IS41C16256-25T-TR [ISSI]

DRAM;
IS41C16256-25T-TR
型号: IS41C16256-25T-TR
厂家: INTEGRATED SILICON SOLUTION, INC    INTEGRATED SILICON SOLUTION, INC
描述:

DRAM

动态存储器
文件: 总22页 (文件大小:177K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
®
IS41C16256  
IS41LV16256  
256K x 16 (4-MBIT) DYNAMIC RAM  
WITH EDO PAGE MODE  
ISSI  
NOVEMBER 2005  
FEATURES  
DESCRIPTION  
• TTL compatible inputs and outputs  
TheISSI ISꢁ1C1ꢂ25andISꢁ1LV1ꢂ25are2ꢂ2,1ꢁx1ꢂ-bit  
high-performanceCMOSDynamicRandomAccessMemory. Both  
productsofferacceleratedcycleaccessEDOPageMode. EDO  
PageModeallows512randomaccesseswithinasinglerowwith  
accesscycletimeasshortas10nsper1ꢂ-bitword.TheByteWrite  
control, of upper and lower byte, makes the ISꢁ1C1ꢂ25ꢂ and  
ISꢁ1LV1ꢂ25idealforusein1and32-bitwidedatabussystems.  
• Refresh Interval: 512 cycles/8 ms  
• Refresh Mode : RAS-Only, CAS-before-RAS (CBR),  
andHidden  
• JEDECstandardpinout  
• Singlepowersupply  
5V 10ꢀ (ISꢁ1C1ꢂ25ꢂ)  
ThesefeaturesmaketheISꢁ1C1ꢂ25andISꢁ1LV1ꢂ2ꢂ ideally  
suited for high band-width graphics, digital signal processing,  
high-performancecomputingsystems,andperipheralapplications.  
3.3V 10ꢀ (ISꢁ1LV1ꢂ25ꢂ)  
• Byte Write and Byte Read operation via two CAS  
• Extended Temperature Range -30oC to 85oC  
• Industrial Temperature Range -ꢁ0oC to 85oC  
The ISꢁ1C1ꢂ25ꢂ and IS41LV16256 are packaged in ꢁ0-pin  
ꢁ00-mil SOJ and TSOP (Type II).  
KEY TIMING PARAMETERS  
Parameter  
-25  
-35  
-50  
-60  
Unit  
(5V only)  
Max. RAS Access Time (tRAC)  
25  
35  
10  
18  
12  
ꢂ0  
50  
1ꢁ  
25  
20  
90  
ꢂ0  
15  
ns  
ns  
ns  
ns  
ns  
Max. CAS Access Time (tCAC)  
10  
12  
10  
ꢁ5  
Max. Column Address Access Time (tAA)  
Min. EDO Page Mode Cycle Time (tPC)  
Min. Read/Write Cycle Time (tRC)  
30  
25  
110  
PIN CONFIGURATIONS  
40-Pin TSOP (Type II)  
40-Pin SOJ  
VCC  
I/O0  
I/O1  
I/O2  
I/O3  
VCC  
I/O4  
I/O5  
I/O6  
I/O7  
1
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
GND  
I/O15  
I/O14  
I/O13  
I/O12  
GND  
I/O11  
I/O10  
I/O9  
VCC  
I/O0  
I/O1  
I/O2  
I/O3  
VCC  
I/O4  
I/O5  
I/O6  
I/O7  
NC  
1
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
GND  
2
2
I/O15  
I/O14  
I/O13  
I/O12  
GND  
I/O11  
I/O10  
I/O9  
I/O8  
NC  
PIN DESCRIPTIONS  
3
3
4
4
A0-A8 Address Inputs  
5
5
6
I/O0-15 Data Inputs/Outputs  
6
7
7
WE  
Write Enable  
8
8
9
OE  
Output Enable  
9
10  
I/O8  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
RAS  
UCAS  
LCAS  
Vcc  
Row Address Strobe  
UpperColumnAddressStrobe  
LowerColumnAddressStrobe  
Power  
NC  
NC  
WE  
RAS  
NC  
A0  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
NC  
NC  
LCAS  
UCAS  
OE  
LCAS  
UCAS  
OE  
WE  
RAS  
NC  
A8  
A8  
A0  
A7  
A7  
GND  
NC  
Ground  
A1  
A6  
A1  
A6  
No Connection  
A2  
A5  
A2  
A5  
A3  
A4  
A3  
A4  
VCC  
GND  
VCC  
GND  
Copyright © 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
1
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
FUNCTIONAL BLOCK DIAGRAM  
OE  
WE  
WE  
CONTROL  
LOGICS  
OE  
CONTROL  
LOGIC  
CAS  
CLOCK  
GENERATOR  
LCAS  
UCAS  
CAS  
WE  
DATA I/O BUS  
RAS  
CLOCK  
RAS  
GENERATOR  
COLUMN DECODERS  
SENSE AMPLIFIERS  
REFRESH  
COUNTER  
I/O0-I/O15  
MEMORY ARRAY  
262,144 x 16  
ADDRESS  
BUFFERS  
A0-A8  
2
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
TRUTHTABLE  
Function  
RAS  
LCAS UCAS WE  
OE Address tR/tC I/O  
Standby  
H
L
L
H
L
L
H
L
X
H
H
X
L
L
X
High-Z  
Read: Word  
Read: Lower Byte  
ROW/COL  
ROW/COL  
DOUT  
H
Lower Byte, DOUT  
Upper Byte, High-Z  
Read: Upper Byte  
L
H
L
H
L
ROW/COL  
Lower Byte, High-Z  
Upper Byte, DOUT  
Write: Word (Early Write)  
L
L
L
L
L
L
L
X
X
ROW/COL  
ROW/COL  
DIN  
Write: Lower Byte (Early Write)  
H
Lower Byte, DIN  
Upper Byte, High-Z  
Write: Upper Byte (Early Write)  
Read-Write(1,2)  
L
L
H
L
L
L
L
X
ROW/COL  
ROW/COL  
Lower Byte, High-Z  
Upper Byte, DIN  
HL LH  
DOUT, DIN  
EDO Page-Mode Read(2) 1st Cycle:  
2nd Cycle:  
L
L
L
HL HL  
HL HL  
LH LH  
H
H
H
L
L
L
ROW/COL  
NA/COL  
NA/NA  
DOUT  
DOUT  
DOUT  
Any Cycle:  
EDO Page-Mode Write(1) 1st Cycle:  
2nd Cycle:  
L
L
HL HL  
HL HL  
L
L
X
X
ROW/COL  
NA/COL  
DIN  
DIN  
EDO Page-Mode  
Read-Write(1,2)  
1st Cycle:  
2nd Cycle:  
L
L
HL HL HL LH  
HL HL HL LH  
ROW/COL  
NA/COL  
DOUT, DIN  
DOUT, DIN  
Hidden Refresh2)  
Read LHL  
Write LHL  
L
L
L
L
H
L
L
X
ROW/COL  
ROW/COL  
DOUT  
DOUT  
RAS-Only Refresh  
CBR Refresh(3)  
L
H
L
H
L
X
X
X
X
ROW/NA  
X
High-Z  
High-Z  
HL  
Notes:  
