SPP18P06P H [INFINEON]

Infineon’s highly innovative OptiMOS™ families include p-channel power MOSFETs. These products consistently meet the highest quality and performance demands in key specifications for power system design such as on-state resistance and figure of merit characteristics.;
SPP18P06P H
型号: SPP18P06P H
厂家: Infineon    Infineon
描述:

Infineon’s highly innovative OptiMOS™ families include p-channel power MOSFETs. These products consistently meet the highest quality and performance demands in key specifications for power system design such as on-state resistance and figure of merit characteristics.

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SPP18P06P H  
SIPMOS® Small-Signal-Transistor  
Product Summary  
Features  
VDS  
-60  
0.13  
-18.7  
V
A
• P-Channel  
RDS(on),max  
ID  
• Enhancement mode  
• Avalanche rated  
• dv /dt rated  
PG-TO220-3-1  
• 175°C operating temperature  
• Pb-free lead finishing; RoHS compliant  
• Halogen-free according to IEC61249-2-21  
• Qualified according to AEC Q101  
Type  
Package  
Tape and reel information  
50pcs/tube  
Marking  
Lead free  
PG-TO220-3  
SPP18P06PH  
Yes  
18P06P  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
steady state  
-18.7  
I D  
T A=25 °C  
T A=100 °C  
T A=25 °C  
Continuous drain current  
A
-13.2  
I D,pulse  
-74.8  
Pulsed drain current  
E AS  
151  
8
I D=18.7 A, R GS=25  
Avalanche energy, single pulse  
mJ  
Avalanche energy, periodic limited by  
Tjmax  
E AR  
I D=18.7 A, V DS=48 V,  
di /dt =-200 A/µs,  
-6  
Reverse diode dv /dt  
dv /dt  
kV/µs  
V
T
j,max=175 °C  
V GS  
±20  
Gate source voltage  
Power dissipation  
T A=25 °C1)  
P tot  
81.1  
W
T j, T stg  
"-55 ... +175"  
Class 1C( >1000V <2000V)  
260 °C  
Operating and storage temperature  
ESD class  
°C  
Soldering temperature  
55/150/56  
IEC climatic category; DIN IEC 68-1  
Rev1.92  
page 1  
2014-11-21  
SPP18P06P H  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
junction - case  
R thJC  
-
-
-
-
-
-
-
-
1.85 K/W  
62  
Thermal resistance,  
junction - ambient, leaded  
R thJA  
R thJA  
SMD version, device on PCB:  
minimal footprint  
62  
40  
K/W  
6 cm2 cooling area1)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS  
V GS(th)  
V
V
GS=0 V, I D=-250 µA  
DS=V GS, I D=-  
Drain-source breakdown voltage  
Gate threshold voltage  
-60  
-
-
V
-2.1  
2.7  
-4  
1000 µA  
V
DS=-60 V, V GS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-0.1  
-1  
µA  
T j=25 °C  
V
DS=-60 V, V GS=0 V,  
-
-
-
-10  
-10  
102  
-100  
T j=150 °C  
I GSS  
V
V
GS=-20 V, V DS=0 V  
Gate-source leakage current  
-100 nA  
R DS(on)  
GS=-10 V, I D=-13.2 A  
Drain-source on-state resistance  
130  
-
m  
|V DS|>2|I D|R DS(on)max  
I D=-13.2 A  
,
g fs  
Transconductance  
5
10  
S
2
1) Device on 40mm*40mm*1.5mm epoxy PCB FR4 with 6 cm (one layer, 70 µm thick) copper area for drain connection.  
PCB is vertical without blown air.  
Rev1.92  
page 2  
2014-11-21  
SPP18P06P H  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
690  
230  
95  
860 pF  
290  
V
GS=0 V, V DS=-25 V,  
C oss  
C rss  
t d(on)  
t r  
f =1 MHz  
120  
12.0  
5.8  
25  
18.0 ns  
8.7  
V
DD=-30 V, V GS=-  
10 V, I D=-13.2 A,  
R G=2.7 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
37  
11  
16.5  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
-4.1  
-11  
-5.5 nC  
-17  
Q gd  
V
DD=-48 V, I D=-  
18.6 A, V GS=0 to -10 V  
Q g  
-21  
-28  
V plateau  
Gate plateau voltage  
-5.94  
-
V
A
Reverse Diode  
I S  
Diode continuous forward current  
Diode pulse current  
