IRF3415L [INFINEON]

Power MOSFET(Vdss=150V, Rds(on)=0.042ohm, Id=43A); 功率MOSFET ( VDSS = 150V , RDS(ON) = 0.042ohm ,ID = 43A )
IRF3415L
型号: IRF3415L
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss=150V, Rds(on)=0.042ohm, Id=43A)
功率MOSFET ( VDSS = 150V , RDS(ON) = 0.042ohm ,ID = 43A )

晶体 晶体管 功率场效应晶体管 开关 脉冲 局域网
文件: 总10页 (文件大小:158K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 91509C  
IRF3415S/L  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Surface Mount (IRF3415S)  
l Low-profile through-hole (IRF3415L)  
l 175°C Operating Temperature  
l Fast Switching  
D
VDSS = 150V  
RDS(on) = 0.042Ω  
G
l Fully Avalanche Rated  
ID = 43A  
S
Description  
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedizeddevicedesignthatHEXFETPowerMOSFETs  
arewellknownfor,providesthedesignerwithanextremely  
efficient and reliable device for use in a wide variety of  
applications.  
The D2Pak is a surface mount power package capable of  
accommodating die sizes up to HEX-4. It provides the  
highest power capability and the lowest possible on-  
resistance in any existing surface mount package. The  
D2Pak is suitable for high current applications because of  
its low internal connection resistance and can dissipate  
up to 2.0W in a typical surface mount application.  
The through-hole version (IRF3415L) is available for low-  
profileapplications.  
2
T O -262  
D
Pak  
Absolute Maximum Ratings  
Parameter  
Max.  
43  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10Vꢀ  
Continuous Drain Current, VGS @ 10Vꢀ  
Pulsed Drain Current ꢀ  
30  
A
150  
3.8  
200  
1.3  
± 20  
590  
22  
PD @TA = 25°C  
PD @TC = 25°C  
Power Dissipation  
W
W
Power Dissipation  
Linear Derating Factor  
W/°C  
V
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy‚ꢀ  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒꢀ  
Operating Junction and  
20  
mJ  
V/ns  
5.0  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
300 (1.6mm from case )  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
–––  
Max.  
0.75  
Units  
RθJC  
RθJA  
°C/W  
Junction-to-Ambient ( PCB Mounted,steady-state)**  
40  
5/13/98  
IRF3415S/L  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
150 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.17 ––– V/°C Reference to 25°C, ID = 1mAꢀ  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance ––– ––– 0.042  
V
S
VGS = 10V, ID = 22A „  
VDS = VGS, ID = 250µA  
VDS = 50V, ID = 22Aꢀ  
VDS = 150V, VGS = 0V  
VDS = 120V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Gate Threshold Voltage  
2.0  
19  
––– 4.0  
––– –––  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 200  
––– ––– 17  
––– ––– 98  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -20V  
Qg  
ID = 22A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
nC  
ns  
VDS = 120V  
VGS = 10V, See Fig. 6 and 13 „ꢀ  
VDD = 75V  
–––  
–––  
–––  
–––  
12 –––  
55 –––  
71 –––  
69 –––  
RiseTime  
ID = 22A  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
RG = 2.5Ω  
RD = 3.3Ω, See Fig. 10 „ꢀ  
Between lead,  
LS  
Internal Source Inductance  
nH  
pF  
–––  
–––  
7.5  
and center of die contact  
VGS = 0V  
Ciss  
Coss  
Crss  
Input Capacitance  
––– 2400 –––  
––– 640 –––  
––– 340 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
D
IS  
MOSFETsymbol  
showing the  
43  
––– –––  
A
G
ISM  
Pulsed Source Current  
(Body Diode) ꢀ  
integral reverse  
p-n junction diode.  
––– ––– 150  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 260 390  
––– 2.2 3.3  
V
TJ = 25°C, IS = 22A, VGS = 0V „  
ns  
TJ = 25°C, IF = 22A  
Qrr  
ton  
µC di/dt = 100A/µs „ꢀ  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
„ Pulse width 300µs; duty cycle 2%.  
Uses IRF3415 data and test conditions  
max. junction temperature. ( See fig. 11 )  
‚ Starting TJ = 25°C, L = 2.4mH  
RG = 25, IAS = 22A. (See Figure 12)  
ƒ ISD 22A, di/dt 820A/µs, VDD V(BR)DSS  
TJ 175°C  
,
** When mounted on 1" square PCB ( FR-4 or G-10 Material ).  
For recommended soldering techniques refer to application note #AN-994.  
IRF3415S/L  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.5V  
8.0V  
7.0V  
6.0V  
5.5V  
5.5V  
BOTTOM 4
5.0V  
5.0V  
BOTTOM 4.5
4.5V  
4.5V  
10  
20us PULSE WIDTH  
20us PULSE WIDTH  
T = 175 oC  
J
T = 25 oC  
J
1
10  
100  
1
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1000  
