IDT74FCT574TSO8 [IDT]

Bus Driver, FCT Series, 1-Func, 8-Bit, True Output, CMOS, PDSO20, SOIC-20;


型号：	IDT74FCT574TSO8
厂家：	INTEGRATED DEVICE TECHNOLOGY
描述：	Bus Driver, FCT Series, 1-Func, 8-Bit, True Output, CMOS, PDSO20, SOIC-20 驱动光电二极管逻辑集成电路
文件：	总7页 (文件大小：75K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

IDT54/74FCT574T/AT/CT

MILITARYANDINDUSTRIALTEMPERATURERANGES

FASTCMOSOCTALDREGISTERS(3-STATE)

FAST CMOS OCTAL D

REGISTERS (3-STATE)

IDT54/74FCT574T/AT/CT

FEATURES:

DESCRIPTION:

• Std., A, and C grades

The FCT574T is an 8-bit register built using an advanced dual metal

CMOStechnology. TheseregistersconsistofeightD-typeflip-flopswitha

bufferedcommonclockandbuffered3-stateoutputcontrol.Whentheoutput

enable(OE)inputislow, theeightoutputsareenabled. WhentheOEinput

is high, the outputs are in the high-impedance state.

• Low input and output leakage ≤1µA (max.)

• CMOS power levels

• True TTL input and output compatibility:

– VOH = 3.3V (typ.)

– VOL = 0.3V (typ.)

• High Drive outputs (-15mA IOH, 48mA IOL)

• Meets or exceeds JEDEC standard 18 specifications

• Military product compliant to MIL-STD-883, Class B and DESC

listed (dual marked)

Inputdatameetingtheset-upandholdtimerequirementsoftheDinputs

istransferredtotheQoutputsonthelow-to-hightransitionoftheclockinput.

• Power off disable outputs permit "live insertion"

• Available in the following packages:

– Industrial: SOIC, SSOP, QSOP, TSSOP

– Military: CERDIP, LCC

FUNCTIONALBLOCKDIAGRAM

TheIDTlogoisaregisteredtrademarkofIntegratedDeviceTechnology,Inc.

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

JUNE 2002

DSC-5494/2

IDT54/74FCT574T/AT/CT

FASTCMOSOCTALDREGISTERS(3-STATE)

MILITARYANDINDUSTRIALTEMPERATURERANGES

PINCONFIGURATION

INDEX

VCC

D⁰

Q⁰

20 19

10 11 12 13

GND

CERDIP/ SOIC/ SSOP/ QSOP/ TSSOP

TOP VIEW

LCC

TOP VIEW

ABSOLUTEMAXIMUMRATINGS⁽¹⁾

PINDESCRIPTION

Symbol

Description

Max

Unit

Pin Names

Description

(2)

VTERM

Terminal Voltage with Respect to GND

–0.5 to +7

D flip-flop data inputs

(3)

VTERM

Terminal Voltage with Respect to GND –0.5 to VCC+0.5

Clock Pulse for the register. Enters data on LOW-to-

HIGH transition.

TSTG

IOUT

Storage Temperature

DC Output Current

–65 to +150

–60 to +120

°C

3-State Outputs (TRUE)

NOTES:

3-State Outputs (INVERTED)

Active LOW 3-State Output Enable Input

1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause

permanent damage to the device. This is a stress rating only and functional operation

of the device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect reliability. No terminal voltage may exceed

Vcc by +0.5V unless otherwise noted.

FUNCTIONTABLE⁽¹⁾

2. Inputs and Vcc terminals only.

3. Output and I/O terminals only.

Inputs

Outputs

Internal

Function

N C

High-Z

Load

↑

CAPACITANCE (TA = +25°C, F = 1.0MHz)

Symbol

Parameter⁽¹⁾

Input Capacitance

Output Capacitance

Conditions

Typ.

