IRL3705ZSTRL [INFINEON]

Power Field-Effect Transistor, 75A I(D), 55V, 0.008ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, PLASTIC, D2PAK-3;
IRL3705ZSTRL
型号: IRL3705ZSTRL
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 75A I(D), 55V, 0.008ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, PLASTIC, D2PAK-3

晶体 晶体管 功率场效应晶体管 开关 脉冲 局域网
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中文:  中文翻译
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PD - 9.1370C  
IRL3705N  
HEXFET® Power MOSFET  
l Logic-Level Gate Drive  
l Advanced Process Technology  
l Dynamic dv/dt Rating  
l 175°C Operating Temperature  
l Fast Switching  
D
VDSS = 55V  
RDS(on) = 0.01Ω  
G
l Fully Avalanche Rated  
ID=89Aꢀ  
S
Description  
FifthGenerationHEXFETsfromInternationalRectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedized device design that HEXFET Power  
MOSFETs are well known for, provides the designer  
with an extremely efficient and reliable device for use  
in a wide variety of applications.  
The TO-220 package is universally preferred for all  
commercial-industrialapplicationsatpowerdissipation  
levels to approximately 50 watts. The low thermal  
resistance and low package cost of the TO-220  
contribute to its wide acceptance throughout the  
industry.  
TO-220AB  
Absolute Maximum Ratings  
Parameter  
Max.  
89ꢀ  
63  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current   
A
310  
PD @TC = 25°C  
Power Dissipation  
170  
W
W/°C  
V
Linear Derating Factor  
1.1  
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
± 16  
340  
Single Pulse Avalanche Energy‚  
Avalanche Current  
mJ  
46  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
17  
mJ  
5.0  
V/ns  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 srew  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
Units  
RθJC  
RθCS  
RθJA  
0.90  
–––  
62  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.50  
–––  
°C/W  
8/25/97  
IRL3705N  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
Conditions  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
55 ––– –––  
V
VGS = 0V, ID = 250µA  
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.056 ––– V/°C Reference to 25°C, ID = 1mA  
––– ––– 0.010  
––– ––– 0.012  
––– ––– 0.018  
VGS = 10V, ID = 46A „  
VGS = 5.0V, ID = 46A „  
VGS = 4.0V, ID = 39A „  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 46A  
VDS = 55V, VGS = 0V  
VDS = 44V, VGS = 0V, TJ = 150°C  
VGS = 16V  
RDS(on)  
Static Drain-to-Source On-Resistance  
VGS(th)  
gfs  
Gate Threshold Voltage  
1.0  
50  
––– 2.0  
––– –––  
V
S
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 98  
––– ––– 19  
––– ––– 49  
IDSS  
IGSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
VGS = -16V  
Qg  
ID = 46A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 44V  
VGS = 5.0V, See Fig. 6 and 13 „  
–––  
12 –––  
VDD = 28V  
––– 140 –––  
ID = 46A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
–––  
–––  
37 –––  
78 –––  
RG = 1.8Ω, VGS = 5.0V  
RD = 0.59Ω, See Fig. 10 „  
Between lead,  
D
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
–––  
4.5  
–––  
nH  
6mm (0.25in.)  
G
from package  
––– 7.5 –––  
and center of die contact  
VGS = 0V  
S
Ciss  
Coss  
Crss  
Input Capacitance  
––– 3600 –––  
––– 870 –––  
––– 320 –––  
Output Capacitance  
pF  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
showing the  
D
IS  
––– –––  
––– –––  
89ꢀ  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
310  
S
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
––– ––– 1.3  
––– 94 140  
––– 290 440  
V
TJ = 25°C, IS = 46A, VGS = 0V „  
ns  
TJ = 25°C, IF = 46A  
Qrr  
ton  
nC di/dt = 100A/µs „  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
ƒ ISD 46A, di/dt 250A/µs, VDD V(BR)DSS  
TJ 175°C  
,
max. junction temperature. ( See fig. 11 )  
„ Pulse width 300µs; duty cycle 2%.  
Calculated continuous current based on maximum allowable  
‚ VDD = 25V, starting TJ = 25°C, L = 320µH  
RG = 25, IAS = 46A. (See Figure 12)  
junction temperature; for recommended current-handling of the  
package refer to Design Tip # 93-4  
IRL3705N  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
12V  
12V  
10V  
10V  
8.0V  
6.0V  
4.0V  
