ZMD31015AEF-T_技术文档

ZMD31150

Fast Automotive Sensor Signal Conditioner

Data Sheet

Rev. 1.04 / November 2009

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

Brief Description

Benefits

The ZMD31150 is a CMOS integrated circuit for

highly-accurate amplification and sensor-specific

correction of bridge sensor signals. Digital

compensation of sensor offset, sensitivity,

 No external trimming components

required

 Only a few external protection devices

temperature

drift,

and

non-linearity

is

needed

accomplished via a 16-bit RISC microcontroller

running a correction algorithm, with calibration

coefficients stored in an EEPROM.

 PC-controlled configuration and One-

Shot calibration via I²C or ZACwire^TM

interface: Simple, cost efficient, quick,

and precise

The ZMD31150 is adjustable to nearly all bridge

sensor types. Measured values are provided at

the analog voltage output or at the digital

ZACwire^TMand I²C interface. The digital interface

can be used for a simple PC-controlled calibration

procedure, in order to program a set of calibration

coefficients into an on-chip EEPROM. Thus, a

specific sensor and a ZMD31150 are mated

digitally: fast, precise, and without the cost

overhead associated with trimming by external

devices or a laser.

 End-of-Line calibration via I²C or

ZACwire^TMinterface

 High accuracy (0.25% FSO @ -25 to

85° C; 0.5% FSO @ -40 to 125° C)

 The ZMD31150 is optimized for

automotive environments by its special

protection circuitry and excellent

electromagnetic compatibility

Features

 Digital compensation of sensor offset,

sensitivity, temperature drift, and non-

linearity

Available Support

 Adjustable to nearly all bridge sensor types,

analog gain of 420, overall gain up to 2000

 Output options: ratiometric analog voltage

output (5 - 95% in maximum, 12.4 bit

resolution) or ZACwire^TM(digital one-wire-

interface)

 Temperature compensation: internal or

external diode, bridge resistance, thermistor

 Sensor biasing by voltage or constant

current

 Evaluation Kit

 Application Notes

 Mass calibration solution

ZMD31150 Overview

VCC

Sensor

Module

 Sample rate up to 7.8 kHz

 High voltage protection up to 33 V

 Reverse polarity and short circuit protection

 Wide operation temperature -40 to +150 °C

 Supply voltage 4.5 to 5.5 V

OUT

GND

ZMD

31150

 Traceability by user-defined EEPROM

entries

 Several safety and diagnostic functions

Data Sheet

Rev. 1.04

November 2009

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

Contents

1

Electrical Characteristics............................................................................................................................ 5

1.1. Absolute Maximum Ratings ................................................................................................................ 5

1.2. Operating Conditions .......................................................................................................................... 5

1.3. Electrical Parameters.......................................................................................................................... 6

1.3.1. Supply Current and System Operation Conditions...................................................................... 6

1.3.2. Analog Front-End (AFE) Characteristics ..................................................................................... 6

1.3.3. Temperature Measurement (refer chapter 0) .............................................................................. 6

1.3.4. Sensor Connection Check ........................................................................................................... 7

1.3.5. AD-Conversion............................................................................................................................. 7

1.3.6. DAC & Analog Output (Pin AOUT) ............................................................................................. 7

1.3.7. System Response........................................................................................................................ 8

1.4. Interface Characteristics & EEPROM ................................................................................................. 8

1.4.1. I²C Interface (refer ZMD31150_FD_Rev_*.pdf for timing details) ............................................... 8

1.4.2. ZACwire™ One Wire Interface (OWI).......................................................................................... 9

1.4.3. EEPROM...................................................................................................................................... 9

Circuit Description .................................................................................................................................... 10

2.1. Signal Flow........................................................................................................................................ 10

2.2. Application Modes............................................................................................................................. 10

2.3. Analog Front End (AFE).................................................................................................................... 11

2.3.1. Programmable Gain Amplifier (PGA)......................................................................................... 11

2.3.2. Measurement Cycle................................................................................................................... 12

2.3.3. Analog-to-Digital Converter........................................................................................................ 13

2.4. Temperature Measurement............................................................................................................... 14

2.5. System Control and Conditioning Calculation................................................................................... 15

2.5.1. Operation Modes ....................................................................................................................... 15

2.5.2. Start Up Phase........................................................................................................................... 15

2.5.3. Conditioning Calculation ............................................................................................................ 16

2.6. Analog Output AOUT ........................................................................................................................ 16

2.7. Serial Digital Interface....................................................................................................................... 16

2.8. Failsafe Features, Watchdog and Error Detection............................................................................ 17

2.9. High Voltage, Reverse Polarity and Short Circuit Protection............................................................ 17

Application Circuit Examples.................................................................................................................... 18

Pin Configuration, Latch-Up and ESD Protection .................................................................................... 20

4.1. Pin Configuration and Latch-up Conditions ...................................................................................... 20

4.2. ESD-Protection.................................................................................................................................. 20

Package.................................................................................................................................................... 21

Quality and Reliability............................................................................................................................... 21

Customization........................................................................................................................................... 21

Additional Documents .............................................................................................................................. 22

Glossary ................................................................................................................................................... 22

2

3

4

5

6

7

8

9

10

Document Revision History .................................................................................................................. 23

Data Sheet

Rev. 1.04

November 2009

stored, or used without the prior written consent of the copyright owner. The Information furnished in

this publication is subject to changes without notice.

