IRFN9240 [INFINEON]

POWER MOSFET N-CHANNEL(BVdss=-200V, Rds(on)=0.51ohm, Id=-11A); 功率MOSFET N沟道( BVDSS = -200V , RDS(ON) = 0.51ohm ,ID = -11A )
IRFN9240
型号: IRFN9240
厂家: Infineon    Infineon
描述:

POWER MOSFET N-CHANNEL(BVdss=-200V, Rds(on)=0.51ohm, Id=-11A)
功率MOSFET N沟道( BVDSS = -200V , RDS(ON) = 0.51ohm ,ID = -11A )

文件: 总6页 (文件大小:186K)
中文:  中文翻译
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Previous Datasheet  
Index  
Next Data Sheet  
Provisional Data Sheet No. PD-9.1554  
HEXFET® POWER MOSFET  
IRFN9240  
N-CHANNEL  
Product Summary  
-200 Volt, 0.51HEXFET  
Part Number  
BVDSS  
RDS(on)  
ID  
HEXFETtechnology is the key to International Rectifier’s  
advanced line of power MOSFET transistors.The effi-  
cient geometry achieves very low on-stateresistancecom-  
binedwithhightransconductance.  
IRFN9240  
-200V  
0.51Ω  
-11A  
Features:  
HEXFET transistors also feature all of the well-establish  
advantages of MOSFETs, such as voltage control, very  
fast switching, ease of paralleling and electrical param-  
eter temperature stability. They are well-suited for appli-  
cations such as switching power supplies, motor controls,  
inverters, choppers, audio amplifiers, and high energy  
pulse circuits.  
Avalanche Energy Rating  
Dynamic dv/dt Rating  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
Surface Mount  
Light-weight  
The Surface Mount Device (SMD-1) package represents  
another step in the continual evolution of surface mount  
technology. The SMD-1 will give designers the extra flex-  
ibility they need to increase circuit board density. Inter-  
national Rectifier has engineered the SMD-1 package to  
meet the specific needs of the power market by increas-  
ing the size of the termination pads, thereby enhancing  
thermal and electrical performance.  
Absolute Maximum Ratings  
Parameter  
= -10V, T = 25°C Continuous Drain Current  
C
IRFN9240  
-11  
Units  
I
@ V  
D
GS  
A
I
D
@ V  
= -10V, T = 100°C Continuous Drain Current  
-7  
GS  
C
I
Pulsed Drain Current ➀  
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
-44  
DM  
@ T = 25°C  
P
125  
W
W/K ➄  
V
D
C
1.0  
V
±20  
GS  
E
Single Pulse Avalanche Energy ➁  
Avalanche Current ➀  
500  
-11  
mJ  
AS  
I
A
AR  
E
Repetitive Avalanche Energy ➀  
Peak Diode Recovery dv/dt ➂  
Operating Junction  
12.5  
mJ  
AR  
dv/dt  
-5.5  
V/ns  
T
-55 to 150  
J
oC  
g
T
Storage Temperature Range  
STG  
(for 5 seconds)  
2.6 (typical)  
Package Mounting Surface Temperature  
Weight  
300  
To Order  
 
