port is enabled, access to the entire memory array
ispermitted.EachporthasitsownOutputEnablecontrol(OE).Intheread
mode, the port’s OEturns onthe outputdrivers whensetLOW. READ/
WRITEconditionsareillustratedinthetable.
0-7
R/W
D
Function
Port Deselected: Power-Down
CEP1=CEP2=CEP3=CEP4=VIH
CE
OE
X
H
X
Z
Z
X
H
X
SB
SB1
Power Down Mode I or I
IN
DATA
L
H
X
L
L
X
X
L
Data on port written into memory(2)
Data in memory output on port
Outputs Disabled
OUT
DATA
H
Z
3241 tbl 11
NOTES:
1. "H" = VIH, "L" = VIL, "X" = Don’t Care, "Z "= High Impedance
2. For valid write operation, no more than one port can write to the same address
location at the same time.
6.42
10
IDT7054S/L
High-Speed 4K x 8 FourPort™ Static RAM
Military, Industrial and Commercial Temperature Ranges
OrderingInformation
IDT
XXXX
A
999
A
A
Device
Type
Power
Speed
Package
Process/
Temperature
Range
Blank Commercial (0°C to +70°C)
I(1)
B
Industrial (-40°C to +85°C)
Military (-55°C to +125°C)
Compliant to MIL-PRF-38535 QML
108-Pin Pin Grid Array (G108-1)
128-Pin Thin Quad Plastic Flatpack (PK128-1)
G
PRF
20
25
35
Commercial Only
Speed in
Commercial, Industrial & Military
nanoseconds
Commercial & Military
Low Power
Standard Power
L
S
32K (4K x 8) FourPort RAM
7054
3241 drw 10
NOTE:
1. Industrial temperature range is available.
For other speeds, packages and powers contact your sales office.
DatasheetDocumentHistory
1/18/99:
Initiateddatasheetdocumenthistory
Convertedtonewformat
Cosmetictypographicalcorrections
Addedadditionalnotestopinconfigurations
Changeddrawingformat
6/4/99:
Page 1 CorrectedDSCnumber
RemovedPreliminary
9/1/99:
11/10/99:
5/23/00:
Replaced IDT logo
Page 4 Increasedstoragetemperatureparameter
ClarifiedTAparameter
Page 5 DCElectricalparameters–changedwordingfrom"open"to"disabled"
Changed±200mVto0mVinnotes
10/22/01:
Page 2 & 3 Added date revision for pin configurations
Page 5, 7& 8 AddedIndustrialtemptocolumnheadingfor25ns speedtoDC&ACElectricalCharacteristics
Page 11 AddedIndustrialtempofferingto25nsorderinginformation
Page 4, 5, 7& 8 RemovedIndustrialtempfootnote fromalltables
Page 6 Changed 5ns to 3ns in AC Test Conditions table
Page 1 & 11 Replace TM logo with ® logo
CORPORATE HEADQUARTERS
2975StenderWay
Santa Clara, CA 95054
for SALES:
for Tech Support:
831-754-4613
DualPortHelp@idt.com
800-345-7015 or 408-727-6116
fax: 408-492-8674
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
6.42
11
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