IRFB9N60 [INFINEON]

Power MOSFET(Vdss=600V, Rds(on)=0.75ohm, Id=9.2A); 功率MOSFET ( VDSS = 600V , RDS(ON) = 0.75ohm ,ID = 9.2A )
IRFB9N60
型号: IRFB9N60
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss=600V, Rds(on)=0.75ohm, Id=9.2A)
功率MOSFET ( VDSS = 600V , RDS(ON) = 0.75ohm ,ID = 9.2A )

文件: 总8页 (文件大小:137K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 91811  
IRFB9N60A  
HEXFET® Power MOSFET  
l Dynamic dv/dt Rating  
l Repetitive Avalanche Rated  
l Fast Switching  
D
VDSS = 600V  
l Ease of Paraleling  
l Simple Drive Requirements  
R
DS(on) = 0.75Ω  
G
ID = 9.2A  
S
Description  
Third Generation HEXFETs from International Rectifier provide the designer  
with the best combination of fast switching, ruggedized device design, low on-  
resistance and cost-effectiveness.  
The TO-220 package is universally preferred for all commercial-industrial  
applications at power dissipation levels to approximately 50 watts. The low  
thermal resistance and low package cost of the TO-220 contribute to its wide  
acceptance throughout the industry.  
TO-220AB  
Absolute Maximum Ratings  
Parameter  
Max.  
9.2  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current   
5.8  
A
37  
PD @TC = 25°C  
Power Dissipation  
170  
1.3  
W
W/°C  
V
Linear Derating Factor  
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
± 30  
290  
9.2  
Single Pulse Avalanche Energy‚  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
17  
mJ  
V/ns  
5.0  
-55 to + 150  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 srew  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
Units  
RθJC  
0.75  
–––  
62  
RθCS  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.50  
–––  
°C/W  
RθJA  
www.irf.com  
1
10/7/98  
IRFB9N60A  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
600 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.66 ––– V/°C Reference to 25°C, ID = 1mA  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 0.75  
V
S
VGS = 10V, ID = 5.5A „  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 5.5A  
VDS = 600V, VGS = 0V  
VDS = 480V, VGS = 0V, TJ = 150°C  
VGS = 30V  
2.0  
5.5  
––– 4.0  
––– –––  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 49  
––– ––– 13  
––– ––– 20  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -30V  
Qg  
ID = 9.2A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 400V  
VGS = 10V, See Fig. 6 and 13 „  
–––  
–––  
–––  
–––  
13 –––  
25 –––  
30 –––  
22 –––  
VDD = 300V  
ID = 9.2A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 9.1Ω  
RD = 35.5,See Fig. 10 „  
Between lead,  
6mm (0.25in.)  
D
4.5  
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
–––  
–––  
–––  
nH  
G
from package  
–––  
7.5  
and center of die contact  
VGS = 0V  
S
Ciss  
Input Capacitance  
––– 1400 –––  
––– 180 –––  
Coss  
Crss  
Coss  
Coss  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
Output Capacitance  
–––  
7.1 –––  
pF  
ƒ = 1.0MHz, See Fig. 5  
––– 1957 –––  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
VGS = 0V, VDS = 480V, ƒ = 1.0MHz  
VGS = 0V, VDS = 0V to 480V  
Output Capacitance  
–––  
–––  
49 –––  
96 –––  
Coss eff.  
Effective Output Capacitance ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
D
IS  
MOSFET symbol  
9.2  
37  
––– –––  
––– –––  
showing the  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
S
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
––– ––– 1.5  
––– 530 800  
––– 3.0 4.4  
V
TJ = 25°C, IS = 9.2A, VGS = 0V „  
ns  
TJ = 25°C, IF = 9.2A  
Qrr  
ton  
µC di/dt = 100A/µs „  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
Repetitive rating; pulse width limited by  
„Pulse width 300µs; duty cycle 2%.  
max. junction temperature. ( See fig. 11 )  
Coss eff. is a fixed capacitance that gives the same charging time  
‚Starting TJ = 25°C, L = 6.8mH  
as Coss while VDS is rising from 0 to 80% VDSS  
RG = 25, IAS = 9.2A. (See Figure 12)  
ƒISD 9.2A, di/dt 50A/µs, VDD V(BR)DSS  
TJ 150°C  
