BUZ103SL-4 [INFINEON]
SIPMOS Power Transistor (Quad-channel Enhancement mode Logic level Avalanche-rated d v/d t rated); SIPMOS功率晶体管(四沟道增强模式的逻辑电平雪崩额定的dv / dt评分)型号: | BUZ103SL-4 |
厂家: | Infineon |
描述: | SIPMOS Power Transistor (Quad-channel Enhancement mode Logic level Avalanche-rated d v/d t rated) |
文件: | 总8页 (文件大小:110K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
BUZ 103SL-4
Preliminary data
®
SIPMOS Power Transistor
• Quad-channel
• Enhancement mode
• Logic level
• Avalanche-rated
• dv/dt rated
Type
V
I
R
Package
P-DSO-28
Ordering Code
DS
D
DS(on)
Ω
BUZ 103SL-4 55 V
4.8 A
0.055
C67078-S. . . .- . .
Maximum Ratings
Parameter
Symbol
Values
4.8
Unit
Continuous drain current one channel active
I
A
D
T = 25 °C
A
Pulsed drain current one channel active
I
Dpuls
T = 25 °C
19.2
A
Avalanche energy, single pulse
E
mJ
AS
I = 4.8 A, V = 25 V, R = 25 Ω
D
DD
GS
L = 12 mH, T = 25 °C
140
j
Reverse diode dv/dt
dv/dt
kV/µs
I = 4.8 A, V = 40 V, di /dt = 200 A/µs
S
DS
F
T
= 175 °C
6
jmax
±
Gate source voltage
Power dissipation ,one channel active
V
P
14
V
GS
W
tot
T = 25 °C
2.4
A
Operating temperature
T
-55 ... + 175 °C
-55 ... + 175
j
Storage temperature
T
stg
IEC climatic category, DIN IEC 68-1
55 / 175 / 56
Semiconductor Group
1
05/Sep/1997
BUZ 103SL-4
Preliminary data
Thermal Characteristics
Parameter
Symbol
Values
min. typ.
Unit
max.
1)
Thermal resistance, junction - soldering point
R
R
-
-
tbd
-
-
K/W
thJS
2)
Thermal resistance, junction - ambient
62.5
thJA
1) Device on 50mm*50mm*1.5mm epoxy PCB FR4 with 6 cm2 (one layer,70µm thick) copper area for
Drain connection. PCB is vertical without blown air.
2) one channel active
Electrical Characteristics,
Parameter
= 25°C, unless otherwise specified
at T
j
Symbol
Values
Unit
min.
typ.
max.
Static Characteristics
Drain- source breakdown voltage
= 0 V, I = 0.25 mA, T = 25 °C
V
V
V
(BR)DSS
GS(th)
DSS
V
55
-
-
GS
D
j
Gate threshold voltage
=V
I = 50 µA
V
1.2
1.6
2
GS DS, D
Zero gate voltage drain current
I
µA
V
V
V
= 55 V, V
= 55 V, V
= 55 V, V
= 0 V, T = -40 °C
-
-
-
-
0.1
1
DS
DS
DS
GS
GS
GS
j
= 0 V, T = 25 °C
0.1
-
j
= 0 V, T = 150 °C
100
j
Gate-source leakage current
= 20 V, V = 0 V
I
nA
GSS
V
-
-
10
100
GS
DS
Ω
Drain-Source on-resistance
= 5 V, I = 4.8 A
R
DS(on)
V
0.0403
0.055
GS
D
Semiconductor Group
2
05/Sep/1997
BUZ 103SL-4
Preliminary data
Electrical Characteristics,
Parameter
= 25°C, unless otherwise specified
at T
j
Symbol
Values
Unit
min.
typ.
max.
Dynamic Characteristics
Transconductance
g
S
fs
≥
V
2 I
R I = 0 A
tbd
-
-
DS
* D * DS(on)max, D
Input capacitance
= 0 V, V = 25 V, f = 1 MHz
C
C
C
pF
960
iss
oss
V
-
-
-
770
230
130
GS
DS
Output capacitance
= 0 V, V = 25 V, f = 1 MHz
V
290
GS
DS
Reverse transfer capacitance
= 0 V, V = 25 V, f = 1 MHz
rss
V
165
GS
DS
Turn-on delay time
= 30 V, V = 5 V, I = 4.8 A
t
t
t
t
ns
d(on)
V
DD
GS
D
R = 6.5 Ω
-
-
-
50
30
20
75
45
30
G
Rise time
r
V
= 30 V, V = 5 V, I = 4.8 A
GS D
DD
R = 6.5 Ω
G
Turn-off delay time
= 30 V, V = 5 V, I = 4.8 A
d(off)
V
DD
GS
D
R = 6.5 Ω
G
Fall time
f
V
= 30 V, V = 5 V, I = 4.8 A
GS D
DD
R = 6.5 Ω
-
-
-
-
-
40
60
nC
2
G
Gate charge at threshold
Q
Q
Q
g(th)
≥
V
= 40 V, I
0.1 A, V =0 to 1 V
GS
1.33
20
DD
D
Gate charge at 5.0 V
= 40 V, I = 4.8 A, V =0 to 5 V
g(5)
V
30
DD
D
GS
Gate charge total
= 40 V, I = 4.8 A, V =0 to 10 V
g(total)
V
32.6
2.94
50
DD
D
GS
Gate plateau voltage
= 40 V, I = 28 A
V
V
(plateau)
V
-
DD
D
Semiconductor Group
3
05/Sep/1997
BUZ 103SL-4
Preliminary data
Electrical Characteristics, at T = 25°C, unless otherwise specified
j
Parameter
Symbol
Values
typ.
