ISL5100A [INTERSIL]

Quad 18V Pin Electronics Driver/Window Comparator; 四路18V引脚电子驱动器/窗口比较器
ISL5100A
型号: ISL5100A
厂家: Intersil    Intersil
描述:

Quad 18V Pin Electronics Driver/Window Comparator
四路18V引脚电子驱动器/窗口比较器

驱动器 比较器 电子
文件: 总13页 (文件大小:519K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ISL55100A  
®
Data Sheet  
October 31, 2005  
FN7486.0  
Quad 18V Pin Electronics Driver/Window  
Comparator  
Features  
• Low Driver Output Resistance  
- R Maximum: ISL55100A 7.0  
The ISL55100 is a Quad pin driver and window comparator  
fabricated in a wide voltage CMOS process. It is designed  
specifically for Test During Burn In (TDBI) applications,  
where cost, functional density, and power are all at a  
premium.  
OUT  
• 18V I/O Range  
• 50MHz Operation  
• 4 Channel Driver/Receiver Pairs with Per Pin Flexibility  
• Dual Level - Per Pin - Input Thresholds  
• Differential or Single Ended Digital Inputs  
• User Defined Comparator Output Levels  
• Low Channel to Channel Timing Skew  
• Small Footprint (72 Ld QFN)  
This IC incorporates four channels of programmable drivers  
and window comparators into a small 72 Ld QFN package.  
Each channel has independent driver levels, data, and high  
impedance control. Each receiver has dual comparators  
which provide high and low threshold levels.  
The ISL55100 uses differential mode digital inputs, and can  
therefore mate directly with LVDS or CML outputs. Single  
ended logic families are handled by connecting one of the  
digital input pins to an appropriate threshold voltage (e.g.,  
1.4V for TTL compatibility). The comparator outputs are  
single ended, and the output levels are user defined to mate  
directly with any digital technology.  
• Pb-Free Plus Anneal Available (RoHS Compliant)  
Applications  
• Burn In ATE  
• Wafer Level Flash Memory Test  
• LCD Panel Test  
• Low Cost ATE  
The 18V driver output and receiver input ranges allow this  
device to interface directly with TTL, ECL, CMOS (3V, 5V,  
and 7V), LVCMOS, and custom level circuitry, as well as the  
high voltage (Super Voltage) level required for many special  
test modes for Flash Devices.  
• Instrumentation  
• Emulation  
Functional Block Diagram  
QUAD - WIDE RANGE, LOW ROUT, TRI-STATEABLE - DRIVERS  
VH(0-3)  
• Device Programmers  
Ordering Information  
DATA+(0-3)  
DOUT(0-3)  
+
-
PART  
TEMP.  
PKG.  
DATA-(0-3)  
PART NO.  
MARKING RANGE (°C) PACKAGE DWG. #  
VL(0-3)  
DRVEN+(0-3)  
ISL55100AIRZ ISL55100  
(See Note) AIRZ  
-40 to +85 72 Ld QFN L72.10x10  
(Pb-free)  
+
-
DRVEN-(0-3)  
Add “-T” suffix for tape and reel.  
NOTE: Intersil Pb-free plus anneal products employ special Pb-free  
material sets; molding compounds/die attach materials and 100%  
matte tin plate termination finish, which are RoHS compliant and  
compatible with both SnPb and Pb-free soldering operations. Intersil  
Pb-free products are MSL classified at Pb-free peak reflow  
temperatures that meet or exceed the Pb-free requirements of  
IPC/JEDEC J STD-020.  
QUAD - DUAL LEVEL COMPARATOR - RECEIVERS  
V
CC  
COMP HIGH  
QA(0-3)  
CVA(0-3)  
VINP(0-3)  
COMP LOW  
V
V
EE  
CC  
COMP HIGH  
QB(0-3)  
COMP LOW  
CVB(0-3)  
V
EE  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.  
Copyright Intersil Americas Inc. 2005. All Rights Reserved  
1
All other trademarks mentioned are the property of their respective owners.  
ISL55100A  
Pinout  
ISL55100A (QFN)  
TOP VIEW  
72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55  
DATA+ 0  
DATA- 0  
QA 1  
V
EXT  
1
2
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
VH 0  
DOUT 0  
NC  
3
QB 1  
4
DRV EN+ 1  
DRV EN- 1  
VL 0  
5
VH 1  
6
DATA+ 1  
DATA- 1  
QA 2  
DOUT 1  
NC  
7
8
VL 1  
9
QB 2  
DRV EN+ 2  
DRV EN- 2  
DATA+ 2  
VH 2  
DOUT 2  
NC  
10  
11  
12  
13  
14  
VL 2  
DATA- 2  
VH 3  
QA 3  
QB 3  
DOUT 3  
NC  
15  
16  
17  
18  
40  
39  
38  
37  
DRV EN+ 3  
DRV EN- 3  
VL 3  
LOSWING  
19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36  
FN7486.0  
October 31, 2005  
2
ISL55100A  
Pin Descriptions  
PIN  
FUNCTION  
DATA+(0:3) Positive differential digital input that determines the driver output state when it is enabled.  
