CY62167G30-45BVXAT [INFINEON]

Asynchronous SRAM;
CY62167G30-45BVXAT
型号: CY62167G30-45BVXAT
厂家: Infineon    Infineon
描述:

Asynchronous SRAM

静态存储器
文件: 总19页 (文件大小:519K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CY62167G Automotive  
16-Mbit (1M Words × 16-Bit) Static RAM  
with Error-Correcting Code (ECC)  
16-Mbit (1M Words  
× 16-Bit) Static RAM with Error-Correcting Code (ECC)  
Data writes are performed by asserting the Write Enable input  
(WE) LOW, and providing the data and address on device data  
(I/O0 through I/O15) and address (A0 through A19) pins  
respectively. The Byte High/Low Enable (BHE, BLE) inputs  
control byte writes, and write data on the corresponding I/O lines  
Features  
AEC-Q100 qualified  
Ultra-low standby power  
Typical standby current: 5.5 A  
Maximum standby current: 75 A  
to the memory location specified. BHE controls I/O8 through  
I/O15; BLE controls I/O0 through I/O7.  
High speed: 45 ns / 55 ns  
Data reads are performed by asserting the Output Enable (OE)  
input and providing the required address on the address lines.  
Read data is accessible on I/O lines (I/O0 through I/O15). Byte  
accesses can be performed by asserting the required byte  
enable signal (BHE, BLE) to read either the upper byte or the  
lower byte of data from the specified address location.  
Embedded error-correcting code (ECC) for single-bit error  
correction  
Temperature Ranges:  
Automotive-A: -40 C to +85 C  
Automotive-E: -40 C to +125 C  
All I/Os (I/O0 through I/O15) are placed in a HI-Z state when the  
device is deselected (CE1 HIGH / CE2 LOW for dual chip-enable  
Operating voltage range: 2.2 V to 3.6 V  
1.0-V data retention  
device), or control signals are de-asserted (OE, BLE, and BHE).  
These devices also have a unique “Byte Power down” feature  
TTL-compatible inputs and outputs  
where if both the Byte Enables (BHE and BLE) are disabled, the  
devices seamlessly switches to standby mode irrespective of the  
state of the chip enable(s), thereby saving power.  
Available in Pb-free 48-ball VFBGA and 48-pin TSOP I  
packages  
The CY62167G device is available in a Pb-free 48-ball VFBGA  
and 48-pin TSOP I packages. The device in the 48-pin TSOP I  
package can also be configured to function as a 2M words × 8  
bit device.The logic block diagram is on page 2. Refer to Pin  
Configurations on page 4 and the associated footnotes for  
details.  
Functional Description  
CY62167G is high-performance CMOS low-power (MoBL)  
SRAM devices with embedded ECC. This device is offered in  
dual chip-enable.  
Devices with dual chip-enable are accessed by asserting both  
chip-enable inputs – CE1 as LOW and CE2 as HIGH.  
Note  
1. This device does not support automatic write-back on error detection.  
Cypress Semiconductor Corporation  
Document Number: 001-84902 Rev. *F  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised May 3, 2017  
CY62167G Automotive  
Logic Block Diagram – CY62167G  
ECC ENCODE  
DATAIN DRIVERS  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
1M x 16 /  
2M x 8  
RAM ARRAY  
I/O0-I/O7  
I/O8-I/O15  
COLUMN DECODER  
CE  
BYTE  
BHE  
POWER DOWN  
CIRCUIT  
BHE  
BLE  
WE  
CE2  
CE1  
OE  
BLE  
Document Number: 001-84902 Rev. *F  
Page 2 of 19  
CY62167G Automotive  
Contents  
Pin Configurations ...........................................................4  
Product Portfolio ..............................................................4  
Maximum Ratings .............................................................5  
Operating Range ...............................................................5  
