EP2A25F33C-8_技术文档

APEX II

Programmable Logic

Device Family

®

December 2001, ver. 1.3

Data Sheet

ꢀ

Programmable logic device (PLD) manufactured using a 0.15-µm all-

layer copper-metal fabrication process (up to eight layers of metal)

Features...

–

1-gigabit per second (Gbps) True-LVDS^TM, LVPECL, pseudo

current mode logic (PCML), and HyperTransport interface

Clock-data synchronization (CDS) in True-LVDS interface to

correct any fixed clock-to-data skew

Enables common networking and communications bus I/O

standards such as RapidIO, CSIX, Utopia IV, and POS-PHY

Level 4

–

Support for high-speed external memory interfaces, including

zero bus turnaround (ZBT), quad data rate (QDR), and double

data rate (DDR) static RAM (SRAM), and single data rate (SDR)

and DDR synchronous dynamic RAM (SDRAM)

30% to 40% faster design performance than APEX^TM20KE

devices on average

Enhanced 4,096-bit embedded system blocks (ESBs)

implementing first-in first-out (FIFO) buffers, Dual-Port+ RAM

(bidirectional dual-port RAM), and content-addressable

memory (CAM)

–

High-performance, low-power copper interconnect

Fast parallel byte-wide synchronous device configuration

Look-up table (LUT) logic available for register-intensive

functions

ꢀ

High-density architecture

–

1,900,000 to 5,250,000 maximum system gates (see Table 1)

Up to 67,200 logic elements (LEs)

Up to 1,146,880 RAM bits that can be used without reducing

available logic

Low-power operation design

–

1.5-V supply voltage

Copper interconnect reduces power consumption

MultiVolt^TMI/O support for 1.5-V, 1.8-V, 2.5-V, and 3.3-V

interfaces

–

ESBs offer programmable power-saving mode

Altera Corporation

1

A-DS-APEXII-1.3

APEX II Programmable Logic Device Family Data Sheet

Table 1. APEX II Device Features

Feature

EP2A15

EP2A25

EP2A40

EP2A70

Maximum gates

1,900,000

600,000

16,640

104

2,750,000

900,000

24,320

152

3,000,000

1,500,000

38,400

160

5,250,000

3,000,000

67,200

280

Typical gates

LEs

RAM ESBs

Maximum RAM bits

True-LVDS channels

Flexible-LVDS^TMchannels (2)

True-LVDS PLLs (3)

General-purpose PLL outputs (4)

Maximum user I/O pins

425,984

36 (1)

56

622,592

36 (1)

56

655,360

36 (1)

88

1,146,880

36 (1)

88

4

8

492

612

735

1,060

Notes to Table 1:

(1) Each device has 36 input channels and 36 output channels.

(2) EP2A15 and EP2A25 devices have 56 input and 56 output channels; EP2A40 and EP2A70 devices have 88 input and

88 output channels.

(3) PLL: phase-locked loop. True-LVDS PLLs are dedicated to implement True-LVDS functionality.

(4) Two internal outputs per PLL are available. Additionally, the device has one external output per PLL pair (two

external outputs per device).

ꢀ

I/O features

...and More

Features

–

Up to 380 Gbps of I/O capability

1-Gbps True-LVDS, LVPECL, PCML, and HyperTransport

support on 36 input and 36 output channels that feature clock

synchronization circuitry and independent clock multiplication

and serialization/deserialization factors

–

Common networking and communications bus I/O standards

such as RapidIO, CSIX, Utopia IV, and POS-PHY Level 4 enabled

624-megabits per second (Mbps) Flexible-LVDS and

HyperTransport support on up to 88 input and 88 output

channels (input channels also support LVPECL)

–

Support for high-speed external memories, including ZBT, QDR,

and DDR SRAM, and SDR and DDR SDRAM

Compliant with peripheral component interconnect Special

Interest Group (PCI SIG) PCI Local Bus Specification,

Revision 2.2 for 3.3-V operation at 33 or 66 MHz and 32 or 64 bits

Compliant with 133-MHz PCI-X specifications

Support for other advanced I/O standards, including AGP, CTT,

SSTL-3 and SSTL-2 Class I and II, GTL+, and HSTL Class I and II

Six dedicated registers in each I/O element (IOE): two input

registers, two output registers, and two output-enable registers

Programmable bus hold feature

Programmable pull-up resistor on I/O pins available during

user mode

–

2

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

–

Programmable output drive for 3.3-V LVTTL at 4 mA, 12 mA,

24 mA, or I/O standard levels

–

Programmable output slew-rate control reduces switching noise

Hot-socketing operation supported

Pull-up resistor on I/O pins before and during configuration

ꢀ

Enhanced internal memory structure

–

High-density 4,096-bit ESBs

Dual-Port+ RAM with bidirectional read and write ports

Support for many other memory functions, including CAM,

FIFO, and ROM

–

ESB packing mode partitions one ESB into two 2,048-bit blocks

ꢀ

Device configuration

–

Fast byte-wide synchronous configuration minimizes in-circuit

reconfiguration time

Device configuration supports multiple voltages (either 3.3 V

and 2.5 V or 1.8 V)

Flexible clock management circuitry with eight general-purpose PLL

outputs

–

Four general-purpose PLLs with two outputs per PLL

Built-in low-skew clock tree

Eight global clock signals

ClockLock^TMfeature reducing clock delay and skew

ClockBoost^TMfeature providing clock multiplication (by 1

to 160) and division (by 1 to 256)

–

ClockShift^TMfeature providing programmable clock phase and

delay shifting with coarse (90˚, 180˚, or 270˚) and fine (0.5 to

1.0 ns) resolution

ꢀ

Advanced interconnect structure

–

All-layer copper interconnect for high performance

Four-level hierarchical FastTrack^®interconnect structure for fast,

predictable interconnect delays

–

Dedicated carry chain that implements arithmetic functions such

as fast adders, counters, and comparators (automatically used by

software tools and megafunctions)

Dedicated cascade chain that implements high-speed,

high-fan-in logic functions (automatically used by software tools

and megafunctions)

Interleaved local interconnect allowing one LE to drive 29 other

LEs through the fast local interconnect

ꢀ

Advanced software support

–

Software design support and automatic place-and-route

provided by the Altera^®Quartus^TMII development system for

Windows-based PCs, Sun SPARCstations, and HP 9000

Series 700/800 workstations

–

Altera MegaCore^®functions and Altera Megafunction Partners

Program (AMPP^SM) megafunctions optimized for APEX II

architecture

Altera Corporation

3

APEX II Programmable Logic Device Family Data Sheet

–

LogicLock^TMincremental design for intellectual property (IP)

integration and team-based design

NativeLink^TMintegration with popular synthesis, simulation,

and timing analysis tools

SignalTap^®embedded logic analyzer simplifies in-system design

evaluation by giving access to internal nodes during device

operation

–

Support for popular revision-control software packages,

including PVCS, RCS, and SCCS

Tables 2 and 3 show the APEX II ball-grid array (BGA) and

FineLine BGA^TMdevice package sizes, options, and I/O pin counts.

Table 2. APEX II Package Sizes

Feature

672-Pin

724-Pin BGA

1,020-Pin

FineLine BGA

1,508-Pin

FineLine BGA

Pitch (mm)

1.00

729

1.27

1,225

1.00

1,089

1.00

1,600

2

Area (mm )

Length × Width (mm × mm)

27 × 27

35 × 35

33 × 33

40 × 40

Table 3. APEX II Package Options & I/O Pin Count

Notes (1), (2)

Feature

672-Pin

FineLine BGA

724-Pin BGA

1,020-Pin

FineLine BGA

1,508-Pin

FineLine BGA

EP2A15

EP2A25

EP2A40

EP2A70

492

536

612

735

1,060

Notes to Table 3:

(1) All APEX II devices support vertical migration within the same package (e.g., the designer can migrate between the

EP2A15, EP2A25, and EP2A40 devices in the 672-pin FineLine BGA package).

(2) I/O pin counts include dedicated clock and fast I/O pins.

APEX II devices integrate high-speed differential I/O support using the

True-LVDS interface. The dedicated serializer, deserializer, and CDS

circuitry in the True-LVDS interface support the LVDS, LVPECL,

HyperTransport, and PCML I/O standards. Flexible-LVDS pins located

in regular user I/O banks offer additional differential support, increasing

the total device bandwidth. This circuitry, together with enhanced IOEs

and support for numerous I/O standards, allows APEX II devices to meet

high-speed interface requirements.

General

Description

4

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

APEX II devices also include other high-performance features such as

bidirectional dual-port RAM, CAM, general-purpose PLLs, and

numerous global clocks.

Conﬁguration

The logic, circuitry, and interconnects in the APEX II architecture are

configured with CMOS SRAM elements. APEX II devices are

reconfigurable and are 100% tested prior to shipment. As a result, test

vectors do not have to be generated for fault coverage. Instead, the

designer can focus on simulation and design verification. In addition, the

designer does not need to manage inventories of different ASIC designs;

APEX II devices can be configured on the board for the specific

functionality required.

APEX II devices are configured at system power-up with data either

stored in an Altera configuration device or provided by a system

controller. Altera offers in-system programmability (ISP)-capable

configuration devices, which configure APEX II devices via a serial data

stream. The enhanced configuration devices can configure any APEX II

device in under 100 ms. Moreover, APEX II devices contain an optimized

interface that permits microprocessors to configure APEX II devices

serially or in parallel, synchronously or asynchronously. This interface

also enables microprocessors to treat APEX II devices as memory and to

configure the device by writing to a virtual memory location, simplifying

reconfiguration.

APEX II devices also support a new byte-wide, synchronous

configuration scheme at speeds of up to 66 MHz using EPC16

configuration devices or a microprocessor. This parallel configuration

reduces configuration time by using eight data lines to send configuration

data versus one data line in serial configuration.

APEX II devices support multi-voltage configuration; device

configuration can be performed at 3.3 V and 2.5 V or 1.8 V.

After an APEX II device has been configured, it can be reconfigured in-

circuit by resetting the device and loading new data. Real-time changes

can be made during system operation, enabling innovative reconfigurable

computing applications.

Altera Corporation

5

APEX II Programmable Logic Device Family Data Sheet

Software

APEX II devices are supported by the Altera Quartus II development

system: a single, integrated package that offers hardware description

language (HDL) and schematic design entry, compilation and logic

synthesis, full simulation and worst-case timing analysis, SignalTap logic

analysis, and device configuration. The Quartus II software runs on

Windows-based PCs, Sun SPARCstations, and HP 9000 Series 700/800

workstations.

The Quartus II software includes the LogicLock incremental design

feature. The LogicLock feature allows the designer to make pin and

timing assignments, verify functionality and performance, and then set

constraints to lock down the placement and performance of a specific

block of logic using LogicLock constraints. Constraints set by the

LogicLock function guarantee repeatable placement when implementing

a block of logic in a current project or exporting the block to another

project. The constraints set by the LogicLock feature can lock down logic

to a fixed location in the device. The LogicLock feature can also lock the

logic down to a floating location, and the Quartus II software determines

the best relative placement of the block to meet design requirements.

Adding additional logic to a project will not affect the performance of

blocks locked down with LogicLock constraints.

The Quartus II software provides NativeLink interfaces to other industry-

standard PC- and UNIX workstation-based EDA tools. For example,

designers can open the Quartus II software from within third-party

design tools. The Quartus II software also contains built-in optimized

synthesis libraries; synthesis tools can use these libraries to optimize

designs for APEX II devices. For example, the Synopsys Design Compiler

library, supplied with the Quartus II development system, includes

DesignWare functions optimized for the APEX II architecture.

APEX II devices incorporate LUT-based logic, product-term-based logic,

memory, and high-speed I/O standards into one device. Signal

interconnections within APEX II devices (as well as to and from device

pins) are provided by the FastTrack interconnect—a series of fast,

continuous row and column channels that run the entire length and width

of the device.

Functional

Description

Each I/O pin is fed by an IOE located at the end of each row and column

of the FastTrack interconnect. Each IOE contains a bidirectional I/O

buffer and six registers that can be used for registering input, output, and

output-enable signals. When used with a dedicated clock pin, these

registers provide exceptional performance and interface support with

external memory devices such as DDR SDRAM and ZBT and QDR SRAM

devices.

6

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

IOEs provide a variety of features such as: 3.3-V, 64-bit, 66-MHz PCI

compliance, 3.3-V, 64-bit, 133-MHz PCI-X compliance, Joint Test Action

Group (JTAG) boundary-scan test (BST) support, output drive strength

control, slew-rate control, tri-state buffers, bus-hold circuitry,

programmable pull-up resistors, programmable input and output delays,

and open-drain outputs.

APEX II devices offer enhanced I/O support, including support for 1.5 V,

1.8 V, 2.5 V, 3.3 V, LVCMOS, LVTTL, HSTL, LVDS, LVPECL,

HyperTransport, PCML, 3.3-V PCI, PCI-X, GTL+, SSTL-2, SSTL-3, CTT,

and 3.3-V AGP I/O standards. High-speed (up to 1.0 Gbps) differential

transfers are supported with True-LVDS circuitry for LVDS, LVPECL,

HyperTransport, and PCML I/O standards. The optional CDS feature

corrects any clock-to-data skew at the True-LVDS receiver channels,

allowing for flexible board topologies. Up to 88 Flexible-LVDS channels

support differential transfer at up to 624 Mbps (DDR) for LVDS and

HyperTransport I/O standards.

An ESB can implement many types of memory, including Dual-Port+

RAM, CAM, ROM, and FIFO functions. Embedding the memory directly

into the die improves performance and reduces die area compared to

distributed-RAM implementations. The abundance of cascadable ESBs

ensures that the APEX II device can implement multiple wide memory

blocks for high-density designs. The ESB’s high speed ensures it can

implement small memory blocks without any speed penalty. The

abundance of ESBs, in conjunction with the ability for one ESB to

implement two separate memory blocks, ensures that designers can create

as many different-sized memory blocks as the system requires.

Figure 1 shows an overview of the APEX II device.

Altera Corporation

7

APEX II Programmable Logic Device Family Data Sheet

Figure 1. APEX II Device Block Diagram

Clock Management Circuitry

FastTrack

Interconnect

IOE

ClockLock

IOE

LUT

IOE

LUT

IOE

Four-input LUT

for data path and

DSP functions.

LUT

Product Term

Memory

IOE

Product Term

Memory

Product Term

Memory

Product Term

Memory

IOEs support

PCI, GTL+,

SSTL-3, LVDS,

and other

Product-term

integration for

high-speed

control logic and

state machines.

standards.

LUT

Product Term

Memory

LUT

Product Term

Memory

Product Term

Memory

IOE

Product Term

Memory

Flexible integration

of embedded

memory, including

CAM, RAM,

IOE

ROM, FIFO, and

other memory

functions.

Table 4 lists the resources available in APEX II devices.

Table 4. APEX II Device Resources

Device

MegaLAB Rows

MegaLAB

Columns

ESBs

EP2A15

EP2A25

EP2A40

EP2A70

26

38

40

70

4

104

152

160

280

APEX II devices provide eight dedicated clock input pins and four

dedicated fast I/O pins that globally drive register control inputs,

including clocks. These signals ensure efficient distribution of high-speed,

low-skew control signals. The control signals use dedicated routing

channels to provide short delays and low skew. The dedicated fast signals

can also be driven by internal logic, providing an ideal solution for a clock

divider or internally-generated asynchronous control signal with high

fan-out. The dedicated clock and fast I/O pins on APEX II devices can also

feed logic. Dedicated clocks can also be used with the APEX II general-

purpose PLLs for clock management.

8

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

MegaLAB Structure

APEX II devices are constructed from a series of MegaLAB^TMstructures.

Each MegaLAB structure contains a group of logic array blocks (LABs),

one ESB, and a MegaLAB interconnect, which routes signals within the

MegaLAB structure. EP2A15 and EP2A25 devices have 16 LABs and

EP2A40 and EP2A70 devices have 24 LABs. Signals are routed between

MegaLAB structures and I/O pins via the FastTrack interconnect. In

addition, edge LABs can be driven by I/O pins through the local

interconnect. Figure 2 shows the MegaLAB structure.

