CY62162G30-45BGXI [INFINEON]

Asynchronous SRAM;
CY62162G30-45BGXI
型号: CY62162G30-45BGXI
厂家: Infineon    Infineon
描述:

Asynchronous SRAM

静态存储器 内存集成电路
文件: 总21页 (文件大小:544K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Please note that Cypress is an Infineon Technologies Company.  
The document following this cover page is marked as “Cypress” document as this is the  
company that originally developed the product. Please note that Infineon will continue  
to offer the product to new and existing customers as part of the Infineon product  
portfolio.  
Continuity of document content  
The fact that Infineon offers the following product as part of the Infineon product  
portfolio does not lead to any changes to this document. Future revisions will occur  
when appropriate, and any changes will be set out on the document history page.  
Continuity of ordering part numbers  
Infineon continues to support existing part numbers. Please continue to use the  
ordering part numbers listed in the datasheet for ordering.  
www.infineon.com  
CY62162G/CY62162GE MoBL  
16-Mbit (512K × 32) Static RAM  
with Error-Correcting Code (ECC)  
16-Mbit (512K  
× 32) Static RAM with Error-Correcting Code (ECC)  
feature that reduces power consumption when addresses are  
not toggling. Placing the device into standby mode reduces  
power consumption by more than 99% when deselected (CE1  
HIGH or CE2 LOW or BA-D HIGH). The input and output pins  
(I/O0 through I/O31) are placed in a high impedance state when  
deselected (CE1 HIGH or CE2 LOW) or outputs are disabled (OE  
HIGH) or the byte selects are disabled (BA-D HIGH).  
Features  
Ultra-low standby power  
Typical standby current: 5.5 A  
Maximum standby current: 16 A  
High speed: 45 ns/55 ns  
To write to the device, take chip enables (CE1 LOW, CE2 HIGH)  
and write enable (WE) input LOW. If byte enable A (BA) is LOW,  
then data from I/O pins (I/O0 through I/O7) is written into the  
location specified on the address pins (A0 through A18). If byte  
enable B (BB) is LOW, then data from I/O pins (I/O8 through  
I/O15) is written into the location specified on the address pins  
(A0 through A18). Likewise, BC and BD correspond with the I/O  
pins I/O16 to I/O23 and I/O24 to I/O31, respectively.  
Embedded error-correcting code (ECC) for single-bit error  
correction  
Wide voltage range: 1.65 V to 2.2 V, 2.2 V to 3.6 V  
1.0-V data retention  
Transistor-transistor logic (TTL) compatible inputs and outputs  
ERR pin to indicate 1-bit error detection and correction  
Easy memory expansion with CE1 and CE2 features  
To read from the device, take chip enables (CE1 LOW, CE2  
HIGH), and output enable (OE) LOW while forcing the write  
enable (WE) HIGH. If the first byte enable (BA) is LOW, then data  
from the memory location specified by the address pins appear  
on I/O0 to I/O7. If byte enable (BB) is LOW, then data from  
memory appears on I/O8 to I/O15. Likewise, BC and BD  
correspond to the third and fourth bytes. During Read operation,  
in case of a single bit error detection and correction, ERR is  
Available in Pb-free 119-ball PBGA package, 512K × 32 bits  
SRAM  
Functional Description  
The CY62162G and CY62162GE devices are high performance  
CMOS MoBL SRAM organized as 512K words by 32-bits. Both  
CY62162G and CY62162GE are available with dual chip  
enables. CY62162GE includes an error indication pin that  
signals the host processor in the case of a single bit  
error-detection and correction event. It is ideal for providing More  
Battery Life™ (MoBL®) in portable applications such as cellular  
telephones. The device also has an automatic power down  
asserted  
HIGH[1]  
.
See  
the  
Truth  
Table  
CY62162G/CY62162GE on page 14 for a complete description  
of read and write modes.  
CY62162G and CY62162GE devices are available in a 119-ball  
PBGA package with center power and ground pinout.  
Product Portfolio  
Power Dissipation  
Features and Options  
(see the Pin  
Operating ICC, (mA)  
f = fmax  
Speed  
(ns)  
Product  
Range  
VCC Range (V)  
Standby, ISB2 (µA)  
Configurations  
Section)  
Typ[2]  
Max  
32  
Typ[2]  
7
Max  
26  
CY62162G(E)18  
CY62162G(E)30  
Dual Chip Enable  
Optional Error indication  
on ERR pinout  
Industrial  
1.65 V–2.2 V  
2.2 V–3.6 V  
55  
45  
29  
29  
36  
5.5  
16  
Notes  
1. This device does not support automatic write-back on error detection.  
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = 1.8 V (for V range of 1.65 V–2.2 V), V = 3 V  
CC  
CC  
CC  
(for V range of 2.2 V–3.6 V), T = 25 °C.  
