IDT709379L12PF9 [IDT]

Dual-Port SRAM, 32KX18, 12ns, CMOS, PQFP100, TQFP-100;
IDT709379L12PF9
型号: IDT709379L12PF9
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

Dual-Port SRAM, 32KX18, 12ns, CMOS, PQFP100, TQFP-100

静态存储器 内存集成电路
文件: 总15页 (文件大小:189K)
中文:  中文翻译
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HIGH-SPEED 32K x 18  
IDT709379L  
SYNCHRONOUS PIPELINED  
DUAL-PORT STATIC RAM  
Features  
True Dual-Ported memory cells which allow simultaneous  
access of the same memory location  
High-speed clock to data access  
– Commercial: 7.5/9/12ns (max.)  
Low-power operation  
Full synchronous operation on both ports  
4ns setup to clock and 0ns hold on all control, data, and  
address inputs  
Data input, address, and control registers  
Fast 7.5ns clock to data out in the Pipelined output mode  
Self-timed write allows fast cycle time  
IDT709379L  
Active: 1.2W (typ.)  
Standby: 2.5mW (typ.)  
12ns cycle time, 83MHz operation in Pipelined output mode  
Separate upper-byte and lower-byte controls for  
multiplexed bus and bus matching compatibility  
TTL- compatible, single 5V (±10%) power supply  
Industrial temperature range (–40°C to +85°C) is  
available for selected speeds  
Flow-Through or Pipelined output mode on either Port via  
the FT/PIPE pins  
Counter enable and reset features  
Dual chip enables allow for depth expansion without  
additional logic  
Available in a 100-pin Thin Quad Flatpack (TQFP) package  
Functional Block Diagram  
R/WL  
UBL  
R/WR  
UBR  
CE0L  
CE1L  
CE0R  
CE1R  
1
0
1
0
0/1  
0/1  
LBL  
LBR  
OEL  
OER  
1b 0b  
0a 1a  
0b 1b  
1a 0a  
a
FT/PIPEL  
0/1  
0/1  
b
a
b
FT/PIPER  
I/O9L-I/O17L  
I/O0L-I/O8L  
I/O9R-I/O17R  
I/O0R-I/O8R  
I/O  
Control  
I/O  
Control  
A14R  
A14L  
Counter/  
Address  
Reg.  
Counter/  
Address  
Reg.  
MEMORY  
ARRAY  
A0R  
A0L  
CLKR  
ADSR  
CLKL  
ADSL  
CNTENL  
CNTENR  
CNTRSTL  
CNTRSTR  
4845 drw 01  
JANUARY 2001  
1
DSC-4845/3  
©2000IntegratedDeviceTechnology,Inc.  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Description  
With an input data register, the IDT709379 has been optimized for  
applications having unidirectional or bidirectional data flow in bursts.  
Anautomaticpowerdownfeature, controlledbyCE0andCE1, permits  
the on-chip circuitry of each port to enter a very low standby power  
mode. Fabricated using IDTs CMOS high-performance technology,  
these devices typically operate on only 1.2W of power.  
The IDT709379 is a high-speed 32K x 18 bit synchronous Dual-  
Port RAM. The memory array utilizes Dual-Port memory cells to allow  
simultaneous access of any address from both ports. Registers on  
control, data, and address inputs provide minimal setup and hold  
times. The timing latitude provided by this approach allows systems  
to be designed with very short cycle times.  
Pin Configurations(1,2,3)  
INDEX  
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76  
1
A9L  
A10L  
A11L  
A12L  
A13L  
A14L  
NC  
LBL  
UBL  
A8R  
A9R  
A10R  
A11R  
A12R  
A13R  
A14R  
NC  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
2
3
4
5
6
7
8
9
LBR  
UBR  
CE0L  
CE1L  
CNTRSTL  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
709379PF  
PN100-1(4)  
CE  
0R  
CE1R  
CNTRSTR  
R/WL  
OEL  
Vcc  
100-Pin TQFP  
Top View(5)  
R/  
R
W
GND  
OER  
/PIPEL  
I/O17L  
I/O16L  
GND  
I/O15L  
I/O14L  
I/O13L  
I/O12L  
I/O11L  
I/O10L  
FT  
FT/PIPER  
I/O17R  
GND  
I/O16R  
I/O15R  
I/O14R  
I/O13R  
I/O12R  
I/O11R  
26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
4845 drw 02  
NOTES:  
