HYM322030GS-50 [INFINEON]

2M x 32-Bit Dynamic RAM Module; 2M ×32位动态RAM模块
HYM322030GS-50
型号: HYM322030GS-50
厂家: Infineon    Infineon
描述:

2M x 32-Bit Dynamic RAM Module
2M ×32位动态RAM模块

内存集成电路 动态存储器
文件: 总10页 (文件大小:81K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2M x 32-Bit Dynamic RAM Module  
HYM 322030S/GS-50/-60/-70  
Advanced Information  
2 097 152 words by 32-bit organization  
1 memory bank  
Fast access and cycle time  
50 ns access time  
90 ns cycle time (-50 version)  
60 ns access time  
110 ns cycle time (-60 version)  
70 ns access time  
130 ns cycle time (-70 version)  
Fast page mode capability  
35 ns cycle time (-50 version)  
40 ns cycle time (-60 version)  
45 ns cycle time (-70 version)  
Single + 5 V (± 10 %) supply  
Low power dissipation  
max. 2640 mW active (-50 version)  
max. 2420 mW active (-60 version)  
max. 2200 mW active (-70 version)  
CMOS – 22 mW standby  
TTL  
–44 mW standby  
CAS-before-RAS refresh  
RAS-only-refresh  
Hidden-refresh  
4 decoupling capacitors mounted on substrate  
All inputs, outputs and clocks fully TTL compatible  
72 pin Single in-Line Memory Module (L-SIM-72-9 ) with 20.32 mm (800 mil) height  
Utilizes four 2M × 8 -DRAMs in 400 mil SOJ packages  
2048 refresh cycles / 32 ms with 11/10 addressing  
Optimized for use in byte-write non-parity applications  
Tin-Lead contact pads (S-version)  
Gold contact pads (GS - version)  
Semicounductor Group  
1
9.95  
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
The HYM 322030S/GS-50/-60/-70 is a 8 MByte DRAM module organized as 2 097 152 words by  
32-bit in a 72-pin single-in-line package comprising four HYB 5117800BSJ 2M × 8 DRAMs in 400  
mil wide SOJ-packages mounted together with four 0.2 µF ceramic decoupling capacitors on a PC  
board.  
Each HYB 5117800BSJ is described in the data sheet and is fully electrical tested and processed  
according to SIEMENS standard quality procedure prior to module assembly. After assembly onto  
the board, a further set of electrical tests is performed.  
The speed of the module can be detected by the use of four presence detect pins.  
The common I/O feature on the HYM 322030S/GS-60/-70 dictates the use of early write cycles.  
Ordering Information  
Type  
Ordering Code  
Package  
Description  
HYM 322030S-50  
on request  
L-SIM-72-9  
DRAM Module  
(access time 50 ns)  
HYM 322030S-60  
HYM 322030S-70  
HYM 322030GS-50  
HYM 322030GS-60  
HYM 322030GS-70  
Q67100-Q976  
Q67100-Q977  
on request  
L-SIM-72-9  
L-SIM-72-9  
L-SIM-72-9  
L-SIM-72-9  
L-SIM-72-9  
DRAM Module  
(access time 60 ns)  
DRAM Module  
(access time 70 ns)  
DRAM Module  
(access time 50 ns)  
Q67100-Q2018  
Q67100-Q2019  
DRAM Module  
(access time 60 ns)  
DRAM Module  
(access time 70 ns)  
Semiconductor Group  
2
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
Pin Configuration  
Pin Names  
VSS 1 DQ0  
DQ16 3 DQ1  
DQ17 5 DQ2  
DQ18 7 DQ3  
DQ19 9 VCC 10  
N.C. 11 A0  
2
4
6
8
A0R-A10R  
A0C-A9C  
DQ0-DQ31  
CAS0 - CAS3  
RAS0, RAS2  
WE  
Row Address Inputs  
Column Address Inputs  
Data Input/Output  
Column Address Strobe  
Row Address Strobe  
Read/Write Input  
Power (+ 5 V)  
12  
14  
A1  
A3  
A5  
13 A2  
15 A4 16  
17 A6 18  
A10 19 DQ4 20  
DQ20 21 DQ5 22  
DQ21 23 DQ6 24  
DQ22 25 DQ7 26  
VCC  
VSS  
Ground  
DQ23 27 A7  
N.C. 29 VCC 30  
A8 31 A9 32  
N.C. 33 RAS2 34  
N.C. 35 N.C. 36  
28  
PD  
Presence Detect Pin  
No Connection  
N.C.  
N.C. 37 N.C. 38  
VSS 39 CAS0 40  
CAS2 41 CAS3 42  
CAS1 43 RAS0 44  
N.C. 45 N.C. 46  
WE  
47 N.C. 48  
Presence Detect Pins  
DQ8 49 DQ24 50  
DQ9 51 DQ25 52  
DQ10 53 DQ26 54  
DQ11 55 DQ27 56  
DQ12 57 DQ28 58  
VCC 59 DQ29 60  
DQ13 61 DQ30 62  
DQ14 63 DQ31 64  
DQ15 65 N.C. 66  
PD0 67 PD1 68  
PD2 69 PD3 70  
N.C. 71 VSS 72  
-50  
-60  
-70  
PD0  
PD1  
PD2  
PD3  
N.C.  
