IRG4PC50UDPBF [INFINEON]

INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE; 绝缘栅双极型晶体管,超快软恢复二极管
IRG4PC50UDPBF
型号: IRG4PC50UDPBF
厂家: Infineon    Infineon
描述:

INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE
绝缘栅双极型晶体管,超快软恢复二极管

晶体 二极管 双极型晶体管 功率控制 双极性晶体管 栅 局域网 超快软恢复二极管 快速软恢复二极管
文件: 总10页 (文件大小:688K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD -95185  
IRG4PC50UDPbF  
UltraFast CoPack IGBT  
INSULATED GATE BIPOLAR TRANSISTOR WITH  
ULTRAFAST SOFT RECOVERY DIODE  
Features  
C
• UltraFast: Optimized for high operating  
frequencies 8-40 kHz in hard switching, >200  
kHz in resonant mode  
VCES = 600V  
• Generation 4 IGBT design provides tighter  
V
CE(on) typ. = 1.65V  
parameter distribution and higher efficiency than  
Generation 3  
G
@VGE = 15V, IC = 27A  
• IGBT co-packaged with HEXFREDTM ultrafast,  
ultra-soft-recovery anti-parallel diodes for use in  
bridge configurations  
E
n-channel  
• Industry standard TO-247AC package  
• Lead-Free  
Benefits  
• Generation 4 IGBT's offer highest efficiencies  
available  
• IGBT's optimized for specific application conditions  
• HEXFRED diodes optimized for performance with  
IGBT's . Minimized recovery characteristics require  
less/no snubbing  
• Designed to be a "drop-in" replacement for  
equivalent industry-standard Generation 3 IR IGBT's  
TO-247AC  
Absolute Maximum Ratings  
Parameter  
Max.  
600  
Units  
V
VCES  
Collector-to-Emitter Voltage  
Continuous Collector Current  
Continuous Collector Current  
Pulsed Collector Current   
IC @ TC = 25°C  
55  
IC @ TC = 100°C  
27  
ICM  
220  
A
ILM  
Clamped Inductive Load Current ‚  
Diode Continuous Forward Current  
Diode Maximum Forward Current  
Gate-to-Emitter Voltage  
220  
IF @ TC = 100°C  
25  
IFM  
220  
VGE  
± 20  
200  
V
PD @ TC = 25°C  
Maximum Power Dissipation  
Maximum Power Dissipation  
Operating Junction and  
W
PD @ TC = 100°C  
78  
TJ  
-55 to +150  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 sec.  
Mounting Torque, 6-32 or M3 Screw.  
°C  
300 (0.063 in. (1.6mm) from case)  
10 lbf•in (1.1 N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case - IGBT  
Junction-to-Case - Diode  
Case-to-Sink, flat, greased surface  
Junction-to-Ambient, typical socket mount  
Weight  
Min.  
------  
------  
------  
-----  
Typ.  
------  
------  
0.24  
Max.  