DC Electrical Characteristics ..........................................5  
Capacitance ......................................................................6  
Thermal Resistance ..........................................................6  
AC Test Loads and Waveforms .......................................6  
Data Retention Characteristics .......................................7  
Data Retention Waveform ................................................7  
Switching Characteristics ................................................8  
Switching Waveforms ......................................................9  
Truth Table – CY62167G ................................................13  
Ordering Information ......................................................14  
Ordering Code Definitions .........................................14  
Package Diagram ............................................................15  
Acronyms ........................................................................17  
Document Conventions .................................................17  
Units of Measure .......................................................17  
Document History Page .................................................18  
Sales, Solutions, and Legal Information ......................19  
Worldwide Sales and Design Support .......................19  
Products ....................................................................19  
PSoC® Solutions ......................................................19  
Cypress Developer Community .................................19  
Technical Support .....................................................19  
Document Number: 001-84902 Rev. *F  
Page 3 of 19  
CY62167G Automotive  
Pin Configurations  
Figure 1. 48-ball VFBGA pinout [2]  
CY62167G  
1
2
4
3
A0  
A3  
5
6
A1  
A2  
CE2  
OE  
BLE  
A
B
C
A
4
I/O BHE  
8
CE1 I/O  
0
A
5
A
6
I/O I/O  
I/O  
I/O  
9
10  
1
2
VCC  
A
7
V
I/O  
I/O  
3
A17  
NC  
D
E
F
SS  
11  
Vss  
A
V
CC  
I/O  
I/O  
16  
12  
4
A
A
15  
I/O  
I/O  
I/O  
I/O  
6
14  
13  
5
14  
A
A
G
H
I/O  
A19  
WE I/O  
7
13  
12  
15  
A
A
9
A
11  
A
NC  
A18  
10  
8
Figure 2. 48-pin TSOP I pinout (Dual Chip Enable without ERR) – CY62167G [2, 3]  
A15  
A14  
A13  
A12  
A11  
A10  
A9  
A8  
A19  
NC  
1
2
3
4
5
6
7
8
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
A16  
BYTE  
Vss  
I/O15/A20  
I/O7  
I/O14  
I/O6  
I/O13  
I/O5  
I/O12  
I/O4  
Vcc  
I/O11  
I/O3  
I/O10  
I/O2  
I/O9  
I/O1  
I/O8  
I/O0  
OE  
Vss  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
WE  
CE  
2
NC  
BHE  
BLE  
A18  
A17  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
CE  
1
A0  
Product Portfolio  
Power Dissipation  
Operating ICC, (mA), f = fmax Standby, ISB2 (µA)  
Speed  
(ns)  
Product  
Range  
VCC Range (V)  
Typ [4]  
Max  
40.0  
36.0  
Typ [4]  
Max  
75.0  
16.0  
CY62167G30  
Automotive-E  
Automotive-A  
2.2 V–3.6 V  
55  
45  
29.0  
5.5  
29.0  
5.5  
Notes  
2. NC pins are not connected internally to the die and are typically used for address expansion to a higher-density device. Refer to the respective datasheets for pin  
configuration.  
3. The BYTE pin in the 48-pin TSOP I package must be tied to V to use the device as a 1M × 16 SRAM. The 48-pin TSOP I package can also be used as a 2M × 8  
CC  
SRAM by tying the BYTE signal to V . In the 2 M × 8 configuration, pin 45 is A20, while BHE, BLE and I/O to I/O pins are not used.  
SS  
8
14  
4. Indicates the value for the center of Distribution at 3.0 V, 25 °C and not 100% tested.  