1. These WRITE cycles may also be BYTE WRITE cycles (either LCAS or UCAS active).  
2. These READ cycles may also be BYTE READ cycles (either LCAS or UCAS active).  
3. At least one of the two CAS signals must be active (LCAS or UCAS).  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
3
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
Functional Description  
Refresh Cycle  
The ISꢁ1C1ꢂ25ꢂ and ISꢁ1LV1ꢂ25ꢂ is a CMOS DRAM  
optimized for high-speed bandwidth, low power applica-  
tions. During READ or WRITE cycles, each bit is uniquely  
addressed through the 18 address bits. These are en-  
tered nine bits (A0-A8) at a time. The row address is  
latched by the Row Address Strobe (RAS). The column  
address is latched by the Column Address Strobe (CAS).  
RAS is used to latch the first nine bits and CAS is used the  
latter nine bits.  
To retain data, 512 refresh cycles are required in each  
8 ms period. There are two ways to refresh the memory.  
1. Byclockingeachofthe512rowaddresses(A0through  
A8) withRAS at least once every 8 ms. Any read, write,  
read-modify-write or RAS-only cycle refreshes the ad-  
dressed row.  
2. Using a CAS-before-RAS refresh cycle. CAS-before-  
RAS refresh is activated by the falling edge of RAS,  
while holding CAS LOW. In CAS-before-RAS refresh  
cycle, an internal 9-bit counter provides the row ad-  
dresses and the external address inputs are ignored.  
The ISꢁ1C1ꢂ25ꢂ and ISꢁ1LV1ꢂ25ꢂ has two CAS con-  
trols, LCAS and UCAS. The LCAS and UCAS inputs  
internally generates a CAS signal functioning in an iden-  
tical manner to the single CAS input on the other 25ꢂK x  
1ꢂ DRAMs. The key difference is that each CAS controls  
its corresponding I/O tristate logic (in conjunction with OE  
and WE and RAS). LCAS controls I/O0 through I/O7 and  
UCAS controls I/O8 through I/O15.  
CAS-before-RAS is a refresh-only mode and no data  
access or device selection is allowed. Thus, the output  
remains in the High-Z state during the cycle.  
Extended Data Out Page Mode  
The ISꢁ1C1ꢂ25ꢂ and ISꢁ1LV1ꢂ25ꢂ CAS function is  
determinedbythefirstCAS(LCASorUCAS)transitioning  
LOW and the last transitioning back HIGH. The two CAS  
controls give the ISꢁ1C1ꢂ25ꢂ both BYTE READ and  
BYTE WRITE cycle capabilities.  
EDOpagemodeoperationpermitsall512columnswithin  
a selected row to be randomly accessed at a high data  
rate.  
In EDO page mode read cycle, the data-out is held to the  
next CAS cycle’s falling edge, instead of the rising edge.  
For this reason, the valid data output time in EDO page  
mode is extended compared with the fast page mode. In  
the fast page mode, the valid data output time becomes  
shorter as the CAS cycle time becomes shorter. There-  
fore, in EDO page mode, the timing margin in read cycle  
is larger than that of the fast page mode even if the CAS  
cycle time becomes shorter.  
Memory Cycle  
A memory cycle is initiated by bring RAS LOW and it is  
terminated by returning both RAS and CAS HIGH. To  
ensures proper device operation and data integrity any  
memory cycle, once initiated, must not be ended or  
aborted before the minimum tRAS time has expired. A new  
cycle must not be initiated until the minimum precharge  
time tRP, tCP has elapsed.  
InEDOpagemode,duetotheextendeddatafunction,the  
CAS cycle time can be shorter than in the fast page mode  
if the timing margin is the same.  
The EDO page mode allows both read and write opera-  
tions during one RAS cycle, but the performance is  
equivalent to that of the fast page mode in that case.  
Read Cycle  
A read cycle is initiated by the falling edge of CAS or OE,  
whichever occurs last, while holding WE HIGH. The  
column address must be held for a minimum time speci-  
fied by tAR. Data Out becomes valid only when tRAC, tAA,  
tCAC and tOEA are all satisfied. As a result, the access time  
is dependent on the timing relationships between these  
parameters.  
Power-On  
After application of the VCC supply, an initial pause of  
200 µs is required followed by a minimum of eight initial-  
ization cycles (any combination of cycles containing a  
RASsignal).  
Write Cycle  
During power-on, it is recommended that RAS track with  
VCC or be held at a valid VIH to avoid current surges.  
