IRFNG50 [INFINEON]

POWER MOSFET N-CHANNEL(BVdss=1000V, Rds(on)=2.0ohm, Id=5.5A); 功率MOSFET N沟道( BVDSS = 1000V , RDS(ON) = 2.0ohm ,ID = 5.5A )
IRFNG50
型号: IRFNG50
厂家: Infineon    Infineon
描述:

POWER MOSFET N-CHANNEL(BVdss=1000V, Rds(on)=2.0ohm, Id=5.5A)
功率MOSFET N沟道( BVDSS = 1000V , RDS(ON) = 2.0ohm ,ID = 5.5A )

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Previous Datasheet  
Index  
Next Data Sheet  
Provisional Data Sheet No. PD-9.1556  
HEXFET® POWER MOSFET  
IRFNG50  
N-CHANNEL  
1000 Volt, 2.0HEXFET  
Product Summary  
Part Number  
BVDSS  
RDS(on)  
ID  
HEXFET technology is the key to International  
Rectifier’s advanced line of power MOSFET transis-  
tors. The efficient geometry achieves very low on-  
state resistance combined with high transconductance.  
IRFNG50  
1000V  
2.0Ω  
5.5A  
Features:  
HEXFET transistors also feature all of the well-es-  
tablish advantages of MOSFETs, such as voltage  
control, very fast switching, ease of paralleling and  
electrical parameter temperature stability. They are  
well-suited for applications such as switching power  
supplies, motor controls, inverters, choppers, audio  
amplifiers, and high energy pulse circuits.  
Avalanche Energy Rating  
Dynamic dv/dt Rating  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
Surface Mount  
Light-weight  
The Surface Mount Device (SMD-1) package repre-  
sents another step in the continual evolution of sur-  
face mount technology. The SMD-1 will give  
designers the extra flexibility they need to increase  
circuit board density. International Rectifier has en-  
gineered the SMD-1 package to meet the specific  
needs of the power market by increasing the size of  
the termination pads, thereby enhancing thermal and  
electrical performance.  
Absolute Maximum Ratings  
Parameter  
= 10V, T = 25°C Continuous Drain Current  
C
IRFNG50  
5.5  
Units  
I
D
@ V  
GS  
A
I
@ V  
= 10V, T = 100°C Continuous Drain Current  
3.5  
D
GS  
C
I
Pulsed Drain Current ➀  
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
22  
DM  
@ T = 25°C  
P
150  
W
W/K ➄  
V
D
C
1.2  
V
±20  
GS  
E
Single Pulse Avalanche Energy ➁  
Avalanche Current ➀  
860  
5.5  
mJ  
AS  
AR  
I
A
E
Repetitive Avalanche Energy ➀  
Peak Diode Recovery dv/dt ➂  
Operating Junction  
15.0  
mJ  
AR  
dv/dt  
1.0  
V/ns  
T
-55 to 150  
J
oC  
g
T
Storage Temperature Range  
STG  
(for 5 seconds)  
2.6 (typical)  
Package Mounting Surface Temperature  
Weight  
300  
To Order  
 