Document Number: 001-84902 Rev. *F  
Page 4 of 19  
CY62167G Automotive  
Output current into outputs (LOW) ............................. 20 mA  
Maximum Ratings  
Static discharge voltage  
(MIL-STD-883, Method 3015) ................................. >2001 V  
Exceeding maximum ratings may shorten the useful life of the  
device. User guidelines are not tested.  
Latch-up current .....................................................>140 mA  
Storage temperature ............................... –65 °C to + 150 °C  
Ambient temperature  
with power applied .................................. –55 °C to + 125 °C  
Operating Range  
Grade  
Ambient Temperature  
–40 C to +125 C  
–40 C to +85 C  
VCC  
Supply voltage  
to ground potential [5] .......................... –0.5 V to VCC + 0.5 V  
Automotive-E  
Automotive-A  
2.2 V to 3.6 V  
DC voltage applied to outputs  
in HI-Z state [5] .................................... –0.5 V to VCC + 0.5 V  
DC input voltage [5] ............................. –0.5 V to VCC + 0.5 V  
DC Electrical Characteristics  
Over the Operating Range  
55 ns (Automotive-E) 45 ns (Automotive-A)  
Parameter  
Description  
Test Conditions  
Unit  
Min Typ [6]  
Max  
Min Typ [6]  
Max  
VOH  
Output HIGH 2.2 V to 2.7 V VCC = Min, IOH = –0.1 mA  
2.0  
2.4  
2.0  
2.4  
V
voltage  
2.7 V to 3.6 V VCC = Min, IOH = –1.0 mA  
VOL  
VIH  
VIL  
Output LOW 2.2 V to 2.7 V VCC = Min, IOL = 0.1 mA  
0.4  
0.4  
0.4  
V
V
V
voltage  
2.7 V to 3.6 V VCC = Min, IOL = 2.1 mA  
0.4  
Input HIGH  
voltage[5]  
2.2 V to 2.7 V –  
2.7 V to 3.6 V –  
2.2 V to 2.7 V –  
2.7 V to 3.6 V –  
1.8  
2.0  
–0.3  
–0.3  
–4.0  
–4.0  
VCC + 0.3 1.8  
CC + 0.3 2.0  
VCC + 0.3  
VCC + 0.3  
0.6  
V
Input LOW  
voltage[5]  
0.6  
0.8  
–0.3  
–0.3  
–1.0  
–1.0  
0.8  
IIX  
Input leakage current  
Output leakage current  
GND < VIN < VCC  
+4.0  
+4.0  
+1.0  
+1.0  
A  
A  
GND < VOUT < VCC, Output  
disabled  
IOZ  
ICC  
VCC operating supply  
current  
VCC = Max,  
OUT = 0 mA,  
CMOS levels  
f = fMAX  
f =1 MHz  
29.0  
7.0  
40.0  
18.0  
29.0  
7.0  
36.0  
9.0  
mA  
mA  
I
[7]  
ISB1  
Automatic power down  
current – CMOS inputs;  
VCC = 2.2 to 3.6 V  
5.5  
75.0  
5.5  
16.0  
A  
CE1 > VCC – 0.2 V or CE2 < 0.2 V  
or (BHE and BLE) > VCC – 0.2 V,  
VIN > VCC – 0.2 V, VIN < 0.2 V,  
f = fmax (address and data only),  
f = 0 (OE, and WE), VCC = VCC(max)  
[7]  
ISB2  
Automatic power down  
current – CMOS inputs;  
VCC = 2.2 to 3.6 V  
5.5  
75.0  
5.5  
16.0  
A  
CE1 > VCC – 0.2V or CE2 < 0.2 V  
or (BHE and BLE) > VCC – 0.2 V,  
VIN > VCC – 0.2 V or VIN < 0.2 V,  
f = 0, VCC = VCC(max)  
Notes  
5.  
6. Indicates the value for the center of Distribution at 3.0 V, 25 °C and not 100% tested.  
7. Chip enables (CE and CE ) and BHE, BLE and BYTE must be tied to CMOS levels to meet the I  
V
= –2.0 V and V  
= V + 2 V for pulse durations of less than 20 ns.  
IL(min)  
IH(max) CC  
/ I  
/ I  
spec. Other inputs can be left floating.  
1
2
SB1 SB2 CCDR  
Document Number: 001-84902 Rev. *F  
Page 5 of 19  
CY62167G Automotive  
Capacitance  
Parameter [8]  
Description  
Input capacitance  
Output capacitance  
Test Conditions  
Max  
10  
Unit  
pF  
CIN  
TA = 25 °C, f = 1 MHz, VCC = VCC(typ)  
COUT  
10  
pF  
Thermal Resistance  
Parameter [8]  
Description  
Test Conditions  
48-ball VFBGA 48-pin TSOP I Unit  
JA  
Thermal resistance  
(junction to ambient)  
Still air, soldered on a 3 × 4.5 inch,  
four-layer printed circuit board  
31.50  
57.99  
°C/W  
JC  
Thermal resistance  
(junction to case)  