3 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

List of Figures

Figure 2.1 Block Diagram of the ZMD31150................................................................................................10

Figure 2.2 Measurement Cycle ....................................................................................................................13

Figure 3.1 Bridge in Voltage Mode, External Diode Temperature Sensor...................................................18

Figure 3.2 Bridge in Voltage Mode, External Thermistor.............................................................................19

Figure 3.3 Bridge in Current Mode, Temperature Measurement via Bridge TC..........................................19

Figure 5.1 ZMD31150 Pin Diagram..............................................................................................................21

List of Tables

Table 1.1

Table 1.2

Table 1.3

Table 1.4

Table 1.5

Table 1.6

Table 1.7

Table 1.8

Table 1.9

Absolute Maximum Ratings ..........................................................................................................5

Operating Conditions ....................................................................................................................5

Parameters for Supply Current and System Operation Conditions..............................................6

Parameters for AFE ......................................................................................................................6

Parameters for Temperature Measurement..................................................................................6

Parameters for Sensor Connection Check ...................................................................................7

Parameters for AD-Conversion.....................................................................................................7

Parameters for DAC & Analog Output ..........................................................................................7

Parameters for System Response................................................................................................8

Table 1.10 Parameters for I²C Interface .........................................................................................................8

Table 1.11 Parameters for ZACwire^TM............................................................................................................9

Table 1.12 Parameters for EEPROM..............................................................................................................9

Table 2.1

Table 2.2

Table 2.3

Table 3.1

Table 4.1

Table 8.1

Adjustable gains, resulting sensor signal spans, and common mode ranges............................11

Analog Zero Point Shift Ranges (XZC).......................................................................................12

Analog Output resolution versus sample rat...............................................................................14

Application Circuit Parameters....................................................................................................18

Pin Configuration and Latch-Up Conditions................................................................................20

Additional Documents .................................................................................................................22

stored, or used without the prior written consent of the copyright owner. The Information furnished in

Data Sheet

Rev. 1.04

4 / 23

November 2009

this publication is subject to changes without notice.

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

1

Electrical Characteristics

1.1.

Absolute Maximum Ratings

Parameters apply in operation temperature range and without time limitations.

Table 1.1

Symbol

Absolute Maximum Ratings

Parameter

Min

Max

Unit Conditions

V_{DDE_AMR}

Supply Voltage ¹

-33

33

V_DCTo V_SSE, refer to chapter 3 for application

circuits

V_OUT

Potential at pin AOUT ¹

Analog Supply Voltage

-33

-0.3

33

V_DCRelated to V_SSE

1

V_{DDA_AMR}

6.5

V_DCRelated to V_SSA, V_DDE- V_DDA< 0.35 V

V_DCRelated to V_SSA

V_{A_IO}

V_{D_IO}

Voltage at all analog and

digital IO – Pins

V_DDA

+ 0.3

T_STG

Storage temperature

-55

150

C

1.2.

Operating Conditions

All voltages are related to V_SSA

.

Table 1.2

Symbol

T_AMB

Operating Conditions

Parameter

Min

-40

Typ

Max

150

125

Unit Conditions

2

Ambient temperature

TQE

TQA

C

T_{AMB_TQA}

Ambient temperature

advanced performance ⁴

T_{AMB_TQI}

Ambient temperature

-25

85

TQI

C

advanced performance ⁴

V_DDE

R_{BR_V}

R_{BR_C}

Supply Voltage

4.5

2

5.0

5.5

25

10

V_DC

k

3, 4

Bridge Resistance

Bridge Resistance ^{3, 4}

Bridge Voltage Mode

Bridge Current Excitation,

note I_{BR_MAX}

4

R_IBR

Resistor R_IBR

0.07 * R_BR

I_BR= V_DDA/ (16 * R_IBR)

k

mA

V

I_{BR_MAX}

V_{BR_TOP}

Maximum Bridge Current

2

Maximum Bridge Top

Voltage

15/16 *

_DDA- 0.3

V

TC R_IBR

TC Current Reference

Resistor

50

ppm/K Behavior influences generated

current

4

¹Refer to the 'ZMD31150 High Voltage Protection Description' for specification and detailed conditions

²Notice temperature profile description in the 'ZMD31150 Dice Package Document' for operation in temperature range > 125 °C

³Symmetric behavior and identical electrical properties (especially with regard to the low pass characteristic) of both sensor inputs of

the ZMD31150 are required. Unsymmetrical conditions of the sensor and/or external components connected to the sensor input pins

of ZMD31150 can generate a failure in signal operation

⁴No measurement in mass production, parameter is guaranteed by design and/or quality observation

stored, or used without the prior written consent of the copyright owner. The Information furnished in

this publication is subject to changes without notice.

Data Sheet

Rev. 1.04

November 2009

5 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

1.3.

Electrical Parameters

All parameter values are valid on behalf on in chapter 1.2 specified operating conditions (special definitions

excluded). All Voltages related to VSSA.

1.3.1. Supply Current and System Operation Conditions

Table 1.3

Symbol

I_VDDE

Parameters for Supply Current and System Operation Conditions

Parameter

Min

Typ

Max

Unit Conditions

Supply current

5.5

mA Without bridge and load current,

f_CLK 3 MHz

f_CLK

Clock frequency

2 ⁵

3

4 ⁵

MHz Guaranteed adjustment range

1.3.2. Analog Front-End (AFE) Characteristics

Table 1.4

Symbol

V_{IN_SP}

Parameters for AFE

Parameter

Min

1

Typ

Max

275

300

Unit Conditions

Input Span

mV/V Analog gain: 420 to 2.8

Analog Offset Compensation

Range

-300

%

Depends on gain adjust, refer to

V_{IN_SP}chapter 2.3.1.1

I_{IN_OFF}

V_{IN_CM}

Parasitic differential input

offset current

-10

-2

10

2

nA Within T_AMB;

nA Within T_{AMB_TQI}

5

Common mode input range 0.29 * V_DDA

0.65 * V_DDA

V

Depends on gain adjust,

no XZC, refer to chapter 2.3.1

1.3.3. Temperature Measurement (refer chapter 0)

Table 1.5

Symbol

A_TSED

Parameters for Temperature Measurement

Parameter

Min

Typ

Max

1300

Unit

Conditions

External temperature diode 300

channel gain

ppm FS

/ mV

I_TSE

External temperature diode

bias current

6

10

20

A

External temperature diode

input range *

0

1.5

V

A_TSER

V_TSER

ST_TSI

External temperature

resistor channel gain

1200

0

3500

600

2700

ppm FS

/ (mV/V)

