IDT709199L12PFG [IDT]
Dual-Port SRAM, 128KX9, 25ns, CMOS, PQFP100, 14 X 14 MM, 1.40 MM HEIGHT, TQFP-100;
| 型号： | IDT709199L12PFG |
| 厂家： | 
INTEGRATED DEVICE TECHNOLOGY |
| 描述： | Dual-Port SRAM, 128KX9, 25ns, CMOS, PQFP100, 14 X 14 MM, 1.40 MM HEIGHT, TQFP-100 静态存储器 |
| 文件： | 总15页 (文件大小：163K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
IDT709199L
HIGH-SPEED 128K x 9
SYNCHRONOUS PIPELINED
DUAL-PORT STATIC RAM
Features
◆
True Dual-Ported memory cells which allow simultaneous
access of the same memory location
High-speed clock to data access
– Commercial:7.5/9/12ns (max.)
– Industrial:9ns (max.)
additional logic
◆
Full synchronous operation on both ports
– 4ns setup to clock and 0ns hold on all control, data, and
address inputs
– Data input, address, and control registers
– Fast 7.5ns clock to data out in the Pipelined output mode
– Self-timed write allows fast cycle time
◆
◆
Low-power operation
– IDT709199L
Active: 1.2W (typ.)
Standby: 2.5mW (typ.)
Flow-Through or Pipelined output mode on either Port via
the FT/PIPE pins
Counter enable and reset features
Dual chip enables allow for depth expansion without
– 12ns cycle time, 83MHz operation in Pipelined output mode
TTL- compatible, single 5V (±10%) power supply
Industrial temperature range (–40°C to +85°C) is
available for selected speeds
◆
◆
◆
◆
◆
◆
Available in a 100-pin Thin Quad Flatpack (TQFP) package
Functional Block Diagram
R/W
L
R/W
R
OEL
OER
CE0R
CE1R
CE0L
CE1L
1
0
1
0
0/1
0/1
0
1
1
FT/PIPE
L
0/1
0
0/1
FT/PIPE
R
I/O0L - I/O8L
I/O0R - I/O8R
I/O
Control
I/O
Control
A
16L
A
16R
Counter/
Address
Reg.
Counter/
Address
Reg.
MEMORY
ARRAY
A
C0LRK
R
R
A
0L
L
L
CLK
ADS
ADS
CNTEN
R
CNTEN
L
CNTRST
R
CNTRST
L
4847 drw 01
NOVEMBER 2001
1
DSC-4847/4
©2001IntegratedDeviceTechnology,Inc.
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Description
With an input data register, the IDT709199 has been optimized for
applications having unidirectional or bidirectional data flow in bursts.
Anautomaticpowerdownfeature, controlledbyCE0andCE1, permits
the on-chip circuitry of each port to enter a very low standby power
mode. Fabricated using IDT’s CMOS high-performance technology,
these devices typically operate on only 1.2W of power.
The IDT709199 is a high-speed 128K x 9 bit synchronous Dual-
Port RAM. The memory array utilizes Dual-Port memory cells to allow
simultaneous access of any address from both ports. Registers on
control, data, and address inputs provide minimal setup and hold
times. The timing latitude provided by this approach allows systems
to be designed with very short cycle times.
Pin Configurations(1,2,3)
Index
11/07/01
10099 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76
1
NC
NC
NC
NC
75
2
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
3
A
A
A
A
A
A
A
A
A
A
GND
NC
NC
NC
NC
CE0R
CE1R
CNTRST
R/W
OE
FT/PIPE
GND
NC
7R
A
A
A
7L
8L
9L
4
8R
5
9R
6
10R
11R
12R
13R
14R
15R
16R
A10L
A11L
A12L
A13L
A14L
A15L
A16L
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
IDT709199PF
PN100-1
(4)
VCC
100-Pin TQFP
(5)
Top View
NC
NC
NC
NC
CE0L
CE1L
R
CNTRST
L
R
R/W
OE
FT/PIPE
L
R
L
R
L
NC
NC
26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
4847 drw 02
NOTES:
1. All VCC pins must be connected to power supply.
2. All GND pins must be connected to ground.
3. Package body is approximately 14mm x 14mm x 1.4mm
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
2
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Pin Names
Left Port
Right Port
Names
Chip Enables
CE0L, CE1L
R/W
OE
CE0R, CE1R
R/W
OE
L
R
Read/Write Enable
Output Enable
Address
L
R
A0L - A16L
A0R - A16R
I/O0L - I/O8L
CLK
I/O0R - I/O8R
CLK
Data Input/Output
Clock
L
R
Address Strobe
Counter Enable
Counter Reset
Flow-Through/Pipeline
Power
ADS
CNTEN
CNTRST
FT/PIPE
L
ADS
CNTEN
CNTRST
FT/PIPE
R
L
R
L
R
L
R
V
CC
GND
Ground
4847 tbl 01
Truth Table I—Read/Write and Enable Control(1,2,3)
CLK
CE1
R/W
I/O0-8
High-Z
High-Z
DATAIN
DATAOUT
High-Z
Mode
OE
X
X
X
L
CE0
H
X
L
L
L
X
L
X
Deselected—Power Down
Deselected—Power Down
Write
↑
X
↑
H
H
H
L
↑
H
Read
↑
H
X
X
Outputs Disabled
4847 tbl 02
NOTES:
1. "H" = VIH, "L" = VIL, "X" = Don't Care.
2. ADS, CNTEN, CNTRST = X.
3. OE is an asynchronous input signal.
Truth Table II—Address Counter Control(1,2,6)
Previous
Address
Addr
Used
Mode
(3)
Address
CLK
↑
I/O
ADS
CNTEN CNTRST
X
An
An
X
X
X
0
An
X
X
X
H
L
H
H
H
D
I/O(0)
I/O(n)
I/O(p)
I/O(p+1)
Counter Reset to Address 0
External Address Utilized
(4)
L
D
↑
Ap
Ap
Ap
H
H
D
External Address Blocked—Counter Disabled (Ap reused)
↑
(5)
Ap + 1
L
D
Counter Enable—Internal Address Generation
↑
4847 tbl 03
NOTES:
1. "H" = VIH, "L" = VIL, "X" = Don't Care.
2. CE0 and OE = VIL; CE1 and R/W = VIH.
3. Outputs configured in Flow-Through Output mode: if outputs are in Pipelined mode the data out will be delayed by one cycle.
4. ADS is independent of all other signals including CE0 and CE1.
5. The address counter advances if CNTEN = VIL on the rising edge of CLK, regardless of all other signals including CE0 and CE1.
6. While an external address is being loaded (ADS = VIL), R/W = VIH is recommended to ensure data is not written arbitrarily.
6.342
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Recommended Operating
Recommended DC Operating
Temperature and Supply Voltage Conditions
Symbol
Parameter
Supply Voltage
GND Ground
Min.
4.5
Typ. Max. Unit
Grade
Ambient
GND
Vcc
Temperature(2)
VCC
5.0
5.5
0
V
V
V
Commercial
0OC to +70OC
0V
0V
5.0V
5.0V
+
+
10%
0
0
Industrial
-40OC to +85OC
10%
____
V
IH
Input High Voltage
Input Low Voltage
2.2
6.0(1)
0.8
4847 tbl 04
____
NOTES:
VIL
-0.5(2)
V
1. This is the parameter TA. This is the "instant on" case temperature.
4847 tbl 05
NOTES:
1. VTERM must not exceed Vcc + 10%.
2. VIL > -1.5V for pulse width less than 10ns.
Absolute Maximum Ratings(1)
Capacitance(1)
(TA = +25°C, f = 1.0MHz)
Symbol
Rating
Commercial
& Industrial
Unit
Symbol
Parameter
Input Capacitance
Output Capacitance
Conditions(2)
IN = 3dV
OUT = 3dV
Max. Unit
(2)
V
TERM
Terminal Voltage
with Respect
to GND
-0.5 to +7.0
V
CIN
V
9
pF
(3)
OUT
C
V
10
pF
4847 tbl 07
Temperature
Under Bias
-55 to +125
-65 to +150
50
oC
oC
T
BIAS
NOTES:
1. These parameters are determined by device characterization, but are not
production tested.
