HYB39S256800DFL-6 [INFINEON]
Synchronous DRAM, 32MX8, 5ns, CMOS, PBGA54, 12 X 8 MM, PLASTIC, TFBGA-54;型号: | HYB39S256800DFL-6 |
厂家: | Infineon |
描述: | Synchronous DRAM, 32MX8, 5ns, CMOS, PBGA54, 12 X 8 MM, PLASTIC, TFBGA-54 动态存储器 |
文件: | 总61页 (文件大小:2394K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Data Sheet, Rev. 1.30, Feb. 2006
HYB39S256400D[C/T](L)
HYB39S256800D[C/T](L)
HYB39S256160D[C/T](L)
256-MBit Synchronous DRAM
SDRAM
Memory Products
Edition 2006-02
Published by Infineon Technologies AG,
St.-Martin-Strasse 53,
81669 München, Germany
© Infineon Technologies AG 2006.
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as a guarantee of
characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding
circuits, descriptions and charts stated herein.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in
question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure
of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support
devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain
and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may
be endangered.
HYB39S256400D[C/T](L) HYB39S256800D[C/T](L) HYB39S256160D[C/T](L)
Revision History: 2006-02, Rev. 1.30
Previous Version: 2005-07, Rev. 1.22
Page
7
Subjects (major changes since last revision)
Changed format in table 1
28
Changed format in table 12
29
Corrected −7.5 = PC133−333
We Listen to Your Comments
Any information within this document that you feel is wrong, unclear or missing at all?
Your feedback will help us to continuously improve the quality of this document.
Please send us your proposal (including a reference to this document) to:
techdoc.mp@infineon.com
Template: mp_a4_s_rev321 / 3 / 2005-10-05
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Table of Contents
Table of Contents
Table of Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
List of Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
List of Figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1
1.1
1.2
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2
Pin Configuration and Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Package P–TSOPII–54 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Package P–TFBGA–54 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.1
2.2
2.3
2.4
3
3.1
3.2
3.3
3.3.1
3.4
3.5
3.5.1
3.5.2
3.5.3
3.5.4
Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Operation Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Mode Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Burst Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Read and Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
DQM Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Suspend Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Power Down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
4
4.1
4.2
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
5
6
Timing Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Data Sheet
4
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
List of Tables
List of Tables
Table 1
Table 2
Table 3
Table 4
Table 5
Table 6
Table 7
Table 8
Table 9
Table 10
Table 11
Table 12
Table 13
Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Pin Configuration of the SDRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Truth Table: Operation Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Mode Register Definition (BA[1:0] = 00B) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Burst Length and Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Bank Selection by Address Bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Input and Output Capacitances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
I
I
DD Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
DD Specifications and Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
AC Timing - Absolute Specifications –8/-7.5/–7/-6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Data Sheet
5
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
List of Figures
List of Figures
Figure 1
Figure 2
Figure 3
Figure 4
Figure 5
Figure 6
Figure 7
Figure 8
Figure 9
Pin Configuration P-TSOPII-54 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Ball out for ×16 components, PG-TFBGA-54 (top view). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Ball out for ×8 components, PG-TFBGA-54 (top view). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Ball out for ×4 components, PG-TFBGA-54 (top view). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Block Diagram for 64M x 4 SDRAM (13/11/2 Addressing). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Block Diagram for 32M x 8 SDRAM (13/10/2 Addressing). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Block Diagram for 16M x 16 SDRAM (13/9/2 Addressing). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Measurement conditions for tAC and tOH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Bank Activate Command Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Figure 10 Burst Read Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Figure 11 Read Interrupted by a Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 12 Read to Write Interval. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 13 Minimum Read to Write Interval . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 14 Non-Minimum Read to Write Interval . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 15 Burst Write Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 16 Write Interrupted by a Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 17 Write Interrupted by a Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 18 Burst Write with Auto-Precharge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 19 Burst Read with Auto-Precharge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 20
AC Parameters for a Write Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 21 AC Parameters for a Read Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 22 Mode Register Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 23 Power on Sequence and Auto Refresh (CBR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Figure 24 Clock Suspension During Burst Read CAS Latency = 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Figure 25 Clock Suspension During Burst Read CAS Latency = 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Figure 26 Clock Suspension During Burst Write CAS Latency = 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Figure 27 Clock Suspension During Burst Write CAS Latency = 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Figure 28 Power Down Mode and Clock Suspend . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Figure 29 Self Refresh (Entry and Exit) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Figure 30 Auto Refresh (CBR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Figure 31 CAS Latency = 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Figure 32 CAS Latency = 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Figure 33 CAS Latency = 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Figure 34 CAS Latency = 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Figure 35 CAS Latency = 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
Figure 36 CAS Latency = 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Figure 37 CAS Latency = 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Figure 38 CAS Latency = 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Figure 39 CAS Latency = 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 40 Full Page Burst Read, CAS Latency = 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 41 Full Page Burst Write, CAS Latency = 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Figure 42 Package Outline P-TSOPII-54-1 (top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Figure 43 Package Outline P-TFBGA-54-8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Data Sheet
6
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
256-MBit Synchronous DRAM
SDRAM
HYB39S256400D[C/T](L)
HYB39S256800D[C/T](L)
HYB39S256160D[C/T](L)
1
Overview
This chapter lists all main features of the product family HYB39S256[40/80/16]0D[C/T](L) and the ordering
information.
1.1
Features
•
•
•
•
•
Fully Synchronous to Positive Clock Edge
0 to 70 °C Operating Temperature
Four Banks controlled by BA0 & BA1
Programmable CAS Latency: 2 & 3
Programmable Wrap Sequence: Sequential or
Interleave
Programmable Burst Length: 1, 2, 4, 8 and full page
Multiple Burst Read with Single Write Operation
Automatic and Controlled Precharge Command
Data Mask for Read / Write control (x4, x8)
•
•
•
•
•
•
•
•
Data Mask for Byte Control (x16)
Auto Refresh (CBR) and Self Refresh
Power Down and Clock Suspend Mode
8192 refresh cycles / 64 ms (7.8 µs)
Random Column Address every CLK (1-N Rule)
Single 3.3 V ± 0.3 V Power Supply
LVTTL Interface
Plastic Packages:
– P–TSOPII–54 400mil width
– P–TFBGA–54 (12 mm x 8 mm)
•
•
•
•
Table 1
Performance
Poduct Type Speed Code
Speed Grade
–6
–7
–7.5
–8
Unit
—
Note
PC166–333 PC133–222 PC133–333 PC100–222
Max. Clock Frequency
fCK3 166
fCK2 133
143
133
7
133
100
7.5
10
125
100
8
MHz
MHz
ns
CL3
CL2
CL3
CL2
CL3
CL2
Min. Clock Cycle Time
tCK3
tCK2 7.5
Max. Access Time from Clock tAC3
tAC2 5.4
6
7.5
5.4
5.4
10
6
ns
5
5.4
6
ns
6
ns
1.2
Description
The HYB39S256[40/80/16]0D[C/T](L) are four bank Synchronous DRAM’s organized as 4 banks x 16 MBit x4,
4 banks x 8 MBit x8 and 4 banks x 4 Mbit x16 respectively. These synchronous devices achieve high speed data
transfer rates for CAS latencies by employing a chip architecture that prefetches multiple bits and then
synchronizes the output data to a system clock. The chip is fabricated with INFINEON’s advanced 0.14 µm
256-MBit DRAM process technology.
The device is designed to comply with all industry standards set for synchronous DRAM products, both electrically
and mechanically. All of the control, address, data input and output circuits are synchronized with the positive edge
of an externally supplied clock.
Operating the four memory banks in an interleave fashion allows random access operation to occur at a higher
rate than is possible with standard DRAMs. A sequential and gapless data rate is possible depending on burst
length, CAS latency and speed grade of the device.
Auto Refresh (CBR) and Self Refresh operation are supported. These devices operate with a single 3.3 V ± 0.3 V
power supply. All 256-Mbit components are available in P–TSOPII–54 and P–TFBGA–54 packages.