Figure 2. MegaLAB Structure

MegaLAB Interconnect

LE1

LE2

LE3

LE4

LE5

LE6

LE7

LE8

LE9

LE10

LE1

LE2

LE3

LE4

LE5

LE6

LE7

LE8

LE9

LE10

LE1

LE2

LE3

LE4

LE5

LE6

LE7

To Adjacent

LAB or IOEs

ESB

LE8

LE9

LE10

Local

Interconnect

LABs

Logic Array Block

Each LAB consists of 10 LEs, the LEs’ associated carry and cascade chains,

LAB control signals, and the local interconnect. The local interconnect

transfers signals between LEs in the same or adjacent LABs, IOEs, or ESBs.

The Quartus II Compiler places associated logic within a LAB or adjacent

LABs, allowing the use of a fast local interconnect for high performance.

APEX II devices use an interleaved LAB structure, so that each LAB can

drive two local interconnect areas. Every other LE drives to either the left

or right local interconnect area, alternating by LE. The local interconnect

can drive LEs within the same LAB or adjacent LABs. This feature

minimizes the use of the row and column interconnects, providing higher

performance and flexibility. Each LAB structure can drive 30 LEs through

fast local interconnects.

Altera Corporation

9

APEX II Programmable Logic Device Family Data Sheet

Figure 3 shows the APEX II LAB.

Figure 3. APEX II LAB Structure

Row

Interconnect

MegaLAB Interconnect

LEs drive local,

MegaLAB, row,

and column

interconnects.

To/From

Adjacent LAB,

ESB, or IOEs

Adjacent LAB,

ESB, or IOEs

Column

Interconnect

Local Interconnect

The 10 LEs in the LAB are driven by

two local interconnect areas. These LEs

can drive two local interconnect areas.

Each LAB contains dedicated logic for driving control signals to its LEs

and ESBs. The control signals include clock, clock enable, asynchronous

clear, asynchronous preset, asynchronous load, synchronous clear, and

synchronous load signals. A maximum of six control signals can be used

at a time. Although synchronous load and clear signals are generally used

when implementing counters, they can also be used with other functions.

Each LAB can use two clocks and two clock enable signals. The LAB’s

clock and clock enable signals are linked (e.g., any LE in a particular LAB

using CLK1will also use CLKENA1). LEs with the same clock but different

clock enable signals either use both clock signals in one LAB or are placed

into separate LABs. If both the rising and falling edges of a clock are used

in an LAB, both LAB-wide clock signals are used.

10

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

The LAB-wide control signals can be generated from the LAB local

interconnect, global signals, and dedicated clock pins. The inherent low

skew of the FastTrack interconnect enables it to be used for clock

distribution. Figure 4 shows the LAB control signal generation circuit.

Figure 4. LAB Control Signal Generation

8

Dedicated

Clocks

4

Fast Global

Signals

Local

Interconnect

Local

Interconnect

Local

Interconnect

Local

Interconnect

LABCLKENA1

SYNCLOAD

LABCLR1 (1)

or LABCLKENA2

SYNCCLR

or LABCLK2 (2)

LABCLK1

LABCLR2 (1)

Notes to Figure 4:

(1) The LABCLR1and LABCLR2signals also control asynchronous load and asynchronous preset for LEs within the

LAB.

(2) The SYNCCLRsignal can be generated by the local interconnect or global signals.

Logic Element

The LE is the smallest unit of logic in the APEX II architecture. Each LE

contains a four-input LUT, which is a function generator that can quickly

implement any function of four variables. In addition, each LE contains a

programmable register and carry and cascade chains. Each LE drives the

local interconnect, MegaLAB interconnect, and FastTrack interconnect

routing structures. See Figure 5.

Altera Corporation

11

APEX II Programmable Logic Device Family Data Sheet

Figure 5. APEX II Logic Element

Register Bypass

LAB-wide

Synchronous

Load

LAB-wide

Synchronous

Clear

Packed

Register Select

Carry-In

Cascade-In

Programmable

Register

data1

data2

data3

data4

To FastTrack Interconnect,

MegaLAB Interconnect,

or Local Interconnect

Look-Up

Table

(LUT)

Carry

Chain

Cascade

Chain

Synchronous

Load & Clear

Logic

PRN

D

Q

ENA

CLRN

To FastTrack Interconnect,

MegaLAB Interconnect,

or Local Interconnect

labclr1

labclr2

Asynchronous

Clear/Preset/

Load Logic

Chip-Wide

Reset

Clock &

Clock Enable

Select

labclk1

labclk2

labclkena1

labclkena2

Carry-Out

Cascade-Out

Each LE’s programmable register can be configured for D, T, JK, or SR

operation. The register’s clock and clear control signals can be driven by

global signals, general-purpose I/O pins, or any internal logic. For

combinatorial functions, the register is bypassed and the output of the

LUT drives the outputs of the LE.

12

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Each LE has two outputs that drive the local, MegaLAB, or FastTrack

interconnect routing structure. Each output can be driven independently

by the LUT’s or register’s output. For example, the LUT can drive one

output while the register drives the other output. This feature, called

register packing, improves device utilization because the register and the

LUT can be used for unrelated functions. The LE can also drive out

registered and unregistered versions of the LUT output. The APEX II

architecture provides two types of dedicated high-speed data paths that

connect adjacent LEs without using local interconnect paths: carry chains

and cascade chains. A carry chain supports high-speed arithmetic

functions such as counters and adders, while a cascade chain implements

wide-input functions such as equality comparators with minimum delay.

Carry and cascade chains connect LEs 1 through 10 in an LAB and all

LABs in the same MegaLAB structure.

Carry Chain

The carry chain provides a fast carry-forward function between LEs. The

carry-in signal from a lower-order bit drives forward into the higher-

order bit via the carry chain, and feeds into both the LUT and the next

portion of the carry chain. This feature allows the APEX II architecture to

implement high-speed counters, adders, and comparators of arbitrary

width. The Quartus II Compiler can create carry chain logic automatically

during the design process, or the designer can create it manually during

design entry. Parameterized functions such as DesignWare functions

from Synopsys and library of parameterized modules (LPM) functions

automatically take advantage of carry chains for the appropriate

functions.

The Quartus II Compiler creates carry chains longer than 10 LEs by

linking LABs together automatically. For enhanced fitting, a long carry

chain skips alternate LABs in a MegaLAB structure. A carry chain longer

than one LAB skips either from an even-numbered LAB to the next even-

numbered LAB, or from an odd-numbered LAB to the next odd-

numbered LAB. For example, the last LE of the first LAB in the upper-left

MegaLAB structure carries to the first LE of the third LAB in the

MegaLAB structure.

Figure 6 shows how an n-bit full adder can be implemented in n + 1 LEs

with the carry chain. One portion of the LUT generates the sum of two bits

using the input signals and the carry-in signal; the sum is routed to the

output of the LE. The register can be bypassed for simple adders or used

for accumulator functions. Another portion of the LUT and the carry

chain logic generates the carry-out signal, which is routed directly to the

carry-in signal of the next-higher-order bit. The final carry-out signal is

routed to an LE, where it is driven onto the local, MegaLAB, or FastTrack

interconnect routing structures.

Altera Corporation

13

APEX II Programmable Logic Device Family Data Sheet

Figure 6. APEX II Carry Chain

Carry-In

s1

Register

a1

b1

LUT

Carry Chain

LE1

Register

s2

a2

b2

LUT

Carry Chain

LE2

Register

sn

LUT

an

bn

Carry Chain

LEn

Register

Carry-Out

LUT

Carry Chain

LEn + 1

14

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Cascade Chain

With the cascade chain, the APEX II architecture can implement functions

with a very wide fan-in. Adjacent LUTs can compute portions of a

function in parallel; the cascade chain serially connects the intermediate

values. The cascade chain can use a logical ANDor logical OR(via

DeMorgan’s inversion) to connect the outputs of adjacent LEs. Each

additional LE provides four more inputs to the effective width of a

function, with a short cascade delay. The Quartus II Compiler can create

cascade chain logic automatically during the design process, or the

designer can create it manually during design entry.

Cascade chains longer than 10 LEs are implemented automatically by

linking LABs together. For enhanced fitting, a long cascade chain skips

alternate LABs in a MegaLAB structure. A cascade chain longer than one

LAB skips either from an even-numbered LAB to the next even-numbered

LAB, or from an odd-numbered LAB to the next odd-numbered LAB. For

example, the last LE of the first LAB in the upper-left MegaLAB structure

carries to the first LE of the third LAB in the MegaLAB structure. Figure 7

shows how the cascade function can connect adjacent LEs to form

functions with a wide fan-in.

Figure 7. APEX II Cascade Chain

AND Cascade Chain

OR Cascade Chain

d[3..0]

LUT

LE1

LE2

LE1

LE2

d[7..4]

d[(4n –1)..(4n –4)]

LUT

LEn

Altera Corporation

15

APEX II Programmable Logic Device Family Data Sheet

LE Operating Modes

The APEX II LE can operate in one of the following three modes:

ꢀ

Normal mode

Arithmetic mode

Counter mode

ꢀ

Each mode uses LE resources differently. In each mode, seven available

inputs to the LE—the four data inputs from the LAB local interconnect,

the feedback from the programmable register, and the carry-in and

cascade-in from the previous LE—are directed to different destinations to

implement the desired logic function. LAB-wide signals provide clock,

asynchronous clear, asynchronous preset, asynchronous load,

synchronous clear, synchronous load, and clock enable control for the

register. These LAB-wide signals are available in all LE modes.

The Quartus II software, in conjunction with parameterized functions

such as LPM and DesignWare functions, automatically chooses the

appropriate mode for common functions such as counters, adders, and

multipliers. If required, the designer can also create special-purpose

functions that specify which LE operating mode to use for optimal

performance. Figure 8 shows the LE operating modes.

16

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 8. APEX II LE Operating Modes

LAB-Wide

Clock Enable (2)

Normal Mode (1)

Carry-In (3)

Cascade-In

LE-Out

data1

data2

4-Input

PRN

D

Q

LUT

data3

LE-Out

data4

ENA

CLRN

Cascade-Out

LAB-Wide

Clock Enable (2)

Arithmetic Mode

Carry-In

Cascade-In

LE-Out

PRN

data1

data2

D

Q

3-Input

LUT

ENA

CLRN

3-Input

LUT

Cascade-Out

Carry-Out

Counter Mode

LAB-Wide

Synchronous

Clear (6)

LAB-Wide

Synchronous

Load (6)

LAB-Wide

Clock Enable (2)

Cascade-In

y-In

Carr

(4)

LE-Out

data1 (5)

data2 (5)

PRN

3-Input

LUT

D

Q

LE-Out

data3

ENA

CLRN

3-Input

LUT

Carry-Out Cascade-Out

Notes to Figure 8:

(1) LEs in normal mode support register packing.

(2) There are two LAB-wide clock enables per LAB.

(3) When using the carry-in in normal mode, the packed register feature is unavailable.

(4) A register feedback multiplexer is available on LE1 of each LAB.

(5) The DATA1and DATA2input signals can supply counter enable, up or down control, or register feedback signals for

LEs other than the second LE in a LAB.

(6) The LAB-wide synchronous clear and LAB-wide synchronous load affect all registers in a LAB.

Altera Corporation

17

APEX II Programmable Logic Device Family Data Sheet

Normal Mode

The normal mode is suitable for general logic applications, combinatorial

functions, or wide decoding functions that can take advantage of a

cascade chain. In normal mode, four data inputs from the LAB local

interconnect and the carry-in are inputs to a four-input LUT. The

Quartus II Compiler automatically selects the carry-in or the DATA3signal

as one of the inputs to the LUT. The LUT output can be combined with the

cascade-in signal to form a cascade chain through the cascade-out signal.

LEs in normal mode support packed registers.

Arithmetic Mode

The arithmetic mode is ideal for implementing adders, accumulators, and

comparators. An LE in arithmetic mode uses two 3-input LUTs. One LUT

computes a three-input function; the other generates a carry output. As

shown in Figure 8, the first LUT uses the carry-in signal and two data

inputs from the LAB local interconnect to generate a combinatorial or

registered output. For example, when implementing an adder, this output

is the sum of three signals: DATA1, DATA2, and carry-in. The second LUT

uses the same three signals to generate a carry-out signal, thereby creating

a carry chain. The arithmetic mode also supports simultaneous use of the

cascade chain. LEs in arithmetic mode can drive out registered and

unregistered versions of the LUT output.

The Quartus II software implements parameterized functions that use the

arithmetic mode automatically where appropriate; the designer does not

need to specify how the carry chain will be used.

Counter Mode

The counter mode offers clock enable, counter enable, synchronous

up/down control, synchronous clear, and synchronous load options. The

counter enable and synchronous up/down control signals are generated

from the data inputs of the LAB local interconnect. The synchronous clear

and synchronous load options are LAB-wide signals that affect all

registers in the LAB. Consequently, if any of the LEs in an LAB use the

counter mode, other LEs in that LAB must be used as part of the same

counter or be used for a combinatorial function. The Quartus II software

automatically places any registers that are not used by the counter into

other LABs.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

The counter mode uses two three-input LUTs: one generates the counter

data, and the other generates the fast carry bit. A 2-to-1 multiplexer

provides synchronous loading, and another ANDgate provides

synchronous clearing. If the cascade function is used by an LE in counter

mode, the synchronous clear or load overrides any signal carried on the

cascade chain. The synchronous clear overrides the synchronous load.

LEs in arithmetic mode can drive out registered and unregistered versions

of the LUT output.

Clear & Preset Logic Control

Logic for the register’s clear and preset signals is controlled by LAB-wide

signals. The LE directly supports an asynchronous clear function. The

Quartus II Compiler can use a NOT-gate push-back technique to emulate

an asynchronous preset. Moreover, the Quartus II Compiler can use a

programmable NOT-gate push-back technique to emulate simultaneous

preset and clear or asynchronous load. However, this technique uses three

additional LEs per register. All emulation is performed automatically

when the design is compiled. Registers that emulate simultaneous preset

and load will enter an unknown state upon power-up or when the chip-

wide reset is asserted.

In addition to the two clear and preset modes, APEX II devices provide a

chip-wide reset pin (DEV_CLRn) that resets all registers in the device. Use

of this pin is controlled through an option in the Quartus II software that

is set before compilation. The chip-wide reset overrides all other control

signals. Registers using an asynchronous preset are preset when the chip-

wide reset is asserted; this effect results from the inversion technique used

to implement the asynchronous preset.

FastTrack Interconnect

In the APEX II architecture, connections between LEs, ESBs, and I/O pins

are provided by the FastTrack interconnect. The FastTrack interconnect is

a series of continuous horizontal and vertical routing channels that

traverse the device. This global routing structure provides predictable

performance, even in complex designs. In contrast, the segmented routing

in FPGAs requires switch matrices to connect a variable number of

routing paths, increasing the delays between logic resources and reducing

performance.

Altera Corporation

19

APEX II Programmable Logic Device Family Data Sheet

The FastTrack interconnect consists of row and column interconnect

channels that span the entire device. The row interconnect routes signals

throughout a row of MegaLAB structures; the column interconnect routes

signals throughout a column of MegaLAB structures. When using the row

and column interconnect, an LE, IOE, or ESB can drive any other LE, IOE,

or ESB in a device. See Figure 9.

Figure 9. APEX II Interconnect Structure

Row

Interconnect

I/O

MegaLAB

I/O

MegaLAB

I/O

MegaLAB

Column

Interconnect

MegaLAB

I/O

MegaLAB

I/O

A row line can be driven directly by LEs, IOEs, or ESBs in that row.

Further, a column line can drive a row line, allowing an LE, IOE, or ESB

to drive elements in a different row via the column and row interconnect.

The row interconnect drives the MegaLAB interconnect to drive LEs,

IOEs, or ESBs in a particular MegaLAB structure.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

A column line can be directly driven by the LEs, IOEs, or ESBs in that

column. Row IOEs can drive a column line on a device’s left or right edge.

The column line is used to route signals from one row to another. A

column line can drive a row line; it can also drive the MegaLAB

interconnect directly, allowing faster connections between rows.

Figure 10 shows how the FastTrack interconnect uses the local

interconnect to drive LEs within MegaLAB structures.

Figure 10. FastTrack Connection to Local Interconnect

I/O

Row

L

A

B

L

A

B

L

A

B

E

S

B

E

S

B

L

A

B

L

A

B

L

A

B

I/O

MegaLAB

Row & Column

Column

Interconnect Drives

MegaLAB Interconnect

Row

MegaLAB

Interconnect

MegaLAB

Interconnect Drives

Local Interconnect

Column

L

A

B

L

A

B

L

A

B

E

S

B

Figure 11 shows the intersection of a row and column interconnect and

how these forms of interconnects and LEs drive each other.