1. All VCC pins must be connected to power supply.  
2. All GND pins must be connected to ground.  
3. Package body is approximately 14mm x 14mm x 1.4mm  
4. This package code is used to reference the package diagram.  
5. This text does not indicate orientation of the actual part-marking.  
2
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Pin Names  
Left Port  
Right Port  
Names  
Chip Enables  
CE0L  
1L  
CE0R  
1R  
, CE  
, CE  
WL  
R/  
WR  
R/  
Read/Write Enable  
Output Enable  
Address  
OEL  
OER  
0L  
A
14L  
0R  
A
14R  
- A  
- A  
0L  
17L  
0R  
17R  
I/O - I/O  
I/O - I/O  
Data Input/Output  
Clock  
L
CLK  
R
CLK  
Upper Byte Select  
Lower Byte Select  
Address Strobe  
Counter Enable  
Counter Reset  
Flow-Through/Pipeline  
Power  
UBL  
UBR  
LBL  
LBR  
ADSL  
ADSR  
CNTENL  
CNTRSTL  
CNTENR  
CNTRSTR  
FT  
/PIPE  
L
FT  
/PIPE  
R
CC  
V
GND  
Ground  
4845 tbl 01  
Truth Table I—Read/Write and Enable Control(1,2,3)  
Upper Byte  
I/O9-17  
Lower Byte  
I/O0-8  
CLK  
0
CE1  
X
L
R/W  
X
X
X
L
Mode  
DeselectedPower Down  
OE  
X
X
X
X
X
X
L
CE  
UB  
X
X
H
L
LB  
X
X
H
H
L
H
X
L
L
L
L
L
L
L
L
High-Z  
High-Z  
High-Z  
DATAIN  
High-Z  
DATAIN  
DATAOUT  
High-Z  
DATAOUT  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
DATAIN  
DATAIN  
High-Z  
DATAOUT  
DATAOUT  
High-Z  
DeselectedPower Down  
Both Bytes Deselected  
Write to Upper Byte Only  
Write to Lower Byte Only  
Write to Both Bytes  
H
H
H
H
H
H
H
H
H
L
L
L
L
L
H
L
H
H
H
X
Read Upper Byte Only  
Read Lower Byte Only  
Read Both Bytes  
L
H
L
L
L
H
X
L
L
Outputs Disabled  
4845 tbl 02  
NOTES:  
1. "H" = VIH, "L" = VIL, "X" = Don't Care.  
2. ADS, CNTEN, CNTRST = X.  
3. OE is an asynchronous input signal.  
6.342  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Truth Table II—Address Counter Control(1,2,6)  
Previous  
Address  
Addr  
Used  
Mode  
(3)  
Address  
CLK  
I/O  
ADS  
CNTEN  
CNTRST  
X
An  
An  
X
X
X
0
An  
X
X
X
H
L
H
H
H
DI/O(0)  
DI/O(n)  
DI/O(n)  
Counter Reset to Address 0  
(4)  
L
External Address Loaded into Counter  
External Address BlockedCounter Disabled (Ap reused)  
Ap  
Ap  
Ap  
H
H
(5)  
Ap + 1  
L
DI/O(n+1) Counter EnableInternal Address Generation  
4845 tbl 03  
NOTES:  
1. "H" = VIH, "L" = VIL, "X" = Don't Care.  
2. CE0, LB, UB, and OE = VIL; CE1 and R/W = VIH.  
3. Outputs configured in Flow-Through Output mode: if outputs are in Pipelined mode the data out will be delayed by one cycle.  
4. ADS is independent of all other signals including CE0, CE1, UB and LB.  
5. The address counter advances if CNTEN = VIL on the rising edge of CLK, regardless of all other signals including CE0, CE1, UB and LB.  
6. While an external address is being loaded (ADS = VIL), R/W = VIH is recommended to ensure data is not written arbitrarily.  
Recommended Operating  
Recommended DC Operating  
Temperature and Supply Voltage(1) Conditions  
Symbol  
Parameter  
Min.  