3.0V  
8.0V  
6.0V  
4.0V  
3.0V  
BOTT OM 2.5V  
BOTT OM 2.5V  
2.5V  
2.5V  
20µs PULSE W IDTH  
20µs PULSE W IDTH  
T
= 25°C  
T
= 175°C  
J
J
1
1
A
A
0.1  
1
10  
100  
0.1  
1
10  
100  
VD S , Drain-to-Source Voltage (V)  
VD S , Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1 0 0 0  
1 0 0  
1 0  
3. 0  
2. 5  
2. 0  
1. 5  
1. 0  
0. 5  
0. 0  
I
= 77A  
D
T
= 25°C  
J
T
= 175°C  
J
V
= 25V  
DS  
20µs P ULS E W IDTH  
V
= 10V  
GS  
1
8. 0 A  
A
2. 0  
3. 0  
4. 0  
5. 0  
6. 0  
7. 0  
- 6 0 - 4 0 - 2 0  
0
2 0  
4 0  
6 0  
8 0 1 0 0 1 2 0 1 4 0 1 6 0 1 8 0  
TJ , Junction Temperature (°C)  
VG S , Ga te-to-So urce Voltage (V)  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
IRL3705N  
15  
12  
9
6000  
I
= 46A  
V
C
C
C
= 0V ,  
f = 1MHz  
D
GS  
iss  
= C  
= C  
= C  
+ C  
+ C  
,
C
SHORTED  
gs  
g d  
ds  
gd  
ds  
V
V
= 44V  
= 28V  
DS  
DS  
rss  
oss  
5000  
4000  
3000  
2000  
1000  
0
C
is s  
gd  
C
C
o s s  
rs s  
6
3
FOR TES T CIRCUIT  
SEE FIGURE 13  
0
A
A
0
20  
40  
60  
80  
100  
120  
140  
1
10  
100  
VD S , Drain-to-Source Voltage (V)  
Q G , Total Gate Charge (nC)  
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
1 0 0 0  
1000  
100  
10  
OPE RATION IN THIS A RE A LIMITE D  
BY R  
D S(o n)  
10µs  
100µs  
1 0 0  
T
= 175°C  
J
1 ms  
T
= 25°C  
J
10m s  
T
T
= 25°C  
= 175°C  
C
J
V
= 0V  
S ingle Pulse  
GS  
1 0  
A
1
A
0. 4  
0. 8  
1. 2  
1. 6  
2. 0  
2. 4  
2. 8  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
VSD , Source-to-Drain Voltage (V)  
DS  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
IRL3705N  
100  
80  
60  
40  
20  
0
RD  
VDS  
LIMITED BY PACKAGE  
VGS  
D.U.T.  
RG  
+VDD  
-
5.0V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
T , Case Temperature ( C)  
C
10%  
V
GS  
Fig 9. Maximum Drain Current Vs.  
t
t
r
t
t
f
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
1
D = 0.50  
0.20  
0.10  
0.05  
0.1  
P
DM  
t
1
0.02  
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
t
2
Notes:  
1. Duty factor D =  
t
/ t  
1
2
2. Peak T = P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
IRL3705N  
800  
600  
400  
200  
0
I
D
TOP  
19A  
33A  
15 V  
BOTTOM 46A  
D R IV ER  
L
V
D S  
D .U .T  
A S  
R
+
G
V
D D  
-
I
A
10V  
0 .0 1  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
= 25V  
50  
D D  
A
175  
25  
75  
100  
125  
150  
Starting TJ , Junction Temperature (°C)  
V
(BR)DSS  
t
p
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Current Regulator  
Fig 12b. Unclamped Inductive Waveforms  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
5.0 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13a. Basic Gate Charge Waveform  
Fig 13b. Gate Charge Test Circuit  
IRL3705N  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
IRL3705N  
Package Outline  
TO-220AB Outline  
Dimensions are shown in millimeters (inches)  
1 0.5 4 (.41 5)  
1 0.2 9 (.40 5)  
-
B
-
3.78 (.14 9)  
3.54 (.13 9)  
2 .87 ( .1 13 )  
2 .62 ( .1 03 )  
4 .69 ( .1 85 )  
4 .20 ( .1 65 )  
1 .3 2 (.0 52 )  
1 .2 2 (.0 48 )  
-
A
-
6.4 7 (.25 5)  
6.1 0 (.24 0)  
4
1 5.24 ( .6 0 0)  
1 4.84 ( .5 8 4)  
1.15 ( .0 4 5)  
L E A D  
A
S
S
IG N M E N T S  
M IN  
1
2
3
4
-
-
-
-
G A T E  
1
2
3
D R A IN  
U R C E  
D R A IN  
S
O
1 4.09 (.5 5 5)  
1 3.47 (.5 3 0)  
4.0 6 (.16 0)  
3.5 5 (.14 0)  
0 .93 ( .0 37 )  
0 .69 ( .0 27 )  
0.5 5 (.02 2)  
0.4 6 (.01 8)  
3X  
3X  
1 .4 0 (.05 5 )  
1 .1 5 (.04 5 )  
3 X  
0 .3 6 (.01 4)  
M
B
A
M
2 .9 2 (.11 5 )  
2 .6 4 (.10 4 )  
2 .54 ( .1 00 )  
2X  
N O T E  
S :  
1
2
D IM E N S IO N IN G  
C O N T R O L LIN G  
&
T O L E R A N C IN G  
P
E R  
A
N S  
I
Y
14 .5 M , 1 98 2.  
3
O
U T L IN E C O N F O R M S T O J E D E  
C
O U T LIN E T O -2 20 A B .  
N O IN C L U D E B U R R S .  
D
IM E N S IO IN C H  
N
:
4
H E A T S IN L E A D E A U R E M E N T S  
K
&
M
S
D
O
T
Part Marking Information  
TO-220AB  
EXAM PLE : THIS IS AN IRF1010  
A
W ITH ASSEMBLY  
INTERNATIONAL  
PART NUM BER  
LOT CODE 9B1M  
RECTIFIER  
IRF1010  
LOGO  
9246  
1M  
9B  
DATE CODE  
ASSEM BLY  
(YYW W )  
LOT CODE  
YY = YEAR  
=
W W W EEK  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
8/97  

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