CC  
A
Cypress Semiconductor Corporation  
Document Number: 001-81598 Rev. *F  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised March 2, 2020  
CY62162G/CY62162GE MoBL  
Logic Block Diagram – CY62162G  
ECC ENCODER  
DATAIN DRIVERS  
I/O0‐I/O7  
I/O8‐I/O15  
I/O16‐I/O23  
I/O24‐I/O32  
WE  
BD  
BC  
BB  
BA  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
512K x 32  
RAM ARRAY  
COLUMN DECODER  
WE  
OE  
CE2  
CE1  
BD BC BB BA  
Document Number: 001-81598 Rev. *F  
Page 2 of 20  
CY62162G/CY62162GE MoBL  
Logic Block Diagram – CY62162GE  
ECC ENCODER  
DATAIN DRIVERS  
I/O0‐I/O7  
I/O8‐I/O15  
I/O16‐I/O23  
I/O24‐I/O32  
WE  
BD  
BC  
BB  
BA  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
512K x 32  
RAM ARRAY  
ERR  
COLUMN DECODER  
WE  
OE  
CE2  
CE1  
BD BC BB BA  
Document Number: 001-81598 Rev. *F  
Page 3 of 20  
CY62162G/CY62162GE MoBL  
Contents  
Pin Configurations ...........................................................5  
Maximum Ratings .............................................................6  
Operating Range ...............................................................6  
Electrical Characteristics .................................................6  
Capacitance ......................................................................7  
Thermal Resistance ..........................................................7  
AC Test Loads and Waveforms .......................................7  
Data Retention Characteristics .......................................8  
Data Retention Waveform ................................................8  
Switching Characteristics ................................................9  
Switching Waveforms ....................................................10  
Truth Table – CY62162G/CY62162GE ...........................14  
ERR Output – CY62162GE .............................................14  
Ordering Information ......................................................15  
Ordering Code Definitions .........................................15  
Package Diagram ............................................................16  
Acronyms ........................................................................17  
Document Conventions .................................................17  
Units of Measure .......................................................17  
Document History Page .................................................18  
Sales, Solutions, and Legal Information ......................20  
Worldwide Sales and Design Support .......................20  
Products ....................................................................20  
PSoC® Solutions ......................................................20  
Cypress Developer Community .................................20  
Technical Support .....................................................20  
Document Number: 001-81598 Rev. *F  
Page 4 of 20  
CY62162G/CY62162GE MoBL  
Pin Configurations  
Figure 1. 119-ball FBGA pinout [3]  
CY62162G (512K × 32)  
1
2
3
4
5
6
7
I/O  
A
4
A
3
A
2
A
1
A
0
I/O  
A
16  
0
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
A
A
CE  
A
A
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
B
C
D
E
F
G
H
J
17  
18  
19  
20  
21  
22  
23  
18  
17  
CE  
1
16  
15  
1
2
3
4
5
6
7
B
NC  
NC  
B
a
c
2
V
CC  
GND  
GND  
GND  
V
CC  
GND  
V
CC  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
V
CC  
GND  
V
CC  
GND  
GND  
V
CC  
GND  
V
CC  
V
CC  
GND  
V
CC  
GND  
GND  
V
CC  
GND  
GND  
NC  
V
CC  
V
CC  
NC  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
V
CC  
GND  
GND  
GND  
V
CC  
GND  
K
L
24  
25  
26  
27  
28  
8
V
CC  
V
CC  
I/O  
I/O  
9
V
GND  
GND  
V
CC  
M
N
P
CC  
10  
11  
12  
13  
14  
15  
GND  
V
CC  
V
CC  
GND  
I/O  
I/O  
I/O  
I/O  
I/O  
V
CC  
GND  
GND  
V
CC  
I/O  
I/O  
I/O  
A
14  
B
d
NC  
B
b
A
13  
R
T
29  
30  
31  
A
12  
A
A
10  
A
9
11  
WE  
OE  
A
8
A
7
A
6
A
5
U
Figure 2. 119-ball FBGA pinout [3, 4]  
CY62162GE (512K × 32)  
1
2
3
4
5
6
7
I/O  
A
A
A
A
A
I/O  
A
16  
4
3
2
1
0
0
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
A
A
CE  
A
A
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
B
C
D
E
F
G
H
J
17  
18  
19  
18  
17  
1
16  
15  
1
2
3
B
CE  
NC  
NC  
B
c
2
a
V
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
GND  
V
CC  
CC  
GND  
V
V
GND  
20  
21  
22  
23  
CC  
CC  
4
5
6
7
V
GND  
GND  
V
CC  
CC  
GND  
V
V
GND  
CC  
CC  
V
GND  
V
GND  
CC  
CC  
ERR  
GND  
V
V
GND  
NC  
I/O  
CC  
CC  
I/O  
V
GND  
GND  
V
K
L
24  
CC  
CC  
8
I/O  
GND  
V
CC  
V
CC  
GND  
I/O  
I/O  
25  
9
I/O  
V
GND  
GND  
V
M
N
P
26  
CC  
CC  
10  
11  
12  
I/O  
GND  
V
V
GND  
I/O  
I/O  
I/O  
I/O  
I/O  
27  
CC  
CC  
I/O  
V
GND  
GND  
V
28  
CC  
CC  
I/O  
A
B
NC  
B
A
R
T
29  
14  
d
b
13  
13  
14  
15  
I/O  
A
A
A
A
30  
12  
11  
10  
9
WE  
OE  
I/O  
A
A
A
A
U
31  
8
7
6
5
Notes  
3. NC pins are not connected internally to the die.  
4. ERR is an Output pin. If not used, this pin should be left floating.  
Document Number: 001-81598 Rev. *F  
Page 5 of 20  
CY62162G/CY62162GE MoBL  
Output current into outputs (LOW) ............................. 20 mA  
Maximum Ratings  
Static discharge voltage  
(per MIL-STD-883, method 3015) ......................... > 2001 V  
Exceeding maximum ratings may impair the useful life of the  
device. These user guidelines are not tested.  
