SLE4442 [INFINEON]

intelligent 256-byte EEPROM; 智能256字节的EEPROM
SLE4442
型号: SLE4442
厂家: Infineon    Infineon
描述:

intelligent 256-byte EEPROM
智能256字节的EEPROM

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总35页 (文件大小:994K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ICs for Chip Cards  
Intelligent 256-Byte EEPROM  
SLE 4432/SLE 4442  
Data Sheet 07.95  
Edition 07.95  
This edition was realized using the software  
system FrameMaker .  
Published by Siemens AG,  
Bereich Halbleiter, Marketing-  
Kommunikation, Balanstraße 73,  
81541 München  
©
Siemens AG 1995.  
All Rights Reserved.  
Attention please!  
As far as patents or other rights of third par-  
ties are concerned, liability is only assumed  
for components, not for applications, pro-  
cesses and circuits implemented within com-  
ponents or assemblies.  
The information describes the type of compo-  
nent and shall not be considered as assured  
characteristics.  
Terms of delivery and rights to change design  
reserved.  
For questions on technology, delivery and  
prices please contact the Semiconductor  
Group Offices in Germany or the Siemens  
Companies and Representatives worldwide  
(see address list).  
Due to technical requirements components  
may contain dangerous substances. For in-  
formation on the types in question please  
contact your nearest Siemens Office, Semi-  
conductor Group.  
Siemens AG is an approved CECC manufac-  
turer.  
Packing  
Please use the recycling operators known to  
you. We can also help you – get in touch with  
your nearest sales office. By agreement we  
will take packing material back, if it is sorted.  
You must bear the costs of transport.  
For packing material that is returned to us un-  
sorted or which we are not obliged to accept,  
we shall have to invoice you for any costs in-  
curred.  
Components used in life-support devices  
or systems must be expressly authorized  
for such purpose!  
1
Critical components of the Semiconductor  
Group of Siemens AG, may only be used in  
2
life-support devices or systems with the ex-  
press written approval of the Semiconductor  
Group of Siemens AG.  
1
2
A critical component is a component used  
in a life-support device or system whose  
failure can reasonably be expected to  
cause the failure of that life-support device  
or system, or to affect its safety or effec-  
tiveness of that device or system.  
Life support devices or systems are in-  
tended (a) to be implanted in the human  
body, or (b) to support and/or maintain  
and sustain human life. If they fail, it is rea-  
sonable to assume that the health of the  
user may be endangered.  
ICs for Chip Cards  
Intelligent 256-Byte EEPROM  
SLE 4432/SLE 4442  
Data Sheet 07.95  
SLE 4432/SLE4442  
Revision History:  
Original Version 07.95  
Previous Releases: 01.94  
Page  
Subjects (changes since last revision)  
Editorial changes  
®
This edition was realized using the software system FrameMaker  
Important: For further information please contact:  
Siemens Semiconductor Group in Munich, Germany,  
Key Account Service Chip Card ICs and Identsystem ICs,  
Tel.: + 49 89 4144-4362, Fax + 49 89 4144-2360  
The supply of this component does not include a licence for its use in  
smart card applications. This licence is due to: INNOVATRON Patents  
137 Boulevard de Sébastopol, 75002 Paris, France, Fax + 33 1 40 13 39 09  
General Information  
Contents  
1
Page  
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
2
2.1  
2.2  
2.2.1  
2.2.2  
2.3  
2.3.1  
2.3.2  
2.3.3  
2.3.4  
2.3.5  
2.3.6  
2.3.7  
2.4  
2.5  
2.6  
2.7  
2.8  
Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Memory Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Transmission Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Reset and Answer-to-Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Operational Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Read Main Memory (SLE 4432 and SLE 4442) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Read Protection Memory (SLE 4432 and SLE 4442) . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
Update Main Memory (SLE 4432 and SLE 4442) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Write Protection Memory (SLE 4432 and SLE 4442) . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Read Security Memory (SLE 4442 only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Update Security Memory (SLE 4442 only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
Compare Verification Data (SLE 4442 only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
PSC Verification (SLE 4442 only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21  
Reset Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
Failures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
Coding of the Chip . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
3
3.1  
3.2  
3.2.1  
3.2.2  
3.2.3  
3.2.4  
3.3  
Operational Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Operation Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28  
Timing Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29  
4
Package and Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32  
Semiconductor Group  
3
Published by Semiconductor Group  
Siemens Aktiengesellschaft  
Ordering No. B116-H6695-G1-X-7600  
Printed in Germany  
DA 07952.  