Altera Corporation

21

APEX II Programmable Logic Device Family Data Sheet

Figure 11. Driving the FastTrack Interconnect

Row

Interconnect

MegaLAB

Interconnect

Column

Interconnect

LE

Local

Interconnect

APEX II devices feature FastRow^TMlines for quickly routing input signals

with high fan-out. Column I/O pins can drive the FastRow interconnect,

which routes signals directly into the local interconnect without having to

drive through the MegaLAB interconnect. FastRow lines traverse two

MegaLAB structures. The FastRow interconnect drives the four

MegaLABs in the top row and the four MegaLABs in the bottom row of

the device. The FastRow interconnect drives all local interconnects in the

appropriate MegaLABs. Column pins using the FastRow interconnect

achieve a faster set-up time, because the signal does not need to use a

MegaLab interconnect line to reach the destination LE. Figure 12 shows

the FastRow interconnect.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 12. APEX II FastRow Interconnect

Select Vertical I/O Pins

Drive Local Interconnect

and FastRow

FastRow Interconnect

Drives Local Interconnect

in Two MegaLAB Structures

IOE

FastRow

Interconnect

Local

Interconnect

LEs

MegaLAB

LABs

Altera Corporation

23

APEX II Programmable Logic Device Family Data Sheet

Table 5 summarizes how elements of the APEX II architecture drive each

other.

Table 5. APEX II Routing Scheme

Source

Destination

MegaLAB

Row Column

I/O Pin I/O Pin

LE

ESB

Local

Row

Column

FastTrack Interconnect

Interconnect Interconnect

FastRow

Interconnect Interconnect FastTrack

Row I/O pin

v

Column I/O

v

LE

v

ESB

Local

v

interconnect

MegaLAB

v

interconnect

Row

FastTrack

interconnect

v

Column

v

FastTrack

interconnect

FastRow

v

interconnect

Product-Term Logic

The product-term portion of the MultiCore architecture is implemented

with the ESB. The ESB can be configured to act as a block of macrocells on

an ESB-by-ESB basis. 32 inputs from the adjacent local interconnect feed

each ESB; therefore, the either MegaLAB or the adjacent LAB can drive the

ESB. Also, nine ESB macrocells feed back into the ESB through the local

interconnect for higher performance. Dedicated clock pins, global signals,

and additional inputs from the local interconnect drive the ESB control

signals.

In product-term mode, each ESB contains 16 macrocells. Each macrocell

consists of two product terms and a programmable register. Figure 13

shows the ESB in product-term mode.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 13. Product-Term Logic in ESB

Dedicated Clocks

Global Signals

MegaLAB Interconnect

4

8

65

9

32

Macrocell

Inputs (1 to 16)

To Row

and Column

Interconnect

From

Adjacent

LAB

2

16

CLK[1..0]

ENA[1..0]

CLRN[1..0]

Local

Interconnect

Macrocells

APEX II macrocells can be configured individually for either sequential or

combinatorial logic operation. The macrocell consists of three functional

blocks: the logic array, the product-term select matrix, and the

programmable register.

Combinatorial logic is implemented in the product terms. The product-

term select matrix allocates these product terms for use as either primary

logic inputs (to the ORand XORgates) to implement combinatorial

functions, or as parallel expanders to be used to increase the logic

available to another macrocell. One product term can be inverted; the

Quartus II software uses this feature to perform DeMorgan’s inversion for

more efficient implementation of wide ORfunctions. The Quartus II

Compiler can use a NOT-gate push-back technique to emulate an

asynchronous preset. Figure 14 shows the APEX II macrocell.

Altera Corporation

25

APEX II Programmable Logic Device Family Data Sheet

Figure 14. APEX II Macrocell

ESB-Wide ESB-Wide

Clears Clock Enables

ESB-Wide

Clocks

2

Parallel Logic

Expanders

(From Other

Macrocells)

Programmable

Register

ESB

Output

Product-

Term

D

Q

Select

Matrix

ENA

CLRN

Clock/

Enable

Select

32 Signals

from Local

Interconnect

Clear

Select

For registered functions, each macrocell register can be programmed

individually to implement D, T, JK, or SR operation with programmable

clock control. The register can be bypassed for combinatorial operation.

During design entry, the designer specifies the desired register type; the

Quartus II software then selects the most efficient register operation for

each registered function to optimize resource utilization. The Quartus II

software or other synthesis tools can also select the most efficient register

operation automatically when synthesizing HDL designs.

Each programmable register can be clocked by one of two ESB-wide

clocks. The ESB-wide clocks can be generated from device dedicated clock

pins, global signals, or local interconnect. Each clock also has an

associated clock enable, generated from the local interconnect. The clock

and clock enable signals are related for a particular ESB; any macrocell

using a clock also uses the associated clock enable.

If both the rising and falling edges of a clock are used in an ESB, both

ESB-wide clock signals are used.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

The programmable register also supports an asynchronous clear function.

Within the ESB, two asynchronous clears are generated from global

signals and the local interconnect. Each macrocell can either choose

between the two asynchronous clear signals or choose to not be cleared.

Either of the two clear signals can be inverted within the ESB. Figure 15

shows the ESB control logic when implementing product-terms.

Figure 15. ESB Product-Term Mode Control Logic

8

Dedicated

Clocks

4

Global

Signals

Local

Interconnect

Local

Interconnect

Local

Interconnect

Local

Interconnect

CLK1

CLR2

CLKENA1

CLR1

CLK2

CLKENA2

Parallel Expanders

Parallel expanders are unused product terms that can be allocated to a

neighboring macrocell to implement fast, complex logic functions.

Parallel expanders allow up to 32 product terms to feed the macrocell OR

logic directly, with two product terms provided by the macrocell and

30 parallel expanders provided by the neighboring macrocells in the ESB.

The Quartus II Compiler can allocate up to 15 sets of up to two parallel

expanders per set to the macrocells automatically. Each set of two parallel

expanders incurs a small, incremental timing delay. Figure 16 shows the

APEX II parallel expanders.

Altera Corporation

27

APEX II Programmable Logic Device Family Data Sheet

Figure 16. APEX II Parallel Expanders

From

Product-

Term

Select

Matrix

Macrocell

Product-

Term Logic

Parallel Expander

Switch

Product-

Term

Select

Matrix

Macrocell

Product-

Term Logic

Parallel Expander

Switch

32 Signals from

Local Interconnect

To Next

Macrocell

The ESB can implement various types of memory blocks, including Dual-

Port+ RAM (bidirectional dual-port RAM), dual- and single-port RAM,

ROM, FIFO, and CAM blocks.

Embedded

System Block

The ESB includes input and output registers; the input registers

synchronize writes, and the output registers can pipeline designs to

improve system performance. The ESB offers a bidirectional, dual-port

mode, which supports any combination of two port operations: two reads,

two writes, or one read and one write at two different clock frequencies.

Figure 17 shows the ESB block diagram.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 17. Bidirectional Dual-Port Memory Conﬁguration

A

B

data_A[]

data_B[]

address_A[]

wren_A

address_B[]

wren_B

clock_A

clocken_A

q_A[]

clock_B

clocken_B

q_B[]

aclr_A

aclr_B

In addition to bidirectional dual-port memory, the ESB also supports

dual-port, and single-port RAM. Dual-port memory supports a

simultaneous read and write. Single-port memory supports independent

read and write. Figure 18 shows these different RAM memory port

configurations for an ESB.

Figure 18. Dual- & Single-Port Memory Conﬁgurations

Dual-Port Memory

data[]

rdaddress[]

rden

wraddress[]

wren

q[]

inclock

inclocken

inaclr

outclock

outclocken

outaclr

Single-Port Memory (1)

data[]

address[]

wren

q[]

outclock

inclock

inclocken

inaclr

outclocken

outaclr

Note to Figure 18:

(1) Two single-port memory blocks can be implemented in a single ESB.

Altera Corporation

29

APEX II Programmable Logic Device Family Data Sheet

The ESB also enables variable width data ports for reading and writing to

the RAM ports in dual-port RAM configuration. For example, the ESB can

be written in 1× mode at port A while being read in 16× mode from port B.

Table 6 lists the supported variable width configurations for an ESB in

dual-port mode.

Table 6. Variable Width Configurations for Dual-Port RAM

Read Port Width

Write Port Width

1 bit

2 bits, 4 bits, 8 bits, or 16 bits

1 bit

ESBs can implement synchronous RAM, which is easier to use than

asynchronous RAM. A circuit using asynchronous RAM must generate

the RAM write enable (WE) signal while ensuring that its data and address

signals meet setup and hold time specifications relative to the WEsignal.

In contrast, the ESB’s synchronous RAM generates its own WEsignal and

is self-timed with respect to the global clock. Circuits using the ESB’s self-

timed RAM only need to meet the setup and hold time specifications of

the global clock.

ESB inputs are driven by the adjacent local interconnect, which in turn can

be driven by the MegaLAB or FastTrack interconnects. Because the ESB

can be driven by the local interconnect, an adjacent LE can drive it directly

for fast memory access. ESB outputs drive the MegaLAB and FastTrack

interconnects and the local interconnect for fast connection to adjacent

LEs or for fast feedback product-term logic.

When implementing memory, each ESB can be configured in any of the

following sizes: 512 × 8, 1,024 × 4, 2,048 × 2, or 4,096 × 1. For dual-port and

single-port modes, the ESB can be configured for 256 × 16 in addition to

the list above.

The ESB can also be split in half and used for two independent 2,048-bit

single-port RAM blocks. The two independent RAM blocks must have

identical configurations with a maximum width of 256 × 8. For example,

one half of the ESB can be used as a 256 × 8 single-port memory while the

other half is also used for a 256 × 8 single-port memory. This effectively

doubles the number of RAM blocks an APEX II device can implement for

its given number of ESBs. The Quartus II software automatically merges

two logical memory functions in a design into an ESB; the designer does

not need to merge the functions manually.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

By combining multiple ESBs, the Quartus II software implements larger

memory blocks automatically. For example, two 256 × 16 RAM blocks can

be combined to form a 256 x 32 RAM block, and two 512 × 8 RAM blocks

can be combined to form a 512 × 16 RAM block. Memory performance

does not degrade for memory blocks up to 4,096 words deep. Each ESB

can implement a 4,096-word-deep memory; the ESBs are used in parallel,

eliminating the need for any external control logic that would increase

delays. To create a high-speed memory block more than 4,096-words

deep, the Quartus II software automatically combines ESBs with LE

control logic.

Input/Output Clock Mode

The ESB implements input/output clock mode for both dual-port and

bidirectional dual-port memory. An ESB using input/output clock mode

can use up to two clocks. On each of the two ports, A or B, one clock

controls all registers for inputs into the ESB: data input, WREN, read

address, and write address. The other clock controls the ESB data output

registers. Each ESB port, A or B, also supports independent read clock

enable, write clock enable, and asynchronous clear signals. Input/output

clock mode is commonly used for applications where the reads and writes

occur at the same system frequency, but require different clock enable

signals for the input and output registers. Figure 19 shows the ESB in

input/output clock mode.

Altera Corporation

31

APEX II Programmable Logic Device Family Data Sheet

Figure 19. ESB in Input/Output Clock Mode

Note (1)

2()

Notes to Figure 19:

(1) All registers can be cleared asynchronously by ESB local interconnect signals, global signals, or the chip-wide reset.

(2) This configuration is not supported for bidirectional dual-port configuration.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

In addition to the input/output mode clocking scheme, the clock

connections to the various ESB input/output registers are customizable in

®

the MegaWizard Plug-In Manager.

Single-Port Mode

The APEX II ESB also supports a single-port mode, which is used when

simultaneous reads and writes are not required. See Figure 20. A single

ESB can support up to two single-port mode RAMs.

Figure 20. ESB in Single-Port Mode

Note (1)

Dedicated Fast

Global Signals

Dedicated Clocks

RAM/ROM

8

4

256 × 16

512 × 8

1,024 × 4

2,048 × 2

4,096 × 1

Data In

data[ ]

D

ENA

Q

To FastTrack

Interconnect

Data Out

D

Q

ENA

Address

address[ ]

wren

D

Q

ENA

outclken

Write Enable

inclken

inclock

D

ENA

Q

Write

Pulse

Generator

outclock

Note to Figure 20:

(1) All registers can be asynchronously cleared by ESB local interconnect signals, global signals, or chip-wide reset.

Altera Corporation

33

APEX II Programmable Logic Device Family Data Sheet

Content-Addressable Memory

APEX II devices can implement CAM in ESBs. CAM can be thought of as

the inverse of RAM. RAM stores data in a specific location; when the

system submits an address, the RAM block provides the data. Conversely,

when the system submits data to CAM, the CAM block provides the

address where the data is found. For example, if the data FA12is stored in

address 14, the CAM outputs 14when FA12is driven into it.

CAM is used for high-speed search operations. When searching for data

within a RAM block, the search is performed serially. Thus, finding a

particular data word can take many cycles. CAM searches all addresses in

parallel and outputs the address storing a particular word. When a match

is found, a match flag is set high. CAM is ideally suited for applications

such as Ethernet address lookup, data compression, pattern recognition,

cache tags, fast routing table lookup, and high-bandwidth address

filtering. Figure 21 shows the CAM block diagram.

Figure 21. CAM Block Diagram

data[]

data_address[]

match

wraddress[]

wren

outclock

inclock

inclocken

inaclr

outclocken

outaclr

The APEX II on-chip CAM provides faster system performance than

traditional discrete CAM. Integrating CAM and logic into the APEX II

device eliminates off-chip and on-chip delays, improving system

performance.

When in CAM mode, the ESB implements a 32-word, 32-bit CAM. Wider

or deeper CAM, such as a 32-word, 64-bit or 128-word, 32-bit block, can

be implemented by combining multiple CAM blocks with some ancillary

logic implemented in LEs. The Quartus II software automatically

combines ESBs and LEs to create larger CAM blocks.

CAM supports writing “don’t care” bits into words of the memory. The

don’t-care bit can be used as a mask for CAM comparisons; any bit set to

don’t-care has no effect on matches.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

CAM can generate outputs in three different modes: single-match mode,

multiple-match mode, and fast multiple-match mode. In each mode, the

ESB outputs the matched data’s location as an encoded or unencoded

address. When encoded, the ESB outputs an encoded address of the data’s

location. For instance, if the data is located in address 12, the ESB output

is 12. When unencoded, each ESB port uses its 16 outputs to show the

location of the data over two clock cycles. In this case, if the data is located

in address 12, the 12th output line goes high. Figures 21 and 22 show the

encoded CAM outputs and unencoded CAM outputs, respectively.

Figure 22. Encoded CAM Address Outputs

CAM

addr[15..0] = 12

Encoded Output

Data Address

data[31..0] = 45

15

27

45

85

10

11

12

13

match = 1

Figure 23. Unencoded CAM Address Outputs

q0

CAM

data[30..0] =45 (1)

Data

Address

select (2)

Unencoded outputs.

q12 goes high to

signify a match.

15

27

45

85

10

11

12

13

q12

q13

q14

q15

Notes to Figures 22 and 23:

(1) For an unencoded output, the ESB only supports 31 input data bits. One input bit

is used by the selectline to choose one of the two banks of 16 outputs.

(2) If the selectinput is a 1, then CAM outputs odd words between 1 through 15. If

the selectinput is a 0, CAM outputs even words between 0 through 14.

In single-match mode, it takes two clock cycles to write into CAM, but

only one clock cycle to read from CAM. In this mode, both encoded and

unencoded outputs are available without external logic. Single-match

mode is better suited for designs without duplicate data in the memory.

Altera Corporation

35

APEX II Programmable Logic Device Family Data Sheet

If the same data is written into multiple locations in the memory, a CAM

block can be used in multiple-match or fast multiple-match modes. The

ESB outputs the matched data’s locations as an encoded or unencoded

address. In multiple-match mode, it takes two clock cycles to write into a

CAM block. For reading, there are 16 outputs from each ESB at each clock

cycle. Therefore, it takes two clock cycles to represent the 32 words from

a single ESB port. In this mode, encoded and unencoded outputs are

available. To implement the encoded version, the Quartus II software

adds a priority encoder with LEs. Fast multiple-match is identical to the

multiple match mode, however, it only takes one clock cycle to read from

a CAM block and generate valid outputs. To do this, the entire ESB is used

to represent 16 outputs. In fast multiple-match mode, the ESB can

implement a maximum CAM block size of 16 words.