A write cycle is initiated by the falling edge of CAS and  
WE, whichever occurs last. The input data must be valid  
at or before the falling edge of CAS or WE, whichever  
occurs last.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
ABSOLUTE MAXIMUM RATINGS(1)  
Symbol Parameters  
Rating  
Unit  
VT  
Voltage on Any Pin Relative to GND  
5V  
3.3V  
–1.0 to +7.0  
-0.5 to ꢁ.ꢂ  
V
V
VCC  
Supply Voltage  
5V  
3.3V  
–1.0 to +7.0  
-0.5 to ꢁ.ꢂ  
V
V
IOUT  
PD  
Output Current  
Power Dissipation  
50  
1
mA  
W
TA  
CommercialTemperature  
ExtendedTemperature  
IndustrialTemperature  
0 to +70  
–30 to +85  
–ꢁ0 to +85  
°C  
°C  
°C  
TSTG  
StorageTemperature  
–55 to +125  
°C  
Note:  
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent  
damage to the device. This is a stress rating only and functional operation of the device at these  
or any other conditions above those indicated in the operational sections of this specification is not  
implied. Exposure to absolute maximum rating conditions for extended periods may affect  
reliability.  
RECOMMENDED OPERATING CONDITIONS (Voltages are referenced to GND.)  
Symbol  
Parameter  
Min.  
Typ.  
Max.  
Unit  
VCC  
SupplyVoltage  
5V  
3.3V  
ꢁ.5  
3.0  
5.0  
3.3  
5.5  
3.ꢂ  
V
VIH  
VIL  
TA  
Input High Voltage  
Input Low Voltage  
5V  
3.3V  
5V  
3.3V  
2.ꢁ  
2.0  
–1.0  
–0.3  
0
–30  
–ꢁ0  
VCC + 1.0  
VCC + 0.3  
V
V
0.8  
0.8  
70  
85  
85  
CommercialAmbientTemperature  
ExtendedAmbientTemperature  
IndustrialAmbientTemperature  
°C  
°C  
°C  
CAPACITANCE(1,2)  
Symbol  
Parameter  
Input Capacitance: A0-A8  
Input Capacitance: RAS, UCAS, LCAS, WE, OE  
Max.  
Unit  
CIN1  
CIN2  
CIO  
5
7
7
pF  
pF  
pF  
Data Input/Output Capacitance: I/O0-I/O15  
Notes:  
1. Tested initially and after any design or process changes that may affect these parameters.  
2. Test conditions: TA = 25°C, f = 1 MHz,  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
5
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
ELECTRICALCHARACTERISTICS(1)  
(Recommended Operation Conditions unless otherwise noted.)  
Symbol Parameter  
Test Condition  
Speed Min. Max.  
Unit  
IIL  
InputLeakageCurrent  
Any input 0V VIN Vcc  
Other inputs not under test = 0V  
–10  
10  
µA  
IIO  
Output Leakage Current  
Output is disabled (Hi-Z)  
–10  
10  
µA  
0V VOUT Vcc  
VOH  
VOL  
ICC1  
Output High Voltage Level  
Output Low Voltage Level  
Stand-byCurrent:TTL  
IOH = –2.5 mA  
2.ꢁ  
V
V
IOL = +2.1 mA  
0.ꢁ  
RAS, LCAS, UCAS VIH Commercial 5V  
2
3
1
2
mA  
Industrial  
Commercial 3V  
5V  
Industrial  
RAS, LCAS, UCAS VCC – 0.2V  
3V  
ICC2  
ICC3  
Stand-byCurrent:CMOS  
5V  
3V  
1
0.5  
mA  
mA  
OperatingCurrent:  
RAS, LCAS, UCAS,  
Address Cycling, tRC = tRC (min.)  
-25  
-35  
-50  
-ꢂ0  
2ꢂ0  
230  
180  
170  
RandomRead/Write(2,3,ꢁ)  
Average Power Supply Current  
ICCꢁ  
ICC5  
OperatingCurrent:  
RAS = VIL, LCAS, UCAS,  
Cycling tPC = tPC (min.)  
-25  
-35  
-50  
-ꢂ0  
250  
220  
170  
1ꢂ0  
mA  
mA  
mA  
EDOPageMode(2,3,ꢁ)  
Average Power Supply Current  
RefreshCurrent:  
RAS Cycling, LCAS, UCAS VIH  
tRC = tRC (min.)  
-25  
-35  
-50  
-ꢂ0  
2ꢂ0  
230  
180  
170  
RAS-Only(2,3)  
Average Power Supply Current  
ICCꢂ  
RefreshCurrent:  
RAS, LCAS, UCAS Cycling  
tRC = tRC (min.)  
-25  
-35  
-50  
-ꢂ0  
2ꢂ0  
230  
180  
170  
CBR(2,3,5)  
AveragePowerSupplyCurrent  
Notes:  
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device  
operation is assured. The eight RAS cycles wake-up should be repeated any time the tREF refresh requirement is exceeded.  
2. Dependent on cycle rates.  
3. Specified values are obtained with minimum cycle time and the output open.  
ꢁ. Column-address is changed once each EDO page cycle.  
5. Enables on-chip refresh and address counters.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
ACCHARACTERISTICS(1,2,3,4,5,6)  
(Recommended Operating Conditions unless otherwise noted.)  
-25  
-35  
-50  
-60  
Min. Max. Units  
Symbol Parameter  
Min. Max.  