0.64  
0.83  
------  
40  
Units  
RθJC  
RθJC  
RθCS  
RθJA  
Wt  
°C/W  
-----  
------  
6 (0.21)  
------  
g (oz)  
www.irf.com  
1
04/23/04  
IRG4PC50UDPbF  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Collector-to-Emitter Breakdown Voltageƒ 600 ---- ----  
V(BR)CES/TJ Temperature Coeff. of Breakdown Voltage ---- 0.60 ---- V/°C VGE = 0V, IC = 1.0mA  
Min. Typ. Max. Units  
Conditions  
V(BR)CES  
V
VGE = 0V, IC = 250µA  
VCE(on)  
Collector-to-Emitter Saturation Voltage  
---- 1.65 2.0  
---- 2.0 ----  
---- 1.6 ----  
3.0 ---- 6.0  
IC = 27A  
C = 55A  
VGE = 15V  
V
I
See Fig. 2, 5  
IC = 27A, TJ = 150°C  
VGE(th)  
Gate Threshold Voltage  
VCE = VGE, IC = 250µA  
VGE(th)/TJ Temperature Coeff. of Threshold Voltage ---- -13 ---- mV/°C VCE = VGE, IC = 250µA  
gfe  
Forward Transconductance „  
16  
24  
----  
S
VCE = 100V, IC = 27A  
VGE = 0V, VCE = 600V  
ICES  
Zero Gate Voltage Collector Current  
---- ---- 250  
---- ---- 6500  
---- 1.3 1.7  
---- 1.2 1.5  
µA  
V
GE = 0V, VCE = 600V, TJ = 150°C  
IC = 25A See Fig. 13  
C = 25A, TJ = 150°C  
VGE = ±20V  
VFM  
IGES  
Diode Forward Voltage Drop  
V
I
Gate-to-Emitter Leakage Current  
---- ---- ±100 nA  
Switching Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
Conditions  
See Fig. 8  
Qg  
Total Gate Charge (turn-on)  
Gate - Emitter Charge (turn-on)  
Gate - Collector Charge (turn-on)  
Turn-On Delay Time  
RiseTime  
---- 180 270  
IC = 27A  
Qge  
Qgc  
td(on)  
tr  
----  
----  
----  
----  
25  
61  
46  
25  
38  
90  
nC VCC = 400V  
VGE = 15V  
----  
----  
TJ = 25°C  
ns  
IC = 27A, VCC = 480V  
VGE = 15V, RG = 5.0Ω  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
---- 140 230  
---- 74 110  
Energy losses include "tail" and  
diode reverse recovery.  
See Fig. 9, 10, 11, 18  
Eon  
Eoff  
Turn-On Switching Loss  
Turn-Off Switching Loss  
Total Switching Loss  
Turn-On Delay Time  
RiseTime  
---- 0.99 ----  
---- 0.59 ----  
---- 1.58 1.9  
mJ  
ns  
mJ  
E
ts  
td(on)  
tr  
td(off)  
tf  
----  
----  
44  
27  
----  
----  
TJ = 150°C, See Fig. 9, 10, 11, 18  
IC = 27A, VCC = 480V  
Turn-Off Delay Time  
FallTime  
---- 240 ----  
---- 130 ----  
---- 2.3 ----  
VGE = 15V, RG = 5.0Ω  
Energy losses include "tail" and  
diode reverse recovery.  
E
ts  
Total Switching Loss  
Internal Emitter Inductance  
Input Capacitance  
LE  
----  
13  
----  
nH Measured 5mm from package  
VGE = 0V  
Cies  
Coes  
Cres  
trr  
---- 4000 ----  
---- 250 ----  
Output Capacitance  
Reverse Transfer Capacitance  
Diode Reverse Recovery Time  
pF  
ns  
A
VCC = 30V  
See Fig. 7  
IF = 25A  
----  
----  
52  
50  
----  
75  
ƒ = 1.0MHz  
TJ = 25°C See Fig.  
---- 105 160  
TJ = 125°C  
TJ = 25°C See Fig.  
TJ = 125°C 15  
nC TJ = 25°C See Fig.  
TJ = 125°C 16  
14  
Irr  
Diode Peak Reverse Recovery Current ---- 4.5  
---- 8.0  
10  
15  
VR = 200V  
Qrr  
Diode Reverse Recovery Charge  
---- 112 375  
---- 420 1200  
di/dt 200A/µs  
di(rec)M/dt  
Diode Peak Rate of Fall of Recovery  