4.5  
0
Typ. Max. Unit  
Grade  
Ambient  
GND  
Vcc  
Temperature(2)  
VCC  
Supply Voltage  
5.0  
5.5  
0
V
V
V
Commercial  
0OC to +70OC  
0V  
0V  
5.0V + 10%  
5.0V + 10%  
GND Ground  
0
Industrial  
-40OC to +85OC  
(1)  
____  
VIH  
VIL  
Input High Voltage  
Input Low Voltage  
2.2  
6.0  
4845 tbl 04  
(2)  
____  
NOTES:  
-0.5  
0.8  
V
1. Industrial temperature: for specific speeds, packages and powers contact your  
sales office.  
2. This is the parameter TA. This is the "instant on" case temperature.  
4845 tbl 05  
NOTES:  
1. VTERM must not exceed Vcc + 10%.  
2. VIL > -1.5V for pulse width less than 10ns.  
Absolute Maximum Ratings(1)  
Capacitance(1)  
(TA = +25°C, f = 1.0MHz)  
Symbol  
Rating  
Commercial  
& Industrial  
Unit  
Symbol  
Parameter  
Input Capacitance  
Output Capacitance  
Conditions(2)  
Max. Unit  
(2)  
VTERM  
Terminal Voltage  
with Respect  
to GND  
-0.5 to +7.0  
V
CIN  
VIN = 3dV  
9
pF  
(3)  
COUT  
VOUT = 3dV  
10  
pF  
4845 tbl 07  
Temperature  
Under Bias  
-55 to +125  
-65 to +150  
50  
oC  
oC  
TBIAS  
TSTG  
IOUT  
NOTES:  
1. These parameters are determined by device characterization, but are not  
production tested.  
2. 3dV references the interpolated capacitance when the input and output switch from  
0V to 3V or from 3V to 0V.  
Storage  
Temperature  
3. COUT also references CI/O.  
DC Output  
Current  
mA  
4845 tbl 06  
NOTES:  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may  
cause permanent damage to the device. This is a stress rating only and functional  
operationofthe device atthese oranyotherconditions above those indicatedinthe  
operational sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect reliability.  
2. VTERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns  
maximum, and is limited to < 20mA for the period of VTERM > Vcc + 10%.  
4
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
DC Electrical Characteristics Over the Operating  
Temperature Supply Voltage Range (VCC = 5.0V ± 10%)  
709379L  
Symbol  
|ILI|  
Parameter  
Test Conditions  
VCC = 5.5V, VIN = 0V to VCC  
Min.  
Max.  
5
Unit  
µA  
µA  
V
(1)  
___  
___  
___  
Input Leakage Current  
|ILO|  
Output Leakage Current  
Output Low Voltage  
Output High Voltage  
0
IH  
1
IL OUT  
CC  
5
CE = V or CE = V , V = 0V to V  
VOL  
IOL = +4mA  
0.4  
___  
VOH  
IOH = -4mA  
2.4  
V
4845 tbl 08  
NOTE:  
1. At Vcc < 2.0V input leakages are undefined.  
DC Electrical Characteristics Over the Operating  
Temperature and Supply Voltage Range(3,6) (VCC = 5V ± 10%)  
709379L7  
Com'l Only  
709379L9  
Com'l Only  
709379L12  
Com'l Only  
Symbol  
Parameter  
Test Condition  
Version  
COM'L  
Typ.(4)  
Max.  
Typ.(4)  
Max.  
Typ.(4)  
Max.  
