IR2101STR [INFINEON]

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IR2101STR
型号: IR2101STR
厂家: Infineon    Infineon
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驱动器 MOSFET驱动器 驱动程序和接口 接口集成电路 光电二极管 PC
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中文:  中文翻译
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Previous Datasheet  
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Data Sheet No. PD-6.043C  
IR2101  
HIGH AND LOW SIDE DRIVER  
Features  
Product Summary  
n Floating channel designed for bootstrap operation  
Fully operational to +600V  
Tolerant to negative transient voltage  
dV/dt immune  
n Gate drive supply range from 10 to 20V  
n Undervoltage lockout  
V
600V max.  
100 mA / 210 mA  
10 - 20V  
OFFSET  
I +/-  
O
V
OUT  
n 5V Schmitt-triggered input logic  
n Matched propagation delay for both channels  
n Outputs in phase with inputs  
t
(typ.)  
130 & 90 ns  
30 ns  
on/off  
Delay Matching  
Description  
Packages  
The IR2101 is a high voltage, high speed power  
MOSFET and IGBT driver with independent high and  
low side referenced output channels. Proprietary HVIC  
and latch immune CMOS technologies enable rugge-  
dized monolithic construction. The logic input is com-  
patible with standard CMOS or LSTTL outputs. The  
output drivers feature a high pulse current buffer stage  
designed for minimum driver cross-conduction. The  
floating channel can be used to drive an N-channel  
power MOSFET or IGBT in the high side configura-  
tion which operates up to 600 volts.  
Typical Connection  
up to 600V  
VCC  
VCC  
HIN  
LIN  
VB  
HO  
VS  
HIN  
LIN  
TO  
LOAD  
COM  
LO  
CONTROL INTEGRATED CIRCUIT DESIGNERS’ MANUAL  
B-1  
To Order  
 