15.75  
13.42  
°C/W  
AC Test Loads and Waveforms  
Figure 3. AC Test Loads and Waveforms  
ALL INPUT PULSES  
90%  
10%  
R1  
V
V
CC  
OUTPUT  
HIGH  
90%  
10%  
GND  
Fall Time = 1 V/ns  
R2  
30 pF  
Rise Time = 1 V/ns  
Equivalent to: THÉVENIN EQUIVALENT  
INCLUDING  
JIG AND  
SCOPE  
R
TH  
OUTPUT  
V
Parameters  
3.0 V  
Unit  
R1  
R2  
317  
351  
3.0  
VHIGH  
V
Note  
8. Tested initially and after any design or process changes that may affect these parameters.  
Document Number: 001-84902 Rev. *F  
Page 6 of 19  
CY62167G Automotive  
Data Retention Characteristics  
Over the Operating Range  
55 ns (Automotive-E) 45 ns (Automotive-A) Unit  
Parameter  
VDR  
Description  
Conditions  
Min Typ [9] Max  
Min Typ [9] Max Unit  
VCC for data retention  
Data-retention current  
1
1
V
[10]  
ICCDR  
2.2 V < VCC < 3.6 V  
5.5  
75.0  
5.5  
16.0  
A  
CE1 > VCC 0.2 V or CE2 < 0.2 V  
or (BHE and BLE) > VCC – 0.2 V,  
VIN > VCC 0.2 V or VIN < 0.2 V  
[11]  
tCDR  
Chip deselect to  
data-retention time  
0
0
[12]  
tR  
Operation-recovery time  
55  
45  
ns  
Data Retention Waveform  
Figure 4. Data-Retention Waveform [13]  
DATA RETENTION M ODE  
VCC  
VDR = 1.0 V  
VCC(min)  
tCDR  
VCC(min)  
tR  
CE1 or  
BHE. BLE  
(or)  
CE2  
Notes  
9. Indicates the value for the center of distribution at 3.0 V, 25°C and not 100% tested.  
10. Chip enables (CE and CE ) and BYTE must be tied to CMOS levels to meet the I / I / I spec. Other inputs can be left floating.  
SB1 SB2 CCDR  
1
2
11. Tested initially and after any design or process changes that may affect these parameters.  
12. Full device operation requires linear V ramp from V to V > 100 s or stable at V > 100 s.  
CC(min)  
CC  
DR  
CC(min)  
13. BHE.BLE is the AND of both BHE and BLE. Deselect the chip by either disabling the chip enable signals or by disabling both BHE and BLE.  
Document Number: 001-84902 Rev. *F  
Page 7 of 19  
CY62167G Automotive  
Switching Characteristics  
55 ns (Automotive-E) 45 ns (Automotive-A)  
Unit  
Parameter [14]  
Description  
Min  
Max  
Min  
Max  
Read Cycle  
tRC  
Read cycle time  
55  
55  
45  
45  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
Address to data valid  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
Data hold from address change  
CE1 LOW and CE2 HIGH to data valid / CE LOW  
OE LOW to data valid / OE LOW  
OE LOW to Low Z [15]  
10  
10  
55  
25  
45  
22  
5
5
OE HIGH to High Z [15, 16]  
20  
18  
CE1 LOW and CE2 HIGH to Low Z [15]  
CE1 HIGH and CE2 LOW to High Z [15, 16]  
CE1 LOW and CE2 HIGH to power-up  
CE1 HIGH and CE2 LOW to power-down  
BLE / BHE LOW to data valid  
10  
10  
20  
18  
0
0
tPD  
55  
55  
45  
45  
tDBE  
tLZBE  
tHZBE  
Write Cycle [17]  
tWC  
BLE / BHE LOW to Low Z [15]  
BLE / BHE HIGH to High Z [15, 16]  
5
5
20  
18  
Write cycle time  
55  
40  
40  
0
45  
35  
35  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tSCE  
tAW  
CE1 LOW and CE2 HIGH to write end  
Address setup to write end  
Address hold from write end  
Address setup to write start  
WE pulse width  
tHA  
tSA  
0
0
tPWE  
tBW  
40  
40  
25  
0
35  
35  
25  
0
BLE / BHE LOW to write end  
Data setup to write end  
Data hold from write end  
WE LOW to High Z [15, 16]  
WE HIGH to Low Z [15]  
tSD  
tHD  
tHZWE  
tLZWE  
20  
18  
10  
10  
Notes  
14. Test conditions assume signal transition time (rise/fall) of 3 ns or less, timing reference levels of 1.5 V (for V > 3 V) and V /2 (for V < 3 V), and input pulse  
CC  
CC  
CC  
levels of 0 to 3 V (for V > 3 V) and 0 to V (for V < 3 V). Test conditions for the read cycle use output loading shown in AC Test Loads and Waveforms section, unless  
CC  
CC  
CC  
specified otherwise.  
15. At any temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any device.  
HZCE  
LZCE HZBE  
LZBE HZOE  
LZOE  
HZWE  
LZWE  
16. t  
, t  
, t  
, and t  
transitions are measured when the outputs enter a high impedance state.  
HZOE HZCE HZBE  
HZWE  
17. The internal write time of the memory is defined by the overlap of WE = V , CE = V , BHE or BLE or both = V , and CE = V . All signals must be ACTIVE to initiate  
IL  
1
IL  
IL  
2
IH  
a write. Any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing must refer to the edge of the signal that terminates the write.  