Unit  
mA  
ICC  
Dynamic Operating  
Current  
(Both Ports Active)  
L
L
L
L
L
L
275  
465  
250  
400  
230  
355  
CEL and CER= VIL  
Outputs Disabled  
(1)  
____  
____  
____  
____  
____  
____  
IND  
f = fMAX  
mA  
mA  
ISB1  
ISB2  
Standby Current  
(Both Ports - TTL  
Level Inputs)  
COM'L  
IND  
95  
150  
80  
135  
70  
110  
CEL = CER = VIH  
(1)  
f = fMAX  
____  
____  
____  
____  
____  
____  
Standby Current  
(One Port - TTL  
Level Inputs)  
COM'L  
IND  
200  
295  
175  
275  
150  
240  
CE"A" = VIL and  
(3)  
CE"B" = VIH  
____  
____  
____  
____  
____  
____  
Active Port Outputs  
Disabled, f=fMAX  
(1)  
mA  
mA  
ISB3  
ISB4  
Full Standby Current  
(Both Ports -  
CMOS Level Inputs)  
Both Ports CER and  
CEL > VCC - 0.2V  
VIN > VCC - 0.2V or  
VIN < 0.2V, f = 0(2)  
COM'L  
IND  
L
L
0.5  
3
0.5  
3
0.5  
3
____  
____  
____  
____  
____  
____  
Full Standby Current  
(One Port -  
CMOS Level Inputs)  
COM'L  
IND  
L
L
190  
290  
170  
270  
140  
225  
CE"A" < 0.2V and  
(5)  
CE"B" > VCC - 0.2V  
VIN > VCC - 0.2V or  
VIN < 0.2V, Active Port  
____  
____  
____  
____  
____  
____  
(1)  
Outputs Disabled, f = fMAX  
4845 tbl 09  
NOTES:  
1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS" at input levels of  
GND to 3V.  
2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby.  
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".  
4. Vcc = 5V, TA = 25°C for Typ, and are not production tested. ICC DC(f=0) = 150mA (Typ).  
5. CEX = VIL means CE0X = VIL and CE1X = VIH  
CEX = VIH means CE0X = VIH or CE1X = VIL  
CEX < 0.2V means CE0X < 0.2V and CE1X > VCC - 0.2V  
CEX > VCC - 0.2V means CE0X > VCC - 0.2V or CE1X < 0.2V  
"X" represents "L" for left port or "R" for right port.  
6. Industrial temperature: for specific speeds, packages and powers contact your sales office.  
6.542  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
AC Test Conditions  
Input Pulse Levels  
GND to 3.0V  
3ns Max.  
Input Rise/Fall Times  
Input Timing Reference Levels  
Output Reference Levels  
Output Load  
1.5V  
1.5V  
Figures 1,2 and 3  
4845 tbl 10  
5V  
5V  
893  
893  
DATAOUT  
DATAOUT  
30pF  
347  
5pF*  
347Ω  
4845 drw 04  
4845 drw 05  
Figure 1. AC Output Test load.  
Figure 2. Output Test Load  
(For tCKLZ, tCKHZ, tOLZ, and tOHZ).  
*Including scope and jig.  
8
7
6
5
- 10pF is the I/O capacitance  
of this device, and 30pF is the  
AC Test Load Capacitance  
tCD  
tCD  
(Typical, ns)  
1
,
4
3
2
1
2
0
20 40 60 80 100 120 140 160 180 200  
Capacitance (pF)  
-1  
4845 drw 06  
Figure 3. Typical Output Derating (Lumped Capacitive Load).  
6
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
AC Electrical Characteristics Over the Operating Temperature Range  
(Read and Write Cycle Timing)(3,4) (VCC = 5V ± 10%, TA = 0°C to +70°C)  
709379L7  
Com'l Only  
709379L9  
Com'l Only  
709379L12  
Com'l Only  
Symbol  
tCYC1  
Parameter  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
(2)  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
Clock Cycle Time (Flow-Through)  
22  
12  
7.5  
7.5  
5
25  
15  
12  
12  
6
30  
20  
12  
12  
8
(2)  
tCYC2  
tCH1  
tCL1  
tCH2  
tCL2  
tR  
Clock Cycle Time (Pipelined)  
(2)  
Clock High Time (Flow-Through)  
Clock Low Time (Flow-Through)(2)  
(2)  
Clock High Time (Pipelined)  
(2)  
Clock Low Time (Pipelined)  
5
6
8
____  
____  
____  
Clock Rise Time  
3