2. 3dV references the interpolated capacitance when the input and output switch from
0V to 3V or from 3V to 0V.
Storage
Temperature
TSTG
DC Output
Current
mA
3. COUT also references CI/O.
IOUT
4847 tbl 06
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operationofthe device atthese oranyotherconditions above those indicatedinthe
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. VTERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of VTERM > Vcc + 10%.
DC Electrical Characteristics Over the Operating
Temperature Supply Voltage Range (VCC = 5.0V ± 10%)
709199L
Symbol
|ILI
|ILO
Parameter
Input Leakage Current(1)
Test Conditions
VCC = 5.5V, VIN = 0V to VCC
Min.
Max.
5
Unit
µA
µA
V
___
___
___
|
|
Output Leakage Current
Output Low Voltage
Output High Voltage
5
CE
OL = +4mA
OH = -4mA
0
= VIH or CE
1
= VIL, VOUT = 0V to VCC
VOL
I
0.4
___
VOH
I
2.4
V
4847 tbl 08
NOTE:
1. At Vcc < 2.0V input leakages are undefined.
4
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range(3) (VCC = 5V ± 10%)
709199L7
709199L9
709199L12
Com'l Only
Com'l Only
Com'l
& Ind
Symbol
Parameter
Test Condition
= VIL
Version
COM'L
Typ.(4)
Max.
Typ.(4)
Max.
400
430
135
160
275
Typ.(4)
Max.
Unit
ICC
Dynamic Operating
Current
(Both Ports Active)
mA
L
L
L
L
L
L
275
465
250
300
80
230
355
CE
L
and CE
R
Outputs Disabled
(1)
____
____
____
____
IND
f = fMAX
ISB1
Standby Current
(Both Ports - TTL
Level Inputs)
COM'L
IND
95
150
70
110
mA
mA
CEL
= CER = VIH
(1)
f = fMAX
____
____
____
____
95
ISB2
Standby Current
(One Port - TTL
Level Inputs)
COM'L
IND
200
295
175
150
240
CE"A" = VIL and
(3)
CE"B" = VIH
____
____
____
____
Active Port Outputs
Disabled, f=fMAX
195
0.5
0.5
170
295
3.0
6.0
270
(1)
ISB3
Full Standby Current
(Both Ports -
CMOS Level Inputs)
Both Ports CE
CE > VCC - 0.2V
IN > VCC - 0.2V or
IN < 0.2V, f = 0(2)
R
and
mA
mA
COM'L
IND
L
L
0.5
3.0
0.5
3.0
L
____
____
____
____
V
V
ISB4
Full Standby Current
(One Port -
CMOS Level Inputs)
COM'L
IND
L
L
190
290
140
225
CE"A" < 0.2V and
(5)
CE"B" > VCC - 0.2V
IN > VCC - 0.2V or
IN < 0.2V, Active Port
Outputs Disabled, f = fMAX
____
____
____
____
V
V
190
290
(1)
4847 tbl 09
NOTES:
1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS" at input levels of
GND to 3V.
2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
4. Vcc = 5V, TA = 25°C for Typ, and are not production tested. ICC DC(f=0) = 150mA (Typ).
5. CEX = VIL means CE0X = VIL and CE1X = VIH
CEX = VIH means CE0X = VIH or CE1X = VIL
CEX < 0.2V means CE0X < 0.2V and CE1X > VCC - 0.2V
CEX > VCC - 0.2V means CE0X > VCC - 0.2V or CE1X < 0.2V
"X" represents "L" for left port or "R" for right port.
.
6.542
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
AC Test Conditions
Input Pulse Levels
GND to 3.0V
3ns Max.
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
1.5V
1.5V
Figures 1,2 and 3
4847 tbl 10
5V
5V
893Ω
893Ω
DATAOUT
DATAOUT
30pF
347Ω
5pF*
347Ω
4847 drw 04
4847 drw 05
Figure 1. AC Output Test load.
Figure 2. Output Test Load
(For tCKLZ, tCKHZ, tOLZ, and tOHZ).
*Including scope and jig.