N.C.  
VSS  
N.C.  
N.C.  
N.C.  
N.C.  
N.C.  
N.C.  
VSS  
VSS  
N.C.  
Semiconductor Group  
3
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
RAS0  
CAS0  
CAS  
RAS  
D1  
DQ0-DQ7  
I/O1-I/O8  
OE  
CAS1  
CAS  
RAS  
D2  
DQ8-DQ15  
I/O1-I/O8  
OE  
RAS2  
CAS2  
CAS  
RAS  
D3  
DQ16-DQ23  
I/O1-I/O8  
OE  
CAS3  
CAS  
RAS  
D4  
DQ24-DQ31  
I/O1-I/O8  
OE  
A0R - A10R,  
A0C - A9C  
D1 - D4  
D1 - D4  
WE  
VCC  
VSS  
C1 - C 4  
Block Diagram  
Semiconductor Group  
4
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
Absolute Maximum Ratings  
Operation temperature range .........................................................................................0 to + 70 °C  
Storage temperature range......................................................................................... – 55 to 125 °C  
Input/output voltage ............................................................................–0.5V to min (Vcc+0.5, 7.0) V  
Power supply voltage...................................................................................................... – 1 to + 7 V  
Power dissipation..................................................................................................................... 4.2 W  
Data out current (short circuit) ................................................................................................ 50 mA  
Note: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent  
damage of the device. Exposure to absolute maximum rating conditions for extended periods  
may affect device reliability.  
DC Characteristics  
TA = 0 to 70 °C, VCC = 5 V ± 10 %  
Parameter  
Symbol  
Limit Values  
Unit Test  
Condition  
min.  
max.  
Vcc+0.5  
0.8  
1)  
1)  
1)  
1)  
1)  
Input high voltage  
VIH  
VIL  
2.4  
– 0.5  
2.4  
V
Input low voltage  
V
Output high voltage (IOUT = – 5 mA)  
Output low voltage (IOUT = 4.2 mA)  
VOH  
VOL  
II(L)  
V
0.4  
V
Input leakage current  
– 10  
10  
µA  
(0 V < VIN < 6.5 V, all other pins = 0 V)  
1)  
Output leakage current  
(DO is disabled, 0 V < VOUT < 5.5 V)  
IO(L)  
ICC1  
– 10  
10  
µA  
Average VCC supply current  
(RAS, CAS, address cycling, tRC = tRC min)  
-50 version  
2),3),4)  
480  
440  
400  
mA  
mA  
mA  
-60 version  
-70 version  
Standby VCC supply current  
(RAS = CAS = VIH)  
ICC2  
ICC3  
8
mA  
Average VCC supply current  
during RAS only refresh cycles  
(RAS cycling, CAS = VIH, tRC = tRC min)  
-50 version  
2), 4)  
480  
440  
400  
mA  
mA  
mA  
-60 version  
-70 version  
Semiconductor Group  
5
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
DC Characteristics1) (cont’d)  
Parameter  
Symbol  
Limit Values  
Unit Test  
Condition  
min.  
max.  
Average VCC supply current  
during fast page mode  
ICC4  
(RAS = VIL, CAS, address cycling,  
tPC = tPC min)  
2), 3), 4)  
-50 version  
-60 version  
-70 version  
160  
140  
120  
mA  
mA  
mA  
Standby VCC supply current  
(RAS = CAS = VCC – 0.2 V)  
ICC5  
ICC6  
4
mA  
Average VCC supply current  
during CAS-before-RAS refresh mode  
(RAS, CAS cycling, tRC = tRC min)  
-50 version  
2), 4)  
480  
440  
400  
mA  
mA  
mA  
-60 version  
-70 version  
Capacitance  
TA = 0 to 70 °C, VCC = 5 V ± 10 %, f = 1 MHz  
Parameter  
Symbol  
Limit Values  
Unit  
min.  
max.  
40  
Input capacitance (A0 to A11)  
Input capacitance (RAS0, RAS2)  
Input capacitance (CAS0 - CAS3)  
Input capacitance (WE)  
CI1  
CI2  
CI3  
CI4  
CIO  
pF  
pF  
pF  
pF  
pF  
45  
45  
45  
I/O capacitance  
(DQ0-DQ31)  
25  
Semiconductor Group  
6
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
5)6)  
16F  
AC Characteristics  
TA = 0 to 70 °C,VCC = 5 V ± 10 %, tT = 5 ns  
Symbol  
Unit Note  
Parameter  
Limit Values  
-60  
-50  
-70  
min. max. min. max. min. max.  
