IDT74FCT273SO [IDT]

FAST CMOS OCTAL FLIP-FLOP WITH MASTER RESET; 快速CMOS八路触发器具有硕士RESET
IDT74FCT273SO
型号: IDT74FCT273SO
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

FAST CMOS OCTAL FLIP-FLOP WITH MASTER RESET
快速CMOS八路触发器具有硕士RESET

触发器
文件: 总7页 (文件大小:64K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IDT54/74FCT273  
IDT54/74FCT273A  
IDT54/74FCT273C  
FAST CMOS  
OCTAL FLIP-FLOP  
WITH MASTER RESET  
Integrated Device Technology, Inc.  
FEATURES:  
DESCRIPTION:  
• IDT54/74FCT273 equivalent to FAST speed;  
IDT54/74FCT273A 45% faster than FAST  
• IDT54/74FCT273C 55% faster than FAST  
• Equivalent to FAST output drive over full temperature  
and voltage supply extremes  
• IOL = 48mA (commercial) and 32mA (military)  
• CMOS power levels (1mW typ. static)  
• TTL input and output level compatible  
• CMOS output level compatible  
• Substantially lower input current levels than FAST  
(5µA max.)  
• Octal D flip-flop with Master Reset  
• JEDEC standard pinout for DIP and LCC  
• Product available in Radiation Tolerant and Radiation  
Enhanced versions  
The IDT54/74FCT273/A/C are octal D flip-flops built using  
an advanced dual metal CMOS technology. The IDT54/  
74FCT273/A/C have eight edge-triggered D-type flip-flops  
with individual D inputs and O outputs. The common buffered  
Clock (CP) and Master Reset (MR) inputs load and reset  
(clear) all flip-flops simultaneously.  
The register is fully edge-triggered. The state of each D  
input, one set-up time before the LOW-to-HIGH clock  
transition, is transferred to the corresponding flip-flop’s O  
output.  
All outputs will be forced LOW independently of Clock or  
Data inputs by a LOW voltage level on the MR input. The  
device is useful for applications where the true output only is  
required and the Clock and Master Reset are common to all  
storage elements.  
• Military product compliant to MIL-STD-883, Class B  
FUNCTIONAL BLOCK DIAGRAM  
0
1
2
3
4
5
6
7
D
D
D
D
D
D
D
D
CP  
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
CP  
RD  
CP  
RD  
CP  
RD  
CP  
RD  
CP  
RD  
CP  
RD  
CP  
RD  
CP  
RD  
MR  
O0  
O1  
O2  
O3  
O4  
O5  
O6  
O7  
2558 drw 01  
PIN CONFIGURATIONS  
INDEX  
1
20  
19  
18  
17  
16  
15  
MR  
O0  
D0  
D1  
O1  
O2  
D2  
D3  
O3  
Vcc  
O7  
D7  
D6  
O6  
O5  
D5  
D4  
O4  
CP  
2
3
3
2
20 19  
18  
D7  
4
5
6
7
8
P20-1  
D20-1  
SO20-2  
&
D1  
O1  
O2  
D2  
D3  
1
4
D6  
O6  
O5  
D5  
17  
16  
15  
14  
5
L20-2  
6
7
E20-1 14  
13  
12  
11  
8
10 11 12 13  
9
9
10  
GND  
2558 drw 02  
DIP/SOIC/CERPACK  
TOP VIEW  
LCC  
TOP VIEW  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
FAST is a registered trademark of National Semiconductor Co.  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