DATA-(0:3) Negative differential digital input that determines the driver output state when it is enabled.  
DRV EN+(0:3) Positive differential digital input that enables or disables the corresponding driver.  
DRV EN-(0:3) Negative differential digital input that enables or disables the corresponding driver.  
QA (0:3)  
QB (0:3)  
Comparator digital outputs. QA(X) is high when VINP(X) exceeds CVA(X).  
Comparator digital outputs. QB(X) is high when VINP(X) exceeds CVB(X).  
DOUT (0:3) Driver outputs.  
VINP (0:3)  
VH (0:3)  
VL (0:3)  
NC  
Comparator inputs.  
Unbuffered analog inputs that set each individual driver’s “high” voltage level.  
Unbuffered analog inputs that set each individual driver’s “low” voltage level. VL must be a lower voltage than VH.  
No internal connection.  
CVA (0:3)  
CVB (0:3)  
COMP HI  
COMP LO  
Analog inputs that set the threshold for the corresponding channel’s A comparators.  
Analog inputs that set the threshold for the corresponding channel’s B comparators.  
Supply voltage, unbuffered input that sets the high output level of all comparators. Must be greater than COMP LO.  
Supply voltage, unbuffered input that sets the low output level of all comparators. Must be less than COMP HI.  
Positive power supply (5% tolerance).  
V
CC  
V
Negative power supply (5% tolerance).  
EE  
V
External 5.5VDC power supply (-0%+5% tolerance, referenced to V , NOT GND) for internal logic. Connect pin to V when  
EE EE  
EXT  
not using an external supply.  
LOSWING  
Input that selects driver output configurations optimized to yield minimum overshoots for low level swings (VH < V +5V), or  
EE  
to select high  
optimized for large output swings. Connect LOSWING to V to select low swing circuitry, or connect it to V  
EE  
CC  
swing circuitry.  
Truth Tables  
RECEIVERS  
DRIVERS  
INPUT  
OUTPUTS  
INPUTS  
OUTPUT  
DOUT  
Hi - Z  
VH  
VINP  
QA  
0
QB  
0
DATA  
DRV EN  
+ > -  
<CVA  
<CVA  
>CVA  
>CVA  
<CVB  
X
+ > -  
>CVB  
<CVB  
>CVB  
0
1
+ < -  
1
0
+ < -  
+ < -  
VL  
1
1
X = DON’T CARE  
FN7486.0  
October 31, 2005  
3
ISL55100A  
Absolute Maximum Ratings  
Thermal Information  
Thermal Resistance (Typical, Note 1)  
72 Ld QFN Package. . . . . . . . . . . . . . . 23  
Maximum Junction Temperature (Plastic Package) . . . . . . . 150°C  
Maximum Storage Temperature Range. . . . . . . . . . .-65°C to 150°C  
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300°C  
V
to V  
EXT  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 19V  
EE  
θ
JA  
(°C/W) θ (°C/W)  
CC  
EE  
JC  
V
to V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V  
2.0  
Input Voltages  
DATA, DRV EN, CVX, VH, VL, VINP, COMPX, LOSWING  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . (V -0.5V) to (V  
EE  
+0.5V)  
CC  
Output Voltages  
DOUT . . . . . . . . . . . . . . . . . . . . . . . . . . . (VL -0.5V) to (VH +0.5V)  
QX . . . . . . . . . . . . . (COMP LOW -0.5V) to (COMP HIGH +0.5V)  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the  
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
1. θ is measured in free air with the component mounted on high effective thermal conductivity test board with “direct attach” features. See Tech  
JA  
Brief TB379 and Tech Brief TB389 for details. Device temperature is closely tied to data-rates, driver loads and overall pin activity. Review Power  
Dissipation Considerations for more information.  