3
3
____  
____  
____  
tF  
Clock Fall Time  
3
3
3
____  
____  
____  
tSA  
Address Setup Time  
Address Hold Time  
Chip Enable Setup Time  
Chip Enable Hold Time  
Byte Enable Setup Time  
Byte Enable Hold Time  
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
4
1
4
1
4
1
4
1
4
1
4
1
4
1
4
4
1
4
1
4
1
4
1
4
1
4
1
4
1
4
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
____  
tHA  
tSC  
tHC  
tSB  
tHB  
tSW  
tHW  
tSD  
R/  
W
W
Setup Time  
Hold Time  
R/  
Input Data Setup Time  
Input Data Hold Time  
ADS Setup Time  
tHD  
tSAD  
tHAD  
tSCN  
tHCN  
tSRST  
tHRST  
tOE  
ADS Hold Time  
CNTEN Setup Time  
CNTEN Hold Time  
CNTRST Setup Time  
CNTRST Hold Time  
Output Enable to Data Valid  
0
1
1
____  
____  
____  
9
12  
12  
(1)  
____  
____  
____  
tOLZ  
tOHZ  
tCD1  
tCD2  
tDC  
Output Enable to Output Low-Z  
2
2
2
(1)  
Output Enable to Output High-Z  
1
7
1
7
1
7
Clock to Data Valid (Flow-Through)(2)  
18  
20  
25  
____  
____  
____  
(2)  
____  
____  
____  
Clock to Data Valid (Pipelined)  
7.5  
9
12  
____  
____  
____  
Data Output Hold After Clock High  
2
2
2
2
2
2
2
2
2
(1)  
tCKHZ  
tCKLZ  
Clock High to Output High-Z  
9
9
9
(1)  
____  
____  
____  
Clock High to Output Low-Z  
Port-to-Port Delay  
tCWDD Write Port Clock High to Read Data Delay  
tCCS Clock-to-Clock Setup Time  
____  
____  
____  
____  
____  
____  
28  
10  
35  
15  
40  
15  
ns  
ns  
4845 tbl 11  
NOTES:  
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed by device characteriza-  
tion, but is not production tested.  
2. The Pipelined output parameters (tCYC2, tCD2) to either the Left or Right ports when FT/PIPE = VIH. Flow-Through parameters (tCYC1, tCD1) apply when FT/PIPE = VIL for  
that port.  
3. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE), FT/PIPER and FT/PIPEL.  
4. Industrial temperature: for other speeds, packages and powers contact your sales office.  
6.742  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Timing Waveform of Read Cycle for  
Flow-Through Output (FT/PIPE"X" = VIL)(3,7)  
tCYC1  
tCH1  
tCL1  
CLK  
CE0  
tSC  
(4)  
tHC  
tHB  
tSC  
tSB  
tHC  
tHB  
CE1  
UB, LB  
R/W  
tSB  
tHW  
tHA  
tSW  
tSA  
ADDRESS(5)  
DATAOUT  
An  
An + 1  
An + 2  
An + 3  
(1)  
tDC  
tCD1  
tCKHZ  
Qn  
Qn + 1  
Qn + 2  
(1)  
(1)  
tCKLZ  
tDC  
(1)  
tOHZ  
tOLZ  
tOE  
OE(2)  
4845 drw 07  
Timing Waveform of Read Cycle for Pipelined Operation  
(FT/PIPE"X" = VIH)(3,7)  
tCYC2  
tCH2  
tCL2  
CLK  
CE0  
tSC  
(4)  
tHC  
tHB  
tSC tHC  
CE1  
tSB  
(6)  
tHB  
tSB  
UB, LB  
R/W  
tHW  
tHA  
tSW  
tSA  
ADDRESS(5)  
An  
An + 1  
An + 2  
Qn  
An + 3  
(1 Latency)  
tDC  
tCD2  
Qn + 2 (6)  
DATAOUT  
Qn + 1  
(1)  
tCKLZ  
(1)  
(1)  
tOHZ  
tOLZ  
OE(2)  
tOE  
4845 drw 08  
NOTES:  
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).  
2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge.  
3. ADS = VIL, CNTEN and CNTRST = VIH.  
4. The output is disabled (High-Impedance state) by CE0 = VIH, CE1 = VIL, UB = VIH, or LB = VIH following the next rising edge of the clock. Refer to Truth Table 1.  
5. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers  
are for reference use only.  
6. If UB or LB was HIGH, then the Upper Byte and/or Lower Byte of DATAOUT for Qn + 2 would be disabled (High-Impedance state).  
7. "X" here denotes Left or Right port. The diagram is with respect to that port.  