External temperature

resistor input range *

mV/V

Internal temperature diode

sensitivity

700

ppm FS /K

raw values – without

conditioning

⁵No measurement in mass production, parameter is guaranteed by design and/or quality observation

stored, or used without the prior written consent of the copyright owner. The Information furnished in

Data Sheet

Rev. 1.04

6 / 23

November 2009

this publication is subject to changes without notice.

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

1.3.4. Sensor Connection Check

Table 1.6

Symbol

Parameters for Sensor Connection Check

Parameter

Min

100

Typ

Max

Unit Conditions

RSCC_min

Sensor connection loss

detection threshold

k



RSSC_short Sensor input short

RSSC_pass Sensor input no short

0

50

short detection guaranteed

short is never detected

1000



1.3.5. AD-Conversion

Table 1.7

Symbol

r_ADC

Parameters for AD-Conversion

Parameter

A/D Resolution *

DNL *

Min

Typ

Max

Unit Conditions

13

16

Bit

DNL_ADC

0.95

LSB

r_ADC=13Bit, f_CLK=3MHz, best

fit, 2nd order, complete AFE,

5.3.5.5

INL_ADC

Range

INL TQA *

4

LSB

INL TQE

5

LSB

ADC Input Range

10

90

%VDDA

1.3.6. DAC & Analog Output (Pin AOUT)

Table 1.8

Symbol

r_DAC

Parameters for DAC & Analog Output

Parameter

Min

Typ

12

Max

Unit Conditions

D/A Resolution

Bit

analog output, 10-90%

I_{SRC/SINK_OUT}

Output current sink and source for

VDDE=5V

2.5

5

mA

Vout: 5-95%, RLOAD>=2k

Vout: 10-90%, RLOAD>=1k

I_{OUT_max}

Short circuit current

-25

25

mA

to VSSE/VDDE6

V_{SR_OUT95}

V_{SR_OUT90}

Addressable output signal

range

0.05

0.1

0.95

0.9

VDDE @ RLOAD>=2k

@ RLOAD>=1k

SR_OUT

Output slew rate *

0.1

V/ s CLOAD < 50nF

R_{OUT_DIA}

Output resistance in

diagnostic mode

82

Diagnostic Range:

<4|96>%, RLOAD>=2k

<8|92>%, RLOAD>=1k



C_LOAD

Load capacitance *

DNL

150

1.5

5

nF

C3 + CL (refer chapter 3)

DNL_OUT

INL_OUT

I_{LEAK_OUT}

-1.5

-5

LSB

A

INL TQA *

INL TQE

best fit, rDAC =12Bit

-8

8

best fit, rDAC =12Bit

Output Leakage current @

150grd

-25

25

in case of power or ground loss

⁶minimum output voltage to VDDE or maximum output voltage to VSSE

Data Sheet

Rev. 1.04

November 2009

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

1.3.7. System Response

Table 1.9

Symbol

t_STA

Parameters for System Response

Parameter

Min

Typ

Max

Unit Conditions

2

Startup time

5

ms

to 1st output, fclk=3MHz, no ROM

check, ADC: 14bit & 2^ndorder

t_RESP

Response time

(100% jump) *

256

512

s

f_CLK=4MHz, 13Bit, 2nd order, refer

chapter 0

Bandwidth *

5

kHz

mV

comparable to analog SSCs

V_NOISE,PP

V_NOISE,RMS

RE_{OUT_5}

Analog Output Noise

Peak-to-Peak *

10

shorted inputs, gain=

bandwidth  10kHz

Analog Output Noise

RMS *

3

mV

shorted inputs, gain=

bandwidth  10kHz

Ratiometricity Error

1000

ppm

maximum error of

VDDE=5V to 4.5/5.5V

13Bit 2^ndorder ADC, fclk<=3MHz,

XZC=0 1, no sensor caused effects;

inside of parenthesis: digital readout

F_ALLTQI

F_ALLTQA

F_ALLTQE

Overall failure (deviation from ideal

line including INL, gain, offset &

temp errors)

0.25 (0.1)

0.5 (0.25)

1.0 (0.5)

%

FS

1.4.

Interface Characteristics & EEPROM

1.4.1. I²C Interface (refer ZMD31150_FD_Rev_*.pdf for timing details)

Table 1.10

Symbol

V_{I2C_IN_H}

V_{I2C_IN_L}

V_{I2C_OUT_L}

C_SDA

Parameters for I²C Interface

Parameter

Min

Typ

Max

Unit Conditions

VDDA

Input-High-Level *

Input-Low-Level *

Output-Low-Level *

SDA load capacitance *

SCL clock frequency *

Internal pullup resistor *

0.8

0.2

VDDA

0.15

400

100

VDDA Open Drain, I_OL<2mA

pF

f_SCL

kHz

k

R_I2C

25

2

Depends on resolution and configuration - start routine begins approximately 0.8ms after power on

* no measurement in mass production, parameter is guarantied by design and/or quality observation

1 XZC is active: additional overall failure of 25ppm/K for XZC=31 in maximum, failure decreases linear for XZC adjusts lower than 31

stored, or used without the prior written consent of the copyright owner. The Information furnished in

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Data Sheet

Rev. 1.04

November 2009

8 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

1.4.2. ZACwire™ One Wire Interface (OWI)

Table 1.11

Symbol

Parameters for ZACwire^TM

Parameter

Min

Typ

Max

0.2

Unit Conditions

VDDA

V_{OWI_IN_L}

Input-Low-Level *

Input-High-Level *

Output-Low-Level *

Start Window *

V_{OWI_IN_H}

V_{OWI_OUT_L}

0.75

96

VDDA

t.b.d.