Max. Unit

CIN

VIN = 0V

COUT

VOUT = 0V

NOTE:

1. H = HIGH Voltage Level

X = Don’t Care

NOTE:

1. This parameter is measured at characterization but not tested.

L = LOW Voltage Level

Z = High Impedance

NC = No Change

↑ = LOW-to-HIGH transition

IDT54/74FCT574T/AT/CT

MILITARYANDINDUSTRIALTEMPERATURERANGES

FASTCMOSOCTALDREGISTERS(3-STATE)

DCELECTRICALCHARACTERISTICSOVEROPERATINGRANGE

FollowingConditionsApplyUnlessOtherwiseSpecified:

Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%; Military: TA = –55°C to +125°C, VCC = 5.0V ±10%

Symbol

VIH

Parameter

Input HIGH Level

Test Conditions⁽¹⁾

Guaranteed Logic HIGH Level

Min.

Typ.⁽²⁾

—

Max.

—

Unit

VIL

Input LOW Level

Guaranteed Logic LOW Level

VCC = Max.

—

0.8

±1

–1.2

—

IIH

Input HIGH Current⁽⁴⁾

Input LOW Current⁽⁴⁾

High Impedance Output Current

(3-State output pins)⁽⁴⁾

Input HIGH Current⁽⁴⁾

ClampDiodeVoltage

Input Hysteresis

VI = 2.7V

VI = 0.5V

VO = 2.7V

VO = 0.5V

—

µA

IIL

VCC = Max.

—

IOZH

IOZL

VCC = Max

—

VCC = Max., VI = VCC (Max.)

VCC = Min, IIN = -18mA

—

µA

VIK

ICC

–0.7

200

0.01

—

µA

Quiescent Power Supply Current

VCC = Max., VIN = GND or VCC

OUTPUTDRIVECHARACTERISTICS

Symbol

Parameter

Test Conditions⁽¹⁾

Min.

Typ.⁽²⁾

Max.

Unit

VOH

Output HIGH Voltage

VCC = Min

VIN = VIH or VIL

IOH = –6mA MIL

IOH = –8mA IND

IOH = –12mA MIL

IOH = –15mA IND

IOL = 32mA MIL

IOL = 48mA IND

2.4

3.3

—

0.5

VOL

IOS

Output LOWVoltage

Short Circuit Current

VCC = Min

VIN = VIH or VIL

VCC = Max., VO = GND⁽³⁾

—

0.3

–60

–120

–225

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.

4. The test limit for this parameter is ±5µA at TA = –55°C.

IDT54/74FCT574T/AT/CT

FASTCMOSOCTALDREGISTERS(3-STATE)

MILITARYANDINDUSTRIALTEMPERATURERANGES

POWERSUPPLYCHARACTERISTICS

Symbol

Parameter

Test Conditions⁽¹⁾

Min.

Typ.⁽²⁾

Max.

Unit

∆ICC

Quiescent Power Supply Current

TTL Inputs HIGH

VCC = Max.

VIN = 3.4V⁽³⁾

—

0.5

ICCD

Dynamic Power Supply

Current⁽⁴⁾

VCC = Max.

Outputs Open

OE = GND

VIN = VCC

VIN = GND

—

0.15

0.25

mA/

MHz

One Input Toggling

50% Duty Cycle

Total Power Supply Current⁽⁶⁾

VCC = Max.

Outputs Open

f^CP= 10MHz

50% Duty Cycle

OE = GND

VIN = VCC

VIN = GND

—

1.5

3.5

5.5

VIN = 3.4V

VIN = GND

fi = 5MHz

One Bit Toggling

VCC = Max.

VIN = VCC

VIN = GND

—

3.8

7.3⁽⁵⁾

Outputs Open

f^CP= 10MHz

50% Duty Cycle

OE = GND

VIN = 3.4V

VIN = GND

16.3⁽⁵⁾

Eight Bits Toggling

fi = 2.5MHz

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of ∆ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC

IC = ICC + ∆ICC DHNT + ICCD (fCP/2+ fiNi)

ICC = Quiescent Current

∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)

DH = Duty Cycle for TTL Inputs High

NT = Number of TTL Inputs at DH

ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)

fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)

fi = Output Frequency

Ni = Number of Outputs at fi

All currents are in milliamps and all frequencies are in megahertz.

IDT54/74FCT574T/AT/CT

MILITARYANDINDUSTRIALTEMPERATURERANGES

FASTCMOSOCTALDREGISTERS(3-STATE)

SWITCHINGCHARACTERISTICSOVEROPERATINGRANGE-INDUSTRIAL

FCT574AT

FCT574CT

(2)

Symbol Parameter

Condition⁽¹⁾

CL = 50pF

RL = 500Ω

Min.