8
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Timing Waveform of a Bank Select Pipelined Read(1,2)  
tCYC2  
tCH2  
tCL2  
CLK  
ADDRESS(B1)  
CE0(B1)  
tSA tHA  
A6  
A5  
A4  
A3  
A2  
A0  
A1  
tSC tHC  
tSC tHC  
(3)  
tCKHZ  
tCD2  
tCD2  
tCD2  
(3)  
Q0  
Q3  
A5  
Q1  
A3  
DATAOUT(B1)  
ADDRESS(B2)  
(3)  
tDC  
tCKLZ  
tDC  
tCKHZ  
tSA tHA  
A0  
A6  
A4  
A2  
A1  
tSC tHC  
CE0(B2)  
tSC tHC  
(3)  
tCD2  
(3)  
tCKHZ  
tCD2  
(3)  
DATAOUT(B2)  
Q4  
Q
2
tCKLZ  
tCKLZ  
4845 drw 09  
Timing Waveform of Write with Port-to-Port Flow-Through Read(4,5,7)  
CLK "A"  
tSW tHW  
R/W "A"  
tSA tHA  
NO  
ADDRESS "A"  
DATAIN "A"  
CLK "B"  
MATCH  
MATCH  
tSD tHD  
VALID  
(6)  
tCCS  
tCD1  
R/W "B"  
tHW  
tHA  
tSW  
tSA  
NO  
MATCH  
ADDRESS "B"  
DATAOUT "B"  
MATCH  
(6)  
tCD1  
tCWDD  
VALID  
VALID  
tDC  
tDC  
4845 drw 10  
NOTES:  
1. B1 Represents Bank #1; B2 Represents Bank #2. Each Bank consists of one IDT709289 for this waveform, and are setup for depth expansion in this example.  
ADDRESS(B1) = ADDRESS(B2) in this situation.  
2. UB, LB, OE, and ADS = VIL; CE1(B1), CE1(B2), R/W, CNTEN, and CNTRST = VIH.  
3. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).  
4. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH.  
5. OE = VIL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to.  
6. If tCCS < maximum specified, then data from right port READ is not valid until the maximum specified for tCWDD.  
If tCCS > maximum specified, then data from right port READ is not valid until tCCS + tCD1. tCWDD does not apply in this case.  
7. All timing is the same for both Left and Right ports. Port "A" may be either Left or Right port. Port "B" is the opposite from Port "A".  
6.942  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Timing Waveform of Pipelined Read-to-Write-to-Read (OE = VIL)(3)  
tCYC2  
tCH2  
tCL2  
CLK  
CE0  
CE1  
tSC tHC  
tSB tHB  
UB, LB  
R/W  
tSW tHW  
An + 2  
tSW tHW  
(4)  
An + 3  
An + 4  
An  
An +1  
An + 2  
ADDRESS  
tSA tHA  
tSD  
tHD  
DATAIN  
Dn + 2  
(1)  
(1)  
tCKLZ  
tCD2  
tCD2  
(2)  
tCKHZ  
Qn + 3  
Qn  
DATAOUT  
READ  
NOP(5)  
WRITE  
READ  
4845 drw 11  
Timing Waveforn of Pipelined Read-to-Write-to-Read (OE Controlled)(3)  
tCYC2  
tCH2  
tCL2  
CLK  
CE0  
tSC tHC  
CE1  
tSB  
tHB  
UB, LB  
tSW tHW  
W
R/  
tSW tHW  
(4)  
An + 4  
An  
An +1  
An + 2  
An + 3  
Dn + 3  
An + 5  
ADDRESS  
tSA tHA  
tSD tHD  
DATAIN  
Dn + 2  
(1)  
tCD2  
tCD2  
tCKLZ  
(2)  
Qn  
Qn + 4  
DATAOUT  
(1)  
tOHZ  
OE  
READ  
WRITE  
READ  
4845 drw 12  
NOTES:  
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).  
2. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.  
3. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. "NOP" is "No Operation".  
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only.  
5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.  
