GD80960JS-25 [INTEL]
RISC Microprocessor, 32-Bit, 25MHz, CMOS, PBGA196, PLASTIC, BGA-196;型号: | GD80960JS-25 |
厂家: | INTEL |
描述: | RISC Microprocessor, 32-Bit, 25MHz, CMOS, PBGA196, PLASTIC, BGA-196 时钟 外围集成电路 |
文件: | 总61页 (文件大小:725K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PRELIMINARY
80960JD
EMBEDDED 32-BIT MICROPROCESSOR
■ Pin/Code Compatible with all 80960Jx
■ High Bandwidth Burst Bus
Processors
— 32-Bit Multiplexed Address/Data
— Programmable Memory Configuration
— Selectable 8-, 16-, 32-Bit Bus Widths
— Supports Unaligned Accesses
— Big or Little Endian Byte Ordering
■ High-Performance Embedded Architecture
— One Instruction/Clock Execution
— Core Clock Rate is 2x the Bus Clock
— Load/Store Programming Model
— Sixteen 32-Bit Global Registers
— Sixteen 32-Bit Local Registers (8 sets)
— Nine Addressing Modes
■ New Instructions
— Conditional Add, Subtract and Select
— Processor Management
— User/Supervisor Protection Model
■ High-Speed Interrupt Controller
— 31 Programmable Priorities
■ Two-Way Set Associative Instruction Cache
— 80960JD - 4 Kbyte
— Eight Maskable Pins plus NMI
— Up to 240 Vectors in Expanded Mode
— Programmable Cache Locking
Mechanism
■ Two On-Chip Timers
■ Direct Mapped Data Cache
— 80960JD - 2 Kbyte
— Independent 32-Bit Counting
— Clock Prescaling by 1, 2, 4 or 8
— lnternal Interrupt Sources
— Write Through Operation
■ Halt Mode for Low Power
■ On-Chip Stack Frame Cache
— Seven Register Sets Can Be Saved
— Automatic Allocation on Call/Return
— 0-7 Frames Reserved for High-Priority
Interrupts
■ IEEE 1149.1 (JTAG) Boundary Scan
Compatibility
■ Packages
— 132-Lead Pin Grid Array (PGA)
— 132-Lead Plastic Quad Flat Pack (PQFP)
■ On-Chip Data RAM
— 1 Kbyte Critical Variable Storage
— Single-Cycle Access
132
PIN 1
99
A80960JD
®
XXXXXXXXA2
i960
M
©
19xx
i
NG80960JD
XXXXXXXXA2
M
©
19xx
i
33
66
Figure 1. 80960JD Microprocessor
Information in this document is provided solely to enable use of Intel products. Intel assumes no liability whatsoever, including infringement of any
patent or copyright, for sale and use of Intel products except as provided in Intel’s Terms and Conditions of Sale for such products. Information
contained herein supersedes previously published specifications on these devices from Intel.
© INTEL CORPORATION, 1995
September 1995
Order Number: 272596-002
80960JD
80960JD
EMBEDDED 32-BIT MICROPROCESSOR
1.0 PURPOSE ..................................................................................................................................................1
2.0 80960JD OVERVIEW ................................................................................................................................1
2.1 80960 Processor Core ........................................................................................................................2
2.2 Burst Bus ............................................................................................................................................2
2.3 Timer Unit ...........................................................................................................................................3
2.4 Priority Interrupt Controller ..................................................................................................................3
2.5 Instruction Set Summary ....................................................................................................................3
2.6 Faults and Debugging .........................................................................................................................3
2.7 Low Power Operation .........................................................................................................................4
2.8 Test Features ......................................................................................................................................4
2.9 Memory-Mapped Control Registers ....................................................................................................4
2.10 Data Types and Memory Addressing Modes ....................................................................................4
3.0 PACKAGE INFORMATION .......................................................................................................................6
3.1 Pin Descriptions ..................................................................................................................................6
3.1.1 Functional Pin Definitions .........................................................................................................6
3.1.2 80960Jx 132-Lead PGA Pinout ..............................................................................................13
3.1.3 80960Jx PQFP Pinout ............................................................................................................17
3.2 Package Thermal Specifications ......................................................................................................20
3.3 Thermal Management Accessories ..................................................................................................22
4.0 ELECTRICAL SPECIFICATIONS ...........................................................................................................23
4.1 Absolute Maximum Ratings ..............................................................................................................23
4.2 Operating Conditions ........................................................................................................................23
4.3 Connection Recommendations .........................................................................................................24
4.4 DC Specifications .............................................................................................................................24
4.5 AC Specifications ..............................................................................................................................26
4.5.1 AC Test Conditions and Derating Curves ..............................................................................33
4.5.2 AC Timing Waveforms ...........................................................................................................34
5.0 BUS FUNCTIONAL WAVEFORMS .........................................................................................................42
6.0 DEVICE IDENTIFICATION ......................................................................................................................56
7.0 REVISION HISTORY ...............................................................................................................................56
ii
PRELIMINARY
80960JD
FIGURES
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
Figure 14.
Figure 15.
Figure 16.
Figure 17.
Figure 18.
Figure 19.
Figure 20.
Figure 21.
Figure 22.
Figure 23.
Figure 24.
Figure 25.
Figure 26.
Figure 27.
Figure 28.
Figure 29.
80960JD Microprocessor ............................................................................................................ i
80960JD Block Diagram ............................................................................................................ 2
132-Lead Pin Grid Array Bottom View - Pins Facing Up ......................................................... 13
132-Lead Pin Grid Array Top View - Pins Facing Down .......................................................... 14
132-Lead PQFP - Top View ..................................................................................................... 17
50 MHz Maximum Allowable Ambient Temperature ................................................................ 21
40 MHz Maximum Allowable Ambient Temperature ................................................................ 22
AC Test Load ........................................................................................................................... 33
Output Delay or Hold vs. Load Capacitance ............................................................................ 33
Rise and Fall Time Derating .................................................................................................... 34
CLKIN Waveform ..................................................................................................................... 34
Output Delay Waveform for TOV1 ............................................................................................ 35
Output Float Waveform for TOF ............................................................................................... 35
Input Setup and Hold Waveform for TIS1 and TIH1 .................................................................. 36
Input Setup and Hold Waveform for TIS2 and TIH2 .................................................................. 36
Input Setup and Hold Waveform for TIS3 and TIH3 .................................................................. 37
Input Setup and Hold Waveform for TIS4 and TIH4 .................................................................. 37
Relative Timings Waveform for TLXL and TLXA ........................................................................ 38
DT/R and DEN Timings Waveform .......................................................................................... 38
TCK Waveform ........................................................................................................................ 39
Input Setup and Hold Waveforms for TBSIS1 and TBSIH1 ......................................................... 39
Output Delay and Output Float Waveform for TBSOV1 AND TBSOF1 ................................... 40
Output Delay and Output Float Waveform for TBSOV2 and TBSOF2 .................................... 40
Input Setup and Hold Waveform for TBSIS2 and TBSIH2 ...........................................................................41
Non-Burst Read and Write Transactions Without Wait States, 32-Bit Bus .............................. 42
Burst Read and Write Transactions Without Wait States, 32-Bit Bus ...................................... 43
Burst Write Transactions With 2,1,1,1 Wait States, 32-Bit Bus ............................................... 44
Burst Read and Write Transactions Without Wait States, 8-Bit Bus ........................................ 45
Burst Read and Write Transactions With 1, 0 Wait States
and Extra Tr State on Read, 16-Bit Bus .................................................................................. 46
Figure 30.
Bus Transactions Generated by Double Word Read Bus Request,
Misaligned One Byte From Quad Word Boundary, 32-Bit Bus, Little Endian .......................... 47
Figure 31.
Figure 32.
Figure 33.
Figure 34.
Figure 35.
Figure 36.
HOLD/HOLDA Waveform For Bus Arbitration ......................................................................... 48
Cold Reset Waveform .............................................................................................................. 49
Warm Reset Waveform ........................................................................................................... 50
Entering the ONCE State ......................................................................................................... 51
Summary of Aligned and Unaligned Accesses (32-Bit Bus) .................................................... 54
Summary of Aligned and Unaligned Accesses (32-Bit Bus) .................................................... 55
PRELIMINARY
iii
80960JD
TABLES
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Table 17.
Table 18.
Table 19.
Table 20.
Table 21.
Table 22.
Table 23.
Table 24.
80960Jx Instruction Set ................................................................................................................5
Pin Description Nomenclature ......................................................................................................6
Pin Description — External Bus Signals ......................................................................................7
Pin Description — Processor Control Signals, Test Signals and Power ....................................10
Pin Description — Interrupt Unit Signals ....................................................................................12
132-Lead PGA Pinout — In Signal Order ...................................................................................15
132-Lead PGA Pinout — In Pin Order .......................................................................................16
132-Lead PQFP Pinout — In Signal Order ................................................................................18
132-Lead PQFP Pinout — In Pin Order .....................................................................................19
132-Lead PGA Package Thermal Characteristics ......................................................................20
132-Lead PQFP Package Thermal Characteristics ...................................................................21
80960JD Operating Conditions ..................................................................................................23
80960JD DC Characteristics ......................................................................................................24
80960JD ICC Characteristics .....................................................................................................25
80960JD AC Characteristics (50 MHz) ......................................................................................26
Note Definitions for Table 15, 80960JD AC Characteristics (50 MHz) .......................................28
80960JD AC Characteristics (40 MHz) ......................................................................................28
80960JD AC Characteristics (33 MHz) ......................................................................................31
Natural Boundaries for Load and Store Accesses .....................................................................52
Summary of Byte Load and Store Accesses ..............................................................................52
Summary of Short Word Load and Store Accesses ...................................................................52
Summary of n-Word Load and Store Accesses (n = 1, 2, 3, 4) ..................................................53
80960JD Die and Stepping Reference .......................................................................................56
Data Sheet Version -001 to -002 Revision History .....................................................................56
iv
PRELIMINARY
80960JD
ration registers enable the processor to operate with
all combinations of bus width and data object
alignment. The processor supports a homogeneous
byte ordering model.
1.0 PURPOSE
This document contains advance information for the
80960JD microprocessor, including electrical
characteristics and package pinout information.
Detailed functional descriptions
— other than
This processor integrates two important peripherals:
a timer unit and an interrupt controller. These and
other hardware resources are programmed through
memory-mapped control registers, an extension to
the familiar 80960 architecture.
parametric performance — are published in the
i960® Jx Microprocessor User’s Guide (272483).
Throughout this data sheet, references to “80960Jx”
indicate features which apply to all of the following:
The timer unit (TU) offers two independent 32-bit
timers for use as real-time system clocks and
general-purpose system timing. These operate in
either single-shot or auto-reload mode and can
generate interrupts.
• 80960JA — 5V, 2 Kbyte instruction cache, 1 Kbyte
data cache
• 80960JF — 5V, 4 Kbyte instruction cache, 2 Kbyte
data cache
• 80960JD — 5V, 4 Kbyte instruction cache, 2 Kbyte
data cache and clock doubling
The interrupt controller unit (ICU) provides a flexible
means for requesting interrupts. The ICU provides
full programmability of up to 240 interrupt sources
into 31 priority levels. The ICU takes advantage of a
cached priority table and optional routine caching to
minimize interrupt latency. Clock doubling reduces
interrupt latency by 40% compared to the
80960JA/JF. Local registers may be dedicated to
high-priority interrupts to further reduce latency.
Acting independently from the core, the ICU
compares the priorities of posted interrupts with the
current process priority, off-loading this task from the
core. The ICU also supports the integrated timer
interrupts.
• 80L960JA — 3.3 V version of the 80960JA
• 80L960JF — 3.3 V version of the 80960JF
2.0 80960JD OVERVIEW
The 80960JD offers high performance to cost-
sensitive 32-bit embedded applications. The
80960JD is object code compatible with the 80960
Core Architecture and is capable of sustained
execution at the rate of one instruction per clock.