Max.

Min.

Max.

Unit

tPLH

tPHL

tPZH

tPZL

tPHZ

tPLZ

tSU

PropagationDelay

6.5

5.2

CP to Qx

OutputEnableTime

1.5

6.5

5.5

—

1.5

5.5

OutputDisableTime

Set-up Time, HIGH or LOW

Dx to CP

—

Hold Time, HIGH or LOW

Dx to CP

1.5

—

1.5

CP Pulse Width HIGH or LOW⁽³⁾

—

SWITCHINGCHARACTERISTICSOVEROPERATINGRANGE-MILITARY

FCT574T

FCT574AT

FCT574CT

(2)

Symbol Parameter

Condition⁽¹⁾

CL = 50pF

RL = 500Ω

Min.

Max.

Min.

Max.

Min.

Max.

Unit

tPLH

tPHL

tPZH

tPZL

tPHZ

tPLZ

tSU

PropagationDelay

1.5

7.2

7.5

6.5

—

1.5

6.2

5.7

—

CP to Qx

OutputEnableTime

OutputDisableTime

Set-up Time, HIGH or LOW

Dx to CP

—

Hold Time, HIGH or LOW

1.5

—

1.5

—

Dx to CP

CP Pulse Width HIGH or LOW⁽³⁾

—

NOTES:

1. See test circuit and waveforms.

2. Minimum limits are guaranteed but not tested on Propagation Delays.

3. This limit is guaranteed but not tested.

IDT54/74FCT574T/AT/CT

FASTCMOSOCTALDREGISTERS(3-STATE)

MILITARYANDINDUSTRIALTEMPERATURERANGES

TESTCIRCUITSANDWAVEFORMS

VCC

SWITCHPOSITION

7.0V

Test

Switch

Closed

Open

500Ω

Open Drain

Disable Low

Enable Low

VOUT

VIN

Pulse

Generator

D.U.T

All Other Tests

50pF

500Ω

DEFINITIONS:

CL = Load capacitance: includes jig and probe capacitance.

RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.

Octal link

Test Circuits for All Outputs

DATA

1.5V

INPUT

LOW-HIGH-LOW

tSU

1.5V

PULSE

1.5V

TIMING

INPUT

ASYNCHRONOUS CONTROL

tREM

PRESET

CLEAR

ETC.

1.5V

HIGH-LOW-HIGH

PULSE

1.5V

SYNCHRONOUS CONTROL

PRESET

Octal link

1.5V

CLEAR

tSU

CLOCK ENABLE

ETC.

Pulse Width

Octal link

Set-Up, Hold, and Release Times

ENABLE

DISABLE

1.5V

SAME PHASE

CONTROL

INPUT

1.5V

INPUT TRANSITION

tPLH

tPHL

tPZL

tPLZ

VOH

1.5V

VOL

OUTPUT

3.5V

1.5V

3.5V

VOL

VOH

OUTPUT

NORMALLY

LOW

SWITCH

CLOSED

0.3V

1.5V

tPZH

tPHZ

OPPOSITE PHASE

INPUT TRANSITION

OUTPUT

NORMALLY

HIGH

SWITCH

OPEN

1.5V

Octal link

Propagation Delay

Enable and Disable Times

NOTES:

1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.

2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.

IDT54/74FCT574T/AT/CT

MILITARYANDINDUSTRIALTEMPERATURERANGES

FASTCMOSOCTALDREGISTERS(3-STATE)

ORDERINGINFORMATION

XXXX

IDT

FCT

Package

Process

Device Type

Temp. Range

Blank

Industrial

MIL-STD-883, Class B

Industrial Options

Small Outline IC

Shrink Small Outline Package

Quarter-size Small Outline Package

Thin Shrink Small Outline Package

Military Options

CERDIP

Leadless Chip Carrier

Fast CMOS Octal D Register

574T

574AT

574CT

– 55°C to +125°C

– 40°C to +85°C

DATASHEETDOCUMENTHISTORY

6/25/2002 Updated as per PDNs Logic-00-07 and Logic-01-04

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for Tech Support:

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www.idt.com

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