Recommended Operating Conditions  
PARAMETER  
SYMBOL  
MIN  
TYP  
MAX  
UNITS  
Device Power-(V  
used  
= V  
V
not  
V
-V  
12 (Note 4)  
15  
18  
V
EXT  
EE) EXT  
CC EE  
Device Power-(V  
= V +5.5V)  
EE  
V
-V  
9 (Note 4)  
15  
18  
V
V
V
V
V
V
EXT  
CC EE  
V
Optional External Logic Power  
V
-V  
5.5 (Note 4)  
5.75  
6.0  
EXT  
EXT EE  
Driver Output High Rail  
Driver Output Low Rail  
Comparator Output High Rail  
Comparator Output Low Rail  
Ambient Temperature  
V
V
+1  
-
-
-
-
-
-
V
V
-0.5  
CC  
H
EE  
V
V
+0.5  
EE  
V
+6  
EE  
L
COMP-High  
COMP-Low  
V
+1  
-0.5  
CC  
EE  
V
+.5  
EE  
V
+6  
EE  
T
-40  
-
+85  
°
A
C
C
Junction Temperature  
T
+150  
°
J
Electrical Specifications Test Conditions: V = 12V, V = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp Low = 0V, V = V and  
CC  
CC,  
SYMBOL  
EE  
5V  
EE  
LOSWING = V  
25°C; Unless Otherwise specified.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
DRIVER DC CHARACTERISTICS  
ISL55100A Output Resistance  
ISL55100A DC output current  
ISL55100A AC output current (Note 1)  
ISL55100A Minimum Output Swing  
Disabled HIZ Leakage Current  
R
I
= ±200mA, data not toggling  
O
3
±200  
-
4.5  
-
6.5  
mA  
A
OUTD  
Iout D  
IOUTDAC Per Individual driver  
Per Individual driver  
-
-
1.0  
-
V
V
= 200mV, V = 0V  
185  
-1  
-
mV  
µA  
OMIN  
HIZ  
H
L
V
V
= V  
with V = V + V or  
0
1
OUT  
OUT  
CC  
H
L
EE  
CC  
= VEE with V = V = V  
H
L
DRIVER TIMING CHARACTERISTICS  
Data± to DOUT Propagation Delay  
t
Lowswing Disabled (Note 3)  
Lowswing Enabled (Note 3)  
8
9
12  
13  
<1  
18  
16  
17  
ns  
ns  
ns  
ns  
PD  
Driver Timing Skew, All Edges (Note 1)  
Disable (HIZ) Time  
t
DVREN± Transition from Enable to  
Disable  
16  
13  
13  
26  
23  
23  
DIS  
Enable Time  
t
DVREN± Transition from Disable to  
Enable: Lowswing Disabled (Note 3)  
15  
18  
ns  
ns  
EN  
DVREN± Transition from Disable to  
Enable: Lowswing Enabled (Note 3)  
FN7486.0  
October 31, 2005  
4
ISL55100A  
Electrical Specifications Test Conditions: V = 12V, V = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp Low = 0V, V = V and  
CC  
EE  
5V  
EE  
LOSWING = V  
25°C; Unless Otherwise specified. (Continued)  
CC,  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
100pF Load V = 0.4V (20% - 80%)  
MIN  
TYP  
2.5  
2.5  
2.5  
2.5  
2.5  
8.0  
10.0  
14.0  
65  
MAX  
UNITS  
ns  
ISL55100A Rise/Fall Times (Note 1)  
t , t  
-
-
-
-
-
-
-
-
-
-
-
R
F
V = 1V (20% - 80%)  
V = 5V (10% - 90%)  
V = 10V (10% - 90%)  
V = 14V (10% - 90%)  
ns  
-
ns  
-
ns  
-
ns  
ISL55100A Rise/Fall Times (Note1)  
t , t  
1000pF Load V = 1V (20% - 80%)  
V = 5V (10% - 90%)  
-
ns  
R
F
-
ns  
V = 10V (10% - 90%)  
-
ns  
ISL55100A Maximum Toggle Frequency FMAXD No Load, 50% Symmetry  
50  
MHz  
ns  
ISL55100A Min Driver Pulse Width  
t
Standard Load, 1K/100pF  
7.7  
WIDD  
OS  
ISL55100A Overshoot Lowswing Mode  
(Note 1)  
Lowswing Enabled, (VH-VL<2v)  
-
20mV+  
10% of  
output  
swing  
-
%+V  
FN7486.0  
October 31, 2005  
5
ISL55100A  
Electrical Specifications Test Conditions: V = 12V, V = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp Low = 0V, V = V and  