Unit
min.
max.
Reverse Diode
Inverse diode continuous forward current I
A
S
T = 25 °C
-
-
-
-
-
-
4.8
A
Inverse diode direct current, pulsed
I
SM
T = 25 °C
-
19.2
V
A
Inverse diode forward voltage
V
SD
V
= 0 V, I = 9.6 A
0.9
55
93
1.6
GS
F
Reverse recovery time
V = 30 V, I =l di /dt = 100 A/µs
t
ns
rr
85
R
F S,
F
Reverse recovery charge
V = 30 V, I =l di /dt = 100 A/µs
Q
nC
140
rr
R
F S,
F
Semiconductor Group
4
05/Sep/1997
BUZ 103SL-4
Preliminary data
Power dissipation
Drain current
ƒ
ƒ
T
D = (
P
T
I
tot = (
)
)
A
A
≥
V
parameter:
5 V
GS
5.0
A
2.8
W
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
4.0
ID
Ptot
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.2
0.0
0.0
0
0
20 40 60 80 100 120 140 °C 180
TA
20 40 60 80 100 120 140 °C 180
TA
Safe operating area
Transient thermal impedance
ƒ
ƒ
t
I
V
Z
th JA = ( p)
D = (
)
DS
D
, T
D = t
T
/
p
parameter: = 0 C = 25°C
parameter:
I
10 2
10 2
K/W
V
10 1
A
t
= 1.4ms
R
p
ID
ZthJC
10 1
10 0
10 ms
10 -1
10 -2
10 -3
10 -4
10 -5
10 -6
10 0
10 -1
10 -2
D = 0.50
0.20
0.10
0.05
0.02
0.01
DC
single pulse
10 0
10 1
V 10 2
10 -8 10 -7 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1s 10 0
tp
VDS
Semiconductor Group
5
05/Sep/1997
BUZ 103SL-4
Preliminary data
Typ. drain-source on-resistance
ƒ(
Typ. output characteristics
ƒ(
RDS (on)
ID
)
=
ID
VDS
)
=
t
T
parameter: p = 80 µs, j = 25 °C
t
parameter: p = 80 µs
0.17
11
P
tot = 2W
a
b
l
k
Ω
h
e
g
A
9
8
7
6
5
4
3
2
d
V
[V]
0.14
GS
a
RDS (on)
ID
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
7.0
8.0
10.0
b
c
d
e
f
0.12
0.10
0.08
0.06
0.04
g
h
i
c
c
j
d
f
k
l
e
g
h
i
j
V
[V] =
b
GS
a
0.02
0.00
c
d
e
f
g
h
i
j
1
0
3.0 3.5 4.0 4.5 5.0 5.5 6.0 7.0 8.0 10.0
b
a
0
2
4
6
8
A
ID
11
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
V
VDS
5.0
I
f V
Typ. transfer characteristics D = (
)
GS
t
parameter: = 80 µs
p
V
I
R
≥2 x
x
DS
D
DS(on)max
90
A
ID
70
60
50
40
30
20
10
0
0
1
2
3
4
5
6
7
8
V
VGS
10
Semiconductor Group
6
05/Sep/1997
BUZ 103SL-4
Preliminary data
Drain-source on-resistance
Gate threshold voltage
ƒ
ƒ
T
GS (th) = ( )
j
R
T
V
DS (on) = ( )
j
I
V
V
V I
, D = 50 µA
DS
parameter: D = 4.8 A, GS = 5 V
parameter:
=
GS
0.15
4.6
V
Ω
0.13
RDS (on)0.12
0.11
4.0
VGS(th)
3.6
3.2
2.8
2.4
2.0
1.6
1.2
0.8
0.4
0.10
0.09
0.08
98%
98%
typ
0.07
0.06
typ
0.05
0.04
0.03
0.02
2%
0.01
0.00
0.0
-60
-60
-20
20
60
100
°C
Tj
180
-20
20
60
100
°C
Tj
180
Typ. capacitances
C f V
Forward characteristics of reverse diode
ƒ
= (
)
I
V
F = (
)
DS
SD
T , t
parameter:
p = 80 µs
V
f
= 0V, = 1MHz
parameter:
j
GS
10 4
10 3
A
C
IF
pF
10 2
10 3
Ciss
10 1
T
T
T
T
j = 25 °C typ
j = 175 °C typ
j = 25 °C (98%)
j = 175 °C (98%)
Coss
Crss
10 2
0
10 0
0.0
5
10
15
20
25
30
V
40
0.4
0.8
1.2
1.6
2.0
2.4
V
VSD
3.0
VDS
Semiconductor Group
7
05/Sep/1997
BUZ 103SL-4
Preliminary data
ƒ
Avalanche energy E
T
Typ. gate charge
AS = ( )
j
ƒ
V Q
GS = (
Gate
I
V
parameter: D = 4.8 A, DD = 25 V
)
Ω
,
R
L
I
GS = 25
= 12 mH
parameter: D puls = 5 A
16
V
150
mJ
130
EAS 120
110
100
90
VGS
12
10
8
80
70
60
V
V
DS max
0,2
0,8
DS max
6
4
50
40
30
20
2
0
10
0
20
40
60
80 100 120 140 °C 180
Tj
0
5
10 15 20 25 30 35 40 nC 50
QGate
Drain-source breakdown voltage
ƒ
V
T
(BR)DSS = ( )
j
65
V
V(BR)DSS
61
59
57
55
53
51
49
-60
-20
20
60
100
°C
Tj
180
Semiconductor Group
8
05/Sep/1997
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