Min. Max  
Min. Max.  
t
RC  
RAC  
CAC  
AA  
RAS  
RP  
CAS  
CP  
CSH  
RCD  
ASR  
RAH  
ASC  
CAH  
AR  
Random READ or WRITE Cycle Time  
Access Time from RAS(ꢂ, 7)  
Access Time from CAS(ꢂ, 8, 15)  
Access Time from Column-Address(ꢂ)  
RAS Pulse Width  
ꢁ5  
25  
15  
25  
10  
12  
10K  
ꢂ0  
35  
20  
35  
10  
18  
10K  
90  
50  
30  
8
50  
1ꢁ  
25  
10K  
110  
ꢂ0  
ꢁ0  
10  
10  
ꢂ0  
20  
0
ꢂ0  
15  
30  
10K  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
RAS Precharge Time  
CAS Pulse Width(2ꢂ)  
CAS Precharge Time(9, 25)  
CAS Hold Time (21)  
RAS to CAS Delay Time(10, 20)  
Row-Address Setup Time  
Row-Address Hold Time  
Column-Address Setup Time(20)  
Column-Address Hold Time(20)  
t
10K  
10K  
10K  
10K  
t
5
8
t
25  
10  
0
35  
11  
0
50  
19  
0
t
17  
28  
3ꢂ  
ꢁ5  
t
t
8
10  
0
t
0
0
0
t
5
8
10  
ꢁ0  
t
Column-Address Hold Time  
19  
30  
ꢁ0  
(referenced to RAS)  
t
RAD  
RAL  
RPC  
RSH  
CLZ  
CRP  
OD  
RAS to Column-Address Delay Time(11)  
Column-Address to RAS Lead Time  
RAS to CAS Precharge Time  
RAS Hold Time(27)  
CAS to Output in Low-Z(15, 29)  
CAS to RAS Precharge Time(21)  
Output Disable Time(19, 28, 29)  
8
12  
0
20  
12  
8
10  
18  
0
20  
12  
10  
1ꢁ  
25  
0
25  
12  
15  
15  
30  
0
30  
12  
15  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
t
7
8
1ꢁ  
3
15  
3
t
3
3
t
5
5
5
5
t
2
3
3
3
t
OE /tOEA Output Enable Time(15, 1ꢂ)  
0
0
0
10  
10  
5
t
OEHC  
OEP  
OES  
OE HIGH Hold Time from CAS HIGH  
OE HIGH Pulse Width  
10  
10  
5
10  
10  
5
10  
10  
5
t
t
OE LOW to CAS HIGH Setup Time  
Read Command Setup Time(17, 20)  
tRCS  
0
0
0
0
t
RRH  
RCH  
Read Command Hold Time  
0
0
0
0
(referenced to RAS)(12)  
t
Read Command Hold Time  
0
0
0
0
ns  
(referenced to CAS)(12, 17, 21)  
t
WCH  
WCR  
Write Command Hold Time(17, 27)  
5
5
8
10  
50  
ns  
ns  
t
Write Command Hold Time  
19  
30  
ꢁ0  
(referenced to RAS)(17)  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
7
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
AC CHARACTERISTICS (Continued)(1,2,3,4,5,6)  
(Recommended Operating Conditions unless otherwise noted.)  
-25  
-35  
-50  
-60  
Min. Max. Units  
Symbol Parameter  
Min. Max.  
Min. Max.  
Min. Max.  
t
WP  
WPZ  
RWL  
CWL  
Write Command Pulse Width(17)  
5
10  
7
5
10  
8
8
10  
10  
15  
15  
0
ns  
ns  
ns  
ns  
ns  
t
WE Pulse Widths to Disable Outputs  
Write Command to RAS Lead Time(17)  
Write Command to CAS Lead Time(17, 21)  
Write Command Setup Time(1ꢁ, 17, 20)  
10  
1ꢁ  
1ꢁ  
0
t
t
5
8
tWCS  
0
0
t
DHR  
Data-in Hold Time (referenced to RAS)  
Column-Address Setup Time to CAS  
Precharge during WRITE Cycle  
19  
15  
30  
15  
ꢁ0  
15  
ꢁ0  
15  
ns  
ns  
tACH  
tOEH  
OE Hold Time from WE during  
5
8
8
15  
ns  
READ-MODIFY-WRITE cycle(18)  
t
DS  
Data-In Setup Time(15, 22)  
Data-In Hold Time(15, 22)  
0
5
0
0
0
ns  
ns  
ns  
ns  
t
t
t
DH  
10  
RWC  
RWD  
READ-MODIFY-WRITE Cycle Time  
ꢂ5  
35  
80  
ꢁ5  
100  
50  
1ꢁ0  
80  
RAS to WE Delay Time during  
READ-MODIFY-WRITE Cycle(1ꢁ)  
t
CWD  
AWD  
CAS to WE Delay Time(1ꢁ, 20)  
Column-Address to WE Delay Time(1ꢁ)  
17  
21  
10  
25  
30  
12  
30  
30  
15  
3ꢂ  
ꢁ9  
25  
ns  
ns  
ns  
t
tPC  
EDO Page Mode READ or WRITE  
Cycle Time(2ꢁ)  
t
RASP  
CPA  
PRWC  
RAS Pulse Width in EDO Page Mode  
Access Time from CAS Precharge(15)  
25 100K  
35 100K  
ꢁ0 100K  
ꢂ0 100K  
ns  
ns  
ns  
t
1ꢁ  
21  
27  
3ꢁ  
t
EDO Page Mode READ-WRITE  
Cycle Time(2ꢁ)  
32  
ꢁ0  
ꢁ5  
5ꢂ  
t
COH /tDOH Data Output Hold after CAS LOW  
5
3
5
3
5
3
5
3
ns  
ns  
tOFF  
Output Buffer Turn-Off Delay from  
15  
15  
15  
15  
CAS or RAS(13,15,19, 29)  
t
t
WHZ  
Output Disable Delay from WE  
3
15  
3
15  
3
15  
3
15  
ns  
ns  
CLCH  
Last CAS going LOW to First CAS  
10  
10  
10  
10  
returning HIGH(23)  
t
CSR  
CHR  
ORD  
CAS Setup Time (CBR REFRESH)(30, 20)  
CAS Hold Time (CBR REFRESH)(30, 21)  
5
7
0
8
8
0
10  
10  
0
10  
10  
0
ns  
ns  
ns  
t
t
OE Setup Time prior to RAS during  
HIDDEN REFRESH Cycle  
t
REF  
Refresh Period (512 Cycles)  
Transition Time (Rise or Fall)(2, 3)  
1
8
1
8
1
8
1
8
ms  
ns  
tT  
50  
50  
50  
50  
8
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
Notes:  
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycle (RAS-Only or CBR) before proper device  
operation is assured. The eight RAS cycles wake-up should be repeated any time the tREF refresh requirement is exceeded.  