This processor’s features include generous
instruction cache, data cache and data RAM. It also
boasts a fast interrupt mechanism, dual program-
mable timer units and new instructions.
The 80960JD features a Halt mode designed to
support applications where low power consumption
is critical. The halt instruction shuts down instruction
execution, resulting in a power savings of up to 90
percent.
The 80960JD’s clock doubler operates the processor
core at twice the bus clock rate to improve execution
performance without increasing the complexity of
board designs.
The 80960JD’s testability features, including ONCE
(On-Circuit Emulation) mode and Boundary Scan
(JTAG), provide a powerful environment for design
debug and fault diagnosis.
Memory subsystems for cost-sensitive embedded
applications often impose substantial wait state
penalties. The 80960JD integrates considerable
storage resources on-chip to decouple CPU
execution from the external bus.
The Solutions960® program features a wide variety
of development tools which support the i960
processor family. Many of these tools are developed
by partner companies; some are developed by Intel,
such as profile-driven optimizing compilers. For
more information on these products, contact your
local Intel representative.
The 80960JD rapidly allocates and deallocates local
register sets during context switches. The processor
needs to flush a register set to the stack only when it
saves more than seven sets to its local register
cache.
A 32-bit multiplexed burst bus provides a high-speed
interface to system memory and I/O.
A full
complement of control signals simplifies the
connection of the 80960JD to external components.
The user programs physical and logical memory
attributes through memory-mapped control registers
(MMRs) — an extension not found on the i960 Kx,
Sx or Cx processors. Physical and logical configu-
PRELIMINARY
1
80960JD
Control
21
Physical Region
Configuration
32-bit buses
address / data
CLKIN
PLL, Clocks,
Power Mgmt
Bus
Control Unit
4 KByte Instruction Cache
Two-Way Set Associative
Address
Data Bu
Bus Request
Queues
TAP
5
Boundary Scan
Controller
32
Instruction Sequencer
Two 32-Bit
Timers
Constants
Control
Interrup
Port
Programmable
Interrupt Controller
9
8-Set
Local Register Cache
Execution
and
Memory
Interface
Unit
Memory-Mapped
Register Interface
Multiply
Divide
Unit
Address
Generation
128
Unit
1 Kbyte
32-bit Address
32-bit Data
Global / Local
Register File
effective
address
Data RAM
SRC1 SRC2 DEST
2 Kbyte Direct
Mapped Data
Cache
3 Independent 32-Bit SRC1, SRC2, and DEST Buses
Figure 2. 80960JD Block Diagram
• 128-bit register bus speeds local register caching
2.1 80960 Processor Core
• 4 Kbyte two-way set associative, integrated
instruction cache
The 80960Jx family is a scalar implementation of the
80960 Core Architecture. Intel designed this
processor core as a very high performance device
that is also cost-effective. Factors that contribute to
the core’s performance include:
• 2 Kbyte direct-mapped, integrated data cache
• 1 Kbyte integrated data RAM delivers zero wait
state program data
• Core operates at twice the bus speed (80960JD
only)
2.2 Burst Bus
• Single-clock execution of most instructions
• Independent Multiply/Divide Unit
A 32-bit high-performance bus controller interfaces
the 80960JD to external memory and peripherals.
The BCU fetches instructions and transfers data at
the rate of up to four 32-bit words per six clock
cycles. The external address/data bus is multi-
plexed.
• Efficient instruction pipeline minimizes pipeline
break latency
• Register and resource scoreboarding allow
overlapped instruction execution
2
PRELIMINARY
80960JD
Users may configure the 80960JD’s bus controller to
match an application’s fundamental memory organi-
zation. Physical bus width is register-programmed
for up to eight regions. Byte ordering and data
caching are programmed through a group of logical
memory templates and a defaults register.
Non-Maskable Interrupt (NMI) pin. Interrupts are
serviced according to their priority levels relative to
the current process priority.
Low interrupt latency is critical to many embedded
applications. As part of its highly flexible interrupt
mechanism, the 80960JD exploits several
techniques to minimize latency:
The BCU’s features include:
• Multiplexed external bus to minimize pin count
• Interrupt vectors and interrupt handler routines can
be reserved on-chip
• 32-, 16- and 8-bit bus widths to simplify I/O
interfaces
• Register frames for high-priority interrupt handlers
can be cached on-chip
• External ready control for address-to-data, data-to-
data and data-to-next-address wait state types
• The interrupt stack can be placed in cacheable
memory space
• Support for big or little endian byte ordering to
facilitate the porting of existing program code
• Interrupt microcode executes at twice the bus
frequency
• Unaligned bus accesses performed transparently
• Three-deep load/store queue to decouple the bus
from the core
2.5 Instruction Set Summary
Upon reset, the 80960JD conducts an internal self
test. Then, before executing its first instruction, it
performs an external bus confidence test by
performing a checksum on the first words of the
initialization boot record (IBR).
The 80960Jx adds several new instructions to the
i960 core architecture. The new instructions are:
• Conditional Move
• Conditional Add
• Conditional Subtract
• Byte Swap
The user may examine the contents of the caches at
any time by executing special cache control instruc-
tions.
• Halt
• Cache Control
• Interrupt Control
2.3 Timer Unit
Table 1 identifies the instructions that the 80960Jx
supports. Refer to i960® Jx Microprocessor User’s
Guide (272483) for a detailed description of each
instruction.
The timer unit (TU) contains two independent 32-bit
timers which are capable of counting at several clock
rates and generating interrupts. Each is programmed
by use of the TU registers. These memory-mapped
registers are addressable on 32-bit boundaries. The
timers have a single-shot mode and auto-reload
capabilities for continuous operation. Each timer has
an independent interrupt request to the 80960JD’s
interrupt controller. The TU can generate a fault
when unauthorized writes from user mode are
detected. Clock prescaling is supported.
2.6 Faults and Debugging
The 80960Jx employs a comprehensive fault model.
The processor responds to faults by making implicit
calls to a fault handling routine. Specific information
collected for each fault allows the fault handler to
diagnose exceptions and recover appropriately.
2.4 Priority Interrupt Controller
The processor also has built-in debug capabilities. In
software, the 80960Jx may be configured to detect
as many as seven different trace event types. Alter-
natively, mark and fmark instructions can generate
trace events explicitly in the instruction stream.
Hardware breakpoint registers are also available to
trap on execution and data addresses.
A programmable interrupt controller manages up to
240 external sources through an 8-bit external
interrupt port. Alternatively, the interrupt inputs may
be configured for individual edge- or level-triggered
inputs. The interrupt unit (IU) also accepts interrupts
from the two on-chip timer channels and a single
PRELIMINARY
3
80960JD
2.7 Low Power Operation
2.9 Memory-Mapped Control
Registers
Intel fabricates the 80960Jx using an advanced sub-
micron manufacturing process. The processor’s sub-
micron topology provides the circuit density for
optimal cache size and high operating speeds while
dissipating modest power. The processor also uses
dynamic power management to turn off clocks to
unused circuits.
The 80960JD, though compliant with i960 series
processor core, has the added advantage of
memory-mapped, internal control registers not found
on the i960 Kx, Sx or Cx processors. These give
software the interface to easily read and modify
internal control registers.
Users may program the 80960Jx to enter Halt mode
for maximum power savings. In Halt mode, the
processor core stops completely while the integrated
peripherals continue to function, reducing overall
power requirements up to 90 percent. Processor
execution resumes from internally or externally
generated interrupts.
Each of these registers is accessed as a memory-
mapped, 32-bit register. Access is accomplished
through regular memory-format instructions. The
processor ensures that these accesses do not
generate external bus cycles.
2.10 Data Types and Memory
Addressing Modes
2.8 Test Features
As with all i960 family processors, the 80960Jx
instruction set supports several data types and
formats:
The 80960Jx incorporates numerous features which
enhance the user’s ability to test both the processor
and the system to which it is attached. These
features include ONCE (On-Circuit Emulation) mode
and Boundary Scan (JTAG).
• Bit
• Bit fields
• Integer (8-, 16-, 32-, 64-bit)
• Ordinal (8-, 16-, 32-, 64-bit unsigned integers)
• Triple word (96 bits)
• Quad word (128 bits)
The 80960Jx provides testability features compatible
with IEEE Standard Test Access Port and Boundary
Scan Architecture (IEEE Std. 1149.1).
One of the boundary scan instructions, HIGHZ,
forces the processor to float all its output pins
(ONCE mode). ONCE mode can also be initiated at
reset without using the boundary scan mechanism.
The 80960Jx provides a full set of addressing modes
for C and assembly programming:
• Two Absolute modes
ONCE mode is useful for board-level testing. This
feature allows a mounted 80960JD to electrically
“remove” itself from a circuit board. This allows for
system-level testing where a remote tester — such
• Five Register Indirect modes
• Index with displacement
• IP with displacement
as an in-circuit emulator
processor system.
— can exercise the
The provided test logic does not interfere with
component or circuit board behavior and ensures
that components function correctly, connections
between various components are correct, and
various components interact correctly on the printed
circuit board.
The JTAG Boundary Scan feature is an attractive
alternative to conventional “bed-of-nails” testing. It
can examine connections which might otherwise be
inaccessible to a test system.
4
PRELIMINARY
80960JD
Table 1. 80960Jx Instruction Set
Arithmetic Logical
Data Movement
Load
Bit, Bit Field and Byte
Add
And
Set Bit
Store
Subtract
Not And
And Not
Or
Clear Bit
Move
Multiply
Not Bit
*Conditional Select
Load Address
Divide
Alter Bit
Remainder
Exclusive Or
Not Or
Scan For Bit
Span Over Bit
Extract
Modulo
Shift
Or Not
Extended Shift
Extended Multiply
Extended Divide
Add with Carry
Subtract with Carry
*Conditional Add
*Conditional Subtract
Rotate
Nor
Modify
Exclusive Nor
Not
Scan Byte for Equal
*Byte Swap
Nand
Comparison
Branch
Call/Return
Fault
Compare
Unconditional Branch
Conditional Branch
Compare and Branch
Call
Conditional Fault
Conditional Compare
Call Extended
Call System
Return
Synchronize Faults
Compare and
Increment
Compare and
Decrement
Branch and Link
Test Condition Code
Check Bit
Processor
Management
Debug
Atomic
Modify Trace Controls
Mark
Flush Local Registers
Atomic Add
Modify Arithmetic
Controls
Atomic Modify
Force Mark
Modify Process
Controls
*Halt
System Control
*Cache Control
*Interrupt Control
NOTE:
Asterisk (*) denotes new 80960Jx instructions unavailable on 80960CA/CF, 80960KA/KB and 80960SA/SB
implementations.
PRELIMINARY
5
80960JD
3.0 PACKAGE INFORMATION
Table 2. Pin Description Nomenclature
The 80960JD is offered in several speed and
package types. The 132-pin Pin Grid Array (PGA)
device will be specified for operation at
Symbol
Description
Input pin only.
I
O
I/O
–
Vcc = 5.0 V ± 5% over a case temperature range of
Output pin only.
0° to 85°C:
• A80960JD-50 (50 MHz core, 25 MHz bus)
Pin can be either an input or output.
Pin must be connected as described.
The 132-pin Pin Grid Array (PGA) device will be
specified for operation at Vcc = 5.0 V ± 5% over a
case temperature range of 0° to 100°C:
S
Synchronous. Inputs must meet setup
and hold times relative to CLKIN for
proper operation.
• A80960JD-40 (40 MHz core, 20 MHz bus)
S(E) Edge sensitive input
S(L) Level sensitive input
• A80960JD-33 (33.33 MHz core, 16.67 MHz bus)
The 132-pin Plastic Quad Flatpack (PQFP) devices
will be specified for operation at Vcc = 5.0 V ± 5%
over a case temperature range of 0° to 100°C:
A (...)
R (...)
Asynchronous. Inputs may be
asynchronous relative to CLKIN.
