IRF1310NSTRR [INFINEON]

Power Field-Effect Transistor, 42A I(D), 100V, 0.036ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, PLASTIC, D2PAK-3;
IRF1310NSTRR
型号: IRF1310NSTRR
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 42A I(D), 100V, 0.036ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, PLASTIC, D2PAK-3

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中文:  中文翻译
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PD - 91514B  
IRF1310NS/L  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Surface Mount (IRF1310NS)  
l Low-profilethrough-hole(IRF1310NL)  
l 175°C Operating Temperature  
l Fast Switching  
D
VDSS =100V  
RDS(on) = 0.036Ω  
G
l Fully Avalanche Rated  
ID = 42A  
S
Description  
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedizeddevicedesignthatHEXFETPowerMOSFETs  
arewellknownfor,providesthedesignerwithanextremely  
efficient and reliable device for use in a wide variety of  
applications.  
The D2Pak is a surface mount power package capable of  
accommodating die sizes up to HEX-4. It provides the  
highest power capability and the lowest possible on-  
resistance in any existing surface mount package. The  
D2Pak is suitable for high current applications because of  
its low internal connection resistance and can dissipate  
up to 2.0W in a typical surface mount application.  
Thethrough-holeversion(IRF1310NL)isavailableforlow-  
profile applications.  
2
T O -262  
D
Pak  
Absolute Maximum Ratings  
Parameter  
Max.  
42  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10Vꢀ  
Continuous Drain Current, VGS @ 10Vꢀ  
Pulsed Drain Current ꢀ  
30  
A
140  
3.8  
160  
1.1  
± 20  
420  
22  
PD @TA = 25°C  
PD @TC = 25°C  
Power Dissipation  
W
W
Power Dissipation  
Linear Derating Factor  
W/°C  
V
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy‚ꢀ  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒꢀ  
Operating Junction and  
16  
mJ  
V/ns  
5.0  
-55 to + 175  
300 (1.6mm from case )  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
–––  
Max.  
0.95  
Units  
RθJC  
RθJA  
°C/W  
Junction-to-Ambient ( PCB Mounted,steady-state)**  
40  
5/13/98  
IRF1310NS/L  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
100 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.11 ––– V/°C Reference to 25°C, ID = 1mAꢀ  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance ––– ––– 0.036  
V
S
VGS = 10V, ID = 22A „  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 22Aꢀ  
VDS = 100V, VGS = 0V  
VDS = 80V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Gate Threshold Voltage  
2.0  
14  
––– 4.0  
––– –––  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 110  
––– ––– 15  
––– ––– 58  
µA  
nA  
IDSS  
IGSS  
Drain-to-Source Leakage Current  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
VGS = -20V  
Qg  
ID = 22A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
nC  
ns  
VDS = 80V  
VGS = 10V, See Fig. 6 and 13 „ꢀ  
VDD = 50V  
–––  
–––  
–––  
–––  
11 –––  
56 –––  
45 –––  
40 –––  
RiseTime  
ID = 22A  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
RG = 3.6Ω  
RD = 2.9Ω, See Fig. 10 „ꢀ  
Between lead,  
LS  
Internal Source Inductance  
–––  
–––  
7.5  
nH  
pF  
and center of die contact  
VGS = 0V  
Ciss  
Coss  
Crss  
Input Capacitance  
––– 1900 –––  
––– 450 –––  
––– 230 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
D
IS  
MOSFETsymbol  
showing the  
42  
––– –––  
––– –––  
A
G
ISM  
Pulsed Source Current  
(Body Diode) ꢀ  
integral reverse  
p-n junction diode.  
140  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 180 270  
––– 1.2 1.8  
V
TJ = 25°C, IS =22A, VGS = 0V „  
TJ = 25°C, IF = 22A  
ns  
µC  
Qrr  
ton  
di/dt = 100A/µs „ꢀ  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
„ Pulse width 300µs; duty cycle 2%.  
Uses IRF1310N data and test conditions  
max. junction temperature. ( See fig. 11 )  
‚ Starting TJ = 25°C, L = 1.7mH  
RG = 25, IAS = 22A. (See Figure 12)  
ƒ ISD 22A, di/dt 180A/µs, VDD V(BR)DSS  
TJ 175°C  
,
** When mounted on 1" square PCB ( FR-4 or G-10 Material ).  
For recommended soldering techniques refer to application note #AN-994.  
IRF1310NS/L  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
VGS  
15V  
TOP  
TOP  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
4.5V  
4.5V  
20us PULSE WIDTH  
20us PULSE WIDTH  
T = 175 oC  
J
T = 25 oC  
J
1
0.1  
1
0.1  
1
10  
100  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
3.0  
36A  
=
I
D
2.5  
100  
10  
1
2.0  
1.5  
1.0  
0.5  
0.0  
T = 25oC  
