IDT74FCT377ATL [IDT]

FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE; 快速CMOS八路D触发器与时钟使能
IDT74FCT377ATL
型号: IDT74FCT377ATL
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
快速CMOS八路D触发器与时钟使能

触发器 锁存器 逻辑集成电路 时钟
文件: 总7页 (文件大小:115K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS  
OCTAL D FLIP-FLOP  
WITH CLOCK ENABLE  
Integrated Device Technology, Inc.  
FEATURES:  
• Std., A, C and D speed grades  
• Low input and output leakage 1µA (max.)  
• CMOS power levels  
• True TTL input and output compatibility  
– VOH = 3.3V (typ.)  
DESCRIPTION:  
TheIDT54/74FCT377T/AT/CT/DTareoctalDflip-flopsbuilt  
usinganadvanceddualmetalCMOStechnology. TheIDT54/  
74FCT377T/AT/CT/DThaveeightedge-triggered,D-typeflip-  
flops with individual D inputs and O outputs. The common  
buffered Clock (CP) input loads all flip-flops simultaneously  
when the Clock Enable (CE) is LOW. The register is fully  
edge-triggered. The state of each D input, one set-up time  
before the LOW-to-HIGH clock transition, is transferred to the  
corresponding flip-flop’s O output. The CE input must be  
stable only one set-up time prior to the LOW-to-HIGH transi-  
tion for predictable operation.  
– VOL = 0.3V (typ.)  
• High drive outputs (-15mA IOH, 48mA IOL)  
• Power off disable outputs permit “live insertion”  
• Meets or exceeds JEDEC standard 18 specifications  
• Product available in Radiation Tolerant and Radiation  
Enhanced versions  
• Military product compliant to MIL-STD-883, Class B  
and DESC listed (dual marked)  
• Available in DIP, SOIC, QSOP, CERPACK and LCC  
packages  
FUNCTIONAL BLOCK DIAGRAM  
D0  
D 1  
D2  
D 3  
D4  
D5  
D6  
D 7  
CE  
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D Q  
CP  
CP  
CP  
CP  
CP  
CP  
CP  
CP  
CP  
0
1
2
3
4
5
6
7
O
O
O
O
O
O
O
O
2630 drw 01  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
APRIL 1995  
1995 Integrated Device Technology, Inc.  
6.14  
DSC-4200/3  
1
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
PIN CONFIGURATIONS  
INDEX  
1
2
20  
19  
18  
CE  
O0  
D0  
D1  
O1  
O2  
D2  
D3  
O3  
Vcc  
O7  
D7  
D6  
O6  
O5  
D5  
D4  
O4  
CP  
3
2
20 19  
18  
3
D
D
O
O
D
7
6
6
5
5
4
5
6
7
8
D
O
1
1
P20-1  
1
D20-1 17  
4
17  
16  
15  
14  
SO20-2  
L20-2  
5
16  
O
D
D
2
SO20-8  
15  
6
2
&
7
14  
E20-1  
3
13  
12  
11  
8
10 11 12 13  
9
9
10  
GND  
2630 drw 03  
2630 drw 02  
DIP/SOIC/QSOP/CERPACK  
TOP VIEW  
LCC  
TOP VIEW  
PIN DESCRIPTION  
FUNCTION TABLE(1)  
Pin Names  
D0 – D7  
CE  
Description  
Inputs  
Outputs  
Data Inputs  
Operating Mode  
Load “1”  
CP  
D
h
l
O
H
L
CE  
Clock Enable (Active LOW)  
Data Outputs  
l
l
O0 – O7  
CP  
Load “0”  
Clock Pulse Input  
Hold  
H
h
H
X
X
No Change  
No Change  
2630 tbl 01  
NOTE:  
1. H = HIGH Voltage Level  
2630 tbl 02  
h = HIGH Voltage Level one setup time prior to the LOW-to-HIGH  