A(E) Edge sensitive input
A(L) Level sensitive input
• NG80960JD-40 (40 MHz core, 20 MHz bus)
• NG80960JD-33 (33.33 MHz core, 16.67 MHz bus)
While the processor’s RESET pin is
asserted, the pin:
For complete package specifications and infor-
mation, refer to Intel’s Packaging Handbook
(240800).
R(1) is driven to VCC
R(0) is driven to VSS
R(Q) is a valid output
R(X) is driven to unknown state
R(H) is pulled up to VCC
3.1 Pin Descriptions
H (...)
While the processor is in the hold state,
the pin:
This section describes the pins for the 80960JD in
the 132-pin ceramic Pin Grid Array (PGA) package
and 132-lead Plastic Quad Flatpack Package
(PQFP).
H(1) is driven to VCC
H(0) is driven to VSS
H(Q) Maintains previous state or
continues to be a valid output
H(Z) Floats
Section 3.1.1, Functional Pin Definitions
describes pin function; Section 3.1.2, 80960Jx 132-
Lead PGA Pinout and Section 3.1.3, 80960Jx
PQFP Pinout define the signal and pin locations for
the supported package types.
P (...)
While the processor is halted, the pin:
P(1) is driven to VCC
P(0) is driven to VSS
P(Q) Maintains previous state or
3.1.1 Functional Pin Definitions
continues to be a valid output
Table 2 presents the legend for interpreting the pin
descriptions which follow. Pins associated with the
bus interface are described in Table 3. Pins
associated with basic control and test functions are
described in Table 4. Pins associated with the
Interrupt Unit are described in Table 5.
6
PRELIMINARY
80960JD
Table 3. Pin Description — External Bus Signals (Sheet 1 of 4)
NAME
TYPE
DESCRIPTION
AD31:0
I/O
ADDRESS / DATA BUS carries 32-bit physical addresses and 8-, 16- or 32-bit data
S(L)
R(X)
H(Z)
P(Q)
to and from memory. During an address (T ) cycle, bits 31:2 contain a physical word
a
address (bits 0-1 indicate SIZE; see below). During a data (T ) cycle, read or write
d
data is present on one or more contiguous bytes, comprising AD31:24, AD23:16,
AD15:8 and AD7:0. During write operations, unused pins are driven to determinate
values.
SIZE, which comprises bits 0-1 of the AD lines during a T cycle, specifies the
a
number of data transfers during the bus transaction.
AD1
AD0
Bus Transfers
0
0
1
1
0
1
0
1
1 Transfer
2 Transfers
3 Transfers
4 Transfers
When the processor enters Halt mode, if the previous bus operation was a:
• write — AD31:2 are driven with the last data value on the AD bus.
• read — AD31:4 are driven with the last address value on the AD bus; AD3:2 are
driven with the value of A3:2 from the last data cycle.
Typically, AD1:0 reflect the SIZE information of the last bus transaction (either
instruction fetch or load/store) that was executed before entering Halt mode.
ALE
ALE
ADS
A3:2
O
ADDRESS LATCH ENABLE indicates the transfer of a physical address. ALE is
asserted during a T cycle and deasserted before the beginning of the T state. It is
R(0)
H(Z)
P(0)
a
d
active HIGH and floats to a high impedance state during a hold cycle (T ).
h
O
ADDRESS LATCH ENABLE indicates the transfer of a physical address. ALE is the
inverted version of ALE. This signal gives the 80960JD a high degree of compatibility
with existing 80960Kx systems.
R(1)
H(Z)
P(1)
O
ADDRESS STROBE indicates a valid address and the start of a new bus access.
R(1)
H(Z)
P(1)
The processor asserts ADS for the entire T cycle. External bus control logic typically
a
samples ADS at the end of the cycle.
O
ADDRESS3:2 comprise a partial demultiplexed address bus.
R(X)
H(Z)
P(Q)
32-bit memory accesses: the processor asserts address bits A3:2 during T . The
partial word address increments with each assertion of RDYRCV during a burst.
a
16-bit memory accesses: the processor asserts address bits A3:1 during Ta with A1
driven on the BE1 pin. The partial short word address increments with each assertion
of RDYRCV during a burst.
8-bit memory accesses: the processor asserts address bits A3:0 during T , with A1:0
a
driven on BE1:0. The partial byte address increments with each assertion of
RDYRCV during a burst.
PRELIMINARY
7
80960JD
Table 3. Pin Description — External Bus Signals (Sheet 2 of 4)
NAME
TYPE
DESCRIPTION
BE3:0
O
BYTE ENABLES select which of up to four data bytes on the bus participate in the
current bus access. Byte enable encoding is dependent on the bus width of the
memory region accessed:
R(1)
H(Z)
P(1)
32-bit bus:
BE3 enables data on AD31:24
BE2 enables data on AD23:16
BE1 enables data on AD15:8
BE0 enables data on AD7:0
16-bit bus:
BE3 becomes Byte High Enable (enables data on AD15:8)
BE2 is not used (state is high)
BE1 becomes Address Bit 1 (A1)
BE0 becomes Byte Low Enable (enables data on AD7:0)
8-bit bus:
BE3 is not used (state is high)
BE2 is not used (state is high)
BE1 becomes Address Bit 1 (A1)
BE0 becomes Address Bit 0 (A0)
The processor asserts byte enables, byte high enable and byte low enable during T .
a
Since unaligned bus requests are split into separate bus transactions, these signals
do not toggle during a burst. They remain active through the last Td cycle.
For accesses to 8- and 16-bit memory, the processor asserts the address bits in
conjunction with A3:2 described above.
WIDTH/
O
WIDTH/HALTED signals denote the physical memory attributes for a bus trans-
HLTD1:0
R(0)
H(Z)
P(1)
action:
WIDTH/HLTD1
WIDTH/HLTD0
0
0
1
1
0
1
0
1
8 Bits Wide
16 Bits Wide
32 Bits Wide
Processor Halted
The processor floats the WIDTH/HLTD pins whenever it relinquishes the bus in
response to a HOLD request, regardless of prior operating state.
D/C
O
DATA/CODE indicates that a bus access is a data access (1) or an instruction
R(X)
H(Z)
P(Q)
access (0). D/C has the same timing as W/R.
0 = instruction access
1 = data access
W/R
O
WRITE/READ specifies, during a T cycle, whether the operation is a write (1) or
a
R(0)
H(Z)
P(Q)
read (0). It is latched on-chip and remains valid during T cycles.
d
0 = read
1 = write
8
PRELIMINARY
80960JD
Table 3. Pin Description — External Bus Signals (Sheet 3 of 4)
NAME
DT/R
TYPE
DESCRIPTION
O
DATA TRANSMIT / RECEIVE indicates the direction of data transfer to and from the
R(0)
H(Z)
P(Q)
address/data bus. It is low during Ta and T /T cycles for a read; it is high during T
a
w
d
and Tw/T cycles for a write. DT/R never changes state when DEN is asserted.
d
0 = receive
1 = transmit
DEN
O
DATA ENABLE indicates data transfer cycles during a bus access. DEN is asserted
at the start of the first data cycle in a bus access and deasserted at the end of the last
data cycle. DEN is used with DT/R to provide control for data transceivers connected
to the data bus.
R(1)
H(Z)
P(1)
0 = data cycle
1 = not data cycle
BLAST
RDYRCV
O
BURST LAST indicates the last transfer in a bus access. BLAST is asserted in the
last data transfer of burst and non-burst accesses. BLAST remains active as long as
wait states are inserted via the RDYRCV pin. BLAST becomes inactive after the final
data transfer in a bus cycle.
R(1)
H(Z)
P(1)
0 = last data transfer
1 = not last data transfer
I
READY/RECOVER indicates that data on AD lines can be sampled or removed. If
S(L)
RDYRCV is not asserted during a T cycle, the Td cycle is extended to the next cycle
by inserting a wait state (T ).
w
d
0 = sample data
1 = don’t sample data
The RDYRCV pin has another function during the recovery (Tr) state. The processor
continues to insert additional recovery states until it samples the pin HIGH. This
function gives slow external devices more time to float their buffers before the
processor begins to drive address again.
0 = insert wait states
1 = recovery complete
LOCK/
ONCE
I/O
BUS LOCK indicates that an atomic read-modify-write operation is in progress. The
LOCK output is asserted in the first clock of an atomic operation and deasserted in
the last data transfer of the sequence. The processor does not grant HOLDA while it
is asserting LOCK. This prevents external agents from accessing memory involved in
semaphore operations.
S(L)
R(H)
H(Z)
P(1)
0 = Atomic read-modify-write in progress
1 = Atomic read-modify-write not in progress
ONCE MODE: The processor samples the ONCE input during reset. If it is asserted
LOW at the end of reset, the processor enters ONCE mode. In ONCE mode, the
processor stops all clocks and floats all output pins. The pin has a weak internal
pullup which is active during reset to ensure normal operation when the pin is left
unconnected.
0 = ONCE mode enabled
1 = ONCE mode not enabled
PRELIMINARY
9
80960JD
Table 3. Pin Description — External Bus Signals (Sheet 4 of 4)
NAME
TYPE
DESCRIPTION
HOLD
I
HOLD: A request from an external bus master to acquire the bus. When the
S(L)
processor receives HOLD and grants bus control to another master, it asserts
HOLDA, floats the address/data and control lines and enters the T state. When
h
HOLD is deasserted, the processor deasserts HOLDA and enters either the T or T
i
state, resuming control of the address/data and control lines.
a
0 = no hold request
1 = hold request
HOLDA
BSTAT
O
HOLD ACKNOWLEDGE indicates to an external bus master that the processor has
relinquished control of the bus. The processor can grant HOLD requests and enter
the Th state during reset and while halted as well as during regular operation.
R(Q)
H(1)
P(Q)
0 = hold not acknowledged
1 = hold acknowledged
O
BUS STATUS indicates that the processor may soon stall unless it has sufficient
access to the bus; see i960® Jx Microprocessor User’s Guide (272483). Arbitration
logic can examine this signal to determine when an external bus master should
acquire/relinquish the bus.
R(0)
H(Q)
P(0)
0 = no potential stall
1 = potential stall
Table 4. Pin Description — Processor Control Signals, Test Signals and Power (Sheet 1 of 2)
NAME
CLKIN
TYPE
I
DESCRIPTION
CLOCK INPUT provides the processor’s fundamental time base; the processor core
operates at twice the CLKIN rate while the external bus operates at the CLKIN rate.
All input and output timings are specified relative to a rising CLKIN edge.
RESET
I
RESET initializes the processor and clears its internal logic. During reset, the
processor places the address/data bus and control output pins in their idle (inactive)
states.
A(L)
During reset, the input pins are ignored with the exception of LOCK/ONCE, STEST
and HOLD.
The RESET pin has an internal synchronizer. To ensure predictable processor initial-
ization during power up, RESET must be asserted a minimum of 10,000 CLKIN
cycles with VCC and CLKIN stable. On a warm reset, RESET should be asserted for
a minimum of 15 cycles.
STEST
I
SELF TEST enables or disables the processor’s internal self-test feature at initial-
ization. STEST is examined at the end of reset. When STEST is asserted, the
processor performs its internal self-test and the external bus confidence test. When
STEST is deasserted, the processor performs only the external bus confidence test.
S(L)
0 = self test disabled
1 = self test enabled
10
PRELIMINARY
80960JD
Table 4. Pin Description — Processor Control Signals, Test Signals and Power (Sheet 2 of 2)
NAME
FAIL
TYPE
DESCRIPTION
O
FAIL indicates a failure of the processor’s built-in self-test performed during initial-
ization. FAIL is asserted immediately upon reset and toggles during self-test to
indicate the status of individual tests:
R(0)
H(Q)
P(1)
• When self-test passes, the processor deasserts FAIL and begins operation from
user code.
• When self-test fails, the processor asserts FAIL and then stops executing.
