IPG20N06S2L65AUMA1 [INFINEON]

Power Field-Effect Transistor, 20A I(D), 55V, 0.065ohm, 2-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, GREEN, PLASTIC, TDSON-8;
IPG20N06S2L65AUMA1
型号: IPG20N06S2L65AUMA1
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 20A I(D), 55V, 0.065ohm, 2-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, GREEN, PLASTIC, TDSON-8

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IPG20N06S2L-65  
OptiMOS® Power-Transistor  
Product Summary  
VDS  
55  
65  
20  
V
3)  
m  
A
R DS(on),max  
I D  
Features  
• Dual N-channel Logic Level - Enhancement mode  
PG-TDSON-8-4  
• AEC Q101 qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green Product (RoHS compliant)  
• 100% Avalanche tested  
Type  
Package  
Marking  
IPG20N06S2L-65  
PG-TDSON-8-4 2N06L65  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
Continuous drain current  
one channel active1)  
I D  
T C=25 °C, VGS=10 V  
20  
14  
80  
A
T C=100 °C, VGS=10 V  
Pulsed drain current1)  
one channel active  
I D,pulse  
-
Avalanche energy, single pulse1, 3)  
Avalanche current, single pulse3)  
Gate source voltage  
EAS  
I AS  
I D=10A  
40  
15  
mJ  
A
-
VGS  
-
±20  
V
Power dissipation  
one channel active  
Ptot  
T C=25 °C  
43  
W
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-
-
-55 ... +175  
55/175/56  
°C  
-
Rev. 1.0  
page 1  
2009-09-07  
IPG20N06S2L-65  
Values  
Parameter  
Symbol  
Conditions  
Unit  
min.  
typ.  
max.  
Thermal characteristics1)  
R thJC  
R thJA  
Thermal resistance, junction - case  
SMD version, device on PCB  
-
-
-
-
-
3.5  
K/W  
minimal footprint  
100  
60  
-
-
6 cm2 cooling area2)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS  
VGS(th)  
V
V
GS=0 V, I D= 1 mA  
DS=VGS, I D=14 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
55  
-
-
V
1.2  
1.6  
2.0  
V
DS=55 V, VGS=0 V,  
Zero gate voltage drain current3)  
I DSS  
-
-
0.01  
1
1
µA  
T j=25 °C  
V
DS=55 V, VGS=0 V,  
100  
T j=125 °C2)  
Gate-source leakage current3)  
Drain-source on-state resistance3)  
I GSS  
V
V
V
GS=20 V, VDS=0 V  
GS=4.5 V, I D=7.5A  
GS=10 V, I D=15A  
-
-
-
1
100 nA  
R DS(on)  
67  
53  
79  
65  
mΩ  
Rev. 1.0  
page 2  
2009-09-07  
IPG20N06S2L-65  
Values  
Parameter  
Symbol  
Conditions  
Unit  
min.  
typ.  
max.  
Dynamic characteristics1)  
Input capacitance3)  
Output capacitance3)  
Reverse transfer capacitance3)  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
315  
90  
35  
2
410 pF  
120  
V
GS=0 V, VDS=25 V,  
f =1 MHz  
50  
-
-
-
-
ns  
V
V
DD=27.5 V,  
GS=10 V, I D=20 A,  
3
t d(off)  
t f  
Turn-off delay time  
Fall time  
10  
7
R G=11 Ω  
Gate Charge Characteristics1, 3)  
Gate to source charge  
Gate to drain charge  
Q gs  
-
-
-
-
1.2  
3.5  
9.4  
3.9  
1.6  
5.3  
12  
-
nC  
Q gd  
V
V
DD=44 V, I D=20 A,  
GS=0 to 10 V  
Q g  
Gate charge total  
Vplateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current1)  
one channel active  
I S  
-
-
-
-
-
-
20  
80  
1.3  
-
T C=25 °C  
Diode pulse current1)  
one channel active  
I S,pulse  
VSD  
t rr  
-
V
GS=0 V, I F=15 A,  
Diode forward voltage  
1.0  
30  
28  
V
T j=25 °C  
VR=27.5 V, I F=I S,  
diF/dt =100 A/µs  
Reverse recovery time1)  
Reverse recovery charge1, 3)  
