IRFP150V [INFINEON]

HEXFET Power MOSFET; HEXFET功率MOSFET
IRFP150V
型号: IRFP150V
厂家: Infineon    Infineon
描述:

HEXFET Power MOSFET
HEXFET功率MOSFET

文件: 总8页 (文件大小:521K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 94459A  
IRFP150V  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Ultra Low On-Resistance  
l Dynamic dv/dt Rating  
D
VDSS = 100V  
l 175°C Operating Temperature  
l Fast Switching  
RDS(on) = 24mΩ  
G
l Fully Avalanche Rated  
ID = 47A  
S
Description  
Advanced HEXFET® Power MOSFETs from International Rectifier utilize  
advanced processing techniques to achieve extremely low on-resistance  
per silicon area. This benefit, combined with the fast switching speed and  
ruggedized device design that HEXFET power MOSFETs are well known  
for, provides the designer with an extremely efficient and reliable device for  
use in a wide variety of applications.  
The TO-247 package is preferred for commercial-industrial applications  
wherehigherpowerlevelsprecludetheuseofTO-220devices. TheTO-247  
is similar but superior to the earlier TO-218 packcage because of its isolated  
mounting hole.  
TO-247AC  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current   
46  
32  
A
230  
PD @TC = 25°C  
Power Dissipation  
140  
W
W/°C  
V
Linear Derating Factor  
0.91  
VGS  
IAR  
Gate-to-Source Voltage  
20  
Avalanche Current  
28  
20  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
mJ  
V/ns  
5.8  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 srew  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
Typ.  
–––  
0.24  
–––  
Max.  
Units  
RθJC  
RθCS  
RθJA  
1.1  
–––  
40  
°C/W  
www.irf.com  
1
02/03/03  
IRFP150V  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Drain-to-Source Breakdown Voltage  
Min. Typ. Max. Units  
100 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.13 ––– V/°C Reference to 25°C, ID = 1mA  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 24  
mVGS = 10V, ID =28A „  
2.0  
32  
––– 4.0  
––– –––  
V
S
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 28A„  
VDS = 100V, VGS = 0V  
VDS = 80V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 130  
––– ––– 26  
––– ––– 43  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -20V  
Qg  
ID = 28A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 80V  
VGS = 10V, See Fig. 6 and 13  
–––  
–––  
–––  
–––  
12 –––  
58 –––  
45 –––  
47 –––  
VDD = 50V  
ID = 28A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 2.5Ω  
VGS = 10V, See Fig. 10 „  
Between lead,  
6mm (0.25in.)  
from package  
and center of die contact  
VGS = 0V  
D
S
4.5  
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
–––  
–––  
–––  
–––  
nH  
G
7.5  
Ciss  
Coss  
Crss  
EAS  
Input Capacitance  
––– 3130 –––  
––– 410 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
Single Pulse Avalanche Energy‚  
–––  
72 –––  
pF  
ƒ = 1.0MHz, See Fig. 5  
––– 1060280† mJ IAS = 28A, L = 0.70mH  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
D
IS  
47  
––– –––  
––– –––  
showing the  
A
G
ISM  
Pulsed Source Current  
(Body Diode)  
integral reverse  
p-n junction diode.  
230  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.2  
––– 140 220  
V
TJ = 25°C, IS = 28A, VGS = 0V „  
TJ = 25°C, IF = 28A  
ns  
Qrr  
ton  
––– 670 1010 nC di/dt = 100A/µs „  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
max. junction temperature. (See fig. 11).  
‚ Starting TJ = 25°C, L = 0.70mH, RG = 25,  
IAS = 28A, VGS=10V (See Figure 12).  
„ Pulse width 400µs; duty cycle 2%.  
This is a typical value at device destruction and represents  
operation outside rated limits.  
† This is a calculated value limited to TJ = 175°C .  
ƒ ISD 28A, di/dt 380A/µs, VDD V(BR)DSS  
TJ 175°C.  
,
2
www.irf.com  
IRFP150V  
1000  
100  
10  
1000  
100  
10  
VGS  
16V  
10V  
7.0V  
6.0V  
5.0V  
4.5V  
4.0V  
3.5V  