A CAM block can be pre-loaded with data during configuration, or it can

be written during system operation. In most cases, two clock cycles are

required to write each word into CAM. When don’t-care bits are used, a

third clock cycle is required.

For more information on CAM, see Application Note 119 (Implementing

High-Speed Search Applications with APEX CAM).

f

Driving Signals to the ESB

ESBs provide flexible options for driving control signals. Different clocks

can be used for the ESB inputs and outputs. Registers can be inserted

independently on the data input, data output, read address, write

address, WE, and REsignals. The global signals and the local interconnect

can drive the WEand REsignals. The global signals, dedicated clock pins,

and local interconnects can drive the ESB clock signals. Because the LEs

drive the local interconnect, the LEs can control the WEand REsignals and

the ESB clock, clock enable, and synchronous clear signals. Figure 24

shows the ESB control signal generation logic.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 24. ESB Control Signal Generation

8

Dedicated

Clocks

4

Fast Global

Signals

Local

Interconnect

Local

Interconnect

Local

Interconnect

Local

Interconnect

Local

Interconnect

INCLKENA

OUTCLKENA

Local

Interconnect

RDEN

WREN INCLOCK

OUTCLOCK

INCLR OUTCLR

An ESB is fed by the local interconnect, which is driven by adjacent LEs

(for high-speed connection to the ESB) or the MegaLAB interconnect. The

ESB can drive the local, MegaLAB, or FastTrack interconnect routing

structure to drive LEs and IOEs in the same MegaLAB structure or

anywhere in the device.

Implementing Logic in ROM

In addition to implementing logic with product terms, the ESB can

implement logic functions when it is programmed with a read-only

pattern during configuration, creating a large LUT. With LUTs,

combinatorial functions are implemented by looking up the results, rather

than by computing them. This implementation of combinatorial functions

can be faster than using algorithms implemented in general logic, a

performance advantage that is further enhanced by the fast access times

of ESBs. The large capacity of ESBs enables designers to implement

complex functions in one logic level without the routing delays associated

with linked LEs or distributed RAM blocks. Parameterized functions such

as LPM functions can take advantage of the ESB automatically. Further,

the Quartus II software can implement portions of a design with ESBs

where appropriate.

Altera Corporation

37

APEX II Programmable Logic Device Family Data Sheet

Programmable Speed/Power Control

APEX II ESBs offer a high-speed mode that supports fast operation on an

ESB-by-ESB basis. When high speed is not required, this feature can be

turned off to reduce the ESB’s power dissipation by up to 50%. ESBs that

run at low power incur a nominal timing delay adder. This Turbo Bit^TM

option is available for ESBs that implement product-term logic or memory

functions. An ESB that is not used will be powered down so that it does

not consume DC current.

Designers can program each ESB in the APEX II device for either high-

speed or low-power operation. As a result, speed-critical paths in the

design can run at high speed, while the remaining paths operate at

reduced power.

The IOE in APEX II devices contains a bidirectional I/O buffer, six

registers, and a latch for a complete embedded bidirectional single data

rate or DDR IOE. Figure 25 shows the structure of the APEX II IOE. The

IOE contains two input registers (plus a latch), two output registers, and

two output enable registers. Both input registers and the latch can be used

for capturing DDR input. Both output registers can be used to drive DDR

outputs. The output enable (OE) register can be used for fast clock-to-

output enable timing. The negative edge-clocked OE register is used for

DDR SDRAM interfacing. The Quartus II software automatically

duplicates a single OE register that controls multiple output or

bidirectional pins.

I/O Structure

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 25. APEX II IOE Structure

Logic Array

OE Register

D

Q

OE

OE Register

D

Q

Output Register

D

Q

Output A

CLK

Output Register

D

Q

Output B

Input Register

D

Q

Input A

Input B

Input Latch

Input Register

D

Q

D

Q

ENA

The IOEs are located around the periphery of the APEX II device. Each

IOE drives a row, column, MegaLAB, or local interconnect when used as

an input or bidirectional pin. A row IOE can drive a local, MegaLAB, row,

and column interconnect; a column IOE can drive the FastTrack or

column interconnect. Figure 26 shows how a row IOE connects to the

interconnect.

Altera Corporation

39

APEX II Programmable Logic Device Family Data Sheet

Figure 26. Row IOE Connection to the Interconnect

Row Interconnect

MegaLAB Interconnect

Any LE can drive a

pin through the row,

column, and MegaLAB

interconnect.

Each IOE can drive local,

IOE

MegaLAB, row, and column

interconnect. Each IOE data

and OE signal is driven by

the local interconnect.

LAB

An LE can drive a pin through the

local interconnect for faster

clock-to-output times.

Figure 27 shows how a column IOE connects to the interconnect.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 27. Column IOE Connection to the Interconnect

Each IOE can drive column and FastRow

interconnects. Each IOE data and

OE signal is driven by local interconnect.

IOE

An LE or ESB can drive a

pin through a local

interconnect for faster

clock-to-output times.

LAB

Any LE or ESB can drive

a column pin through a

row, column, and MegaLAB

interconnect.

Column Interconnect

MegaLAB Interconnect

Row Interconnect

FastRow interconnects connect a column I/O pin directly to the LAB local

interconnect within two MegaLAB structures. This feature provides fast

setup times for pins that drive high fan-outs with complex logic, such as

PCI designs. For fast bidirectional I/O timing, LE registers using local

routing can improve setup times and OE timing.

APEX II devices have a peripheral control bus made up of 12 signals that

drive the IOE control signals. The peripheral bus is composed of six

output enables, OE[5:0]and six clock enables, CE[5:0]. These twelve

signals can be driven from internal logic or from the Fast I/O signals.

Table 7 lists the peripheral control signal destinations.

Altera Corporation

41

APEX II Programmable Logic Device Family Data Sheet

Table 7. Peripheral Control Bus Destinations

Peripheral Bus

I/O Control Signal

Output Enable 0 [OE0]

Output Enable 1 [OE1]

Output Enable 2 [OE2]

Output Enable 3 [OE3]

Output Enable 4 [OE4]

Output Enable 5 [OE5]

Clock Enable 0 [CE0]

Clock Enable 1 [CE1]

Clock Enable 2 [CE2]

Clock Enable 3 [CE3]

Clock Enable 4 [CE4]

Clock Enable 5 [CE5]

OE

CE, CLK

CE, OE

CE, CLK

CE, OE

CE, CLR

In normal bidirectional operation, the input register can be used for input

data requiring fast setup times. The input register can have its own clock

input and clock enable separate from the OE and output registers. The

output register can be used for data requiring fast clock-to-output

performance. The OE register can be used for fast clock-to-output enable

timing. The OE and output register share the same clock source and the

same clock enable source from local interconnect in the associated LAB,

fast global signals, or row global signals. Figure 28 shows the IOE in

bidirectional configuration.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 28. APEX II IOE in Bidirectional I/O Conﬁguration

Column, Row

or Local

Interconnect

Eight

Dedicated

Clocks

12 Peripheral

Signals

OE Register

Output

Delay

D

Q

t

ZX

VCCIO

Optional

PCI Clamp

ENA

CLRN/PRN

OE Register

Delay

Output Clock

Enable Delay

t

CO

VCCIO

Programmable

Pull-Up

Chip-Wide Reset

Output

Delay

Output Register

Logic Array

to Output

D

Q

Register Delay

Drive Strength Control

Open-Drain Output

Slew Control

ENA

CLRN/PRN

Input Pin to

Logic Array Delay

Bus-Hold

Circuit

Input Pin to

Input Register Delay

Input Register

D

Q

Input Clock

Enable Delay

ENA

CLRN/PRN

The APEX II IOE includes programmable delays that can be activated to

ensure zero hold times, minimum clock-to-output times, input IOE

register-to-logic array register transfers, or logic array-to-output IOE

register transfers.

Altera Corporation

43

APEX II Programmable Logic Device Family Data Sheet

A path in which a pin directly drives a register may require the delay to

ensure zero hold time, whereas a path in which a pin drives a register

through combinatorial logic may not require the delay. Programmable

delays exist for decreasing input pin to logic array and IOE input register

delays. The Quartus II Compiler can program these delays automatically

to minimize setup time while providing a zero hold time. Delays are also

programmable for increasing the register to pin delays for output and/or

output enable registers. A programmable delay exists for increasing the

t

delay to the output pin, which is required for ZBT interfaces. Table 8

ZX

shows the programmable delays for APEX II devices.

Table 8. APEX II Programmable Delay Chain

Programmable Delays

Quartus II Logic Option

Input pin to logic array delay (1)

Input pin to input register delay

Output propagation delay

Decrease input delay to internal cells

Decrease input delay to input register

Increase delay to output pin

Output enable register t delay

Increase delay to output enable pin

CO

Output t delay

Increase t delay to output pin

ZX

Output clock enable delay

Input clock enable delay

Increase output clock enable delay

Increase input clock enable delay

Decrease input delay to output register

Logic array to output register delay

Note to Table 8:

(1) This delay has four settings: off and three levels of delay.

The IOE registers in APEX II devices share the same source for clear or

preset. The designer can program preset and clear for each individual

IOE. The registers can be programmed to power up high or low after

configuration is complete. If programmed to power up low, an

asynchronous clear can control the registers. If programmed to power up

high, an asynchronous preset can control the registers. This feature

prevents the inadvertent activation of another device’s active-low input

upon power-up. If one register in an IOE uses a preset or clear signal then

all registers in the IOE must use that preset or clear signal.

Double Data Rate I/O

APEX II devices have six-register IOEs which support DDR interfacing by

clocking data on both positive and negative clock edges. The IOEs in

APEX II devices support DDR inputs, DDR outputs, and bidirectional

DDR modes.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

When using the IOE for DDR inputs, the two input registers are used to

clock double rate input data on alternating edges. An input latch is also

used within the IOE for DDR input acquisition. The latch holds the data

that is present during the clock high times. This allows both bits of data to

be synchronous to the same clock edge (either rising or falling). Figure 29

shows an IOE configured for DDR input.

Figure 29. APEX II IOE in DDR Input I/O Conﬁguration

VCCIO

Column, Row

or Local

Interconnect

Eight

Dedicated

Clocks

Optional

PCI Clamp

12 Peripheral

Signals

VCCIO

Programmable

Pull-Up

Input Pin to Input

Register Delay

Input Register

D

Q

ENA

CLRN/PRN

Bus-Hold

Circuit

Input Clock

Enable Delay

Chip-Wide Reset

Input Register

Latch

D Q

D

Q

ENA

CLRN/PRN

When using the IOE for DDR outputs, the two output registers are

configured to clock two data paths from LEs on rising clock edges. These

register outputs are multiplexed by the clock to drive the output pin at a

×2 rate. One output register clocks the first bit out on the clock high time,

while the other output register clocks the second bit out on the clock low

time. Figure 30 shows the IOE configured for DDR output.

Altera Corporation

45

APEX II Programmable Logic Device Family Data Sheet

Figure 30. APEX II IOE in DDR Output I/O Conﬁguration

Column, Row

or Local

Interconnect

Eight

Dedicated

Clocks

12 Peripheral

Signals

OE Register

D

Q

Output

Delay

t

ZX

VCCIO

Optional

PCI Clamp

ENA

CLRN/PRN

Output Clock

Enable Delay

VCCIO

OE Register

Delay

t

CO

Programmable

Pull-Up

Chip-Wide Reset

OE Register

D

Q

Used for

DDR SDRAM

ENA

CLRN/PRN

Output Register

Logic Array

to Output

Output

Propagation

Delay

D

Q

Register Delay

clk

ENA

CLRN/PRN

Drive Strength Control

Open-Drain Output

Slew Control

Output Register

Logic Array

to Output

Register Delay

D

Q

Bus-Hold

Circuit

ENA

CLRN/PRN

The APEX II IOE operates in bidirectional DDR mode by combining the

DDR input and DDR output configurations.

APEX II I/O pins transfer data on a DDR bidirectional bus to support

DDR SDRAM at 167 MHz (334 Mbps). The negative-edge-clocked OE

register is used to hold the OE signal inactive until the falling edge of the

clock. This is done to meet DDR SDRAM timing requirements. QDR

SRAMs are also supported with DDR I/O pins on separate read and write

ports.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Zero Bus Turnaround SRAM Interface Support

In addition to DDR SDRAM support, APEX II device I/O pins also

support interfacing with ZBT SRAM devices at up to 200 MHz. ZBT

SRAM blocks are designed to eliminate dead bus cycles when turning a

bidirectional bus around between reads and writes, or writes and reads.

ZBT allows for 100% bus utilization because ZBT SRAM can be read or

written on every clock cycle.

To avoid bus contention, the output clock-to-low-impedance time (t

)

ZX

delay ensures that the t is greater than the clock-to-high-impedance

ZX

time (t ). Phase delay control of clocks to the OE/output and input

XZ

registers using two general-purpose PLLs enable the APEX II device to

meet ZBT t and t times.

CO

SU

Programmable Drive Strength

The output buffer for each APEX II device I/O pin has a programmable

drive strength control for certain I/O standards. The LVTTL standard has

several levels of drive strength that the user can control. SSTL-3 class I

and II, SSTL-2 class I and II, HSTL class I and II, and 3.3-V GTL+ support

a minimum setting. The minimum setting is the lowest drive strength that

guarantees the I /I of the standard. Using minimum settings

OH OL

provides signal slew rate control to reduce system noise and signal

overshoot. Table 9 shows the possible settings for the I/O standards with

drive strength control.

Altera Corporation

47

APEX II Programmable Logic Device Family Data Sheet

Table 9. Programmable Drive Strength

I/O Standard

I

/I Current Strength

OH OL

Setting

LVTTL (3.3 V)

4 mA

12 mA

24 mA

PCI

PCI-X

2 mA

LVTTL (2.5 V)

LVTTL (1.8 V)

LVTTL (1.5 V)

16 mA

2 mA

8mA

2 mA

12 mA

16 mA

24 mA

Minimum

SSTL-3 class I and II

SSTL-2 class I and II

HSTL class I and II

GTL+ (3.3 V)

Open-Drain Output

APEX II devices provide an optional open-drain (equivalent to an open-

collector) output for each I/O pin. This open-drain output enables the

device to provide system-level control signals (e.g., interrupt and write-

enable signals) that can be asserted by any of several devices.

Slew-Rate Control

The output buffer for each APEX II device I/O pin has a programmable

output slew rate control that can be configured for low-noise or high-

speed performance. A faster slew rate provides high-speed transitions for

high-performance systems. However, these fast transitions may introduce

noise transients into the system. A slow slew rate reduces system noise,

but adds a nominal delay to rising and falling edges. Each I/O pin has an

individual slew rate control, allowing the designer to specify the slew rate

on a pin-by-pin basis. The slew rate control affects both the rising and

falling edges.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Bus Hold

Each APEX II device I/O pin provides an optional bus-hold feature. When

this feature is enabled for an I/O pin, the bus-hold circuitry weakly holds

the signal at its last driven state. By holding the last driven state of the pin

until the next input signal is present, the bus-hold feature eliminates the

need to add external pull-up or pull-down resistors to hold a signal level

when the bus is tri-stated. The bus-hold circuitry also pulls undriven pins

away from the input threshold voltage where noise can cause unintended

high-frequency switching. This feature can be selected individually for

each I/O pin. The bus-hold output will drive no higher than V

to

CCIO

prevent overdriving signals. If the bus-hold feature is enabled, the

programmable pull-up option cannot be used. The bus-hold feature

should also be disabled if open-drain outputs are used with the GTL+ I/O

standard.

The bus-hold circuitry weakly pulls the signal level to the last driven state

through a resistor with a nominal resistance (R ) of approximately 7 kΩ.

BH

Table 44 on page 76 gives specific sustaining current that will be driven

through this resistor and overdrive current that will identify the next

driven input level. This information is provided for each V

level.

voltage

CCIO

The bus-hold circuitry is active only after configuration. When going into

user mode, the bus-hold circuit captures the value on the pin present at

the end of configuration.