Intelligent 256-Byte EEPROM with Write Protect Function  
SLE 4432  
SLE 4442  
Intelligent 256-Byte EEPROM with Write Protect Function  
and Programmable Security Code (PSC)  
Features  
256 × 8-bit EEPROM organization  
Byte-wise addressing  
Irreversible byte-wise write protection of lowest  
32 addresses (Byte 0 ... 31)  
32 × 1-bit organization of protection memory  
Two-wire link protocol  
End of processing indicated at data output  
Answer-to-Reset acc. to ISO standard 7816-3  
Programming time 2.5 ms per byte for both erasing  
and writing  
M2.2  
Minimum of 104 write/erase cycles1)  
Data retention for minimum of ten years1)  
Contact configuration and serial interface in accordance  
with ISO standard 7816 (synchronous transmission)  
Additional Feature of SLE 4442  
Data can only be changed after entry of the correct 3-byte  
programmable security code (security memory)  
Type  
Ordering Code  
on request  
on request  
on request  
on request  
Package  
SLE 4432 M2.2  
SLE 4432 C  
SLE 4442 M2.2  
SLE 4442 C  
Wire-Bonded Module M2.2  
Chip  
Wire-Bonded Module M2.2  
Chip  
1) Values are temperature dependent, for further information please refer to your Siemens sales  
office.  
Semiconductor Group  
5
07.95  
SLE 4432  
SLE 4442  
1
Pin Configuration  
(top view)  
M2.2 (Card Contacts)  
Pin Definitions and Functions  
Card Contact  
Symbol  
VCC  
RST  
CLK  
N.C.  
GND  
N.C.  
I/O  
Function  
C1  
C2  
C3  
C4  
C5  
C6  
C7  
C8  
Supply voltage  
Reset  
Clock input  
Not connected  
Ground  
Not connected  
Bidirectional data line (open drain)  
Not connected  
N.C.  
SLE 4432/SLE 4442 comes as a M2.2 wire-bonded module for embedding in plastic cards or as  
a die for customer packaging.  
Semiconductor Group  
6
SLE 4432  
SLE 4442  
2
Functional Description  
Block Diagram  
Semiconductor Group  
7
SLE 4432  
SLE 4442  
2.1 Memory Overview  
Figure 1  
Memory Overwiew  
SLE 4432  
The SLE 4432 consists of 256 x 8 bit EEPROM main memory and a 32-bit protection memory with  
PROM functionality. The main memory is erased and written byte by byte. When erased, all 8 bits  
of a data byte are set to logical one. When written, the information in the individual EEPROM cells  
is, according to the input data, altered bit by bit to logical zeros (logical AND between the old and the  
new data in the EEPROM). Normally a data change consists of an erase and write procedure. It  
depends on the contents of the data byte in the main memory and the new data byte whether the  
EEPROM is really erased and/or written. If none of the 8 bits in the addressed byte requires a zero-  
to-one transition the erase access will be suppressed. Vice versa the write access will be  
suppressed if no one-to-zero transition is necessary. The write and the erase operation takes at  
least 2.5 ms each.  
Each of the first 32 bytes can be irreversibly protected against data change by writing the  
corresponding bit in the protection memory. Each data byte in this address range is assigned to one  
bit of the protection memory and has the same address as the data byte in the main memory which  
it is assigned to. Once written the protection bit cannot be erased (PROM).  
Semiconductor Group  
8
SLE 4432  
SLE 4442  
SLE 4442  
Additionally to the above functions the SLE 4442 provides a security code logic which controls the  
write/erase access to the memory. For this purpose the SLE 4442 contains a 4-byte security  
memory with an Error Counter EC (bit 0 to bit 2) and 3 bytes reference data. These 3 bytes as a  
whole are called Programmable Security Code (PSC). After power on the whole memory, except for  
the reference data, can only be read. Only after a successful comparison of verification data with the  
internal reference data the memory has the identical access functionality of the SLE 4432 until the  
power is switched off. After three successive unsuccessful comparisons the Error Counter blocks  
any subsequent attempt, and hence any possibility to write and erase.  