8
7
6
5
- 10pF is the I/O capacitance
of this device, and 30pF is the
AC Test Load Capacitance
tCD
tCD
(Typical, ns)
1
,
4
3
2
1
2
0
20 40 60 80 100 120 140 160 180 200
Capacitance (pF)
-1
4847 drw 06
Figure 3. Typical Output Derating (Lumped Capacitive Load).
6
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the Operating Temperature Range
(Read and Write Cycle Timing)(3) (VCC = 5V ± 10%, TA = 0°C to +70°C)
709199L7
709199L9
Com'l
709199L12
Com'l Only
Com'l Only
& Ind
Symbol
Parameter
Min.
Max.
Min.
25
15
12
12
6
Max.
Min.
Max.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
(2)
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
t
CYC1
CYC2
CH1
CL1
CH2
CL2
Clock Cycle Time (Flow-Through)
Clock Cycle Time (Pipelined)(2)
22
12
7.5
7.5
5
30
20
12
12
8
t
(2)
t
Clock High Time (Flow-Through)
(2)
t
Clock Low Time (Flow-Through)
Clock High Time (Pipelined)(2)
t
(2)
t
Clock Low Time (Pipelined)
5
6
8
____
____
____
tR
Clock Rise Time
3
3
3
____
____
____
tF
Clock Fall Time
3
3
3
____
____
____
t
SA
HA
SC
HC
SW
HW
SD
HD
SAD
HAD
SCN
HCN
SRST
HRST
OE
OLZ
OHZ
CD1
CD2
DC
CKHZ
CKLZ
Address Setup Time
Address Hold Time
Chip Enable Setup Time
Chip Enable Hold Time
R/W Setup Time
4
0
4
0
4
0
4
0
4
0
4
0
4
4
1
4
1
4
1
4
1
4
1
4
1
4
4
1
4
1
4
1
4
1
4
1
4
1
4
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
t
t
t
t
t
R/W Hold Time
t
Input Data Setup Time
Input Data Hold Time
ADS Setup Time
t
t
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
t
ADS Hold Time
t
CNTEN Setup Time
CNTEN Hold Time
CNTRST Setup Time
CNTRST Hold Time
Output Enable to Data Valid
t
t
t
0
1
1
____
____
____
t
9
12
12
(1)
____
____
____
t
Output Enable to Output Low-Z
2
2
2
(1)
t
Output Enable to Output High-Z
1
7
1
7
1
7
(2)
____
____
____
t
Clock to Data Valid (Flow-Through)
18
20
25
(2)
____
____
____
t
Clock to Data Valid (Pipelined)
7.5
9
12
____
____
____
t
Data Output Hold After Clock High
2
2
2
2
2
2
2
2
2
(1)
t
Clock High to Output High-Z
9
9
9
(1)
____
____
____
t
Clock High to Output Low-Z
Port-to-Port Delay
Write Port Clock High to Read Data Delay
Clock-to-Clock Setup Time
____
____
____
____
____
____
t
CWDD
28
10
35
15
40
15
ns
tCCS
ns
4847 tbl 11
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed by device characteriza-
tion, but is not production tested.
2. The Pipelined output parameters (tCYC2, tCD2) to either the Left or Right ports when FT/PIPE = VIH. Flow-Through parameters (tCYC1, tCD1) apply when FT/PIPE = VIL for
that port.
3. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE), FT/PIPER and FT/PIPEL.
6.742
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Read Cycle for
Flow-Through Output (FT/PIPE"X" = VIL)(3,6)
tCYC1
tCH1
tCL1
CLK
CE
0
tSC
tHC
tSC
tHC
(4)
CE1
R/W
tHW
tSW
tSA
t
HA
ADDRESS(5)
DATAOUT
An
An + 1
An + 2
An + 3
(1)
tDC
tCD1
tCKHZ
Qn
Qn + 1
Qn + 2
(1)
(1)
tCKLZ
tDC
(1)
tOHZ
tOLZ
OE (2)
tOE
4847 drw 07
Timing Waveform of Read Cycle for Pipelined Operation
(FT/PIPE"X" = VIH)(3,6)
tCYC2
tCH2
tCL2
CLK
CE
0
tSC
tHC
tSC
tHC
(4)
CE1
R/W
tHW
tSW
tSA
tHA
ADDRESS(5)
An
An + 1
An + 2
Qn
An + 3
(1 Latency)
tDC
tCD2
Qn + 2 (6)
DATAOUT
Qn + 1
(1)
tCKLZ
(1)
(1)
t
OHZ
tOLZ
OE(2)
tOE
4847 drw 08
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge.