Document Number: 001-84902 Rev. *F  
Page 8 of 19  
CY62167G Automotive  
Switching Waveforms  
Figure 5. Read Cycle No. 1 of CY62167G (Address Transition Controlled) [18, 19]  
tRC  
ADDRESS  
DATA I/O  
tAA  
tOHA  
PREVIOUS DATAOUT  
VALID  
DATAOUT VALID  
Figure 6. Read Cycle No. 2 (OE Controlled) [19, 20, 21]  
ADDRESS  
tRC  
CE  
tPD  
tHZCE  
tACE  
OE  
tHZOE  
tDOE  
tLZOE  
BHE/  
BLE  
tDBE  
tLZBE  
tHZBE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA I/O  
DATAOUT VALID  
tLZCE  
tPU  
VCC  
SUPPLY  
CURRENT  
ISB  
Notes  
18. The device is continuously selected. OE = V , CE = V , BHE or BLE or both = V .  
IL  
IL  
IL  
19. WE is HIGH for read cycle.  
20. For all dual chip enable devices, CE is the logical combination of CE and CE . When CE is LOW and CE is HIGH, CE is LOW; when CE is HIGH or CE is LOW,  
1
2
1
2
1
2
CE is HIGH.  
21. Address valid prior to or coincident with CE LOW transition.  
Document Number: 001-84902 Rev. *F  
Page 9 of 19  
CY62167G Automotive  
Switching Waveforms (continued)  
Figure 7. Write Cycle No. 1 (WE Controlled) [22, 23, 24]  
tWC  
ADDRESS  
tSCE  
CE  
tBW  
BHE/  
BLE  
tAW  
tHA  
tSA  
tPWE  
WE  
tLZWE  
tSD  
t
HZWE  
tHD  
DATA I/O  
DATAIN VALID  
Notes  
22. For all dual chip enable devices, CE is the logical combination of CE and CE . When CE is LOW and CE is HIGH, CE is LOW; when CE is HIGH or CE is LOW,  
1
2
1
2
1
2
CE is HIGH.  
23. The internal write time of the memory is defined by the overlap of WE = V , CE = V , BHE or BLE or both = V , and CE = V . All signals must be ACTIVE to initiate  
IL  
1
IL  
IL  
2
IH  
a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing must refer to the edge of the signal that terminates  
the write.  
24. Data I/O is in HI-Z state if CE = V , or OE = V or BHE, and/or BLE = V .  
IH  
IH  
IH  
Document Number: 001-84902 Rev. *F  
Page 10 of 19  
CY62167G Automotive  
Switching Waveforms (continued)  
[25, 26, 27]  
Figure 8. Write Cycle No. 2 (CE Controlled)  
tWC  
ADDRESS  
tSA  
tSCE  
CE  
tAW  
tHA  
tPWE  
WE  
tBW  
BHE/  
BLE  
OE  
tHZOE  
tHD  
tSD  
DATA I/O  
DATAIN VALID  
Notes  
25. For all dual chip enable devices, CE is the logical combination of CE and CE . When CE is LOW and CE is HIGH, CE is LOW; when CE is HIGH or CE is LOW,  
1
2
1
2
1
2
CE is HIGH.  
26. The internal write time of the memory is defined by the overlap of WE = V , CE = V , BHE or BLE or both = V , and CE = V . All signals must be ACTIVE to initiate  
IL  
1
IL  
IL  
2
IH  
a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing must refer to the edge of the signal that terminates  
the write.  
27. Data I/O is in high impedance state if CE = V , or OE = V or BHE, and/or BLE = V  
.
IH  
IH  
IH  
Document Number: 001-84902 Rev. *F  
Page 11 of 19  
CY62167G Automotive  
Switching Waveforms (continued)  
[28, 29, 30]  
Figure 9. Write Cycle No. 3 (BHE/BLE Controlled, OE LOW)  
tWC  
ADDRESS  
tSCE  
CE  
tAW  
tSA  
tHA  
tBW  
BHE/  
BLE  
tPWE  
WE  
tHZWE  
tHD  
tSD  
tLZWE  
DATA I/O  
DATAIN VALID  
Notes  
28. For all dual chip enable devices, CE is the logical combination of CE and CE . When CE is LOW and CE is HIGH, CE is LOW; when CE is HIGH or CE is LOW,  
1
2
1
2
1
2
CE is HIGH.  
29. The internal write time of the memory is defined by the overlap of WE = V , CE = V , BHE or BLE or both = V , and CE = V . All signals must be ACTIVE to initiate  
IL  
1
IL  
IL  
2
IH  
a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing must refer to the edge of the signal that terminates  
the write.  
30. Data I/O is in high impedance state if CE = V , or OE = V or BHE, and/or BLE = V  
.
