Q62702-S299 [INFINEON]

SIPMOS Small-Signal Transistor (P channel Enhancement mode Logic Level); SIPMOS小信号晶体管(P沟道增强模式的逻辑电平)
Q62702-S299
型号: Q62702-S299
厂家: Infineon    Infineon
描述:

SIPMOS Small-Signal Transistor (P channel Enhancement mode Logic Level)
SIPMOS小信号晶体管(P沟道增强模式的逻辑电平)

晶体 晶体管
文件: 总7页 (文件大小:76K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BSS 284  
®
SIPMOS Small-Signal Transistor  
• P channel  
• Enhancement mode  
• Logic Level  
• V  
= -0.8...-1.6 V  
GS(th)  
Pin 1  
G
Pin 2  
S
Pin 3  
D
Type  
V
I
R
DS(on)  
Package  
Marking  
DS  
D
BSS 284  
-50 V  
-0.13 A 10 Ω  
SOT-23  
SDs  
Type  
Ordering Code  
Tape and Reel Information  
BSS 284  
Q62702-S299  
E6327  
Maximum Ratings  
Parameter  
Symbol  
Values  
Unit  
Drain source voltage  
Drain-gate voltage  
V
V
-50  
V
DS  
DGR  
R
= 20 k  
-50  
GS  
±
20  
Gate source voltage  
V
GS  
Continuous drain current  
I
A
D
T = 30 °C  
-0.13  
-0.52  
0.36  
A
DC drain current, pulsed  
I
Dpuls  
T = 25 °C  
A
Power dissipation  
P
W
tot  
T = 25 °C  
A
Semiconductor Group  
1
18/02/1997  
BSS 284  
Maximum Ratings  
Parameter  
Symbol  
Values  
Unit  
Chip or operating temperature  
Storage temperature  
T
-55 ... + 150 °C  
-55 ... + 150  
j
T
stg  
1)  
Thermal resistance, chip to ambient air  
R
350  
K/W  
thJA  
1)  
Therminal resistance, chip-substrate- reverse side R  
DIN humidity category, DIN 40 040  
285  
thJSR  
E
IEC climatic category, DIN IEC 68-1  
55 / 150 / 56  
1) For package mounted on aluminium 15 mm x 16.7 mm x 0.7 mm  
Electrical Characteristics, at T = 25°C, unless otherwise specified  
j
Parameter  
Symbol  
Values  
Unit  
min.  
typ.  
max.  
Static Characteristics  
Drain- source breakdown voltage  
V
V
V
(BR)DSS  
GS(th)  
DSS  
V
= 0 V, I = -0.25 mA, T = 25 °C  
-50  
-
-
GS  
D
j
Gate threshold voltage  
=
V
V
I = -1 mA  
-0.8  
-1.2  
-1.6  
GS DS, D  
Zero gate voltage drain current  
I
µA  
V
V
V
= -50 V, V = 0 V, T = 25 °C  
-
-
-
-0.1  
-2  
-1  
DS  
DS  
DS  
GS  
j
= -50 V, V = 0 V, T = 125 °C  
-60  
-0.1  
GS  
j
= -25 V, V = 0 V, T = 25 °C  
-
GS  
j
Gate-source leakage current  
= -20 V, V = 0 V  
I
nA  
GSS  
V
-
-
-1  
5
-10  
10  
GS  
DS  
Drain-Source on-state resistance  
= -10 V, I = -0.13 A  
R
DS(on)  
V
GS  
D
Semiconductor Group  
2
18/02/1997  
BSS 284  
Electrical Characteristics, at T = 25°C, unless otherwise specified  
j
Parameter  
Symbol  
Values  
typ.  
Unit  
min.  
max.  
Dynamic Characteristics  
Transconductance  
g
S
fs  
V
2 I  
R I = -0.13 A  
0.05  
0.08  
30  
17  
8
-
DS  
* D * DS(on)max, D  
Input capacitance  
= 0 V, V = -25 V, f = 1 MHz  
C
C
C
pF  
iss  
V
-
-
-
40  
25  
12  
GS  
DS  
Output capacitance  
= 0 V, V = -25 V, f = 1 MHz  
oss  
V
GS  
DS  
Reverse transfer capacitance  
= 0 V, V = -25 V, f = 1 MHz  
rss  
V
GS  
DS  
Turn-on delay time  
= -30 V, V = -10 V, I = -0.27 A  
t
t
t
t
ns  
d(on)  
V
DD  
GS  
D
R
= 50  
-
-
-
-
7
10  
18  
13  
27  
GS  
Rise time  
= -30 V, V = -10 V, I = -0.27 A  
r
V
DD  
GS  
D
R
= 50  
12  
10  
20  
GS  
Turn-off delay time  
= -30 V, V = -10 V, I = -0.27 A  
d(off)  
V
DD  
GS  
D
R
= 50 Ω  
GS  
Fall time  
= -30 V, V = -10 V, I = -0.27 A  
f
V
DD  
GS  
D
R
= 50 Ω  
GS  
Semiconductor Group  
3
18/02/1997  
BSS 284  
Electrical Characteristics, at T = 25°C, unless otherwise specified  