3. ADS = VIL, CNTEN and CNTRST = VIH.
4. The output is disabled (High-Impedance state) by CE0 = VIH or CE1 = VIL following the next rising edge of the clock. Refer to Truth Table 1.
5. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
6. "X" here denotes Left or Right port. The diagram is with respect to that port.
8
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of a Bank Select Pipelined Read(1,2)
t
CYC2
tCH2
tCL2
CLK
ADDRESS(B1)
CE0(B1)
t
SA
tHA
A6
A5
A4
A3
A
2
A
0
A1
tSC
tHC
t
SC
tHC
(3)
CKHZ
tCD2
tCD2
t
tCD2
Q
0
Q3
Q
1
DATAOUT(B1)
ADDRESS(B2)
(3)
(3)
tDC
tCKLZ
t
DC
t
CKHZ
tSA
tHA
A6
A5
A4
A3
A2
A
0
A1
tSC
tHC
CE0(B2)
tSC
tHC
(3)
tCD2
tCKHZ
tCD2
DATAOUT(B2)
Q4
Q2
(3)
(3)
tCKLZ
tCKLZ
4847 drw 09
Timing Waveform of Write with Port-to-Port Flow-Through Read(4,5,7)
CLK "A"
tSW
tHW
R/W "A"
ADDRESS "A"
DATAIN "A"
CLK "B"
t
SA
MATCH
SD HD
VALID
tHA
NO
MATCH
t
t
(6)
tCCS
tCD1
R/W "B"
tHW
t
SW
tHA
tSA
NO
MATCH
ADDRESS "B"
DATAOUT "B"
MATCH
(6)
t
CD1
tCWDD
VALID
VALID
tDC
t
DC
4847 drw 10
NOTES:
1. B1 Represents Bank #1; B2 Represents Bank #2. Each Bank consists of one IDT709199 for this waveform, and are setup for depth expansion in this example.
ADDRESS(B1) = ADDRESS(B2) in this situation.
2. OE and ADS = VIL; CE1(B1), CE1(B2), R/W, CNTEN, and CNTRST = VIH.
3. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
4. CE0 and ADS = VIL; CE1, CNTEN, and CNTRST = VIH.
5. OE = VIL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to.
6. If tCCS < maximum specified, then data from right port READ is not valid until the maximum specified for tCWDD.
If tCCS > maximum specified, then data from right port READ is not valid until tCCS + tCD1. tCWDD does not apply in this case.
7. All timing is the same for both Left and Right ports. Port "A" may be either Left or Right port. Port "B" is the opposite from Port "A".
6.942
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Pipelined Read-to-Write-to-Read (OE = VIL)(3)
tCYC2
tCH2
tCL2
CLK
CE0
tSC
tHC
CE1
tSW tHW
R/W
tSW tHW
(4)
An + 3
An + 4
An
An +1
An + 2
An + 2
ADDRESS
tSA
tHA
tSD
tHD
DATAIN
Dn + 2
(1)
(1)
tCKLZ
tCD2
tCD2
(2)
tCKHZ
Qn + 3
Qn
DATAOUT
READ
NOP(5)
WRITE
READ
4847 drw 11
Timing Waveforn of Pipelined Read-to-Write-to-Read (OE Controlled)(3)
t
CYC2
tCH2
tCL2
CLK
CE0
t
SC
tHC
CE1
tSW tHW
R/W
tSW tHW
(4)
An + 4
An
An +1
An + 2
An + 3
Dn + 3
An + 5
ADDRESS
t
SA
tHA
t
SD
t
HD
DATAIN
Dn + 2
(1)
CKLZ
t
CD2
t
CD2
t
(2)
Qn
Qn + 4
DATAOUT
(1)
t
OHZ
OE
READ
WRITE
READ
4847 drw 12
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
3. CE0 and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. "NOP" is "No Operation".
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only.