 
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IRFNG50 Device  
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)  
Index  
Next Data Sheet  
Parameter  
Min. Typ. Max. Units  
Test Conditions  
BV  
Drain-to-Source Breakdown Voltage  
1000  
V
V
= 0V, I = 1.0 mA  
D
DSS  
GS  
V/°C Reference to 25°C, I = 1.0 mA  
BV  
/T Temperature Coefficient of Breakdown  
1.4  
DSS  
J
D
Voltage  
R
Static Drain-to-Source  
On-State Resistance  
Gate Threshold Voltage  
ForwardTransconductance  
Zero Gate Voltage Drain Current  
2.0  
5.2  
2.0  
2.25  
4.0  
25  
250  
V
= 10V, I = 3.5A  
= 10V, I = 5.5A  
DS(on)  
GS D  
V
S ( )  
V
GS D  
V
g
V
= V , I = 250µA  
GS(th)  
fs  
DS  
GS  
D
V
> 15V, I  
= 3.5A  
DS  
DS  
I
V
= 0.8 x Max Rating,V = 0V  
DSS  
DS  
GS  
µA  
V
= 0.8 x Max Rating  
DS  
V
= 0V, T = 125°C  
GS  
J
I
Gate-to-Source Leakage Forward  
Gate-to-Source Leakage Reverse  
Total Gate Charge  
Gate-to-Source Charge  
Gate-to-Drain (“Miller”) Charge  
Turn-On Delay Time  
Rise Time  
Turn-Off Delay Time  
Fall Time  
Internal Drain Inductance  
87  
8.7  
49  
2.0  
100  
-100  
200  
20  
110  
30  
44  
210  
60  
V
= 20V  
GS  
GSS  
nA  
nC  
I
V
GS  
= -20V  
GSS  
Q
Q
Q
V
=10V, I = 5.5A  
GS D  
= Max. Rating x 0.5  
see figures 6 and 13  
V = 500V, I = 5.5A,  
DD  
g
gs  
gd  
V
DS  
t
d(on)  
D
t
R
G
= 2.35, VGS = 10V  
r
ns  
t
d(off)  
t
L
see figure 10  
f
Measured from the  
drain lead, 6mm (0.25  
in.) from package to  
center of die.  
Modified MOSFET  
symbol showing the  
internal inductances.  
D
S
nH  
pF  
Measured from the  
source lead, 6mm  
(0.25 in.) from package  
to source bonding pad.  
L
Internal Source Inductance  
6.5  
C
C
C
Input Capacitance  
Output Capacitance  
ReverseTransfer Capacitance  
2400  
240  
80  
V
= 0V, V  
f = 1.0 MHz  
see figure 5  
= 25V  
DS  
iss  
oss  
rss  
GS  
Source-Drain Diode Ratings and Characteristics  
Parameter  
Min. Typ. Max. Units  
Test Conditions  
I
I
Continuous Source Current (Body Diode)  
Pulse Source Current (Body Diode) ➀  
5.5  
22  
Modified MOSFET symbol showing the  
integral reverse p-n junction rectifier.  
S
SM  
A
V
t
Q
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
1.8  
1200 ns  
8.4 µC  
V
T = 25°C, I = 5.5A, V  
= 0V ➃  
GS  
j
SD  
rr  
RR  
S
T = 25°C, I = 5.5A, di/dt 100A/µs  
j
F
V
50V ➃  
DD  
t
Forward Turn-On Time  
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L + L .  
S D  
on  
Thermal Resistance  
Parameter  
Min. Typ. Max. Units  
Test Conditions  
R
R
Junction-to-Case  
0.83  
thJC  
Junction-to-PC Board  
TBD  
K/W Soldered to a copper clad PC board  
thJPCB  
To Order  
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IRFNG50 Device  
Index  
Next Data Sheet  
Fig. 1 — Typical Output Characteristics  
TC = 25°C  
Fig. 2 — Typical Output Characteristics  
TC = 150°C  
I
= 5.5A  
D
Fig. 3 — Typical Transfer Characteristics  
Fig. 4 — Normalized On-Resistance Vs.Temperature  
I
= 5.5A  
D
Fig. 5 — Typical Capacitance Vs. Drain-to-Source  
Voltage  
Fig. 6 — Typical Gate Charge Vs. Gate-to-Source  
Voltage  
To Order  
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IRFNG50 Device  
Index  
Next Data Sheet  
100  
10  
1
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
10us  
100us  
1ms  
10ms  
T
= 25°C  
°
= 150 C  
C
T
J
Single Pulse  
0.1  
10  
100  
1000  
10000  
V
, Drain-to-Source Voltage (V)  
DS  
Fig. 7 — Typical Source-to-Drain Diode Forward  
Voltage  
Fig. 8 — Maximum Safe Operating Area  
Fig. 9 — Maximum Drain Current Vs. Case Temperature  
Fig. 10b — Switching Time Waveforms  
Fig. 10a — Switching Time Test Circuit  
To Order  
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IRFNG50 Device  
Index  
Next Data Sheet  
1
0.50  
0.20  
0.1  
0.10  
0.05  
0.02  
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
P
DM  
0.01  
t
1
t
2
Notes:  
1. Duty factor D = t / t  
1
2
2. Peak T = P  
x
Z
+ T  
C
J
DM  
thJC  
0.1  
0.001  
0.00001  
0.0001  
0.001  
0.01  
1
t , Rectangular Pulse Duration (sec)  
1
Fig. 11 — Maximum Effective Transient Thermal Impedance, Junction-to-Case Vs. Pulse Duration  
Fig. 12b — Unclamped Inductive Waveforms  
Fig. 12a — Unclamped Inductive Test Circuit  
PEAK I = 5.5A  
L
V
= 50V  
DD  
Fig. 12c — Max. Avalanche Energy vs. Current  
Fig. 13a — Gate Charge Test Circuit  
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IRFNG50 Device  
Index  
Next Data Sheet  
Repetitive Rating; Pulse width limited by  
maximum junction temperature.  
(see figure 11)  
@ V  
= 50V, Starting T = 25°C,  
J
DD  
= [0.5  
2
E
L
(I ) [BV  
/(BV  
-V )]  
DSS DD  
G
AS  
*
*
*
DSS  
= 10V, 25 R 200Ω  
L
Peak I = 5.5A, V  
L
GS  
I  
SD  
5.5A, di/dt 120A/µs,  
V
BV  
, T 150°C  
DSS J  
DD  
Pulse width 300 µs; Duty Cycle 2%  
K/W = °C/W  
W/K = W/°C  
Fig. 13b — Basic Gate Charge Waveform  
Case Outline and Dimensions — SMD-1  
All dimensions in millimeters (inches)  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
9/96  
To Order  

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