2.2 Transmission Protocol  
The transmission protocol is a two wire link protocol between the interface device IFD and the  
integrated circuit IC. It is identical to the protocol type “S = A”. All data changes on I/O are initiated  
by the falling edge on CLK.  
The transmission protocol consists of the 4 modes:  
– Reset and Answer-to-Reset  
– Command Mode  
– Outgoing Data Mode  
– Processing Mode  
Operational modes  
Note: The I/O pin is open drain and therefore requires an external pull up resistor to achieve a high  
level.  
Semiconductor Group  
9
SLE 4432  
SLE 4442  
2.2.1 Reset and Answer-to-Reset  
Answer-to-Reset takes place according to ISO standard 7816-3 (ATR). The reset can be given at  
any time during operation. In the beginning, the address counter is set to zero together with a clock  
pulse and the first data bit (LSB) is output to I/O when RST is set from level H to level L. Under a  
continuous input of additional 31 clock pulses the contents of the first 4 EEPROM addresses is read  
out. The 33rd clock pulse switches I/O to high impedance Z and finishes the ATR procedure.  
Answer-to-Reset  
(Hex)  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
DO7 … DO0  
DO15 … DO8  
DO23 … DO16  
DO31 … DO24  
Figure 2  
Reset and Answer-to-Reset  
2.2.2 Operational Modes  
Command Mode  
After the Answer-to-Reset the chip waits for a command. Every command begins with a start  
condition, includes a 3 bytes long command entry followed by an additional clock pulse and ends  
with a stop condition.  
– Start condition: Falling edge on I/O during CLK in level H  
– Stop condition: Rising edge on I/O during CLK in level H  
After the reception of a command there are two possible modes:  
– Outgoing data mode for reading  
– Processing mode for writing and erasing  
Semiconductor Group  
10  
SLE 4432  
SLE 4442  
Outgoing Data Mode  
In this mode the IC sends data to the IFD. The first bit becomes valid on I/O after the first falling edge  
on CLK. After the last data bit an additional clock pulse is necessary in order to set I/O to high  
impedance Z and to prepare the IC for a new command entry. During this mode any start and stop  
condition is discarded.  
Processing Mode  
In this mode the IC processes internally. The IC has to be clocked continuously until I/O, which was  
switched to level L after the first falling edge of CLK, is set to high impedance level Z. Any start and  
stop condition is discarded during this mode.  
Note: The RST line is low during the modes mentioned above. If RST is set to high during the CLK  
low level any operation is aborted and I/O is switched to high impedance Z (Break).  
Figure 3  
Operational Modes  
Semiconductor Group  
11  
SLE 4432  
SLE 4442  
2.3 Commands  
Command Format  
Each command consists of three bytes:  
MSB  
Control  
LSB MSB  
Address  
LSB MSB  
Data  
LSB  
&ꢀ &ꢁ &ꢂ &ꢃ &ꢄ &ꢅ &ꢆ &ꢇ %ꢀ %ꢁ %ꢂ %ꢃ %ꢄ %ꢅ %ꢆ %ꢇ (ꢀ (ꢁ (ꢂ (ꢃ (ꢄ (ꢅ (ꢆ (ꢇ  
Beginning with the control byte LSB is transmitted first.  
Figure 4  
Command Mode  
The SLE 4432 provides 4 commands which are listed in table 1. Additionally to these commands  
the SLE 4442 provides 3 commands which can be found in table 2.  