IH  
IH  
IH  
Document Number: 001-84902 Rev. *F  
Page 12 of 19  
CY62167G Automotive  
Truth Table – CY62167G  
CE1  
CE2  
WE  
X
OE  
X
BHE BLE  
Inputs/Outputs  
Mode  
Power  
[31]  
H
X
X
X
H
L
X
X
H
L
HI-Z  
HI-Z  
HI-Z  
Deselect/Power-down  
Deselect/Power-down  
Deselect/Power-down  
Read  
Standby (I  
Standby (I  
Standby (I  
)
SB  
[31]  
X
L
X
X
)
SB  
[31]  
[31]  
X
X
X
X
)
SB  
L
L
H
H
H
L
Data Out (I/O –I/O  
)
Active (I )  
CC  
0
15  
H
L
H
L
Data Out (I/O –I/O );  
Read  
Active (I )  
CC  
0
7
HI-Z (I/O –I/O  
)
8
15  
L
H
H
L
L
H
HI-Z (I/O –I/O );  
Read  
Active (I  
)
0
7
CC  
Data Out (I/O –I/O  
)
8
15  
L
L
L
H
H
H
H
L
L
H
X
X
X
L
X
L
L
HI-Z  
Output disabled  
Write  
Active (I  
Active (I  
Active (I  
)
CC  
Data In (I/O –I/O  
)
)
CC  
0
15  
H
Data In (I/O –I/O );  
HI-Z (I/O –I/O  
Write  
)
CC  
0
7
)
8
15  
L
H
L
X
L
H
HI-Z (I/O –I/O );  
Write  
Active (I  
)
0
7
CC  
Data In (I/O –I/O  
)
8
15  
Note  
31. The ‘X’ (Don’t care) state for the chip enables refer to the logic state (either HIGH or LOW). Intermediate voltage levels on these pins is not permitted.  
Document Number: 001-84902 Rev. *F  
Page 13 of 19  
CY62167G Automotive  
Ordering Information  
Speed  
Package  
Diagram  
Operating  
Range  
Package Type  
(ns)  
Ordering Code  
CY62167G30-55BVXE  
CY62167G30-55BVXET  
CY62167G30-55ZXE  
CY62167G30-55ZXET  
CY62167G30-45ZXA  
CY62167G30-45ZXAT  
CY62167G30-45BVXA  
CY62167G30-45BVXAT  
55  
51-85150 48-ball VFBGA (6 × 8 × 1 mm) (Pb-free),  
Package Code: BZ48  
Automotive-E  
51-85183 48-pin TSOP I (12 × 18.4 × 1 mm) (Pb-free),  
Package Code: Z48A  
45  
51-85183 48-pin TSOP I (12 × 18.4 × 1 mm) (Pb-free),  
Package Code: Z48A  
Automotive-A  
51-85150 48-ball VFBGA (6 × 8 × 1 mm) (Pb-free),  
Package Code: BZ48  
Ordering Code Definitions  
X
G
XX XX  
XX -  
X
621  
6
X
CY  
7
X = blank or T  
blank = Bulk; T = Tape and Reel  
Temperature Range: X = E or A  
E = Automotive-E; A = Automotive-A  
Pb-free  
Package Type: XX = BV or Z  
BV = 48-ball VFBGA; Z = 48-pin TSOP I  
Speed Grade: XX = 45 or 55  
45 = 45 ns; 55 = 55 ns  
Voltage Range: 30 = 3 V typ  
Process Technology: G = 65 nm  
Bus Width: 7 = × 16  
Density: 6 = 16-Mbit  
Family Code: 621 = MoBL SRAM family  
Company ID: CY = Cypress  
Document Number: 001-84902 Rev. *F  
Page 14 of 19  
CY62167G Automotive  
Package Diagram  
Figure 10. 48-ball VFBGA (6 × 8 × 1.0 mm) BV48/BZ48 Package Outline, 51-85150  
51-85150 *H  
Document Number: 001-84902 Rev. *F  
Page 15 of 19  
CY62167G Automotive  
Package Diagram (continued)  
Figure 11. 48-pin TSOP I (18.4 × 12 × 1.2 mm) Package Outline, 51-85183  
STANDARD PIN OUT (TOP VIEW)  
2X (N/2 TIPS)  
0.10 C  
8
0.10  
2X  
A2  
2
0.10  
2X  
1
N
B
SEE DETAIL B  
R
A
(c)  
E
5
GAUGE PLANE  
0.25 BASIC  
e
9
N/2 +1  
N/2  
0°  
5
A1  
C
D1  
D
4
PARALLEL TO  
SEATING PLANE  
L
C
0.20  
2X (N/2 TIPS)  
SEATING PLANE  
DETAIL A  
B
A
B
SEE DETAIL A  
0.08MM M C A-B  
b
6
7
WITH PLATING  
e/2  
REVERSE PIN OUT (TOP VIEW)  
3
1
N
c
7
c1  
X
X = A OR B  
b1  
BASE METAL  
DETAIL B  
N/2  
N/2 +1  
SECTION B-B  
NOTES:  
DIMENSIONS  
SYMBOL  
1. DIMENSIONS ARE IN MILLIMETERS (mm).  
MIN. NOM. MAX.  
