IRFP4332 [INFINEON]

The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. ;
IRFP4332
型号: IRFP4332
厂家: Infineon    Infineon
描述:

The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. 

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PD - 97100B  
IRFP4332PbF  
PDP SWITCH  
Features  
Key Parameters  
l
Advanced Process Technology  
VDS min  
250  
300  
29  
V
V
m
l
Key Parameters Optimized for PDP Sustain,  
Energy Recovery and Pass Switch Applications  
Low EPULSE Rating to Reduce Power  
Dissipation in PDP Sustain, Energy Recovery  
and Pass Switch Applications  
VDS (Avalanche) typ.  
RDS(ON) typ. @ 10V  
TJ max  
l
175  
°C  
l
l
Low QG for Fast Response  
High Repetitive Peak Current Capability for  
Reliable Operation  
D
D
l
Short Fall & Rise Times for Fast Switching  
l175°C Operating Junction Temperature for  
S
Improved Ruggedness  
Repetitive Avalanche Capability for Robustness  
D
G
G
l
and Reliability  
S
TO-247AC  
G
D
S
Gate  
Drain  
Source  
Description  
This HEXFET® Power MOSFET is specifically designed for Sustain; Energy Recovery & Pass switch  
applicationsinPlasmaDisplayPanels. ThisMOSFETutilizesthelatestprocessingtechniquestoachieve  
low on-resistance per silicon area and low EPULSE rating. Additional features of this MOSFET are 175°C  
operating junction temperature and high repetitive peak current capability. These features combine to  
make this MOSFET a highly efficient, robust and reliable device for PDP driving applications.  
Absolute Maximum Ratings  
Max.  
±30  
Parameter  
Gate-to-Source Voltage  
Units  
V
A
VGS  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
57  
40  
230  
IRP @ TC = 100°C  
PD @TC = 25°C  
PD @TC = 100°C  
120  
Repetitive Peak Current  
360  
Power Dissipation  
W
180  
Power Dissipation  
2.4  
Linear Derating Factor  
W/°C  
°C  
TJ  
-40 to + 175  
Operating Junction and  
TSTG  
Storage Temperature Range  
Soldering Temperature for 10 seconds  
Mounting Torque, 6-32 or M3 Screw  
300  
10lb in (1.1N m)  
N
Thermal Resistance  
Parameter  
Typ.  
Max.  
0.42  
–––  
40  
Units  
Junction-to-Case  
Rθ  
Rθ  
–––  
0.24  
–––  
JC  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
°C/W  
CS  
RθJA  
Notes  through †are on page 9  
www.irf.com  
1
12/15/09  
IRFP4332PbF  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Conditions  
VGS = 0V, ID = 250µA  
Parameter  
Min. Typ. Max. Units  
BVDSS  
Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
250  
–––  
–––  
3.0  
–––  
170  
29  
–––  
V
Reference to 25°C, I = 1mA  
V
/ T  
J
∆Β  
––– mV/°C  
D
DSS  
VGS = 10V, ID = 35A  
RDS(on)  
VGS(th)  
33  
mΩ  
V
V
DS = VGS, ID = 250µA  
DS = 250V, VGS = 0V  
–––  
-14  
–––  
–––  
–––  
–––  
–––  
99  
5.0  
VGS(th)/TJ  
IDSS  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
–––  
–––  
–––  
–––  
–––  
100  
–––  
–––  
100  
––– mV/°C  
V
20  
200  
100  
-100  
–––  
150  
–––  
–––  
µA  
µA  
nA  
VDS = 250V, VGS = 0V, TJ = 125°C  
GS = 20V  
V
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
VGS = -20V  
VDS = 25V, ID = 35A  
VDD = 125V, ID = 35A, VGS = 10V  
gfs  
Qg  
Qgd  
tst  
S
nC  
Gate-to-Drain Charge  
35  
VDD = 200V, VGS = 15V, RG= 4.7Ω  
Shoot Through Blocking Time  
–––  
ns  
µJ  
L = 220nH, C= 0.3µF, VGS = 15V  
VDS = 200V, RG= 5.1Ω, TJ = 25°C  
L = 220nH, C= 0.3µF, VGS = 15V  
–––  
–––  
520  
920  
–––  
–––  
EPULSE  
Energy per Pulse  
VDS = 200V, RG= 5.1Ω, TJ = 100°C  
V
GS = 0V  
Ciss  
Coss  
Crss  
Input Capacitance  
––– 5860 –––  
VDS = 25V  
Output Capacitance  
–––  
–––  
–––  
–––  
530  
130  
360  
5.0  
–––  
–––  
–––  
–––  
pF  
ƒ = 1.0MHz,  
Reverse Transfer Capacitance  
Effective Output Capacitance  
Internal Drain Inductance  
VGS = 0V, VDS = 0V to 200V  
Coss eff.  
LD  
Between lead,  
D
S
nH 6mm (0.25in.)  
from package  
LS  
G
Internal Source Inductance  
–––  
13  
–––  
and center of die contact  
Avalanche Characteristics  
Typ.  