2. VIH (MIN) and VIL (MAX) are reference levels for measuring timing of input signals. Transition times, are measured between VIH  
and VIL (or between VIL and VIH) and assume to be 1 ns for all inputs.  
3. In addition to meeting the transition rate specification, all input signals must transit between VIH and VIL (or between VIL and VIH) in  
amonotonicmanner.  
ꢁ. If CAS and RAS = VIH, data output is High-Z.  
5. If CAS = VIL, data output may contain data from the last valid READ cycle.  
ꢂ. Measured with a load equivalent to one TTL gate and 50 pF.  
7. Assumes that tRCD - tRCD (MAX). If tRCD is greater than the maximum recommended value shown in this table, tRAC will increase by  
the amount that tRCD exceeds the value shown.  
8. Assumes that tRCD • tRCD (MAX).  
9. If CAS is LOW at the falling edge of RAS, data out will be maintained from the previous cycle. To initiate a new cycle and clear the  
data output buffer, CAS and RAS must be pulsed for tCP.  
10. Operation with the tRCD (MAX) limit ensures that tRAC (MAX) can be met. tRCD (MAX) is specified as a reference point only; if tRCD  
is greater than the specified tRCD (MAX) limit, access time is controlled exclusively by tCAC.  
11. Operation within the tRAD (MAX) limit ensures that tRCD (MAX) can be met. tRAD (MAX) is specified as a reference point only; if tRAD  
is greater than the specified tRAD (MAX) limit, access time is controlled exclusively by tAA.  
12. Either tRCH or tRRH must be satisfied for a READ cycle.  
13. tOFF (MAX) defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL.  
1ꢁ. tWCS, tRWD, tAWD and tCWD are restrictive operating parameters in LATE WRITE and READ-MODIFY-WRITE cycle only. If tWCS •  
tWCS (MIN), the cycle is an EARLY WRITE cycle and the data output will remain open circuit throughout the entire cycle. If tRWD •  
tRWD (MIN), tAWD • tAWD (MIN) and tCWD • tCWD (MIN), the cycle is a READ-WRITE cycle and the data output will contain data read  
from the selected cell. If neither of the above conditions is met, the state of I/O (at access time and until CAS and RAS or OE go  
back to VIH) is indeterminate. OE held HIGH and WE taken LOW after CAS goes LOW result in a LATE WRITE (OE-controlled)  
cycle.  
15. Output parameter (I/O) is referenced to corresponding CAS input, I/O0-I/O7 by LCAS and I/O8-I/O15 by UCAS.  
1ꢂ. During a READ cycle, if OE is LOW then taken HIGH before CAS goes HIGH, I/O goes open. If OE is tied permanently LOW, a  
LATE WRITE or READ-MODIFY-WRITE is not possible.  
17. Write command is defined as WE going low.  
18. LATE WRITE and READ-MODIFY-WRITE cycles must have both tOD and tOEH met (OE HIGH during WRITE cycle) in order to  
ensure that the output buffers will be open during the WRITE cycle. The I/Os will provide the previously written data if CAS  
remains LOW and OE is taken back to LOW after tOEH is met.  
19. The I/Os are in open during READ cycles once tOD or tOFF occur.  
20. The first χCAS edge to transition LOW.  
21. The last χCAS edge to transition HIGH.  
22. These parameters are referenced to CAS leading edge in EARLY WRITE cycles and WE leading edge in LATE WRITE or  
READ-MODIFY-WRITE cycles.  
23. Last falling χCAS edge to first rising χCAS edge.  
2ꢁ. Last rising χCAS edge to next cycle’s last rising χCAS edge.  
25. Last rising χCAS edge to first falling χCAS edge.  
2ꢂ. Each χCAS must meet minimum pulse width.  
27. Last χCAS to go LOW.  
28. I/Os controlled, regardless UCAS and LCAS.  
29. The 3 ns minimum is a parameter guaranteed by design.  
30. Enables on-chip refresh and address counters.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
9
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
READCYCLE  
tRC  
t
RAS  
t
RP  
RAS  
tCSH  
tRSH  
tRRH  
t
CRP  
ASR  
t
CAS CLCH  
t
t
RCD  
UCAS/LCAS  
tAR  
t
RAD  
tRAL  
t
t
RAH  
tCAH  
tASC  
ADDRESS  
WE  
Row  
Column  
Row  
tRCS  
tRCH  
tAA  
tRAC  
(1)  
tOFF  
tCAC  
t
CLC  
Open  
Open  
Valid Data  
I/O  
OE  
tOE  
tOD  
tOES  
Don't Care  
Note:  
1. tOFF is referenced from rising edge of RAS or CAS, whichever occurs last.  