MAY 1992  
1992 Integrated Device Technology, Inc.  
7.10  
DSC-4609/2  
1
IDT54/74FCT273/A/C FAST CMOS  
OCTAL D FLIP-FLOP WITH MASTER RESET  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
PIN DESCRIPTION  
FUNCTION TABLE  
Pin Names  
Description  
Inputs  
Outputs  
DN  
Data Input  
Operating Mode  
Reset (Clear)  
Load “1”  
CP  
X
DN  
X
h
ON  
L
MR  
L
MR  
CP  
ON  
Master Reset (Active LOW)  
Clock Pulse Input (Active Rising Edge)  
Data Outputs  
H
H
Load “0”  
H
l
L
2558 tbl 05  
NOTES:  
H = HIGH voltage level steady-state  
2558 tbl 06  
h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock  
transition  
L = LOW voltage level steady state  
l = LOW voltage level one set-up time prior to the LOW-to-HIGH clock  
transition  
X = Don’t care  
= LOW-to-HIGH clock transition  
ABSOLUTE MAXIMUM RATINGS(1)  
CAPACITANCE (TA = +25°C, f = 1.0MHz)  
Symbol  
Parameter(1)  
Conditions Typ. Max. Unit  
Symbol  
Rating  
Commercial  
Military  
Unit  
(2)  
VTERM  
Terminal Voltage  
with Respect  
to GND  
–0.5 to +7.0 –0.5 to +7.0  
V
CIN  
Input Capacitance  
VIN = 0V  
6
8
10  
12  
pF  
pF  
COUT  
Output Capacitance VOUT = 0V  
NOTE:  
2558 tbl 02  
(3)  
VTERM  
Terminal Voltage  
with Respect  
to GND  
–0.5 to VCC –0.5 to VCC  
V
1. This parameter is guaranteed by characterization data and not tested.  
TA  
Operating  
0 to +70  
–55 to +125 °C  
Temperature  
TBIAS  
TSTG  
Temperature  
Under Bias  
–55 to +125 –65 to +135 °C  
–55 to +125 –65 to +150 °C  
Storage  
Temperature  
PT  
Power Dissipation  
DC Output Current  
0.5  
0.5  
W
IOUT  
120  
120  
mA  
NOTES:  
2558 tbl 01  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM  
RATINGS may cause permanent damage to the device. This is a stress  
rating only and functional operation of the device at these or any other  
conditions above those indicated in the operational sections of this  
specification is not implied. Exposure to absolute maximum rating  
conditions for extended periods may affect reliability. No terminal voltage  
may exceed VCC by +0.5V unless otherwise noted.  
2. Input and VCC terminals only.  
3. Outputs and I/O terminals only.  
7.10  
2
IDT54/74FCT273/A/C FAST CMOS  
OCTAL D FLIP-FLOP WITH MASTER RESET  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE  
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V  
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%  
Symbol  
VIH  
Parameter  
Input HIGH Level  
Input LOW Level  
Input HIGH Current  
Test Conditions(1)  
Min.  
2.0  
Typ.(2)  
Max.  
Unit  
V
Guaranteed Logic HIGH Level  
VIL  
Guaranteed Logic LOW Level  
VCC = Max.  
0.8  
V
IIH  
VI = VCC  
VI = 2.7V  
VI = 0.5V  
VI = GND  
5
µA  
5(4)  
–5(4)  
–5  
IIL  
Input LOW Current  
VIK  
Clamp Diode Voltage  
Short Circuit Current  
Output HIGH Voltage  
Vcc = Min., IN = –18mA  
Vcc = Max.(3), VO = GND  
–0.7  
–1.2  
V
mA  
V
IOS  
–60  
VHC  
VHC  
2.4  
2.4  
–120  
VCC  
VCC  
4.3  
VOH  
Vcc = 3V, VIN = VLC or VHC, IOH = –32µA  
Vcc = Min.  
IOH = –300µA  
VIN = VIH or VIL  
IOH = –12mA MIL.  
IOH = –15mA COM’L.  
4.3  
VOL  
Output LOW Voltage  
Vcc = 3V, VIN = VLC or VHC, IOL = 300µA  
GND  
GND  
0.3  
VLC  
V
(4)  
Vcc = Min.  
IOL = 300µA  
VLC  
VIN = VIH or VIL  
IOL = 32mA MIL.  
IOL = 48mA COM’L.  