Semiconductor Group  
12  
SLE 4432  
SLE 4442  
Table 1  
Byte 1  
Byte 2  
Byte 3  
Operation  
Mode  
Control  
Address Data  
B7 B6 B5 B4 B3 B2 B1 B0 A7-A0  
D7-D0  
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
0
1
0
1
0
0
1
1
0
0
0
0
0
0
0
0
address no effect READ MAIN  
MEMORY  
outgoing  
data  
address input data UPDATE MAIN  
MEMORY  
processing  
no effect no effect READ PROTECTION outgoing  
MEMORY  
data  
address input data WRITE  
processing  
PROTECTION  
MEMORY  
Table 2  
SLE 4442 only  
0
0
0
0
0
0
1
1
1
1
1
1
0
1
0
0
0
0
0
0
1
1
1
1
no effect no effect READ SECURITY  
MEMORY  
outgoing  
data  
address input data UPDATE SECURITY processing  
MEMORY  
address input data COMPARE  
VERIFICATION DATA  
processing  
Semiconductor Group  
13  
SLE 4432  
SLE 4442  
2.3.1 Read Main Memory (SLE 4432 and SLE 4442)  
The command reads out the contents of the main memory (with LSB first) starting at the given byte  
address (N = 0…255) up to the end of the memory. After the command entry the IFD has to supply  
sufficient clock pulses. The number of clocks is m = (256 – N) × 8 + 1. The read access to the main  
memory is always possible.  
Address Main Memory  
(decimal)  
Protection Memory  
Security Memory  
(only SLE 4442)  
255  
:
Data Byte 255 (D7 … D0) –  
:
32  
31  
:
Data Byte 32 (D7 … D0)  
Data Byte 31 (D7 … D0) Protection Bit 31 (D31) –  
:
:
3
Data Byte 3 (D7 … D0)  
Data Byte 2 (D7 … D0)  
Data Byte 1 (D7 … D0)  
Data Byte 0 (D7 … D0)  
Protection Bit 3 (D3)  
Protection Bit 2 (D2)  
Protection Bit 1 (D1)  
Protection Bit 0 (D0)  
Reference Data Byte 3 (D7 … D0)  
Reference Data Byte 2 (D7 … D0)  
Reference Data Byte 1 (D7 … D0)  
Error Counter  
2
1
0
Command: READ MAIN MEMORY  
Control  
Address  
Data  
B7  
0
B6  
0
B5  
1
B4  
1
B3  
0
B2  
0
B1  
0
B0 A7…A0  
D7…D0  
No effect  
No effect  
Binary  
0
Address  
Hexadecimal  
30H  
00H…FFH  
Figure 5  
Read Main Memory  
Semiconductor Group  
14  
SLE 4432  
SLE 4442  
2.3.2 Read Protection Memory (SLE 4432 and SLE 4442)  
The command transfers the protection bits under a continuous input of 32 clock pulses to the output.  
I/O is switched to high impedance Z by an additional pulse. The protection memory can always be  
read, and indicates the data bytes of the main memory protected against changing.  
Address Main Memory  
(decimal)  
Protection Memory  
Security Memory  
(only SLE 4442)  
255  
:
Data Byte 255 (D7 … D0) –  
:
32  
31  
:
Data Byte 32 (D7 … D0)  
Data Byte 31 (D7 … D0) Protection Bit 31 (D31) –  
:
:
3
Data Byte 3 (D7 … D0)  
Data Byte 2 (D7 … D0)  
Data Byte 1 (D7 … D0)  
Data Byte 0 (D7 … D0)  
Protection Bit 3 (D3)  
Protection Bit 2 (D2)  
Protection Bit 1 (D1)  
Protection Bit 0 (D0)  
Reference Data Byte 3 (D7 … D0)  
Reference Data Byte 2 (D7 … D0)  
Reference Data Byte 1 (D7 … D0)  
Error Counter  
2
1
0
Command: READ PROTECTION MEMORY  
Control  
Address  
Data  
B7  
0
B6  
0
B5  
1
B4  
1
B3  
0
B2  
1
B1  
0
B0 A7…A0  
D7…D0  
No effect  
No effect  
Binary  
0
No effect  
No effect  
Hexadecimal  
34H  
Figure 6  
Read Protection Memory  
Semiconductor Group  
15  
SLE 4432  
SLE 4442  
2.3.3 Update Main Memory (SLE 4432 and SLE 4442)  
The command programs the addressed EEPROM byte with the data byte transmitted. Depending  
on the old and new data, one of the following sequences will take place during the processing mode:  
– erase and write  
(5 ms)  
corresponding to m = 255 clock pulses  
– write without erase (2.5 ms) corresponding to m = 124 clock pulses  
– erase without write (2.5 ms) corresponding to m = 124 clock pulses  
(All values at 50 kHz clock rate.)  