A
1.20  
2. PIN 1 IDENTIFIER FOR STANDARD PIN OUT (DIE UP).  
0.15  
0.05  
A1  
A2  
b1  
b
3. PIN 1 IDENTIFIER FOR REVERSE PIN OUT (DIE DOWN): INK OR LASER MARK.  
0.95  
0.17  
0.17  
1.00  
0.20  
1.05  
0.23  
0.27  
4. TO BE DETERMINED AT THE SEATING PLANE -C- . THE SEATING PLANE IS  
DEFINED AS THE PLANE OF CONTACT THAT IS MADE WHEN THE PACKAGE  
LEADS ARE ALLOWED TO REST FREELY ON A FLAT HORIZONTAL SURFACE.  
0.22  
5. DIMENSIONS D1 AND E DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE  
MOLD PROTRUSION ON E IS 0.15mm PER SIDE AND ON D1 IS 0.25mm PER SIDE.  
c1  
0.10  
0.10  
0.16  
0.21  
c
D
6. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR  
PROTRUSION SHALL BE 0.08mm TOTAL IN EXCESS OF b DIMENSION AT MAX.  
MATERIAL CONDITION. DAMBAR CANNOT BE LOCATED ON LOWER RADIUS OR  
THE FOOT. MINIMUM SPACE BETWEEN PROTRUSION AND AN ADJACENT LEAD  
TO BE 0.07mm .  
20.00 BASIC  
18.40 BASIC  
12.00 BASIC  
0.50 BASIC  
D1  
E
e
L
0
0.50  
0.60 0.70  
7. THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE LEAD BETWEEN  
0.10mm AND 0.25mm FROM THE LEAD TIP.  
0°  
8
0.20  
R
N
0.08  
8. LEAD COPLANARITY SHALL BE WITHIN 0.10mm AS MEASURED FROM THE  
SEATING PLANE.  
48  
9. DIMENSION "e" IS MEASURED AT THE CENTERLINE OF THE LEADS.  
10. JEDEC SPECIFICATION NO. REF: MO-142(D)DD.  
51-85183 *F  
Document Number: 001-84902 Rev. *F  
Page 16 of 19  
CY62167G Automotive  
Acronyms  
Document Conventions  
Units of Measure  
Symbol  
Acronym  
Description  
BHE  
BLE  
byte high enable  
Unit of Measure  
byte low enable  
chip enable  
°C  
MHz  
A  
s  
mA  
mm  
ns  
Degrees Celsius  
megahertz  
microamperes  
microseconds  
milliamperes  
millimeters  
nanoseconds  
ohms  
CE  
CMOS  
I/O  
complementary metal oxide semiconductor  
input/output  
OE  
output enable  
SRAM  
VFBGA  
WE  
static random access memory  
very fine-pitch ball grid array  
write enable  
%
percent  
pF  
V
picofarads  
volts  
W
watts  
Document Number: 001-84902 Rev. *F  
Page 17 of 19  
CY62167G Automotive  
Document History Page  
Document Title: CY62167G Automotive, 16-Mbit (1M Words × 16-Bit) Static RAM with Error-Correcting Code (ECC)  
Document Number: 001-84902  
Orig. of  
Change  
Submission  
Date  
Rev.  
ECN No.  
Description of Change  
*C  
5083752  
NILE  
01/13/2016 Changed status from Preliminary to Final.  
*D  
*E  
5130998  
5555173  
NILE  
02/12/2016 Updated Logic Block Diagram – CY62167G.  
Updated Pin Configurations:  
Added Note 3 and referred the same note in Figure 2.  
Updated DC Electrical Characteristics:  
Updated Note 7.  
Updated Data Retention Characteristics:  
Updated Note 10.  
VINI  
01/18/2017 Updated Features:  
Added “AEC-Q100 qualified”.  
Updated Maximum Ratings:  
Updated Note 5 (Replaced “2 ns” with “20 ns”).  
Updated DC Electrical Characteristics:  
Replaced “55 ns (Automotive-E)” with “45 ns (Automotive-A)” in column  
heading.  