Clock Transition  
L = LOW Voltage Level  
ABSOLUTE MAXIMUM RATINGS(1)  
l
=
LOW Voltage Level one setup time prior to the LOW-to-HIGH Clock  
Transition  
Symbol  
Rating  
Commercial  
Military  
Unit  
(2)  
VTERM  
Terminal Voltage  
with Respect to  
GND  
–0.5 to +7.0 –0.5 to +7.0  
V
X = Don't Care  
= LOW-to-HIGH Clock Transition  
(3)  
VTERM  
Terminal Voltage  
with Respect to  
GND  
–0.5 to  
VCC +0.5  
–0.5 to  
VCC +0.5  
V
CAPACITANCE (TA = +25°C, f = 1.0MHz)  
TA  
Operating  
0 to +70  
–55 to +125 °C  
Symbol  
Parameter(1)  
Conditions Typ. Max. Unit  
Temperature  
Temperature  
Under Bias  
Storage  
Temperature  
Power Dissipation  
CIN  
Input  
Capacitance  
Output  
VIN = 0V  
6
8
10  
pF  
TBIAS  
TSTG  
–55 to +125 –65 to +135 °C  
–55 to +125 –65 to +150 °C  
COUT  
VOUT = 0V  
12  
pF  
Capacitance  
2630 lnk 04  
NOTE:  
1. This parameter is measured at characterization but not tested.  
PT  
0.5  
0.5  
W
IOUT  
DC Output  
Current  
–60 to +120 –60 to +120 mA  
2630 lnk 03  
NOTES:  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-  
INGS may cause permanent damage to the device. This is a stress rating  
onlyandfunctionaloperationofthedeviceattheseoranyotherconditions  
above those indicated in the operational sections of this specification is  
not implied. Exposure to absolute maximum rating conditions for  
extended periods may affect reliability. No terminal voltage may exceed  
VCC by +0.5V unless otherwise noted.  
2. Input and VCC terminals only.  
3. Outputs and I/O terminals only.  
6.14  
2
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE  
Following Conditions Apply Unless Otherwise Specified:  
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%  
Symbol  
VIH  
VIL  
Parameter  
Test Conditions(1)  
Guaranteed Logic HIGH Level  
Guaranteed Logic LOW Level  
Min.  
2.0  
Typ.(2)  
Max. Unit  
Input HIGH Level  
0.8  
±1  
V
V
Input LOW Level  
IIH  
Input HIGH Current(4)  
Input LOW Current(4)  
Input HIGH Current(4)  
Clamp Diode Voltage  
Short Circuit Current  
Output HIGH Voltage  
VCC = Max.  
VI = 2.7V  
µA  
µA  
µA  
V
IIL  
VCC = Max.  
VI = 0.5V  
±1  
II  
VCC = Max., VI = VCC (Max.)  
VCC = Min., IN = –18mA  
VCC = Max.(3), VO = GND  
VCC = Min.  
±1  
VIK  
IOS  
VOH  
–0.7  
–120  
3.3  
–1.2  
–225  
–60  
2.4  
mA  
V
IOH = –6mA MIL.  
VIN = VIH or VIL  
IOH = –8mA COM’L.  
IOH = –12mA MIL.  
IOH = –15mA COM’L.  
IOL = 32mA MIL.  
2.0  
3.0  
0.3  
0.5  
±1  
V
V
VOL  
IOFF  
Output LOW Voltage  
VCC = Min.  
VIN = VIH or VIL  
IOL = 48mA COM’L.  
Input/Output Power Off  
Leakage(5)  
VCC = 0V, VIN or VO 4.5V  
µA  
VH  
Input Hysteresis  
Quiescent Power  
Supply Current  
200  
1
mV  
mA  
ICC  
VCC = Max.  
0.01  
VIN = GND or VCC  
NOTES:  
2630 tbl 05  
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.  
