IRFB4229 [INFINEON]

The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. ;
IRFB4229
型号: IRFB4229
厂家: Infineon    Infineon
描述:

The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. 

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PD - 97078A  
IRFB4229PbF  
Features  
l
Advanced Process Technology  
Key Parameters  
l
Key Parameters Optimized for PDP Sustain,  
Energy Recovery and Pass Switch Applications  
Low EPULSE Rating to Reduce Power  
Dissipation in PDP Sustain, Energy Recovery  
and Pass Switch Applications  
Low QG for Fast Response  
High Repetitive Peak Current Capability for  
Reliable Operation  
VDS min  
250  
300  
38  
V
V
m
VDS (Avalanche) typ.  
RDS(ON) typ. @ 10V  
IRP max @ TC= 100°C  
TJ max  
l
91  
A
l
l
175  
°C  
D
D
l
Short Fall & Rise Times for Fast Switching  
l175°C Operating Junction Temperature for  
Improved Ruggedness  
l
l
Repetitive Avalanche Capability for Robustness  
and Reliability  
Class-D Audio Amplifier 300W-500W  
(Half-bridge)  
G
S
D
G
S
TO-220AB  
G
D
S
Gate  
Drain  
Source  
Description  
This HEXFET® Power MOSFET is specifically designed for Sustain; Energy Recovery & Pass switch  
applicationsinPlasmaDisplayPanels. ThisMOSFETutilizesthelatestprocessingtechniquestoachieve  
low on-resistance per silicon area and low EPULSE rating. Additional features of this MOSFET are 175°C  
operating junction temperature and high repetitive peak current capability. These features combine to  
make this MOSFET a highly efficient, robust and reliable device for PDP driving applications.  
Absolute Maximum Ratings  
Max.  
Parameter  
Units  
VGS  
±30  
Gate-to-Source Voltage  
V
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
46  
A
33  
180  
IRP @ TC = 100°C  
PD @TC = 25°C  
PD @TC = 100°C  
91  
Repetitive Peak Current  
330  
Power Dissipation  
W
190  
Power Dissipation  
2.2  
Linear Derating Factor  
W/°C  
°C  
TJ  
-40 to + 175  
Operating Junction and  
TSTG  
Storage Temperature Range  
Soldering Temperature for 10 seconds  
Mounting Torque, 6-32 or M3 Screw  
300  
10lb in (1.1N m)  
N
Thermal Resistance  
Parameter  
Typ.  
Max.  
0.45  
–––  
62  
Units  
Junction-to-Case  
Rθ  
Rθ  
Rθ  
–––  
0.50  
–––  
JC  
CS  
JA  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
°C/W  
Notes  through are on page 8  
www.irf.com  
1
09/10/07  
IRFB4229PbF  
Electrical Characteristics @ T = 25°C (unless otherwise specified)  
J
Conditions  
VGS = 0V, ID = 250µA  
Parameter  
Min. Typ. Max. Units  
BVDSS  
Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
250  
–––  
–––  
3.0  
–––  
210  
38  
–––  
V
Reference to 25°C, I = 1mA  
V
/ T  
J
∆Β  
––– mV/°C  
D
DSS  
VGS = 10V, ID = 26A  
RDS(on)  
VGS(th)  
46  
mΩ  
V
VDS = VGS, ID = 250µA  
–––  
-14  
–––  
–––  
–––  
–––  
–––  
72  
5.0  
VGS(th)/TJ  
IDSS  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
–––  
–––  
–––  
–––  
–––  
83  
––– mV/°C  
VDS = 250V, VGS = 0V  
20  
1.0  
µA  
mA  
nA  
V
V
V
V
DS = 250V, VGS = 0V, TJ = 125°C  
GS = 20V  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
100  
-100  
–––  
110  
–––  
–––  
–––  
–––  
–––  
–––  
GS = -20V  
DS = 25V, ID = 26A  
gfs  
Qg  
Qgd  
td(on)  
tr  
S
VDD = 125V, ID = 26A, VGS = 10V  
–––  
–––  
–––  
–––  
–––  
–––  
100  
nC  
Gate-to-Drain Charge  
Turn-On Delay Time  
26  
VDD = 125V, VGS = 10V  
ID = 26A  
18  
Rise Time  
31  
ns  
td(off)  
tf  
RG = 2.4Ω  
See Fig. 22  
Turn-Off Delay Time  
30  
Fall Time  
21  
tst  
VDD = 200V, VGS = 15V, RG= 4.7Ω  
Shoot Through Blocking Time  
–––  
ns  
µJ  
L = 220nH, C= 0.3µF, VGS = 15V  
VDS = 200V, RG= 4.7Ω, TJ = 25°C  
L = 220nH, C= 0.3µF, VGS = 15V  
VDS = 200V, RG= 4.7Ω, TJ = 100°C  
VGS = 0V  
–––  
790  
–––  
EPULSE  
Energy per Pulse  
––– 1390 –––  
––– 4560 –––  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = 25V  
Output Capacitance  
–––  
–––  
–––  
–––  
390  
100  
290  
4.5  
–––  
–––  
–––  
–––  
pF  
ƒ = 1.0MHz,  
Reverse Transfer Capacitance  
Effective Output Capacitance  
Internal Drain Inductance  
VGS = 0V, VDS = 0V to 200V  
Coss eff.  
