IPB600N25N3 G [INFINEON]

英飞凌 250V OptiMOS™ 产品采用性能先进标杆技术,完全适合在 48V 系统、直流-直流转换器、不间断电源 (UPS) 和直流电机驱动逆变器中用于异步整流。;
IPB600N25N3 G
型号: IPB600N25N3 G
厂家: Infineon    Infineon
描述:

英飞凌 250V OptiMOS™ 产品采用性能先进标杆技术,完全适合在 48V 系统、直流-直流转换器、不间断电源 (UPS) 和直流电机驱动逆变器中用于异步整流。

电机 驱动 转换器
文件: 总11页 (文件大小:689K)
中文:  中文翻译
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IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
OptiMOSTM3 Power-Transistor  
Product Summary  
Features  
VDS  
250  
60  
V
• N-channel, normal level  
RDS(on),max  
ID  
mW  
A
• Excellent gate charge x R DS(on) product (FOM)  
• Very low on-resistance R DS(on)  
25  
• 175 °C operating temperature  
• Pb-free lead plating; RoHS compliant  
• Qualified according to JEDEC1) for target application  
• Halogen-free according to IEC61249-2-21  
• Ideal for high-frequency switching and synchronous rectification  
Type  
IPB600N25N3 G  
IPP600N25N3 G  
IPI600N25N3 G  
Package  
Marking  
PG-TO263-3  
600N25N  
PG-TO220-3  
600N25N  
PG-TO262-3  
600N25N  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
T C=25 °C  
T C=100 °C  
T C=25 °C  
Continuous drain current  
25  
18  
A
Pulsed drain current2)  
I D,pulse  
E AS  
100  
210  
I D=25 A, R GS=25 W  
Avalanche energy, single pulse  
mJ  
Reverse diode dv /dt  
dv /dt  
10  
kV/µs  
V GS  
Gate source voltage  
±20  
V
P tot  
T C=25 °C  
Power dissipation  
136  
W
°C  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... 175  
55/175/56  
1)J-STD20 and JESD22  
2) See figure 3  
Rev. 2.3  
page 1  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
R thJC  
Thermal resistance, junction - case  
-
-
-
-
-
-
1.1  
62  
40  
K/W  
R thJA  
minimal footprint  
Thermal resistance, junction -  
ambient  
6 cm2 cooling area3)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS=0 V, I D=1 mA  
V GS(th) V DS=V GS, I D=90 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
250  
2
-
-
V
3
4
V DS=200 V, V GS=0 V,  
T j=25 °C  
I DSS  
Zero gate voltage drain current  
-
-
0.1  
10  
1
µA  
V DS=200 V, V GS=0 V,  
T j=125 °C  
100  
I GSS  
V GS=20 V, V DS=0 V  
Gate-source leakage current  
Drain-source on-state resistance  
Gate resistance  
-
-
-
1
100 nA  
R DS(on) V GS=10 V, I D=25 A  
51  
2.5  
60  
-
mW  
R G  
W
|V DS|>2|I D|R DS(on)max  
I D=25 A  
,
g fs  
Transconductance  
24  
47  
-
S
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 2.3  
page 2  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
1770  
112  
3
2350 pF  
V GS=0 V, V DS=100 V,  
f =1 MHz  
C oss  
C rss  
t d(on)  
t r  
149  
-
10  
10  
22  
8
-
-
-
-
ns  
V DD=100 V,  
V GS=10 V, I D=12 A,  
R G=1.6 W  
t d(off)  
t f  
Turn-off delay time  
Fall time  
Gate Charge Characteristics4)  
Gate to source charge  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
8
2
-
-
nC  
Q gd  
V DD=100 V, I D=12 A,  
V GS=0 to 10 V  
Q sw  
Q g  
5
-
Gate charge total  
22  
4.3  
45  
29  
-
V plateau  
Q oss  
Gate plateau voltage  
Output charge  
V
V DD=100 V, V GS=0 V  
60  
nC  
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
25  
A
T C=25 °C  
I S,pulse  
100  
V GS=0 V, I F=25 A,  
T j=25 °C  
V SD  
Diode forward voltage  
-
1
1.2  
V
t rr  
Reverse recovery time  
-
-
127  
604  
-
-
ns  
V R=100 V, I F=12A ,  
di F/dt =100 A/µs  
Q rr  
Reverse recovery charge  
nC  
4) See figure 16 for gate charge parameter definition  
Rev. 2.3  
page 3  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
1 Power dissipation  
2 Drain current  
P tot=f(T C)  
I D=f(T C); V GS≥10 V  
160  
140  
120  
100  
80  
30  
20  
10  
0
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
TC [°C]  
TC [°C]  
3 Safe operating area  
I D=f(V DS); T C=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
Z thJC=f(t p)  
parameter: D =t p/T  
103  
102  
101  
100  
10-1  
1 µs  
100  
10 µs  
100 µs  
0.5  
0.2  
0.1  
1 ms  
10-1  
10 ms  
DC  
0.05  
0.02  
0.01  
single pulse  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
10-1  
100  
101  
102  
103  
tp [s]  
VDS [V]  
Rev. 2.3  
page 4  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
R DS(on)=f(I D); T j=25 °C  
parameter: V GS  
parameter: V GS  
60  
50  
40  
30  
20  
10  
0
100  
10 V  
7 V  
80  
5 V  
4.5 V  
5 V  
60  
40  
20  
0
7 V  
10 V  
4.5 V  
0
1
2
3
4
5
0
10  
20  
30  
40  
50  
VDS [V]  
ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
40  
30  
20  
80  
70  
60  
50  
40  
30  
20  
10  
0
175 °C  
10  
25 °C  
0
0
2
4
6
8
0
25  
50  
75  
VGS [V]  
ID [A]  
Rev. 2.3  
page 5  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
R DS(on)=f(T j); I D=25 A; V GS=10 V  
V GS(th)=f(T j); V GS=V DS  
parameter: I D  
200  
180  
160  
140  
120  
100  
4
3.5  
3
900 µA  
90 µA  
2.5  
2
98%  
80  
1.5  
1
typ  
60  
40  
20  
0
0.5  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
Tj [°C]  
100  
140  
180  
Tj [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
104  
103  
Ciss  
103  
102  
Coss  
25 °C  
102  
175 °C  
101  
25°C, 98%  
Crss  
101  
175°C, 98%  
100  
0
0.5  
1
1.5  
2
0
40  
80  
120  
160  
VSD [V]  
VDS [V]  
Rev. 2.3  
page 6  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
13 Avalanche characteristics  
14 Typ. gate charge  
V GS=f(Q gate); I D=12 A pulsed  
parameter: V DD  
I AS=f(t AV); R GS=25 W  
parameter: T j(start)  
100  
10  
8
200 V  
125 V  
25 °C  
6
4
2
0
100 °C  
50 V  
10  
125 °C  
1
1
10  
100  
1000  
0
10  
20  
30  
tAV [µs]  
Qgate [nC]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V BR(DSS)=f(T j); I D=1 mA  
290  
280  
270  
260  
250  
240  
230  
220  
V GS  
Qg  
V gs(th)  
Qg(th)  
Qsw  
Qgd  
Qgate  
Qgs  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Rev. 2.3  
page 7  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
PG-TO220-3: Outline  
Rev. 2.3  
page 8  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
PG-TO263-3: Outline  
Rev. 2.3  
page 9  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
PG-TO262-3: Outline  
Rev. 2.3  
page 10  
2011-07-14  
IPB600N25N3 G IPP600N25N3 G  
IPI600N25N3 G  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 2.3  
page 11  
2011-07-14  

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