Latch-up current ....................................................> 140 mA  
Storage temperature ................................ –65 °C to +150 °C  
Operating Range  
Ambient temperature  
with power applied ................................... –55 °C to +125 °C  
Ambient  
Temperature  
[7]  
Device  
Range  
VCC  
Supply voltage to ground potential .....0.5 V to VCC + 0.5 V  
DC voltage applied to outputs  
CY62162G  
Industrial –40°Cto+85°C 1.65 V to 2.2 V,  
2.2 V to 3.6 V  
in high Z State[6] .................................0.5 V to VCC + 0.5 V  
DC input voltage [6] ..............................0.5 V to VCC+ 0.5 V  
Electrical Characteristics  
Over the Operating Range  
Parameter  
Description  
Output HIGH  
Test Conditions  
Min  
1.4  
2.0  
2.2  
Typ [8]  
Max  
Unit  
VOH  
1.65 V to 2.2 V VCC = Min, IOH = –0.1 mA  
V
voltage  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
V
CC = Min, IOH = –1.0 mA  
CC = Min, IOH = –4.0 mA  
V
VOL  
VIH  
VIL  
Output LOW  
voltage  
1.65 V to 2.2 V VCC = Min, IOL = 0.1 mA  
0.2  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
V
CC = Min, IOL = 2 mA  
CC = Min, IOL = 8 mA  
0.4  
V
0.4  
Input HIGH  
voltage  
1.65 V to 2.2 V –  
1.4  
2.0  
2.0  
–0.2  
–0.3  
–0.3  
–1.0  
–1.0  
VCC + 0.2  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
V
CC + 0.3  
CC + 0.3  
0.4  
V
Input LOW  
voltage [6]  
1.65 V to 2.2 V –  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
0.6  
0.8  
IIX  
Input leakage current  
GND < VIN < VCC  
+1.0  
+1.0  
36.0  
32.0  
9.0  
A  
IOZ  
ICC  
Output leakage current  
VCC operating supply current  
GND < VOUT < VCC, Output disabled  
f = 22.22 MHz (45 ns)  
f = 18.18 MHz (55 ns)  
f = 1 MHz  
VCC = VCC(max)  
OUT = 0 mA  
CMOS levels  
,
29.0  
29.0  
7.0  
5.5  
mA  
I
[9]  
ISB1  
Automatic power down current – CE1 > VCC – 0.2 V or CE2 < 0.2 V  
CMOS inputs; VCC = 2.2 to 3.6 V  
16.0  
A  
or BA–D > VCC – 0.2 V,  
VIN > VCC – 0.2 V, VIN < 0.2 V,  
f = fmax (address and data only),  
Automatic power down current –  
CMOS inputs; VCC = 1.65 to 2.2 V  
7.0  
26.0  
f = 0 (OE, and WE), VCC = VCC(max)  
[9]  
ISB2  
Automatic power down current – CE1 > VCC – 0.2V or CE2 < 0.2 V  
CMOS inputs; VCC = 2.2 to 3.6 V or BA–D > VCC – 0.2 V,  
5.5  
7.0  
16.0  
26.0  
VIN > VCC – 0.2 V or VIN < 0.2 V,  
Automatic power down current –  
CMOS inputs; VCC = 1.65 to 2.2 V  
f = 0, VCC = VCC(max)  
Notes  
5. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = 1.8 V (for V range of 1.65 V–2.2 V), V = 3 V  
CC  
CC  
CC  
(for V range of 2.2 V–3.6 V), T = 25 °C.  
CC  
A
6.  
V
= –2.0 V and V  
= V + 2 V for pulse durations of less than 2 ns.  
IL(min)  
IH(max) CC  
7. Full device AC operation assumes a 100-µs ramp time from 0 to V (min) and 200-µs wait time after V stabilizes to its operational value.  
