HS0-26CLV31RH-Q [INTERSIL]

Radiation Hardened 3.3V Quad Differential Line Driver; 抗辐射3.3V四路差分线路驱动器
HS0-26CLV31RH-Q
型号: HS0-26CLV31RH-Q
厂家: Intersil    Intersil
描述:

Radiation Hardened 3.3V Quad Differential Line Driver
抗辐射3.3V四路差分线路驱动器

驱动器
文件: 总2页 (文件大小:36K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HS-26CLV31RH  
TM  
Data Sheet  
August 2000  
File Number 4898  
Radiation Hardened 3.3V Quad Differential  
Line Driver  
Features  
• Electrically Screened to SMD # 5962-96663  
The Intersil HS-26CLV31RH is a radiation hardened 3.3V  
quad differential line driver designed for digital data  
transmission over balanced lines, in low voltage, RS-422  
protocol applications. CMOS processing assures low power  
consumption, high speed, and reliable operation in the most  
severe radiation environments.  
• QML Qualified per MIL-PRF-38535 Requirements  
• 1.2 Micron Radiation Hardened CMOS  
- Total Dose. . . . . . . . . . . . . . . . . . . . . 300 krad(Si)(Max)  
2
- Single Event Upset LET . . . . . . . . . . .100MeV/mg/cm )  
- Single Event Latch-up Immune  
The HS-26CLV31RH accepts CMOS level inputs and converts  
them to differential outputs. Enable pins allow several devices  
to be connected to the same data source and addressed  
independently. The device has unique outputs that become  
high impedance when the driver is disabled or powered-down,  
maintaining signal integrity in multi-driver applications.  
• Extremely Low Stand-by Current . . . . . . . . . 100µA (Max)  
• Operating Supply Range . . . . . . . . . . . . . . . . 3.0V to 3.6V  
• CMOS Level Inputs . . . . V > (.7)(V ); V < (.3)(V  
)
IH  
DD  
IL  
DD  
• Differential Outputs. . . . . . . . . . . V  
> 1.8V; V < 0.5V  
OH  
OL  
• High Impedance Outputs when Disabled or Powered  
Down  
Specifications for Rad Hard QML devices are controlled  
by the Defense Supply Center in Columbus (DSCC). The  
SMD numbers listed here must be used when ordering.  
• Low Output Impedance . . . . . . . . . . . . . . . . . 10or Less  
o
o
• Full -55 C to 125 C Military Temperature Range  
Detailed Electrical Specifications for these devices are  
contained in SMD 5962-96663. A “hot-link” is provided  
on our homepage for downloading.  
Pinouts  
HS1-26CLV31RH (SBDIP)  
CDIP2-T16  
www.intersil.com/spacedefense/space.htm  
TOP VIEW  
Ordering Information  
AIN  
AO  
1
2
3
4
5
6
7
8
16 V  
DD  
TEMP.  
INTERNAL  
RANGE  
15 DIN  
14 DO  
o
ORDERING NUMBER  
5962F9666302QEC  
5962F9666302QXC  
5962F9666302V9A  
5962F9666302VEC  
5962F9666302VXC  
MKT. NUMBER  
( C)  
AO  
HS1-26CLV31RH-8  
HS9-26CLV31RH-8  
HS0-26CLV31RH-Q  
HS1-26CLV31RH-Q  
HS9-26CLV31RH-Q  
-55 to 125  
-55 to 125  
25  
ENABLE  
BO  
13 DO  
12 ENABLE  
11 CO  
BO  
-55 to 125  
-55 to 125  
10 CO  
BIN  
9
CIN  
GND  
HS1-26CLV31RH/PROTO HS1-26CLV31RH/PROTO -55 to 125  
HS9-26CLV31RH/PROTO HS9-26CLV31RH/PROTO -55 to 125  
Logic Diagram  
HS9-26CLV31RH (FLATPACK)  
CDFP4-F16  
ENABLE ENABLE DIN  
CIN  
BIN  
AIN  
TOP VIEW  
AIN  
AO  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
V
DD  
DIN  
AO  
DO  
ENABLE  
BO  
DO  
ENABLE  
CO  
DO DO  
CO CO  
BO BO  
AO AO  
BO  
BIN  
CO  
GND  
CIN  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 321-724-7143 | Intersil and Design is a trademark of Intersil Corporation. | Copyright © Intersil Corporation 2000  
1
HS-26CLV31RH  
Die Characteristics  
DIE DIMENSIONS:  
96.5 mils x 195 mils x 21 mils  
(2450 x 4950)  
Substrate:  
AVLSI1RA  
Backside Finish:  
INTERFACE MATERIALS:  
Silicon  
Glassivation:  
ASSEMBLY RELATED INFORMATION:  
Substrate Potential (Powered Up):  
Type: PSG (Phosphorus Silicon Glass)  
Thickness: 8kÅ ± 1kÅ  
V
DD  
Metallization:  
ADDITIONAL INFORMATION:  
Worst Case Current Density:  
Bottom: Mo/TiW  
Thickness: 5800Å ± 1kÅ  
Top: AlSiCu (Top)  
Thickness: 10kÅ ± 1kÅ  
5
2
<2.0 x 10 A/cm  
Bond Pad Size:  
110µm x 100µm  
Metallization Mask Layout  
HS-26CLV31RH  
AO (2)  
(14) DO  
AO (3)  
(13) DO  
ENABLE (4)  
(12) ENABLE  
BO (5)  
(11) CO  
BO (6)  
(10) CO  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with-  
out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site www.intersil.com  
2

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