IRFU2605 [INFINEON]

Power MOSFET(Vdss=55V, Rds(on)=0.075ohm, Id=19A); 功率MOSFET ( VDSS = 55V , RDS(ON) = 0.075ohm ,ID = 19A)
IRFU2605
型号: IRFU2605
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss=55V, Rds(on)=0.075ohm, Id=19A)
功率MOSFET ( VDSS = 55V , RDS(ON) = 0.075ohm ,ID = 19A)

文件: 总8页 (文件大小:307K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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PD - 9.1253  
IRFR2605  
IRFU2605  
HEXFET® Power MOSFET  
Ultra Low On-Resistance  
ESD Protected  
D
Surface Mount (IRFR2605)  
Straight Lead (IRFU2605)  
150°C Operating Temperature  
Repetitive Avalanche Rated  
Fast Switching  
VDSS = 55V  
RDS(on) = 0.075Ω  
ID = 19A  
G
Description  
S
Fourth Generation HEXFETs from International Rectifier utilize advanced  
processing techniques that achieve extremely low on-resistance per silicon area  
and allow electrostatic discharge protection to be integrated in the gate structure.  
These benefits, combined with the ruggedized device design that HEXFETs are  
known for, provide the designer with extremely efficient and reliable device for use  
in a wide variety of applications.  
D-PAK  
TO-252AA  
I-PAK  
TO-251AA  
The D-PAK is designed for surface mounting using vapor phase, infrared, or wave  
soldering techniques. The straight lead version (IRFU series) is for through-hole  
mounting applications. Power dissipation levels up to 1.5 watts are possible in  
typical surface mount applications.  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
19  
12  
A
76  
PD @TC = 25°C  
PD @TC = 25°C  
Power Dissipation  
50  
W
Power Dissipation (PCB Mount)**  
Linear Derating Factor  
3.1  
0.40  
0.025  
±20  
100  
12  
W/°C  
Linear Derating Factor (PCB Mount)**  
Gate-to-Source Voltage  
VGS  
V
mJ  
A
EAS  
Single Pulse Avalanche Energy  
Avalanche Current  
IAR  
EAR  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
5.0  
4.5  
mJ  
V/ns  
dv/dt  
TJ, TSTG  
Junction and Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Human Body Model, 100pF, 1.5KΩ  
-55 to + 150  
300 (1.6mm from case)  
2000  
°C  
V
VESD  
Thermal Resistance  
Parameter  
Junction-to-Case  
Min.  
Typ.  
Max.  
2.5  
Units  
RθJC  
RθJA  
RθJA  
Junction-to-Ambient (PCB Mount)**  
Junction-to-Ambient  
40  
°C/W  
62  
** When mounted on 1" square PCB (FR-4 or G-10 Material).  
For recommended footprint and soldering techniques refer to application note #AN-994.  
To Order  
 