Data Sheet
7
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Overview
Table 2
Ordering Information
Product Type
Speed Grade
Package
Description
HYB 39S256400DT–6
HYB 39S256400DT–7
HYB 39S256400DT–7.5
HYB 39S256400DT–8
HYB 39S256800DT–6
HYB 39S256800DT–7
HYB 39S256800DT–7.5
HYB 39S256800DT–8
HYB 39S256160DT–6
HYB 39S256160DT–7
HYB 39S256160DT–7.5
HYB 39S256160DT–8
HYB39S256400DTL–x
PC166–333–520
PC133–222–520
PC133–333–520
PC100–222–620
PC166–333–520
PC133–222–520
PC133–333–520
PC100–222–620
PC166–333–520
PC133–222–520
PC133–333–520
PC100–222–620
—
P–TSOP–54–1 (400mil) 166MHz 4B x 16M x 4 SDRAM
P–TSOP–54–1 (400mil) 143MHz 4B x 16M x 4 SDRAM
P–TSOP–54–1 (400mil) 133MHz 4B x 16M x 4 SDRAM
P–TSOP–54–1 (400mil) 125MHz 4B x 16M x 4 SDRAM
P–TSOP–54–1 (400mil) 166MHz 4B x 8M x 8 SDRAM
P–TSOP–54–1 (400mil) 143MHz 4B x 8M x 8 SDRAM
P–TSOP–54–1 (400mil) 133MHz 4B x 8M x 8 SDRAM
P–TSOP–54–1 (400mil) 125MHz 4B x 8M x 8 SDRAM
P–TSOP–54–1 (400mil) 166MHz 4B x 4M x 16 SDRAM
P–TSOP–54–1 (400mil) 143MHz 4B x 4M x 16 SDRAM
P–TSOP–54–1 (400mil) 133MHz 4B x 4M x 16 SDRAM
P–TSOP–54–1 (400mil) 125MHz 4B x 4M x 16 SDRAM
P–TSOP–54–1 (400mil) 4B x 16M x 4 SDRAM Low Power
Versions (on request)
HYB39S256800DTL–x
HYB39S256160DTL–x
HYB39S256xx0DC(L)–x
—
—
—
P–TSOP–54–1 (400mil) 4B x 8M x 8 SDRAM Low Power
Versions (on request)
P–TSOP–54–1 (400mil) 4B x 4M x 16 SDRAM Low Power
Versions (on request)
P–TFBGA–54-8
(on request)
Data Sheet
8
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
2
Pin Configuration and Block Diagrams
This chapter contains the pin configuration table, the TSOP and FBGA package drawing, and the block diagrams
for the ×4, ×8, ×16 organization of the SDRAM.
2.1
Pin Description
Listed below are the pin configurations sections for the various signals of the SDRAM
•
•
•
•
•
•
•
•
•
•
•
•
Clock Signals ×4/×8/×16 Organization
Control Signals ×4/×8/×16 Organization
Address Signals ×4/×8/×16 Organization
Data Signals ×4 Organization
Data Signals ×8 Organization
Data Signals ×16 Organization
Data Mask ×4/×8 Organization
Data Mask ×16 Organization
Power Supplies ×4/×8/×16 Organization
Not connected ×4 Organization
Not connected ×8 Organization
Not connected ×16 Organization
Table 3
Pin Configuration of the SDRAM
Name Pin Buffer Function
Type Type
Pin or
Ball No.
Clock Signals ×4/×8/×16 Organization
38,2F
37,3F
CLK
I
LVTTL
Clock Signal CK
Note: The system clock input. All of the SDRAM inputs are sampled on the
rising edge of the clock.
CKE
I
LVTTL
Clock Enable
Note: Activates the CLK signal when high and deactivates the CLK signal
when low, thereby initiating either the Power Down mode, Suspend
mode, or the Self Refresh mode.
Control Signals ×4/×8/×16 Organization
18, 8F
17, 7F
16, 9F
RAS
CAS
WE
I
I
I
LVTTL
LVTTL
LVTTL
Row Address Strobe (RAS), Column Address Strobe (CAS), Write
Enable (WE)
Note: When sampled at the positive rising edge of the clock, CAS, RAS, and
WE define the command to be executed by the SDRAM.
19, 9G
CS
I
LVTTL
Chip Select
Note: Enables the command decoder when low and disables the command
decoder when high. When the command decoder is disabled, new
commands are ignored but previous operations continue.
Address Signals ×4/×8/×16 Organization
20, 7G
21, 8G
BA0
BA1
I
I
LVTTL
LVTTL
Bank Address Signals 1:0
Note: Bank Select Inputs. Bank address inputs selects which of the four
banks a command applies to.
Data Sheet
9
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
Table 3
Pin Configuration of the SDRAM (cont’d)
Name Pin Buffer Function
Type Type
Pin or
Ball No.
23, 7H
24,8H
25, 8J
26, 7J
29, 3J
30, 2J
31, H
A0
I
I
I
I
I
I
I
I
I
I
I
I
I
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
Address Signal 9:0, Address Signal 10/Auto precharge
A1
Note: During a Bank Activate command cycle, A0-A12 define the row
address (RA0-RA12) when sampled at the rising clock edge. During a
Read or Write command cycle, A0-An define the column address
(CA0-CAn) when sampled at the rising clock edge. CAn depends
upon the SDRAM organization:
A2
A3
A4
A5
64M x4SDRAM CAn = CA9, CA11 (Page Length = 2048 bits)
32M x8SDRAM CAn = CA9 (Page Length = 1024 bits)
16M x16SDRAM CAn = CA8 (Page Length = 512 bits)
A6
32, 2H
33, 1H
34, 3G
22, 9H
35,2G
36, 1G
A7
In addition to the column address, A10 (= AP) is used to invoke the
auto pre charge operation at the end of the burst read or write cycle.
If A10 is high, auto pre charge is selected and BA0, BA1 defines the
bank to be precharged. If A10 is low, auto pre charge is
disabled.During a Precharge command cycle, A10 (= AP) is used in
conjunction with BA0 and BA1 to control which bank(s) to precharge.
If A10 is high, all four banks will be precharged regardless of the state
of BA0 and BA1. If A10 is low, then BA0 and BA1 are used to define
which bank to precharge.
A8
A9
A10
A11
A12
Data Signals ×4 Organization
5, 8B
DQ0
DQ1
DQ2
DQ3
I/O
I/O
I/O
I/O
LVTTL
LVTTL
LVTTL
LVTTL
Data Signal Bus [15:0]
11, 8D
44, 2D
50, 2B
Note: Data Input/Output pins operate in the same manner as on EDO or
FPM DRAMs.
Data Signals ×8 Organization
2, 8A
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
Data Signal Bus [15:0]
5, 8B
Note: Data Input/Output pins operate in the same manner as on EDO or
FPM DRAMs.
8, 8C
11, 8D
44, 2D
47, 2C
50, 2B
53, 2A
Data Sheet
10
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
Table 3
Pin Configuration of the SDRAM (cont’d)
Pin or
Name Pin
Buffer
Function
Ball No.
Type Type
Data Signals ×16 Organization
2, 9A
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
LVTTL
Data Signal Bus [15:0]
4, 9B
Note: Data Input/Output pins operate in the same manner as on EDO or
FPM DRAMs.
5, 8B
7, 9C
8, 8C
10, 9D
11, 8D
13, 9E
42, 1E
44, 2D
45, 1D
47, 2C
48, 1C
50, 2B
51, 1B
53, 2A
DQ10 I/O
DQ11 I/O
DQ12 I/O
DQ13 I/O
DQ14 I/O
DQ15 I/O
Data Mask ×4/×8 Organization
39, 1F DQM I/O LVTTL
Data Mask
Note: The Data Input/Output mask places the DQ buffers in a high
impedance state when sampled high. In Read mode, DQM has a
latency of two clock cycles and controls the output buffers like an
output enable. In Write mode, DQM has a latency of zero and
operates as a word mask by allowing input data to be written if it is low
but blocks the write operation if DQM is high.One DQM input is
present in x4 and x8 SDRAMs.
Data Mask ×16 Organization
39, 1F
UDQM I/O
LVTTL
Data Mask Upper Byte
Note: LDQM and UDQM controls the lower and upper bytes in x16
SDRAMs.