LD  
Between lead,  
D
S
nH 6mm (0.25in.)  
from package  
G
LS  
Internal Source Inductance  
–––  
7.5  
–––  
and center of die contact  
Avalanche Characteristics  
Typ.  
–––  
–––  
300  
–––  
Max.  
130  
33  
Parameter  
Units  
mJ  
mJ  
V
EAS  
Single Pulse Avalanche Energy  
Repetitive Avalanche Energy  
Repetitive Avalanche Voltage  
Avalanche Current  
EAR  
VDS(Avalanche)  
IAS  
–––  
26  
A
Diode Characteristics  
Conditions  
Parameter  
Min. Typ. Max. Units  
IS @ TC = 25°C  
ISM  
MOSFET symbol  
Continuous Source Current  
–––  
–––  
46  
showing the  
(Body Diode)  
A
integral reverse  
p-n junction diode.  
Pulsed Source Current  
(Body Diode)  
–––  
–––  
180  
TJ = 25°C, IS = 26A, VGS = 0V  
TJ = 25°C, IF = 26A, VDD = 50V  
di/dt = 100A/µs  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
–––  
–––  
–––  
–––  
190  
1.3  
V
290  
ns  
nC  
Qrr  
840 1260  
2
www.irf.com  
IRFB4229PbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
BOTTOM  
BOTTOM  
5.5V  
5.5V  
60µs PULSE WIDTH  
Tj = 25°C  
60µs PULSE WIDTH  
Tj = 175°C  
1
1
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1000  
I
= 26A  
D
V
= 10V  
GS  
100  
10  
T
= 175°C  
J
1
T
= 25°C  
J
0.1  
0.01  
V
= 25V  
DS  
60µs PULSE WIDTH  
4.0  
5.0  
6.0  
7.0  
8.0  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
V
, Gate-to-Source Voltage (V)  
GS  
T
, Junction Temperature (°C)  
J
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance vs. Temperature  
1600  
1400  
L = 220nH  
C = Variable  
L = 220nH  
C = 0.3µF  
100°C  
1200  
100°C  
25°C  
25°C  
1200  
800  
400  
0
1000  
800  
600  
400  
200  
0
150  
160  
170  
180  
190  
200  
100  
110  
120  
130  
140  
150  
160  
170  
V
Drain-to -Source Voltage (V)  
I
Peak Drain Current (A)  
DS,  
D,  
Fig 6. Typical EPULSE vs. Drain Current  
Fig 5. Typical EPULSE vs. Drain-to-Source Voltage  
www.irf.com  
3
IRFB4229PbF  
2000  
1000  
100  
10  
L = 220nH  
C= 0.3µF  
1600  
C= 0.2µF  
C= 0.1µF  
T
= 175°C  
J
1200  
800  
400  
0
1
T
= 25°C  
0.8  
J
V
= 0V  
GS  
0.1  
25  
50  
75  
100  
125  
150  
0.2  
0.4  
0.6  
1.0  
1.2  
Temperature (°C)  
V
, Source-to-Drain Voltage (V)  
SD  
Fig 7. Typical EPULSE vs.Temperature  
Fig 8. Typical Source-Drain Diode Forward Voltage  
20  
7000  
6000  
5000  
4000  
3000  
2000  
1000  
0
V
C
= 0V,  
f = 1 MHZ  
I = 26A  
D
GS  
= C + C , C SHORTED  
iss  
gs  
gd ds  
V
V
V
= 160V  
= 100V  
= 40V  
DS  
DS  
DS  
C
C
= C  
rss  
oss  
gd  
16  
12  
8
= C + C  
ds  
gd  
Ciss  
Coss  
Crss  
4
0
0
20  
40  
60  
80  
100  
120  
1
10  
100  
1000  
Q
Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 9. Typical Capacitance vs.Drain-to-Source Voltage  
Fig 10. Typical Gate Charge vs.Gate-to-Source Voltage  
50  
40  
30  
20  
10  
0
1000  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
1µsec  
100  
10  
1
100µsec  
10µsec  
Tc = 25°C  
Tj = 175°C  
Single Pulse  
0.1  
25  
50  
75  
100  
125  
150  
175  
1
10  
100  
1000  
T , Junction Temperature (°C)  
V
, Drain-to-Source Voltage (V)  
J
DS  
Fig 12. Maximum Safe Operating Area  
Fig 11. Maximum Drain Current vs. Case Temperature  
4
www.irf.com  
IRFB4229PbF  
600  
500  
400  
300  
200  
100  
0
0.40  
0.30  
0.20  
0.10  
0.00  
I
I
= 26A  
D
D
TOP  
7.4A  
13A  
26A  
BOTTOM  
T
= 125°C  
= 25°C  
J
T
J
5
6
7
8
9
10  
25  
50  
75  
100  
125  
150  
175  
V
, Gate-to-Source Voltage (V)  
Starting T , Junction Temperature (°C)  
GS  
J
Fig 13. On-Resistance Vs. Gate Voltage  
Fig 14. Maximum Avalanche Energy Vs. Temperature  
5.0  
140  
ton= 1µs  
Duty cycle = 0.25  
4.5  
4.0  
120  
Half Sine Wave  
Square Pulse  
100  
I
= 250µA  
D
3.5  
3.0  
2.5  
2.0  
1.5  
80  
60  
40  
20  
0
-75 -50 -25  
0
J
25 50 75 100 125 150 175  
, Temperature ( °C )  
25  
50  
75  
100  
125  
150  
175  
Case Temperature (°C)  
T
Fig 16. Typical Repetitive peak Current vs.  