10  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
EARLY WRITE CYCLE (OE = DON'T CARE)  
tRC  
t
RAS  
tRP  
RAS  
t
CSH  
t
RSH  
t
CRP  
ASR  
t
CAS CLCH  
t
t
RCD  
UCAS/LCAS  
tAR  
t
RAD  
t
t
t
RAL  
CAH  
ACH  
t
t
RAH  
tASC  
ADDRESS  
Row  
Column  
Row  
t
t
CWL  
RWL  
t
WCR  
tWCS  
tWCH  
tWP  
WE  
I/O  
t
t
DHR  
tDH  
DS  
Valid Data  
Don't Care  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
11  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
READ WRITE CYCLE (LATE WRITE and READ-MODIFY-WRITE Cycles)  
t
t
RWC  
RAS  
t
RP  
RAS  
t
CSH  
t
RSH  
t
CRP  
ASR  
t
CAS CLCH  
t
t
RCD  
UCAS/LCAS  
t
AR  
t
RAD  
t
RAL  
ACH  
t
t
RAH  
tCAH  
t
ASC  
t
ADDRESS  
WE  
Row  
Column  
Row  
t
RWD  
tCWL  
t
RCS  
t
CWD  
t
RWL  
t
AWD  
t
WP  
t
AA  
t
RAC  
t
t
CAC  
CLZ  
t
DS  
tDH  
Open  
Open  
Valid DOUT  
Valid DIN  
I/O  
OE  
t
OD  
tOEH  
t
OE  
Don't Care  
12  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
EDO-PAGE-MODE READ CYCLE  
tRASP  
tRP  
RAS  
(1)  
tPC  
tCSH  
tRSH  
tCRP  
tRCD  
t
CAS,  
tCP  
t
CAS,  
tCP  
t
CAS,  
tCP  
t
CLCH  
t
CLCH  
tCLCH  
UCAS/LCAS  
tAR  
tRAD  
tRAL  
tASR  
tASC  
tCAH  
tASC  
tCAH  
tASC  
tCAH  
ADDRESS  
WE  
Row  
Column  
Column  
Column  
Row  
t
RAH  
tRRH  
tRCS  
tRCH  
tAA  
tAA  
tAA  
t
RAC  
CAC  
CLZ  
tCPA  
tCPA  
t
t
t
CAC  
t
t
CAC  
tCOH  
CLZ  
tOFF  
Open  
Open  
Valid Data  
Valid Data  
Valid Data  
I/O  
OE  
t
OE  
t
OEHC  
tOE  
t
OD  
tOES  
tOD  
tOES  
tOEP  
Don't Care  
Note:  
1. tPC can be measured from falling edge of CAS to falling edge of CAS, or from rising edge of CAS to rising edge of CAS. Both  
measurements must meet the tPC specifications.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
13  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
EDO-PAGE-MODE EARLY-WRITE CYCLE  
t
RASP  
t
RP  
RAS  
t
CSH  
t
PC  
t
RSH  
t
CRP  
t
CAS,  
t
CP  
t
CAS,  
t
CP  
t
CAS,  
tCP  
t
RCD  
t
CLCH  
t
CLCH  
tCLCH  
UCAS/LCAS  
t
AR  
tACH  
t
ACH  
t
ACH  
CAH  
t
RAD  
t
RAL  
t
ASR  
t
ASC  
t
CAH  
t
ASC  
t
t
ASC  
t
CAH  
ADDRESS  
Row  
Column  
Column  
Column  
Row  
t
RAH  
t
CWL  
WCS  
WCH  
t
CWL  
tCWL  
t
t
WCS  
t
WCS  
t
t
WCH  
tWCH  
t
WP  
t
WP  
t
WP  
WE  
t
WCR  
DHR  
tRWL  
t
tDS  
tDS  
tDS  
t
DH  
t
DH  
tDH  
I/O  
Valid Data  
Valid Data  
Valid Data  
OE  
Don't Care  
1ꢁ  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
EDO-PAGE-MODE READ-WRITE CYCLE (LATE WRITE and READ-MODIFY WRITE Cycles)  
tRASP  
tRP  
RAS  
(1)  
tPC / tPRWC  
tCSH  
tRSH  
tCRP  
tRCD  
tCAS,  
tCLCH  
tCP  
tCAS,  
tCLCH  
tCP  
tCAS,  
tCLCH  
tCP  
UCAS/LCAS  
tAR  
tASR  
tRAD  
tRAL  
tASC  
tCAH  
tASC  
tCAH  
tASC  
tCAH  
tRAH  
ADDRESS  
Row  
Column  
Column  
Column  
Row  
t
RWD  
t
RWL  
CWL  
WP  
tRCS  
t
CWL  
t
CWL  
t
tWP  
tWP  
t
tAWD  
tAWD  
tAWD  
tCWD  
tCWD  
tCWD  
WE  
tAA  
t
AA  
CPA  
t
AA  
tCPA  
t
t
RAC  
t
DH  
DS  
t
DH  
DS  
t
DH  
tDS  
t
t
t
CAC  
CLZ  
t
t
CAC  
CLZ  
t
t
CAC  
CLZ  
t
Open  
Open  
I/O  
OE  
D
OUT  
D
t
IN  
D
OUT  
D
IN  
D
OUT  
D
IN  
OD  
tOD  
t
OD  
tOE  
tOE  
tOE  
tOEH  
Don't Care  
Note:  
1. tPC can be measured from falling edge of CAS to falling edge of CAS, or from rising edge of CAS to rising edge of CAS. Both  
measurements must meet the tPC specifications.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
15  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