455

VDDA Open Drain, I_OL<?mA

175

ms

typ: @ fclk=3MHz

1.4.3. EEPROM

Table 1.12

Symbol

Parameters for EEPROM

Parameter

Min

-40

Typ

Max

Unit Conditions

T_{AMB_EEP}

Ambient temperature EEPROM

150

C

*

programming

n_{WRI_EEP}

Write cycles *

100k

100

@write <= 85°C

@write up to 150°C

8 * 10⁸

<=175°C²

n_{READ_EEP}

t_{RET_EEP}

Read cycles *

3

Data retention *

15

a

1300h @ 175°C

(=100000h@55°C &

27000h@125°C & 3000h@150°C)

t_{WRI_EEP}

Programming time *

12

ms

per written word, fclk=3MHz

^*no measurement in mass production, parameter is guarantied by design and/or quality observation

²valid for the dice, notice additional package and temperature version caused restrictions

³over lifetime and valid for the dice, use calculation sheet “ZMD_TempProfile_Rev_*.xls” for temperature stress calculation,

notice additional package and temperature version caused restrictions

stored, or used without the prior written consent of the copyright owner. The Information furnished in

this publication is subject to changes without notice.

Data Sheet

Rev. 1.04

November 2009

9 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

2

Circuit Description

2.1.

Signal Flow

The ZMD31150’s signal path is partly analog and partly digital. The analog part is realized differentially – this

means, the differential bridge sensor signal is internally handled via two signal lines, which are rejected

symmetrically around an internal common mode potential (analog ground = V_DDA/2).

Consequently, it is possible to amplify positive and negative input signals, which are located within the

common mode range of the signal input.

Figure 2.1

Block Diagram of the ZMD31150

ZACwire^TM

I²C

RAM

EEPROM

Digital

Data I/O

Analog

Out

PGA

TS

ADC

CMC

DAC

BAMP

ROM

Analog Block

Digital Block

ZMD31150

The differential signal from the bridge sensor is pre-amplified by the Programmable Gain Amplifier (PGA).

The Multiplexer (MUX) transmits the signals from either the bridge sensor, the external diode, or the

separate temperature sensor, to the Analog-to-Digital Converter (ADC) in a certain sequence (instead of the

temperature diode, the internal pn-junction (TS) can be used optionally). Afterwards, the ADC converts these

signals into digital values.

The digital signal correction takes place in the calibration microcontroller (CMC). It is based on a correction

formula located in the ROM, and on sensor-specific coefficients stored in the EEPROM during calibration.

Dependent on the programmed output configuration, the corrected sensor signal is output as an analog

value or in a digital format (I²C^TM, ZACwire^TM). The configuration data and the correction parameters can be

programmed into the EEPROM via the digital interfaces.

2.2.

Application Modes

For each application, a configuration set has to be established (generally prior to calibration) by programming

the on-chip EEPROM regarding to the following modes:

 Sensor Channel

▬ Sensor Mode: Ratiometric bridge excitation in voltage or current supply mode.

▬ Input Range: The gain adjustment of the AFE with respect to the maximum sensor signal span and

the zero point of the ADC has to be chosen.

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Data Sheet

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

▬ Additional Offset Compensation (XZC): The extended analog offset compensation has to be

enabled, if required; e.g., if the sensor offset voltage is near to or larger than the sensor span.

▬ Resolution/Response Time: The A/D converter has to be configured for resolution and converting

scheme, or ADC order (first or second order). These settings influence the sampling rate and the

signal integration time, and thus, the noise immunity.

 Temperature

▬ Temperature Measurement: The source for the temperature correction has to be chosen.

2.3.

Analog Front End (AFE)

The Analog Front End (AFE) consists of the Programmable Gain Amplifier (PGA), the Multiplexer (MUX),

and the Analog-to-Digital Converter (ADC).

2.3.1. Programmable Gain Amplifier (PGA)

The following table shows the adjustable gains, the sensor signal spans, and the allowed common mode

range.

Table 2.1

Adjustable gains, resulting sensor signal spans, and common mode ranges

No.

Overall Gain

a_IN

Max. Span

V_{IN_SP}

Gain

Amp1

Gain

Amp2

Gain

Amp3

Input common mode range

V_{IN_CM}as % of VDDA ²⁾

[mV/V] ¹⁾

XZC = Off

29 to 65

32 to 57

XZC = On

45 to 55

not applicable

1

2

420

280

210

140

105

70

1.8

2.7

30

15

7.5

3.75

1

7

4.66

7

2

3

3.6

4

5.4

4.66

7

5

7.1

6

10.7

14.3

21.4

28.5

53.75

80

4.66

7

52.5

35

8

4.66

3.5

7

9

26.3

14

10

11

12

9.3

7

1

4.66

3.5

1.4

107

267

1

13

2.8

1

1)

Recommended internal signal range is 75% of supply voltage in maximum.