10  
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Timing Waveform of Flow-Through Read-to-Write-to-Read (OE = VIL)(3)  
tCYC1  
tCH1  
tCL1  
CLK  
CE0  
CE1  
tSC tHC  
tSB  
tHB  
,
UB LB  
tSW tHW  
R/  
W
tSW tHW  
ADDRESS(4)  
An + 4  
An  
An + 3  
An +1  
An + 2  
An + 2  
tSD tHD  
Dn + 2  
tSA tHA  
DATAIN  
tCD1  
tCD1  
tCD1  
tCD1  
(2)  
Qn + 3  
Qn  
READ  
Qn + 1  
DATAOUT  
(1)  
tCKLZ  
(1)  
tDC  
tDC  
tCKHZ  
NOP(5)  
READ  
WRITE  
4845 drw 13  
TimingWaveformofFlow-ThroughRead-to-Write-to-Read(OEControlled)(3)  
t
CYC1  
tCH1  
tCL1  
CLK  
CE0  
tSC tHC  
CE1  
tSB tHB  
UB, LB  
R/W  
tSW tHW  
tSW tHW  
(4)  
An + 5  
An  
An +1  
An + 2  
An + 3  
Dn + 3  
An + 4  
ADDRESS  
tSA tHA  
tSD tHD  
DATAIN  
Dn + 2  
t
OE  
tDC  
t
CD1  
tCD1  
tCD1  
(2)  
Qn + 4  
tDC  
Qn  
DATAOUT  
(1)  
tCKLZ  
(1)  
tOHZ  
OE  
READ  
WRITE  
READ  
4845 drw 14  
NOTES:  
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).  
2. Output state (High, Low, or High-impedance is determined by the previous cycle control signals.  
3. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. "NOP" is "No Operation".  
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only.  
5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.  
61.412  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Timing Waveform of Pipelined Read with Address Counter Advance(1)  
tCYC2  
tCH2  
tCL2  
CLK  
tSA tHA  
An  
ADDRESS  
tSAD tHAD  
ADS  
tSAD tHAD  
tSCN tHCN  
CNTEN  
tCD2  
Qn + 2(2)  
Qx - 1(2)  
Qx  
Qn + 3  
Qn + 1  
Qn  
DATAOUT  
tDC  
READ  
EXTERNAL  
ADDRESS  
READ  
WITH  
COUNTER  
COUNTER  
HOLD  
READ WITH COUNTER  
4845 drw 15  
TimingWaveformof Flow-ThroughReadwithAddressCounterAdvance(1)  
tCYC1  
tCH1  
tCL1  
CLK  
tSA tHA  
An  
ADDRESS  
tSAD tHAD  
ADS  
tSAD tHAD  
tSCN tHCN  
CNTEN  
tCD1  
Qn + 3(2)  
Qx(2)  
tDC  
Qn  
Qn + 4  
Qn + 1  
Qn + 2  
DATAOUT  
READ  
READ  
EXTERNAL  
ADDRESS  
READ WITH COUNTER  
COUNTER  
HOLD  
WITH  
COUNTER  
4845 drw 16  
NOTES:  
1. CE0, OE, UB, and LB = VIL; CE1, R/W, and CNTRST = VIH.  
2. If there is no address change via ADS = VIL (loading a new address) or CNTEN = VIL (advancing the address), i.e. ADS = VIH and CNTEN = VIH, then the data output  
remains constant for subsequent clocks.  
12  
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Timing Waveform of Write with Address Counter Advance  
(Flow-Through or Pipelined Outputs)(1)  
tCYC2  
tCH2  
tCL2  
CLK  
tSA tHA  
An  
ADDRESS  
INTERNAL(3)  
ADDRESS  
An(7)  
An + 4  
An + 2  
An + 1  
An + 3  
tSAD tHAD  
ADS  
CNTEN  
tSD tHD  
Dn  
Dn + 4  
Dn + 1  
Dn + 3  
Dn + 1  
Dn + 2  
DATAIN  
WRITE  
EXTERNAL  
ADDRESS  
WRITE  
WITH COUNTER  
WRITE  
COUNTER HOLD  
WRITE WITH COUNTER  
4845 drw 17  
Timing Waveform of Counter Reset (Pipelined Outputs)(2)  
tCYC2  
tCH2  
tCL2  
CLK  
tSA tHA  
An  
ADDRESS(4)  
An + 2  
An + 1  
INTERNAL(3)  
ADDRESS  
Ax(6)  
0
An + 1  
1
An  
tSW tHW  
R/W  
ADS  
CNTEN  
tSRST  
tHRST  
CNTRST  
tSD  
tHD  
D0  
DATAIN  
(5)  
Qn  
Q1  
Q0  
DATAOUT  
.