EDO-PAGE-MODE READ-EARLY-WRITE CYCLE (Psuedo READ-MODIFY WRITE)  
t
RASP  
t
RP  
RAS  
t
CSH  
t
PC  
tPC  
t
RSH  
t
CRP  
t
RCD  
t
CAS  
t
CP  
t
CAS  
t
CP  
t
CAS  
tCP  
UCAS/LCAS  
t
AR  
t
ACH  
RAL  
CAH  
t
ASR  
t
t
RAD  
t
t
ASC  
t
CAH  
t
ASC  
t
CAH  
t
ASC  
t
RAH  
ADDRESS  
WE  
Row  
Column (A)  
Column (B)  
Column (N)  
Row  
t
RCS  
t
RCH  
t
WCS  
tWCH  
t
WHZ  
t
AA  
t
AA  
t
CPA  
CAC  
COH  
t
RAC  
CAC  
t
t
t
t
DS  
tDH  
Open  
Open  
I/O  
OE  
Valid Data (A)  
Valid Data (B)  
DIN  
t
OE  
Don't Care  
1ꢂ  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
AC WAVEFORMS  
READ CYCLE (With WE-Controlled Disable)  
RAS  
tCSH  
t
CRP  
ASR  
t
RCD  
tCP  
tCAS  
UCAS/LCAS  
tAR  
t
RAD  
t
t
RAH  
tCAH  
tASC  
tASC  
ADDRESS  
WE  
Row  
Column  
Column  
tRCS  
tRCH  
tRCS  
tAA  
tRAC  
tCAC  
tCLZ  
tWHZ  
tCLZ  
Open  
Open  
Valid Data  
I/O  
OE  
tOE  
tOD  
Don't Care  
RAS-ONLY REFRESH CYCLE (OE, WE = DON'T CARE)  
t
RC  
t
RAS  
tRP  
RAS  
t
CRP  
t
RPC  
UCAS/LCAS  
t
ASR  
tRAH  
ADDRESS  
I/O  
Row  
Row  
Open  
Don't Care  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
17  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
CBR REFRESH CYCLE (Addresses; WE, OE = DON'T CARE)  
t
RP  
t
RAS  
t
RP  
t
RAS  
RAS  
t
CHR  
tCHR  
t
RPC  
CP  
tRPC  
t
t
CSR  
tCSR  
UCAS/LCAS  
I/O  
Open  
HIDDEN REFRESH CYCLE (WE = HIGH; OE = LOW)(1)  
tRAS  
tRAS  
tRP  
RAS  
tCRP  
tRCD  
t
RSH  
tCHR  
UCAS/LCAS  
tAR  
tRAD  
t
RAL  
tASR  
tRAH  
tCAH  
tASC  
ADDRESS  
Row  
Column  
t
AA  
t
RAC  
(2)  
tOFF  
tCAC  
tCLZ  
Open  
Open  
Valid Data  
I/O  
OE  
tOE  
tOD  
tORD  
Don't Care  
Notes:  
1. A Hidden Refresh may also be performed after a Write Cycle. In this case, WE = LOW and OE = HIGH.  
2. tOFF is referenced from rising edge of RAS or CAS, whichever occurs last.  
18  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. K  
10/28/05  
IS41C16256  
IS41LV16256  
®
ISSI  
ORDERING INFORMATION : 5V  
Commercial Range: 0oC to 70oC  
Speed (ns) Order Part No.  
Package  
25  
35  
ꢂ0  
ISꢁ1C1ꢂ25ꢂ-25K  
ISꢁ1C1ꢂ25ꢂ-25T  
ꢁ00-mil SOJ  
ꢁ00-mil TSOP (Type II)  
ISꢁ1C1ꢂ25ꢂ-35K  
ISꢁ1C1ꢂ25ꢂ-35T  
ꢁ00-mil SOJ  
ꢁ00-mil TSOP (Type II)  
ISꢁ1C1ꢂ25ꢂ-ꢂ0K  
ISꢁ1C1ꢂ25ꢂ-ꢂ0T  
ꢁ00-mil SOJ  
ꢁ00-mil TSOP (Type II)  
ORDERING INFORMATION : 3.3V  
Commercial Range: 0oC to 70oC  
Speed (ns) Order Part No.  
Package  
35  
ISꢁ1LV1ꢂ25ꢂ-35K  
ISꢁ1LV1ꢂ25ꢂ-35T  
ꢁ00-mil SOJ  
ꢁ00-mil TSOP (Type II)  
ꢂ0  
ISꢁ1LV1ꢂ25ꢂ-ꢂ0K  
ISꢁ1LV1ꢂ25ꢂ-ꢂ0T  
ꢁ00-milSOJ  
ꢁ00-mil TSOP (Type II)  
ORDERING INFORMATION : 5V  
Industrial Range: -40oC to 85oC  
Speed (ns) Order Part No.  
Package  
50  
ISꢁ1C1ꢂ25ꢂ-50KI  
ISꢁ1C1ꢂ25ꢂ-50TI  
ꢁ00-milSOJ  
ꢁ00-mil TSOP (Type II)  
ꢂ0  
ISꢁ1C1ꢂ25ꢂ-ꢂ0KI  
ISꢁ1C1ꢂ25ꢂ-ꢂ0TI  
ꢁ00-milSOJ  
ꢁ00-mil TSOP (Type II)  
ORDERING INFORMATION : 3.3V  
Industrial Range: -40oC to 85oC  
Speed (ns) Order Part No.  
Package  
ꢂ0  
ISꢁ1LV1ꢂ25ꢂ-ꢂ0KI  
ISꢁ1LV1ꢂ25ꢂ-ꢂ0TI  
ꢁ00-milSOJ  
ꢁ00-mil TSOP (Type II)  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
19  
Rev. K  
10/28/05  
®
PACKAGING INFORMATION  
400-mil Plastic SOJ  
Package Code: K  
ISSI  
Notes:  
1. Controlling dimension:  
millimeters.  
N
N/2+1  
2. BSC = Basic lead spacing  
between centers.  
3. Dimensions D and E1 do not  
include mold flash protrusions  
and should be measured from  
the bottom of the package.  
4. Reference document: JEDEC  
MS-027.  