2. Typical values are at VCC = 5.0V, +25°C ambient.  
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.  
4. The test limit for this parameter is ±5µA at TA = -55°C.  
5. This parameter is guaranted but not tested.  
6.14  
3
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
POWER SUPPLY CHARACTERISTICS  
Symbol  
Parameter  
Test Conditions(1)  
Min.  
Typ.(2)  
Max.  
Unit  
ICC  
Quiescent Power Supply  
Current TTL Inputs HIGH  
VCC = Max.  
VIN = 3.4V(3)  
0.5  
2.0  
mA  
ICCD  
IC  
Dynamic Power Supply  
Current(4)  
VCC = Max., Outputs Open  
CE = GND  
One Input Toggling  
50% Duty Cycle  
VIN = VCC  
VIN = GND  
0.15  
0.25  
mA/  
MHz  
Total Power Supply  
Current(6)  
VCC = Max., Outputs Open  
fCP = 10MHz  
VIN = VCC  
VIN = GND  
1.5  
2.0  
3.5  
5.5  
mA  
CE = GND  
One Bit Toggling  
fi = 5MHz  
VIN = 3.4V  
VIN = GND  
50% Duty Cycle  
VCC = Max., Outputs Open  
fCP = 10MHz, 50% Duty Cycle  
VIN = VCC  
VIN = GND  
3.8  
6.0  
7.3(5)  
CE = GND  
Eight Bits Toggling  
fi = 2.5MHz  
VIN = 3.4V  
VIN = GND  
16.3(5)  
50% Duty Cycle  
2639 tbl 05  
NOTES:  
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.  
2. Typical values are at VCC = 5.0V, +25°C ambient.  
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.  
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.  
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.  
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC  
IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi)  
ICC = Quiescent Current  
ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)  
DH = Duty Cycle for TTL Inputs High  
NT = Number of TTL Inputs at DH  
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)  
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)  
fi = Input Frequency  
Ni = Number of Inputs at fi  
All currents are in milliamps and all frequencies are in megahertz.  
6.14  
4
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
SWITCHING CHARACTERISTICS OVER OPERATING RANGE  
IDT54/74FCT377T  
FCT54/74FCT377AT  
Com'l. Mil.  
Com'l.  
Mil.  
Symbol  
tPLH  
Parameter  
Propagation Delay  
CP to On  
Condition(1)  
CL = 50pF  
RL = 500  
Min.(2)  
Max.  
Min.(2)  
Max.  
Min.(2)  
Max.  
Min.(2)  
Max.  
Unit  
2.0  
2.5  
2.0  
4.0  
1.5  
7.0  
13.0  
2.0  
15.0  
2.0  
2.0  
1.5  
3.5  
1.5  
6.0  
7.2  
2.0  
8.3  
ns  
tPHL  
tSU  
Set-Up Time HIGH or LOW  
Dn to CP  
3.0  
2.5  
4.0  
1.5  
7.0  
2.0  
1.5  
3.5  
1.5  
7.0  
ns  
ns  
ns  
ns  
tH  
Hold Time HIGH or LOW  
Dn to CP  
tSU  
tH  
Set-Up Time HIGH or LOW  
CE to CP  
Hold Time HIGH or LOW  
CE to CP  
tW  
Clock Pulse Width,  
HIGH or LOW  
ns  
2630 tbl 06  
IDT54/74FCT377CT  
Com'l. Mil.  
FCT54/74FCT377DT  
Com'l. Mil.  
Symbol  
tPLH  
Parameter  
Propagation Delay  
CP to On  
Condition(1)  
CL = 50pF  
RL = 500Ω  
Min.(2)  
Max.  
Min.(2)  
Max.  
Min.(2)  
Max.  
Min.(2)  
Max.  