CC  
CC,  
SYMBOL  
EE  
5V  
EE  
LOSWING = V  
25°C; Unless Otherwise specified. (Continued)  
PARAMETER  
RECEIVER DC CHARACTERISTICS  
Input Offset Voltage  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
V
CVA = CVB = 1.5V  
- CV = ±5V  
-50  
-
-
50  
30  
35  
mV  
nA  
OS  
Input Bias Current  
I
V
10  
25  
BIAS  
INP  
(A/B)  
Output Resistance  
RoutR  
18  
RECEIVER TIMING CHARACTERISTICS  
Propagation delay  
t
7
50  
-
12  
65  
18  
-
ns  
MHz  
ns  
PP  
Maximum Operating Frequency  
Min Pulse Width  
F
Under No Load, PWOUT Symmetry 50%  
MAXR  
WIDR  
t
7.7  
<1  
Rcvr Channel to Channel Skew (Note 1)  
DIGITAL INPUTS  
-
ns  
Differential Input High Voltage  
Differential Input Low Voltage  
Input Current  
V
V
V
V
V
V
- V  
- V  
200  
-
-
-
-
mV  
mV  
nA  
V
DIFFH  
DIG+  
DIG+  
IN  
DIG-  
DIG-  
V
-200  
50  
DIFFL  
I
= V  
or V  
EE  
-50  
0
IN  
CC  
Common Mode Input Voltage Range  
V
not greater than V  
-0.2 Volts  
V
-5V  
CC  
CM  
DIFFL  
DIFFH  
DIFFH  
not less than V  
+0.2 Volts  
V
+0.2V  
V
DIFFL  
EE  
POWER SUPPLIES, DRIVER/RECEIVER STATIC CONDITIONS V  
EXT  
= V  
EXTERNAL LOGIC POWER OPTION NOT USED. (Note 5)  
EE,  
Positive Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
EXT  
-
-85  
-
65  
-65  
<1  
85  
mA  
mA  
mA  
CC  
CC  
H
EE  
L
= V , Outputs Unloaded  
EE  
Negative Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
EE  
-
EE  
CC  
H
L
= V , Outputs Unloaded  
EE  
EXT  
V
Supply Current  
I
V
V
= V = 12, V = V = -3V,  
-
EXT  
EXT  
CC  
H
EE  
L
= V , Outputs Unloaded  
EE  
EXT  
POWER SUPPLIES, DRIVER/RECEIVER STATIC CONDITIONS V  
EXT  
= V + 5.5V, EXTERNAL LOGIC POWER OPTION USED. (Note 6)  
EE  
Positive Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
EXT  
-
-50  
-
35  
-35  
25  
50  
mA  
mA  
mA  
CC  
CC  
H
EE  
L
= V +5.5V, Outputs Unloaded  
EE  
Negative Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
EE  
-
EE  
CC  
H
L
= V +5.5V, Outputs Unloaded  
EE  
EXT  
V
Supply Current  
I
V
V
= V = 12, V = V = -3V,  
40  
EXT  
EXT  
CC  
H
EE  
L
= V + 5.5V, Outputs Unloaded  
EE  
EXT  
NOTES:  
1. Lab characterization, room temp, Timing Parameters Matched Stimulus/Loads, Channel to Channel Skew < 500ps, 1ns Max by design.  
2. Measured across 100pF/1K lump sum load + 15pF PCB/Scope Probe. Cap and Resistor Surface Mount/Stacked ~0.5inch from Pin.  
3. To Enable LOWSWING, connect LOWSWING to V and keep VH < V +5. To disable LOWSWING, connect it to V  
EE EE  
CC.  
4. When V  
is connected to V (External Device Power not used) then the Minimum V -V is 12V. When V  
EE CC EE  
is connected to an external  
EXT  
EXT  
5.5V supply, then the minimum V -V voltage is 9.0V.  
CC EE  
5. I  
& I values are based on static conditions and will increase with pattern rates. I  
CC EE  
& I reach 400-500mA at maximum data rates (provided  
CC EE  
sufficient device cooling is employed). These currents can be reduced by 1) Reducing the V -V operating voltage 2) Utilizing the V  
CC EE  
EXT  
option.  
6. When using V  
= 5.5V, current requirements of the V  
input can approach 100mA at maximum pattern rates.  