Programmable Pull-Up Resistor

Each APEX II device I/O pin provides an optional programmable pull-up

resistor during user mode. When this feature is enabled for an I/O pin, the

pull-up resistor (typically 25 kΩ) weakly holds the output to the V

CCIO

level of the bank that the output pin resides in.

Dedicated Fast I/O Pins

APEX II devices incorporate dedicated bidirectional pins for signals with

high internal fanout, such as PCI control signals. These pins are called

dedicated fast I/O pins (FAST1, FAST2, FAST3, and FAST4) and can drive

the four global fast lines throughout the device, ideal for fast clock, clock

enable, preset, clear, or high fanout logic signal distribution. The

dedicated fast I/O pins have one output register and one OE register, but

they do not have input registers. The dedicated fast lines can also be

driven by a LE local interconnect to generate internal global signals.

Altera Corporation

49

APEX II Programmable Logic Device Family Data Sheet

Advanced I/O Standard Support

APEX II device IOEs support the following I/O standards:

ꢀ

LVTTL

LVCMOS

1.5-V

1.8-V

2.5-V

3.3-V PCI

3.3-V PCI-X

3.3-V AGP (1×, 2×)

LVDS

LVPECL

PCML

HyperTransport

GTL+

HSTL class I and II

SSTL-3 class I and II

SSTL-2 class I and II

CTT

Differential HSTL

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 10 describes the I/O standards supported by APEX II devices.

Table 10. APEX II Supported I/O Standards

I/O Standard

Type

Input

Reference

Voltage (V

(V)

Output

Supply

Voltage

Board

Termination

Voltage

)

REF

(V

) (V)

(V ) (V)

CCIO

3.3

2.5

1.8

1.5

3.3

2.5

1.5

N/A

1.5

2.5

3.3

TT

LVTTL

Single-ended

Differential

N/A

1.0

N/A

1.5

LVCMOS

2.5 V

1.8 V

1.5 V

3.3-V PCI

3.3-V PCI-X

LVDS

LVPECL

Differential

PCML

Differential

HyperTransport

Differential HSTL (1)

GTL+

Differential

Voltage referenced

HSTL class I and II

SSTL-2 class I and II

SSTL-3 class I and II

AGP (1× and 2×)

CTT

0.75

1.25

1.5

0.75

1.25

1.5

1.32

1.5

N/A

1.5

Note to Table 10:

(1) Differential HSTL is only supported on the eight dedicated global clock pins and four dedicated high-speed PLL

clock pins.

For more information on I/O standards supported by APEX II devices,

see Application Note 117 (Using Selectable I/O Standards in Altera Devices).

f

APEX II devices contain eight I/O banks, as shown in Figure 31. Two

blocks within the right I/O banks contain circuitry to support high-speed

True-LVDS, LVPECL, PCML, and HyperTransport inputs, and another

two blocks within the left I/O banks support high-speed True-LVDS,

LVPECL, PCML, and HyperTransport outputs. All other standards are

supported by all I/O banks.

Altera Corporation

51

APEX II Programmable Logic Device Family Data Sheet

Figure 31. APEX II I/O Banks

I/O banks 1 and 2 support Flexible-LVDS,

HyperTransport, and LVPECL inputs, and

regular I/O pin standards.

I/O Bank 1

I/O Bank 2

True-LVDS, LVPECL,

PCML, and HyperTransport

Output Block (2)

True-LVDS, LVPECL,

PCML, and HyperTransport

Input Block (2)

Regular I/O Pins Support

ꢀ 3.3-V, 2.5-V, 1.8-V, and

1.5-V LVTTL

ꢀ 3.3-V PCI and PCI-X

ꢀ GTL+

(1)

I/O Bank 8

I/O Bank 3

ꢀ AGP

ꢀ SSTL-2 Class I and II

ꢀ SSTL-3 Class I and II

ꢀ HSTL Class I and II

ꢀ CTT

I/O Bank 7

I/O Bank 4

(1)

Individual

Power Bus

True-LVDS, LVPECL,

PCML, and HyperTransport

Output Block (2)

True-LVDS, LVPECL,

PCML, and HyperTransport

Input Block (2)

I/O Bank 6

I/O Bank 5

I/O banks 5 and 6 support Flexible-LVDS and

HyperTransport outputs and regular I/O pin standards.

Notes to Figure 31:

(1) For more information on placing I/O pins within LVDS blocks, refer to the “High-Speed Interface Pin Location”

section in Application Note 166 (Using High-Speed I/O Standards in APEX II Devices).

(2) If the True-LVDS pins or the Flexible-LVDS pins are not used for high-speed differential signalling, they can

support all of the I/O standards and can be used as input, output, or bidirectional pins with V_CCIOset to 3.3 V, 2.5 V,

1.8 V, or 1.5 V. However, True-LVDS pins do not support the HSTL Class II output.

Each I/O bank has its own VCCIOpins. A single device can support 1.5-V,

1.8-V, 2.5-V, and 3.3-V interfaces; each bank can support a different

standard independently. Each bank can also use a separate V

level to

REF

support any one of the terminated standards (such as SSTL-3)

independently.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Each bank can support multiple standards with the same V

for input

CCIO

and output pins. Each bank can support one voltage-referenced I/O

standard, but it can support multiple I/O standards with the same V

CCIO

voltage level. For example, when V

is 3.3 V, a bank can support

CCIO

LVTTL, LVCMOS, 3.3-V PCI, and SSTL-3 for inputs and outputs. When

the True-LVDS banks are not used for LVDS I/O pins, they support all of

the other I/O standards except HSTL Class II output.

True-LVDS Interface

APEX II devices contain dedicated circuitry for supporting differential

standards at speeds up to 1.0 Gbps. APEX II devices have dedicated

differential buffers and circuitry to support LVDS, LVPECL,

HyperTransport, and PCML I/O standards. Four dedicated high-speed

PLLs (separate from the general-purpose PLLs) multiply reference clocks

and drive high-speed differential serializer/deserializer channels. In

addition, CDS circuitry at each receiver channel corrects any fixed clock-

to-data skew. All APEX II devices support 36 input channels, 36 output

channels, two dedicated receiver PLLs, and two dedicated transmitter

PLLs.

The True-LVDS circuitry supports the following standards and

applications:

ꢀ

RapidIO

POS-PHY Level 4

Utopia IV

HyperTransport

APEX II devices support source-synchronous interfacing with LVDS,

LVPECL,PCML, or HyperTransport signaling at up to 1 Gbps. Serial

channels are transmitted and received along with a low-speed clock. The

receiving device then multiplies the clock by a factor of 1, 2, or 4 to 10. The

serialization/deserialization rate can be any number from 1, 2, or 4 to 10

and does not have to equal the clock multiplication value.

For example, an 840-Mbps LVDS channel can be received along with an

84-MHz clock. The 84-MHz clock is multiplied by 10 to drive the serial

shift register, but the register can be clocked out in parallel at 8- or 10-bits

wide at 84 or 105 MHz. See Figures 32 and 33.

Altera Corporation

53

APEX II Programmable Logic Device Family Data Sheet

Figure 32. True-LVDS Receiver Diagram

Notes (1). (2)

J Bits Wide

Deserializer

Data to

LEs

+

–

Receiver

Channel

×W

RX_CLK1 (3)

Receiver

PLL1

W

J

×

Receiver Channel 1

Receiver Channel 2

+

–

Receiver

Channel

+

–

Receiver

Channel

Receiver Channel 18

To Global

Clock

Notes to Figure 32:

(1) Two sets of 18 receiver channels are located in each APEX II device. Each set of 18 channels has one receiver PLL.

(2) W = 1, 2, 4 to 10

J = 1, 2, 4 to 10

W does not have to equal J. When J = 1 or 2, the deserializer is bypassed. When J = 2, DDR I/O registers are used.

(3) These clock pins drive receiver PLLs only. They do not drive directly to the logic array. However, the receiver PLL

can drive the logic array via a global clock line.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 33. True-LVDS Transmitter Diagram

Notes (1), (2)

J Bits Wide

Serializer

Data from

LEs

Transmitter

Channel

×W

Global Clock

from Receiver

or System Clock

Transmitter

W

J

PLL1

×

Transmitter Channel 1

Transmitter Channel 2

Transmitter Channel 18

TXOUTCLOCK1

Transmitter

Channel

Transmitter

Channel

Notes to Figure 33:

(1) Two sets of 18 transmitter channels are located in each APEX II device. Each set of 18 channels has one transmitter

PLL.

(2) W = 1, 2, 4 to 10

J = 1, 2, 4 to 10

W does not have to equal J. When J = 1 or 2, the deserializer is bypassed. When J = 2, DDR I/O registers are used.

Clock-Data Synchronization

In addition to dedicated serial-to-parallel converters, APEX II True-LVDS

circuitry contains CDS circuitry in every receiver channel. The CDS

feature can be turned on or off independently for each receiver channel.

There are two modes for the CDS circuitry: single-bit mode, which

corrects a fixed clock-to-data skew of up to 50% of the data bit period,

and multi-bit mode, which corrects any fixed clock-to-data skew.

Altera Corporation

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APEX II Programmable Logic Device Family Data Sheet

Single-Bit Mode

Single-bit CDS corrects a fixed clock-to-data skew of up to 50% of the

data bit period, which allows receiver input skew margin (RSKM) to

increase by 50% of the data period. To use single-bit CDS, the

deserialization factor, J, must be equal to the multiplication factor, W. The

combination of allowable W/J factors and the associated CDS training

patterns automatically determine byte alignment (see Table 11).

Table 11. Single-Bit CDS Training Patterns

W/J Factor

Single-Bit CDS Pattern

10

9

0000011111

000001111

00001111

0000111

000111

8

7

6

5

00011

4

0011

Multi-Bit Mode

Multi-bit CDS corrects any fixed clock-to-data skew. This feature enables

flexible board topologies, such as an N:1 topology (see Figure 34), a switch

topology, or a matrix topology. Multi-bit CDS corrects for the skews

inherent with these topologies, making them possible to use.

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Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 34. Multi-Bit CDS Supports N:1 Topology

Clock

APEX II

Device

Data

APEX II

Device

APEX II

Device

APEX II

Device

Clock

When using multi-bit CDS, the J and W factors do not need to be the same

value. The byte boundary cannot be distinguished with multi-bit CDS

patterns (see Table 12). Therefore, the byte must be aligned using internal

logic. Table 12 shows the possible training patterns for multi-bit CDS.

Either pattern can be used.

Table 12. Multi-Bit CDS Patterns

W Factor

J Factor

Multi-Bit CDS Pattern

1, 2, 4 to 10

4 to 10

3 × J-bits of 010101pattern

3 × J-bits of 101010pattern

Pre-Programmed CDS

When the fixed clock-to-data skew is known, CDS can be pre-

programmed into the device during configuration. If CDS is pre-

programmed into the device, the training patterns do not need to be

transmitted to the receiver channels. The resolution of each pre-

programmed setting is 25% of the data period, to compensate for skew up

to 50% of the data period.

Altera Corporation

57

APEX II Programmable Logic Device Family Data Sheet

Pre-programmed CDS may also be used to resolve clock-to-data skew

greater than 50% of the bit period. However, internal logic must be used

to implement the byte alignment circuitry for this operation.

Flexible-LVDS I/O Pins

A subset of pins in the top two I/O banks supports interfacing with

Flexible-LVDS, LVPECL, and HyperTransport inputs. These

Flexible-LVDS input pins include dedicated LVDS, LVPECL, and

HyperTransport input buffers. A subset of pins in the bottom two I/O

banks supports interfacing with Flexible-LVDS and HyperTransport

outputs. These Flexible-LVDS output pins include dedicated LVDS and

HyperTransport output buffers. The Flexible-LVDS pins do not require

any external components except for 100-Ω termination resistors on

receiver channels. These pins do not contain dedicated

serialization/deserialization circuitry; therefore, internal logic is used to

perform serialization/deserialization functions.

The EP2A15 and EP2A25 devices support 56 input and 56 output

Flexible-LVDS channels. The EP2A40 and larger devices support 88 input

and 88 output Flexible-LVDS channels. All APEX II devices support the

Flexible-LVDS interface up to 624 Mbps (DDR) per channel. Flexible-

LVDS pins along with the True-LVDS pins provide up to 182-Gbps total

device bandwidth.

The APEX II architecture supports the MultiVolt I/O interface feature,

which allows APEX II devices in all packages to interface with systems of

MultiVolt I/O

Interface

different supply voltages. The devices have one set of V pins for

CC

internal operation and input buffers (VCCINT), and another set for I/O

output drivers (VCCIO).

The APEX II VCCINTpins must always be connected to a 1.5-V power

supply. With a 1.5-V V

level, input pins are 1.5-V, 1.8-V, 2.5-V and

CCINT

3.3-V tolerant. The VCCIOpins can be connected to either a 1.5-V, 1.8-V,

2.5-V or 3.3-V power supply, depending on the output requirements. The

output levels are compatible with systems of the same voltage as the

power supply (i.e., when VCCIOpins are connected to a 1.5-V power

supply, the output levels are compatible with 1.5-V systems). When

VCCIOpins are connected to a 3.3-V power supply, the output high is 3.3 V

and is compatible with 3.3-V or 5.0-V systems.

58

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 13 summarizes APEX II MultiVolt I/O support.

Table 13. APEX II MultiVolt I/O Support

Note (1)

V

(V)

Input Signal

2.5 V

Output Signal

2.5 V

CCIO

1.5 V

1.8 V

3.3 V

5.0 V

1.5 V

1.8 V

3.3 V

5.0 V

1.5

1.8

2.5

3.3

v

v (2)

v (3)

v (4)

v (6)

v

v (2)

v (4)

v (6)

v

v (5)

v (6)

v

Notes to Table 13:

(1) The PCI clamping diode must be disabled to drive an input with voltages higher than V_CCIO

.

(2) These input levels are only allowed if the input standard is set to any V_REFstandard (i.e., SSTL-3, SSTL-2, HSTL,

GTL+, and AGP 2×). The V_REFstandard inputs are powered by V_CCINT. LVTTL, PCI, PCI-X, and AGP 1× standard

inputs are powered by V_CCIO. As a result, input levels below the V_CCIOsetting cannot drive these standards.

(3) When V_CCIO= 1.8 V, an APEX II device can drive a 1.5-V device with 1.8-V tolerant inputs.

(4) When V_CCIO= 2.5 V, an APEX II device can drive a 1.5-V or 1.8-V device with 2.5-V tolerant inputs.

(5) APEX II devices can be 5.0-V tolerant with the use of an external resistor.

(6) When V_CCIO= 3.3 V, an APEX II device can drive a 1.5-V, 1.8-V, or 2.5-V device with 3.3-V tolerant inputs.

Open-drain output pins with a pull-up resistor to the 5.0-V supply and a

series register to the I/O pin can drive 5.0-V CMOS input pins that require

a V of 3.5 V. When the pin is inactive, the trace will be pulled up to 5.0 V

IH

by the resistor. The open-drain pin will only drive low or tri-state; it will

never drive high. The rise time is dependent on the value of the pull-up

resistor and load impedance. The I current specification should be

OL

considered when selecting a pull-up resistor.

Because APEX II devices can be used in a mixed-voltage environment,

they have been designed specifically for any possible power-up sequence.

Power

Sequencing &

Hot Socketing

Therefore, the V

order.

and V

power supplies may be powered in any

CCIO

CCINT

Signals can be driven into APEX II devices before and during power-up

without damaging the device. In addition, APEX II devices do not drive

out during power-up. Once operating conditions are reached and the

device is configured, APEX II devices operate as specified by the user.

Altera Corporation

59

APEX II Programmable Logic Device Family Data Sheet

APEX II devices have ClockLock, ClockBoost, and ClockShift features,

General-

Purpose PLLs

which use four general-purpose PLLs (separate from the four dedicated

True-LVDS PLLs) to provide clock management and clock-frequency

synthesis. These PLLs allow designers to increase performance and

provide clock-frequency synthesis. The PLL reduces the clock delay

within a device. This reduction minimizes clock-to-output and setup

times while maintaining zero hold times. The PLLs, which provide

programmable multiplication, allow the designer to distribute a low-

speed clock and multiply that clock on-device. APEX II devices include a

high-speed clock tree: unlike ASICs, the user does not have to design and

optimize the clock tree. The PLLs work in conjunction with the APEX II

device’s high-speed clock to provide significant improvements in system

performance and bandwidth.