 
Previous Datasheet  
Index  
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IR2101  
Absolute Maximum Ratings  
Absolute Maximum Ratings indicate sustained limits beyond which damage to the device may occur.All voltage param-  
eters are absolute voltages referenced to COM.The Thermal Resistance and Power Dissipation ratings are measured  
under board mounted and still air conditions.  
Parameter  
Definition  
Value  
Symbol  
Min.  
Max.  
Units  
V
V
High Side Floating Supply Voltage  
High Side Floating Supply Offset Voltage  
High Side Floating Output Voltage  
Low Side and Logic Fixed Supply Voltage  
Low Side Output Voltage  
-0.3  
625  
B
S
V
- 25  
V + 0.3  
B
B
S
V
V
V
- 0.3  
V
+ 0.3  
25  
HO  
CC  
B
V
-0.3  
V
-0.3  
-0.3  
V
+ 0.3  
+ 0.3  
LO  
CC  
CC  
V
IN  
Logic Input Voltage (HIN & LIN)  
V
dV /dt  
s
Allowable Offset Supply Voltage Transient  
50  
V/ns  
W
P
Package Power Dissipation @ T +25°C  
(8 Lead DIP)  
(8 Lead SOIC)  
(8 Lead DIP)  
(8 Lead SOIC)  
1.0  
0.625  
125  
200  
150  
150  
300  
D
A
R
θJA  
Thermal Resistance, Junction to Ambient  
°C/W  
°C  
T
Junction Temperature  
J
T
Storage Temperature  
-55  
S
T
Lead Temperature (Soldering, 10 seconds)  
L
Recommended Operating Conditions  
The Input/Output logic timing diagram is shown in Figure 1. For proper operation the device should be used within the  
recommended conditions. The V offset rating is tested with all supplies biased at 15V differential.  
S
Parameter  
Definition  
Value  
Symbol  
Min.  
Max.  
Units  
V
V
High Side Floating Supply Absolute Voltage  
High Side Floating Supply Offset Voltage  
High Side Floating Output Voltage  
Low Side and Logic Fixed Supply Voltage  
Low Side Output Voltage  
V
S
+ 10  
V + 20  
S
B
S
V
Note 1  
600  
V
V
V
B
HO  
S
V
CC  
10  
0
20  
V
V
CC  
LO  
V
Logic Input Voltage (HIN & LIN)  
Ambient Temperature  
0
V
CC  
IN  
°C  
T
-40  
125  
A
Note 1: Logic operational for V of -5 to +600V. Logic state held for V of -5V to -V  
.
S
S
BS  
B-2  
CONTROL INTEGRATED CIRCUIT DESIGNERS’ MANUAL  
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Index  
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IR2101  
Dynamic Electrical Characteristics  
V
(V , V ) = 15V, C = 1000 pF andT = 25°C unless otherwise specified.  
BIAS CC BS L A  
Parameter  
Definition  
Value  
Min. Typ. Max. Units Test Conditions  
Symbol  
t
Turn-On Propagation Delay  
Turn-Off Propagation Delay  
Turn-On RiseTime  
130  
90  
80  
40  
30  
200  
200  
120  
70  
V = 0V  
S
on  
t
off  
V = 600V  
S
t
ns  
r
t
f
Turn-Off FallTime  
MT  
Delay Matching, HS & LSTurn-On/Off  
Static Electrical Characteristics  
V
(V , V ) = 15V andT = 25°C unless otherwise specified.TheV , V and I parameters are referenced to COM.  
BIAS CC BS A IN TH IN  
TheV and I parameters are referenced to COM and are applicable to the respective output leads:HO or LO.  
O
O
Parameter  
Definition  
Value  
Symbol  
Min. Typ. Max. Units Test Conditions  
V
Logic“1InputVoltage  
2.7  
8.8  
0.8  
100  
100  
50  
V
= 10V to 20V  
IH  
CC  
V
V
Logic“0InputVoltage  
V
CC  
= 10V to 20V  
IL  
V
OH  
High Level OutputVoltage, V  
- V  
O
I
O
= 0A  
= 0A  
BIAS  
mV  
V
Low Level OutputVoltage, V  
I
O
OL  
LK  
O
I
Offset Supply Leakage Current  
QuiescentV Supply Current  
V =V = 600V  
B S  
I
20  
140  
20  
50  
V
IN  
= 0V or 5V  
= 0V or 5V  
QBS  
BS  
I
QuiescentV Supply Current  
CC  
240  
40  
µA  
V
IN  
QCC  
I
Logic “1” Input Bias Current  
Logic “0” Input Bias Current  
V
= 5V  
= 0V  
IN+  
IN  
I
1.0  
9.8  
V
IN  
IN-  
V
V
CC  
Supply Undervoltage Positive Going  
9.3  
CCUV+  
Threshold  
Supply Undervoltage Negative Going  
V
V
V
CC  
7.5  
100  
210  
8.2  
125  
250  
8.6  
CCUV-  
Threshold  
I
Output High Short Circuit Pulsed Current  
V = 0V,V =5V  
O IN  
O+  
PW 10µs  
mA  
I
Output Low Short Circuit Pulsed Current  
V
=15V,V =0V  
O-  
O IN  
PW 10µs  
CONTROL INTEGRATED CIRCUIT DESIGNERS’ MANUAL B-3  
To Order  
Previous Datasheet  
Index  
Next Data Sheet  
IR2101  
Functional Block Diagram  
VB  
Q
HV  
LEVEL  
SHIFT  
R
S
HO  
PULSE  
FILTER  
HIN  
PULSE  
GEN  
VS  
UV  
DETECT  
VCC  
LIN  
LO  
COM  
Lead Definitions  
Lead  
Symbol Description  
HIN  
Logic input for high side gate driver output (HO), in phase  
Logic input for low side gate driver output (LO), in phase  
High side floating supply  
LIN  
V
B
HO  
High side gate drive output  
V
High side floating supply return  
Low side and logic fixed supply  
Low side gate drive output  
S
V
CC  
LO  
COM  
Low side return  
Lead Assignments  
8 Lead DIP  
SO-8  
IR2101  
IR2101S  
B-4  
CONTROL INTEGRATED CIRCUIT DESIGNERS’ MANUAL  
To Order  
Previous Datasheet  
Index  
Next Data Sheet  
IR2101  
Device Information  
Process & Design Rule  
Transistor Count  
Die Size  
HVDCMOS 4.0 µm  
168  
67 X 91 X 26 (mil)  
Die Outline  
Thickness of Gate Oxide  
Connections  
First  
800Å  
Poly Silicon  
4 µm  
Material  
Width  
Layer  
Spacing  
Thickness  
Material  
Width  
Spacing  
Thickness  
6 µm  
5000Å  
Al - Si (Si: 1.0% ±0.1%)  
6 µm  
Second  
Layer  
9 µm  
20,000Å  
Contact Hole Dimension  
Insulation Layer  
5 µm X 5 µm  
PSG (SiO2)  
1.5 µm  
PSG (SiO2)  
1.5 µm  
Material  
Thickness  
Material  
Passivation  
Thickness  
Method of Saw  
Method of Die Bond  
Wire Bond  
Full Cut  
Ablebond 84 - 1  
Thermo Sonic  
Au (1.0 mil / 1.3 mil)  
Cu  
Method  
Material  
Material  
Die Area  
Leadframe  
Ag  
Lead Plating  
Types  
Materials  
Pb : Sn (37 : 63)  
8 Lead PDIP / SO-8  
EME6300 / MP150 / MP190  
Package  
Remarks:  
CONTROL INTEGRATED CIRCUIT DESIGNERS’ MANUAL B-5  
To Order  
Previous Datasheet  
Index  
Next Data Sheet  
IR2101  
50%  
50%  
t
HIN  
LIN  
HIN  
LIN  
t
t
t
f
on  
off  
r
90%  
90%  
HO  
LO  
HO  
LO  
10%  
10%  
Figure 1. Input/Output Timing Diagram  
Figure 2. Switching Time Waveform Definitions  
50%  
50%  
HIN  
LIN  
LO  
HO  
10%  
MT  
MT  
90%  
LO  
HO  
Figure 3. Delay Matching Waveform Definitions  
To Order  
B-6  
CONTROL INTEGRATED CIRCUIT DESIGNERS’ MANUAL  

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