–––  
–––  
300  
–––  
Max.  
210  
36  
Parameter  
Units  
mJ  
mJ  
V
EAS  
Single Pulse Avalanche Energy  
Repetitive Avalanche Energy  
Repetitive Avalanche Voltage  
Avalanche Current  
EAR  
VDS(Avalanche)  
IAS  
–––  
35  
A
Diode Characteristics  
Conditions  
Parameter  
Min. Typ. Max. Units  
IS @ TC = 25°C  
ISM  
MOSFET symbol  
Continuous Source Current  
–––  
–––  
57  
showing the  
(Body Diode)  
A
integral reverse  
p-n junction diode.  
Pulsed Source Current  
(Body Diode)  
–––  
–––  
230  
TJ = 25°C, IS = 35A, VGS = 0V  
TJ = 25°C, IF = 35A, VDD = 50V  
di/dt = 100A/µs  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
–––  
–––  
–––  
–––  
190  
1.3  
V
290  
ns  
nC  
Qrr  
820 1230  
2
www.irf.com  
IRFP4332PbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
BOTTOM  
BOTTOM  
5.5V  
5.5V  
60µs PULSE WIDTH  
Tj = 25°C  
60µs PULSE WIDTH  
Tj = 175°C  
1
1
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1000  
I
= 35A  
D
V
= 10V  
GS  
100  
10  
T
= 175°C  
J
T
= 25°C  
J
1
0.1  
0.01  
V
= 25V  
DS  
60µs PULSE WIDTH  
4.0  
5.0  
6.0  
7.0  
8.0  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
V
, Gate-to-Source Voltage (V)  
GS  
T
, Junction Temperature (°C)  
J
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance vs. Temperature  
1000  
1000  
L = 220nH  
C = Variable  
L = 220nH  
C = 0.3µF  
100°C  
100°C  
25°C  
800  
800  
600  
400  
200  
0
25°C  
600  
400  
200  
0
100  
110  
120  
130  
140  
150  
160  
170  
150  
160  
170  
180  
190  
200  
I
Peak Drain Current (A)  
V
Drain-to -Source Voltage (V)  
D,  
DS,  
Fig 6. Typical EPULSE vs. Drain Current  
Fig 5. Typical EPULSE vs. Drain-to-Source Voltage  
www.irf.com  
3
IRFP4332PbF  
1000  
100  
10  
1400  
L = 220nH  
1200  
C= 0.3µF  
C= 0.2µF  
C= 0.1µF  
1000  
800  
600  
400  
200  
0
T
= 175°C  
J
1
T
= 25°C  
0.8  
J
V
= 0V  
GS  
0.1  
25  
50  
75  
100  
125  
150  
0.2  
0.4  
0.6  
1.0  
1.2  
Temperature (°C)  
V
, Source-to-Drain Voltage (V)  
SD  
Fig 7. Typical EPULSE vs.Temperature  
Fig 8. Typical Source-Drain Diode Forward Voltage  
10000  
8000  
6000  
4000  
2000  
0
20  
V
C
= 0V,  
f = 1 MHZ  
I
= 35A  
GS  
D
= C + C , C SHORTED  
iss  
gs  
gd ds  
V
V
V
= 200V  
= 125V  
= 50V  
DS  
DS  
DS  
C
= C  
rss  
gd  
16  
12  
8
C
= C + C  
oss  
ds  
gd  
Ciss  
Coss  
Crss  
4
0
0
40  
80  
120  
160  
1
10  
100  
1000  
Q
Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 9. Typical Capacitance vs.Drain-to-Source Voltage  
Fig 10. Typical Gate Charge vs.Gate-to-Source Voltage  
60  
50  
40  
30  
20  
10  
0
1000  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
1µsec  
100  
10  
1
100µsec  
10µsec  
Tc = 25°C  
Tj = 175°C  
Single Pulse  
0.1  
25  
50  
75  
100  
125  
150  
175  
1
10  
100  
1000  
T , Junction Temperature (°C)  
V
, Drain-to-Source Voltage (V)  
J
DS  
Fig 12. Maximum Safe Operating Area  
Fig 11. Maximum Drain Current vs. Case Temperature  
4
www.irf.com  
IRFP4332PbF  
1000  
800  
600  
400  
200  
0
0.40  
0.30  
0.20  
0.10  
0.00  
I
D
I
= 35A  
D
TOP  
8.3A  
13A  
35A  
BOTTOM  
T
= 125°C  
= 25°C  
J
T
J
5
6
7
8
9
10  
25  
50  
75  
100  
125  
150  
175  
V
, Gate-to-Source Voltage (V)  
Starting T , Junction Temperature (°C)  
GS  
J
Fig 13. On-Resistance Vs. Gate Voltage  
Fig 14. Maximum Avalanche Energy Vs. Temperature  
5.0  
180  
ton= 1µs  
Duty cycle = 0.25  
160  
Half Sine Wave  
Square Pulse  
140  
4.0  
I
= 250µA  
120  
100  
80  
60  
40  
20  
0
D
3.0  
2.0  
1.0  
-75 -50 -25  
0
J
25 50 75 100 125 150 175  
, Temperature ( °C )  
25  
50  
75  
100  
125  
150  
175  
T
Case Temperature (°C)  
Fig 16. Typical Repetitive peak Current vs.  