37A  
=
I
D
°
T = 25 C  
J
100  
°
T = 175 C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
10  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
4
5
6
7
8
9
10  
T , Junction Temperature ( oC)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 4. Normalized On-Resistance  
Fig 3. Typical Transfer Characteristics  
Vs. Temperature  
IRF3415S/L  
20  
16  
12  
8
6000  
V
C
= 0V,  
f = 1MHz  
C
I
D
= 22A  
GS  
= C + C  
SHORTED  
ds  
V
V
V
= 120V  
= 75V  
= 30V  
iss  
gs  
gd ,  
gd  
DS  
DS  
DS  
C
= C  
gd  
rss  
5000  
4000  
3000  
2000  
1000  
0
C
= C + C  
ds  
oss  
C
iss  
C
oss  
rss  
C
4
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
0
40  
80  
120 160  
200  
1
10  
100  
Q
, Total Gate Charge (nC)  
V
, Drain-to-Source Voltage (V)  
G
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
100  
10  
1
10us  
T = 175oC  
J
100us  
T = 25oC  
J
1ms  
T
= 25o C  
10ms  
C
T
= 175o C  
J
V
= 0 V  
GS  
Single Pulse  
0.1  
0.2  
1
0.6  
1.0  
1.4  
1.8  
1
10  
100  
1000  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
ForwardVoltage  
IRF3415S/L  
RD  
50  
40  
30  
20  
10  
0
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
T
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
CaseTemperature  
Fig 10b. Switching Time Waveforms  
1
D = 0.50  
0.20  
0.1  
0.10  
0.05  
P
DM  
t
1
0.02  
t
2
SINGLE PULSE  
(THERMAL RESPONSE)  
0.01  
Notes:  
1. Duty factor D =  
t / t  
1 2  
2. Peak T = P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig11. MaximumEffectiveTransientThermalImpedance,Junction-to-Case  
IRF3415S/L  
1400  
1200  
1000  
800  
600  
400  
200  
0
I
D
TOP  
9.0A  
16A  
BOTTOM 22A  
1 5V  
DRIVER  
L
V
G
DS  
D.U.T  
R
+
V
D D  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
25  
50  
75  
100  
125  
150  
175  
Starting T , Junction Temperature ( oC)  
J
V
(BR)DSS  
t
p
Fig 12c. Maximum Avalanche Energy  
Vs. DrainCurrent  
I
AS  
Fig12b. UnclampedInductiveWaveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
Q
G
.2µF  
12V  
.3µF  
10 V  
+
V
Q
Q
GD  
DS  
GS  
D.U.T.  
-
V
GS  
V
G
3mA  
Charge  
I
I
D
G
Current Sampling Resistors  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
IRF3415S/L  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig14. ForN-ChannelHEXFETS  
IRF3415S/L  
D2Pak Package Outline  
10.54 (.415)  
10.29 (.405)  
10.16 (.400)  
REF.  
- B -  
1.32 (.052)  
4.69 (.185)  
4.20 (.165)  
1.40 (.055)  
- A -  
M AX.  
1.22 (.048)  
2
6.47 (.255)  
6.18 (.243)  
1.78 (.070)  
1.27 (.050)  
15.49 (.610)  
14.73 (.580)  
2.79 (.110)  
2.29 (.090)  
1
3
2.61 (.103)  
2.32 (.091)  
5.28 (.208)  
4.78 (.188)  
8.89 (.350)  
REF.  
1.40 (.055)  
1.14 (.045)  
1.39 (.055)  
1.14 (.045)  
3X  
0.55 (.022)  
0.46 (.018)  
0.93 (.037)  
0.69 (.027)  
3X  
5.08 (.200)  
0.25 (.010)  
M
B A M  
M INIMUM RECOM MENDED FOOTPRINT  
11.43 (.450)  
8.89 (.350)  
LEAD ASSIGNMENTS  
1 - GATE  
NO TES:  
1
2
3
4
DIM ENSIONS AFTER SOLDER DIP.  
17.78 (.700)  
2 - DRAIN  
3 - SOURCE  
DIM ENSIONING & TOLERANCING PER ANSI Y14.5M , 1982.  
CONTROLLING DIM ENSION : INCH.  
HEATSINK & LEAD DIM ENSIONS DO NOT INCLUDE BURRS.  
3.81 (.150)  
2.54 (.100)  
2.08 (.082)  
2X  
2X  
Part Marking Information  
D2Pak  
A
INTERNATIONAL  
RECTIFIER  
LOGO  
PART NUM BER  
F530S  
9246  
1M  
DATE CODE  
(YYW W )  
9B  
ASSEM BLY  
YY  
=
YEAR  
= W EEK  
LOT CODE  
W W  
IRF3415S/L  
Package Outline  
TO-262 Outline  
Part Marking Information  
TO-262  
IRF3415S/L  
Tape & Reel Information  
D2Pak  
TRR  
1 .6 0 (.063 )  
1 .5 0 (.059 )  
1.60 (.06 3)  
1.50 (.05 9)  
4.10 (.16 1)  
3.90 (.15 3)  
0.3 68 (.0145)  
0.3 42 (.0135)  
FEED DIRECTION  
1.85 (.07 3)  
11.60 (.457)  
11.40 (.449)  
1.65 (.06 5)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
TRL  
1.75 (.069)  
1.25 (.049)  
10.90 (.42 9)  
10.70 (.42 1)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED DIRECTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
M A X.  
60.00 (2.362)  
MIN .  
30.40 (1.197)  
M AX.  
NO TES :  
1. CO M FO RM S TO EIA-418.  
2. CO N TR O LLIN G D IM ENSIO N : M ILLIM ET ER .  
3. DIM ENSIO N MEASUR ED  
26.40 (1.039)  
24.40 (.961)  
4
@ HU B.  
3
4. INC LUD ES FLAN G E D ISTO R TIO N  
@
O UTER EDG E.  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
5/98  

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