Address Main Memory  
(decimal)  
Protection Memory  
Security Memory  
(only SLE 4442)  
255  
:
Data Byte 255 (D7 … D0) –  
:
32  
31  
:
Data Byte 32 (D7 … D0)  
Data Byte 31 (D7 … D0) Protection Bit 31 (D31) –  
:
:
3
Data Byte 3 (D7 … D0)  
Data Byte 2 (D7 … D0)  
Data Byte 1 (D7 … D0)  
Data Byte 0 (D7 … D0)  
Protection Bit 3 (D3)  
Protection Bit 2 (D2)  
Protection Bit 1 (D1)  
Protection Bit 0 (D0)  
Reference Data Byte 3 (D7 … D0)  
Reference Data Byte 2 (D7 … D0)  
Reference Data Byte 1 (D7 … D0)  
Error Counter  
2
1
0
Command: UPDATE MAIN MEMORY  
Control  
Address  
Data  
B7  
0
B6  
0
B5  
1
B4  
1
B3  
1
B2  
0
B1  
0
B0 A7…A0  
D7…D0  
Input data  
Input data  
Binary  
0
Address  
Hexadecimal  
38H  
00H…FFH  
Semiconductor Group  
16  
SLE 4432  
SLE 4442  
Figure 7  
Erase and Write Main Memory  
Figure 8  
Erase or Write Main Memory  
If the addressed byte is protected against changes (indicated by the associated written protection  
bit) the I/O is set to high impedance after the clock number 2 of the processing.  
Semiconductor Group  
17  
SLE 4432  
SLE 4442  
2.3.4 Write Protection Memory (SLE 4432 and SLE 4442)  
The execution of this command contains a comparison of the entered data byte with the assigned  
byte in the EEPROM. In case of identity the protection bit is written thus making the data information  
unchangeable. If the data comparison results in data differences writing of the protection bit will be  
suppressed. Execution times and required clock pulses see UPDATE MAIN MEMORY.  
Address Main Memory  
(decimal)  
Protection Memory  
Security Memory  
(only SLE 4442)  
255  
:
Data Byte 255 (D7 … D0) –  
:
32  
31  
:
Data Byte 32 (D7 … D0)  
Data Byte 31 (D7 … D0) Protection Bit 31 (D31) –  
:
:
3
Data Byte 3 (D7 … D0)  
Data Byte 2 (D7 … D0)  
Data Byte 1 (D7 … D0)  
Data Byte 0 (D7 … D0)  
Protection Bit 3 (D3)  
Protection Bit 2 (D2)  
Protection Bit 1 (D1)  
Protection Bit 0 (D0)  
Reference Data Byte 3 (D7 … D0)  
Reference Data Byte 2 (D7 … D0)  
Reference Data Byte 1 (D7 … D0)  
Error Counter  
2
1
0
Command: WRITE PROTECTION MEMORY  
Control  
Address  
Data  
B7  
0
B6  
0
B5  
1
B4  
1
B3  
1
B2  
1
B1  
0
B0 A7…A0  
D7…D0  
Input data  
Input data  
Binary  
0
Address  
Hexadecimal  
3CH  
00H…1FH  
Semiconductor Group  
18  
SLE 4432  
SLE 4442  
2.3.5 Read Security Memory (SLE 4442 only)  
Similar to the read command for the protection memory this command reads out the 4 bytes of the  
security memory. The number of clock pulses during the outgoing data mode is 32. I/O is switched  
to high impedance Z by an additional pulse. Without a preceeding successful verification of the PSC  
the output of the reference bytes is suppressed, that means I/O outputs state L for the reference  
data bytes.  