E1  
E
1
N/2  
SEATING PLANE  
D
A
b
C
A2  
e
B
A1  
E2  
Millimeters  
Inches  
Min Max  
Millimeters  
Inches  
Min Max  
Millimeters  
Inches  
Symbol Min  
Max  
Min  
Max  
Min  
Max  
Min  
Max  
No. Leads (N)  
28  
32  
36  
A
A1  
A2  
B
b
C
D
E
E1  
E2  
e
3.25 3.75  
0.128 0.148  
3.25  
0.64  
2.08  
0.38  
0.66  
0.18  
20.82 21.08  
11.05 11.30  
10.03 10.29  
9.40 BSC  
3.75  
0.51  
0.81  
0.33  
0.128 0.148  
3.25 3.75  
0.128 0.148  
0.64  
2.08  
0.025  
0.082  
0.025  
0.082  
0.64  
2.08  
0.025  
0.082  
0.38 0.51  
0.66 0.81  
0.18 0.33  
18.29 18.54  
11.05 11.30  
10.03 10.29  
9.40 BSC  
0.015 0.020  
0.026 0.032  
0.007 0.013  
0.720 0.730  
0.435 0.445  
0.395 0.405  
0.370 BSC  
0.015 0.020  
0.026 0.032  
0.007 0.013  
0.820 0.830  
0.435 0.445  
0.395 0.405  
0.370 BSC  
0.38 0.51  
0.66 0.81  
0.18 0.33  
23.37 23.62  
11.05 11.30  
10.03 10.29  
9.40 BSC  
0.015 0.020  
0.026 0.032  
0.007 0.013  
0.920 0.930  
0.435 0.445  
0.395 0.405  
0.370 BSC  
1.27 BSC  
0.050 BSC  
1.27 BSC  
0.050 BSC  
1.27 BSC  
0.050 BSC  
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774  
Rev. F  
10/29/03  
®
PACKAGING INFORMATION  
ISSI  
Millimeters  
Symbol Min Max  
No. Leads (N)  
Inches  
Min Max  
Millimeters  
Inches  
Min Max  
Millimeters  
Min Max  
Inches  
Min Max  
Min  
Max  
40  
42  
44  
A
A1  
A2  
B
b
C
D
E
E1  
E2  
e
3.25 3.75  
0.128 0.148  
3.25  
0.64  
2.08  
0.38  
0.66  
0.18  
27.18 27.43  
11.05 11.30  
10.03 10.29  
9.40 BSC  
3.75  
0.51  
0.81  
0.33  
0.128 0.148  
3.25 3.75  
0.128 0.148  
0.64  
2.08  
0.025  
0.082  
0.025  
0.082  
0.64  
2.08  
0.025  
0.082  
0.38 0.51  
0.66 0.81  
0.18 0.33  
25.91 26.16  
11.05 11.30  
10.03 10.29  
9.40 BSC  
0.015 0.020  
0.026 0.032  
0.007 0.013  
1.020 1.030  
0.435 0.445  
0.395 0.405  
0.370 BSC  
0.015 0.020  
0.026 0.032  
0.007 0.013  
1.070 1.080  
0.435 0.445  
0.395 0.405  
0.370 BSC  
0.38 0.51  
0.66 0.81  
0.18 0.33  
28.45 28.70  
11.05 11.30  
10.03 10.29  
9.40 BSC  
0.015 0.020  
0.026 0.032  
0.007 0.013  
1.120 1.130  
0.435 0.445  
0.395 0.405  
0.370 BSC  
1.27 BSC  
0.050 BSC  
1.27 BSC  
0.050 BSC  
1.27 BSC  
0.050 BSC  
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
2
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774  
Rev. F  
10/29/03  
®
PACKAGINGINFORMATION  
ISSI  
Plastic TSOP  
Package Code: T (Type II)  
N
N/2+1  
Notes:  
1. Controlling dimension: millimeters, unless otherwise  
specified.  
2. BSC = Basic lead spacing between centers.  
3. Dimensions D1 and E do not include mold flash protru-  
sions and should be measured from the bottom of the  
E
E1  
package  
.
4. Formed leads shall be planar with respect to one another  
within 0.004 inches at the seating plane.  
1
N/2  
D
SEATING PLANE  
A
L
α
e
b
c
A1  
Plastic TSOP (T - Type II) (MS 25)  
Plastic TSOP (T - Type II) (MS 24)  
Millimeters Inches  
Min Max  
Plastic TSOP (T - Type II) (MS 24)  
Millimeters Inches  
Min Max  
Millimeters  
Inches  
Min Max  
Symbol Min  
Max  
Symbol Min  
Max  
Symbol Min  
Max  
Ref. Std.  
Ref. Std.  
Ref. Std.  
N
A
A1  
b
c
D
24/26  
N
A
A1  
b
c
D
40/44  
N
A
A1  
b
c
D
44/50  
1.20  
0.05 0.15  
0.30 0.51  
0.12 0.21  
0.0472  
1.20  
0.05 0.15  
0.30 0.45  
0.12 0.21  
0.0472  
1.20  
0.05 0.15  
0.30 0.45  
0.12 0.21  
0.0472  
0.002 0.0059  
0.012 0.0201  
0.005 0.0083  
0.670 0.6899  
0.295 0.3051  
0.050 BSC  
0.002 0.0059  
0.012 0.0157  
0.005 0.0083  
0.721 0.7287  
0.396 0.4040  
0.031 BSC  
0.002 0.0059  
0.012 0.0157  
0.005 0.0083  
0.821 0.8287  
0.396 0.4040  
0.031 BSC  
17.01 17.27  
7.49 7.75  
1.27 BSC  
18.31 18.51  
10.06 10.26  
0.80 BSC  
20.85 21.05  
10.06 10.26  
0.80 BSC  
E
E
E
1
e
1
1
e
e
E
L
α
9.02 9.42  
0.40 0.60  
0.462 0.4701  
0.016 0.0236  
E
L
α
11.56 11.96  
0.40 0.60  
0.455 0.4709  
0.016 0.0236  
E
L
α
11.56 11.96  
0.40 0.60  
0.455 0.4709  
0.016 0.0236  
0°  
5°  
0°  
5°  
0°  
8°  
0°  
8°  
0°  
8°  
0°  
8°  
Integrated Silicon Solution, Inc.  
PK13197T40 Rev. C 08/013/99  

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