0 = self test failed
1 = self test passed
TCK
I
TEST CLOCK is a CPU input which provides the clocking function for IEEE 1149.1
Boundary Scan Testing (JTAG). State information and data are clocked into the
processor on the rising edge; data is clocked out of the processor on the falling edge.
TDI
I
TEST DATA INPUT is the serial input pin for JTAG. TDI is sampled on the rising
S(L)
edge of TCK, during the SHIFT-IR and SHIFT-DR states of the Test Access Port.
TDO
O
TEST DATA OUTPUT is the serial output pin for JTAG. TDO is driven on the falling
edge of TCK during the SHIFT-IR and SHIFT-DR states of the Test Access Port. At
other times, TDO floats. TDO does not float during ONCE mode.
R(Q)
HQ)
P(Q)
TRST
I
TEST RESET asynchronously resets the Test Access Port (TAP) controller function
of IEEE 1149.1 Boundary Scan testing (JTAG). When using the Boundary Scan
feature, connect a pulldown resistor between this pin and VSS. If TAP is not used,
this pin must be connected to VSS; however, no resistor is required. See Section 4.3,
Connection Recommendations (pg. 24).
A(L)
TMS
I
TEST MODE SELECT is sampled at the rising edge of TCK to select the operation
S(L)
of the test logic for IEEE 1149.1 Boundary Scan testing.
VCC
–
–
POWER pins intended for external connection to a VCC board plane.
VCCPLL
PLL POWER is a separate VCC supply pin for the phase lock loop clock generator. It
is intended for external connection to the VCC board plane. In noisy environments,
add a simple bypass filter circuit to reduce noise-induced clock jitter and its effects
on timing relationships.
VSS
NC
–
–
GROUND pins intended for external connection to a VSS board plane.
NO CONNECT pins. Do not make any system connections to these pins.
PRELIMINARY
11
80960JD
Table 5. Pin Description — Interrupt Unit Signals
NAME
TYPE
DESCRIPTION
XINT7:0
I
EXTERNAL INTERRUPT pins are used to request interrupt service. The XINT7:0
A(E/L)
pins can be configured in three modes:
Dedicated Mode: Each pin is assigned a dedicated interrupt level. Dedicated inputs
can be programmed to be level (low) or edge (falling) sensitive.
Expanded Mode: All eight pins act as a vectored interrupt source. The interrupt pins
are level sensitive in this mode.
Mixed Mode:
The XINT7:5 pins act as dedicated sources and the XINT4:0 pins
act as the five most significant bits of a vectored source. The
least significant bits of the vectored source are set to 0102
internally.
Unused external interrupt pins should be connected to VCC
.
NMI
I
NON-MASKABLE INTERRUPT causes a non-maskable interrupt event to occur.
A(E)
NMI is the highest priority interrupt source and is falling edge-triggered. If NMI is
unused, it should be connected to VCC
.
12
PRELIMINARY
80960JD
3.1.2 80960Jx 132-Lead PGA Pinout
1
2
3
4
5
6
7
8
9
10
11
12
13
14
P
P
AD22 AD19 AD18 VCC
VCC
VCC
VCC
VCC
VCC
VCC AD13
AD11 AD6
AD25
N
N
AD27 AD26 AD24 AD20 VSS
VSS
VSS
VSS
VSS
VSS
VSS AD10 AD7
AD3
M
M
AD23 AD21
AD12
AD9
AD17
AD16 AD15 AD14
AD8 AD4
AD5 AD1
AD0
VCC
AD30 AD29 NC
L
K
J
L
K
J
BE2
VCC
BE3
VSS
AD28
AD31
VSS
VCC
AD2
NC
VSS
VCC
VCC
VSS
BE1
BE0
H
G
F
H
G
F
VCCPLL VSS CLKIN
VCC
VSS
VCC
VSS ALE
NC
VSS
VCC
BSTAT
DEN
VCC
VSS
RDYRCV VSS
RESET VSS
VCC
VCC
VCC
E
D
E
D
VCC
VSS
VCC
VSS DT/R
VSS
TDI
C
B
A
C
B
A
LOCK/
ONCE
HOLDA BLAST A3
A2
FAIL
VSS
VCC
NC
VSS
VCC
HOLD XINT1 XINT0 TRST STEST NC
NC
XINT4 TCK
XINT3
NC
W/R
D/C WIDTH/ TDO NC
HLTD0
VSS
VSS XINT6
ALE
NC
NC
ADS WIDTH/
HLTD1
VCC VCC
NMI XINT7 XINT5 XINT2 TMS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Figure 3. 132-Lead Pin Grid Array Bottom View - Pins Facing Up
PRELIMINARY
13
80960JD
A
B
C
D
E
F
G
H
J
K
L
M
N
P
14
14
TMS
NC
NC
VCC
VSS
TDI
VCC
VCC
VCC CLKIN VCC
VCC
VSS
AD2
VCC
AD1
AD5
AD0
AD4
AD3
AD7
AD6
13
12
13
12
XINT2 TCK STEST
VSS
VSS
VSS
VSS
VSS
NC
AD11
XINT5 XINT3 TRST
XINT7 XINT4 XINT0
RESET RDYRCV NC
AD8
AD9
AD10 AD13
VCCPLL
11
10
9
11
10
9
VSS
VCC
AD12
VSS
VCC
NMI
VCC
XINT6 XINT1
HOLD
NC
VSS
VSS
VSS
AD14
AD15
VSS
VSS
VSS
VCC
VCC
VCC
A80960JD
8
8
VCC
7
7
M
© 19xx
AD16
NC
VCC
i
6
5
6
5
FAIL
A2
VCC
NC
VSS
NC
AD17 VSS
XXXXXXXX A2
VCC
AD21
VSS
VCC
4
4
A3
NC
TDO
AD23 AD20 AD18
3
2
1
3
2
1
BSTAT ALE
BE0
VSS
VCC
BE1
VSS
VCC
AD31 AD28
AD19
AD22
AD24
AD26
WIDTH/
HLTD0
NC
BLAST
ALE
DT/R
DEN
WIDTH/
HLTD1
HOLDA VSS
D/C
VSS
VSS
VSS
VSS
BE3
BE2
AD29
ADS
VCC
VCC
VCC
VCC
VCC
AD30 AD27 AD25
W/R LOCK/
ONCE
A
B
C
D
E
F
G
H
J
K
L
M
N
P
Figure 4. 132-Lead Pin Grid Array Top View - Pins Facing Down
14
PRELIMINARY
80960JD
Table 6. 132-Lead PGA Pinout — In Signal Order
Signal
A2
Pin
C5
Signal
AD31
ADS
Pin
K3
Signal
TDI
Pin
D12
B4
Signal
VSS
Pin
B9
A3
C4
A1
TDO
TMS
TRST
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCCPLL
VSS
VSS
D2
AD0
M14
L13
K12
N14
M13
L12
P14
N13
M12
M11
N12
P13
M10
P12
M9
ALE
G3
A3
A14
C12
A6
VSS
D13
E2
AD1
ALE
VSS
AD2
BE0
H3
VSS
E13
F2
AD3
BE1
J3
A7
VSS
AD4
BE2
L1
A8
VSS
F13
G2
AD5
BE3
L2
A9
VSS
AD6
BLAST
BSTAT
CLKIN
D/C
C3
D1
VSS
G13
H2
AD7
F3
D14
E1
VSS
AD8
H14
B2
VSS
H13
J2
AD9
E14
F1
VSS
AD10
AD11
AD12
AD13
AD14
AD15
AD16
AD17
AD18
AD19
AD20
AD21
AD22
AD23
AD24
AD25
AD26
AD27
AD28
AD29
AD30
DEN
DT/R
FAIL
E3
VSS
J13
K2
D3
F14
G1
G14
H1
VSS
C6
VSS
K13
N5
HOLD
HOLDA
LOCK/ONCE
NC
C9
VSS
C2
VSS
N6
M8
C1
J1
VSS
N7
M7
A4
J14
K1
VSS
N8
M6
NC
A5
VSS
N9
P4
NC
B5
K14
L14
P5
VSS
N10
N11
B1
P3
NC
B14
C7
VSS
N4
NC
W/R
M5
NC
C8
P6
WIDTH/HLTD0
WIDTH/HLTD1
XINT0
XINT1
XINT2
XINT3
XINT4
XINT5
XINT6
XINT7
B3
P2
NC
C14
G12
J12
M3
A10
F12
E12
C13
B13
P7
A2
M4
NC
P8
C11
C10
A13
B12
B11
A12
B10
A11
N3
NC
P9
P1
NC
P10
P11
H12
B6
N2
NMI
N1
RDYRCV
RESET
STEST
TCK
L3
M2
VSS
B7
M1
VSS
B8
NOTE: Do not connect any external logic to pins marked NC (no connect pins).
PRELIMINARY
15
80960JD
Table 7. 132-Lead PGA Pinout — In Pin Order
Pin
A1
Signal
ADS
Pin
C6
Signal
FAIL
NC
Pin
H1
Signal
VCC
Pin
M10
M11
M12
M13
M14
N1
Signal
AD12
AD9
AD8
AD4
AD0
AD27
AD26
AD24
AD20
VSS
A2
WIDTH/HLTD1
ALE
C7
H2
VSS
A3
C8
NC
H3
BE0
A4
NC
C9
HOLD
XINT1
XINT0
TRST
STEST
NC
H12
H13
H14
J1
VCCPLL
VSS
A5
NC
C10
C11
C12
C13
C14
D1
A6
VCC
CLKIN
VCC
A7
VCC
N2
A8
VCC
J2
VSS
N3
A9
VCC
J3
BE1
N4
A10
A11
A12
A13
A14
B1
NMI
VCC
J12
J13
J14
K1
NC
N5
XINT7
XINT5
XINT2
TMS
D2
VSS
VSS
N6
VSS
D3
DT/R
TDI
VCC
N7
VSS
D12
D13
D14
E1
VCC
N8
VSS
VSS
K2
VSS
N9
VSS
W/R
VCC
K3
AD31
AD2
N10
N11
N12
N13
N14
P1
VSS
B2
D/C
VCC
K12
K13
K14
L1
VSS
B3
WIDTH/HLTD0
TDO
E2
VSS
VSS
AD10
AD7
AD3
AD25
AD22
AD19
AD18
VCC
B4
E3
DEN
RESET
VSS
VCC
B5
NC
E12
E13
E14
F1
BE2
B6
VSS
L2
BE3
B7
VSS
VCC
L3
AD28
AD5
P2
B8
VSS
VCC
L12
L13
L14
M1
M2
M3
M4
M5
M6
M7
M8
M9
P3
B9
VSS
F2
VSS
AD1
P4
B10
B11
B12
B13
B14
C1
XINT6
XINT4
XINT3
TCK
F3
BSTAT
RDYRCV
VSS
VCC
P5
F12
F13
F14
G1
AD30
AD29
NC
P6
VCC
P7
VCC
VCC
P8
VCC
NC
VCC
AD23
AD21
AD17
AD16
AD15
AD14
P9
VCC
LOCK/ONCE
HOLDA
BLAST
A3
G2
VSS
P10
P11
P12
P13
P14
VCC
C2
G3
ALE
VCC
C3
G12
G13
G14
NC
AD13
AD11
AD6
C4
VSS
C5
A2
VCC
NOTE: Do not connect any external logic to pins marked NC (no connect pins).