During tb  
---- 250 ---- A/µs TJ = 25°C  
---- 160 ---- TJ = 125°C  
2
www.irf.com  
IRG4PC50UDPbF  
40  
30  
20  
10  
0
Duty cycle: 50%  
T
T
= 1 25°C  
J
=
90°C  
sink  
Gate drive as specified  
Turn-on losses include  
effects of reverse recovery  
Power Dissipation = 40W  
60% of rated  
voltage  
A
0.1  
1
10  
100  
f, Frequency (kHz)  
Fig. 1 - Typical Load Current vs. Frequency  
(Load Current = IRMS of fundamental)  
1000  
100  
1000  
100  
TJ = 150°C  
TJ = 1 5 0 °C  
10  
TJ = 25°C  
TJ = 2 5 °C  
10  
1
VG E = 1 5 V  
VCC = 10V  
2 0 µ s P UL S E W ID TH  
5µs PULSE W IDTH  
A
A
0.1  
1
0
1
10  
4
6
8
10  
12  
V
, Collector-to-Em itter Voltage (V)  
V
, Gate-to-Emitter Voltage (V)  
C E  
GE  
Fig. 3 - Typical Transfer Characteristics  
Fig. 2 - Typical Output Characteristics  
www.irf.com  
3
IRG4PC50UDPbF  
60  
2.5  
2.0  
1.5  
1.0  
V
= 15V  
G E  
VGE = 15V  
80µs PULSE W IDTH  
50  
40  
30  
20  
10  
0
IC = 54A  
IC = 27A  
IC = 14A  
A
25  
50  
75  
100  
125  
150  
-60  
-40  
-20  
0
20  
40  
60  
80  
100 120 140 160  
TC , Case Temperature (°C)  
T
, Junction Temperature (°C)  
J
Fig. 4 - Maximum Collector Current vs. Case  
Fig. 5 - Typical Collector-to-Emitter Voltage  
Temperature  
vs. Junction Temperature  
1
D
=
0.5 0  
0.2 0  
0.1  
0.1 0  
0 .0 5  
P
D M  
t
1
S IN G L E P U LS E  
t
2
(T H E R M A L R E S P O N S E )  
0.02  
0.01  
N otes:  
1 . D uty factor D =  
t
/ t  
2
1
2. P eak T = P  
x Z  
+ T  
C
D M  
J
thJC  
1
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
10  
t
, Rectangular P ulse Duration (sec)  
1
Fig. 6-MaximumIGBTEffectiveTransientThermalImpedance,Junction-to-Case  
www.irf.com  
4
IRG4PC50UDPbF  
20  
16  
12  
8
8000  
6000  
4000  
2000  
0
VC E = 400V  
IC = 27A  
V G E = 0V ,  
f = 1M Hz  
C ies = C ge + C  
C res = C gc  
,
C
SHO RTED  
gc  
ce  
C oes = C ce + C  
gc  
C
ie s  
C
C
oes  
res  
4
A
A
0
0
40  
80  
120  
160  
200  
1
10  
100  
Q
, Total Gate Charge (nC)  
g
V
, Collector-to-Em itter Voltage (V)  
CE  
Fig. 7 - Typical Capacitance vs.  
Fig. 8 - Typical Gate Charge vs.  
Collector-to-Emitter Voltage  
Gate-to-Emitter Voltage  
3.0  
2.5  
2.0  
1.5  
1.0  
10  
V C C = 4 8 0V  
V G E = 1 5 V  
T J  
= 2 5 °C  
IC = 54A  
I C = 27 A  
IC = 27A  
IC = 14A  
1
RG  
= 5.0 Ω  
VG E = 15V  
VC C = 480V  
A
A
0.1  
0
10  
20  
30  
40  
50  
60  
-60  
-40  
-20  
0
20  
40  
60  
80  
100 120 140 160  
T
, Junction Temperature (°C)  
R
, G ate R e sista nce (  
)
J
G
Fig. 9 - Typical Switching Losses vs. Gate  
Fig. 10 - Typical Switching Losses vs.  
Resistance  
Junction Temperature  
www.irf.com  
5
IRG4PC50UDPbF  
8.0  
1000  
100  
10  
V
T
= 20V  
= 125°C  
R G = 5 .0  
G
E
T
= 15 0 °C  
V C C = 4 8 0 V  
V G E = 1 5 V  
J
J
6.0  
4.0  
2.0  
0.0  
SA FE O PERATING AREA  
A
1
0
10  
20  
30  
40  
50  
60  
1
10  
100  
1000  
I
, C ollector-to-Em itte r C urrent (A)  
V
, Collector-to-Emitter Voltage (V)  
C
C E  
Fig. 12 - Turn-Off SOA  
Fig. 11 - Typical Switching Losses vs.  