-
-
-
-
18.60  
-74.8  
T A=25 °C  
I S,pulse  
V
GS=0 V, I F=-18.6 A,  
V SD  
t rr  
Diode forward voltage  
Reverse recovery time  
Reverse recovery charge  
-
-
-
-0.99  
70  
-1.33  
V
T j=25 °C  
105 ns  
208 nC  
V R=30 V, I F=|I S|,  
di F/dt =100 A/µs  
Q rr  
139  
Rev1.92  
page 3  
2014-11-21  
SPP18P06P H  
1 Power dissipation  
2 Drain current  
P
tot=f(T A)  
I D=f(T A); |V GS|10 V  
20  
15  
10  
5
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0
0
0
40  
80  
A [°C]  
120  
160  
40  
80  
120  
160  
T
A [°C]  
T
3 Safe operating area  
I D=f(V DS); T A=25 °C1); D =0  
4 Max. transient thermal impedance  
thJA=f(t p)  
Z
parameter: t p  
parameter: D =t p/T  
101  
10 µs  
100 µs  
limited by on-state  
resistance  
1 ms  
101  
100  
10 ms  
0.5  
100  
DC  
0.2  
0.1  
0.05  
0.02  
10-1  
10-5  
10  
10-3  
10-2  
10-1  
100  
101  
102  
-4  
0.01  
10-1  
10-2  
single pulse  
0.1  
1
10  
100  
-V DS [V]  
t
p [s]  
Rev1.92  
page 4  
2014-11-21  
SPP18P06P H  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
DS(on)=f(I D); T j=25 °C  
R
parameter: V GS  
parameter: V GS  
40  
400  
-20 V  
35  
-10 V  
320  
30  
-4 V  
-4.5 V  
-7 V  
-5.5 V  
-5 V  
25  
-6 V  
240  
20  
15  
-7 V  
-6 V  
160  
80  
0
-5.5 V  
-10 V  
10  
5
-5 V  
-20 V  
-4.5 V  
-4 V  
0
0
2
4
6
8
0
5
10  
15  
20  
-ID [A]  
25  
30  
35  
-V DS [V]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
8
6
4
2
0
14  
12  
10  
8
6
4
125 °C  
25 °C  
2
0
0
1
2
3
4
5
0
5
10  
15  
20  
25  
30  
-V GS [V]  
-I D [A]  
Rev1.92  
page 5  
2014-11-21  
SPP18P06P H  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
R
DS(on)=f(T j); I D=-13.2 A; V GS=-10 V  
V
GS(th)=f(T j); V GS=V DS; I D=-1000 µA  
4
3.5  
3
350  
300  
250  
max.  
2.5  
typ.  
200  
98 %  
2
min.  
150  
1.5  
1
typ.  
100  
50  
0
0.5  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
T j [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
25 °C, typ  
103  
102  
101  
101  
150 °C, typ  
Ciss  
Coss  
Crss  
100  
150 °C, 98%  
25 °C, 98%  
10-1  
0
5
10  
15  
20  
25  
0
0.5  
1
1.5  
2
2.5  
3
-V DS [V]  
-V SD [V]  
Rev1.92  
page 6  
2014-11-21  
SPP18P06P H  
13 Avalanche characteristics  
AS=f(t AV); R GS=25 Ω  
14 Typ. gate charge  
GS=f(Q gate); I D=-18.6 A pulsed  
V
I
parameter: T j(start)  
parameter: V DD  
102  
16  
14  
12  
10  
8
25 °C  
12 V  
30 V  
48 V  
101  
100 °C  
125 °C  
6
4
2
0
0
5
10  
15  
20  
25  
30  
100  
100  
101  
102  
103  
Q
gate [nC]  
t
AV [µs]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V
BR(DSS)=f(T j); I D=-250 µA  
70  
V GS  
Q g  
65  
60  
55  
50  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
Rev1.9  
2
page 7  
2014  
-
11 21  
-
SPP18P06P H  
Package Outline: PG-TO220-3  
Rev1.92  
page 8  
2014-11-21  
SPP18P06P H  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2008 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies  
hereby disclaims any and all warranties and liabilities of any kind, including without limitation,  
warranties of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
).  
the nearest Infineon Technologies Office (www.infineon.com  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office. Infineon  
Technologies components may be used in life-support devices or systems only with the express  
written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be  
implanted in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be  
endangered.  
Rev1.92  
page 9  
2014-11­ 21  

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