15, 8E
LDQM I/O
LVTTL
Data Mask Lower Byte
Power Supplies ×4/×8/×16 Organization
3B, 3D, VDDQ PWR –
Power Supply
7A, 7C
7E, 9A, VDD
9J
PWR –
PWR –
Power Supply
Note: Power for the input buffers and the core logic (3.3 V)
Power Supply Ground for DQs
3A, 3C, VSSQ
7B, 7D
Note: Isolated power supply and ground for the output buffers to provide
improved noise immunity.
1J, 1A, VSS
PWR –
Power Supply Ground
3E
Data Sheet
11
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
Table 3
Pin Configuration of the SDRAM (cont’d)
Pin or
Name Pin
Buffer
Function
Ball No.
Type Type
Not connected ×4 Organization
2, 4, 7, 8, NC
10, 13,
15, 40,
NC
–
Not connected
Note: No internal electrical connection is present.
42, 45,
47, 48,
51, 53,
1B, 1C,
1D, 1E,
2A, 2C,
2E, 8A,
8C, 8E,
9B, 9C,
9D, 9E
Not connected ×8 Organization
7, 10,
NC
NC
–
Not connected
13, 15,
40, 42,
45, 48,
51, 1B,
1C, 1D,
1E, 2E,
8E, 9B,
9C, 9D,
9E
Note: No internal electrical connection is present.
Not connected ×16 Organization
40, 2E NC NC
–
Not connected
Note: No internal electrical connection is present.
Data Sheet
12
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
2.2
Package P–TSOPII–54
Listed below are the pin outs of the TSOP package.
X ꢂꢆ
X ꢈ
X ꢁ
6$$
$1ꢀ
6$$1
$1ꢂ
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6331
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Figure 1
Pin Configuration P-TSOPII-54
Data Sheet
13
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
2.3
Package P–TFBGA–54
Listed below are the ball outs of the TFBGA package.
•
•
•
Ball out for ×16 components, PG-TFBGA-54 (top view)
Ball out for ×8 components, PG-TFBGA-54 (top view)
Ball out for ×4 components, PG-TFBGA-54 (top view)
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ꢃ
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$1ꢂꢀ $1ꢉ
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Figure 2
Ball out for ×16 components, PG-TFBGA-54 (top view)
Data Sheet
14
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
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ꢃ
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Figure 3
Ball out for ×8 components, PG-TFBGA-54 (top view)
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Figure 4
Ball out for ×4 components, PG-TFBGA-54 (top view)
Data Sheet
15
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
2.4
Block Diagrams
The Block diagrams for 64M ×4, 32M ×8 and 16M ×16 are shown below.
•
•
•
Block Diagram for 64M x 4 SDRAM (13/11/2 Addressing)
Block Diagram for 32M x 8 SDRAM (13/10/2 Addressing)
Block Diagram for 16M x 16 SDRAM (13/9/2 Addressing)
C olum n A d d resses
R ow A d d resses
A 0 - A 9 , A 11 , A P,
B A 0 , B A 1
A 0 - A 1 2 ,
B A 0 , B A 1
C olum n A d d ress
C o un ter
C olum n A d d ress
B uffe r
R ow A d d ress
B u ffe r
R e fresh C o u nte r
R ow
R ow
R ow
R ow
D e co de r
D e co de r
D e co de r
D eco de r
M em ory
A rray
M e m ory
A rray
M e m o ry
A rray
M e m o ry
A rray
B an k 0
B a nk 1
B a nk 2
B a nk 3
81 96
x 20 48
x 4 B it
81 92
x 20 48
x 4 B it
81 9 2
x 20 4 8
x 4 B it
8 19 2
x 2 04 8
x 4 B it
In p ut B u ffer
O u tpu t B uffe r
C o ntro l L og ic &
T im ing G en erato r
D Q 0 - D Q 3
S P B 041 27_2
Figure 5
Block Diagram for 64M x 4 SDRAM (13/11/2 Addressing)
Data Sheet
16
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
#OLUMN !DDRESSES
2OW !DDRESSES
!ꢀ ꢐ !ꢉꢊ !0ꢊ
"!ꢀꢊ "!ꢂ
!ꢀ ꢐ !ꢂꢃꢊ
"!ꢀꢊ "!ꢂ
#OLUMN !DDRESS
#OUNTER
#OLUMN !DDRESS
"UFFER
2OW !DDRESS
"UFFER
2EFRESH #OUNTER
2OW
$ECODER
2OW
$ECODER
2OW
$ECODER
2OW
$ECODER
-EMOR
!RRA
-EMOR
!RRA
-EMOR
!RRA
-EMOR
!RRA
"ANK ꢀ
"ANK ꢂ
"ANK ꢃ
"ANK ꢄ
ꢈꢂꢉꢃ
X ꢂꢀꢃꢁ
X ꢈ "IT
ꢈꢂꢉꢃ
X ꢂꢀꢃꢁ
X ꢈ "IT
ꢈꢂꢉꢃ
X ꢂꢀꢃꢁ
X ꢈ "IT
ꢈꢂꢉꢃ
X ꢂꢀꢃꢁ
X ꢈ "IT
)NPUT "UFFER /UTPUT "UFFER
$1ꢀ ꢐ $1ꢇ
#ONTROL ,OGIC ꢍ
4IMING 'ENERATOR
30"ꢀꢁꢂꢃꢈ
Figure 6
Block Diagram for 32M x 8 SDRAM (13/10/2 Addressing)
Data Sheet
17
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Pin Configuration and Block Diagrams
#OLUMN !DDRESSES
2OW !DDRESSES
!ꢀ ꢐ !ꢈꢊ !0ꢊ
"!ꢀꢊ "!ꢂ
!ꢀ ꢐ !ꢂꢃꢊ
"!ꢀꢊ "!ꢂ
#OLUMN !DDRESS
#OUNTER
#OLUMN !DDRESS
"UFFER
2OW !DDRESS
"UFFER
2EFRESH #OUNTER
2OW
$ECODER
2OW
$ECODER
2OW
$ECODER
2OW
$ECODER
-EMOR
!RRA
-EMOR
!RRA
-EMOR
!RRA
-EMOR
!RRA
"ANK ꢀ
"ANK ꢂ
"ANK ꢃ
"ANK ꢄ
ꢈꢂꢉꢃ X ꢅꢂꢃ
X ꢂꢆ "IT
ꢈꢂꢉꢃ X ꢅꢂꢃ
X ꢂꢆ "IT
ꢈꢂꢉꢃ X ꢅꢂꢃ
X ꢂꢆ "IT
ꢈꢂꢉꢃ X ꢅꢂꢃ
X ꢂꢆ "IT
)NPUT "UFFER /UTPUT "UFFER
$1ꢀ ꢐ $1ꢂꢅ
#ONTROL ,OGIC ꢍ
4IMING 'ENERATOR
30"ꢀꢁꢂꢃꢉ
Figure 7
Block Diagram for 16M x 16 SDRAM (13/9/2 Addressing)
Data Sheet
18
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
3
Functional Description
This chapter list all defined commands and their usage for this Synchronous DRAM family.
3.1
Operation Definition
All of SDRAM operations are defined by states of control signals CS, RAS, CAS, WE, and DQM at the positive
edge of the clock. The following list shows the truth table for the operation commands.