CC  
CC  
8. Indicates the value for the center of distribution at 3.0 V, 25 °C and not 100% tested.  
9. Chip enables (CE and CE ) must be tied to CMOS levels to meet the I /I /I spec. Other inputs can be left floating.  
1
2
SB1 SB2 CCDR  
Document Number: 001-81598 Rev. *F  
Page 6 of 20  
CY62162G/CY62162GE MoBL  
Capacitance  
Parameter [10]  
Description  
Input capacitance  
Output capacitance  
Test Conditions  
Max  
Unit  
CIN  
TA = 25 °C, f = 1 MHz, VCC = VCC(typ)  
10  
pF  
COUT  
Thermal Resistance  
Parameter [10]  
Description  
Test Conditions  
119-ball BGA Unit  
JA  
Thermal resistance  
(junction to ambient)  
Still air, soldered on a 3 × 4.5 inch, 2-layer printed circuit  
board  
20.92  
C/W  
JC  
Thermal resistance  
(junction to case)  
15.84  
AC Test Loads and Waveforms  
Figure 3. AC Test Loads and Waveforms  
ALL INPUT PULSES  
VCC  
90%  
90%  
R1  
VCC  
OUTPUT  
10%  
10%  
Fall Time = 1 V/ns  
GND  
R2  
30 pF  
Rise Time = 1 V/ns  
INCLUDING  
JIG AND  
SCOPE  
Equivalent to: THEVENIN EQUIVALENT  
RTH  
OUTPUT  
VTH  
Table 1. AC Test Loads  
Parameter  
R1  
1.8 V  
13500  
10800  
6000  
0.8  
2.5 V  
16667  
15385  
8000  
1.2  
3.0 V  
1103  
1554  
645  
Unit  
R2  
RTH  
VTH  
1.75  
V
Note  
10. Tested initially and after any design or process changes that may affect these parameters.  
Document Number: 001-81598 Rev. *F  
Page 7 of 20  
CY62162G/CY62162GE MoBL  
Data Retention Characteristics  
Over the Operating Range  
Parameter  
VDR  
ICCDR  
Description  
VCC for data retention  
Data retention current  
Conditions  
Min  
1.0  
Typ [11]  
Max  
Unit  
V
[12, 13]  
1.0 V < VCC < 2.2 V,  
CE1 > VCC 0.2 V or CE2 < 0.2 V or  
A–D > VCC – 0.2 V,  
7.0  
26.0  
A  
B
VIN > VCC 0.2 V or VIN < 0.2 V  
2.2 V < VCC < 3.6 V,  
5.5  
16.0  
CE1 > VCC 0.2 V or CE2 < 0.2 V or  
BA–D > VCC – 0.2 V,  
VIN > VCC 0.2 V or VIN < 0.2 V  
[14]  
tCDR  
Chip deselect to data retention  
time  
0
ns  
[14, 15]  
tR  
Operation recovery time  
45 / 55  
Data Retention Waveform  
Figure 4. Data Retention Waveform  
D A T A R E T E N T IO N M O D E  
V C C  
V D R = 1 .0 V  
V C C (m in )  
tC D R  
V C C (m in )  
t R  
C E 1  
(o r )  
C E 2  
Notes  
11. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = 1.8 V for the range 1.7 V to 2.2 V; 3 V for the  
CC  
range 2.2 V to 3.6 V, T = 25 °C.  
A
12. Only chip enables (CE and CE ) and all byte enables (B ) need to be tied to CMOS levels to meet the I  
/I  
spec. Other inputs can be left floating.  
1
2
A-D  
SB2 CCDR  
13. B  
is the AND of B , B , B and B . Chip is deselected by either disabling the chip enable signals or by disabling all byte enables together.  
A B C D  
A-D  
14. These parameters are guaranteed by design and are not tested.  
15. Full device operation requires linear V ramp from V to V  
> 100 s or stable at V > 100 s.  
CC(min)  
CC  
DR  
CC(min)  
Document Number: 001-81598 Rev. *F  
Page 8 of 20  
CY62162G/CY62162GE MoBL  
Switching Characteristics  
Over the Operating Range  
45 ns  
55 ns  
Parameter [16, 17]  
Description  
Unit  
Min  
Max  
Min  
Max  
Read Cycle  
tRC  
Read cycle time  
45.0  
55.0  
ns  
tAA  
Address to data/ERR valid  
45.0  
55.0  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
Data/ERR hold from address change  
CE1 LOW and CE2 HIGH to data/ERR valid  
OE LOW to data/ERR valid  
OE LOW to low Z [17, 18]  
OE HIGH to high Z [17, 18, 19]  
CE1 LOW and CE2 HIGH to low Z [17, 18]  
CE1 HIGH and CE2 LOW to high Z [17, 18, 19]  
CE1 LOW and CE2 HIGH to power-up [20]  
CE1 HIGH and CE2 LOW to power-down [20]  
Byte enable LOW to data valid  
10  
10.0  
45.0  
22.0  
55.0  
25.0  
5.0  
5.0  
18.0  
18.0  
10.0  
10.0  
18.0  
18.0  
0
0
tPD  
45.0  
45.0  
55.0  
55.0  
tDBE  
tLZBE  
tHZBE  
Byte enable LOW to low Z [17]  
Byte enable HIGH to high Z [17, 19]  
5.0  
5.0  
18.0  
18.0  
Write Cycle [21, 22]  
tWC Write cycle time  
tSCE  
tAW  
45.0  
35.0  
35.0  
0
55.0  
40.0  
40.0  
0
ns  
CE1 LOW and CE2 HIGH to write end  
Address setup to write end  
Address hold from write end  
Address setup to write start  
WE pulse width  
tHA  
tSA  
0
0
tPWE  
tBW  
35.0  
35.0  
25.0  
0
40.0  
40.0  
25.0  
0
Byte enable LOW to write end  
Data setup to write end  
tSD  
tHD  
Data hold from write end  
WE LOW to high Z [17, 18, 19]  
WE HIGH to low Z [17, 18]  
tHZWE  
tLZWE  
18.0  
20.0  
10.0  
10.0  
Notes  
16. Test conditions for all parameters other than tri-state parameters assume signal transition time of 1 V/ns, timing reference levels of V , input pulse levels of 0 to  
TH  
V
, and output loading of the specified I /I as shown in Table 1 on page 7.  