EXT  
EXT  
FN7486.0  
6
October 31, 2005  
ISL55100A  
Test Circuits and Waveforms  
VH  
VL  
DATA+  
DATA-  
(NOTE 2)  
V
O
DRV EN+  
DOUT  
100pF  
1k  
DRV EN-  
FIGURE 1. DRIVER SWITCHING TEST CIRCUIT  
DATA = 0  
DATA = 1  
400mV  
0V  
DATA-  
DATA+  
t
t
PDLH  
PDHL  
V
(V  
)
H
OH  
50%  
50%  
V
O
V
(V )  
L
OL  
t
t
R
F
FIGURE 2. DRIVER PROPAGATION DELAY AND TRANSITION TIME MEASUREMENT POINTS  
DIS  
EN  
400mV  
DRV EN-  
DRV EN+  
0V  
t
t
DISL  
DISH  
ENH  
V
REF  
V
O
1V  
2V  
(FOR DATA = 0)  
10%  
V
(V )  
L
OL  
t
t
ENL  
V
(V )  
H
OH  
90%  
V
O
(FOR DATA = 1)  
V
REF  
FIGURE 3. DRIVER ENABLE AND DISABLE TIME MEASUREMENT POINTS  
FN7486.0  
7
October 31, 2005  
ISL55100A  
Test Circuits and Waveforms (Continued)  
COMP HI  
CVA  
-
QA  
QB  
+
5V  
VINP  
+
-
CVB  
COMP LO  
FIGURE 4. RECEIVER SWITCHING TEST CIRCUIT  
500mV  
VINP  
0V  
0V  
-500mV  
PDHL  
t
t
PDLH  
V
(5V)  
(0V)  
OH  
50%  
50%  
QX  
V
OL  
FIGURE 5. RECEIVER PROPAGATION DELAY MEASUREMENT POINTS  
short circuit current protection. Momentary short circuits to  
Application Information  
GND, or any supply voltage, won’t cause permanent damage,  
but care must be taken to avoid longer duration short circuits.  
If tolerable to the application, current limiting resistors can be  
inserted in series with the QA(0-3) and QB(0-3) Outputs to  
protect the receiver outputs from damage due to overcurrent  
conditions.  
The ISL55100 provides Quad pin drivers and Quad dual  
level comparator receivers in a small footprint. The four  
channels may be used as bidirectional or split channels.  
Drivers have per channel level, data, and high impedance  
controls, while comparators have per channel high and low  
threshold levels.  
Driver Features  
Receiver Features  
The drivers are single ended outputs featuring a wide  
voltage range, an output stage capable of delivering 200mA  
while providing a low out resistance and tri-state capability.  
Additionally, the driver output can be toggled to drive one of  
two user defined output levels High (VH) or Low (VL).  
The receivers are four independent window comparators that  
feature high output current capability, and user defined high  
and low output levels to interface with a wide variety of logic  
families. Each receiver, comprises two comparators and each  
comparator has an independent threshold level input, making  
it easy to implement window comparator functions. The CVA  
and CVB pins set the threshold levels of the A and B  
comparators respectively. COMP HIGH and COMP LOW set  
all the comparator output levels, and COMP HIGH must be  
more positive than COMP LOW. These two inputs are  
unbuffered supply pins, so the sources driving these pins  
must provide adequate current for the expected load. COMP  
HIGH and COMP LOW typically connect to the power  
supplies of the logic device driven by the comparator outputs.  
The truth table for the receivers is given on page 3. Receiver  
outputs are not tri-statable, and do not incorporate any on-chip  
Driver waveforms are greatly affected by load  
characteristics. The ISL55100 actually double bonds the  
VH(0-3) and VL(0-3) supply pins for each channel. The  
Driver Output Pins (DOUT(0-3)) are triple bonded. Multiple  
bond wires help reduce the effects of Inductance between  
the IC Die (Wafer) and the packaging. Also the QFN style of  
packaging reduces inductance over other types of  
packaging.  
While the inductance of a bond wire might seem  
insignificant, it can reduce high-frequency waveform fidelity.  
So this should be borne in mind when doing PCB layout and  
FN7486.0  
8
October 31, 2005  
ISL55100A  
DUT interconnect. Lead lengths should be kept as short as  
provides suitable driver protection, but should be properly  
rated.  
possible, maintaining as much decoupling on the drive rails  
as possible and make sure scope measurements are made  
properly. Often the inductance of a scope probe ground can  
be the actual cause of the waveform distortion.  
External Logic Supply Option (V  
)
EXT  
Pin to a 5.5V DC Source  
Connection of the V  
EXT  
(Referenced to V ) will reduce the V -V current drain.  
EE CC EE  
VH and VL (Driver Output Rails)  
Current drain is directly proportional to Data Rate. This  
option will help with Power Supply/Dissipation should heat  
distribution become an issue.  
There are sets of VH and VL pins designated for each Driver.  
These are unbuffered analog inputs that determine the Drive  
High (VH) and Drive Low (VL) Voltages that the drivers will  
deliver. These inputs are double bonded to reduce  
inductance and decrease AC Impedance.  
Power Supply Bypassing and Printed Circuit  
Board Layout  
As with any high frequency device, good printed circuit  
board layout is necessary for optimum performance. Ground  
plane construction is highly recommended, lead lengths  
should be as short as possible, and the power supply pins  
must be well bypassed to reduce the risk of oscillation. For  
Each VH and VL should be decoupled with 4.7µF and 0.1µF  
capacitors to ground. If all four VH/VLs are bussed per  
device then one 4.7µF can be used for multiple VH/VL pins.  