j
Parameter  
Symbol  
Values  
typ.  
Unit  
min.  
max.  
Reverse Diode  
Inverse diode continuous forward current I  
A
S
T = 25 °C  
-
-
-
-
-0.13  
-0.52  
-1.2  
A
Inverse diode direct current,pulsed  
I
SM  
T = 25 °C  
-
A
Inverse diode forward voltage  
V
V
SD  
V
= 0 V, I = -0.26 A, T = 25 °C  
-0.9  
GS  
F
j
Semiconductor Group  
4
18/02/1997  
BSS 284  
Power dissipation  
Drain current  
ƒ
ƒ
I = (T )  
D A  
P
= (T )  
tot  
A
parameter: V  
-10 V  
GS  
0.40  
W
-0.14  
A
-0.12  
0.32  
0.28  
0.24  
0.20  
0.16  
0.12  
0.08  
0.04  
Ptot  
ID  
-0.11  
-0.10  
-0.09  
-0.08  
-0.07  
-0.06  
-0.05  
-0.04  
-0.03  
-0.02  
-0.01  
0.00  
0.00  
0
20  
40  
60  
80 100 120  
°C 160  
TA  
0
20  
40  
60  
80 100 120  
°C 160  
TA  
Safe operating area I =f(V  
)
DS  
Drain-source breakdown voltage  
D
ƒ
parameter : D = 0.01, T =25°C  
V
= (T )  
C
(BR)DSS  
j
-60  
V
-58  
-57  
V(BR)DSS  
-56  
-55  
-54  
-53  
-52  
-51  
-50  
-49  
-48  
-47  
-46  
-45  
-60  
-20  
20  
60  
100  
°C  
Tj  
160  
Semiconductor Group  
5
18/02/1997  
BSS 284  
Typ. output characteristics  
ƒ(  
Typ. drain-source on-resistance  
ƒ(  
I =  
V
)
R
=
I )  
D
D
DS  
DS (on)  
parameter: t = 80 µs , T = 25 °C  
parameter: t = 80 µs, T = 25 °C  
p j  
p
j
32  
-0.30  
A
P
tot = 0W  
k
a
b
c
d
e
j
i
l
h
-0.26  
-0.24  
-0.22  
-0.20  
-0.18  
-0.16  
-0.14  
-0.12  
-0.10  
-0.08  
-0.06  
-0.04  
V
[V]  
GS  
a
ID  
RDS (on)  
-2.0  
-2.5  
-3.0  
-3.5  
-4.0  
-4.5  
-5.0  
-6.0  
-7.0  
-8.0  
-9.0  
24  
20  
16  
12  
8
b
c
d
e
f
g
f
g
h
i
e
c
j
k
l
f
-10.0  
d
b
g
h
i
j
V
[V] =  
GS  
a
4
0
b
c
d
e
f
g
h
i
j
-0.02  
0.00  
-3.0 -3.5 -4.0 -4.5 -5.0 -6.0 -7.0 -8.0 -9.0 -10.0  
a
0.0  
-1.0  
-2.0  
-3.0  
-4.0  
V
-5.5  
0.00  
-0.04  
-0.08  
-0.12  
-0.16  
A
-0.24  
VDS  
ID  
Typ. transfer characteristics I = f(V  
)
Typ. forward transconductance g = f (I )  
D
GS  
fs  
D
parameter: t = 80 µs  
parameter: t = 80 µs,  
p
p
V 2 x I x R  
DS D DS(on)max  
V
DS  
2 x I x R  
D
DS(on)max  
-0.9  
A
0.16  
S
ID  
gfs  
-0.7  
-0.6  
-0.5  
-0.4  
-0.3  
-0.2  
0.12  
0.10  
0.08  
0.06  
0.04  
0.02  
0.00  
-0.1  
0.0  
0
-1 -2 -3 -4 -5 -6 -7 -8  
V
VGS  
-10  
0.0 -0.1 -0.2 -0.3 -0.4 -0.5 -0.6  
A
ID  
-0.8  
Semiconductor Group  
6
18/02/1997  
BSS 284  
Drain-source on-resistance  
Gate threshold voltage  
ƒ
ƒ
= (T )  
GS (th) j  
R
= (T )  
V
DS (on)  
j
parameter: I = -0.13 A, V = -10 V  
parameter: V = V , I = -1 mA  
GS DS D  
D
GS  
26  
-2.6  
V
22  
20  
18  
16  
14  
12  
10  
8
-2.2  
-2.0  
-1.8  
-1.6  
-1.4  
-1.2  
-1.0  
-0.8  
-0.6  
-0.4  
RDS (on)  
VGS(th)  
98%  
typ  
98%  
typ  
2%  
6
4
2
0
-0.2  
0.0  
-60  
-20  
20  
60  
100  
°C  
Tj  
160  
-60  
-20  
20  
60  
100  
°C  
Tj  
160  
Typ. capacitances  
Forward characteristics of reverse diode  
ƒ
C = f (V )  
I = (V  
)
DS  
F
SD  
parameter: T , t = 80 µs  
parameter:V =0V, f = 1 MHz  
j
p
GS  
10 3  
-10 0  
pF  
A
C
IF  
10 2  
10 1  
10 0  
-10 -1  
-10 -2  
-10 -3  
Ciss  
Coss  
Tj = 25 °C typ  
Crss  
Tj = 150 °C typ  
Tj = 25 °C (98%)  
Tj = 150 °C (98%)  
0
-5  
-10 -15 -20 -25 -30  
V
VDS  
-40  
0.0  
-0.4 -0.8 -1.2 -1.6 -2.0 -2.4  
V
-3.0  
VSD  
7
18/02/1997  
Semiconductor Group  

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