Address Main Memory  
(decimal)  
Protection Memory  
Security Memory  
(only SLE 4442)  
255  
:
Data Byte 255 (D7 … D0) –  
:
32  
31  
:
Data Byte 32 (D7 … D0)  
Data Byte 31 (D7 … D0) Protection Bit 31 (D31) –  
:
:
3
Data Byte 3 (D7 … D0)  
Data Byte 2 (D7 … D0)  
Data Byte 1 (D7 … D0)  
Data Byte 0 (D7 … D0)  
Protection Bit 3 (D3)  
Protection Bit 2 (D2)  
Protection Bit 1 (D1)  
Protection Bit 0 (D0)  
Reference Data Byte 3(D7 … D0)  
Reference Data Byte 2(D7 … D0)  
Reference Data Byte 1(D7 … D0)  
2
1
0
Error Counter  
(0,0,0,0,0,D2,D1,D0)  
Command: READ SECURITY MEMORY  
Control  
B4 B3  
Address  
Data  
B7  
0
B6  
0
B5  
1
B2  
0
B1  
0
B0 A7…A0  
D7…D0  
No effect  
No effect  
Binary  
1
0
1
No effect  
No effect  
Hexadecimal  
31H  
Figure 9  
Read Security Memory  
Semiconductor Group  
19  
SLE 4432  
SLE 4442  
2.3.6 Update Security Memory (SLE 4442 only)  
Regarding the reference data bytes this command will only be executed if a PSC has been  
successfully verified before. Otherwise only each bit of the error counter (Address 0) can be written  
from “1” to “0”. The execution times and the required clock pulses are the same as described under  
UPDATE MAIN MEMORY.  
Command: UPDATE SECURITY MEMORY  
Control  
B4 B3  
Address  
Data  
B7  
0
B6  
0
B5  
1
B2  
0
B1  
0
B0 A7…A0  
D7…D0  
Input data  
Input data  
Binary  
1
1
1
Address  
Hexadecimal  
39H  
00H…03H  
2.3.7 Compare Verification Data (SLE 4442 only)  
This command can only be executed in combination with an update procedure of the error counter  
(see PSC verification). The command compares one byte of the entered verification data byte with  
the corresponding reference data byte. For this procedure clock pulses are necessary during the  
processing mode.  
Command: COMPARE VERIFICATION DATA  
Control  
B4 B3  
Address  
Data  
B7  
0
B6  
0
B5  
1
B2  
0
B1  
1
B0 A7…A0  
D7…D0  
Input data  
Input data  
Binary  
1
0
1
Address  
Hexadecimal  
33H  
00H…03H  
Figure 10  
Compare Verification Data  
Semiconductor Group  
20  
SLE 4432  
SLE 4442  
2.4 PSC Verification (SLE 4442 only)  
The SLE 4442 requires a correct verification of the Programmable Security Code PSC stored in the  
Security Memory for altering data if desired.  
The following procedure has to be carried out exactly as described. Any variation leads to a failure,  
so that a write/erase access will not be achieved. As long as the procedure has not been  
successfully concluded the error counter bits can only be changed from “1” to “0” but not erased.  
At first an error counter bit has to be written to “0” by an UPDATE command (see figure 11) followed  
by three COMPARE VERIFICATION DATA commands beginning with byte 1 of the reference data.  
A successful conclusion of the whole procedure can be recognized by being able to erase the error  
counter which is not automatically erased. Now write/erase access to all memory areas is possible  
as long as the operating voltage is applied. In case of error the whole procedure can be repeated as  
long as erased counter bits are available. Having been enabled, the reference data are allowed to  
be altered like any other information in the EEPROM.  
The following table gives an overview of the necessary commands for the PSC verification. The  
sequence of the shaded commands is mandatory.  
Command  
Control  
B7…B0  
31H  
Address  
A7…A0  
No effect  
00H  
Data  
Remark  
D7…D0  
No effect  
Input data  
Read security Memory  
Check Error Counter  
Update Security Memory  
39H  
Write free bit in Error  
Counter input data:  
0000 0ddd binary  
Compare Verification Data  
Compare Verification Data  
Compare Verification Data  
Update Security Memory  
Read Security Memory  
33H  
33H  
33H  
39H  
31H  
01H  
Input data  
Input data  
Input data  
FFH  
Reference Data Byte 1  
Reference Data Byte 2  
Reference Data Byte 3  
Erase Error Counter  
Check Error Counter  
02H  
03H  
00H  
No effect  
No effect  
As shipped, the PSC is programmed with a code according to individual agreement with the  
customer. Thus, knowledge of this code is indispensable to alter data.  