Table 4
Truth Table: Operation Command
Operation
Device State
CKE
n-11)2)
CKE DQM BA0
AP=
Addr. CS RAS CAS WE
1)2)
1)2)
1)2)
1)2)
1)2)
1)2)
n1)2)
BA11)2) A101)2)
Bank Active
Bank Precharge
Precharge All
Write
Idle3)
Any
H
H
H
H
H
X
X
X
X
X
X
V
V
X
V
V
V
L
V
X
X
V
V
L
L
L
L
L
L
L
H
H
H
L
H
L
L
L
L
X
Any
Active3)
X
H
L
L
X
H
H
Write with Auto pre Active3)
X
H
L
charge
Read
Active3)
H
H
X
X
X
X
V
V
L
V
V
L
L
H
H
L
L
H
H
Read with Auto pre Active3)
H
charge
Mode Register Set
No Operation
Idle
H
H
H
H
H
H
X
X
X
X
H
L
X
X
X
X
X
X
X
V
X
X
X
X
X
X
V
X
X
X
X
X
X
V
X
X
X
X
X
X
L
L
L
L
Any
Active
Any
Idle
L
H
H
X
L
H
H
X
L
H
L
Burst Stop
L
Device Deselect
Auto Refresh
H
L
X
H
H
X
X
X
X
Self Refresh Entry
Self Refresh Exit
Idle
L
L
L
Idle (Self Refr.) L
H
H
L
X
H
X
X
X
H
X
X
Clock Suspend Entry Active
H
H
L
L
X
X
X
X
X
X
X
X
X
H
Power Down Entry
(Precharge or active
standby)
Idle
Active
L
H
X
X
H
X
H
X
X
H
X
H
X
X
L
Clock Suspend Exit Active4)
L
L
H
H
X
X
X
X
X
X
X
X
X
H
L
Power Down Exit
Any (Power
Down)
Data Write/Output
Enable
Active
H
H
X
X
L
X
X
X
X
X
X
X
X
Data Write/Output
Disable
Active
H
X
X
X
X
1) V = Valid, x = Don’t Care, L = Low Level, H = High Level
2) CKEn signal is input level when commands are provided, CKEn-1 signal is input level one clock before the commands are
provided.
3) This is the state of the banks designated by BA0, BA1 signals.
4) Power Down Mode can not be entered in a burst cycle. When this command asserted in the burst mode cycle device is in
clock suspend mode.
Data Sheet
19
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
3.2
Initialization
The default power on state of the mode register is supplier specific and may be undefined. The following power
on and initialization sequence guarantees the device is preconditioned to each users specific needs. Like a
conventional DRAM, the Synchronous DRAM must be powered up and initialized in a predefined manner. During
power on, all VDD and VDDQ pins must be built up simultaneously to the specified voltage when the input signals
are held in the “NOP” state. The power on voltage must not exceed VDD + 0.3 V on any of the input pins or VDD
supplies. The CLK signal must be started at the same time. After power on, an initial pause of 200 µs is required
followed by a precharge of all banks using the precharge command. To prevent data contention on the DQ bus
during power on, it is required that the DQM and CKE pins be held high during the initial pause period. Once all
banks have been precharged, the Mode Register Set Command must be issued to initialize the Mode Register. A
minimum of eight Auto Refresh cycles (CBR) are also required.These may be done before or after programming
the Mode Register. Failure to follow these steps may lead to unpredictable start-up modes.
Data Sheet
20
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
3.3
Mode Register Definition
The Mode register designates the operation mode at the read or write cycle. This register is divided into four fields.
First, a Burst Length field which sets the length of the burst. Second, an Addressing Selection bit which programs
the column access sequence in a burst cycle (interleaved or sequential). Third, a CAS Latency field to set the
access time at clock cycle. Fourth, an Operation Mode field to differentiate between normal operation (Burst read
and burst Write) and special Burst Read and Single Write mode. After the initial power up, the mode set operation
must be done before any activate command. Any content of the mode register can be altered by re-executing the
mode set command. All banks must be in precharged state and CKE must be high at least one clock before the
mode set operation. After the mode register is set, a Standby or NOP command is required. Low signals of RAS,
CAS, and WE at the positive edge of the clock activate the mode set operation. Address input data at this timing
defines parameters to be set as shown in the previous table.
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Table 5
Mode Register Definition (BA[1:0] = 00B)
Field
BL
Bits
Type
Description
[2:0]
w
Burst Length
Number of sequential bits per DQ related to one read/write command, see
Chapter 3.3.1
All other bit combinations are RESERVED
000B1,
001B2,
010B4,
011B8,
111BFull Page (Sequential burst type only),
BT
CL
3
w
w
Burst Type
See Table 7 for internal address sequence of low order address bits.
0BSequential,
1BInterleaved,
[6:4]
CAS Latency
Number of full clocks from read command to first data valid window.
All other bit combinations are RESERVED.
010B2,
011B3,
Mode
[12:7]
w
Operation Mode
All other bit combinations are RESERVED.
0BBurst read/burst write,
1BBurst read/single write,
Data Sheet
21
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
3.3.1
Burst Length
Table 6
Burst Length and Sequence
Burst Length
Starting Column Address
Order of Accesses Within a Burst
A2
A1
A0
0
1
0
1
0
1
0
1
0
1
0
1
0
1
Type=Sequential
0–1
Type=Interleaved
0–1
2
4
1–0
1–0
0
0
1
1
0
0
1
1
0
0
1
1
0–1–2–3
0–1–2–3
1–2–3–0
1–0–3–2
2–3–0–1
2–3–0–1
3–0–1–2
3–2–1–0
8
0
0
0
0
1
1
1
1
n
0–1–2–3–4–5–6–7
1–2–3–4–5–6–7–0
2–3–4–5–6–7–0–1
3–4–5–6–7–0–1–2
4–5–6–7–0–1–2–3
5–6–7–0–1–2–3–4
6–7–0–1–2–3–4–5
7–0–1–2–3–4–5–6
Cn, Cn+1, Cn+2 ....
0–1–2–3–4–5–6–7
1–0–3–2–5–4–7–6
2–3–0–1–6–7–4–5
3–2–1–0–7–6–5–4
4–5–6–7–0–1–2–3
5–4–7–6–1–0–3–2
6–7–4–5–2–3–0–1
7–6–5–4–3–2–1–0
not supported
FullPage
Notes
1. For a burst length of two, A1-Ai selects the two-data-element block; A0 selects the first access within the block.
2. For a burst length of four, A2-Ai selects the four-data-element block; A0-A1 selects the first access within the
block.
3. For a burst length of eight, A3-Ai selects the eight-data- element block; A0-A2 selects the first access with in
the block.
4. Whenever a boundary of the block is reached within a given sequence above, the following access wraps
within the block.
Data Sheet
22
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
3.4
Commands
Refresh Mode
SDRAM has two refresh modes, Auto Refresh and Self Refresh. Auto Refresh is similar to the CAS -before-RAS
refresh of conventional DRAMs. All banks must be precharged before applying any refresh mode. An on-chip
address counter increments the word and the bank addresses and no bank information is required for both refresh
modes.
The chip enters the Auto Refresh mode, when RAS and CAS are held low and CKE and WE are held high at a
clock timing. The mode restores word line after the refresh and no external precharge command is necessary. A
minimum tRC time is required between two automatic refreshes in a burst refresh mode. The same rule applies to
any access command after the automatic refresh operation.
The chip has an on-chip timer and the Self Refresh mode is available. The mode restores the word lines after RAS,
CAS, and CKE are low and WE is high at a clock timing. All of external control signals including the clock are
disabled. Returning CKE to high enables the clock and initiates the refresh exit operation. After the exit command,
at least one tRC delay is required prior to any access command.
Auto Precharge
Two methods are available to precharge SDRAMs. In an automatic precharge mode, the CAS timing accepts one
extra address, CA10, to determine whether the chip restores or not after the operation. If CA10 is high when a
Read Command is issued, the Read with Auto-Precharge function is initiated. If CA10 is high when a Write
Command is issued, the Write with Auto-Precharge function is initiated. The SDRAM automatically enters the
precharge operation a time delay equal to tWR (“write recovery time”) after the last data in. A burst operation with
Auto-Precharge may only be interrupted by a burst start to another bank. It must not be interrupted by a precharge
or a burst stop command.
Precharge Command
There is also a separate precharge command available. When RAS and WE are low and CAS is high at a clock
timing, it triggers the precharge operation. Three address bits, BA0, BA1 and A10 are used to define banks as
shown in the following list. The precharge command can be imposed one clock before the last data out for CAS
latency = 2 and two clocks before the last data out for CAS latency = 3. Writes require a time delay tWR (“write
recovery time”) of 2 clocks minimum from the last data out to apply the precharge command.