5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
10
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Flow-Through Read-to-Write-to-Read (OE = VIL)(3)
t
CYC1
tCH1
tCL1
CLK
CE0
tSC
tHC
CE1
tSW tHW
R/W
tSW tHW
ADDRESS(4)
An + 4
An
An + 3
An +1
An + 2
Qn + 1
An + 2
tSA
tHA
t
SD
tHD
DATAIN
Dn + 2
tCD1
t
CD1
tCD1
tCD1
(2)
Qn + 3
Qn
READ
DATAOUT
(1)
(1)
tDC
tDC
READ
tCKLZ
t
CKHZ
NOP(5)
WRITE
4847 drw 13
TimingWaveformofFlow-ThroughRead-to-Write-to-Read(OEControlled)(3)
tCYC1
tCH1
tCL1
CLK
CE0
tSC
tHC
CE1
tSW tHW
R/W
tSW tHW
(4)
An + 5
An
tHA
An +1
An + 2
An + 3
Dn + 3
An + 4
ADDRESS
tSA
t
SD tHD
DATAIN
Dn + 2
tOE
tDC
tCD1
tCD1
tCD1
(2)
Qn + 4
Qn
DATAOUT
(1)
CKLZ
(1)
t
tOHZ
tDC
OE
READ
WRITE
READ
4847 drw 14
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. Output state (High, Low, or High-impedance is determined by the previous cycle control signals.
3. CE0 and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. "NOP" is "No Operation".
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only.
5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
61.412
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Pipelined Read with Address Counter Advance(1)
t
CYC2
tCH2
tCL2
CLK
tSA
tHA
An
ADDRESS
tSAD tHAD
ADS
tSAD tHAD
CNTEN
tSCN tHCN
tCD2
Qn + 2(2)
Qx - 1(2)
Qx
Qn + 3
Qn + 1
Qn
DATAOUT
tDC
READ
EXTERNAL
ADDRESS
READ
WITH
COUNTER
COUNTER
HOLD
READ WITH COUNTER
4847 drw 15
TimingWaveformof Flow-ThroughReadwithAddressCounterAdvance(1)
t
CYC1
tCH1
tCL1
CLK
tSA
tHA
An
ADDRESS
t
SAD tHAD
ADS
t
SAD
tHAD
tSCN
tHCN
CNTEN
t
CD1
Qn + 3(2)
Qx(2)
Qn + 4
Qn + 1
Qn + 2
Qn
DATAOUT
t
DC
READ
READ
EXTERNAL
ADDRESS
READ WITH COUNTER
COUNTER
HOLD
WITH
COUNTER
4847 drw 16
NOTES:
1. CE0 and OE = VIL; CE1, R/W, and CNTRST = VIH.
2. If there is no address change via ADS = VIL (loading a new address) or CNTEN = VIL (advancing the address), i.e. ADS = VIH and CNTEN = VIH, then the data output
remains constant for subsequent clocks.
12
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Address Counter Advance
(Flow-Through or Pipelined Outputs)(1)
t
CYC2
tCH2
tCL2
CLK
tSA
tHA
An
ADDRESS
INTERNAL(3)
ADDRESS
An(7)
An + 4
An + 2
An + 1
An + 3
t
SAD tHAD
ADS
CNTEN
tSD tHD
Dn + 4
Dn + 1
Dn + 3
Dn
Dn + 1
Dn + 2
DATAIN
WRITE
EXTERNAL
ADDRESS
WRITE
WITH COUNTER
WRITE
COUNTER HOLD
WRITE WITH COUNTER
4847 drw 17
Timing Waveform of Counter Reset (Pipelined Outputs)(2)
t
CYC2
tCH2
tCL2
CLK
tSA tHA
ADDRESS(4)
An + 2
An
An + 1
INTERNAL(3)
ADDRESS
Ax(6)
0
An + 1
1
An
t
SW tHW
R/W
ADS
CNTEN
tSRST
tHRST
CNTRST
tSD
tHD
D0
DATAIN
(5)
Qn
Q1
Q0
DATAOUT
.
COUNTER(6)
RESET
WRITE
READ
READ
READ
ADDRESS n+1
READ
ADDRESS 0
ADDRESS 0
ADDRESS n
ADDRESS 1
4847 drw 18
NOTES:
1. CE0 and R/W = VIL; CE1 and CNTRST = VIH.
CE0 = VIL; CE1 = VIH.