16
PRELIMINARY
80960JD
3.1.3 80960Jx PQFP Pinout
AD9
VCC (I/O)
SS (I/O)
AD10
AD11
TRST
TCK
TMS
HOLD
XINT0
XINT1
XINT2
1
99
98
2
3
4
5
6
7
V
97
96
95
94
93
V
V
V
CC (I/O)
SS (I/O)
CC (Core)
XINT3
VCC (I/O)
SS (I/O)
XINT4
XINT5
XINT6
92
91
90
8
9
10
VSS (Core)
AD12
V
89
88
87
86
85
84
83
82
81
80
79
78
11
12
13
14
15
16
17
18
19
20
21
22
AD13
AD14
AD15
V
CC (I/O)
XINT7
NMI
VSS (I/O)
AD16
VCC (Core)
SS (Core)
V
®
AD17
AD18
AD19
NC
NC
i960
VCC (I/O)
NC
NC
NC
FAIL
ALE
TDO
VSS (I/O)
AD20
AD21
AD22
NG80960JX
77
76
75
74
73
72
71
23
24
25
26
27
28
29
XXXXXXXX A2
AD23
VCC (Core)
VSS (Core)
V
V
CC (I/O)
SS(I/O)
WIDTH/HLTD1
CC(Core)
SS (Core)
M
© 19xx
i
V
V
CC (I/O)
SS (I/O)
V
AD24
70
69
68
67
30
31
32
33
V
WIDTH/HLTD0
A2
AD25
AD26
NC
A3
Figure 5. 132-Lead PQFP - Top View
PRELIMINARY
17
80960JD
Table 8. 132-Lead PQFP Pinout — In Signal Order
Signal
Pin
60
Signal
ALE
Pin
24
36
33
32
55
54
53
52
28
31
35
37
42
43
34
132
50
4
Signal
Pin
47
Signal
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
VSS (I/O)
NC
Pin
10
27
40
48
56
64
71
79
85
93
97
106
112
131
18
19
20
21
22
67
121
122
126
127
14
13
12
11
8
AD31
AD30
AD29
AD28
AD27
AD26
AD25
AD24
AD23
AD22
AD21
AD20
AD19
AD18
AD17
AD16
AD15
AD14
AD13
AD12
AD11
AD10
AD9
VCC (Core)
VCC (Core)
61
ADS
59
62
A3
V
CC (Core)
CC (Core)
74
63
A2
V
92
66
BE3
VCC (Core)
VCC (Core)
VCC (Core)
VCC (I/O)
113
115
123
9
68
BE2
69
BE1
70
BE0
75
WIDTH/HLTD1
WIDTH/HLTD0
D/C
V
CC (I/O)
CC (I/O)
26
76
V
41
77
VCC (I/O)
VCC (I/O)
VCC (I/O)
VCC (I/O)
VCC (I/O)
VCC (I/O)
VCC (I/O)
49
78
W/R
57
81
DT/R
65
82
DEN
72
83
BLAST
RDYRCV
LOCK/ONCE
HOLD
HOLDA
BSTAT
CLKIN
RESET
STEST
FAIL
80
84
86
NC
87
94
NC
88
VCC (I/O)
VCC (I/O)
VCC (I/O)
VCC (I/O)
98
NC
89
44
51
117
125
128
23
2
105
111
129
119
118
17
NC
90
NC
95
NC
96
VCCPLL
NC
99
V
SS (CLK)
NC
AD8
100
101
102
103
104
107
108
109
110
45
VSS (Core)
NC
AD7
TCK
V
V
V
SS (Core)
SS (Core)
SS (Core)
30
XINT7
XINT6
XINT5
XINT4
XINT3
XINT2
XINT1
XINT0
NMI
AD6
TDI
130
25
1
38
AD5
TDO
46
AD4
TRST
TMS
VSS (Core)
SS (Core)
58
AD3
3
V
73
AD2
V
CC (CLK)
120
16
29
39
VSS (Core)
VSS (Core)
VSS (Core)
VSS (Core)
91
7
AD1
V
V
V
CC (Core)
CC (Core)
CC (Core)
114
116
124
6
AD0
5
ALE
15
NOTE: Do not connect any external logic to pins marked NC (no connect pins).
18
PRELIMINARY
80960JD
Table 9. 132-Lead PQFP Pinout — In Pin Order
Pin
1
Signal
TRST
TCK
Pin
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
Signal
BLAST
D/C
Pin
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
Signal
NC
Pin
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
Signal
AD8
AD7
2
AD26
3
TMS
ADS
AD25
AD6
4
HOLD
XINT0
XINT1
XINT2
XINT3
W/R
AD24
AD5
5
VSS (Core)
VCC (Core)
VSS (I/O)
VCC (I/O)
DT/R
VSS (I/O)
VCC (I/O)
VSS (Core)
VCC (Core)
AD23
AD4
6
VCC (I/O)
VSS (I/O)
AD3
7
8
9
VCC (I/O)
AD2
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
V
SS (I/O)
XINT4
XINT5
XINT6
XINT7
NMI
DEN
AD22
AD1
HOLDA
ALE
AD21
AD0
AD20
VCC (I/O)
VSS (I/O)
VCC (Core)
VSS (Core)
VCC (Core)
VSS (Core)
CLKIN
VSS (CLK)
VCCPLL
VCC (CLK)
NC
VSS (Core)
VCC (Core)
VSS (I/O)
VCC (I/O)
LOCK/ONCE
BSTAT
BE0
VSS (I/O)
VCC (I/O)
AD19
V
CC (Core)
SS (Core)
NC
AD18
V
AD17
AD16
NC
VSS (I/O)
VCC (I/O)
AD15
NC
BE1
NC
BE2
NC
BE3
AD14
FAIL
VSS (I/O)
VCC (I/O)
AD13
NC
ALE
AD12
VCC (Core)
VSS (Core)
RESET
NC
TDO
V
SS (Core)
VSS (Core)
VCC (Core)
VSS (I/O)
VCC (I/O)
VCC (Core)
AD31
VSS (I/O)
WIDTH/HLTD1
AD30
VCC (I/O)
NC
V
CC (Core)
SS (Core)
AD29
AD11
STEST
VCC (I/O)
TDI
V
AD28
AD10
WIDTH/HLTD0
VSS (I/O)
VSS (I/O)
VCC (I/O)
AD9
A2
A3
VCC (I/O)
VSS (I/O)
RDYRCV
AD27
NOTE: Do not connect any external logic to pins marked NC (no connect pins).
PRELIMINARY
19
80960JD
TJ = TC + P (θJC
)
3.2 Package Thermal Specifications
Similarly, if TA is known, the corresponding case
temperature (TC) can be calculated as follows:
The 80960JD is specified for operation when TC
(case temperature) is within the range of 0°C to 85°C
for the (PGA) 80960JD-50, or 0°C to 100°C for the
(PQFP and PGA) 80960JD-40 and 80960JD-33.
Case temperature may be measured in any
environment to determine whether the 80960JD is
within specified operating range. The case temper-
ature should be measured at the center of the top
surface, opposite the pins.
T
C = TA + P (θCA
Compute P by multiplying ICC from Table 13 and
CC. Values for θJC and θCA are given in Table 10
)
V
for the PGA package and Table 11 for the PQFP
package. For high speed operation, the processor’s
θJA may be significantly reduced by adding
a
heatsink and/or by increasing airflow.
θCA is the thermal resistance from case to ambient.
Use the following equation to calculate TA, the
maximum ambient temperature to conform to a
particular case temperature:
Figure 6 shows the maximum ambient temperature
(TA) permitted without exceeding TC for the
80960JD-50 in a PGA package. Figure 7 illustrates
this for the 80960JD-40 in PGA and PQFP
packages. The curves are based on minimum ICC
(hot) and maximum VCC of +5.25 V, with a TCASE of
+85°C for the 80960JD-50, or a TCASE of +100°C for
the 80960JD-40.
T
A = TC - P (θCA)
Junction temperature (TJ) is commonly used in
reliability calculations. TJ can be calculated from θJC
(thermal resistance from junction to case) using the
following equation:
Table 10. 132-Lead PGA Package Thermal Characteristics
Thermal Resistance — °C/Watt
Airflow — ft./min (m/sec)
200 400 600 800
(1.01) (2.03) (3.04) (4.06) (5.08)
Parameter
0
1000
(0)
θJC (Junction-to-Case)
3
3
3
12
9
3
11
8
3
11
8
3
11
8
θCA (Case-to-Ambient) (No Heatsink)
18
15
14
15
12
11
θCA (Case-to-Ambient) (Omnidirectional Heatsink)
θCA (Case-to-Ambient) (Unidirectional Heatsink)
8
7
7
7
θJA
θCA
θJC
θJ-PIN
θJ-CAP
NOTES:
1. This table applies to a PGA device plugged into a socket or soldered directly into a board.
2.
3.
4.
5.
θ
θ
θ
θ
= θ + θ
JC
JA
CA
= 4°C/W (approx.)
J-CAP
J-PIN
J-PIN
= 4°C/W (inner pins) (approx.)
= 8°C/W (outer pins) (approx.)
20
PRELIMINARY
80960JD
Table 11. 132-Lead PQFP Package Thermal Characteristics
Thermal Resistance — °C/Watt
Airflow — ft./min (m/sec)
Parameter
0
50
100
200
400
600
800
(0)
(0.25)
(0.50)
(1.01)
(2.03)
(3.04)
(4.06)
θJC (Junction-to-Case)
6
7
7
7
7
7
9
7
8
θCA (Case-to-Ambient -No Heatsink)
23
20
18
14
10
θCA
θJC
θJA
θJB
θJL
NOTES:
1. This table applies to a PQFP device soldered directly into board.
2.
3.
4.
θ
θ
θ
= θ
+ θ
JA
JL
JB
JC CA
= 18°C/W (approx.)
= 18°C/W (approx.)
65
60
55
50
45
40
35
30
0
100
200
300
400
500
600
700
800
AIRFLOW (ft/min)
PGA with unidirectional heatsink
PGA with no heatsink
PGA with omnidirectional heatsink
Figure 6. 50 MHz Maximum Allowable Ambient Temperature
PRELIMINARY
21
80960JD
85
80
75
70
65
60
55
50
45
40
0
50
100
200
300
400
500
600
PGA with unidirectional heatsink
700
800
AIRFLOW (ft/min)
PQFP
PGA with no heatsink
PGA with omnidirectional heatsink
Figure 7. 40 MHz Maximum Allowable Ambient Temperature
2. Wakefield Engineering
3.3 Thermal Management
Accessories
60 Audubon Road
Wakefield, MA 01880
(617) 245-5900
The following is a list of suggested sources for
80960JD thermal solutions. This is neither an
endorsement or a warranty of the performance of
any of the listed products and/or companies.
3. Aavid Thermal Technologies, Inc.
One Kool Path
Laconia, NH 03247-0400
(603) 528-3400
Heatsinks
1. Thermalloy, Inc.
2021 West Valley View Lane
Dallas, TX 75234-8993
(214) 243-4321 FAX: (214) 241-4656
22
PRELIMINARY
80960JD
4.0 ELECTRICAL SPECIFICATIONS
4.1 Absolute Maximum Ratings
NOTICE: This data sheet contains preliminary information
on new products in production. The specifications are
subject to change without notice.
Parameter
Maximum Rating
Storage Temperature............................. –65° C to +150° C
WARNING: Stressing the device beyond the
“Absolute Maximum Ratings” may cause perma-
nent damage. These are stress ratings only. Opera-
tion beyond the “Operating Conditions” is not
recommended and extended exposure beyond the
“Operating Conditions” may affect device reliability.
Case Temperature Under Bias .............. –65° C to +110° C
Supply Voltage wrt. V ..............................–0.5V to + 4.6V
SS
Voltage on Other Pins wrt. V ........... –0.5V to V
+ 0.5V
CC
SS
4.2 Operating Conditions
Table 12. 80960JD Operating Conditions
Symbol
Parameter
Supply Voltage
Min
Max
Units
Notes
V
CC
80960JD-50
80960JD-40
80960JD-33
4.75
4.75
4.75
5.25
5.25
5.25
V
f
Input Clock Frequency
CLKIN
80960JD-50
80960JD-40
80960JD-33
8
8
8
25
20
16.67
MHz
TC
Operating Case Temperature
A80960JD-50 (132 PGA)
A80960JD-40 (132 PGA)
A80960JD-33 (132 PGA)
0
0
0
85
100
100
°C
NG80960JD-40 (132 PQFP)
NG80960JD-33 (132 PQFP)
0
0
100
100
PRELIMINARY
23
80960JD
Pay special attention to the Test Reset (TRST) pin. It
is essential that the JTAG Boundary Scan Test
Access Port (TAP) controller initializes to a known
state whether it will be used or not. If the JTAG
Boundary Scan function will be used, connect a
pulldown resistor between the TRST pin and VSS. If
the JTAG Boundary Scan function will not be used
(even for board-level testing), connect the TRST pin
to VSS. Also, do not connect the TDI, TDO, and TCK
pins if the TAP Controller will not be used.