Layouts should also accommodate the placement of  
capacitance “across” VH and VL. So in additional to  
decoupling the VH/VL pins to ground, they are also  
decoupled to each other.  
normal single supply operation, where the V pin is  
EE  
connected to ground, one 0.1µF ceramic capacitor should be  
placed from the V  
pin to ground. A 4.7µF tantalum  
CC  
capacitor should then be connected from the V  
pin to  
CC  
Logic Inputs  
ground. This same capacitor combination should be placed  
at each supply pin to ground if split supplies are to be used.  
The ISL55100 uses differential mode digital inputs, and can  
therefore mate directly with LVDS or CML outputs. Single  
ended logic families are handled by connecting one of the  
digital input pins to an appropriate threshold voltage (e.g.,  
1.4V for TTL compatibility).  
Power Dissipation Considerations  
Specifying continuous data rates, driver loads and driver  
level amplitudes are key in determining power supply  
requirements as well as dissipation/cooling necessities.  
Driver Output patterns also impact these needs. The faster  
the pin activity, the greater the need to supply current and  
remove heat.  
LOSWING Circuit Option  
The drivers include switchable circuitry that is optimized for  
either low (VH-VL < 3V) or high output swings, and this  
selection is accomplished via the LOSWING pin. Connecting  
Figures 16 and 17 address power consumption relative to  
Frequency of Operation. These graphs are based on Driving  
6.0/0.0V Out into a 1kLoad. Theta ja for the device  
package is 23.0, 16.6 and 14.9 Deg C/W based on Airflows  
of 0, 1 and 2.5 meters per second. Device mounted per Note  
1 under Thermal Information. With the high speed data rate  
capability of the ISL55100, it is possible to exceed the 150°C  
“absolute-maximum junction temperature” as operating  
conditions and frequencies increase. Therefore, it is  
important to calculate the maximum junction temperature for  
the application to determine if operating conditions need to  
be modified for the device to remain in the safe operating  
area.  
LOSWING to V selects the circuits optimized for low  
EE  
overshoots at low swings, while tying the pin V  
the large signal circuitry. (See Figure 6)  
enables  
CC  
With LOSWING = V , the low swing circuitry activates  
EE  
whenever VH < V + 5V, and the VH and VL currents  
EE  
increase, so for the lowest power dissipation set LOSWING  
= V only if the output swing (VH-VL) is less than 3V, and  
EE  
better than 10% overshoots are required.  
For the best small signal performance, the VH/VL common  
mode voltage [(VH + VL)/2] must be V + 1.5V. So if V  
=
EE  
EE  
0V, and the desired swing is 500mV, set VH = 1.75V, and VL  
= 1.25V.  
Driver and Receiver Overload Protection  
The maximum power dissipation allowed in a package is  
determined according to:  
The ISL55100 is designed to provide minimum and balanced  
Driver ROUT. Great care should be taken when making use  
of the ISL55100 low ROUT drivers as there is no internal  
protection. There is no short circuit protection built into either  
the driver or the receiver/comparator outputs. Also there are  
no junction temperature monitors or thermal shutdown  
features.  
T
- T  
AMAX  
JMAX  
P
= --------------------------------------------  
DMAX  
Θ
JA  
where:  
• T  
• T  
= Maximum junction temperature  
= Maximum ambient temperature  
JMAX  
The driver or receiver outputs may be damaged by more  
than a momentary short circuit directly to any low impedance  
voltage. If included, a 50Series Termination Resistor  
AMAX  
θ = Thermal resistance of the package  
JA  
• P  
DMAX  
= Maximum power dissipation in the package  
FN7486.0  
October 31, 2005  
9
ISL55100A  
The maximum power dissipation actually produced by an IC  
ensure Die Temperature does not exceed Absolute  
Maximum Thermal Limits.  
is the total quiescent supply current times the total power  
supply voltage, plus the power in the IC due to the loads.  
Power also depends on number of channels changing state,  
frequency of operation. The extent of continuous active  
pattern generation/reception will greatly effect dissipation  
requirements.  