Semiconductor Group  
21  
SLE 4432  
SLE 4442  
Figure 11  
Verification Procedure  
Semiconductor Group  
22  
SLE 4432  
SLE 4442  
2.5 Reset Modes  
Reset and Answer-to-Reset (compare 2.2.1)  
Power on Reset  
After connecting the operating voltage to VCC, I/O is high impedance Z. By all means, a read  
access to any address or an Answer-to-Reset must be carried out before data can be altered.  
2.6 Break  
If RST is set to high during CLK in state L any operation is aborted and I/O is switched to high  
impedance Z. Minimum duration of tRES = 5 µs is necessary to trigger a defined valid reset. After  
Break the chip is ready for further operations.  
2.7 Failures  
Behavior in case of failures:  
In case of one of the following failures, the chip sets the I/O to high impedance Z after 8 clock pulses  
at the latest.  
Possible failures:  
– Comparison unsuccessful  
– Wrong command  
– Wrong number of command clock pulses  
– Write/erase access to already protected bytes  
– Rewriting and erasing of a bit in the protection memory  
2.8 Coding of the Chip  
Due to security purposes every chip is irreversibly coded by a scheme. By this way fraud and  
misuse is excluded. The relevant data are programmed in the memory area from address 0 to 31.  
Afterwards the associated protection bits are programmed. As an example, figures 12 and 13 show  
ATR and Directory Data of Structure 1. When delivered, ATR header, ICM and ICT are  
programmed. Siemens programs also the AID. The AID (Application IDentifier) consists of 5 byte  
RID (Registered application provider IDentifier) administered by a national registration authority and  
of up to 11 byte PIX (Proprietary application Identifier eXtension). There are two possibilities: the  
customers AID or Siemens AID (only for sample quantities). Depending on the agreement between  
the customer and Siemens ICCF can be also programmed before delivery.  
Semiconductor Group  
23  
SLE 4432  
SLE 4442  
Figure 12  
Synchronous Transmission  
ATR and Directory Data of Structure 1  
Semiconductor Group  
24  
SLE 4432  
SLE 4442  
Figure 13  
Answer-to-Reset for Synchronous Transmission  
Coding of Structure 1  
Semiconductor Group  
25  
SLE 4432  
SLE 4442  
3
Operational Information  
3.1 Memory Map  
Address Main Memory  
(decimal)  
Protection Memory  
Security Memory  
(only SLE 4442)  
255  
:
Data Byte 255 (D7 … D0)  
:
32  
31  
:
Data Byte 32 (D7 … D0)  
Data Byte 31 (D7 … D0) Protection Bit 31 (D31)  
:
:
3
Data Byte 3 (D7 … D0)  
Data Byte 2 (D7 … D0)  
Data Byte 1 (D7 … D0)  
Data Byte 0 (D7 … D0)  
Protection Bit 3 (D3)  
Protection Bit 2 (D2)  
Protection Bit 1 (D1)  
Protection Bit 0 (D0)  
Reference Data Byte 3 (D7 … D0)  
Reference Data Byte 2 (D7 … D0)  
Reference Data Byte 1 (D7 … D0)  
Error Counter (0,0,0,0,0,D2,D1,D0)  
2
1
0
The Data bytes 0 to 31 can be protected against further changes by programming the associated  
protection bit 0 to 31. The SLE 4442 allows data changing only after correct verification of the  
Reference Data bytes. Reading of the Data bytes and of the associated protection bits is always  
possible.  
3.2 Electrical Characteristics  
3.2.1 Absolute Maximum Ratings  
Parameter  
Symbol  
Limit Values  
Unit  
min.  
max.  
6.0  
Supply voltage  
VCC  
VI  
– 0.3  
– 0.3  
– 40  
V
Input voltage (any pin)  
Storage temperature  
Power dissipation  
6.0  
V
Tstg  
Ptot  
125  
70  
°C  
mW  
Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent  
damage to the device. This is a stress rating only and functional operation of the device at  
these or any other conditions above those indicated in the operational sections of this data  
sheet is not implied. Exposure to absolute maximum rating conditions for extended periods  
may affect device reliability, including EEPROM data retention and write/erase endurance.  
In the operating range the functions given in the circuit description are fulfilled.  