4.3 Connection Recommendations
For clean on-chip power distribution, VCC and VSS
pins separately feed the device’s functional units.
Power and ground connections must be made to all
80960JD power and ground pins. On the circuit
board, every VCC pin should connect to a power
plane and every VSS pin should connect to a ground
plane. Place liberal decoupling capacitance near the
80960JD, since the processor can cause transient
power surges.
Pins identified as NC must not be connected in
the system.
4.4 DC Specifications
Table 13. 80960JD DC Characteristics
Symbol
VIL
Parameter
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Min
-0.3
2.0
Typ
Max
0.8
Units
Notes
V
V
V
V
VIH
VCC + 0.3
0.45
VOL
VOH
IOL = 5 mA
IOH = -1 mA
OH = -200 µA
2.4
V
CC - 0.5
I
VOLP
CIN
Output Ground Bounce
< 0.8
V
(1,2)
Input Capacitance
PGA
PQFP
f
= fMIN (2)
= fMIN (2)
CLKIN
12
10
pF
COUT
I/O or Output Capacitance
PGA
PQFP
f
CLKIN
12
10
pF
pF
CCLK
CLKIN Capacitance
PGA
PQFP
12
10
f
= fMIN (2)
CLKIN
NOTES:
1. Typical is measured with VCC = 5.0V and temperature = 25 °C.
2. Not tested.
24
PRELIMINARY
80960JD
Table 14. 80960JD ICC Characteristics
Symbol
Parameter
Typ
Max
Units
Notes
0 ≤ VIN ≤ VCC
ILI1
Input Leakage Current for
each pin except TCK, TDI,
TRST and TMS
± 1
µA
ILI2
ILO
Input Leakage Current for
TCK, TDI, TRST and TMS
-140
-250
± 1
µA
VIN = 0.45V (1)
Output Leakage Current
µA
0.4 ≤ VOUT ≤ VCC
ICC Active
(Power Supply)
80960JD-50
80960JD-40
80960JD-33
640
530
450
mA
(2,3)
(2,3)
(2,3)
ICC Active
(Thermal)
80960JD-50
80960JD-40
80960JD-33
525
430
365
mA
mA
(2,4)
(2,4)
(2,4)
ICC Test
Reset mode
80960JD-50
80960JD-40
80960JD-33
(Power modes)
510
430
370
(5)
(5)
(5)
Halt mode
80960JD-50
80960JD-40
80960JD-33
48
41
36
(5)
(5)
(5)
ONCE mode
10
(5)
NOTES:
1. These pins have internal pullup devices. Typical leakage current is not tested.
2. Measured with device operating and outputs loaded to the test condition in Figure 8, AC Test Load (pg.
33).
3. ICC Active (Power Supply) value is provided for selecting your system’s power supply. It is measured
using one of the worst case instruction mixes with V
tested.
= 5.25V. This parameter is characterized but not
CC
4.
I
CC Active (Thermal) value is provided for your system’s thermal management. Typical ICC is measured
with VCC = 5.0V and temperature = 25° C. This parameter is characterized but not tested.
5. ICC Test (Power modes) refers to the ICC values that are tested when the 80960JD is in Reset mode,
Halt mode or ONCE mode with V
= 5.25V.
CC
PRELIMINARY
25
80960JD
4.5 AC Specifications
The 80960JD AC timings are based upon device characterization.
Table 15. 80960JD AC Characteristics (50 MHz) (Sheet 1 of 2)
Symbol
Parameter
Min
Max
Units
Notes
INPUT CLOCK TIMINGS
TF
CLKIN Frequency
8
25
MHz
ns
TC
CLKIN Period
40
125
TCS
TCH
TCL
TCR
TCF
CLKIN Period Stability
CLKIN High Time
CLKIN Low Time
CLKIN Rise Time
CLKIN Fall Time
± 250
ps
(1, 2)
16
16
ns
Measured at 1.5 V (1)
Measured at 1.5 V (1)
0.8 V to 2.0 V (1)
ns
25
5
ns
ns
2.0 V to 0.8 V (1)
SYNCHRONOUS OUTPUT TIMINGS
TOV1
Output Valid Delay, Except
ALE/ALE Inactive and DT/R
3.5
17
ns
(3)
(4)
TOV2
TOF
Output Valid Delay, DT/R
Output Float Delay
0.5TC + 3.5 0.5TC + 17
3.5 15
ns
ns
SYNCHRONOUS INPUT TIMINGS
TIS1
TIH1
TIS2
TIH2
TIS3
TIH3
TIS4
TIH4
NOTE:
Input Setup to CLKIN —
AD31:0, NMI, XINT7:0
8
ns
ns
ns
ns
ns
ns
ns
ns
(5)
(5)
(6)
(6)
(7)
(7)
(8)
(8)
Input Hold from CLKIN —
AD31:0, NMI, XINT7:0
2
9
1
8
2
8
Input Setup to CLKIN —
RDYRCV and HOLD
Input Hold from CLKIN —
RDYRCV and HOLD
Input Setup to CLKIN —
RESET
Input Hold from CLKIN —
RESET
Input Setup to RESET —
ONCE, STEST
Input Hold from RESET —
ONCE, STEST
2
See Table 16 on page 28 for note definitions for this table.
26
PRELIMINARY
80960JD
Table 15. 80960JD AC Characteristics (50 MHz) (Sheet 2 of 2)
Symbol
Parameter
Min
Max
Units
Notes
RELATIVE OUTPUT TIMINGS
TLXL
TLXA
ALE/ALE Width
(9)
Address Hold from ALE/ALE
Inactive
Equal Loading (9)
0.5TC - 7.5
ns
TDXD
DT/R Valid to DEN Active
Equal Loading (9)
BOUNDARY SCAN TEST SIGNAL TIMINGS
TBSF
TCK Frequency
TCK High Time
TCK Low Time
TCK Rise Time
TCK Fall Time
0.5TF
MHz
ns
TBSCH
TBSCL
TBSCR
TBSCF
TBSIS1
TBSIH1
15
15
5
Measured at 1.5 V (1)
Measured at 1.5 V (1)
0.8 V to 2.0 V (1)
ns
ns
5
ns
2.0 V to 0.8 V (1)
Input Setup to TCK — TDI, TMS
4
6
ns
Input Hold from TCK — TDI,
TMS
ns
TBSOV1
TBSOF1
TBSOV2
TDO Valid Delay
TDO Float Delay
3
3
3
30
30
30
ns
ns
ns
(1,10)
(1,10)
(1,10)
All Outputs (Non-Test) Valid
Delay
TBSOF2
TBSIS2
TBSIH2
NOTE:
All Outputs (Non-Test) Float
Delay
3
4
6
30
ns
ns
ns
(1,10)
Input Setup to TCK — All Inputs
(Non-Test)
Input Hold from TCK — All
Inputs (Non-Test)
See Table 16 on page 28 for note definitions for this table.
PRELIMINARY
27
80960JD
NOTES:
Table 16. Note Definitions for Table 15, 80960JD AC Characteristics (50 MHz) (pg. 26)
1. Not tested.
2. To ensure a 1:1 relationship between the amplitude of the input jitter and the internal clock, the jitter
frequency spectrum should not have any power peaking between 500 KHz and 1/3 of the CLKIN
frequency.
3. Inactive ALE/ALE refers to the falling edge of ALE and the rising edge of ALE. For inactive ALE/ALE
timings, refer to Relative Output Timings in this table.
4. A float condition occurs when the output current becomes less than I . Float delay is not tested, but is
LO
designed to be no longer than the valid delay.
5. AD31:0 are synchronous inputs. Setup and hold times must be met for proper processor operation. NMI
and XINT7:0 may be synchronous or asynchronous. Meeting setup and hold time guarantees recog-
nition at a particular clock edge. For asynchronous operation, NMI and XINT7:0 must be asserted for a
minimum of two CLKIN periods to guarantee recognition.
6. RDYRCV and HOLD are synchronous inputs. Setup and hold times must be met for proper processor
operation.
7. RESET may be synchronous or asynchronous. Meeting setup and hold time guarantees recognition at a
particular clock edge.
8. ONCE and STEST must be stable at the rising edge of RESET for proper operation.
9. Guaranteed by design. May not be 100% tested.
10. Relative to falling edge of TCK.
Table 17. 80960JD AC Characteristics (40 MHz) (Sheet 1 of 3)
Symbol
Parameter
Min
Max
Units
Notes
INPUT CLOCK TIMINGS
TF
CLKIN Frequency
8
20
MHz
ns
TC
CLKIN Period
50
125
TCS
TCH
CLKIN Period Stability
CLKIN High Time
±250
ps
(1, 2)
20
20
ns
Measured at
1.5 V (1)
TCL
TCR
TCF
CLKIN Low Time
CLKIN Rise Time
CLKIN Fall Time
ns
ns
ns
Measured at
1.5 V (1)
7
7
0.8 V to 2.0
V (1)
2.0 V to 0.8
V (1)
SYNCHRONOUS OUTPUT TIMINGS
TOV1
Output Valid Delay, Except ALE/ALE
Inactive and DT/R
3.5
18
ns
(3)
28
PRELIMINARY
80960JD
Notes
Table 17. 80960JD AC Characteristics (40 MHz) (Sheet 2 of 3)
Symbol
TOV2
Parameter
Output Valid Delay, DT/R
Output Float Delay
Min
0.5TC + 3.5
3.5
Max
0.5TC + 18
16
Units
ns
TOF
ns
(4)
SYNCHRONOUS INPUT TIMINGS
TIS1
TIH1
TIS2
TIH2
Input Setup to CLKIN — AD31:0, NMI,
XINT7:0
8
2
9
1
ns
ns
ns
ns
(5)
(5)
(6)
(6)
Input Hold from CLKIN — AD31:0, NMI,
XINT7:0
Input Setup to CLKIN — RDYRCV and
HOLD
Input Hold from CLKIN — RDYRCV and
HOLD
TIS3
TIH3
TIS4
TIH4
Input Setup to CLKIN — RESET
8
2
8
2
ns
ns
ns
ns
(7)
(7)
(8 )
(8)
Input Hold from CLKIN — RESET
Input Setup to RESET — ONCE, STEST
Input Hold from RESET — ONCE,
STEST
RELATIVE OUTPUT TIMINGS
TLXL
TLXA
ALE/ALE Width
(9)
Address Hold from ALE/ALE Inactive
Equal
Loading (9)
0.5TC - 7.5
ns
TDXD
DT/R Valid to DEN Active
Equal
Loading (9)
BOUNDARY SCAN TEST SIGNAL TIMINGS
0.5TF
TBSF
TCK Frequency
TCK High Time
MHz
ns
TBSCH
15
Measured at
1.5 V (1)
TBSCL
TBSCR
TBSCF
TCK Low Time
TCK Rise Time
TCK Fall Time
15
ns
ns
ns
Measured at
1.5 V (1)
5
5
0.8 V to 2.0
V (1)
2.0 V to 0.8
V (1)
TBSIS1
TBSIH1
TBSOV1
TBSOF1
Input Setup to TCK — TDI, TMS
Input Hold from TCK — TDI, TMS
TDO Valid Delay
4
6
3
3
ns
ns
ns
ns
30
30
(1, 10)
(1, 10)
TDO Float Delay
PRELIMINARY
29
80960JD
Table 17. 80960JD AC Characteristics (40 MHz) (Sheet 3 of 3)
Symbol
TBSOV2
TBSOF2
TBSIS2
Parameter
Min
3
Max
30
Units
ns
Notes
(1, 10)
(1, 10)
All Outputs (Non-Test) Valid Delay
All Outputs (Non-Test) Float Delay
3
30
ns
Input Setup to TCK — All Inputs (Non-
Test)
4
ns
TBSIH2
Input Hold from TCK — All Inputs (Non-
Test)
6
ns
NOTES:
1. Not tested.
2. To ensure a 1:1 relationship between the amplitude of the input jitter and the internal clock, the jitter
frequency spectrum should not have any power peaking between 500 KHz and 1/3 of the CLKIN
frequency.