Span is calculated by the following formula: Span = 75% / gain

1)

Bridge in voltage mode, containing maximum input signal (with XZC: +300% Offset), 14-bit accuracy. Refer to the 'ZMD31150

Functional Description' for usable input signal/common mode range at bridge in current mode.

stored, or used without the prior written consent of the copyright owner. The Information furnished in

this publication is subject to changes without notice.

Data Sheet

Rev. 1.04

November 2009

11 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

2.3.1.1. Offset Compensation

The ZMD31150 supports two methods of sensor offset compensation (zero shift):

 Digital offset correction

 XZC - Analog compensation for large offset values (up to in maximum approximately 300% of span,

depending on gain adjustment)

Digital sensor offset correction will be processed during the digital signal correction/conditioning by the

calibration microcontroller (CMC). Analog sensor offset pre-compensation will be needed for compensation

of large offset values, which would overdrive the analog signal path by uncompensated gaining. For analog

sensor offset pre-compensation, a compensation voltage will be added in the analog pre-gaining signal path

(coarse offset removal). The analog offset compensation in the AFE can be adjusted by 6 EEPROM bits.

Table 2.2

Analog Zero Point Shift Ranges (XZC)

PGA gain

Max. Span V_{IN_SP}

[mV/V]

Offset shift per step

in % of full span

Approx. maximum

offset shift [mV/V]

Approx. maximum shift

in [% V_{IN_SP}] (@ ± 31)

a_IN

420

280

210

140

105

70

1.8

2.7

12.5 %

7.6 %

12.5 %

7.6 %

5.2 %

7.6 %

5.2 %

7.6 %

5.2 %

12.5 %

7.6 %

5.2 %

0.83 %

7.8

7.1

15.5

14.2

13

388 %

237 %

388 %

237 %

388 %

237 %

388 %

237 %

161 %

388 %

237 %

161 %

26 %

3.6

5.4

7.1

10.7

14.3

21.4

28.5

53.75

80

28

52.5

35

26

57

26.3

14

52

194

189

161

72

9.3

7

107

267

2.8

2.3.2. Measurement Cycle

The Multiplexer selects, depending on EEPROM settings, the following inputs in a certain sequence.

 Temperature measured by external diode or thermistor, internal pn-junction or bridge

 Internal offset of the input channel (V_OFF

)

 Pre-amplified bridge sensor signal

The complete measurement cycle is controlled by the CMC. The cycle diagram at the right shows its

principle structure.

The EEPROM adjustable parameters are:

 n=<1,31>: Pressure measurement count

After power on the start routine is called, which contains all needed measurements once.

Remark: The tasks “CMV”, “SSC/SCC+” and “SSC/SCC-“ are contained independent from EEPROM

configuration always in cycle.

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Data Sheet

Rev. 1.04

November 2009

12 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

Figure 2.2

Measurement Cycle



Start routine

Temperature Auto Zero

Pressure measurement

Temp measurement



1

n



1

n

Pressure measurement

1

n

1

n

1

n

1

n

Pressure auto zero

Pressure measurement

CMV

Pressure measurement

SSC/SCC+

Pressure measurement

SSC/SCC-

Pressure measurement

2.3.3. Analog-to-Digital Converter

The ADC is an integrating AD-Converter in full differential switched capacitor technique.

Programmable ADC-resolutions are r_ADC=<13,14> and with segmentation <15,16> bit.

It can be used as first or second order converter. In the first order mode it is inherently monotone and

insensitive against short and long term instability of the clock frequency. The conversion cycle time depends

on the desired resolution and can be roughly calculated by:

t_{CYC_1}= 2 ^rs / 2 / f_CLK

In the second order mode two conversions are stacked with the advantage of much shorter conversion

cycle time and the drawback of a lower noise immunity caused by the shorter signal integration period. The

conversion cycle time at this mode is roughly calculated by:

t_{CYC_2}= 2^(r+3)/2/ 2 / f_CLK

The calculation formulas give a overview about conversion time for one AD-conversion. Refer Calculation

sheet “ZMD31150_Bandwidth_Calculation_Rev*.xls” for detailed calculation of sampling time and bandwidth.

The result of the AD conversion is a relative counter result corresponding to the following equation:

Z_ADC= 2 ^r* (V_{ADC_DIFF}/ V_{ADC_REF}- RS_ADC

)

Z_ADC

r:

:

number of counts (result of the conversion)

adjusted resolution in bit

Data Sheet

Rev. 1.04

November 2009

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13 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

V_{ADC/REF_DIFF}

RS_ADC

:

differential input/reference voltage of ADC

digital ADC Range Shift (RS_ADC= ¹/₁₆, ¹/₈, ¹/₄, ¹/₂, controlled by the EEPROM content)

:

With the RS_ADCvalue a sensor input signal can be shifted in the optimal input range of the ADC.

Table 2.3

Analog Output resolution versus sample rat

ADC

Adjustment

approx. Output

Sample Rate

f_CON*2)

Averaged

Bandwidth @

Resolution *1)

Digital Analog

Bit Bit

Order

r_ADC

Bit

13

14

15

16

13

14

15

16

f_CLK=3MHz f_CLK=4MHz f_CLK=3MHz f_CLK=4MHz

O_ADC

Hz

345

178

90

Hz

460

Hz

130

67

Hz

172

89

1

2

13

14

13

14

12

237

120

34

45

61

17

23

5859

3906

2930

1953

7813

5208

3906

2604

2203

1469

1101

734

2937

1958

1468

979

*1) ADC resolution should be one bit higher then applied output resolution, if AFE gain is adjusted in such

manner, that input range is used more than 50%. Otherwise ADC resolution should be more than one bit

higher than applied output resolution.