Important Note: The ISL55100 package metal plane is  
used for heat sinking of the device. It is electrically  
connected to the negative supply potential (V ). If V  
EE  
EE  
is tied to ground, the thermal pad can be connected to  
ground. Otherwise, the thermal pad (V ) must be  
EE  
The power dissipation curves (Figure 16), provide a way to  
see if the device will overheat. The maximum safe power  
temperature vs operating frequency can be found graphically  
in Figure 17. This graph is based on the package type Theta  
JA ratings and actual current/wattage requirements of the  
ISL55100 when driving a 1K load with a 6V High Level and a  
0V Low Rail. The temperatures are indicated as calculated  
junction temperature over the ambient temperature of the  
user’s system. Plots indicate temperature change as  
operating frequency increases. (The graph assumes  
continuous operation.) The user should evaluate various  
heat sink/cooling options in order to control the ambient  
temperature part of the equation. This is especially true if the  
users applications require continuos, high speed operation.  
isolated from other power planes.  
Power Supply Sequencing  
The ISL55100 references every supply with respect to VEE.  
Therefore apply VEE, then VCC followed by the VH,VL  
busses, then the COMP High and Comp Low followed by the  
CVA & CVB Supplies. Digital Inputs should be set with a  
differential bias as soon as possible. In cases where V  
is  
EXT  
being utilized (V  
= V + 5.5v), it should be powered up  
EXT  
EE  
immediately after V . Basically, no pin should be biased  
CC  
or below V  
above V  
.
EE  
CC  
Data Rates  
Please note that the Frequency - MHz in Figures 16 and 17  
contain two transitions within each period. A digital  
application that requires a new test pattern every 50ns would  
be running at a 20MHz Data Rate. Figure 18 reveals 100ns  
period, in 10MHz frequency parlance, results in two 50ns  
digital patterns.  
The reader is cautioned against assuming the same  
level of thermal performance in actual applications. A  
careful inspection of conditions in your application  
should be conducted. Great care must be taken to  
Typical Performance Curves Device installed on Intersil ISL55100 Evaluation Board.  
V
12.0 VH 2.0  
- 3.0 VL 0.0  
V
12.0 VH 6.0  
- 3.0 VL 0.0  
CC  
CC  
V
V
EE  
EE  
0
DATA IN  
LOWSWING OFF  
680pF  
0
0
1K/100pF  
LOWSWING ON  
2200pF  
1000pF  
0
10ns/DIV  
10ns/DIV  
FIGURE 7. DRIVER WAVEFORMS UNDER VARIOUS LOADS  
FIGURE 6. LOWSWING EFFECTS ON DRIVER SHAPE AND  
T
(100pF-1K LOAD)  
PD  
FN7486.0  
10  
October 31, 2005  
ISL55100A  
Typical Performance Curves Device installed on Intersil ISL55100 Evaluation Board. (Continued)  
65.0  
VH (6.00V) R  
: DRIVER SOURCES 200mA  
OUT  
DRVEN  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
0
0
DATA IN  
VL (0.0V) R  
: DRIVER SINKS 200mA  
OUT  
DRIVER OUT  
V
12.0 VH 6.0  
- 3.0 VL 0.0  
CC  
0
V
EE  
12  
13  
14  
15  
16  
17  
18  
20ns/DIV  
V
-V VOLTS (V -3.0 FIXED)  
EE  
CC EE  
FIGURE 9. R  
vs DEVICE VOLTAGE  
FIGURE 8. DATA/HIZ/DRIVER OUT TIMING  
OUT  
5.0  
20.0  
18.0  
16.0  
14.0  
12.0  
10.0  
8.0  
VH (1V-15V) R  
: DRIVER SOURCES 200mA  
OUT  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
2200pF  
1000pF  
680pF  
VL (0.0V FIXED) R  
: DRIVER SINKS 200mA  
OUT  
1K/100pF  
6.0  
4.0  
2.0  
0.0  
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
1
2
3
4
5
6
7
8
9
10 11 12 13 14  
VH VOLTS (VL = 0.0)  
VH VOLTS (VL = 0.0)  
FIGURE 11. PROPAGATION DELAY vs VH RAIL, VARIOUS  
FIGURE 10. R  
vs VH RAIL  
OUT  
LOADS  
30.0  
27.0  
24.0  
21.0  
18.0  
15.0  
12.0  
9.0  
20.0  
18.0  
16.0  
14.0  