Collector-to-Emitter Current  
100  
10  
1
T
= 150°C  
= 125°C  
J
T
J
T
=
25°C  
J
0.6  
1.0  
1.4  
1.8  
2.2  
2.6  
Forward Voltage D ro p - V  
(V)  
FM  
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current  
www.irf.com  
6
IRG4PC50UDPbF  
100  
10  
1
140  
120  
100  
80  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
VR  
TJ  
TJ  
=
=
=
200V  
125°C  
25°C  
I
= 50A  
F
I
= 25A  
F
I
I
= 50A  
= 25A  
F
F
I
= 10A  
F
I
= 10A  
F
60  
40  
20  
100  
1000  
100  
1000  
di /dt - (A/µs)  
f
di /dt - (A/µs)  
f
Fig. 15 - Typical Recovery Current vs. dif/dt  
Fig. 14 - Typical Reverse Recovery vs. dif/dt  
1500  
10000  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
1200  
900  
I
= 50A  
F
I
= 10A  
F
1000  
600  
300  
0
I
= 25A  
F
I
= 25A  
F
I
= 10A  
F
I
= 50A  
F
100  
100  
100  
1000  
1000  
di /dt - (A /µs)  
di /dt - (A/µs)  
f
f
Fig. 16 - Typical Stored Charge vs. dif/dt  
Fig. 17 - Typical di(rec)M/dt vs. dif/dt  
www.irf.com  
7
IRG4PC50UDPbF  
90% Vge  
+Vge  
Same type  
device as  
D.U.T.  
Vce  
90% Ic  
10% Vce  
Ic  
Ic  
430µF  
80%  
5% Ic  
of Vce  
D.U.T.  
td(off)  
tf  
t1+5µ S  
Eoff =  
Vce ic dt  
t1  
Fig. 18a - Test Circuit for Measurement of  
ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf  
t1  
t2  
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining  
Eoff, td(off), tf  
trr  
id dt  
trr  
G ATE VO LTA G E D .U .T.  
Q rr =  
Ic  
tx  
10% +Vg  
+Vg  
tx  
10% Irr  
10% Vcc  
Vcc  
D UT VO LTAG E  
AN D CU RRE NT  
Vce  
V pk  
Irr  
10% Ic  
Vcc  
Ipk  
90% Ic  
Ic  
DIO DE RE CO V ERY  
W AVEFO RMS  
5% Vce  
tr  
td(on)  
t2  
Vce ie dt  
E on =  
t4  
Erec = Vd id dt  
t1  
t3  
DIO DE REVE RSE  
REC O VERY ENER G Y  
t1  
t2  
t3  
t4  
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,  
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,  
Defining Erec, trr, Qrr, Irr  
Defining Eon, td(on), tr  
8
www.irf.com  
IRG4PC50UDPbF  
Vg  
G ATE SIG NAL  
DEVICE U NDE R TEST  
CUR REN T D .U .T.  
VO LTAG E IN D.U.T.  
CUR REN T IN D1  
t0  
t1  
t2  
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit  
480V  
4 X IC @25°C  
L
D.U.T.  
RL=  
1000V  
V *  
c
0 - 480V  
50V  
6000µ F  
100 V  
Figure 20. Pulsed Collector Current  
Test Circuit  
Figure 19. Clamped Inductive Load Test  
Circuit  
www.irf.com  
9
IRG4PC50UDPbF  
Notes:  
Repetitive rating: VGE = 20V; pulse width limited by maximum junction temperature  
(figure 20)  
‚VCC = 80%(VCES), VGE = 20V, L = 10µH, RG = 5.0(figure 19)  
ƒPulse width 80µs; duty factor 0.1%.  
„Pulse width 5.0µs, single shot.  
TO-247AC Package Outline  
Dimensions are shown in millimeters (inches)  
TO-247AC Part Marking Information  
EXAMPLE: THIS IS AN IRFPE30  
WIT H AS S E MBLY  
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
LOGO  
LOT CODE 5657  
IRFPE30  
035H  
57  
ASSEMBLED ON WW 35, 2000  
IN THE ASSEMBLY LINE "H"  
56  
DATE CODE  
YEAR 0 = 2000  
WE EK 35  
Note: "P" in assembly line  
position indicates "Lead-Free"  
AS S E MB L Y  
LOT CODE  
LINE H  
Data and specifications subject to change without notice.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 04/04  
10  
www.irf.com  

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