Table 7
Bank Selection by Address Bits
A10
0
BA0
BA1
0
0
1
1
1
0
1
0
1
X
Bank 0
Bank 1
Bank 2
Bank 3
All Banks
0
0
0
1
Data Sheet
23
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
Burst Termination
Once a burst read or write operation has been initiated, there are several methods in which to terminate the burst
operation prematurely. These methods include using another Read or Write Command to interrupt an existing
burst operation, use a Precharge Command to interrupt a burst cycle and close the active bank, or using the Burst
Stop Command to terminate the existing burst operation but leave the bank open for future Read or Write
Commands to the same page of the active bank. When interrupting a burst with another Read or Write Command
care must be taken to avoid DQ contention. The Burst Stop Command, however, has the fewest restrictions
making it the easiest method to use when terminating a burst operation before it has been completed. If a Burst
Stop command is issued during a burst write operation, then any residual data from the burst write cycle will be
ignored. Data that is presented on the DQ pins before the Burst Stop Command is registered will be written to the
memory.
3.5
Operations
3.5.1
Read and Write
When RAS is low and both CAS and WE are high at the positive edge of the clock, a RAS cycle starts. According
to address data, a word line of the selected bank is activated and all of sense amplifiers associated to the wordline
are set. A CAS cycle is triggered by setting RAS high and CAS low at a clock timing after a necessary delay, tRCD
from the RAS timing. WE is used to define either a read (WE = H) or a write (WE = L) at this stage.
SDRAM provides a wide variety of fast access modes. In a single CAS cycle, serial data read or write operations
are allowed at up to a 166 MHz data rate. The numbers of serial data bits are the burst length programmed at the
mode set operation, i.e., one of 1, 2, 4 and 8 and full page. Column addresses are segmented by the burst length
and serial data accesses are done within this boundary. The first column address to be accessed is supplied at
the CAS timing and the subsequent addresses are generated automatically by the programmed burst length and
its sequence. For example, in a burst length of 8 with interleave sequence, if the first address is ‘2’, then the rest
of the burst sequence is 3, 0, 1, 6, 7, 4, and 5.
Full page burst operation is only possible using the sequential burst type and page length is a function of the I/O
organization and column addressing. Full page burst operation does not self terminate once the burst length has
been reached. In other words, unlike burst lengths of 2, 4 and 8, full page burst continues until it is terminated
using another command.
Similar to the page mode of conventional DRAMs, burst read or write accesses on any column address are
possible once the RAS cycle latches the sense amplifiers. The maximum tRAS or the refresh interval time limits the
number of random column accesses. A new burst access can be done even before the previous burst ends. The
interrupt operation at every clock cycle is supported. When the previous burst is interrupted, the remaining
addresses are overridden by the new address with the full burst length. An interrupt which accompanies an
operation change from a read to a write is possible by exploiting DQM to avoid bus contention.
When two or more banks are activated sequentially, interleaved bank read or write operations are possible. With
the programmed burst length, alternate access and precharge operations on two or more banks can realize fast
serial data access modes among many different pages. Once two or more banks are activated, column to column
interleave operation can be performed between different pages.
Data Sheet
24
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Functional Description
3.5.2
DQM Function
DQM has two functions for data I/O read and write operations. During reads, when it turns to “high“ at a clock
timing, data outputs are disabled and become high impedance after two clock delay (DQM Data Disable Latency
t
DQZ). It also provides a data mask function for writes. When DQM is activated, the write operation at the next clock
is prohibited (DQM Write Mask Latency tDQW = zero clocks).
3.5.3
Suspend Mode
During normal access mode, CKE is held high enabling the clock. When CKE is low, it freezes the internal clock
and extends data read and write operations. One clock delay is required for mode entry and exit (Clock Suspend
Latency tCSL).
3.5.4
Power Down
In order to reduce standby power consumption, a power down mode is available. All banks must be precharged
and the necessary Precharge delay (tRP) must occur before the SDRAM can enter the Power Down mode. Once
the Power Down mode is initiated by holding CKE low, all of the receiver circuits except CLK and CKE are gated
off. The Power Down mode does not perform any refresh operations, therefore the device can’t remain in Power
Down mode longer than the Refresh period (tREF) of the device. Exit from this mode is performed by taking CKE
“high“. One clock delay is required for Power Down mode entry and exit.
Data Sheet
25
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Electrical Characteristics
4
Electrical Characteristics
4.1
Operating Conditions
Table 8
Absolute Maximum Ratings
Parameter
Symbol
Limit Values
Unit
Note/
Test Condition
Min.
– 1.0
– 1.0
– 1.0
0
Max.
Input / Output voltage relative to VSS
Voltage on VDD supply relative to VSS
Voltage on VDDQ supply relative to VSS
Operating Temperature
VIN, VOUT
VDD
+4.6
+4.6
+4.6
+70
+150
1
V
–
–
–
–
–
–
–
V
VDDQ
TA
V
°C
°C
W
mA
Storage temperature range
TSTG
PD
-55
–
Power dissipation per SDRAM component
Data out current (short circuit)
IOUT
–
50
Attention: Stresses above the max. values listed here may cause permanent damage to the device.
Exposure to absolute maximum rating conditions for extended periods may affect device
reliability. Maximum ratings are absolute ratings; exceeding only one of these values maycause
irreversible damage to the integrated circuit.
Table 9
DC Characteristics1)
Parameter
Symbol
Values
Max.
Unit
Note/
Test Condition
Min.
3.0
3.0
2.0
– 0.3
2.4
–
2)
Supply Voltage
VDD
VDDQ
VIH
3.6
3.6
V
2)
I/O Supply Voltage
V
2)3)
2)3)
2)
Input high voltage
V
DDQ+0.3
V
Input low voltage
VIL
+0.8
–
V
Output high voltage (IOUT = – 4.0 mA)
Output low voltage (IOUT = 4.0 mA)
VOH
VOL
IIL
V
2)
0.4
+5
V
Input leakage current, any input
(0 V < VIN < VDD, all other inputs = 0 V)
– 5
µA
–
–
Output leakage current
IOL
– 5
+5
µA
(DQs are disabled, 0 V < VOUT < VDDQ
1) TA = 0 to 70 οC
)
2) All voltages are referenced to VSS
3) VIH may overshoot to VDDQ + 2.0 V for pulse width of < 4ns with 3.3 V. VIL may undershoot to -2.0 V for pulse width < 4.0 ns
with 3.3 V. Pulse width measured at 50% points with amplitude measured peak to DC reference.
Data Sheet
26
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Electrical Characteristics
Table 10
Input and Output Capacitances1)
Parameter
Symbol
Values2)
Min.
2.5
Unit
Max.
3.5
Input Capacitances: CK, CK
CI1
CI2
pF
pF
Input Capacitance
2.5
3.8
(A0-A12, BA0, BA1, RAS, CAS, WE, CS, CKE, DQM)
Input/Output Capacitance (DQ)
CI0
4.0
6.0
pF
1) TA = 0 to 70 °C; VDD,VDDQ = 3.3 V ± 0.3 V, f = 1 MHz
2) Capacitance values are shown for TSOP-54 packages. Capacitance values for TFBGA packages are lower by 0.5 pF
Table 11
IDD Conditions
Parameter
Symbol
Operating Current
IDD1
One bank active, Burst length = 1
Precharge Standby Current in Power Down Mode
Recharge Standby Current in Non-Power Down Mode
IDD2P
IDD2N
IDD3N
IDD3P
IDD4
No Operating Current
Active state (max. 4 banks)
Burst Operating Current
Read command cycling
Auto Refresh Current
Auto Refresh command cycling
IDD5
IDD6
Self Refresh Current (standard )
Self Refresh Mode, CKE=0.2V, tCK=infinity
Data Sheet
27
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Electrical Characteristics
Table 12
Symbol
I
DD Specifications and Conditions1)
-6
-7
-7.5
Max.
80
2
-8
Unit
Note/ Test Condition
Max.
100
2
Max.
80
2
Max.
