BSO301SP H [INFINEON]

英飞凌高度创新型 OptiMOS™ 系列包括 P 通道功率 MOSFET。这些产品始终满足电力系统设计关键规范中的至高质量和性能要求,例如导通电阻特性和品质因数特性。;
BSO301SP H
型号: BSO301SP H
厂家: Infineon    Infineon
描述:

英飞凌高度创新型 OptiMOS™ 系列包括 P 通道功率 MOSFET。这些产品始终满足电力系统设计关键规范中的至高质量和性能要求,例如导通电阻特性和品质因数特性。

文件: 总9页 (文件大小:325K)
中文:  中文翻译
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BSO301SP H  
OptiMOS®-P Power-Transistor  
Product Summary  
V DS  
Features  
-30  
8.0  
V
• P-Channel  
R DS(on),max  
m  
A
V
GS= 10 V  
• Enhancement mode  
VGS= 4.5 V  
12.0  
-14.9  
• Logic level  
I D  
A
• 150°C operating temperature  
• Avalanche rated  
PG-DSO-8  
• Qualified according JEDEC for target applications  
• Pb-free lead plating; RoHS compliant  
• Halogen-free according to IEC61249-2-21  
Type  
Package  
Marking  
Leadfree  
Halogen free  
packing  
dry  
BSO301SP H  
PG-DSO-8  
301SP  
Yes  
Yes  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
10 secs steady state  
T A=25 °C1)  
I D  
Continuous drain current  
-14.9  
-11.9  
-12.6  
-10  
A
T A=70 °C1)  
T A=25 °C2)  
I D,pulse  
-60  
248  
±20  
Pulsed drain current  
E AS  
I D=-14.9 A, R GS=25 Ω  
Avalanche energy, single pulse  
mJ  
V GS  
Gate source voltage  
V
T A=25 °C1)  
P tot  
Power dissipation  
2.5  
1.79  
W
°C  
T j, T stg  
-55 ... 150  
1C (1kV - 2kV)  
260  
Operating and storage temperature  
ESD class  
JESD22-A114 HBM  
Soldering temperature  
IEC climatic category; DIN IEC 68-1  
°C  
55/150/56  
Rev. 1.32  
page 1  
2010-05-12  
BSO301SP H  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
R thJS  
-
-
-
-
-
-
-
-
-
-
35  
110  
150  
50  
K/W  
junction - soldering point  
minimal footprint,  
Thermal resistance,  
junction - ambient  
R thJA  
t p10 s  
minimal footprint,  
steady state  
6 cm2 cooling area1),  
t p10 s  
6 cm2 cooling area1),  
steady state  
80  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS  
V
V
GS=0 V, I D=-250µA  
DS=V GS  
Drain-source breakdown voltage  
Gate threshold voltage  
-30  
-1  
-
-
V
,
V GS(th)  
-1.5  
-2  
I D=-250 µA  
V
DS=-30 V, V GS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-
-0.1  
-10  
-1  
µA  
T j=25 °C  
V
DS=-30 V, V GS=0 V,  
-100  
T j=125 °C  
I GSS  
V
V
GS=-20 V, V DS=0 V  
GS=-4.5 V, I D=-12 A  
Gate-source leakage current  
-
-
-10  
8.8  
-100 nA  
R DS(on)  
Drain-source on-state resistance  
12  
mΩ  
R DS(on)  
V
GS=-10 V, I D=-14.9 A  
Drain-source on-state resistance  
Transconductance  
-
6.3  
44  
8.0  
|V DS|>2|I D|R DS(on)max  
I D=-14.9 A  
,
g fs  
22  
-
S
2
1) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.32  
page 2  
2010-05-12  
BSO301SP H  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
4430  
1180  
970  
15  
5890 pF  
1570  
V
V
GS=0 V,  
C oss  
C rss  
t d(on)  
t r  
DS=-25 V, f =1 MHz  
1500  
23  
33  
ns  
V
V
DD=-15 V,  
GS=-10 V,  
22  
t d(off)  
t f  
Turn-off delay time  
Fall time  
130  
110  
195  
165  
I D=-1 A, R G=6 Ω  
Gate Charge Characteristics3)  
Gate to source charge  
Gate charge at threshold  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
-
-11  
-7.1  
-35  
-15  
nC  
Q g(th)  
Q gd  
-9.5  
V
DD=-24 V,  
I D=-14.9 A,  
Q sw  
-40  
-59  
-136  
-
V
GS=0 to -10 V  
Q g  
Gate charge total  
-102  
-2.5  
-36  
V plateau  
Q oss  