common parameters  
Random read or write cycle time tRC  
90  
30  
50  
13  
0
110  
40  
60  
15  
0
130  
50  
70  
20  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RAS precharge time  
RAS pulse width  
tRP  
tRAS  
tCAS  
tASR  
tRAH  
tASC  
tCAH  
tRCD  
tRAD  
10k  
10k  
10k  
10k  
10k  
10k  
CAS pulse width  
Row address setup time  
Row address hold time  
Column address setup time  
Column address hold time  
RAS to CAS delay time  
8
10  
0
10  
0
0
10  
18  
13  
15  
20  
15  
15  
20  
15  
37  
25  
45  
30  
50  
35  
RAS to column address delay  
time  
ns  
RAS hold time  
tRSH  
tCSH  
tCRP  
tT  
13  
50  
5
15  
60  
5
20  
70  
5
ns  
ns  
ns  
CAS hold time  
CAS to RAS precharge time  
Transition time (rise and fall)  
Refresh period  
3
50  
32  
3
50  
32  
3
50  
32  
ns  
7
tREF  
ms  
Read Cycle  
Access time from RAS  
Access time from CAS  
tRAC  
tCAC  
50  
13  
25  
60  
15  
30  
70  
20  
35  
ns 8, 9  
ns 8, 9  
ns 8,10  
ns  
Access time from column address tAA  
Column address to RAS lead time tRAL  
25  
0
30  
0
35  
0
Read command setup time  
Read command hold time  
tRCS  
tRCH  
tRRH  
ns  
0
0
0
ns 11  
ns 11  
Read command hold time  
referenced to RAS  
0
0
0
CAS to output in low-Z  
tCLZ  
tOFF  
0
0
0
0
0
0
ns  
8
Output buffer turn-off delay  
13  
15  
20  
ns 12  
Semiconductor Group  
7
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
5)6)  
16F  
AC Characteristics (cont’d)  
TA = 0 to 70 °C,VCC = 5 V ± 10 %, tT = 5 ns  
Symbol  
Unit Note  
Parameter  
Limit Values  
-60  
-50  
-70  
min. max. min. max. min. max.  
Early Write Cycle  
Write command hold time  
Write command pulse width  
Write command setup time  
tWCH  
tWP  
8
10  
10  
0
10  
10  
0
ns  
8
ns  
tWCS  
0
ns 15  
ns  
Write command to RAS lead time tRWL  
Write command to CAS lead time tCWL  
13  
13  
0
15  
15  
0
20  
20  
0
ns  
Data setup time  
Data hold time  
tDS  
tDH  
ns 16  
ns 16  
10  
10  
15  
Fast Page Mode Cycle  
Fast page mode cycle time  
CAS precharge time  
tPC  
tCP  
35  
10  
40  
10  
45  
10  
ns  
ns  
Access time from CAS precharge tCPA  
30  
35  
40  
ns  
7
RAS pulse width  
tRAS  
50  
30  
200k 60  
200k 70  
200k ns  
CAS precharge to RAS Delay  
tRHPC  
35  
40  
ns  
CAS-before-RAS Refresh Cycle  
CAS setup time  
tCSR  
tCHR  
tRPC  
tWRP  
10  
10  
5
10  
10  
5
10  
10  
5
ns  
ns  
ns  
ns  
CAS hold time  
RAS to CAS precharge time  
Write to RAS precharge time  
10  
10  
10  
Semiconductor Group  
8
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
Notes:  
1) All voltages are referenced to VSS.  
2) ICC1, ICC3, ICC4 and ICC6 depend on cycle rate.  
3) ICC1 and ICC4 depend on output loading. Specified values are measured with the output open.  
4) Address can be changed once or less while RAS = VIL. In the case of ICC4 it can be changed once or less  
during a fast page mode cycle (tPC).  
5) An initial pause of 200 µs is required after power-up followed by 8 RAS cycles of which at least one cycle has  
to be a refresh cycle, before proper device operation is achieved. In case of using internal refresh counter, a  
minimum of 8 CAS-before-RAS initialization cycles instead of 8 RAS cycles are required.  
6) AC measurements assume tT = 5 ns.  
7) VIH (min.) and VIL (max.) are reference levels for measuring timing of input signals. Transition times are also  
measured between VIH and VIL.  
8) Measured with a load equivalent to 2 TTL loads and 100 pF.  
9) Operation within the tRCD (max.) limit ensures that tRAC (max.) can be met. tRCD (max.) is specified as a  
reference point only: If tRCD is greater than the specified tRCD (max.) limit, then access time is controlled by  
tCAC.  
10)Operation within the tRAD (max.) limit ensures that tRAC (max.) can be met. tRAD (max.) is specified as a  
reference point only: If tRAD is greater than the specified tRAD (max.) limit, then access time is controlled by  
tAA.  
11)Either tRCH or tRRH must be satisfied for a read cycle.  
12)tOFF (max.) define the time at which the outputs achieve the open-circuit condition and are not referenced to  
output voltage levels  
.
13)tWCS is not a restrictive operating parameter. This is included in the data sheet as electrical characteristics  
only. If tWCS > tWCS (min.), the cycle is an early write cycle and the I/O pin will remain open-circuit (high  
impedance) through the entire cycle.  
14)These parameters are referenced to the CAS leading edge.  
Semiconductor Group  
9
HYM 322030S/GS-50/-60/-70  
2M × 32-Bit  
Package Outline  
Dimensions in mm  
GLS05789  
Module Package L-SIM-72-9  
(Single in-Line Memory Module)  
Semiconductor Group  
10  

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