The PLLs in APEX II devices are enabled through the Quartus II software.

External devices are not required to use these features. Table 14 shows the

general-purpose PLL features for APEX II devices. Figure 35 shows an

APEX II general-purpose PLL.

Table 14. APEX II General-Purpose PLL Features

Number of PLLs

ClockBoost

Feature

Number of External

Clock Outputs

Number of

Feedback Inputs

4

m/(n × k, v)

8

2

Figure 35. APEX II General-Purpose PLL

Notes (1)

Phase

Comparator

Voltage-Controlled

Oscillator

inclock

n

Phase Shift

Circuitry

clock0

clock1

k

v

m

f

bin

Note to Figure 35:

(1) n represents the prescale divider for the PLL input. m represents the multiplier. k and v represent the different post

scale dividers for the two possible PLL outputs. m and k are integers that range from 1 to 160. n and v are integers

that range from 1 to 16.

60

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Advanced ClockBoost Multiplication & Division

APEX II PLLs include circuitry that provides clock synthesis for eight

internal outputs and two external outputs using m/(n × output divider)

scaling. When a PLL is locked, the locked output clock aligns to the rising

edge of the input clock. The closed loop equation for Figure 35 gives an

output frequency f

= (m/(n × k))f and f

= (m/(n × v))f . These

clock0

IN

clock1 IN

equations allow the multiplication or division of clocks by a

programmable number. The Quartus II software automatically chooses

the appropriate scaling factors according to the frequency, multiplication,

and division values entered.

A single PLL in an APEX II device allows for multiple user-defined

multiplication and division ratios that are not possible even with multiple

delay-locked loops (DLLs). For example, if a frequency scaling factor of

3.75 is needed for a given input clock, a multiplication factor of 15 and a

division factor of 4 can be entered. This advanced multiplication scaling

can be performed with a single PLL, making it unnecessary to cascade

PLL outputs.

External Clock Outputs

APEX II devices have two low-jitter external clocks available for external

clock sources. Other devices on the board can use these outputs as clock

sources.

There are three modes for external clock outputs.

ꢀ

Zero Delay Buffer: The external clock output pin is phase aligned

with the clock input pin for zero delay. Multiplication,

programmable phase shift, and time delay shift are not allowed in

this configuration. The MegaWizard interface for altclklock

should be used to verify possible clock settings.

External Feedback: The external feedback input pin is phase aligned

with clock input pin. By aligning these clocks, you can actively

remove clock delay and skew between devices. This mode has the

same restrictions as zero delay buffer mode.

Normal Mode: The external clock output pin will have phase delay

relative to the clock input pin. If an internal clock is used in this mode,

the IOE register clock will be phase aligned to the input clock pin.

Multiplication is allowed with the normal mode.

ꢀ

Altera Corporation

61

APEX II Programmable Logic Device Family Data Sheet

ClockShift Circuitry

General-purpose PLLs in APEX II devices have ClockShift circuitry that

provides programmable phase shift. Users can enter a phase shift (in

degrees or time units) that affects all PLL outputs. Phase shifts of 90˚, 180˚,

and 270˚ can be implemented exactly. Other values of phase shifting, or

delay shifting in time units, are allowed with a resolution range of 0.5 ns

to 1.0 ns. This resolution varies with frequency input and the user-entered

multiplication and division factors. The phase shift ability is only possible

on a multiplied or divided clock if the input and output frequency have

an integer multiple relationship (i.e., f /f

or f

/f must be an

IN OUT

OUT IN

integer).

Clock Enable Signal

APEX II PLLs have a CLKLK_ENApin for enabling/disabling all device

PLLs. When the CLKLK_ENApin is high, the PLL drives a clock to all its

output ports. When the CLKLK_ENApin is low, the clock0, clock1, and

extclockports are driven by GND and all of the PLLs go out of lock.

When the CLKLK_ENApin goes high again, the PLL relocks.

The individual enable port for each PLL is programmable. If more than

one PLL is instantiated, each one does not have to use the clock enable. To

enable/disable the device PLLs with the CLKLK_ENApin, the inclocken

port on the altclklockinstance must be connected to the CLKLK_ENA

input pin.

Lock Signals

The APEX II device PLL circuits support individual LOCKsignals. The

LOCKsignal drives high when the PLL has locked onto the input clock.

LOCKremains high as long as the input remains within specification. It

will go low if the input is out of specification. A LOCKpin is optional for

each PLL used in the APEX II devices; when not used, they are I/O pins.

This signal is not available internally; if it is used in the logic array, it must

be fed back in with an input pin.

APEX II devices include device enhancements to support the SignalTap

embedded logic analyzer. By including this circuitry, the APEX II device

provides the ability to monitor design operation over a period of time

through the IEEE Std. 1149.1 (JTAG) circuitry; a designer can analyze

internal logic at speed without bringing internal signals to the I/O pins.

This feature is particularly important for advanced packages such as

FineLine BGA packages because adding a connection to a pin during the

debugging process can be difficult after a board is designed and

manufactured.

SignalTap

Embedded

Logic Analyzer

62

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

All APEX II devices provide JTAG BST circuitry that complies with the

IEEE Std. 1149.1-1990 specification. JTAG boundary-scan testing can be

performed before or after configuration, but not during configuration.

APEX II devices can also use the JTAG port for configuration with the

Quartus II software or with hardware using either Jam^TMStandard Test

and Programming Language (STAPL) Files (.jam) or Jam Byte-Code Files

(.jbc). Finally, APEX II devices use the JTAG port to monitor the logic

operation of the device with the SignalTap embedded logic analyzer.

APEX II devices support the JTAG instructions shown in Table 15.

IEEE Std.

1149.1 (JTAG)

Boundary-Scan

Support

Table 15. APEX II JTAG Instructions

JTAG Instruction

Description

SAMPLE/PRELOAD Allows a snapshot of signals at the device pins to be captured and examined during

normal device operation, and permits an initial data pattern to be output at the device pins.

Also used by the SignalTap embedded logic analyzer.

EXTEST (1)

Allows the external circuitry and board-level interconnections to be tested by forcing a test

pattern at the output pins and capturing test results at the input pins.

BYPASS

Places the 1-bit bypass register between the TDIand TDOpins, which allows the BST data

to pass synchronously through selected devices to adjacent devices during normal device

operation.

USERCODE

IDCODE

Selects the 32-bit USERCODE register and places it between the TDIand TDOpins,

allowing the USERCODE to be serially shifted out of TDO.

Selects the IDCODE register and places it between TDIand TDO, allowing the IDCODE

to be serially shifted out of TDO.

HIGHZ (1)

Places the 1-bit bypass register between the TDIand TDOpins, which allows the BST data

to pass synchronously through selected devices to adjacent devices during normal device

operation, while tri-stating all of the I/O pins.

CLAMP (1)

Places the 1-bit bypass register between the TDIand TDOpins, which allows the BST data

to pass synchronously through selected devices to adjacent devices during normal device

operation while holding I/O pins to a state defined by the data in the boundary-scan

register.

ICR instructions

Used when configuring an APEX II device via the JTAG port with a MasterBlaster^TMor

ByteBlasterMV^TMdownload cable, or when using a Jam File or Jam Byte-Code File via an

embedded processor.

SignalTap

Monitors internal device operation with the SignalTap embedded logic analyzer.

instructions

Note to Table 15:

(1) Bus hold and weak pull-up features override the high-impedance state of HIGHZ, CLAMP, and EXTEST.

The APEX II device instruction register length is 10 bits. The APEX II

device USERCODE register length is 32 bits. Tables 16 and 17 show the

boundary-scan register length and device IDCODE information for

APEX II devices.

Altera Corporation

63

APEX II Programmable Logic Device Family Data Sheet

Table 16. APEX II JTAG Boundary-Scan Register Length

Device

Boundary-Scan Register Length

EP2A15

EP2A25

EP2A40

EP2A70

1,524

1,884

2,328

3,228

Table 17. 32-Bit APEX II Device IDCODE

Device

IDCODE (32 Bits) (1)

Version

(4 Bits)

Part Number (16 Bits)

Manufacturer

Identity (11 Bits)

1 (1 Bit)

(2)

EP2A15

EP2A25

EP2A40

EP2A70

0000

1100 0100 0000 0000

1100 0110 0000 0000

1101 0000 0000 0000

1110 0000 0000 0000

000 0110 1110

1

Notes to Tables 16 and 17:

(1) The most significant bit (MSB) is on the left.

(2) The IDCODE’s least significant bit (LSB) is always 1.

Figure 36 shows the timing requirements for the JTAG signals.

64

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 36. APEX II JTAG Waveforms

TMS

TDI

t_JCP

t_JCH

t _JCL

t_JPH

t_JPSU

TCK

TDO

t_JPXZ

t_JPZX

t_JPCO

t_JSSU

t_JSH

Signal

to Be

Captured

t_JSCO

t_JSZX

t_JSXZ

Signal

to Be

Driven

Table 18 shows the JTAG timing parameters and values for APEX II

devices.

Table 18. APEX II JTAG Timing Parameters & Values

Symbol

Parameter

Min Max Unit

t

TCKclock period

TCKclock high time

TCKclock low time

100

50

20

45

ns

JCP

JCH

JCL

JTAG port setup time

JPSU

JPH

JTAG port hold time

JTAG port clock to output

25

JPCO

JPZX

JPXZ

JSSU

JSH

JTAG port high impedance to valid output

JTAG port valid output to high impedance

Capture register setup time

20

45

Capture register hold time

Update register clock to output

Update register high impedance to valid output

Update register valid output to high impedance

35

JSCO

JSZX

JSXZ

Altera Corporation

65

APEX II Programmable Logic Device Family Data Sheet

For more information, see the following documents:

f

ꢀ

Application Note 39 (IEEE Std. 1149.1 (JTAG) Boundary-Scan Testing in

Altera Devices)

Jam Programming & Test Language Specification

Each APEX II device is functionally tested. Complete testing of each

configurable static random access memory (SRAM) bit and all logic

functionality ensures 100% yield. AC test measurements for APEX II

devices are made under conditions equivalent to those shown in

Figure 37. Multiple test patterns can be used to configure devices during

all stages of the production flow. AC test criteria include:

Generic Testing

ꢀ

Power supply transients can affect AC measurements.

Simultaneous transitions of multiple outputs should be avoided for

accurate measurement.

ꢀ

Threshold tests must not be performed under AC conditions.

Large-amplitude, fast-ground-current transients normally occur as

the device outputs discharge the load capacitances. When these

transients flow through the parasitic inductance between the device

ground pin and the test system ground, significant reductions in

observable noise immunity can result.

Figure 37. APEX II AC Test Conditions

Device

Output

To Test

System

C1 (includes

jig capacitance)

Device input

rise and fall

times < 3 ns

APEX II devices are offered in both commercial and industrial grades.

However, industrial-grade devices may have limited speed-grade

availability.

Operating

Conditions

66

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Tables 19 through 44 provide information on absolute maximum ratings,

recommended operating conditions, and DC operating conditions for

1.5-V APEX II devices.

Table 19. APEX II Device Absolute Maximum Ratings

Notes (1), (2)

Symbol

Parameter

Conditions

Minimum

Maximum

Unit

V

Supply voltage

With respect to ground (3)

–0.5

–25

–65

3.6

4.6

25

V

CCINT

CCIO

I

DC input voltage

V

I

DC output current, per pin

Storage temperature

Ambient temperature

Junction temperature

mA

° C

OUT

T

No bias

150

135

STG

AMB

J

Under bias

BGA packages under bias

Table 20. APEX II Device Recommended Operating Conditions

Symbol

Parameter

Conditions

Minimum

Maximum

Unit

V

Supply voltage for internal logic (4)

and input buffers

1.425

1.575

V

CCINT

Supply voltage for output buffers, (4), (5)

3.3-V operation

3.00 (3.135)

2.375

3.60 (3.465)

2.625

1.89

V

CCIO

Supply voltage for output buffers, (4)

2.5-V operation

Supply voltage for output buffers, (4)

1.8-V operation

1.71

Supply voltage for output buffers, (4)

1.4

1.6

1.5-V operation

V

Input voltage

(3), (6)

–0.5

0

4.1

V

I

Output voltage

V

CCIO

O

J

T

Operating junction temperature For commercial

use

0

85

° C

For industrial use

–40

100

40

° C

ns

t

Input rise time

Input fall time

R

40

F

Altera Corporation

67

APEX II Programmable Logic Device Family Data Sheet

Table 21. APEX II Device DC Operating Conditions

Note (7)

Minimum

Symbol

Parameter

Conditions

Typical

Maximum

Unit

I

Input pin leakage

current

V = V

to 0 V (8)

–10

10

µA

I

CCIO

Tri-stated I/O pin

leakage current

V

= V to 0 V (8)

CCIO

–10

10

µA

OZ

O

V

supply current V = ground, no load,

10

5

mA

CC0

CC

I

(standby) (All ESBs no toggling inputs, -7

in power-down

mode)

speed grade

V = ground, no load,

mA

I

no toggling inputs, -8,

-9 speed grades

R

Value of I/O pin pull- V

= 3.0 V (9)

20

30

60

50

80

kΩ

CONF

CCIO

up resistor before

and during

V

= 2.375 V (9)

= 1.71 V (9)

150

configuration

Table 22. LVTTL Specifications

Symbol

Parameter

Conditions

Minimum

Maximum

Units

V

Output supply voltage

High-level input voltage

Low-level input voltage

Input pin leakage current

High-level output voltage

Low-level output voltage

3.0

1.7

–0.5

–5

3.6

4.1

0.7

5

V

CCIO

IH

V

IL

I

V

I

= 0 V or V

CCIO

µA

V

I

IN

V

= –4 to –24 mA (10)

= 4 to 24 mA (10)

2.4

OH

OL

OH

OL

I

0.45

V

Table 23. LVCMOS Specifications

Symbol

Parameter

Conditions

Minimum

Maximum

Units

V

Output supply voltage

High-level input voltage

Low-level input voltage

Input pin leakage current

High-level output voltage

3.0

1.7

3.6

4.1

0.7

10

V

CCIO

IH

–0.5

–10

V

IL

I

V

= 0 V or V

CCIO

µA

V

I

IN

V

= 3.0,

V

– 0.2

OH

OL

CCIO

I

= –0.1 mA

OH

V

Low-level output voltage

V

= 3.0,

0.2

V

CCIO

I

= 0.1 mA

OL

68

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 24. 2.5-V I/O Specifications

Note (10)

Symbol

Parameter

Conditions

Minimum

Maximum

Units

V

Output supply voltage

High-level input voltage

Low-level input voltage

Input pin leakage current

High-level output voltage

2.375

1.7

2.625

4.1

V

CCIO

IH

–0.5

–10

2.1

0.7

V

IL

I

V

= 0 V or V

CCIO

10

µA

V

I

IN

OH

OL

V

I

= –0.1 mA

= –1 mA

OH

OL

2.0

V

= –2 to –16 mA

= 0.1 mA

1.7

V

Low-level output voltage

0.2

0.4

0.7

V

= 1 mA

V

OH

= 2 to 16 mA

V

Table 25. 1.8-V I/O Specifications

Symbol

Parameter

Conditions

Minimum

Maximum

Units

V

Output supply voltage

High-level input voltage

Low-level input voltage

Input pin leakage current

High-level output voltage

Low-level output voltage

1.65

1.95

4.1

V

CCIO

IH

0.65 × V

CCIO

–0.5

–10

0.35 × V

V

IL

CCIO

I

V

I

= 0 V or V

CCIO

10

µA

V

I

IN

V

= –2 to –8 mA (10)

= 2 to 8 mA (10)

V

– 0.45

OH

OL

CCIO

I

0.45

V

OL

Table 26. 1.5-V I/O Specifications

Symbol

Parameter

Conditions

Minimum

Maximum

Units

V

Output supply voltage

High-level input voltage

Low-level input voltage

Input pin leakage current

High-level output voltage

Low-level output voltage

1.4

1.6

4.1

V

CCIO

IH

0.65 × V

CCIO

–0.5

–10

0.35 × V

V

IL

CCIO

I

V

I

= 0 V or V

CCIO

10

µA

V

I

IN

V

= –2 mA (10)

= 2 mA (10)