VGS  
16V  
10V  
7.0V  
6.0V  
5.0V  
4.5V  
4.0V  
3.5V  
TOP  
TOP  
BOTTOM  
BOTTOM  
3.5V  
3.5V  
1
1
20µs PULSE WIDTH  
Tj = 25°C  
20µs PULSE WIDTH  
Tj = 175°C  
0.1  
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.0  
1000.00  
57A  
=
I
D
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
100.00  
10.00  
1.00  
T = 175°C  
J
T = 25°C  
J
V
= 15V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
0.10  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
3.0  
4.0  
V
5.0  
6.0  
7.0  
8.0  
9.0  
T , Junction Temperature  
( C)  
J
, Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
www.irf.com  
3
IRFP150V  
12  
10  
7
100000  
D
I
= 28A  
V
C
= 0V,  
f = 1 MHZ  
GS  
V
V
V
= 80V  
= 50V  
= 20V  
DS  
DS  
DS  
= C + C  
,
C
ds  
SHORTED  
iss  
gs  
gd  
C
= C  
rss  
gd  
C
= C + C  
10000  
1000  
100  
oss  
ds gd  
Ciss  
Coss  
5
Crss  
2
10  
0
0
20  
Q
40  
60  
80  
100  
1
10  
100  
, Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000.00  
100.00  
10.00  
1.00  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
T = 175°C  
J
100µsec  
1msec  
T
= 25°C  
J
10msec  
1
Tc = 25°C  
Tj = 175°C  
Single Pulse  
V
= 0V  
GS  
0.10  
0.1  
0.0  
0.5  
1.0  
1.5  
2.0  
1
10  
100  
1000  
V
, Source-toDrain Voltage (V)  
V
, Drain-toSource Voltage (V)  
SD  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRFP150V  
50  
40  
30  
20  
10  
0
RD  
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
VGS  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
T
C
10%  
V
GS  
Fig 9. Maximum Drain Current Vs.  
t
t
r
t
t
f
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
P
DM  
0.10  
0.05  
0.1  
t
1
t
0.02  
2
SINGLE PULSE  
0.01  
(THERMAL RESPONSE)  
Notes:  
1. Duty factor D =  
t / t  
1
2
2. Peak T  
= P  
x Z  
+ T  
J
DM  
thJC  
C
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFP150V  
550  
440  
330  
220  
110  
0
I
15V  
D
TOP  
11A  
20A  
28A  
BOTTOM  
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
VGS  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
25  
50  
75  
100  
125  
150  
175  
°
( C)  
Starting T , Junction Temperature  
J
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
VGS  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Current Sampling Resistors  
Charge  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
6
www.irf.com  
IRFP150V  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T*  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
+
-
VDD  
VGS  
* Reverse Polarity of D.U.T for P-Channel  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
[
=10V  
] ***  
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
]
[
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
[
]
SD  
Ripple 5%  
*** VGS = 5.0V for Logic Level and 3V Drive Devices  
Fig 14. For N-channel HEXFET® power MOSFETs  
www.irf.com  
7
IRFP150V  
TO - 247 Package Outline  
Dimensions are shown in millimeters (inches)  
- D -  
3.65 (.143)  
3.55 (.140)  
5.30 (.209)  
4.70 (.185)  
15.90 (.626)  
15.30 (.602)  
- B -  
0.25 (.010)  
D
M
B
M
2.50 (.089)  
- A -  
1.50 (.059)  
5.50 (.217)  
4
20.30 (.800)  
19.70 (.775)  
NOTES:  
5.50 (.217)  
4.50 (.177)  
2X  
1 DIMENSIONING & TOLERANCING  
PER ANSI Y14.5M, 1982.  
2 CONTROLLING DIMENSION : INCH.  
3 CONFORMS TO JEDEC OUTLINE  
TO-247-AC.  
1
2
3
- C -  
14.80 (.583)  
14.20 (.559)  
4.30 (.170)  
3.70 (.145)  
LEAD ASSIGNMENTS  
2.40 (.094)  
2.00 (.079)  
2X  
0.80 (.031)  
0.40 (.016)  
1.40 (.056)  
1.00 (.039)  
3X  
1 - GATE  
3X  
2 - DRAIN  
3 - SOURCE  
4 - DRAIN  
2.60 (.102)  
2.20 (.087)  
0.25 (.010)  
C
A
S
M
5.45 (.215)  
3.40 (.133)  
3.00 (.118)  
2X  
TO-247 package is not recommended for Surface Mount Application.  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.02/03  
8
www.irf.com  

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