3. Inactive ALE/ALE refers to the falling edge of ALE and the rising edge of ALE. For inactive ALE/ALE
timings, refer to Relative Output Timings in this table.
4. A float condition occurs when the output current becomes less than I . Float delay is not tested, but is
LO
designed to be no longer than the valid delay.
5. AD31:0 are synchronous inputs. Setup and hold times must be met for proper processor operation. NMI
and XINT7:0 may be synchronous or asynchronous. Meeting setup and hold time guarantees recog-
nition at a particular clock edge. For asynchronous operation, NMI and XINT7:0 must be asserted for a
minimum of two CLKIN periods to guarantee recognition.
6. RDYRCV and HOLD are synchronous inputs. Setup and hold times must be met for proper processor
operation.
7. RESET may be synchronous or asynchronous. Meeting setup and hold time guarantees recognition at a
particular clock edge.
8. ONCE and STEST must be stable at the rising edge of RESET for proper operation.
9. Guaranteed by design. May not be 100% tested.
10. Relative to falling edge of TCK.
30
PRELIMINARY
80960JD
Table 18. 80960JD AC Characteristics (33 MHz) (Sheet 1 of 2)
Symbol
Parameter
Min
Max
Units
Notes
INPUT CLOCK TIMINGS
TF
CLKIN Frequency
8
16.67
MHz
ns
TC
CLKIN Period
60
125
TCS
TCH
TCL
TCR
TCF
CLKIN Period Stability
CLKIN High Time
CLKIN Low Time
CLKIN Rise Time
CLKIN Fall Time
± 250
ps
(1, 2)
24
24
ns
Measured at 1.5 V (1)
Measured at 1.5 V (1)
0.8 V to 2.0 V (1)
ns
8
8
ns
ns
2.0 V to 0.8 V (1)
SYNCHRONOUS OUTPUT TIMINGS
TOV1
TOV2
TOF
Output Valid Delay, Except
ALE/ALE Inactive and DT/R
3.5
19
0.5TC + 19
18
ns
ns
ns
(3)
Output Valid Delay, DT/R
0.5TC
3.5
+
Output Float Delay
3.5
(4)
SYNCHRONOUS INPUT TIMINGS
TIS1
TIH1
TIS2
TIH2
Input Setup to CLKIN — AD31:0,
NMI, XINT7:0
8
2
9
1
ns
ns
ns
ns
(5)
(5)
(6)
(6)
Input Hold from CLKIN — AD31:0,
NMI, XINT7:0
Input Setup to CLKIN — RDYRCV
and HOLD
Input Hold from CLKIN —
RDYRCV and HOLD
TIS3
TIH3
TIS4
Input Setup to CLKIN — RESET
Input Hold from CLKIN — RESET
8
2
8
ns
ns
ns
(7)
(7)
(8)
Input Setup to RESET — ONCE,
STEST
TIH4
Input Hold from RESET — ONCE,
STEST
2
ns
(8)
RELATIVE OUTPUT TIMINGS
TLXL
TLXA
ALE/ALE Width
(9)
Address Hold from ALE/ALE Inac-
tive
Equal Loading (9)
0.5TC - 8
ns
TDXD
DT/R Valid to DEN Active
Equal Loading (9)
PRELIMINARY
31
80960JD
Symbol
Table 18. 80960JD AC Characteristics (33 MHz) (Sheet 2 of 2)
Parameter Min Max Units
Notes
BOUNDARY SCAN TEST SIGNAL TIMINGS
TBSF
TCK Frequency
TCK High Time
TCK Low Time
TCK Rise Time
TCK Fall Time
0.5TF
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
TBSCH
TBSCL
TBSCR
TBSCF
TBSIS1
TBSIH1
TBSOV1
TBSOF1
TBSOV2
TBSOF2
TBSIS2
15
15
5
Measured at 1.5 V (1)
Measured at 1.5 V (1)
0.8 V to 2.0 V (1)
5
2.0 V to 0.8 V (1)
Input Setup to TCK — TDI, TMS
Input Hold from TCK — TDI, TMS
TDO Valid Delay
4
6
3
3
3
3
4
30
30
30
30
(1, 10)
(1, 10)
(1, 10)
(1, 10)
TDO Float Delay
All Outputs (Non-Test) Valid Delay
All Outputs (Non-Test) Float Delay
Input Setup to TCK — All Inputs
(Non-Test)
TBSIH2
Input Hold from TCK — All Inputs
(Non-Test)
6
ns
NOTES:
1. Not tested.
2. To ensure a 1:1 relationship between the amplitude of the input jitter and the internal clock, the jitter
frequency spectrum should not have any power peaking between 500 KHz and 1/3 of the CLKIN
frequency.
3. Inactive ALE/ALE refers to the falling edge of ALE and the rising edge of ALE. For inactive ALE/ALE
timings, refer to Relative Output Timings in this table.
4. A float condition occurs when the output current becomes less than I . Float delay is not tested, but is
LO
designed to be no longer than the valid delay.
5. AD31:0 are synchronous inputs. Setup and hold times must be met for proper processor operation.
NMI and XINT7:0 may be synchronous or asynchronous. Meeting setup and hold time guarantees
recognition at a particular clock edge. For asynchronous operation, NMI and XINT7:0 must be asserted
for a minimum of two CLKIN periods to guarantee recognition.
6. RDYRCV and HOLD are synchronous inputs. Setup and hold times must be met for proper processor
operation.
7. RESET may be synchronous or asynchronous. Meeting setup and hold time guarantees recognition at
a particular clock edge.
8. ONCE and STEST must be stable at the rising edge of RESET for proper operation.
9. Guaranteed by design. May not be 100% tested.
10. Relative to falling edge of TCK.
32
PRELIMINARY
80960JD
4.5.1 AC Test Conditions and Derating Curves
The AC Specifications in Section 4.5, AC Specifications are tested with the 50 pF load indicated in Figure 8.
Figure 9 shows how timings vary with load capacitance; Figure 10 shows how output rise and fall times vary
with load capacitance.
Output Pin
C
= 50 pF for all signals
L
C
L
Figure 8. AC Test Load
AC Derating Curves
nom +6
nom +4
nom +2
nom
High-to-Low Transitions
Low-to-High Transitions
nom -2
50
100
150
C
(pF)
L
Figure 9. Output Delay or Hold vs. Load Capacitance
PRELIMINARY
33
80960JD
10
8
2.0V to 0.8V Transitions
0.8V to 2.0V Transitions
6
4
2
50
100
150
C
(pF)
L
Figure 10. Rise and Fall Time Derating
4.5.2 AC Timing Waveforms
T
T
CR
CF
2.0V
1.5V
0.8V
T
CH
T
CL
T
C
Figure 11. CLKIN Waveform
34
PRELIMINARY
80960JD
1.5V
OV1
1.5V
CLKIN
T
AD31:0,
ALE (active),
ALE (active),
1.5V
ADS, A3:2,
BE3:0,
WIDTH/HLTD1:0,
D/C, W/R, DEN,
BLAST, LOCK,
HOLDA, BSTAT, FAIL
Figure 12. Output Delay Waveform for TOV1
1.5V
1.5V
CLKIN
T
OF
AD31:0,
ALE, ALE
ADS, A3:2,
BE3:0,
WIDTH/HLTD1:0,
D/C, W/R, DT/R,
DEN, BLAST, LOCK
Figure 13. Output Float Waveform for TOF
PRELIMINARY
35
80960JD
1.5V
1.5V
IH1
1.5V
CLKIN
T
T
IS1
AD31:0
NMI
Valid
1.5V
XINT7:0
Figure 14. Input Setup and Hold Waveform for T
and T
IH1
IS1
1.5V
1.5V
1.5V
CLKIN
T
IH2
T
IS2
HOLD,
1.5V
Valid
1.5V
RDYRCV
Figure 15. Input Setup and Hold Waveform for T
and T
IH2
IS2
36
PRELIMINARY
80960JD
1.5V
1.5V
CLKIN
T
T
IS3
IH3
RESET
Figure 16. Input Setup and Hold Waveform for T
and T
IH3
IS3
RESET
T
IH4
T
IS4
ONCE,
STEST
Valid
Figure 17. Input Setup and Hold Waveform for T
and T
IH4
IS4
PRELIMINARY
37
80960JD
T
T /T
w
a
d
1.5V
1.5V
1.5V
CLKIN
T
LXL
ALE
ALE
1.5V
Valid
1.5V
1.5V
T
LXA
1.5V
AD31:0
Valid
Figure 18. Relative Timings Waveform for T
and T
LXA
LXL
T
T /T
w d
a
CLKIN
1.5V
1.5V
1.5V
T
OV2
Valid
DT/R
DEN
T
DXD
T
OV1
Figure 19. DT/R and DEN Timings Waveform
38
PRELIMINARY
80960JD
T
T
BSCR
BSCF
2.0V
1.5V
0.8V
T
BSCH
T
BSCL
Figure 20. TCK Waveform
1.5V
1.5V
1.5V
TCK
T
T
BSIH1
BSIS1
TMS
TDI
1.5V
Valid
1.5V
Figure 21. Input Setup and Hold Waveforms for T
and T
BSIS1
BSIH1
PRELIMINARY
39
80960JD
TCK
1.5V
1.5V
1.5V
T
T
BSOV1
BSOF1
Valid
1.5V
TDO
Figure 22. Output Delay and Output Float Waveform for T
AND T
BSOF1
BSOV1
TCK
1.5V
1.5V
1.5V
T
T
BSOF2
BSOV2
Non-Test
Outputs
Valid
1.5V
Figure 23. Output Delay and Output Float Waveform for T
and T
BSOF2
BSOV2
40
PRELIMINARY
80960JD
TCK
1.5V
1.5V
1.5V
T
T
BSIH2
BSIS2
Non-Test
Inputs
1.5V
Valid
1.5V
Figure 24. Input Setup and Hold Waveform for T
and T
BSIS2
BSIH2
PRELIMINARY
41
80960JD
5.0 BUS FUNCTIONAL WAVEFORMS
Figures 25 through 30 illustrate typical 80960JD bus transactions. Figure 31 depicts the bus arbitration
sequence. Figure 32 illustrates the processor reset sequence from the time power is applied to the device.
Figure 33 illustrates the processor reset sequence when the processor is in operation. Figure 34 illustrates the
processor ONCE sequence from the time power is applied to the device. Figures 35 and 36 also show
accesses on 32-bit buses. Tables 19 through 22 summarize all possible combinations of bus accesses across
8-, 16-, and 32-bit buses according to data alignment.