J
T = 175oC  
J
VDS= 50V  
20µS PULSE WIDTH  
V
= 10V  
GS  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
T , Junction Temperature ( oC)  
4.0  
5.0  
V
6.0  
7.0  
8.0  
9.0  
10.0  
, Gate-to-Source Voltage (V)  
J
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs.Temperature  
IRF1310NS/L  
3500  
20  
16  
12  
8
V
C
= 0V,  
f = 1MHz  
C
I
D
= 22A  
GS  
= C + C  
SHORTED  
ds  
V
V
V
= 80V  
= 50V  
= 20V  
iss  
gs  
gd ,  
gd  
DS  
DS  
DS  
C
= C  
gd  
3000  
2500  
2000  
1500  
1000  
500  
rss  
C
= C + C  
oss  
ds  
C
iss  
C
C
oss  
rss  
4
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
0
1
10  
100  
0
20  
40  
60  
80  
100  
120  
V
, Drain-to-Source Voltage (V)  
Q
, Total Gate Charge (nC)  
DS  
G
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
1000  
100  
10  
1000  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
100  
10  
1
10us  
100us  
1ms  
T
= 25oC  
10ms  
C
T
= 175o C  
J
V
= 0 V  
Single Pulse  
GS  
1
0.1  
0.2  
1
10  
100  
1000  
0.4  
V
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
V
, Drain-to-Source Voltage (V)  
,Source-to-Drain Voltage (V)  
DS  
SD  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
IRF1310NS/L  
50  
40  
30  
20  
10  
0
RD  
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
T
C
10%  
V
GS  
Fig 9. Maximum Drain Current Vs.  
t
t
r
t
t
f
d(on)  
d(off)  
CaseTemperature  
Fig 10b. Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
P
DM  
0.10  
0.05  
0.1  
t
1
t
2
0.02  
SINGLE PULSE  
0.01  
(THERMAL RESPONSE)  
Notes:  
1. Duty factor D =  
t / t  
1 2  
2. Peak T = P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig11. MaximumEffectiveTransientThermalImpedance,Junction-to-Case  
IRF1310NS/L  
1000  
800  
600  
400  
200  
0
I
D
TOP  
9.0A  
16A  
BOTTOM 22A  
1 5V  
DRIVER  
L
V
G
DS  
D.U.T  
R
+
V
D D  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
25  
50  
75  
100  
125  
150  
175  
V
(BR)DSS  
Starting T , Junction Temperature ( oC)  
J
t
p
Fig 12c. Maximum Avalanche Energy  
Vs. DrainCurrent  
I
AS  
Current Regulator  
Fig12b. UnclampedInductiveWaveforms  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
10 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
IRF1310NS/L  
Peak Diode Recovery dv/dt Test Circuit  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig14. ForN-ChannelHEXFETS  
IRF1310NS/L  
D2Pak Package Outline  
10.54 (.415)  
10.29 (.405)  
10.16 (.400)  
REF.  
- B -  
1.32 (.052)  
4.69 (.185)  
4.20 (.165)  
1.40 (.055)  
- A -  
M AX.  
1.22 (.048)  
2
6.47 (.255)  
6.18 (.243)  
1.78 (.070)  
1.27 (.050)  
15.49 (.610)  
14.73 (.580)  
2.79 (.110)  
2.29 (.090)  
1
3
2.61 (.103)  
2.32 (.091)  
5.28 (.208)  
4.78 (.188)  
8.89 (.350)  
REF.  
1.40 (.055)  
1.14 (.045)  
1.39 (.055)  
1.14 (.045)  
3X  
0.55 (.022)  
0.46 (.018)  
0.93 (.037)  
0.69 (.027)  
3X  
5.08 (.200)  
0.25 (.010)  
M
B A M  
M INIMUM RECOM MENDED FOOTPRINT  
11.43 (.450)  
8.89 (.350)  
LEAD ASSIGNMENTS  
1 - GATE  
NO TES:  
1
2
3
4
DIM ENSIONS AFTER SOLDER DIP.  
17.78 (.700)  
2 - DRAIN  
3 - SOURCE  
DIM ENSIONING & TOLERANCING PER ANSI Y14.5M , 1982.  
CONTROLLING DIM ENSION : INCH.  
HEATSINK & LEAD DIM ENSIONS DO NOT INCLUDE BURRS.  
3.81 (.150)  
2.54 (.100)  
2.08 (.082)  
2X  
2X  
Part Marking Information  
D2Pak  
A
INTERNATIONAL  
RECTIFIER  
LOGO  
PART NUM BER  
F530S  
9246  
1M  
DATE CODE  
(YYW W )  
9B  
ASSEM BLY  
YY  
=
YEAR  
= W EEK  
LOT CODE  
W W  
IRF1310NS/L  
Package Outline  
TO-262 Outline  
Part Marking Information  
TO-262  
IRF1310NS/L  
Tape & Reel Information  
D2Pak  
TRR  
1 .6 0 (.063 )  
1 .5 0 (.059 )  
1.60 (.06 3)  
1.50 (.05 9)  
4.10 (.16 1)  
3.90 (.15 3)  
0.3 68 (.0145)  
0.3 42 (.0135)  
FEED DIRECTION  
1.85 (.07 3)  
11.60 (.457)  
11.40 (.449)  
1.65 (.06 5)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
TRL  
1.75 (.069)  
1.25 (.049)  
10.90 (.42 9)  
10.70 (.42 1)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED DIRECTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
M A X.  
60.00 (2.362)  
MIN .  
30.40 (1.197)  
M AX.  
NO TES :  
1. CO M FO RM S TO EIA-418.  
2. CO N TR O LLIN G D IM ENSIO N : M ILLIM ET ER .  
3. DIM ENSIO N MEASUR ED  
26.40 (1.039)  
24.40 (.961)  
4
@ HU B.  
3
4. INC LUD ES FLAN G E D ISTO R TIO N  
@
O UTER EDG E.  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
5/98  
Note: For the most current drawings please refer to the IR website at:  
http://www.irf.com/package/  

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