2.
3. The "Internal Address" is equal to the "External Address" when ADS = VIL and equals the counter output when ADS = VIH.
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only.
5. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
6. No dead cycle exists during counter reset. A READ or WRITE cycle may be coincidental with the counter reset cycle.
7. CNTEN = VIL advances Internal Address from ‘An’ to ‘An +1’. The transition shown indicates the time required for the counter to advance. The ‘An +1’ Address is written
to during this cycle.
61.432
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Depth and Width Expansion
A Functional Description
The IDT709199 features dual chip enables (refer to Truth Table I)
in order to facilitate rapid and simple depth expansion with no require-
ments for external logic. Figure 4 illustrates how to control the various
chip enables in order to expand two devices in depth.
The IDT709199 provides a true synchronous Dual-Port Static
RAM interface. Registered inputs provide minimal set-up and hold
times on address, data, and all critical control inputs. All internal
registers are clocked on the rising edge of the clock signal, however,
the self-timed internal write pulse is independent of the LOW to HIGH
transition of the clock signal.
The 709199 can also be used in applications requiring expanded
width, as indicated in Figure 4. Since the banks are allocated at the
discretion of the user, the external controller can be set up to drive the
input signals for the various devices as required to allow for 18-bit
or wider applications.
An asynchronous output enable is provided to ease asynchronous
bus interfacing. Counter enable inputs are also provided to stall the
operation of the address counters for fast interleaved memory appli-
cations.
CE0 = VIH or CE1 = VIL for one clock cycle will power down the
internal circuitry to reduce static power consumption. Multiple chip
enables allow easier banking of multiple IDT709199's for depth
expansion configurations. When the Pipelined output mode is en-
abled, two cycles are required with CE0 = VIL and CE1 = VIH to re-
activate the outputs.
A17
IDT709199
IDT709199
CE0
CE0
CE1
CE1
VCC
VCC
Control Inputs
Control Inputs
IDT709199
IDT709199
CE1
CE1
CE0
CE0
CNTRST
CLK
ADS
Control Inputs
Control Inputs
CNTEN
R/W
OE
4847 drw 19
Figure 4. Depth and Width Expansion with IDT709199
14
6.42
IDT709199L
High-Speed 128K x 9 Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Ordering Information
IDT XXXXX
A
99
A
A
Device
Type
Power Speed
Package
Process/
Temperature
Range
Blank
Commercial (0°C to +70°C)
Industrial (-40°C to +85°C)
(1)
I
PF
100-pin TQFP (PN100-1)
7
9
Commercial Only
Commercial Only
Commercial Only
Speed in nanoseconds
12
L
Low Power
709199 1152K (128K x 9-Bit) Synchronous Dual-Port RAM
4847 drw 20
NOTE:
1. Industrial temperature range is available.
For other speeds, packages and powers contact your sales office.
DatasheetDocumentHistory
9/30/99:
11/10/99:
12/22/99:
1/5/01:
InitialPublicRelease
Replaced IDT logo
Page 1 Addedmissingdiamond
Page 3 ChangedinformationinTruthTableII
Page 4 Increasedstoragetemperatureparameter
ClarifiedTAparameter
Page 5 DCElectricalparameters–changedwordingfrom"open"to"disabled"
Put overbar on CE in notes
Changed±200mVto0mVinnotes
DeletedPreliminary
10/19/01:
Page 2 Addeddate revisionforpinconfiguration
Page 5&7 AddedIndustrialtemptocolumnheadingandvalues for9ns speedtoDC&ACElectricalCharacteristics
Page 15 AddedIndustrialtempofferingto9nsorderinginformation
Page4,5& 7 RemovedIndustrialtempfootnotefromalltables
Page 1 & 15 Replace TM logo with ® logo
CORPORATE HEADQUARTERS
6024 Silver Creek Valley Road
San Jose, CA 95138
for SALES:
for Tech Support:
408-284-2794
DualPortHelp@idt.com
800-345-7015 or 408-284-8200
fax: 408-284-2775
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
61.452
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