80
2
IDD1
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
t
RC = tRC(min), IO = 0 mA 2)3)
2)
IDD2P
IDD2N
IDD3N
IDD3P
IDD4
CS =VIH (min.), CKE ≤VIL(max)
2)
35
40
5
30
35
5
30
35
5
25
30
5
CS =VIH (min), CKE≥ VIH(min)
CS = VIH(min), CKE ≥VIH(min)
2)
2)
CS = VIH(min), CKE ≤ VIL(max)
2)3)
110
220
3
90
190
3
90
190
3
70
160
3
4)
IDD5
t
t
RFC = tRFC(min)
RFC = 7.8 µs
IDD6
3
3
3
3
Standard components
Low power components
1.5
1.5
1.5
1.5
1) TA = 0 to 70 °C; VSS = 0 V; VDD, VDDQ = 3.3 V ± 0.3 V
2) These parameters depend on the cycle rate. All values are measured at 166 MHz for -6, at 133 MHz for
-7 and -7.5 and at 100 MHz for -8 components with the outputs open. Input signals are changed once during tCK.
3) These parameters are measured with continuous data stream during read access and all DQ toggling. CL=3 and BL=4 is
assumed and the VDDQ current is excluded.
4) tRFC= tRFC(min) “burst refresh”, tRFC= 7.8 µs “distributed refresh”.
Data Sheet
28
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Electrical Characteristics
4.2
AC Characteristics
Table 13
AC Timing - Absolute Specifications –8/-7.5/–7/-6 1)2)3)
Parameter
Symbol –8
–7.5
–7
–6
Unit Note
PC100–222 PC133–333 PC133–222 PC166–333
Min. Max. Min. Max. Min. Max. Min. Max.
Clock and Clock Enable
Clock Cycle Time
tCK3
tCK2
fCK3
fCK2
tAC3
tAC2
tCH
8
—
—
125
100
6
7.5
10
—
—
7
—
6
—
ns
ns
CL3
CL2
10
—
—
—
—
3
—
7.5
—
—
7.5
—
—
—
—
2
—
Clock Frequency
133
100
5.4
6
143
133
5.4
5.4
—
166
133
5
MHz CL3
MHz CL2
—
—
Access Time from Clock
—
—
ns
ns
ns
ns
ns
CL3
CL23)4)5)
6
—
—
5.4
—
Clock High Pulse Width
Clock Low Pulse Width
Transition time
—
—
2.5
2.5
—
2.5
2.5
0.3
tCL
3
—
—
2
—
tT
0.5 10
0.3 1.2
1.2
0.3
1.2
Setup and Hold Times
Input Setup Time
Input Hold Time
6)
6)
6)
6)
tIS
2
1
2
1
2
—
—
—
—
—
1.5
0.8
1.5
0.8
2
—
—
—
—
—
1.5
0.8
1.5
0.8
2
—
—
—
—
—
1.5
0.8
1.5
0.8
2
—
—
—
—
—
ns
tIH
ns
CKE Setup Time
tCKS
tCKH
tRSC
ns
CKE Hold Time
ns
Mode Register Set-up to
Active delay
CLK
Power Down Mode Entry Time tSB
0
8
0
7.5
0
7
0
6
ns
Common Parameters
7)
7)
7)
7)
Row to Column Delay Time
Row Precharge Time
Row Active Time
tRCD
20
20
48
70
70
—
—
20
20
—
—
15
15
—
—
15
15
—
—
ns
ns
tRP
tRAS
tRC
100k 45
100k 37
100k 36
100k ns
Row Cycle Time
—
—
67
67
—
—
60
63
—
—
60
60
—
—
ns
ns
Row Cycle Time during Auto tRFC
Refresh
7)
Activate(a) to Activate(b)
Command period
tRRD
16
1
—
—
15
1
—
—
14
1
—
—
12
1
—
—
ns
CAS(a) to CAS(b) Command tCCD
CLK
period
Refresh Cycle
Refresh Period (8192 cycles) tREF
–
1
3
64
—
—
–
1
3
64
—
—
–
1
3
64
—
—
–
64
—
—
ms
CLK
ns
Self Refresh Exit Time
Data Out Hold Time
Read Cycle
tSREX
tOH
1
3)5)
2.5
Data Out to Low Impedance
Time
tLZ
0
—
0
—
0
—
0
—
ns
Data Sheet
29
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Electrical Characteristics
Table 13
AC Timing - Absolute Specifications –8/-7.5/–7/-6 (cont’d)1)2)3)
Symbol –8 –7.5 –7
Parameter
–6
Unit Note
PC100–222 PC133–333 PC133–222 PC166–333
Min. Max. Min. Max. Min. Max. Min. Max.
Data Out to High Impedance tHZ
3
8
3
7
3
7
3
6
ns
Time
DQM Data Out Disable
Latency
tDQZ
—
2
—
2
—
2
—
2
CLK
Write Cycle
8)
Last Data Input to Precharge tWR
(Write without AutoPrecharge)
15
—
15
—
—
14
0
—
—
12
0
—
—
ns
9)
Last Data Input to Activate
(Write with AutoPrecharge)
tDAL(min.) (tWR/tCK) + (tRP/tCK)
tDQW
CLK
DQM Write Mask Latency
0
—
0
CLK
1) TA = 0 to 70 °C; VSS = 0 V; VDD, VDDQ = 3.3 V ± 0.3 V, tT = 1 ns
2) For proper power-up see the operation section of this data sheet.
3) AC timing tests for LV-TTL versions have VIL = 0.4 V and VIH = 2.4 V with the timing referenced to the 1.4 V crossover point.
The transition time is measured between VIH and VIL. All AC measurements assume tT = 1 ns with the AC output load circuit
shown in figure below. Specified tAC and tOH parameters are measured with a 50 pF only, without any resistive termination
and with an input signal of 1V / ns edge rate between 0.8 V and 2.0 V.
4) If clock rising time is longer than 1 ns, a time (tT/2 - 0.5) ns has to be added to this parameter.
5) Access time from clock tac is 4.6 ns for PC133 components with no termination and 0 pF load,
Data out hold time toh is 1.8 ns for PC133 components with no termination and 0 pF load.
6) If tT is longer than 1 ns, a time (tT - 1) ns has to be added to this parameter.
7) These parameter account for the number of clock cycles and depend on the operating frequency of the clock, as follows:
the number of clock cycles = specified value of timing period (counted in fractions as a whole number)
8) It is recommended to use two clock cycles between the last data-in and the precharge command in case of a write command
without Auto-Precharge. One clock cycle between the last data-in and the precharge command is also supported, but
restricted to cycle times tck greater or equal the specified twr value, where tck is equal to the actual system clock time.
9) When a Write command with AutoPrecharge has been issued, a time of tDAL(min) has be fullfilled before the next Activate
Command can be applied. For each of the terms, if not already an integer, round up to the next highest integer. tCK is equal
to the actual system clock time.