Semiconductor Group  
26  
SLE 4432  
SLE 4442  
3.2.2 Operation Range  
Parameter  
Symbol  
Limit Values  
Unit  
Test Condition  
min.  
typ.  
5.0  
3
max.  
Supply voltage  
VCC  
ICC  
TA  
4.75  
5.25  
10  
V
V
Supply current  
mA  
°C  
CC = 5 V  
Ambient temperature  
0
70  
3.2.3 DC Characteristics  
Parameter  
Symbol  
Limit Values  
Unit  
Test Condition  
min.  
typ.  
max.  
High level input voltage VIH  
3.5  
VCC  
V
(I/O, CLK, RST)  
Low level input voltage VIL  
0
0.8  
V
(I/O, CLK, RST)  
High level input current IIH  
(I/O, CLK, RST)  
50  
µA  
mA  
µA  
pF  
VIH = 5 V  
Low level output  
current (I/O)  
IOL  
IOH  
CI  
1
VOL = 0.4 V, open drain  
High level output  
current (I/O)  
50  
10  
VOH = 5 V, open drain  
Input capacitance  
Semiconductor Group  
27  
SLE 4432  
SLE 4442  
3.2.4 AC Characteristics  
The AC characteristics refer to the timing diagrams in the following. VIHmin and VILmax are reference  
levels for measuring timing of signals.  
Parameter  
Symbol  
Limit Values  
Unit  
Test Condition  
min.  
4
typ.  
max.  
RST High to CLK Setup time  
CLK Low to RST Hold time  
t10  
t11  
µs  
µs  
µs  
µs  
µs  
kHz  
µs  
µs  
µs  
µs  
µs  
µs  
µs  
4
RST High time (address reset) t12  
20  
50  
RST Low to I/O Valid time  
RST Low to CLK Setup time  
CLK Frequency  
t13  
t14  
fCLK  
tR  
2.5  
4
7
50  
1
CLK Rise time  
CLK Fall time  
tF  
1
CLK High time  
t15  
t16  
t17  
t18  
t19  
9
9
CLK Low time  
CLK Low to I/O Valid time  
Reset time for Break  
2.5  
5
RST High to I/O Clear time  
(Break)  
2.5  
I/O High time (Start Condition) t1  
10  
4
µs  
µs  
µs  
CLK High to I/O Hold time  
t2  
t3  
I/O Low to CLK Hold time  
(Start Condition)  
4
I/O Setup to CLK High time  
CLK Low to I/O Hold time  
t4  
t5  
t6  
1
1
4
µs  
µs  
µs  
CLK High to I/O Clear time  
(Stop Condition)  
CLK Low to I/O Valid time  
CLK Low to I/O Valid time  
CLK Low to I/O Clear time  
Erase time  
t7  
2.5  
2.5  
2.5  
µs  
µs  
µs  
ms  
ms  
µs  
t8  
t9  
tER  
tWR  
tPOR  
2.5  
2.5  
f
f
CLK = 50 kHz  
CLK = 50 kHz  
Write time  
Power on reset time  
100  
Note: The listed characteristics are ensured over the operating range of the integrated circuit.  
Typical characteristics specify mean values expected over the production spread. If not  
otherwise specified, typical characteristics apply at TA = 25 °C and the given supply voltage.  
Semiconductor Group  
28  
SLE 4432  
SLE 4442  
3.3 Timing Diagrams  
Figure 14  
Reset and Answer-to-Reset  
Figure 15  
Command Mode  
Semiconductor Group  
29  
SLE 4432  
SLE 4442  
Figure 16  
Outgoing Data Mode  
Figure 17  
Processing Mode  
Semiconductor Group  
30  
SLE 4432  
SLE 4442  
Figure 18  
Break  
Semiconductor Group  
31  
SLE 4432  
SLE 4442  
4
Package and Dimensions  
Chip and Package Outlines  
Wire-Bonded Module M2.2  
Semiconductor Group  
32  
SLE 4432  
SLE 4442  
Wafer Size: 5"  
Scribe Line: 80 µm  
Pad Size: 110 × 110 µm2  
Stepping Size: 1820 × 1850 µm2  
Chip Dimensions  
Semiconductor Group  
33  

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