COUNTER(6)  
RESET  
WRITE  
ADDRESS 0  
READ  
ADDRESS 0  
READ  
READ  
READ  
ADDRESS 1  
ADDRESS n ADDRESS n+1  
4845 drw 18  
NOTES:  
1. CE0, UB, LB, and R/W = VIL; CE1 and CNTRST = VIH.  
CE0, UB, LB = VIL; CE1 = VIH.  
2.  
3. The "Internal Address" is equal to the "External Address" when ADS = VIL and equals the counter output when ADS = VIH.  
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only.  
5. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.  
6. No dead cycle exists during counter reset. A READ or WRITE cycle may be coincidental with the counter reset cycle.  
7. CNTEN = VIL advances Internal Address from Anto An +1. The transition shown indicates the time required for the counter to advance. The An +1Address is written  
to during this cycle.  
61.432  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Depth and Width Expansion  
A Functional Description  
The IDT709379 features dual chip enables (refer to Truth Table I)  
in order to facilitate rapid and simple depth expansion with no require-  
ments for external logic. Figure 4 illustrates how to control the various  
chip enables in order to expand two devices in depth.  
The 709379 can also be used in applications requiring expanded  
width, as indicated in Figure 4. Since the banks are allocated at the  
discretion of the user, the external controller can be set up to drive the  
input signals for the various devices as required to allow for 36-bit  
or wider applications.  
The IDT709379 provides a true synchronous Dual-Port Static  
RAM interface. Registered inputs provide minimal set-up and hold  
times on address, data, and all critical control inputs. All internal  
registers are clocked on the rising edge of the clock signal, however,  
the self-timed internal write pulse is independent of the LOW to HIGH  
transition of the clock signal.  
An asynchronous output enable is provided to ease asynchronous  
bus interfacing. Counter enable inputs are also provided to stall the  
operation of the address counters for fast interleaved memory appli-  
cations.  
CE0 = VIH or CE1 = VIL for one clock cycle will power down the  
internal circuitry to reduce static power consumption. Multiple chip  
enables allow easier banking of multiple IDT709379's for depth  
expansion configurations. When the Pipelined output mode is en-  
abled, two cycles are required with CE0 = VIL and CE1 = VIH to re-  
activate the outputs.  
15  
A
IDT709379  
IDT709379  
CE0  
CE0  
CE1  
CE1  
CC  
CC  
V
V
Control Inputs  
Control Inputs  
IDT709379  
IDT709379  
CE1  
CE1  
CE0  
CE0  
CNTRST  
CLK  
Control Inputs  
Control Inputs  
ADS  
CNTEN  
4845 drw 19  
W
R/  
LB UB  
OE  
,
Figure 4. Depth and Width Expansion with IDT709379  
14  
6.42  
IDT709379L  
High-Speed 32K x 18 Synchronous Pipelined Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
Ordering Information  
IDT XXXXX  
A
99  
A
A
Device  
Type  
Power Speed  
Package  
Process/  
Temperature  
Range  
Blank  
I(1)  
Commercial (0°C to +70°C)  
Industrial (-40 C to +85 C)  
°
°
PF  
100-pin TQFP (PN100-1)  
7
9
12  
Commercial Only  
Commercial Only  
Commercial Only  
Speed in nanoseconds  
L
Low Power  
709379 576K (32K x 18-Bit) Synchronous Dual-Port RAM  
4845 drw 20  
NOTE:  
1. Industrial temperature range is available.  
For specific speeds, packages and powers contact your sales office.  
DatasheetDocumentHistory  
9/30/99:  
11/10/99:  
12/22/99:  
1/12/01:  
InitialPublicRelease  
Replaced IDT log  
Page 1 Addednmissingdiamond  
Page 4 ChangedinformationinTruthTableII  
Increasedstoragetemperatureparameter  
ClarifiedTAparameter  
Page 5 DCElectricalparameterschangedwordingfrom"open"to"disabled"  
Changed±200mVto0mVinnotes  
RemovedPreliminarystatus  
CORPORATE HEADQUARTERS  
2975 Stender Way  
Santa Clara, CA 95054  
for SALES:  
for Tech Support:  
831-754-4613  
DualPortHelp@idt.com  
800-345-7015 or 408-727-611 6  
fax: 408-492-8674  
www.idt.com  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
61.452  

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