Fig 15. Threshold Voltage vs. Temperature  
Case temperature  
1
D = 0.50  
0.1  
0.20  
R1  
R1  
R2  
R2  
R3  
R3  
0.10  
0.05  
τι  
(sec)  
Ri (°C/W)  
τ
J τJ  
τ
τ
Cτ  
0.069565 0.000074  
0.172464 0.001546  
0.178261 0.019117  
τ
1 τ1  
τ
2 τ2  
3 τ3  
0.01  
0.02  
0.01  
Ci= τi/Ri  
Ci= τi/Ri  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
SINGLE PULSE  
( THERMAL RESPONSE )  
0.001  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig 17. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFP4332PbF  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
D.U.T  
+
***  
V
=10V  
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
-
+
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
*
VDD  
**  
Re-Applied  
Voltage  
dv/dt controlled by RG  
RG  
+
-
Body Diode  
Forward Drop  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
Inductor Curent  
I
SD  
Ripple 5%  
* Use P-Channel Driver for P-Channel Measurements  
** Reverse Polarity for P-Channel  
*** VGS = 5V for Logic Level Devices  
Fig 18. Diode Reverse Recovery Test Circuit for HEXFET® Power MOSFETs  
V
(BR)DSS  
15V  
t
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
V
GS  
0.01  
t
p
I
AS  
Fig 19b. Unclamped Inductive Waveforms  
Fig 19a. Unclamped Inductive Test Circuit  
Current Regulator  
Same Type as D.U.T.  
Id  
Vds  
50KΩ  
.2µF  
Vgs  
12V  
.3µF  
+
V
DS  
D.U.T.  
-
V
GS  
Vgs(th)  
3mA  
I
I
D
G
Current Sampling Resistors  
Qgs1  
Qgs2  
Qgd  
Qgodr  
Fig 20a. Gate Charge Test Circuit  
Fig 20b. Gate Charge Waveform  
6
www.irf.com  
IRFP4332PbF  
A
PULSE A  
PULSE B  
RG  
C
DRIVER  
L
VCC  
B
Ipulse  
DUT  
RG  
tST  
Fig 21b. tst Test Waveforms  
Fig 21a. tst and EPULSE Test Circuit  
Fig 21c. EPULSE Test Waveforms  
www.irf.com  
7
IRFP4332PbF  
TO-247AC Package Outline Dimensions are shown in millimeters (inches)  
TO-247AC package is not recommended for Surface Mount Application.  
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/  
8
www.irf.com  
IRFP4332PbF  
TO-247AC Part Marking Information  
TO-247AC Lead Option- 203  
All dimensions in millimeters (inches)  
Lead Assignments  
1- Gate  
2- Drain  
3- Source  
Notes:  
 Repetitive rating; pulse width limited by max. junction temperature.  
‚ Starting TJ = 25°C, L = 0.35mH, RG = 25, IAS = 35A.  
ƒ Pulse width 400µs; duty cycle 2%.  
„ R is measured at TJ of approximately 90°C.  
θ
Half sine wave with duty cycle = 0.25, ton=1µsec.  
† Applicable to Sustain and Energy Recovery applications.  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 12/2009  
www.irf.com  
9
IMPORTANT NOTICE  
The information given in this document shall in no For further information on the product, technology,  
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please  
characteristics (“Beschaffenheitsgarantie”) .  
contact your nearest Infineon Technologies office  
(www.infineon.com).  
With respect to any examples, hints or any typical  
values stated herein and/or any information  
regarding the application of the product, Infineon  
Technologies hereby disclaims any and all  
warranties and liabilities of any kind, including  
without limitation warranties of non-infringement  
of intellectual property rights of any third party.  
WARNINGS  
Due to technical requirements products may  
contain dangerous substances. For information on  
the types in question please contact your nearest  
Infineon Technologies office.  
In addition, any information given in this document  
is subject to customers compliance with its  
obligations stated in this document and any  
applicable legal requirements, norms and  
standards concerning customers products and any  
use of the product of Infineon Technologies in  
customers applications.  
Except as otherwise explicitly approved by Infineon  
Technologies in a written document signed by  
authorized  
representatives  
of  
Infineon  
Technologies, Infineon Technologies’ products may  
not be used in any applications where a failure of  
the product or any consequences of the use thereof  
can reasonably be expected to result in personal  
injury.  
The data contained in this document is exclusively  
intended for technically trained staff. It is the  
responsibility of customers technical departments  
to evaluate the suitability of the product for the  
intended application and the completeness of the  
product information given in this document with  
respect to such application.  

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