*2) The sampling rate (AD conversion time) is only a part of the whole cycle,

refer “ZMD31150 bandwidth calculation sheet” for detailed information

Remark: ADCs reference voltage ADC_VREFis defined by the potential between <VBR_T> and <VBR_B> (or

<VDDA> to <VSSA>, if CFGAPP:BREF=1). The theoretically input range ADC_{RANGE_INP}of the ADC

is equivalent to ADCs reference voltage.

In practice ADCs input range should be used in maximum from 10% to 90% of ADC_{RANGE_INP}- a necessary

condition for abiding specified accuracy, stability and nonlinearity parameters of AFE. These condition is also

valid for whole temperature range and all applicable sensor tolerances. Inside of ZMD31150 is no failsafe

task implemented, which verifies abiding of these condition.

2.4.

Temperature Measurement

The ZMD31150 supports four different methods for temperature data acquiring needed for calibration of the

sensor signal in temperature range. Temperature data can be acquired using:

 an internal pn-junction temperature sensor,

 an external pn-junction temperature sensor connected to sensor top potential (VBRTOP),

 an external resistive half bridge temperature sensor and

 the temperature coefficient of the sensor bridge at bridge current excitation.

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Data Sheet

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

Refer “ZMD31150 Functional Description” for a detailed explanation of temperature sensor adaptation and

adjustment.

2.5.

System Control and Conditioning Calculation

The system control supports the following tasks/features:

 control the measurement cycle regarding to the EEPROM-stored configuration data

 16 bit correction calculation for each measurement signal using the EEPROM stored calibration

coefficients and ROM-based algorithms = signal conditioning

 manage start up sequence and start signal conditioning

 handle communication requests received by the serial interface

 failsafe tasks for the functions of ZMD31150 and message detected errors with diagnostic states

Refer “ZMD31150_FunctionalDescription_Rev_*.PDF” for a detailed description.

2.5.1. Operation Modes

The internal state machine represents three main states:

 the continuous running signal conditioning mode – called Normal Operation Mode: NOM

 the calibration mode with access to all internal registers and states – called Command Mode: CM

 the failure messaging mode – called Diagnostic Mode: DM

2.5.2. Start Up Phase⁷

The start up phase consist of following parts:

1 internal supply voltage settling phase (=potential VDDA-VSSA) – finished by disabling the reset signal

through the power on clear block (POC). Refer “ZMD31150_HighVoltageProt_Rev_*.PDF”, chapter 4 for

power on/off thresholds.

Time (for beginning with VDDA-VSSA=0V): 500 s to 2000 s, AOUT: tristate

2 system start, EEPROM read out and signature check (and ROM-check, if CFGAPP:CHKROM=1).

Time: ~200 s (~9000 s with ROM-check – 28180clocks ), AOUT: LOW (DM)

3 processing the start routine of signal conditioning (all measures & conditioning calculation).

Time: 5x AD conversion time, AOUT behavior depending on adjusted OWI mode (2.6):

- OWIANA & OWIDIS => AOUT: LOW (DM)

- OWIWIN & OWIENA => AOUT: tristate

The analog output AOUT will be activated at the end of start up phase depending on adjusted output and

communication mode (2.6). In case of detected errors Diagnostic Mode (DM) is activated and diagnostic

output signal is driven at the output.

After the start up phase the continuous running measurement and calibration cycle is started. Refer

“ZMD31150_BandwidthCalculation_Rev_*.xls” for detailed information about output update rate.

⁷All described timings are roughly estimated values and correlates with internal clock frequency. Timings estimated for fclk=3MHz.

stored, or used without the prior written consent of the copyright owner. The Information furnished in

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Data Sheet

Rev. 1.04

November 2009

15 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

2.5.3. Conditioning Calculation

The digitalized value for pressure (acquired raw data) is processed with the correction formula to remove

offset and temperature dependency and to compensate non-linearity up to 3rd order. The result of the

correction calculation is a non-negative 15 Bit value for pressure (P) in the range [0; 1). This value P is

clipped with programmed limitation coefficients and continuously written to the output register of the digital

serial interface and the output DAC.

Note: The conditioning includes up to third order nonlinearity sensor input correction. The available

adjustment ranges depend on the specific calibration parameters, for a detailed description refer to

“ZMD31150 Functional Description”. To give a rough idea: Offset compensation and linear correction

are only limited by the loose of resolution it will cause, the second order correction is possible up to

about 30% full scale difference to straight line, third order up to about 20% (ADC resolution = 13bit).

The used calibration principle is able to reduce present nonlinearity errors of the sensor up to 90%.

The temperature calibration includes first and second order correction and should be fairly sufficient

in all relevant cases. ADC resolution influences also calibration possibilities – 1 bit more resolution

reduces calibration range by approximately 50%. Calculation input data width is in maximum 14bit.

15 & 16bit ADC resolution mode uses only a 14 bit segment of ADC range.

2.6.

Analog Output AOUT

The analog output is used for output the analog signal conditioning result and for “End of Line”

communication via the ZACwire^TMinterface (one wire communication interface - OWI). The ZMD31150

supports four different modes of the analog output in combination with OWI behavior:

 OWIENA:analog output is deactivated, OWI communication is enabled

 OWIDIS: analog output is active (~2ms after power on), OWI communication is disabled

 OWIWIN:analog output will be activated after time window,

OWI communication is enabled in time window of ~500ms in maximum,

transmission of “START_CM” command has to be finished during time window

 OWIANA:analog output will be activated after ~2ms power on time,

OWI communication is enabled in time window of ~500ms in maximum,

transmission of “START_CM” command has to be finished during time window,

to communicate the internal driven potential at AOUT has to be overwritten

by the external communication master (AOUT drive capability is current limited)

The analog output potential is driven by an unity gain output buffer, those input signal is generated by an

12.4bit resistor string DAC. The output buffer (BAMP) – a rail-to-rail OPAMP - is offset compensated and

current limited. So a short circuit of analog output to ground or power supply does not damage the

ZMD31150.