 
Previous Datasheet  
IRFN9240 Device  
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)  
Index  
Next Data Sheet  
Parameter  
Min. Typ. Max. Units  
Test Conditions  
BV  
Drain-to-Source Breakdown Voltage  
-200  
V
V
= 0V, I = -1.0mA  
D
DSS  
GS  
V/°C Reference to 25°C, I = -1.0mA  
BV  
/T Temperature Coefficient of Breakdown  
-0.20  
DSS  
J
D
Voltage  
= -10V, I = -7A  
GS D  
R
Static Drain-to-Source  
On-State Resistance  
GateThreshold Voltage  
Forward Transconductance  
Zero Gate Voltage Drain Current  
-2.0  
4.0  
0.51  
0.52  
-4.0  
-25  
-250  
V
V
DS(on)  
V
S ( )  
= -10V, I = -11A  
GS D  
V
g
V
V
= V  
, I = -250µA  
D
GS(th)  
fs  
DS  
DS  
GS  
> -15V, I  
= -7A  
DS  
I
V
DS  
= 0.8 x Max Rating,V = 0V  
GS  
DSS  
µA  
V
= 0.8 x Max Rating  
DS  
V
= 0V, T = 125°C  
J
GS  
I
Gate-to-Source Leakage Forward  
Gate-to-Source Leakage Reverse  
Total Gate Charge  
Gate-to-Source Charge  
Gate-to-Drain (“Miller”) Charge  
Turn-On Delay Time  
Rise Time  
Turn-Off Delay Time  
FallTime  
Internal Drain Inductance  
28  
3.0  
4.5  
2.0  
-100  
100  
60  
15  
38  
35  
85  
85  
65  
V
V
= -20V  
= 20V  
GSS  
GS  
GS  
nA  
nC  
I
GSS  
Q
Q
Q
t
t
t
t
V
V
= -10V, I = -11A  
D
g
gs  
gd  
d(on)  
r
d(off)  
f
D
S
GS  
= Max. Rating x 0.5  
DS  
see figures 6 and 13  
V
R
= -100V, I = -11A,  
DD D  
= 9.1, VGS = -10V  
G
ns  
see figure 10  
Measured from the  
drain lead, 6mm (0.25  
in.) from package to  
center of die.  
Modified MOSFET  
symbol showing the  
internal inductances.  
L
nH  
pF  
Measured from the  
source lead, 6mm  
(0.25 in.) from package  
to source bonding pad.  
L
Internal Source Inductance  
6.5  
C
C
C
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
1200  
570  
81  
V
= 0V, V  
f = 1.0 MHz  
see figure 5  
= -25V  
DS  
iss  
oss  
rss  
GS  
Source-Drain Diode Ratings and Characteristics  
Parameter  
Min. Typ. Max. Units  
Test Conditions  
I
I
Continuous Source Current (Body Diode)  
Pulse Source Current (Body Diode) ➀  
-11  
-44  
Modified MOSFET symbol showing the  
integral reverse p-n junction rectifier.  
S
SM  
A
V
t
Q
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
-4.6  
440  
7.2  
V
ns  
µC  
T = 25°C, I = -11A, V  
= 0V ➃  
j
SD  
rr  
RR  
S
GS  
T = 25°C, I = -11A, di/dt -100A/µs  
j
F
V
-50V ➃  
DD  
t
Forward Turn-On Time  
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L + L .  
S D  
on  
Thermal Resistance  
Parameter  
Min. Typ. Max. Units  
Test Conditions  
R
R
Junction-to-Case  
1.0  
thJC  
Junction-to-PC Board  
TBD  
K/W Soldered to a copper clad PC board  
thJ-PCB  
To Order  
Previous Datasheet  
IRFN9240 Device  
Index  
Next Data Sheet  
Fig. 1 — Typical Output Characteristics  
TC = 25°C  
Fig. 2 — Typical Output Characteristics  
TC = 150°C  
I
= -11A  
D
Fig. 3 — Typical Transfer Characteristics  
Fig. 4 — Normalized On-Resistance Vs.Temperature  
I
= -11A  
D
Fig. 5 — Typical Capacitance Vs. Drain-to-Source  
Voltage  
Fig. 6 — Typical Gate Charge Vs. Gate-to-Source  
Voltage  
To Order  
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IRFN9240 Device  
Index  
Next Data Sheet  
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
100us  
1ms  
T
= 25°C  
°
= 150 C  
C
T
J
10ms  
Single Pulse  
1
10  
100  
1000  
-V , Drain-to-Source Voltage (V)  
DS  
Fig. 7 — Typical Source-to-Drain Diode Forward  
Voltage  
Fig. 8 — Maximum Safe Operating Area  
Fig. 9 — Maximum Drain Current Vs. Case Temperature  
Fig. 10b — Switching Time Waveforms  
Fig. 10a — Switching Time Test Circuit  
To Order  
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IRFN9240 Device  
Index  
Next Data Sheet  
10  
1
0.50  
0.20  
P
DM  
0.10  
0.05  
0.1  
t
1
t
2
0.02  
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
Notes:  
1. Duty factor D = t / t  
1
2
2. Peak T = P  
x
Z
+ T  
C
J
DM  
thJC  
0.1  
0.01  
0.00001  
0.0001  
0.001  
0.01  
1
t , Rectangular Pulse Duration (sec)  
1
Fig. 11 — Maximum Effective Transient Thermal Impedance, Junction-to-Case Vs. Pulse Duration  
Fig. 12a — Unclamped Inductive Test Circuit  
Fig. 12b — Unclamped Inductive Waveforms  
Fig. 12c — Max. Avalanche Energy vs. Current  
Fig. 13a — Gate Charge Test Circuit  
To Order  
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IRFN9240 Device  
Index  
Next Data Sheet  
Repetitive Rating; Pulse width limited by  
maximum junction temperature.  
(see figure 11)  
@ V  
= -50V, StartingT = 25°C,  
J
DD  
= [0.5  
2
E
L
(I ) [BV  
/(BV  
-V )]  
DSS DD  
AS  
*
*
*
DSS  
L
Peak I = -11A, V  
= -10V, 25 R 200Ω  
L
GS  
G
I  
SD  
-11A, di/dt-150A/µs,  
V
BV  
, T 150°C  
DSS J  
DD  
Pulse width 300 µs; Duty Cycle 2%  
K/W = °C/W  
W/K = W/°C  
Fig. 13b — Basic Gate Charge Waveform  
Case Outline and Dimensions — SMD-1  
All dimensions in millimeters (inches)  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
9/96  
To Order  

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