IRFPS40N60KPBF [INFINEON]

HEXFET Power MOSFET; HEXFET功率MOSFET
IRFPS40N60KPBF
型号: IRFPS40N60KPBF
厂家: Infineon    Infineon
描述:

HEXFET Power MOSFET
HEXFET功率MOSFET

晶体 晶体管 功率场效应晶体管 开关 脉冲
文件: 总8页 (文件大小:177K)
中文:  中文翻译
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PD - 95702  
SMPS MOSFET  
IRFPS40N60KPbF  
HEXFET® Power MOSFET  
Applications  
l Hard Switching Primary or PFC Switch  
l Switch Mode Power Supply (SMPS)  
l Uninterruptible Power Supply  
l High Speed Power Switching  
l Motor Drive  
VDSS  
600V  
RDS(on) typ.  
ID  
40A  
0.110 Ω  
l Lead-Free  
Benefits  
l Low Gate Charge Qg results in Simple  
Drive Requirement  
l Improved Gate, Avalanche and Dynamic  
dv/dt Ruggedness  
l Fully Characterized Capacitance and  
Avalanche Voltage and Current  
l Enhanced Body Diode dv/dt Capability  
Absolute Maximum Ratings  
Parameter  
SUPER TO-247AC  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current   
40  
24  
A
160  
PD @TC = 25°C  
Power Dissipation  
570  
W
W/°C  
V
Linear Derating Factor  
4.5  
VGS  
dv/dt  
TJ  
Gate-to-Source Voltage  
± 30  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
5.5  
V/ns  
-55 to + 150  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
(1.6mm from case )  
300  
°C  
Avalanche Characteristics  
Symbol  
EAS  
Parameter  
Single Pulse Avalanche Energy‚  
Typ.  
Max.  
600  
40  
Units  
mJ  
–––  
–––  
–––  
IAR  
Avalanche Current  
A
EAR  
Repetitive Avalanche Energy  
57  
mJ  
Thermal Resistance  
Symbol  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
0.22  
–––  
40  
Units  
RθJC  
RθCS  
RθJA  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.24  
–––  
°C/W  
www.irf.com  
1
9/10/04  
IRFPS40N60KPbF  
Static @ TJ = 25°C (unless otherwise specified)  
Symbol  
Parameter  
Min. Typ. Max. Units  
600 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.63 ––– V/°C Reference to 25°C, ID = 1mA†  
RDS(on)  
VGS(th)  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– 0.110 0.130  
3.0 ––– 5.0  
V
VGS = 10V, ID = 24A „  
VDS = VGS, ID = 250µA  
––– ––– 50  
––– ––– 250  
––– ––– 100  
––– ––– -100  
V
DS = 600V, VGS = 0V  
VDS = 480V, VGS = 0V, TJ = 125°C  
GS = 30V  
VGS = -30V  
µA  
nA  
IDSS  
IGSS  
Drain-to-Source Leakage Current  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
V
Dynamic @ TJ = 25°C (unless otherwise specified)  
Symbol  
gfs  
Parameter  
Forward Transconductance  
Total Gate Charge  
Min. Typ. Max. Units  
21 ––– –––  
Conditions  
VDS = 50V, ID = 24A  
ID = 38A  
S
Qg  
––– ––– 330  
––– ––– 84  
––– ––– 150  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 480V  
VGS = 10V, See Fig. 6 and 13 „  
–––  
47 –––  
VDD = 300V  
––– 110 –––  
ID = 38A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
–––  
–––  
97 –––  
60 –––  
RG = 4.3Ω  
VGS = 10V,See Fig. 10 „  
VGS = 0V  
Ciss  
Coss  
Crss  
Coss  
Coss  
Coss eff.  
Input Capacitance  
––– 7970 –––  
––– 750 –––  
Output Capacitance  
Reverse Transfer Capacitance  
Output Capacitance  
Output Capacitance  
Effective Output Capacitance  
VDS = 25V  
–––  
75 –––  
pF  
ƒ = 1.0MHz, See Fig. 5  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
VGS = 0V, VDS = 480V, ƒ = 1.0MHz  
VGS = 0V, VDS = 0V to 480V ꢀ  
––– 9440 –––  
––– 200 –––  
––– 260 –––  
Diode Characteristics  
Symbol  
Parameter  
Min. Typ. Max. Units  
Conditions  
D
IS  
Continuous Source Current  
(Body Diode)  
––– ––– 40  
MOSFET symbol  
showing the  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
––– ––– 160  
integral reverse  
S
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
––– ––– 1.5  
––– 630 950  
––– 730 1090  
V
TJ = 25°C, IS = 38A, VGS = 0V „  
TJ = 25°C  
TJ = 125°C  
TJ = 25°C  
TJ = 125°C  
TJ = 25°C  
IF = 38A  
ns  
Reverse Recovery Time  
Reverse Recovery Charge  
di/dt = 100A/µs „  
––– 14  
––– 17  
––– 39  
20  
25  
58  
µC  
A
Qrr  
IRRM  
ton  
Reverse Recovery Current  
Forward Turn-On Time  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