t C H
2.4 V
0.4 V
1.4
V
C LO C K
tT
tC L
tIH
tIS
IN PU T
1.4 V
tAC
tAC
tLZ
tO H
O U TP U T
1.4 V
I/O
t H Z
50 pF
Measurement conditions for
AC and tOH
IO.vsd
t
Figure 8
Measurement conditions for tAC and tOH
30
Data Sheet
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
5
Timing Diagrams
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Figure 9
Bank Activate Command Cycle
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Figure 10 Burst Read Operation
Data Sheet
31
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
ꢀ%XUVWꢁ/HQJWKꢁ ꢁꢄꢅꢁ&$6ꢁODWHQF\ꢁ ꢁꢆꢅꢁꢂꢃꢁ
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637ꢂꢅꢆꢄꢅꢀ
Figure 11 Read Interrupted by a Read
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Figure 12 Read to Write Interval
Data Sheet
32
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
ꢀ%XUVWꢁ/HQJWKꢁ ꢁꢄꢅꢁ&$6ꢁODWHQF\ꢁ ꢁꢆꢃꢁ
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Figure 13 Minimum Read to Write Interval
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Figure 14 Non-Minimum Read to Write Interval
Data Sheet
33
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
ꢀ%XUVWꢁ/HQJWKꢁ ꢁꢄꢅꢁ&$6ꢁODWHQF\ꢁ ꢁꢆꢅꢁꢂꢃꢁ
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123ꢀ
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Figure 15 Burst Write Operation
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1 Clk Interval
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Figure 16 Write Interrupted by a Write
Data Sheet
34
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
ꢀ%XUVWꢁ/HQJWKꢁ ꢁꢄꢅꢁ&$6ꢁODWHQF\ꢁ ꢁꢆꢅꢁꢂꢃꢁ
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Figure 17 Write Interrupted by a Read
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Figure 18 Burst Write with Auto-Precharge
Data Sheet
35
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
ꢀ%XUVWꢁ/HQJWKꢁ ꢁꢄꢅꢁ&$6ꢁODWHQF\ꢁ ꢁꢆꢅꢁꢂꢃꢁ
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53ꢀ
Figure 19 Burst Read with Auto-Precharge
Data Sheet
36
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
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&RPPDQGꢀ
%DQNꢀ$ꢀ
$FWLYDWHꢀ
$FWLYDWHꢀ
&RPPDQGꢀ
%DQNꢀ%ꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
&RPPDQGꢀ &RPPDQGꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
%DQNꢀ$ꢀ
%DQNꢀ$ꢀ
:ULWHꢀZLWKꢀ
:ULWHꢀZLWKꢀ
$XWRꢀ3UHFKDUJHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
$XWRꢀ3UHFKDUJHꢀ
&RPPDQGꢀ
%DQNꢀ%ꢀ
637ꢂꢅꢐꢄꢂꢀ
Figure 20
AC Parameters for a Write Timing
Data Sheet
37
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢉꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ
7ꢄꢀ
7ꢉꢀ
7ꢅꢀ
7ꢈꢀ
7ꢊꢀ
7ꢋꢀ
7ꢆꢀ
7ꢇꢀ
7ꢐꢀ
7ꢄꢂꢀ
7ꢄꢄꢀ
7ꢄꢉꢀ
7ꢄꢅꢀ
&/.ꢁ
&.(ꢁ
Wꢀ&+ꢀ
Wꢀ&.ꢉꢀ
Wꢀ&/ꢀ
Wꢀ&.+ꢀ
Wꢀ&6ꢀ
%HJLQꢀ$XWRꢀ
3UHFKDUJHꢀ
%DQNꢀ$ꢀ
%HJLQꢀ$XWRꢀ
3UHFKDUJHꢀ
%DQNꢀ%ꢀ
Wꢀ&.6ꢀ
Wꢀ&+ꢀ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
Wꢀ$+ꢀ
$3ꢁ
5$[ꢀ
5$[ꢀ
5%[ꢀ
5$\ꢀ
5$\ꢀ
Wꢀ$6ꢀ
$GGUꢇꢁ
&$[ꢀ
5%[ꢀ
5%[ꢀ
Wꢀ55'ꢀ
Wꢀ5$6ꢀ
Wꢀ5&ꢀ
'40ꢁ
'4ꢁ
Wꢀ
Wꢀ$&ꢉꢀ
Wꢀ+=ꢀ
Wꢀ53ꢀ
/=ꢀ
Wꢀ$&ꢉꢀ
Wꢀ2+ꢀ
Wꢀ5&'ꢀ
Wꢀ+=ꢀ
%[ꢄꢀ
+Lꢏ=ꢀ
$[ꢂꢀ
$[ꢄꢀ
%[ꢂꢀ
$FWLYDWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
5HDGꢀZLWKꢀ
$FWLYDWHꢀ
5HDGꢀZLWKꢀ
3UHFKDUJHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
$FWLYDWHꢀ
$XWRꢀ3UHFKDUJHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
&RPPDQGꢀ
%DQNꢀ%ꢀ
$XWRꢀ3UHFKDUJHꢀ
&RPPDQGꢀ
%DQNꢀ%ꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
637ꢂꢅꢐꢄꢄꢀ
Figure 21 AC Parameters for a Read Timing
Data Sheet
38
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
&.(ꢁ
Wꢀ56&ꢀ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢈꢅꢁ%6ꢉꢁ
$ꢉꢈꢅꢁ$ꢉꢉꢁ
$GGUHVVꢀ.H\ꢀ
$ꢈꢊ$ꢋꢁ
3UHFKDUJHꢀ
&RPPDQGꢀ
$OOꢀ%DQNVꢀ
$Q\ꢀ
&RPPDQGꢀ
0RGHꢀ5HJLVWHUꢀ
637ꢂꢅꢐꢄꢉꢀ
Figure 22 Mode Register Set
Data Sheet
39
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
&.(ꢁ
+LJKꢀ /HYHOꢀ
ꢉꢀ&ORFNꢀPLQꢃꢀ
0LQLPXPꢀRIꢀꢇꢀ5HIUHVKꢀ&\FOHVꢀDUHꢀUHTXLUHGꢀ
LVꢀ UHTXLUHGꢀ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
$GGUHVVꢀ.H\ꢀ
$GGUꢇꢁ
'40ꢁ
Wꢀ53ꢀ
Wꢀ5&ꢀ
+Lꢏ=ꢀ
'4ꢁ
3UHFKDUJHꢀ
&RPPDQGꢀ
$OOꢀ%DQNVꢀ
ꢇWKꢀ$XWRꢀ5HIUHVKꢀ
&RPPDQGꢀ
0RGHꢀ5HJLVWHUꢀ
6HWꢀ&RPPDQGꢀ
$Q\ꢀ
&RPPDQGꢀ
,QSXWVꢀPXVWꢀEHꢀ
VWDEOHꢀIRUꢀ ꢉꢂꢂꢀ Vꢀ
ꢄVWꢀ$XWRꢀ5HIUHVKꢀ
&RPPDQGꢀ
637ꢂꢅꢐꢄꢅꢀ
Figure 23 Power on Sequence and Auto Refresh (CBR)
Data Sheet
40
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.ꢉꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
5$[ꢀ
$GGUꢇꢁ
'40ꢁ
5$[ꢀ
&$[ꢀ
Wꢀ&6/ꢀ
Wꢀ+=ꢀ
Wꢀ&6/ꢀ
$[ꢂꢀ
Wꢀ&6/ꢀ
+Lꢏ=ꢀ
'4ꢁ
$[ꢄꢀ
$[ꢉꢀ
$[ꢅꢀ
$FWLYDWHꢀ
5HDGꢀ
&ORFNꢀ
&ORFNꢀ
&ORFNꢀ
&RPPDQGꢀ &RPPDQGꢀ
6XVSHQGꢀ
ꢄꢀ&\FOHꢀ
6XVSHQGꢀ
ꢉꢀ&\FOHVꢀ
6XVSHQGꢀ
ꢅꢀ&\FOHVꢀ
%DQNꢀ$ꢀ
%DQNꢀ$ꢀ
637ꢂꢅꢐꢄꢈꢀ
Figure 24 Clock Suspension During Burst Read CAS Latency = 2
Data Sheet
41
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢅꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.ꢅꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
5$[ꢀ
$GGUꢇꢁ
'40ꢁ
5$[ꢀ
&$[ꢀ
Wꢀ&6/ꢀ
Wꢀ&6/ꢀ
Wꢀ&6/ꢀ
Wꢀ+=ꢀ
+Lꢏ=ꢀ
'4ꢁ
$[ꢂꢀ
$[ꢄꢀ
$[ꢉꢀ
$[ꢅꢀ
$FWLYDWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
5HDGꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
&ORFNꢀ
&ORFNꢀ
&ORFNꢀ
6XVSHQGꢀ
ꢄꢀ&\FOHꢀ
6XVSHQGꢀ
ꢉꢀ&\FOHVꢀ
6XVSHQGꢀ
ꢅꢀ&\FOHVꢀ
637ꢂꢅꢐꢄꢊꢀ
Figure 25 Clock Suspension During Burst Read CAS Latency = 3
Data Sheet
42
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.ꢉꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
5$[ꢀ
$GGUꢇꢁ
'40ꢁ
'4ꢁ
5$[ꢀ
&$[ꢀ
+Lꢏ=ꢀ
'$[ꢂꢀ
'$[ꢄꢀ
'$[ꢉꢀ
'$[ꢅꢀ
$FWLYDWHꢀ
&ORFNꢀ
&ORFNꢀ
&ORFNꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
6XVSHQGꢀ
ꢄꢀ&\FOHꢀ
6XVSHQGꢀ
ꢉꢀ&\FOHVꢀ
6XVSHQGꢀ
ꢅꢀ&\FOHVꢀ
:ULWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
637ꢂꢅꢐꢄꢋꢀ
Figure 26 Clock Suspension During Burst Write CAS Latency = 2
Data Sheet
43
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢅꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.ꢅꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%$ꢁ
$ꢌꢍ$3ꢁ
$GGUꢇꢁ
'40[ꢁ
'4ꢁ
5$[ꢀ
5$[ꢀ
&$[ꢀ
+Lꢏ=ꢀ
'$[ꢂꢀ
'$[ꢄꢀ
'$[ꢉꢀ
'$[ꢅꢀ
$FWLYDWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
&ORFNꢀ
&ORFNꢀ
&ORFNꢀ
6XVSHQGꢀ
ꢄꢀ&\FOHꢀ
6XVSHQGꢀ
ꢉꢀ&\FOHVꢀ
6XVSHQGꢀ
ꢅꢀ&\FOHVꢀ
:ULWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
637ꢂꢅꢐꢄꢆꢀ
Figure 27 Clock Suspension During Burst Write CAS Latency = 3
Data Sheet
44
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.6ꢀ
Wꢀ&.6ꢀ
Wꢀ&.ꢉꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
5$[ꢀ
$GGUꢇꢁ
'40ꢁ
5$[ꢀ
&$[ꢀ
Wꢀ+=ꢀ
+Lꢏ=ꢀ
'4ꢁ
$[ꢂꢀ $[ꢄꢀ
$[ꢉꢀ
$[ꢅꢀ
$FWLYDWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
$FWLYHꢀ
5HDGꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
&ORFNꢀ0DVNꢀ
6WDUWꢀ
&ORFNꢀ0DVNꢀ
(QGꢀ
3UHFKDUJHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
3UHFKDUJHꢀ
6WDQGE\ꢀ
$Q\ꢀ
6WDQGE\ꢀ
&RPPDQGꢀ
&ORFNꢀ6XVSHQGꢀ
0RGHꢀ(QWU\ꢀ
&ORFNꢀ6XVSHQGꢀ
0RGHꢀ([LWꢀ
3RZHUꢀ'RZQꢀ
0RGHꢀ(QWU\ꢀ
3RZHUꢀ'RZQꢀ
0RGHꢀ([LWꢀ
637ꢂꢅꢐꢄꢇꢀ
Figure 28 Power Down Mode and Clock Suspend
Data Sheet
45
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
&.(ꢁ
Wꢀ&.6ꢀ
Wꢀ&.6ꢀ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
$GGUꢇꢁ
Wꢀ65(;ꢀ
Wꢀ5&ꢀ
'40ꢁ
'4ꢁ
+Lꢏ=ꢀ
$OOꢀ%DQNVꢀ
PXVWꢀEHꢀLGOHꢀ
6HOIꢀ5HIUHVKꢀ
(QWU\ꢀ
%HJLQꢀ6HOIꢀ5HIUHVKꢀ
([LWꢀ&RPPDQGꢀ
$Q\ꢀ
&RPPDQGꢀ
6HOIꢀ5HIUHVKꢀ([LWꢀ
&RPPDQGꢀLVVXHGꢀ
6HOIꢀ5HIUHVKꢀ
([LWꢀ
637ꢂꢅꢐꢄꢐꢀ
Figure 29 Self Refresh (Entry and Exit)
Data Sheet
46
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.ꢉꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
5$[ꢀ
$GGUꢇꢁ
5$[ꢀ
&$[ꢀ
Wꢀ5&ꢀ
Wꢀ5&ꢀ
Wꢀ53ꢀ
ꢑ0LQLPXPꢀ,QWHUYDOꢒꢀ
'40ꢁ
'4ꢁ
+Lꢏ=ꢀ
$[ꢂꢀ $[ꢄꢀ $[ꢉꢀ $[ꢅꢀ
3UHFKDUJHꢀ $XWRꢀ5HIUHVKꢀ
$XWRꢀ5HIUHVKꢀ
&RPPDQGꢀ
$FWLYDWHꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
5HDGꢀ
&RPPDQGꢀ
%DQNꢀ$ꢀ
&RPPDQGꢀ
$OOꢀ%DQNVꢀ
&RPPDQGꢀ
637ꢂꢅꢐꢉꢂꢀ
Figure 30 Auto Refresh (CBR)
Data Sheet
47
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
Wꢀ&.ꢉꢀ
&.(ꢁ
&6ꢁ
5$6ꢁ
&$6ꢁ
:(ꢁ
%6ꢁ
$3ꢁ
5$Zꢀ
5$Zꢀ
5$]ꢀ
5$]ꢀ
$GGUꢇꢁ
'40ꢁ
'4ꢁ
&$Zꢀ
&$[ꢀ
&$\ꢀ
&$]ꢀ
+Lꢀ=ꢀ
$Zꢂꢀ $Zꢄꢀ $Zꢉꢀ $Zꢅꢀ $[ꢂꢀ $[ꢄꢀ $\ꢂꢀ $\ꢄꢀ $\ꢉꢀ $\ꢅꢀ
$]ꢂꢀ $]ꢄꢀ $]ꢉꢀ $]ꢅꢀ
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%DQNꢀ$ꢀ
%DQNꢀ$ꢀ
%DQNꢀ$ꢀ
637ꢂꢅꢐꢉꢄꢀ
Figure 31 CAS Latency = 2
Data Sheet
48
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢅꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
&/.ꢁ
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$FWLYDWHꢀ
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637ꢂꢅꢐꢉꢉꢀ
%DQNꢀ$ꢀ
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Figure 32 CAS Latency = 3
Data Sheet
49
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
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637ꢂꢅꢐꢉꢅꢀ
Figure 33 CAS Latency = 2
Data Sheet
50
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢈꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢅꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
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:ULWHꢀ
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Figure 34 CAS Latency = 3
Data Sheet
51
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢇꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
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Figure 35 CAS Latency = 2
Data Sheet
52
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢇꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢅꢀ
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Figure 36 CAS Latency = 3
Data Sheet
53
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢇꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
7ꢂꢀ 7ꢄꢀ 7ꢉꢀ 7ꢅꢀ 7ꢈꢀ 7ꢊꢀ 7ꢋꢀ 7ꢆꢀ 7ꢇꢀ 7ꢐꢀ 7ꢄꢂꢀ 7ꢄꢄꢀ 7ꢄꢉꢀ 7ꢄꢅꢀ 7ꢄꢈꢀ 7ꢄꢊꢀ 7ꢄꢋꢀ 7ꢄꢆꢀ 7ꢄꢇꢀ 7ꢄꢐꢀ 7ꢉꢂꢀ 7ꢉꢄꢀ 7ꢉꢉꢀ
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Figure 37 CAS Latency = 2
Data Sheet
54
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢇꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢅꢀ
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Figure 38 CAS Latency = 3
Data Sheet
55
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
%XUVWꢀ/HQJWKꢀ ꢀꢇꢀRUꢀ)XOOꢀ3DJHꢌꢀ&$6ꢀ/DWHQF\ꢀ ꢀꢉꢀ
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Figure 39 CAS Latency = 2
Data Sheet
56
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Timing Diagrams
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Figure 40 Full Page Burst Read, CAS Latency = 2
Data Sheet
57
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
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HYB39S256[40/80/16]0D[C/T](L)
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Timing Diagrams
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Figure 41 Full Page Burst Write, CAS Latency = 3
Data Sheet
58
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Package Outlines
6
Package Outlines
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Figure 42 Package Outline P-TSOPII-54-1 (top view)
Data Sheet
59
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Package Outlines
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Figure 43 Package Outline P-TFBGA-54-8
Data Sheet
60
Rev. 1.30, 2006-02
10072003-13LE-FGQQ
w w w . i n f i n e o n . c o m
Published by Infineon Technologies AG
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