0.5  
0.5  
0.3  
NOTES:  
2558 tbl 03  
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.  
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.  
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.  
4. This parameter is guaranteed but not tested.  
7.10  
3
IDT54/74FCT273/A/C FAST CMOS  
OCTAL D FLIP-FLOP WITH MASTER RESET  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
POWER SUPPLY CHARACTERISTICS  
VLC = 0.2V; VHC = VCC – 0.2V  
Symbol  
Parameter  
Test Conditions(1)  
Vcc = Max.  
Min.  
Typ.(2)  
Max.  
Unit  
ICC  
Quiescent Power Supply Current  
0.2  
1.5  
mA  
VIN VHC; VIN VLC  
ICC  
Quiescent Power Supply Current  
TTL Inputs HIGH  
Vcc = Max.  
0.5  
2.0  
mA  
VIN = 3.4V(3)  
ICCD  
Dynamic Power Supply Current(4)  
Vcc = Max.  
Outputs Open  
MR = VCC  
VIN VHC  
VIN VLC  
0.15  
0.25  
mA/MHz  
One Input Toggling  
50% Duty Cycle  
IC  
Total Power Supply Current(6)  
Vcc = Max.  
VIN VHC  
VIN VLC  
(FCT)  
1.7  
2.2  
4.0  
6.0  
mA  
Outputs Open  
fCP = 10MHz  
50% Duty Cycle  
MR = VCC  
One Bit Toggling  
at fi = 5MHz  
VIN = 3.4V  
VIN = GND  
50% Duty Cycle  
Vcc = Max.  
VIN VHC  
VIN VLC  
(FCT)  
4.0  
6.2  
7.8(5)  
Outputs Open  
fCP = 10MHz  
50% Duty Cycle  
MR = VCC  
Eight Bits Toggling  
fi = 2.5MHz  
VIN = 3.4V  
VIN = GND  
16.8(5)  
50% Duty Cycle  
NOTES:  
2558 tbl 04  
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.  
2. Typical values are at VCC = 5.0V, +25°C ambient.  
3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND.  
4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.  
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.  
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC  
IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi)  
ICC = Quiescent Current  
ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)  
DH = Duty Cycle for TTL Inputs High  
NT = Number of TTL Inputs at DH  
ICCD = Dynamic Current Caused by an Output Transition Pair (HLH or LHL)  
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)  
fi = Input Frequency  
Ni = Number of Inputs at fi  
All currents are in milliamps and all frequencies are in megahertz.  
7.10  
4
IDT54/74FCT273/A/C FAST CMOS  
OCTAL D FLIP-FLOP WITH MASTER RESET  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
SWITCHING CHARACTERISTICS OVER OPERATING RANGE  
IDT54/74FCT273  
IDT54/74FCT273A  
IDT54/74FCT273C  
Com’l.  
Mil.  
Com’l.  
Mil.  
Com’l.  
Mil.  
(2)  
(2)  
(2)  
(2)  
(2)  
(2)  
Symbol  
Parameter  
Condition(1) Min.  
Max. Min.  
Max. Min.  
Max. Min.  
Max. Min.  
Max. Min.  
Max. Unit  
tPLH  
tPHL  
Propagation Delay  
Clock to Output  
CL = 50 pF  
RL = 500Ω  
2.0 13.0  
2.0 15.0  
2.0  
2.0  
2.0  
1.5  
6.0  
6.0  
2.0  
7.2  
7.2  
2.0  
8.3  
8.3  
2.0  
5.8  
6.1  
2.0 6.5  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tPHL  
tSU  
tH  
Propagation Delay  
MR to Output  
2.0 13.0  
2.0 15.0  
2.0  
2.0  
1.5  
6.0  
6.0  
2.5  
2.0  
2.0  
1.5  
6.0  
6.0  
2.0  
2.0 6.8  
Set-up Time HIGH  
or LOW Data to CP  
3.0  
2.0  
7.0  
7.0  
4.0  
3.5  
2.0  
7.0  
7.0  
5.0  
2.0  
1.5  
6.0  
6.0  
2.5  
Hold Time HIGH  
or LOW Data to CP  
tW  
Clock Pulse Width  
HIGH or LOW  
tW  
MR Pulse Width  
LOW  
tREM  
Recovery Time  
MR to CP  
NOTES:  