2200pF  
COMPARATOR T  
PD  
NO LOAD  
DRIVER T  
12.0  
10.0  
8.0  
1000pF  
680pF  
NO LOAD  
PD  
6.0  
6.0  
4.0  
1K/100pF  
3.0  
2.0  
0.0  
0.0  
11  
12  
13  
14  
15  
16  
17  
18  
19  
1
2
3
4
5
6
7
8
9
10 11 12 13 14  
V
-V (V = -3.0)  
VH VOLTS (VL = 0.0)  
CC EE EE  
FIGURE 13. DRIVER & RECEIVER TPD VARIANCE vs V  
FIGURE 12. DRIVER FALL TIME vs VH RAIL, VARIOUS LOADS  
CC  
FN7486.0  
11  
October 31, 2005  
ISL55100A  
Typical Performance Curves Device installed on Intersil ISL55100 Evaluation Board. (Continued)  
30.0  
27.0  
24.0  
21.0  
18.0  
15.0  
12.0  
9.0  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
2200pF  
1000pF  
680pF  
ICC STATIC CONDITIONS  
6.0  
1K/100pF  
3.0  
0.0  
1
2
3
4
5
6
7
8
9
10 11 12 13 14  
11  
12  
13  
14  
15  
16  
17  
18  
19  
VH VOLTS (VL = 0.0)  
V
-V (V = -3.0)  
CC EE EE  
FIGURE 14. DRIVER RISE TIME vs VH RAIL, VARIOUS LOADS  
FIGURE 15. STATIC I  
CC  
vs V  
CC  
AIRFLOW LEGEND A=0m/s : B=1.0m/s : C =2.5 m/s  
10.0  
9.0  
150  
135  
120  
105  
90  
A
A
B
C
8.0  
12V V  
CC  
B
C
12V V  
CC  
7.0  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
18V V  
CC  
A
B
C
75  
18V V  
CC  
60  
45  
30  
9V V  
& V  
=5.5V  
EXT  
9V V  
& V  
=5.5V  
EXT  
CC  
CC  
15  
0
5
10 15 20 25 30 35 40 45 50 55 60  
FREQUENCY (MHz)  
5
10 15 20 25 30 35 40 45 50 55 60  
FREQUENCY (MHz)  
FIGURE 17. CALCULATED JUNCTION TEMP ABOVE  
FIGURE 16. DEVICE POWER DISSIPATION WITH  
-V = 18, 12 & 9.0 (V = 5.5V) VOLTS. All  
AMBIENT WITH V -V = 18, 12 & 9.0  
V
CC EE  
CC EE  
EXT  
(V  
= 5.5V) VOLTS. ALL FOUR PINS MAKING  
FOUR PINS MAKING TWO TRANSITIONS PER  
PERIOD  
EXT  
TWO TRANSITIONS PER PERIOD.  
V
+ 6.0 VH 6.0  
- 3.0 VL 0.0  
CC  
V
V
12.0 VH 6/8/10  
- 3.0 VL 0.0  
CC  
EE  
V
EE  
0
0
0
20ns/DIV  
10ns/DIV  
FIGURE 18. FREQUENCY OF 10MHz = 50ns PATTERN RATE  
FIGURE 19. MINIMUM PULSE WIDTH VH 6/8/10V  
FN7486.0  
October 31, 2005  
12  
ISL55100A  
Quad Flat No-Lead Plastic Package (QFN)  
Micro Lead Frame Plastic Package (MLFP)  
L72.10x10  
72 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE  
MILLIMETERS  
SYMBOL  
MIN  
NOMINAL  
0.90  
MAX  
1.00  
0.05  
1.00  
NOTES  
A
A1  
A2  
A3  
b
0.80  
-
-
-
0.02  
-
0.65  
9
0.20 REF  
0.25  
9
0.18  
5.85  
5.85  
0.30  
6.15  
6.15  
5, 8  
D
10.00 BSC  
9.75 BSC  
6.00  
-
D1  
D2  
E
9
7, 8  
10.00 BSC  
9.75 BSC  
6.00  
-
E1  
E2  
e
9
7, 8  
0.50 BSC  
-
-
k
0.20  
0.30  
-
-
L
0.40  
0.50  
8, 10  
N
72  
2
Nd  
Ne  
P
18  
3
18  
3
-
-
-
0.60  
12  
9
θ
-
9
Rev. 1 11/04  
NOTES:  
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.  
2. N is the number of terminals.  
3. Nd and Ne refer to the number of terminals on each D and E.  
4. All dimensions are in millimeters. Angles are in degrees.  
5. Dimension b applies to the metallized terminal and is measured  
between 0.15mm and 0.30mm from the terminal tip.  
6. The configuration of the pin #1 identifier is optional, but must be  
located within the zone indicated. The pin #1 identifier may be  
either a mold or mark feature.  
7. Dimensions D2 and E2 are for the exposed pads which provide  
improved electrical and thermal performance.  
8. Nominal dimensionsare provided toassistwith PCBLandPattern  
Design efforts, see Intersil Technical Brief TB389.  
9. Features and dimensions A2, A3, D1, E1, P & θ are present when  
Anvil singulation method is used and not present for saw  
singulation.  
10. Compliant to JEDEC MO-220VNND-3 except for the "L" min  
dimension.  
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.  
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN7486.0  
13  
October 31, 2005  

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