„ Pulse width 300µs; duty cycle 2%.  
max. junction temperature. (See Fig. 11)  
Coss eff. is a fixed capacitance that gives the same charging time  
‚ Starting TJ = 25°C, L = 0.84mH, RG = 25,  
as Coss while VDS is rising from 0 to 80% VDSS  
IAS = 38A, dv/dt =5.5V/ns (See Figure 12a)  
ƒ ISD 38A, di/dt 150A/µs, VDD V(BR)DSS  
TJ 150°C  
,
2
www.irf.com  
IRFPS40N60KPbF  
1000  
100  
10  
100  
10  
1
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
BOTTOM 4.5V  
BOTTOM 4.5V  
1
4.5V  
0.1  
4.5V  
0.01  
0.001  
20µs PULSE WIDTH  
Tj = 25°C  
20µs PULSE WIDTH  
Tj = 150°C  
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.5  
1000  
38A  
=
I
D
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
100  
10  
°
T = 150  
C
J
°
C
T = 25  
J
1
0.1  
0.01  
V
= 50V  
DS  
V
= 10V  
GS  
20µs PULSE WIDTH  
-60 -40 -20  
0
20  
40  
60  
80 100 120 140 160  
°
4
6
8
10  
11 13  
15  
T , Junction Temperature  
(
C)  
V
, Gate-to-Source Voltage (V)  
GS  
J
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
www.irf.com  
3
IRFPS40N60KPbF  
100000  
12  
10  
7
D
I
= 38A  
V
= 0V,  
f = 1 MHZ  
V
V
V
= 480V  
= 300V  
= 120V  
GS  
iss  
rss  
oss  
DS  
DS  
DS  
C
C
C
= C + C  
,
C
SHORTED  
gs  
gd  
ds  
= C  
gd  
= C + C  
ds  
gd  
10000  
1000  
100  
Ciss  
Coss  
Crss  
5
2
0
10  
0
50  
Q
100  
150  
200  
250  
1
10  
100  
1000  
, Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
100  
10  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
°
100µsec  
1msec  
T = 150  
J
C
°
C
T = 25  
J
1
1
10msec  
Tc = 25°C  
Tj = 150°C  
Single Pulse  
V
= 0 V  
GS  
0.1  
0.1  
0.2  
0.6  
0.9  
1.3  
1.6  
1
10  
100  
1000  
10000  
V
,Source-to-Drain Voltage (V)  
SD  
V
, Drain-toSource Voltage (V)  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRFPS40N60KPbF  
RD  
40  
30  
20  
10  
0
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
T
75  
100  
125  
150  
°
C)  
, Case Temperature  
(
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
1
D = 0.50  
0.20  
0.1  
0.10  
0.05  
P
DM  
0.02  
0.01  
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
t
1
t
2
Notes:  
1. Duty factor D =  
t / t  
1
2
2. Peak T  
= P  
x Z  
+ T  
J
DM  
thJC  
C
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFPS40N60KPbF  
1200  
5.0  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
I
D
TOP  
17A  
24A  
38A  
960  
BOTTOM  
I
= 250µA  
720  
480  
240  
0
D
25  
50  
75  
100  
125  
C)  
150  
-75 -50 -25  
0
25  
50  
75 100 125 150  
°
(
Starting Tj, Junction Temperature  
T
, Temperature ( °C )  
J
Fig 12a. Maximum Avalanche Energy  
Fig 14. Threshold Voltage Vs. Temperature  
Vs. Drain Current  
15V  
V
(BR)DSS  
t
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
20V  
0.01Ω  
t
p
I
AS  
Fig 12d. Unclamped Inductive Waveforms  
Fig 12c. Unclamped Inductive Test Circuit  
Current Regulator  
Same Type as D.U.T.  
Q
G
50KΩ  
.2µF  
12V  
VGS  
V
.3µF  
Q
Q
GD  
GS  
+
V
DS  
D.U.T.  
-
V
V
GS  
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13b. Basic Gate Charge Waveform  
Fig 13a. Gate Charge Test Circuit  
6
www.irf.com  
IRFPS40N60KPbF  
Peak Diode Recovery dv/dt Test Circuit  
+
ƒ
-
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFET® Power MOSFETs  
www.irf.com  
7
IRFPS40N60KPbF  
Case Outline and Dimensions — Super-247  
Super-247 (TO-274AA) Part Marking Information  
E X A M P LE : T H IS IS A N IR F P S 3 7N 5 0A W IT H  
A S S E M B L Y LO T C O D E 17 89  
A S S E M B LE D O N W W 1 9, 19 97  
IN T H E A S S E M B LY L IN E "C "  
P A R T N U M B E R  
IN T E R N A T IO N A L R E C T IF IE R  
L O G O  
IR FP S 37N 50A  
719C  
17  
89  
D A T E C O D E  
Y E A R 7 = 19 97  
W E E K 1 9  
LIN E C  
A S S E M B L Y L O T C O D E  
N ote: "P " in a sse m bly line p osition  
ind icate s "Le ad-F ree "  
T O P  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.09/04  
8
www.irf.com  

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