CC(typ)  
OL OH  
17. At any temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
LZWE  
HZCE  
LZCE HZBE  
LZBE HZOE  
LZOE  
HZWE  
18. Tested initially and after any design or process changes that may affect these parameters.  
19. t , t , t , and t transitions are measured when the outputs enter a high impedence state.  
HZOE HZCE HZBE  
HZWE  
20. These parameters are guaranteed by design and are not tested.  
21. The internal write time of the memory is defined by the overlap of CE and WE LOW. Chip enable must be active and WE and byte enables must be LOW to initiate a  
write, and the transition of any of these signals terminate the write. The input data setup and hold timing are referenced to the leading edge of the signal that terminates  
the write.  
22. The minimum write cycle pulse width for Write Cycle No. 2 (WE Controlled, OE LOW) should be equal to sum of t  
and t  
.
HZWE  
SD  
Document Number: 001-81598 Rev. *F  
Page 9 of 20  
CY62162G/CY62162GE MoBL  
Switching Waveforms  
Figure 5. Read Cycle No. 1 of CY62162G (Address Transition Controlled) [23, 24]  
tRC  
ADDRESS  
DATA I/O  
tAA  
tOHA  
PREVIOUS DATAOUT  
VALID  
DATAOUT VALID  
Figure 6. Read Cycle No. 1 of CY62162GE (Address Transition Controlled) [23, 24]  
tRC  
ADDRESS  
tAA  
tOHA  
DATA I/O  
ERR  
PREVIOUS DATAOUT VALID  
DATAOUT VALID  
ERR VALID  
tAA  
tOHA  
PREVIOUS ERR VALID  
Notes  
23. Device is continuously selected. OE = V , CE = V .  
IL  
IL  
24. WE is HIGH for read cycle.  
Document Number: 001-81598 Rev. *F  
Page 10 of 20  
CY62162G/CY62162GE MoBL  
Switching Waveforms (continued)  
Figure 7. Read Cycle No. 2 (OE Controlled) [25, 26, 27]  
ADDRESS  
tRC  
CE  
tPD  
tHZCE  
tACE  
OE  
tHZOE  
tDOE  
tLZOE  
BA-D  
tDBE  
tLZBE  
tHZBE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
tLZCE  
tPU  
DATA I/O  
DATAOUT VALID  
VCC  
SUPPLY  
CURRENT  
ISB  
Notes  
25. WE is HIGH for read cycle.  
26. Address valid before or similar to CE transition LOW.  
27. CE refers to a combination of CE and CE . CE is LOW when CE is LOW and CE is HIGH. CE is HIGH when CE is HIGH or CE is LOW.  
1
2
1
2
1
2
Document Number: 001-81598 Rev. *F  
Page 11 of 20  
CY62162G/CY62162GE MoBL  
Switching Waveforms (continued)  
Figure 8. Write Cycle No. 1 (CE Controlled) [28, 29, 30, 31]  
tWC  
ADDRESS  
tSA  
tSCE  
CE  
tAW  
tHA  
tPWE  
WE  
tBW  
BA-D  
OE  
tHZOE  
tHD  
tSD  
NOTE 32  
DATA I/O  
DATAIN VALID  
Notes  
28. The internal write time of the memory is defined by the overlap of CE and WE LOW. Chip enable must be active and WE and byte enables must be LOW to initiate a  
write, and the transition of any of these signals terminate the write. The input data setup and hold timing are referenced to the leading edge of the signal that terminates  
the write.  
29. Data I/O is high impedance if OE or B , B , B , B = V .  
A
B
C
D
IH  
30. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.  
31. CE refers to a combination of CE and CE . CE is LOW when CE is LOW and CE is HIGH. CE is HIGH when CE is HIGH or CE is LOW.  