T
T
T
T
T
T
T
T
T
T
i
a
d
r
i
i
a
d
r
i
CLKIN
D
In
ADDR
ADDR
Invalid
DATA Out
AD31:0
ALE
ADS
A3:2
BE3:0
WIDTH1:0
10
10
D/C
W/R
BLAST
DT/R
DEN
RDYRCV
F_JF030A
Figure 25. Non-Burst Read and Write Transactions Without Wait States, 32-Bit Bus
42
PRELIMINARY
80960JD
T
T
T
T
T
T
T
T
T
T
a
d
d
r
a
d
d
d
d
r
CLKIN
DATA
Out
D
In
DATA
Out
DATA
Out
D
In
DATA
Out
ADDR
ADDR
AD31:0
ALE
ADS
00 or 10
01 or 11
00
01
10
11
A3:2
BE3:0
1 0
WIDTH1:0
D/C
1 0
W/R
BLAST
DT/R
DEN
RDYRCV
Figure 26. Burst Read and Write Transactions Without Wait States, 32-Bit Bus
PRELIMINARY
43
80960JD
T
T
T
T
T
T
T
T
T
T
T
r
a
w
w
d
w
d
w
d
w
d
CLKIN
AD31:0
ALE
DATA
Out
DATA
Out
DATA
Out
DATA
Out
ADDR
ADS
A3:2
0 0
0 1
1 0
1 1
BE3:0
WIDTH1:0
D/C
1 0
W/R
BLAST
DT/R
DEN
RDYRCV
F_JF032A
Figure 27. Burst Write Transactions With 2,1,1,1 Wait States, 32-Bit Bus
44
PRELIMINARY
80960JD
T
T
T
T
T
T
T
T
T
T
r
a
d
d
r
a
d
d
d
d
CLKIN
DATA
Out
DATA
Out
D
In
DATA DATA
D
In
ADDR
ADDR
AD31:0
Out
Out
ALE
ADS
A3:2
00,01,10 or 11
00,01,10 or 11
01 or
BE1/A1
BE0/A0
00
01
10
11
00 or 10
11
WIDTH1:0
D/C
00
00
W/R
BLAST
DT/R
DEN
RDYRCV
F_JF033A
Figure 28. Burst Read and Write Transactions Without Wait States, 8-Bit Bus
PRELIMINARY
45
80960JD
T
T
T
T
T
T
T
T
T
T
r
T
w
d
d
r
r
a
w
d
d
a
CLKIN
AD31:0
ALE
D
In
D
In
DATA
Out
DATA
Out
ADDR
ADDR
ADS
00,01,10, or 11
00,01,10, or 11
A3:2
0
0
1
BE1/A1
1
BE3/BHE
BE0/BLE
01
01
WIDTH1:0
D/C
W/R
BLAST
DT/R
DEN
F_JF034A
RDYRCV
Figure 29. Burst Read and Write Transactions With 1, 0 Wait States
and Extra Tr State on Read, 16-Bit Bus
46
PRELIMINARY
80960JD
T
T
T
T
T
T
T
T
T
T
T
T
r
a
d
r
a
d
r
a
d
r
a
d
CLKIN
AD31:0
ALE
D
In
D
In
D
In
D
In
A
A
A
A
ADS
A3:2
00
00
01
10
BE3:0
WIDTH1:0
D/C
0 0 0 0
1 1 1 0
0 0 1 1
1 1 0 1
1 0
Valid
W/R
BLAST
DT/R
DEN
RDYRCV
Figure 30. Bus Transactions Generated by Double Word Read Bus Request,
Misaligned One Byte From Quad Word Boundary, 32-Bit Bus, Little Endian
PRELIMINARY
47
80960JD
T or T
T
T
T or T
i a
i
r
h
h
CLKIN
Outputs:
AD31:0,
ALE, ALE,
ADS, A3:2,
BE3:0,
Valid
Valid
WIDTH/HLTD1:0,
D/C, W/R,
DT/R, DEN,
BLAST, LOCK
HOLD
HOLDA
(Note)
NOTE: HOLD is sampled on the rising edge of CLKIN. The processor asserts HOLDA to grant the bus on the
same edge in which it recognizes HOLD if the last state was T or the last T of a bus transaction. Similarly,
i
r
the processor deasserts HOLDA on the same edge in which it recognizes the deassertion of HOLD.
Figure 31. HOLD/HOLDA Waveform For Bus Arbitration
48
PRELIMINARY
80960JD
Figure 32. Cold Reset Waveform
PRELIMINARY
49
80960JD
Figure 33. Warm Reset Waveform
50
PRELIMINARY
80960JD
Figure 34. Entering the ONCE State
PRELIMINARY
51
80960JD
Table 19. Natural Boundaries for Load and Store Accesses
Data Width
Byte
Natural Boundary (Bytes)
1
2
Short Word
Word
4
Double Word
Triple Word
Quad Word
8
16
16
Table 20. Summary of Byte Load and Store Accesses
Address Offset from
Natural Boundary
(in Bytes)
Accesses on 8-Bit Bus Accesses on 16 Bit Bus Accesses on 32 Bit Bus
(WIDTH1:0=00)
(WIDTH1:0=01)
(WIDTH1:0=10)
+0 (aligned)
• byte access
• byte access
• byte access
Table 21. Summary of Short Word Load and Store Accesses
Address Offset from
Natural Boundary
(in Bytes)
Accesses on 8-Bit Bus Accesses on 16 Bit Bus Accesses on 32 Bit Bus
(WIDTH1:0=00)
(WIDTH1:0=01)
(WIDTH1:0=10)
+0 (aligned)
+1
• burst of 2 bytes
• 2 byte accesses
• short-word access
• 2 byte accesses
• short-word access
• 2 byte accesses
52
PRELIMINARY
80960JD
Table 22. Summary of n-Word Load and Store Accesses (n = 1, 2, 3, 4)
Address Offset
from Natural
Boundary in Bytes
Accesses on 8-Bit Bus
(WIDTH1:0=00)
Accesses on 16 Bit Bus
(WIDTH1:0=01)
Accesses on 32 Bit
Bus (WIDTH1:0=10)
+0 (aligned)
• n burst(s) of 4 bytes
• case n=1:
• burst of n word(s)
(n =1, 2, 3, 4)
burst of 2 short words
• case n=2:
burst of 4 short words
• case n=3:
burst of 4 short words
burst of 2 short words
• case n=4:
2 bursts of 4 short words
+1 (n =1, 2, 3, 4)
+5 (n = 2, 3, 4)
+9 (n = 3, 4)
• byte access
• byte access
• short-word access
• n-1 burst(s) of 2 short words • n-1 word access(es)
• byte access
• byte access
• short-word access
• burst of 2 bytes
• n-1 burst(s) of 4 bytes
• byte access
+13 (n = 3, 4)
• byte access
+2 (n =1, 2, 3, 4)
+6 (n = 2, 3, 4)
+10 (n = 3, 4)
+14 (n = 3, 4)
• burst of 2 bytes
• n-1 burst(s) of 4 bytes
• burst of 2 bytes
• short-word access
• n-1 burst(s) of 2 short words • n-1 word access(es)
• short-word access
• short-word access
• short-word access
+3 (n =1, 2, 3, 4)
+7 (n = 2, 3, 4)
+11 (n = 3, 4)
+15 (n = 3, 4)
• byte access
• byte access
• n-1 burst(s) of 2 short words • n-1 word access(es)
• short-word access
• byte access
• byte access
• n-1 burst(s) of 4 bytes
• burst of 2 bytes
• byte access
• short-word access
• byte access
+4 (n = 2, 3, 4)
+8 (n = 3, 4)
• n burst(s) of 4 bytes
• n burst(s) of 2 short words
• n word access(es)
+12 (n = 3, 4)
PRELIMINARY
53
80960JD
0
0
4
1
8
2
12
3
16
4
20
5
24
6
Byte Offset
Word Offset
Short Access (Aligned)
Byte, Byte Accesses
Short-Word
Load/Store
Short Access (Aligned)
Byte, Byte Accesses
Word Access (Aligned)
Byte, Short, Byte, Accesses
Short, Short Accesses
Word
Load/Store
Byte, Short, Byte Accesses
One Double-Word Burst (Aligned)
Byte, Short, Word, Byte Accesses
Short, Word, Short Accesses
Double-Word
Load/Store
Byte, Word, Short, Byte Accesses
Word, Word Accesses
One Double-Word
Burst (Aligned)
Figure 35. Summary of Aligned and Unaligned Accesses (32-Bit Bus)
54
PRELIMINARY
80960JD
0
4
1
8
2
12
3
16
4
20
5
24
6
Byte Offset
Word Offset
0
One Three-Word
Burst (Aligned)
Byte, Short, Word,
Word, Byte Accesses
Short, Word, Word,
Short Accesses
Triple-Word
Load/Store
Byte, Word, Word,
Short, Byte Accesses
Word, Word,
Word Accesses
Word, Word,
Word Accesses
Word,
Word,
Word
Accesses
One Four-Word
Burst (Aligned)
Byte, Short, Word, Word,
Word, Byte Accesses
Short, Word, Word, Word,
Short Accesses
Quad-Word
Load/Store
Byte, Word, Word, Word,
Short, Byte Accesses
Word, Word, Word,
Word Accesses
Word,
Word,
Word,
Word,
Accesses
Figure 36. Summary of Aligned and Unaligned Accesses (32-Bit Bus) (Continued)
PRELIMINARY
55
80960JD
6.0 DEVICE IDENTIFICATION
80960JD processors may be identified electrically according to device type and stepping (see Table 23). The
32-bit identifier is accessible in three ways:
• Upon reset, the identifier is placed into the g0 register.
• The identifier may be accessed from supervisor mode at any time by reading the DEVICEID register at
address FF008710H.
• The IEEE Standard 1149.1 Test Access Port may select the DEVICE ID register through the IDCODE
instruction.
The device and stepping letter is also printed on the top side of the product package.
Table 23. 80960JD Die and Stepping Reference
Device and
Stepping
Version
Number
Complete ID
(Hex)
Part Number
Manufacturer
X
80960JD A, A2
0000
1000 1000 0010 0000
0000 0001 001
1
08820013
NOTE: This data sheet applies to the 80960JD A and 80960JD A2 steppings.
7.0 REVISION HISTORY
This data sheet supersedes revision 272596-001. Table 24 indicates significant changes since the previous
revision.
Table 24. Data Sheet Version -001 to -002 Revision History (Sheet 1 of 2)
Table 13, 80960JD DC Characteristics (pg.
24)
Removed Icc characteristics. Added VOLP (output
ground bounce) specification
Table 13, 80960JD DC Characteristics (pg.
24)
New table for comprehensible Icc characteristics.
Added Icc’s for reset mode. Halt Icc for: 80960JD-50
(max) improved from 56 mA to 48 mA, 80960JD-40
(max) improved from 44 mA to 41mA. ONCE Icc
Improved from 30 mA to 10 mA.
Section 4.5, AC Specifications (pg. 26)
Grouped AC Specifications tables by frequency.
Added 40 MHz and 33 MHz AC specifications.
Table 15, 80960JD AC Characteristics (50
MHz) (pg. 26) Section INPUT CLOCK
TIMINGS
T
CS (max) improved from ±0.1% to ±250 ps
Table 15, 80960JD AC Characteristics (50
MHz) (pg. 26) Section SYNCHRONOUS
OUTPUT TIMINGS
T
ov1 (min) improved from 3.0 ns to 3.5 ns. Tov2 (min)
improved from 0.45TC + 3.0 ns to 0.5TC + 3.5 ns. ToF
(min) improved from 3.0 ns to 3.5 ns. ToF (max)
improved from 17 ns to 15 ns.
56
PRELIMINARY
80960JD
Table 24. Data Sheet Version -001 to -002 Revision History (Sheet 2 of 2)
Table 15, 80960JD AC Characteristics (50
MHz) (pg. 26) Section SYNCHRONOUS
INPUT TIMINGS
T
IS2 (min) improved from 10 ns to 9 ns
Table 15, 80960JD AC Characteristics (50
MHz) (pg. 26) Section RELATIVE OUTPUT
TIMINGS
T
LXL, TLXA, and TDXD (min) improved from .45TC - 3 ns
to .5TC - 7.5 ns.
Table 15, 80960JD AC Characteristics (50
MHz) (pg. 26) Section BOUNDARY SCAN
TEST SIGNAL TIMINGS
TBSF (max) improved from 8 MHz to .5TF. TBSIS1 (min)
improved from 8 ns to 4 ns. TBSIH1 (min) improved
from 10 ns to 6 ns. TBSIS2 (min) improved from 8 ns to
4 ns. TBSIH2 (min) improved from 10 ns to 6 ns.
PRELIMINARY
57
相关型号:
©2020 ICPDF网 联系我们和版权申明