,
2
www.irf.com  
IRFB9N60A  
100  
10  
1
100  
10  
1
VGS  
15V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.7V  
BOTTOM 4.7V  
4.7V  
4.7V  
20µs PULSE WIDTH  
T = 150 C  
20µs PULSE WIDTH  
°
°
J
T = 25 C  
J
0.1  
0.1  
1
10  
100  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
100  
3.0  
9.2A  
=
I
D
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
°
T = 150 C  
J
10  
°
T = 25 C  
J
1
V
= 50V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
0.1  
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
°
4.0  
5.0  
V
6.0  
7.0  
8.0 9.0  
10.0  
T , Junction Temperature ( C)  
J
, Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
www.irf.com  
3
IRFB9N60A  
20  
16  
12  
8
2400  
I
D
= 9.2A  
V
C
C
C
= 0V,  
f = 1M Hz  
G S  
iss  
= C  
= C  
= C  
+ C  
+ C  
,
C
S HORTED  
gs  
gd  
ds  
gd  
ds  
400V  
= 300V  
= 120V  
V
V
V
=
rss  
oss  
DS  
DS  
DS  
2000  
1600  
1200  
800  
400  
0
gd  
C
C
iss  
oss  
4
C
rss  
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
A
0
10  
20  
30  
40  
50  
1
10  
100  
1000  
Q
, Total Gate Charge (nC)  
V
, Drain-to-Source Voltage (V)  
G
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
100  
10  
100  
10  
1
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
10us  
°
T = 150 C  
J
100us  
1ms  
°
T = 25 C  
1
J
10ms  
°
T = 25 C  
C
°
T = 150 C  
Single Pulse  
J
V
= 0 V  
GS  
0.1  
0.2  
0.1  
0.5  
0.7  
1.0  
1.2  
10  
100  
1000  
10000  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRFB9N60A  
RD  
10.0  
8.0  
6.0  
4.0  
2.0  
0.0  
VDS  
VGS  
10V  
D.U.T.  
RG  
+VDD  
-
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
T
75  
100  
125  
150  
°
, Case Temperature ( C)  
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
1
D = 0.50  
0.20  
0.1  
0.10  
0.05  
P
DM  
t
1
0.02  
t
2
SINGLE PULSE  
(THERMAL RESPONSE)  
0.01  
Notes:  
1. Duty factor D =  
t / t  
1 2  
2. Peak T = P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFB9N60A  
600  
500  
400  
300  
200  
100  
0
I
D
TOP  
4.1A  
5.8A  
BOTTOM 9.2A  
1 5V  
DRIVER  
L
V
G
DS  
D.U.T  
R
+
V
D D  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
25  
50  
75  
100  
125  
150  
°
Starting T , Junction Temperature ( C)  
V
(BR)DSS  
J
t
p
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Current Regulator  
Fig 12b. Unclamped Inductive Waveforms  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
Q
G
.3µF  
+
10 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
6
www.irf.com  
IRFB9N60A  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
www.irf.com  
7
IRFB9N60A  
Package Outline  
TO-220AB Outline  
Dimensions are shown in millimeters (inches)  
10.54 (.415)  
10.29 (.405)  
-
B
-
3.78 (.149)  
3.54 (.139)  
2.87 (.113)  
2.62 (.103)  
4.69 (.185)  
4.20 (.165)  
1.32 (.052)  
1.22 (.048)  
- A  
-
6.47 (.255)  
6.10 (.240)  
4
15.24 (.600)  
14.84 (.584)  
1.15 (.045)  
M IN  
LEAD ASSIG NM ENTS  
1
2
3
4
- GATE  
1
2
3
- DRAIN  
- SOU RC E  
- DRAIN  
14.09 (.555)  
13.47 (.530)  
4.06 (.160)  
3.55 (.140)  
0.93 (.037)  
0.69 (.027)  
0.55 (.022)  
0.46 (.018)  
3X  
3X  
1.40 (.055)  
3X  
1.15 (.045)  
0.36 (.014)  
M
B
A
M
2.92 (.115)  
2.64 (.104)  
2.54 (.100)  
2X  
N OTES:  
1
2
D IM ENSIONING  
&
TOLERANCING PER ANSI Y14.5M , 1982.  
3
4
O UTLINE CONFOR MS TO JEDEC OUTLIN E TO-220AB.  
HEATSINK LE AD M EASUREM ENTS DO NOT INCLU DE BURRS.  
C ONTROLLING DIM ENSION : INC H  
&
Part Marking Information  
TO-220AB  
EXAMPLE : THIS IS AN IR F1010  
W ITH ASSEM BLY  
A
INTERNATIONAL  
RECTIFIER  
LOGO  
PART NU M BER  
LOT C ODE 9B1M  
IR F1010  
9246  
9B  
1M  
D ATE COD E  
(YYW W )  
ASSEMBLY  
LOT  
CO DE  
YY  
=
YEAR  
= W EEK  
W W  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630  
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936  
http://www.irf.com/  
Data and specifications subject to change without notice.  
10/98  
8
www.irf.com  

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