Unit  
2.0  
5.2  
2.0  
5.5  
2.0  
4.4  
ns  
tPHL  
tSU  
Set-Up Time HIGH or LOW  
Dn to CP  
2.0  
1.5  
3.5  
1.5  
6.0  
2.0  
1.5  
3.5  
1.5  
7.0  
2.0  
1.0  
3.0  
0.0  
3.0  
ns  
ns  
ns  
ns  
ns  
tH  
Hold Time HIGH or LOW  
Dn to CP  
tSU  
tH  
Set-Up Time HIGH or LOW  
CE to CP  
Hold Time HIGH or LOW  
CE to CP  
tW  
Clock Pulse Width,  
HIGH or LOW  
NOTES:  
2630 tbl 07  
1. See test circuit and waveforms.  
2. Minimum limits are guaranteed but not tested on Propagation Delays.  
6.14  
5
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
TEST CIRCUITS AND WAVEFORMS  
TEST CIRCUITS FOR ALL OUTPUTS  
SWITCH POSITION  
Test  
Switch  
VCC  
7.0V  
Open Drain  
Disable Low  
Closed  
500  
Enable Low  
VOUT  
VIN  
Open  
All Other Tests  
Pulse  
Generator  
D.U.T.  
2630 lnk 08  
DEFINITIONS:  
CL= Load capacitance: includes jig and probe capacitance.  
RT = Termination resistance: should be equal to ZOUT of the Pulse  
Generator.  
50pF  
C L  
500Ω  
T
R
2630 drw 04  
SET-UP, HOLD AND RELEASE TIMES  
PULSE WIDTH  
3V  
DATA  
1.5V  
0V  
INPUT  
LOW-HIGH-LOW  
PULSE  
tH  
tSU  
1.5V  
1.5V  
3V  
1.5V  
0V  
TIMING  
INPUT  
tW  
ASYNCHRONOUS CONTROL  
tREM  
PRESET  
3V  
1.5V  
0V  
CLEAR  
HIGH-LOW-HIGH  
PULSE  
ETC.  
SYNCHRONOUS CONTROL  
PRESET  
2630 drw 06  
3V  
1.5V  
0V  
CLEAR  
tSU  
tH  
CLOCK ENABLE  
ETC.  
2630 drw 05  
PROPAGATION DELAY  
ENABLE AND DISABLE TIMES  
ENABLE  
DISABLE  
3V  
1.5V  
0V  
3V  
SAME PHASE  
CONTROL  
INPUT  
1.5V  
0V  
INPUT TRANSITION  
tPLH  
tPHL  
tPHL  
tPZL  
tPLZ  
VOH  
1.5V  
VOL  
OUTPUT  
3.5V  
1.5V  
3.5V  
VOL  
OUTPUT  
NORMALLY  
LOW  
SWITCH  
CLOSED  
tPLH  
0.3V  
0.3V  
3V  
1.5V  
0V  
tPZH  
tPHZ  
OPPOSITE PHASE  
INPUT TRANSITION  
VOH  
OUTPUT  
NORMALLY  
HIGH  
SWITCH  
OPEN  
1.5V  
0V  
2630 drw 07  
0V  
2630 drw 08  
NOTES:  
1. Diagram shown for input Control Enable-LOW and input Control Disable-  
HIGH  
2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns  
6.14  
6
IDT54/74FCT377T/AT/CT/DT  
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
ORDERING INFORMATION  
IDT  
XX  
FCT  
X
XXXX  
X
X
Temperature  
Range  
Family  
Device Type  
Package  
Process  
Blank  
B
Commercial  
MIL-STD-883, Class B  
P
Plastic DIP  
D
CERDIP  
SO  
L
E
Q
Small Outline IC  
Leadless Chip Carrier  
CERPACK  
Quarter-size Small Outline Package  
377T  
Octal D Flip-Flop w/Clock Enable  
377AT  
377CT  
377DT  
Blank High Drive  
54  
74  
–55  
°C to +125°C  
0
°
C to +70°C  
2630 drw 09  
6.14  
7

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