0.75 × V

CCIO

OH

OL

I

0.25 × V

V

OL

CCIO

Altera Corporation

69

APEX II Programmable Logic Device Family Data Sheet

Table 27. 3.3-V LVDS I/O Specifications

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

I/O supply voltage

3.135

250

3.3

3.465

450

50

V

CCIO

OD

Differential output voltage

R

= 100 Ω

mV

L

∆ V

Change in V between

R = 100 Ω

L

OD

high and low

V

Output offset voltage

R = 100 Ω

1.125

1.25

1.375

50

V

OS

L

∆ V

Change in V between

R

= 100 Ω

mV

OS

L

high and low

V

Differential input threshold

V

= 1.2 V

–100

100

2.4

mV

V

TH

IN

CM

Receiver input voltage

range

0.0

R

Receiver differential input

resistor (external to

APEX II devices)

90

100

110

Ω

L

Table 28. PCML Specifications

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

I/O supply voltage

3.135

3.3

3.465

V

CCIO

IL

Low-level input voltage

V

–

CCIO

0.3

V

High-level input voltage

Low-level output voltage

V

IH

CCIO

V

–

V

–

OL

CCIO

0.3

0.6

V

High-level output voltage

V

OH

CCIO

0.3

V

Output termination voltage

Differential output voltage

Rise time (20 to 80%)

Fall time (20 to 80%)

Output load

V

mV

ps

Ω

T

CCIO

300

85

450

600

325

OD

t

R

85

F

R

100

50

O

L

Receiver differential input

resistor

45

55

Ω

70

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 29. LVPECL Specifications

Note (11)

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

I/O supply voltage

3.135

800

3.3

3.465

2,000

V

CCIO

IL

Low-level input voltage

High-level input voltage

Low-level output voltage

High-level output voltage

Differential input voltage

mV

ps

2,100

1,450

2,275

100

V

CCIO

IH

1,650

2,420

2,500

970

OL

OH

ID

600

800

Differential output voltage

Rise time (20 to 80%)

Fall time (20 to 80%)

625

OD

t

85

325

R

85

325

ps

F

Table 30. HyperTransport Specifications

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

I/O supply voltage

2.375

380

2.5

600

2.625

820

V

CCIO

OD

Differential output voltage

mV

Output common mode

voltage

R

= 100 Ω

TT

500

700

OCM

V

Differential input voltage

300

450

600

900

750

mV

ID

Input common mode

voltage

ICM

R

Receiver differential input

resistor

90

100

110

Ω

L

Table 31. 3.3-V PCI Specifications

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

Output supply voltage

High-level input voltage

3.0

3.3

3.6

V

CCIO

IH

0.5 ×

V

+

CCIO

V

0.5

CCIO

V

Low-level input voltage

–0.5

0.3 ×

V

IL

V

CCIO

I

Input pin leakage current

High-level output voltage

0 < V < V

CCIO

–10

10

µA

I

IN

V

I

= –500 µA

0.9 ×

V

OH

OL

OUT

V

CCIO

V

Low-level output voltage

I

= 1,500 µA

0.1 ×

V

OUT

V

CCIO

Altera Corporation

71

APEX II Programmable Logic Device Family Data Sheet

Table 32. PCI-X Specifications

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

Output supply voltage

High-level input voltage

3.0

3.6

V

CCIO

IH

0.5 ×

V

+

CCIO

V

0.5

CCIO

V

Low-level input voltage

Input pull-up voltage

–0.5

0.35 ×

V

IL

V

CCIO

V

0.7 ×

IPU

V

CCIO

I

Input leakage current

0 < V < V

CCIO

–10

10

µA

IL

IN

V

High-level output voltage

I

= –500 µA

0.9 ×

V

OH

OUT

V

CCIO

V

Low-level output voltage

Pin inductance

I

= 1,500 µA

0.1 ×

V

OL

OUT

V

CCIO

L

15

nH

Table 33. GTL+ I/O Specifications

Symbol

Parameter

Conditions

Minimum Typical Maximum Units

V

Termination voltage

Reference voltage

1.35

0.88

1.5

1.0

1.65

1.12

V

TT

REF

IH

High-level input voltage

Low-level input voltage

Low-level output voltage

V

+ 0.1

REF

V

– 0.1

REF

IL

I

= 36 mA (10)

0.65

OL

Table 34. SSTL-2 Class I Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

Termination voltage

2.375

2.5

2.625

V

CCIO

TT

V

– 0.04

V

+ 0.04

REF

Reference voltage

1.15

1.25

1.35

3.0

– 0.18

REF

IH

High-level input voltage

Low-level input voltage

High-level output voltage

V

+ 0.18

REF

–0.3

V + 0.57

TT

V

IL

REF

I

= –7.6 mA

OH

(10)

V

Low-level output voltage

I

= 7.6 mA (10)

V – 0.57

TT

V

OL

72

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 35. SSTL-2 Class II Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

Termination voltage

2.3

2.5

2.7

V

CCIO

TT

V

– 0.04

V

+ 0.04

REF

Reference voltage

1.15

1.25

1.35

V + 0.3

CCIO

REF

IH

High-level input voltage

Low-level input voltage

High-level output voltage

V

+ 0.18

REF

–0.3

V + 0.76

TT

V

– 0.18

IL

REF

I

= –15.2 mA

OH

(10)

V

Low-level output voltage

I

= 15.2 mA

V

TT

– 0.76

V

OL

(10)

Table 36. SSTL-3 Class I Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

Termination voltage

3.0

3.3

3.6

V

CCIO

TT

V

– 0.05

V

+ 0.05

REF

Reference voltage

1.3

+ 0.2

1.5

1.7

REF

IH

High-level input voltage

Low-level input voltage

High-level output voltage

Low-level output voltage

V

+ 0.3

CCIO

REF

–0.3

V + 0.6

TT

V

– 0.2

REF

IL

I

= –8 mA (10)

OH

OL

OH

= 8 mA (10)

V

– 0.6

OL

TT

Table 37. SSTL-3 Class II Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

Termination voltage

3.0

3.3

3.6

V

CCIO

TT

V

– 0.05

V

+ 0.05

REF

Reference voltage

1.3

+ 0.2

1.5

1.7

REF

IH

High-level input voltage

Low-level input voltage

High-level output voltage

V

+ 0.3

CCIO

REF

–0.3

V + 0.8

TT

V

– 0.2

REF

IL

I

= –16 mA

OH

(10)

V

Low-level output voltage

I

= 16 mA (10)

V – 0.8

TT

V

OL

Altera Corporation

73

APEX II Programmable Logic Device Family Data Sheet

Table 38. 3.3-V AGP 2× Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

Reference voltage

3.15

3.3

3.45

V

CCIO

REF

IH

0.39 × V

0.41 × V

CCIO

High-level input voltage

0.5 × V

V

+ 0.5

CCIO

(12)

V

Low-level input voltage

0.3 × V

V

IL

CCIO

(12)

V

High-level output voltage

Low-level output voltage

Input pin leakage current

I

= –20 µA

= 20 µA

0.9 × V

3.6

V

OH

OUT

CCIO

0.1 × V

OL

CCIO

I

0 < V < V

CCIO

–10

10

µA

I

IN

Table 39. 3.3-V AGP 1× Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

3.15

3.3

3.45

V

CCIO

IH

High-level input voltage

0.5 × V

V

+ 0.5

CCIO

(12)

V

Low-level input voltage

0.3 × V

V

IL

CCIO

(12)

V

High-level output voltage

Low-level output voltage

Input pin leakage current

I

= –20 µA

= 20 µA

0.9 × V

3.6

V

OH

OUT

CCIO

0.1 × V

OL

CCIO

I

0 < V < V

CCIO

–10

10

µA

I

IN

Table 40. 1.5-V HSTL Class I Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

1.4

0.68

0.7

1.5

1.6

0.9

0.8

V

CCIO

REF

TT

Input reference voltage

Termination voltage

0.75

(DC)

(AC)

DC high-level input voltage

DC low-level input voltage

AC high-level input voltage

AC low-level input voltage

High-level output voltage

Low-level output voltage

V

+ 0.1

IH

IL

IH

IL

REF

–0.3

V

– 0.1

– 0.2

REF

+ 0.2

REF

I

= 8 mA (10)

V – 0.4

CCIO

OH

OL

OH

= –8 mA (10)

0.4

74

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 41. 1.5-V HSTL Class II Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

1.4

0.68

0.7

1.5

1.6

0.9

0.8

V

CCIO

REF

TT

Input reference voltage

Termination voltage

0.75

(DC)

(AC)

DC high-level input voltage

DC low-level input voltage

AC high-level input voltage

AC low-level input voltage

High-level output voltage

Low-level output voltage

V

+ 0.1

IH

IL

IH

IL

REF

–0.3

V

– 0.1

– 0.2

REF

+ 0.2

REF

I

= 16 mA (10)

V – 0.4

CCIO

OH

OL

OH

= –16 mA

0.4

OH

(10)

Table 42. 1.5-V Differential HSTL Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

I/O supply voltage

1.4

0.2

1.5

1.6

V

CCIO

(DC)

(AC)

DC input differential

voltage

DIF

CM

DIF

V

DC common mode input

voltage

0.68

0.4

0.9

V

AC differential input

voltage

Table 43. CTT I/O Specifications

Symbol

Parameter

Conditions

Minimum

Typical

Maximum

Units

V

Output supply voltage

3.0

3.3

1.5

3.6

V

CCIO

/V

Termination and input

reference voltage

1.35

1.65

TT REF

V

High-level input voltage

Low-level input voltage

Input pin leakage current

High-level output voltage

Low-level output voltage

V

+ 0.2

V

IH

REF

V

– 0.2

IL

REF

I

0 < V < V

CCIO

–10

10

µA

V

I

IN

V

I

= –8 mA

+ 0.4

OH

OL

REF

= 8 mA

– 0.4

V

OL

REF

I

Output leakage current

GND ≤ V

≤

–10

10

µA

O

OUT

(when output is high Z)

V

CCIO

Altera Corporation

75

APEX II Programmable Logic Device Family Data Sheet

Table 44. Bus Hold Parameters

Parameter

Conditions

V

Level

Units

CCIO

1.5 V

Min Max

1.8 V

2.5 V

Max

3.3 V

Max

Min

Max

Min

Low sustaining

current

V

> V

30

50

70

µA

IN

IL

(maximum)

< V

High sustaining

current

V

–30

–50

–70

IN

IH

(minimum)

Low overdrive 0 V < V

<

200

300

500

IN

current

High overdrive 0 V < V

current

Notes to Tables 19 – 44:

(1) See the Operating Requirements for Altera Devices Data Sheet.

(2) Conditions beyond those listed in Table 19 may cause permanent damage to a device. Additionally, device

V

CCIO

<

–200

–300

–500

IN

V

CCIO

operation at the absolute maximum ratings for extended periods of time may have adverse affects on the device.

(3) Minimum DC input is –0.5 V. During transitions, the inputs may undershoot to –2 V or overshoot to 4.6 V for input

currents less than 100 mA and periods shorter than 20 ns.

(4) Maximum V_CCrise time is 100 ms, and V_CCmust rise monotonically.

(5) V_CCIOmaximum and minimum conditions for LVPECL, LVDS, RapidIO, and PCML are shown in parentheses.

(6) All pins, including dedicated inputs, clock, I/O, and JTAG pins, may be driven before V_CCINTand V_CCIOare

powered.

(7) Typical values are for T_A= 25° C, V_CCINT= 1.5 V, and V_CCIO= 1.5 V, 1.8 V, 2.5 V, and 3.3 V.

(8) This value is specified for normal device operation. The value may vary during power-up.

(9) Pin pull-up resistance values will lower if an external source drives the pin higher than V_CCIO

.

(10) Drive strength is programmable according to values in Table 9 on page 48.

(11) When APEX II devices drive LVPECL signals, the APEX II LVPECL outputs must be terminated with a resistor

network.

(12) V_REFspecifies the center point of the switching range.

Table 45 and Figure 38 provide information on APEX II device

capacitance.

Capacitance

Table 45. APEX II Device Capacitance

Symbol

Parameter

Conditions

Minimum

Maximum

Unit

C

Input capacitance

V

= 0 V,

IN

(1)

pF

IN

f = 1.0 MHz

Input capacitance on

dedicated clock pin

V

= 0 V,

12

pF

INCLK

OUT

IN

f = 1.0 MHz

= 0 V,

Output capacitance

V

(1)

IN

f = 1.0 MHz

Note to Table 45:

(1) See Figure 38.

76

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 38. APEX II Maximum Input & Output Pin Capacitance

C

= 10 pF

IN

I/O Bank 1

I/O Bank 2

I/O Bank 8

I/O Bank 3

C

= 12 pF

C

= 7 pF

IN

I/O Bank 7

I/O Bank 4

I/O Bank 6

I/O Bank 5

C

= 15 pF

IN

The high-performance FastTrack and MegaLAB interconnect routing

structures ensure predictable performance, and accurate simulation and

timing analysis. In contrast, the unpredictable performance of FPGAs is

caused by their segmented connection scheme.

Timing Model

All specifications are always representative of worst-case supply voltage

and junction temperature conditions. All output-pin-timing specifications

are reported for maximum drive strength.

Altera Corporation

77

APEX II Programmable Logic Device Family Data Sheet

Figure 39 shows the f

parameters can be used to estimate f

timing model for APEX II devices. These

MAX

for multiple levels of logic.

MAX

However, the Quartus II software timing analysis provides more accurate

timing information because the Quartus II software usually has more up-

to-date timing information than the data sheet until the timing model is

final. Also, the Quartus II software can model delays caused by loading

and distance effects more accurately than by using the numbers in this

data sheet.

Figure 39. f

Timing Model

MAX

LE

Routing Delay

t

SU

H

t

F1–4

t

F5–20

CO

LUT

t

F20+

ESB

t

ESBARC

t

ESBSRC

t

ESBAWC

t

ESBSWC

t

ESBWASU

t

ESBWDSU

t

ESBSRASU

t

ESBWESU

t

ESBDATASU

t

ESBWADDRSU

t

ESBRADDRSU

t

ESBDATACO1

t

ESBDATACO2

t

ESBDD

t

PD

t

PTERMSU

t

PTERMCO

78

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Figure 40 shows the timing model for bi-directional, input, and output

IOE timing.

Figure 40. Synchronous External TIming Model

OE Register (1)

PRN

t_XZ

t_ZX

D

Q

Dedicated

Clock

CLRN

t_OUTCO

Output IOE Register (2)

PRN

Bidirectional Pin

D

Q

t_INSU

t_INH

CLRN

Input Register (3)

PRN

D

Q

CLRN

Notes to Figure 40:

(1) The output enable register is in the IOE and is controlled by the

“Fast Output Enable Register = ON” option in the Quartus II software.

(2) The output register is in the IOE and is controlled by the

“Fast Output Register = ON” option in the Quartus II software.

(3) The input register is in the IOE and is controlled by the “Fast Input Register = ON”

option in the Quartus II software.

Tables 46 through 49 show APEX II LE, ESB, and routing delays and

minimum pulse-width timing parameters for the f

timing model.