Replaced “55 ns (Automotive-A)” with “55 ns (Automotive-E)” in column  
heading.  
Changed minimum value of V parameter from 2.2 V to 2.4 V corresponding  
OH  
to Operating Range “2.7 V to 3.6 V”.  
Changed minimum value of V parameter from 2.0 V to 1.8 V corresponding  
IH  
to Operating Range “2.2 V to 2.7 V”.  
Updated Ordering Information:  
Updated part numbers.  
Updated Ordering Code Definitions.  
Updated Package Diagram:  
spec 51-85183 – Changed revision from *D to *E.  
Updated to new template.  
Completing Sunset Review.  
*F  
5725191  
NILE  
05/03/2017 Updated DC Electrical Characteristics:  
Fixed typo in values of I and I parameters (both “Min” and “Max” columns).  
IX  
OZ  
Fixed typo in values of I  
and I  
parameters (only “Max” column).  
SB1  
SB2  
Updated Data Retention Characteristics:  
Fixed typo in values of I parameter (only “Max” column).  
CCDR  
Updated to new template.  
Document Number: 001-84902 Rev. *F  
Page 18 of 19  
CY62167G Automotive  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
®
Products  
PSoC Solutions  
®
®
ARM Cortex Microcontrollers  
Automotive  
cypress.com/arm  
cypress.com/automotive  
cypress.com/clocks  
cypress.com/interface  
cypress.com/iot  
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP  
Cypress Developer Community  
Clocks & Buffers  
Interface  
Forums | WICED IOT Forums | Projects | Video | Blogs |  
Training | Components  
Internet of Things  
Memory  
Technical Support  
cypress.com/memory  
cypress.com/mcu  
cypress.com/support  
Microcontrollers  
PSoC  
cypress.com/psoc  
Power Management ICs  
Touch Sensing  
USB Controllers  
Wireless Connectivity  
cypress.com/pmic  
cypress.com/touch  
cypress.com/usb  
cypress.com/wireless  
© Cypress Semiconductor Corporation, 2013–2017. This document is the property of Cypress Semiconductor Corporation and its subsidiaries, including Spansion LLC ("Cypress"). This document,  
including any software or firmware included or referenced in this document ("Software"), is owned by Cypress under the intellectual property laws and treaties of the United States and other countries  
worldwide. Cypress reserves all rights under such laws and treaties and does not, except as specifically stated in this paragraph, grant any license under its patents, copyrights, trademarks, or other  
intellectual property rights. If the Software is not accompanied by a license agreement and you do not otherwise have a written agreement with Cypress governing the use of the Software, then Cypress  
hereby grants you a personal, non-exclusive, nontransferable license (without the right to sublicense) (1) under its copyright rights in the Software (a) for Software provided in source code form, to  
modify and reproduce the Software solely for use with Cypress hardware products, only internally within your organization, and (b) to distribute the Software in binary code form externally to end users  
(either directly or indirectly through resellers and distributors), solely for use on Cypress hardware product units, and (2) under those claims of Cypress's patents that are infringed by the Software (as  
provided by Cypress, unmodified) to make, use, distribute, and import the Software solely for use with Cypress hardware products. Any other use, reproduction, modification, translation, or compilation  
of the Software is prohibited.  
TO THE EXTENT PERMITTED BY APPLICABLE LAW, CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS DOCUMENT OR ANY SOFTWARE  
OR ACCOMPANYING HARDWARE, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. To the extent  
permitted by applicable law, Cypress reserves the right to make changes to this document without further notice. Cypress does not assume any liability arising out of the application or use of any  
product or circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is  
the responsibility of the user of this document to properly design, program, and test the functionality and safety of any application made of this information and any resulting product. Cypress products  
are not designed, intended, or authorized for use as critical components in systems designed or intended for the operation of weapons, weapons systems, nuclear installations, life-support devices or  
systems, other medical devices or systems (including resuscitation equipment and surgical implants), pollution control or hazardous substances management, or other uses where the failure of the  
device or system could cause personal injury, death, or property damage ("Unintended Uses"). A critical component is any component of a device or system whose failure to perform can be reasonably  
expected to cause the failure of the device or system, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim,  
damage, or other liability arising from or related to all Unintended Uses of Cypress products. You shall indemnify and hold Cypress harmless from and against all claims, costs, damages, and other  
liabilities, including claims for personal injury or death, arising from or related to any Unintended Uses of Cypress products.  
Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, WICED, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in  
the United States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners.  
Document Number: 001-84902 Rev. *F  
Revised May 3, 2017  
Page 19 of 19  
MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor Corporation.  

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