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Index  
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IRFR2605  
IRFU2605  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
55 ––– –––  
––– 0.051 ––– V/°C Reference to 25°C, ID = 1mA  
Conditions  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
VGS = 0V, ID = 250µA  
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient  
RDS(ON)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 0.085  
2.0 ––– 4.0  
3.6 ––– –––  
––– ––– 25  
––– ––– 250  
––– ––– 10  
––– ––– -10  
––– ––– 23  
––– ––– 5.4  
––– ––– 10  
––– 7.1 –––  
––– 56 –––  
––– 31 –––  
––– 39 –––  
V
S
VGS = 10V, ID = 11A  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 11A  
VDS = 55V, VGS = 0V  
VDS = 44V, VGS = 0V, TJ = 125°C  
VGS = 20V  
Forward Transconductance  
IDSS  
IGSS  
Drain-to-Source Leakage Current  
µA  
µA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
VGS = -20V  
Qg  
ID = 11A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC  
ns  
VDS = 44V  
VGS = 10V, See Fig. 6 and 13  
VDD = 25V  
ID = 11A  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 20Ω  
RD = 2.2Ω, See Fig. 10  
D
Between lead,  
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
––– 4.5 –––  
––– 7.5 –––  
6mm (0.25in.)  
G
nH  
pF  
from package  
and center of die contact  
S
Ciss  
Coss  
Crss  
Input Capacitance  
––– 420 –––  
––– 250 –––  
––– 67 –––  
VGS = 0V  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
D
IS  
MOSFET symbol  
––– –––  
18  
showing the  
G
A
ISM  
Pulsed Source Current  
(Body Diode)  
integral reverse  
––– –––  
72  
p-n junction diode.  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
––– ––– 1.5  
––– 67 100  
––– 0.18 0.26  
V
TJ = 25°C, IS = 11A, VGS = 0V  
TJ = 25°C, IF = 11A  
ns  
Qrr  
ton  
µC di/dt = 100A/µs  
Intrinsic turn-on time is negligible (turn-on is dominated by L S+LD)  
Notes:  
Repetitive rating; pulse width limited by  
max. junction temperature. ( See fig. 11 )  
I
SD 11A, di/dt 110A/µs, VDD V(BR)DSS,  
TJ 150°C  
VDD = 25V, starting TJ = 25°C, L = 830µH  
Pulse width 300µs; duty cycle 2%.  
RG = 25, IAS = 11A. (See Figure 12)  
To Order  
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Index  
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IRFR2605  
IRFU2605  
100  
100  
10  
1
VGS  
VGS  
15V  
TOP  
15V  
TOP  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
10  
4.5V  
4.5V  
1
20µs PULSE WIDTH  
20µs PULSE WIDTH  
T
C
= 25°C  
T
= 150°C  
C
0.1  
0.01  
0.1  
0.01  
A
A
0.1  
1
10  
1 00  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics,  
Fig 2. Typical Output Characteristics,  
TC = 25oC  
TC = 150oC  
100  
10  
1
2.0  
1.5  
1.0  
0.5  
0.0  
I
= 19A  
D
TJ = 25°C  
TJ = 150°C  
VDS = 25V  
20µs PULSE WIDTH  
V
= 10V  
GS  
10A  
A
4
5
6
7
8
9
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
VGS , Gate-to-Source Voltage (V)  
T
, Junction Temperature (°C)  
J
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
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IRFR2605  
IRFU2605  
1000  
20  
16  
12  
8
I
= 11A  
V
C
C
C
= 0V,  
f = 1MHz  
D
GS  
iss  
rss  
oss  
= C + C  
,
C
SHORTED  
gs  
gd  
gd  
ds  
= C  
V
V
= 44V  
= 26V  
= C + C  
DS  
DS  
ds  
gd  
800  
600  
400  
200  
0
C
iss  
C
oss  
4
C
rss  
10  
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
A
A
1
100  
0
5
10  
15 20  
25  
V
, Drain-to-Source Voltage (V)  
Q
, Total Gate Charge (nC)  
DS  
G
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
100  
10  
1
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
T = 150°C  
J
T = 25°C  
J
10µs  
100µs  
1ms  
T
T
= 25°C  
= 150°C  
C
J
V
GS  
= 0V  
Single Pulse  
A
0.1  
1
0.1  
A
1000  
0.0  
0.4  
0.8  
1.2  
1.6  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Source-to-Drain Voltage (V)  
DS  
SD  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
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Index  
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IRFR2605  
IRFU2605  
RD  
VDS  
VGS  
20  
16  
12  
8
D.U.T.  
RG  
VDD  
10 V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
4
0
A
150  
25  
50  
75  
100  
125  
T , Case Temperature (°C)  
C
Fig 9. Maximum Drain Current Vs.  
Fig 10b. Switching Time Waveforms  
Case Temperature  
10  
D = 0.50  
0.20  
1
0.10  
0.05  
P
DM  
0.02  
0.1  
0.01  
t
1
SINGLE PULSE  
(THERMAL RESPONSE)  
t
2
N o tes:  
1 . D u ty fa ctor D  
=
t
/ t  
2
1
2 . P e ak T = P  
x Z  
+ T  
C
D M  
J
thJC  
A
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t1 , Rectangular Pulse Duration (sec)  
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
To Order  
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Index  
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IRFR2605  
IRFU2605  
200  
160  
120  
80  
I
D
TOP  
4.9A  
7.0A  
BOTTOM 11A  
10 V  
Fig 12a. Unclamped Inductive Test Circuit  
40  
V
= 25V  
50  
DD  
0
A
150  
25  
75  
100  
125  
Starting T , Junction Temperature (°C)  
J
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
Fig 12b. Unclamped Inductive Waveforms  
10
Fig 13a. Basic Gate Charge Waveform  
Fig 13b. Gate Charge Test Circuit  
To Order  
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IRFR2605  
IRFU2605  
Peak Diode Recovery dv/dt Test Circuit  
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
D.U.T  
Low Leakage Inductance  
Current Transformer  
RG  
dv/dt controlled by RG  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
*
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
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IRFR2605  
IRFU2605  
Package Outline  
D-PAK Outline  
Dimensions are shown in millimeters (inches)  
2.38 (.094)  
2.19 (.086)  
6.73 (.265)  
6.35 (.250)  
1.14 (.045)  
0.89 (.035)  
- A -  
1.27 (.050)  
5.46 (.215)  
0.58 (.023)  
0.46 (.018)  
0.88 (.035)  
5.21 (.205)  
4
6.45 (.245)  
5.68 (.224)  
6.22 (.245)  
5.97 (.235)  
10.42 (.410)  
9.40 (.370)  
1.02 (.040)  
1.64 (.025)  
LEAD ASSIGNMENTS  
1 - GATE  
1
2
3
0.51 (.020)  
MIN.  
2 - DRAIN  
- B -  
3 - SOURCE  
4 - DRAIN  
1.52 (.060)  
1.15 (.045)  
0.89 (.035)  
0.64 (.025)  
3X  
0.58 (.023)  
0.46 (.018)  
1.14 (.045)  
0.76 (.030)  
2X  
0.25 (.010)  
M A M B  
NOTES:  
2.28 (.090)  
1
2
3
4
DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.  
CONTROLLING DIMENSION : INCH.  
4.57 (.180)  
CONFORMS TO JEDEC OUTLINE TO-252AA.  
DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,  
SOLDER DIP MAX. +0.16 (.006).  
Part Marking Information  
D-PAK  
EXAMPLE : THIS IS AN IRFR120  
WITH ASSEMBLY  
A
INTERNATIONAL  
RECTIFIER  
LOGO  
LOT CODE 9U1P  
FIRST PORTION  
OF PART NUMBER  
IRFR  
120  
9U 1P  
SECOND PORTION  
OF PART NUMBER  
ASSEMBLY  
LOT CODE  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: (44) 0883 713215  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 3L1, Tel: (905) 475 1897 IR GERMANY:  
Saalburgstrasse 157, 61350 Bad Homburg Tel: 6172 37066 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: (39) 1145  
10111 IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo 171 Tel: (03)3983 0641 IR  
SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, 0316 Tel: 65 221 8371  
Data and specifications subject to change without notice.  
To Order  

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