Fig 15. Threshold Voltage vs. Temperature  
Case temperature  
1
D = 0.50  
0.1  
0.01  
0.20  
0.10  
0.05  
R1  
R1  
R2  
R2  
R3  
R3  
τι  
Ri (°C/W)  
(sec)  
τ
J τJ  
τ
τ
Cτ  
0.080717 0.000052  
0.209555 0.001021  
0.159883 0.007276  
τ
1 τ1  
τ
2 τ2  
3τ3  
0.02  
0.01  
Ci= τi/Ri  
Ci= τi/Ri  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
SINGLE PULSE  
( THERMAL RESPONSE )  
0.001  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig 17. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFB4229PbF  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
D.U.T  
+
***  
V
=10V  
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
-
+
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
*
VDD  
**  
Re-Applied  
Voltage  
dv/dt controlled by RG  
RG  
+
-
Body Diode  
Forward Drop  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
Inductor Curent  
I
SD  
Ripple 5%  
* Use P-Channel Driver for P-Channel Measurements  
** Reverse Polarity for P-Channel  
*** VGS = 5V for Logic Level Devices  
Fig 18. Diode Reverse Recovery Test Circuit for HEXFET® Power MOSFETs  
V
(BR)DSS  
15V  
t
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
V
GS  
0.01  
t
p
I
AS  
Fig 19b. Unclamped Inductive Waveforms  
Fig 19a. Unclamped Inductive Test Circuit  
Id  
Vds  
Vgs  
L
VCC  
DUT  
0
1K  
Vgs(th)  
Qgs1  
Qgs2  
Qgd  
Qgodr  
Fig 20a. Gate Charge Test Circuit  
Fig 20b. Gate Charge Waveform  
6
www.irf.com  
IRFB4229PbF  
A
PULSE A  
PULSE B  
RG  
C
DRIVER  
L
VCC  
B
Ipulse  
DUT  
RG  
tST  
Fig 21b. tst Test Waveforms  
Fig 21a. tst and EPULSE Test Circuit  
Fig 21c. EPULSE Test Waveforms  
RD  
V
DS  
VDS  
90%  
VGS  
D.U.T.  
RG  
+VDD  
-
10%  
VGS  
V
GS  
PulseWidth ≤ 1 µs  
Duty Factor ≤ 0.1 %  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 22a. Switching Time Test Circuit  
Fig 22b. Switching Time Waveforms  
www.irf.com  
7
IRFB4229PbF  
TO-220AB Package Outline (Dimensions are shown in millimeters (inches))  
TO-220AB Part Marking Information  
TO-220AB packages are not recommended for Surface Mount Application.  
Notes:  
 Repetitive rating; pulse width limited by max. junction temperature.  
‚ Starting TJ = 25°C, L = 0.37mH, RG = 25, IAS = 26A.  
ƒ Pulse width 400µs; duty cycle 2%.  
„ R is measured at TJ of approximately 90°C.  
θ
Half sine wave with duty cycle = 0.25, ton=1µsec.  
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 09/2007  
8
www.irf.com  
IMPORTANT NOTICE  
The information given in this document shall in no For further information on the product, technology,  
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please  
characteristics (“Beschaffenheitsgarantie”) .  
contact your nearest Infineon Technologies office  
(www.infineon.com).  
With respect to any examples, hints or any typical  
values stated herein and/or any information  
regarding the application of the product, Infineon  
Technologies hereby disclaims any and all  
warranties and liabilities of any kind, including  
without limitation warranties of non-infringement  
of intellectual property rights of any third party.  
WARNINGS  
Due to technical requirements products may  
contain dangerous substances. For information on  
the types in question please contact your nearest  
Infineon Technologies office.  
In addition, any information given in this document  
is subject to customers compliance with its  
obligations stated in this document and any  
applicable legal requirements, norms and  
standards concerning customers products and any  
use of the product of Infineon Technologies in  
customers applications.  
Except as otherwise explicitly approved by Infineon  
Technologies in a written document signed by  
authorized  
representatives  
of  
Infineon  
Technologies, Infineon Technologies’ products may  
not be used in any applications where a failure of  
the product or any consequences of the use thereof  
can reasonably be expected to result in personal  
injury.  
The data contained in this document is exclusively  
intended for technically trained staff. It is the  
responsibility of customers technical departments  
to evaluate the suitability of the product for the  
intended application and the completeness of the  
product information given in this document with  
respect to such application.  

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