2.7.

Serial Digital Interface

The ZMD31150 includes a serial digital interface (SIF), which is used for communication with the circuit to

realize calibration of the sensor module. The serial interface is able to communicate with two communication

protocols – I²C^TMand ZACwire^TM(an one wire communication interface – also called OWI). The OWI can be

used to realize a “End of Line” calibration via the analog output AOUT of the complete assembled sensor

module.

Refer “ZMD31150 Functional Description” for a detailed description of the serial interfaces and

communication protocols.

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Data Sheet

Rev. 1.04

November 2009

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

2.8.

Failsafe Features, Watchdog and Error Detection

The ZMD31150 detects various possible errors. A detected error is signalized by changing the interal status

in diagnostic mode (DM). In this case the analog output is set to LOW (minimum possible output value =

lower diagnostic range – LDR) and the output registers of the digital serial interface are set to a significant

error code.

A watchdog oversees the continuous working of the CMC and the running measurement loop. The operation

of the internal clock oscillator is verified continuously by oscillator fail detection.

A check of the sensor bridge for broken wires is done permanently by two comparators watching the input

voltage of each input (sensor connection and short check). Additionally the common mode voltage of the

sensor and sensor input short is watched permanently (sensor aging).

Different functions and blocks in digital part - like RAM-, ROM-, EEPROM- and register content - are watched

continuously. Refer “ZMD31150 Functional Description” for a detailed description of safety features and

methods of error messaging.

2.9.

High Voltage, Reverse Polarity and Short Circuit Protection

The ZMD31150 is designed for 5V power supply operation.

The ZMD31150 and the connected sensor is protected from overvoltage and reverse polarity damage by an

internal supply voltage limiter. The analog output AOUT can be connected (short circuit, overvoltage and

reverse) with all potentials in protection range under all potential conditions at the pins VDDE and VSSE.

All external components – explained in application circuit in chapter 3 – are required to guarantee these

operation, the protection is no time limited. Refer “ZMD31150 High Voltage Protection Description” for a

detailed description of protection cases and conditions.

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Data Sheet

Rev. 1.04

November 2009

17 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

3

Application Circuit Examples

The application circuits contain external components, which are needed for overvoltage, reverse polarity, and

short circuit protection.

Note:

Check also the available 'ZMD31150 Application Notes' for application examples and board layout.

Table 3.1

Application Circuit Parameters

Symbol Parameter

Min

100

4

Typ

Max

Unit Notes

C1

C2

C

470

nF

8) 9)

C3

47

160

10

nF The value of C3 is the sum of the load capacitor

and the cable capacitance

C4, C5 ⁹⁾

C

0

nF Recommended to increase EMC immunity.

The value of C4, C5 is the sum of the load

capacitor and the cable capacitance

R1

10

kΩ

R_IBR

R

Refer to chapter 1.2

Ω

Figure 3.1

Bridge in Voltage Mode, External Diode Temperature Sensor

Temperature Sensor

C1 100nF

C4 C5

1

2

3

4

5

6

7

14

13

12

11

10

9

VDDA

VSSA

SDA

IRTEMP

VBR_T

VBP

Sensor Bridge

SDA

SCL

VBR_B

VBN

N.C.

OUT

VDD

AOUT

VSSE

C3

47nF

8

VCC

VDDE

C2

100nF

ZMD31150

GND

⁸value of C3 summarizes load capacitor and cable capacity

⁹higher values for C3, C4 and C5 increase EMC immunity

Data Sheet

Rev. 1.04

November 2009

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

Figure 3.2

Bridge in Voltage Mode, External Thermistor

Temperature Sensor

C1 100nF

C4 C5

PT

1000

1

2

3

4

5

6

7

14

13

12

11

10

9

VDDA

VSSA

SDA

IRTEMP

VBR_T

VBP

Sensor Bridge

R1

SDA

SCL

VBR_B

VBN

N.C.

OUT

VDD

AOUT

VSSE

C3

47nF

8

VCC

VDDE

C2

100nF

ZMD31150

GND

Figure 3.3

Bridge in Current Mode, Temperature Measurement via Bridge TC

R_IBR

1

2

3

4

5

6

7

14

13

12

11

10

9

VDDA

VSSA

SDA

IRTEMP

VBR_T

VBP

C1

Sensor Bridge

100nF

SDA

SCL

C4

C5

SCL

VBR_B

VBN

N.C.

OUT

GND

VDD

AOUT

VSSE

C3

47nF

8

VCC

VDDE

C2

ZMD31150

100nF

Data Sheet

Rev. 1.04

November 2009

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

4

Pin Configuration, Latch-Up and ESD Protection

4.1.

Pin Configuration and Latch-up Conditions

Table 4.1

Pin Configuration and Latch-Up Conditions

Pin Name

Description

Remarks

Usage/

Connection

Latch-up related Application Circuit

Restrictions and/or Remarks

9

7

6

AOUT

VDDE

VDD

Analog output & one wire IF IO IO

Required/-

Trigger Current/Voltage: -100mA/33V

Positive external supply voltage

Positive digital supply voltage

Supply

Analog IO Required or

open/-

only capacitor to VSSA is allowed,

otherwise no application access

8

4

VSSE

SCL

Negative external supply voltage Ground

Required/-

Digital IN, -/VDDA

pullup

I²C clock

Trigger Current/Voltage to

VDDA/VSSA:

+/-100mA or 8/-4V

3

2

1

SDA

I²C data IO

Digital IO, -/VDDA

pullup

VSSA

Negative analogue supply

voltage

Analog IO Required/-

VDDA

Positive analogue supply voltage Analog IO Required/-

13 VBR_T Bridge top potential

Analog IO Required/VDDA Depending on application circuit,

short to VDDA/VSSA possible

11 VBR_B Bridge bottom potential

Analog IO Required/VSSA

14 IRTEMP Temp sensor & current source

resistor

Analog IO -/VDDA, VSSA Depending on application circuit

12 VBP

Positive input sensor bridge

Negative input sensor bridge

Analog IN Required/-

10 VBN

1)

Usage: If “Required” is specified, an electrical connection is necessary – refer to the application circuits

Connection: To be connected to this potential, if not used or no application/configuration related constraints are given

4.2.