1
2
1
2
1
2
32. During this period the I/Os are in output state and input signals should not be applied.  
Document Number: 001-81598 Rev. *F  
Page 12 of 20  
CY62162G/CY62162GE MoBL  
Switching Waveforms (continued)  
[33, 34, 35]  
Figure 9. Write Cycle No. 2 (WE Controlled, OE LOW)  
tWC  
ADDRESS  
tSCE  
CE  
tBW  
BA-D  
tAW  
tHA  
tSA  
tPWE  
WE  
tLZWE  
tSD  
t
HZWE  
tHD  
NOTE 36  
DATA I/O  
DATAIN VALID  
[33, 34]  
Figure 10. Write Cycle No. 3 (BA, BB, BC, BD Controlled, OE LOW)  
tWC  
ADDRESS  
tSCE  
CE  
tAW  
tSA  
tHA  
tBW  
BA-D  
tPWE  
WE  
tHZWE  
tHD  
tSD  
tLZWE  
NOTE 36  
DATA I/O  
DATAIN VALID  
Notes  
33. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.  
34. CE refers to a combination of CE and CE . CE is LOW when CE is LOW and CE is HIGH. CE is HIGH when CE is HIGH or CE is LOW.  
1
2
1
2
1
2
35. The minimum write cycle pulse width should be equal to the sum of t  
and t  
.
HZWE  
SD  
36. During this period the I/Os are in output state and input signals should not be applied.  
Document Number: 001-81598 Rev. *F  
Page 13 of 20  
CY62162G/CY62162GE MoBL  
Truth Table – CY62162G/CY62162GE  
[37]  
CE  
OE WE BA BB BC BD I/O0–I/O7 I/O8–I/O15 I/O16–I/O23 I/O24–I/O31  
Mode  
Power  
[38]  
[38]  
[38]  
[38]  
H
X
X
L
X
X
H
H
H
H
H
L
X
X
X
X
High Z  
High Z  
Data out  
Data out  
High Z  
High Z  
High Z  
Data in  
Data in  
High Z  
High Z  
High Z  
High Z  
High Z  
High Z  
Data out  
High Z  
Data out  
High Z  
High Z  
Data in  
High Z  
Data in  
High Z  
High Z  
High Z  
High Z  
High Z  
Data out  
High Z  
High Z  
Data out  
High Z  
Data in  
High Z  
High Z  
Data in  
High Z  
High Z  
High Z  
High Z  
Standby  
Standby  
(I  
(I  
)
)
SB  
SB  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
[38]  
X
H
L
H
L
H
L
H
L
L
L
L
L
L
L
L
L
L
L
L
Data out Read all bits  
(I  
(I  
(I  
(I  
(I  
(I  
(I  
(I  
(I  
(I  
)
)
)
)
)
)
)
)
)
)
)
L
L
H
L
H
H
L
H
H
H
L
High Z  
High Z  
High Z  
Read byte A bits only  
L
H
H
H
L
Read byte B bits only  
Read byte C bits only  
L
H
H
L
L
H
L
Data out Read byte D bits only  
X
X
X
X
X
H
L
Data in  
High Z  
High Z  
High Z  
Data in  
High Z  
Write all bits  
L
L
H
L
H
H
L
H
H
H
Write byte A bits only  
Write byte B bits only  
Write byte C bits only  
Write byte D bits only  
L
H
H
L
H
L
H
H
H
L
[38]  
[38]  
[38]  
[38]  
H
X
X
X
X
Selected, outputs disabled (I  
ERR Output – CY62162GE  
[39]  
Output  
Mode  
0
1
Z
Read Operation, no single bit error in the stored data.  
Read Operation, single bit error detected and corrected.  
Device deselected / Outputs disabled / Write Operation.  
Note  
37. CE refers to a combination of CE and CE . CE is LOW when CE is LOW and CE is HIGH. CE is HIGH when CE is HIGH or CE is LOW.  
1
2
1
2
1
2
38. ‘X’ refers to V or V . For CMOS voltage levels refer to I  
test conditions in Electrical Characteristics on page 6. Chip enables (CE and CE ) and all Byte Enables  
IL  
IH  
SB2  
/I  
1 2  
(B ) must be in CMOS voltage levels to meet the I  
spec.  