MAX

Table 46. APEX II f

LE Timing Parameters

MAX

Symbol

Parameter

t

LE register setup time before clock

LE register hold time before clock

LE register clock-to-output delay

LUT delay for data-in to data-out

SU

H

CO

LUT

Altera Corporation

79

APEX II Programmable Logic Device Family Data Sheet

Table 47. APEX II f

ESB Timing Parameters

MAX

Symbol

Parameter

t

ESB asynchronous read cycle time

ESB synchronous read cycle time

ESB asynchronous write cycle time

ESB synchronous write cycle time

ESBARC

ESBSRC

ESBAWC

ESBSWC

ESB write address setup time with respect to WE

ESB write address hold time with respect to WE

ESB data setup time with respect to WE

ESBWASU

ESBWAH

ESBWDSU

ESBWDH

ESB data hold time with respect to WE

ESB read address setup time with respect to RE

ESB read address hold time with respect to RE

ESB WE setup time before clock when using input register

ESB data setup time before clock when using input register

ESB write address setup time before clock when using input registers

ESB read address setup time before clock when using input registers

ESB clock-to-output delay when using output registers

ESB clock-to-output delay without output registers

ESB data-in to data-out delay for RAM mode

ESBRASU

ESBRAH

ESBWESU

ESBDATASU

ESBWADDRSU

ESBRADDRSU

ESBDATACO1

ESBDATACO2

ESBDD

ESB macrocell input to non-registered output

PD

ESB macrocell register setup time before clock

ESB macrocell register clock-to-output delay

PTERMSU

PTERMCO

Table 48. APEX II f

Routing Delays

MAX

Symbol

Parameter

t

Fan-out delay estimate using local interconnect; use to estimate routing delay for a signal

with fan-out of 1 to 4

F1-4

Fan-out delay estimate using MegaLab interconnect; use to estimate routing delay for a

signal with fan-out of 5 to 20

F5-20

F20+

Fan-out delay estimate using FastTrack interconnect; use to estimate routing delay for a

signal with fan-out greater than 20

80

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 49. APEX II Minimum Pulse Width Timing Parameters

Symbol Parameter

t

Minimum clock high time from clock pin

CH

Minimum clock low time from clock pin

LE clear pulse width

LE preset pulse width

Clock high time

CL

CLRP

PREP

ESBCH

ESBCL

Clock low time

Write pulse width

ESBWP

ESBRP

Read pulse width

Table 50. APEX II External Timing Parameters

Symbol

Note (1)

Parameter

Conditions

t

Setup time with global clock at IOE input register

Hold time with global clock at IOE input register

INSU

INH

Clock-to-output delay with global clock at IOE output register C1 = 35 pF

Clock-to-output buffer disable delay

OUTCO

XZ

Clock-to-output buffer enable delay

Slow slew rate = OFF

ZX

Setup time with PLL clock at IOE input register

Hold time with PLL clock at IOE input register

Clock-to-output delay with PLL clock at IOE output register C1 = 35 pF

PLL clock-to-output buffer disable delay

INSUPLL

INHPLL

OUTCOPLL

XZPLL

ZXPLL

PLL clock-to-output buffer enable delay

Slow slew rate = OFF

Note to Table 50:

(1) External timing parameters are factory tested, worst-case values specified by Altera. These timing parameters are

sample-tested only.

Altera Corporation

81

APEX II Programmable Logic Device Family Data Sheet

Tables 51 through 66 show the APEX II device f

and functional timing

MAX

parameters.

Table 51. EP2A15 f

LE Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

0.25

0.29

ns

SU

H

0.17

0.51

0.20

0.64

0.23

0.73

CO

LUT

Table 52. EP2A15 f

ESB Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.28

2.49

2.20

3.02

1.47

2.83

2.53

3.47

1.69

3.25

2.91

3.99

ns

ESBARC

ESBSRC

ESBAWC

ESBSWC

–0.55

0.15

–0.64

0.18

–0.73

0.20

ESBWASU

ESBWAH

0.37

0.43

0.49

ESBWDSU

ESBWDH

0.16

0.18

0.21

0.84

0.96

1.11

ESBRASU

ESBRAH

0.00

0.14

0.13

0.15

ESBWESU

ESBDATASU

ESBWADDRSU

ESBRADDRSU

ESBDATACO1

ESBDATACO2

ESBDD

–0.02

–0.40

–0.38

–0.06

–0.50

–0.48

–0.07

–0.58

–0.55

1.30

1.84

2.42

1.69

1.50

2.12

2.78

1.94

1.72

2.44

3.19

2.23

PD

1.10

1.22

1.40

PTERMSU

PTERMCO

0.82

0.94

1.08

82

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 53. EP2A15 f

Routing Delays

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

0.19

0.45

1.18

0.21

0.52

1.33

0.25

0.64

1.54

ns

F1-4

F5-20

F20+

Table 54. EP2A15 Minimum Pulse Width Timing Parameters

Note (1)

Symbol -7 Speed Grade -8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.00

0.13

1.00

1.12

0.88

1.30

0.13

1.30

1.28

1.02

1.50

0.15

1.50

1.48

1.17

ns

CH

CL

CLRP

PREP

ESBCH

ESBCL

ESBWP

ESBRP

Table 55. EP2A25 f

LE Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

0.25

0.29

0.33

ns

SU

H

0.17

0.51

0.19

0.59

0.22

0.67

CO

LUT

Altera Corporation

83

APEX II Programmable Logic Device Family Data Sheet

Table 56. EP2A25 f

ESB Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.28

2.49

2.20

3.02

1.47

2.86

2.53

3.47

1.69

3.29

2.91

3.99

ns

ESBARC

ESBSRC

ESBAWC

ESBSWC

0.07

0.15

0.07

0.18

0.09

0.20

ESBWASU

ESBWAH

0.37

0.43

0.49

ESBWDSU

ESBWDH

0.16

0.18

0.21

0.84

0.96

1.11

ESBRASU

ESBRAH

0.00

0.14

0.16

0.19

ESBWESU

ESBDATASU

ESBWADDRSU

ESBRADDRSU

ESBDATACO1

ESBDATACO2

ESBDD

–0.02

–0.40

–0.38

–0.03

–0.46

–0.44

–0.03

–0.53

–0.51

1.30

1.84

2.42

1.69

1.50

2.12

2.78

1.94

1.72

2.44

3.19

2.23

PD

1.10

1.26

1.45

PTERMSU

PTERMCO

0.82

0.94

1.08

Table 57. EP2A25 f

Routing Delays

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

0.19

0.65

1.11

0.21

0.75

1.27

0.25

0.86

1.41

ns

F1-4

F5-20

F20+

84

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 58. EP2A25 Minimum Pulse Width Timing Parameters

Note (1)

Symbol -7 Speed Grade -8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.00

0.13

1.00

1.12

0.88

1.50

0.15

1.50

1.28

1.02

2.12

0.17

2.12

1.48

1.17

ns

CH

CL

CLRP

PREP

ESBCH

ESBCL

ESBWP

ESBRP

Table 59. EP2A40 f

LE Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade (2)

-8 Speed Grade

-9 Speed Grade (2)

Min Max

Unit

Min

Max

Min

Max

t

0.25

ns

SU

H

0.20

0.64

CO

LUT

Altera Corporation

85

APEX II Programmable Logic Device Family Data Sheet

Table 60. EP2A40 f

ESB Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade (2)

-8 Speed Grade

-9 Speed Grade (2)

Min Max

Unit

Min

Max

Min

Max

t

1.39

2.62

3.04

3.19

ns

ESBARC

ESBSRC

ESBAWC

ESBSWC

0.45

0.46

0.59

0.46

1.33

0.00

2.38

0.04

0.30

ESBWASU

ESBWAH

ESBWDSU

ESBWDH

ESBRASU

ESBRAH

ESBWESU

ESBDATASU

ESBWADDRSU

ESBRADDRSU

ESBDATACO1

ESBDATACO2

ESBDD

0.98

2.17

2.59

1.53

PD

0.91

PTERMSU

PTERMCO

0.98

Table 61. EP2A40 f

Routing Delays

Note (1)

MAX

Symbol

-7 Speed Grade (2)

-8 Speed Grade

-9 Speed Grade (2)

Min Max

Unit

Min

Max

Min

Max

t

0.23

0.17

1.96

ns

F1-4

F5-20

F20+

86

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 62. EP2A40 Minimum Pulse Width Timing Parameters

Symbol -7 Speed Grade (2) -8 Speed Grade

Min Max

Note (1)

-9 Speed Grade (2)

Min Max

Unit

Min

Max

t

1.30

0.13

1.30

1.09

0.90

ns

CH

CL

CLRP

PREP

ESBCH

ESBCL

ESBWP

ESBRP

Table 63. EP2A70 f

LE Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

0.25

0.29

0.33

ns

SU

H

0.19

0.55

0.21

0.63

0.24

0.73

CO

LUT

Altera Corporation

87

APEX II Programmable Logic Device Family Data Sheet

Table 64. EP2A70 f

ESB Timing Parameters

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.56

2.61

3.20

1.79

3.00

3.68

2.06

3.45

3.46

4.23

ns

ESBARC

ESBSRC

ESBAWC

ESBSWC

0.37

0.00

0.42

0.00

0.48

0.00

ESBWASU

ESBWAH

0.44

0.51

0.58

ESBWDSU

ESBWDH

0.01

1.26

1.45

1.66

ESBRASU

ESBRAH

0.00

0.12

0.13

0.15

ESBWESU

ESBDATASU

ESBWADDRSU

ESBRADDRSU

ESBDATACO1

ESBDATACO2

ESBDD

–0.02

–0.18

–0.19

–0.02

–0.21

–0.22

–0.03

–0.24

–0.25

1.27

1.97

2.59

1.82

1.46

2.27

2.98

2.09

1.68

2.61

3.42

2.40

PD

1.18

1.35

1.56

PTERMSU

PTERMCO

0.90

1.04

1.19

Table 65. EP2A70 f

Routing Delays

Note (1)

MAX

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

0.19

1.39

2.01

0.21

1.60

2.32

0.25

1.84

2.66

ns

F1-4

F5-20

F20+

88

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 66. EP2A70 Minimum Pulse Width Timing Parameters

Note (1)

Symbol -7 Speed Grade -8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.00

0.14

1.00

1.14

0.95

1.50

0.16

1.50

1.31

1.09

2.12

0.18

2.12

1.50

1.25

ns

CH

CL

CLRP

PREP

ESBCH

ESBCL

ESBWP

ESBRP

Notes to Tables 51 – 66:

(1) Timing information is preliminary. Final timing information will be released in a future version of this data sheet.

(2) Timing information for these devices will be released in a future version of this data sheet.

Tables 67 through 72 show the IOE external timing parameter values for

APEX II devices.

Table 67. EP2A15 External Timing Parameters

Symbol -7 Speed Grade

Note (1)

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.67

0.00

1.91

0.00

2.08

0.00

ns

INSU

INH

4.04

4.98

4.68

5.92

5.20

6.67

OUTCO

XZ

ZX

1.15

0.00

1.35

0.00

-

INSUPLL

INHPLL

OUTCOPLL

XZPLL

ZXPLL

2.59

3.53

2.98

4.22

-

Altera Corporation

89

APEX II Programmable Logic Device Family Data Sheet

Table 68. EP2A25 External Timing Parameters

Symbol -7 Speed Grade

Note (1)

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.52

0.00

1.68

0.00

1.86

0.00

ns

INSU

INH

4.29

5.23

4.62

5.72

4.98

6.26

OUTCO

XZ

ZX

1.17

0.00

1.28

0.00

-

INSUPLL

INHPLL

OUTCOPLL

XZPLL

ZXPLL

2.60

3.54

2.82

3.92

-

Table 69. EP2A40 External Timing Parameters

Symbol -7 Speed Grade (2)

Min Max

Note (1)

-8 Speed Grade

-9 Speed Grade (2)

Min Max

Unit

Min

Max

t

1.89

0.00

ns

INSU

INH

5.70

6.94

OUTCO

XZ

ZX

1.45

0.00

INSUPLL

INHPLL

OUTCOPLL

XZPLL

ZXPLL

3.28

4.90

90

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 70. EP2A70 External Timing Parameters

Symbol -7 Speed Grade

Note (1)

-8 Speed Grade

-9 Speed Grade

Unit

Min

Max

Min

Max

Min

Max

t

1.79

0.00

1.98

0.00

2.16

0.00

ns

INSU

INH

4.73

5.64

5.08

6.15

5.46

6.71

OUTCO

XZ

ZX

1.14

0.00

1.25

0.00

-

INSUPLL

INHPLL

OUTCOPLL

XZPLL

ZXPLL

2.49

3.41

2.70

3.78

-

Altera Corporation

91

APEX II Programmable Logic Device Family Data Sheet

Table 71. APEX II Selectable I/O Standards Input Adder Delays

Note (1)

Symbol

-7 Speed Grade

-8 Speed Grade

-9 Speed Grade

Min Max

Unit

Min

Max

Min

Max

LVCMOS

0.00

ns

LVTTL

1.5 V

0.10

0.11

0.12

1.8 V

0.00

2.5 V

0.00

3.3-V PCI

3.3-V PCI-X

GTL+

0.00

–0.20

–0.17

–0.24

–0.03

–0.23

0.00

–0.23

–0.19

–0.27

–0.03

–0.27

0.00

–0.25

–0.21

–0.30

–0.04

–0.29

0.00

SSTL-3 Class I

SSTL-3 Class II

SSTL-2 Class I

SSTL-2 Class II

HSTL Class I

HSTL Class II

LVDS

LVPECL

PCML

CTT

3.3-V AGP 1×

3.3-V AGP 2×

HyperTransport

0.00

–0.23

–0.27

–0.29

Differential

HSTL

92

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Table 72. APEX II Selectable I/O Standards Output Adder Delays

Symbol -7 Speed Grade -8 Speed Grade

Note (1)

-9 Speed Grade

Min Max

Unit

Min

Max

Min

Max

LVCMOS

0.00

0.000

ns

LVTTL

1.5 V

3.32

3.82

4.202

1.8 V

1.20

1.38

1.515

2.5 V

2.65

3.05

3.356

3.3-V PCI

3.3-V PCI-X

GTL+

–0.68

–0.45

–0.52

–0.68

–0.81

–0.08

–0.23

–1.41

–1.38

–1.30

0.00

–0.78

–0.52

–0.60

–0.78

–0.93

–0.09

–0.27

–1.62

–1.58

–1.50

0.00

–0.854

–0.572

–0.660

–0.856

–1.024

–0.095

–0.295

–1.787

–1.740

–1.646

0.000

SSTL-3 Class I

SSTL-3 Class II

SSTL-2 Class I

SSTL-2 Class II

HSTL Class I

HSTL Class II

LVDS

LVPECL

PCML

CTT

3.3-V AGP 1×

3.3-V AGP 2×

HyperTransport

0.00

0.000

0.00

0.000

–1.22

–1.41

–1.62

–1.549

–1.787

Differential

HSTL

Notes to Tables 67 – 72:

(1) Timing information is preliminary. Final timing information will be released in a future version of this data sheet.

(2) These timing adjustment factors will be released in a future version of this data sheet.

Detailed power consumption information for APEX II devices will be

released via a future interactive power estimator on the Altera web site.

Power

Consumption

See the Altera web site (http://www.altera.com) or the Altera Digital

Library for pin-out information.

Device Pin-

Outs

Altera Corporation

93

APEX II Programmable Logic Device Family Data Sheet

The information contained in the APEX II Programmable Logic Device

Family Data Sheet version 1.3 supersedes information published in

previous versions.

Revision

History

Version 1.3

The following changes were made to the APEX II Programmable Logic

Device Family Data Sheet version 1.3: updated Note (1) to Figure 31.

Version 1.2

The following changes were made to the APEX II Programmable Logic

Device Family Data Sheet version 1.2:

ꢀ

Device specifications are finalized. However, timing numbers are still

preliminary.

ꢀ

Removed EP2A90 device from data sheet.

Updated I/O pin count in Tables 1, 2, and 3.

Updated LVTTL (1.5 V) drive strengths in Table 9.

Updated “Advanced I/O Standard Support” section, including

Note (2) to Figure 31.

ꢀ

Updated “Pre-Programmed CDS” section.

Updated Table 13.

Added EP2A40 and EP2A70 device information to Tables 16 and 17.

Updated LVPECL V specification in Table 29.

IL

Updated Figure 35.

Added “Capacitance” section.

Added timing information to Tables 51 through 72.

Various textual changes throughout the document.

Version 1.1

The following changes were made to the APEX II Programmable Logic

Device Family Data Sheet version 1.1:

ꢀ

Updated Table 5

Added preliminary timing information, including Tables 51

through 72.

94

Altera Corporation

APEX II Programmable Logic Device Family Data Sheet

Notes:

Altera Corporation

95

APEX II Programmable Logic Device Family Data Sheet

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trademarks and/or service marks are, unless noted otherwise, the trademarks and service marks of Altera

Corporation in the U.S. and other countries. All other product or service names are the property of their

respective holders. Altera products are protected under numerous U.S. and foreign patents and pending

applications, maskwork rights, and copyrights. Altera warrants performance of its semiconductor products to

current specifications in accordance with Altera’s standard warranty, but reserves the

right to make changes to any products and services at any time without notice. Altera

assumes no responsibility or liability arising out of the application or use of any

information, product, or service described herein except as expressly agreed to in writing

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96

Altera Corporation

Printed on Recycled Paper.


型号：	EP2A25F33C-8
厂家：	INTEL
描述：	Field Programmable Gate Array 栅
文件：	总96页 (文件大小：1039K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

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