ns  
nC  
Q rr  
-
1) Specified by design. Not subject to production test.  
2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
3) Per channel  
Rev. 1.0  
page 3  
2009-09-07  
IPG20N06S2L-65  
1 Power dissipation  
2 Drain current  
P
tot = f(T C); VGS 6 V; one channel active  
I D = f(T C); VGS 6 V; one channel active  
45  
40  
35  
30  
25  
20  
15  
10  
5
25  
20  
15  
10  
5
0
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
C [°C]  
T
C [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
thJC = f(t p)  
I D=f(VDS); T C=25°C; D =0; one channel active  
parameter: t p  
Z
parameter: D =t p/T  
101  
100  
1 µs  
0.5  
10 µs  
100  
0.1  
10  
100 µs  
0.05  
10-1  
0.01  
1 ms  
single pulse  
10-2  
1
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
1
10  
100  
t p [s]  
V
DS [V]  
Rev. 1.0  
page 4  
2009-09-07  
IPG20N06S2L-65  
5 Typ. output characteristics3)  
I D = f(VDS); T j = 25 °C  
parameter: VGS  
6 Typ. drain-source on-state resistance3)  
R
DS(on) = f(I D); T j = 25 °C  
parameter: VGS  
80  
60  
40  
20  
0
160  
4.5 V  
5.5 V  
5 V  
4 V  
3.5 V  
10 V  
140  
120  
100  
80  
5 V  
4.5 V  
4 V  
60  
3.5 V  
3 V  
10 V  
40  
0
0
1
2
3
4
5
20  
40  
60  
80  
V
DS [V]  
I
D [A]  
7 Typ. transfer characteristics3)  
I D = f(VGS); VDS = 6V  
parameter: T j  
8 Typ. drain-source on-state resistance3)  
R
DS(on) = f(T j); I D = 15 A; VGS = 10 V  
80  
60  
40  
20  
0
120  
-55 °C  
25 °C  
100  
80  
60  
40  
20  
175 °C  
1
2
3
4
5
6
7
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
GS [V]  
Rev. 1.0  
page 5  
2009-09-07  
IPG20N06S2L-65  
10 Typ. Capacitances3)  
C = f(VDS); VGS = 0 V; f = 1 MHz  
9 Typ. gate threshold voltage  
GS(th) = f(T j); VGS = VDS  
V
parameter: I D  
2.5  
104  
103  
102  
101  
2
1.5  
1
140µA  
14µA  
Ciss  
Coss  
Crss  
0.5  
0
0
5
10  
15  
20  
25  
30  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
DS [V]  
11 Typical forward diode characteristicis3)  
12 Avalanche characteristics3)  
IF = f(VSD)  
I A S= f(t AV)  
parameter: T j  
parameter: Tj(start)  
102  
100  
10  
1
25 °C  
101  
100 °C  
150 °C  
25 °C  
175 °C  
100  
0.1  
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
10  
100  
1000  
V
SD [V]  
t AV [µs]  
Rev. 1.0  
page 6  
2009-09-07  
IPG20N06S2L-65  
13 Avalanche energy3)  
14 Drain-source breakdown voltage  
E
AS = f(T j)  
V
BR(DSS) = f(T j); I D = 1 mA  
parameter: I D  
65  
100  
62  
59  
56  
53  
50  
80  
5 A  
60  
40  
10 A  
15 A  
20  
0
-60  
-20  
20  
60  
100  
140  
180  
25  
50  
75  
100  
125  
150  
175  
T j [°C]  
T j [°C]  
15 Typ. gate charge3)  
16 Gate charge waveforms  
V
GS = f(Q gate); I D = 20 A pulsed  
parameter: VDD  
12  
V GS  
11 V  
44 V  
Q g  
10  
8
6
V gs(th)  
4
2
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
0
0
2
4
6
8
10  
Q
gate [nC]  
Rev. 1.0  
page 7  
2009-09-07  
IPG20N06S2L-65  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2009  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.0  
page 8  
2009-09-07  
IPG20N06S2L-65  
Revision History  
Version  
Date  
Changes  
Revision 1.0  
07.09.2009 Final Data Sheet  
Rev. 1.0  
page 9  
2009-09-07  

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