A-D  
SB2 CCDR  
39. ERR is an Output pin. If not used, this pin should be left floating.  
Document Number: 001-81598 Rev. *F  
Page 14 of 20  
CY62162G/CY62162GE MoBL  
Ordering Information  
Speed  
(ns)  
Voltage  
Range  
Package  
Diagram  
Package Type  
(All Pb-free)  
Operating  
Range  
Ordering Code  
45  
55  
2.2 V–3.6 V CY62162G30-45BGXI  
1.65 V–2.2 V CY62162G18-55BGXI  
51-85115 119-ball PBGA (14 × 22 × 2.4 mm)  
Industrial  
Industrial  
Ordering Code Definitions  
G
E
CY 621 6  
2
BG  
X I  
XX 45  
Temperature Grade: I = Industrial  
Pb-free  
Package Type: BG = 119-ball PBGA  
Speed grade XX: 45 = 45 ns, 55 = 55 ns  
Voltage Range: 30 = 3.3 V typ, 18 = 1.8 V typ  
E = ECC flag  
Process Technology: G = 65 nm  
Bus Width: 2 = × 32  
Density: 6 = 16-Mbit  
Family Code: 621 = MoBL SRAM family  
Company ID: CY = Cypress  
Document Number: 001-81598 Rev. *F  
Page 15 of 20  
CY62162G/CY62162GE MoBL  
Package Diagram  
Figure 11. 119-ball PBGA (14 × 22 × 2.4 mm) Package Outline, 51-85115  
51-85115 *D  
Document Number: 001-81598 Rev. *F  
Page 16 of 20  
CY62162G/CY62162GE MoBL  
Acronyms  
Document Conventions  
Units of Measure  
Symbol  
Acronym  
Description  
CE  
Chip Enable  
Unit of Measure  
CMOS  
FBGA  
I/O  
Complementary Metal Oxide Semiconductor  
Fine-Pitch Ball Grid Array  
Input/Output  
°C  
mA  
MHz  
mm  
µA  
µs  
ns  
degree Celsius  
milliampere  
megahertz  
millimeter  
microampere  
microsecond  
nanosecond  
ohm  
OE  
Output Enable  
SRAM  
WE  
Static Random Access Memory  
Write Enable  
%
percent  
pF  
V
picofarad  
volt  
W
watt  
Document Number: 001-81598 Rev. *F  
Page 17 of 20  
CY62162G/CY62162GE MoBL  
Document History Page  
Document Title: CY62162G/CY62162GE MoBL, 16-Mbit (512K × 32) Static RAM with Error-Correcting Code (ECC)  
Document Number: 001-81598  
Submission  
Revision  
ECN  
Description of Change  
Date  
*C  
4863821  
07/31/2015 Changed status from Preliminary to Final.  
*D  
*E  
6012120  
6674948  
01/03/2018 Updated Cypress Logo and Copyright.  
09/27/2019 Updated Product Portfolio:  
Added Note “This device is offered with improved I , I  
and I  
specifications compared  
CC SB1  
SB2  
to the current revision with same marketing part number. The new device will be in  
production from WW1952. For more information, please contact Cypress sales  
representative.” and referred the same note in “CY62162G(E)30” under “Product” column.  
Added Note “For next version of this device, kindly refer here. Further details about  
improvement and comparison between current and new versions can be found in the  
PCN193805.” and referred the same note in “CY62162G(E)30” under “Product” column.  
Updated Pin Configurations:  
Updated Figure 1.  
Updated Figure 2.  
Updated Electrical Characteristics:  
Added Note “This device is offered with improved I , I  
and I  
specifications compared  
CC SB1  
SB2  
to the current revision with same marketing part number. The new device will be in  
production from WW1952. For more information, please contact Cypress sales  
representative.” and referred the same note in I , I  
, I  
parameters.  
CC SB1 SB2  
Added Note “For next version of this device, kindly refer here. Further details about  
improvement and comparison between current and new versions can be found in the  
PCN193805.” and referred the same note in I , I  
, I  
parameters.  
CC SB1 SB2  
Updated Data Retention Characteristics:  
Added Note “This device is offered with improved I , I  
and I  
specifications compared  
CC SB1  
SB2  
to the current revision with same marketing part number. The new device will be in  
production from WW1952. For more information, please contact Cypress sales  
representative.” and referred the same note in I  
parameter.  
CCDR  
Added Note “For next version of this device, kindly refer here. Further details about  
improvement and comparison between current and new versions can be found in the  
PCN193805.” and referred the same note in I  
Updated to new template.  
parameter.  
CCDR  
Completing Sunset Review.  
*F  
6822780  
03/02/2020 Updated Product Portfolio:  
Removed Note “This device is offered with improved I , I  
and I  
specifications  
SB2  
CC SB1  
compared to the current revision with same marketing part number. The new device will be  
in production from WW1952. For more information, please contact Cypress sales  
representative.” and its reference in “CY62162G(E)30” under “Product” column.  
Removed Note “For next version of this device, kindly refer here. Further details about  
improvement and comparison between current and new versions can be found in the  
PCN193805.” and its reference in “CY62162G(E)30” under “Product” column.  
Updated Electrical Characteristics:  
Removed Note “This device is offered with improved I , I  
and I  
specifications  
CC SB1  
SB2  
compared to the current revision with same marketing part number. The new device will be  
in production from WW1952. For more information, please contact Cypress sales  
representative.” and its reference in I , I  
, I  
parameters.  
CC SB1 SB2  
Removed Note “For next version of this device, kindly refer here. Further details about  
improvement and comparison between current and new versions can be found in the  
PCN193805.” and its reference in I , I  
, I  
parameters.  
CC SB1 SB2  
Document Number: 001-81598 Rev. *F  
Page 18 of 20  
CY62162G/CY62162GE MoBL  
Document History Page (continued)  
Document Title: CY62162G/CY62162GE MoBL, 16-Mbit (512K × 32) Static RAM with Error-Correcting Code (ECC)  
Document Number: 001-81598  
Submission  
Revision  
ECN  
Description of Change  
Date  
*F (cont.)  
6822780  
03/02/2020 Updated Data Retention Characteristics:  
Removed Note “This device is offered with improved I , I  
and I  
specifications  
SB2  
CC SB1  
compared to the current revision with same marketing part number. The new device will be  
in production from WW1952. For more information, please contact Cypress sales  
representative.” and its reference in I  
parameter.  