Gate plateau voltage  
Output charge  
V
A
V
DD=-15 V, V GS=0 V  
-48  
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
-2.1  
-60  
T A=25 °C  
I S,pulse  
V
GS=0 V, I F=-14.9 A,  
V SD  
Diode forward voltage  
Reverse recovery time  
-
-
-
-0.82  
32  
-1.2  
40  
V
T j=25 °C  
V R=15 V, I F=-14.9A,  
di F/dt =100 A/µs  
t rr  
ns  
nC  
Q rr  
Reverse recovery charge  
2) See figure 3  
-20  
-25  
3) See figure 16 for gate charge parameter definition  
Rev. 1.32  
page 3  
2010-05-12  
BSO301SP H  
1 Power dissipation  
2 Drain current  
P
tot=f(T A); t p10 s  
I D=f(T A); |V GS|10 V; t p10 s  
3
2.5  
2
16  
12  
8
1.5  
1
4
0.5  
0
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T
A [°C]  
T
A [°C]  
3 Safe operating area  
I D=f(V DS); T A=25 °C1); D =0  
4 Max. transient thermal impedance  
thJS=f(t p)  
Z
parameter: t p  
parameter: D =t p/T  
102  
102  
100  
100  
10 µs  
100 µs  
0.5  
0.2  
1 ms  
101  
101  
10  
10  
limited by on-state  
resistance  
0.1  
0.05  
10 ms  
0.02  
100  
10-1  
10-2  
100  
1
1
0.01  
10-1  
0.1  
DC  
0.1  
single pulse  
10-2  
0.01  
0.1  
0.01  
1
10  
100  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
10-1  
100  
101  
102  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
-V DS [V]  
t
p [s]  
Rev. 1.32  
page 4  
2010-05-12  
BSO301SP H  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
DS(on)=f(I D); T j=25 °C  
R
parameter: V GS  
parameter: V GS  
60  
25  
-10 V  
-3.5 V  
-4.5 V  
3.0  
2.5  
2.7  
-3.2 V  
-3 V  
50  
40  
30  
20  
10  
0
20  
15  
10  
5
3.2  
3.5  
4.5  
10  
-2.7 V  
-2.5 V  
-2.3 V  
0
0
0
1
2
3
10  
20  
30  
40  
-V DS [V]  
-ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
60  
50  
40  
30  
20  
60  
40  
20  
0
C °25  
C °150  
10  
0
0
1
2
3
4
0
10  
20  
30  
-ID [A]  
-V GS [V]  
Rev. 1.32  
page 5  
2010-05-12  
BSO301SP H  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
R
DS(on)=f(T j); I D=-14.9 A; V GS=-10 V  
V
GS(th)=f(T j); V GS=V DS; I D=-250 µA  
12  
10  
2.5  
2
max.  
98 %  
8
typ.  
1.5  
typ.  
6
min.  
1
4
2
0
0.5  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
T j [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
104  
10000  
100  
Ciss  
25 °C, typ  
150 °C, typ  
10  
Coss  
25 °C, 98%  
150 °C, 98%  
103  
1000  
Crss  
1
102  
100  
0.1  
0
0
5
10  
15  
20  
25  
30  
0.5  
1
1.5  
-V SD [V]  
-V DS [V]  
Rev. 1.32  
page 6  
2010-05-12  
BSO301SP H  
13 Avalanche characteristics  
AS=f(t AV); R GS=25 Ω  
14 Typ. gate charge  
GS=f(Q gate); I D=-14.9 A pulsed  
V
I
parameter: T j(start)  
parameter: V DD  
100  
10  
9
8
7
6
5
4
3
2
1
0
6
15  
24  
C °25  
10  
C °100  
C °125  
1
1
10  
100  
1000  
0
20  
40  
60  
80  
100  
120  
-Q gate [nC]  
t
AV [µs]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V
BR(DSS)=f(T j); I D=-250 µA  
36  
34  
32  
30  
28  
26  
24  
22  
20  
V GS  
Q g  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
Rev. 1.32  
page 7  
2010-05-12  
BSO301SP H  
Package Outline  
P-DSO-8: Outline  
Rev. 1.32  
page 8  
2010-05-12  
BSO301SP H  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2008 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 1.32  
page 9  
2010-05-12  

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