2558 tbl 07  
1. See test circuit and waveforms.  
2. Minimum limits are guaranteed but not tested on Propagation Delays.  
7.10  
5
IDT54/74FCT273/A/C FAST CMOS  
OCTAL D FLIP-FLOP WITH MASTER RESET  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
TEST CIRCUITS AND WAVEFORMS  
TEST CIRCUITS FOR ALL OUTPUTS  
VCC  
SWITCH POSITION  
Test  
Switch  
Closed  
Open  
7.0V  
Open Drain  
Disable Low  
Enable Low  
500Ω  
VOUT  
VIN  
Pulse  
Generator  
D.U.T.  
All Other Tests  
50pF  
CL  
500Ω  
DEFINITIONS:  
CL = Load capacitance: includes jig and probe capacitance.  
2558 tbl 08  
R T  
RT = Termination resistance: should be equal to ZOUT of the Pulse  
Generator.  
SET-UP, HOLD AND RELEASE TIMES  
PULSE WIDTH  
3V  
1.5V  
0V  
DATA  
INPUT  
tSU  
t H  
LOW-HIGH-LOW  
1.5V  
3V  
1.5V  
0V  
TIMING  
INPUT  
PULSE  
t W  
ASYNCHRONOUS CONTROL  
t REM  
PRESET  
CLEAR  
ETC.  
3V  
1.5V  
0V  
HIGH-LOW-HIGH  
PULSE  
1.5V  
SYNCHRONOUS CONTROL  
PRESET  
CLEAR  
CLOCK ENABLE  
ETC.  
3V  
1.5V  
0V  
t H  
tSU  
PROPAGATION DELAY  
ENABLE AND DISABLE TIMES  
ENABLE  
DISABLE  
3V  
3V  
CONTROL  
INPUT  
1.5V  
0V  
SAME PHASE  
INPUT TRANSITION  
1.5V  
0V  
tPZL  
tPLZ  
tPHL  
tPLH  
3.5V  
1.5V  
3.5V  
OUTPUT  
NORMALLY  
LOW  
VOH  
SWITCH  
CLOSED  
OUTPUT  
1.5V  
0.3V  
0.3V  
VOL  
VOH  
tPZH  
tPHZ  
VOL  
tPLH  
tPHL  
OUTPUT  
NORMALLY  
HIGH  
SWITCH  
OPEN  
3V  
1.5V  
0V  
OPPOSITE PHASE  
INPUT TRANSITION  
1.5V  
0V  
0V  
NOTES  
2558 drw 04  
1. Diagram shown for input Control Enable-LOW and input Control  
Disable-HIGH.  
2. Pulse Generator for All Pulses: Rate 1.0 MHz; ZO 50; tF 2.5ns;  
tR 2.5ns.  
7.10  
6
IDT54/74FCT273/A/C FAST CMOS  
OCTAL D FLIP-FLOP WITH MASTER RESET  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
ORDERING INFORMATION  
XX  
IDT  
FCT  
X
X
X
Temperature  
Range  
Device  
Type  
Package Process  
Blank  
B
Commercial  
MIL-STD-883, Class B  
P
Plastic DIP  
D
CERDIP  
SO  
L
E
Small Outline IC  
Leadless Chip Carrier  
CERPACK  
273  
273A  
273C  
Octal D Flip-Flop w/Clear  
Fast Octal D Flip-Flop w/Clear  
Super Fast Octal D Flip-Flop w/Clear  
54  
74  
–55  
°C to +125°C  
0
°
C to +70°C  
2558 drw 03  
7.10  
7

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