CCDR  
Removed Note “For next version of this device, kindly refer here. Further details about  
improvement and comparison between current and new versions can be found in the  
PCN193805.” and its reference in I  
Updated to new template.  
parameter.  
CCDR  
Document Number: 001-81598 Rev. *F  
Page 19 of 20  
CY62162G/CY62162GE MoBL  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
®
Products  
PSoC Solutions  
®
®
Arm Cortex Microcontrollers  
Automotive  
cypress.com/arm  
cypress.com/automotive  
cypress.com/clocks  
cypress.com/interface  
cypress.com/iot  
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP | PSoC 6 MCU  
Cypress Developer Community  
Clocks & Buffers  
Interface  
Community | Code Examples | Projects | Video | Blogs |  
Training | Components  
Internet of Things  
Memory  
Technical Support  
cypress.com/memory  
cypress.com/mcu  
cypress.com/support  
Microcontrollers  
PSoC  
cypress.com/psoc  
Power Management ICs  
Touch Sensing  
USB Controllers  
Wireless Connectivity  
cypress.com/pmic  
cypress.com/touch  
cypress.com/usb  
cypress.com/wireless  
© Cypress Semiconductor Corporation, 2012–2020. This document is the property of Cypress Semiconductor Corporation and its subsidiaries (“Cypress”). This document, including any software or  
firmware included or referenced in this document (“Software”), is owned by Cypress under the intellectual property laws and treaties of the United States and other countries worldwide. Cypress  
reserves all rights under such laws and treaties and does not, except as specifically stated in this paragraph, grant any license under its patents, copyrights, trademarks, or other intellectual property  
rights. If the Software is not accompanied by a license agreement and you do not otherwise have a written agreement with Cypress governing the use of the Software, then Cypress hereby grants  
you a personal, non-exclusive, nontransferable license (without the right to sublicense) (1) under its copyright rights in the Software (a) for Software provided in source code form, to modify and reproduce  
the Software solely for use with Cypress hardware products, only internally within your organization, and (b) to distribute the Software in binary code form externally to end users (either directly or  
indirectly through resellers and distributors), solely for use on Cypress hardware product units, and (2) under those claims of Cypress’s patents that are infringed by the Software (as provided by  
Cypress, unmodified) to make, use, distribute, and import the Software solely for use with Cypress hardware products. Any other use, reproduction, modification, translation, or compilation of the  
Software is prohibited.  
TO THE EXTENT PERMITTED BY APPLICABLE LAW, CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS DOCUMENT OR ANY SOFTWARE  
OR ACCOMPANYING HARDWARE, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. No computing  
device can be absolutely secure. Therefore, despite security measures implemented in Cypress hardware or software products, Cypress shall have no liability arising out of any security breach, such  
as unauthorized access to or use of a Cypress product. CYPRESS DOES NOT REPRESENT, WARRANT, OR GUARANTEE THAT CYPRESS PRODUCTS, OR SYSTEMS CREATED USING  
CYPRESS PRODUCTS, WILL BE FREE FROM CORRUPTION, ATTACK, VIRUSES, INTERFERENCE, HACKING, DATA LOSS OR THEFT, OR OTHER SECURITY INTRUSION (collectively, “Security  
Breach”). Cypress disclaims any liability relating to any Security Breach, and you shall and hereby do release Cypress from any claim, damage, or other liability arising from any Security Breach. In  
addition, the products described in these materials may contain design defects or errors known as errata which may cause the product to deviate from published specifications. To the extent permitted  
by applicable law, Cypress reserves the right to make changes to this document without further notice. Cypress does not assume any liability arising out of the application or use of any product or  
circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is the  
responsibility of the user of this document to properly design, program, and test the functionality and safety of any application made of this information and any resulting product. “High-Risk Device”  
means any device or system whose failure could cause personal injury, death, or property damage. Examples of High-Risk Devices are weapons, nuclear installations, surgical implants, and other  
medical devices. “Critical Component” means any component of a High-Risk Device whose failure to perform can be reasonably expected to cause, directly or indirectly, the failure of the High-Risk  
Device, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim, damage, or other liability arising from any use of  
a Cypress product as a Critical Component in a High-Risk Device. You shall indemnify and hold Cypress, its directors, officers, employees, agents, affiliates, distributors, and assigns harmless from  
and against all claims, costs, damages, and expenses, arising out of any claim, including claims for product liability, personal injury or death, or property damage arising from any use of a Cypress  
product as a Critical Component in a High-Risk Device. Cypress products are not intended or authorized for use as a Critical Component in any High-Risk Device except to the limited extent that (i)  
Cypress’s published data sheet for the product explicitly states Cypress has qualified the product for use in a specific High-Risk Device, or (ii) Cypress has given you advance written authorization to  
use the product as a Critical Component in the specific High-Risk Device and you have signed a separate indemnification agreement.  
Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, WICED, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in  
the United States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners.  
Document Number: 001-81598 Rev. *F  
Revised March 2, 2020  
Page 20 of 20  

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