ESD-Protection

All pins have an ESD Protection of >2000V. Additionally the pins VDDE, VSSE and AOUT have an ESD

Protection of >4000V.

ESD Protection referred to the human body model is tested with devices in SSOP14 packages during

product qualification. The ESD test follows the human body model with 1.5kOhm/100pF based on MIL 883,

Method 3015.7.

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Data Sheet

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

5

Package

The standard package of the ZMD31150 is an SSOP14 green package (5.3mm body width) with a lead pitch

of 0.65 mm.

Figure 5.1

ZMD31150 Pin Diagram

VSSE

AOUT

VBN

VDDE

VDD

N.C.

VBR_B

VBP

SCL

SDA

VBR_T

IRTEMP

VSSA

VDDA

6

Quality and Reliability

The ZMD31150 is qualified according to the AEC-Q100 standard, operating temperature grade 0. A fit rate

<5fit (temp=55°C, S=60%) is guaranteed. A typical fit rate of the C7D-technologie, which is used for

ZMD31150, is 2.5fit.

7

Customization

For high-volume applications, which require an up- or downgraded functionality compared to the ZM31150,

ZMDI can customize the circuit design by adding or removing certain functional blocks.

For it ZMDI has a considerable library of sensor-dedicated circuitry blocks.

Thus ZMDI can provide a custom solution quickly. Please contact ZMDI for further information.

stored, or used without the prior written consent of the copyright owner. The Information furnished in

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Data Sheet

Rev. 1.04

November 2009

21 / 23

Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

8

Additional Documents

Table 8.1

Additional Documents

Document

File Name

ZMD31150 Feature Sheet

ZMD31150_FS_Rev_*.PDF

ZMD31150_FD_Rev_*.PDF

ZMD31150_HV_PROT_Rev_*.PDF

ZMD31150_DicePackagePin_Rev_*.PDF

ZMD31150_Bandwidth_Calculation_Rev*.xls

ZMD_TempProfile_Rev_*.xls

ZMD31150_APPLKIT_Rev_*.pdf

ZMD31150_AN*.pdf

ZMD31150 Functional Description

ZMD31150 High Voltage Protection Description

ZMD31150 Dice Package

ZMD31150 Bandwidth Calculation Sheet

ZMD Temperature Profile Calculation Sheet

ZMD31150 Application Kit Description

ZMD31150 Application Notes

Visit ZMDI’s website www.zmdi.com or contact your nearest sales office for the latest version of these

documents.

9

Glossary

Term

Description

ADC

CMC

CMV

SCC

SSC+

SSC-

Analog-to-Digital Converter

Calibration Microcontroller

Common Mode Voltage

Sensor Connection Check

Positive-biased Sensor Short Check

Negative-biased Sensor Short Check

Data Sheet

Rev. 1.04

November 2009

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Data Sheet

Fast Automotive Sensor Signal Conditioner

ZMD31150

10 Document Revision History

Revision Date

Description

0.46

0.47

June 12, 2008

July 20, 2008

First release after format update

Update after review

“6.” – fit rate added

1.01

September 20, 2008 ”1.5.2” – ROM check time revised/corrected

”5.3.4.3” – SSC – no detection limit added

1.02

1.03

1.04

September 20, 2009 adjust to new ZMDI template

October 2, 2009

change to ZMDI denotation

November 2, 2009

formatting and linking issues solved

This information applies to a product under development. Its characteristics and specifications are subject to change without notice.

ZMD AG assumes no obligation regarding future manufacture unless otherwise agreed to in writing. The information furnished hereby

is believed to be true and accurate. However, ZMD AG shall not be liable to any customer, licensee or any other third party for any

damages in connection with or arising out of the furnishing, performance or use of this technical data.

Sales Offices and Further Information

www.zmdi.com

ZMD AG

ZMD America, Inc.

201 Old Country Road

Suite 204

Melville, NY 11747

USA

ZMD Japan

ZMD Far East

Grenzstrasse 28

01109 Dresden

Germany

2^ndFloor, Shinbashi Tokyu Bldg. 3F, No.,51, Sec. 2,

4-21-3, Shinbashi, Minato-ku

Tokyo, 105-0004

Japan

Keelung Road

11052 Taipei

Taiwan

Phone

Fax

sales@zmdi.com

+49 (0)351.8822.7.772 Phone

+49(0)351.8822.87.772 Fax

+01 (631) 549-2666

+01 (631) 549-2882

sales@zmdi.com

Phone

Fax

sales@zmdi.com

+81.3.6895.7410

+81.3.6895.7301

Phone

Fax

sales@zmdi.com

+886.3.563.1388

+886.3.563.6385

Data Sheet

Rev. 1.04

November 2009

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型号：	ZMD31015AEF-T
厂家：	INTEGRATED DEVICE TECHNOLOGY
描述：	Automotive Analog Circuit
文件：	总23页 (文件大小：296K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

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