LUYOS53133-L39-PF [LIGITEK]

SUPER BRIGHT ROUND TYPE LED LAMPS; SUPER BRIGHT ROUND型LED灯


型号：	LUYOS53133-L39-PF
厂家：	LIGITEK ELECTRONICS CO., LTD.
描述：	SUPER BRIGHT ROUND TYPE LED LAMPS SUPER BRIGHT ROUND型LED灯
文件：	总6页 (文件大小：113K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

SUPER BRIGHT ROUND TYPE LED LAMPS

Lead-Free Parts

LUYOS53133/L39-PF

DATA SHEET

DOC. NO : QW0905-LUYOS53133/L39-PF

REV.

DATE

: 03 - Apr. - 2007

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

Page

PART NO. LUYOS53133/L39-PF

1/5

Package Dimensions

5.0

5.8

7.65

8.65

1.5MAX

25.0MIN

□0.5

TYP

1.0MIN

2.54TYP

Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.

2.Specifications are subject to change without notice.

Directivity Radiation

0°

-30°

30°

-60°

60°

100% 75% 50% 25% 0 25% 50% 75%100%

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

PART NO. LUYOS53133/L39-PF

Page2/5

Absolute Maximum Ratings at Ta=25 ℃

Ratings

UYOS

Symbol

Parameter

UNIT

IFP

Forward Current

Peak Forward Current

Duty 1/10@10KHz

μA

Power Dissipation

Reverse Current @5V

Electrostatic Discharge( * )

Operating Temperature

Storage Temperature

ESD

Topr

Tstg

2000

-40 ~ +85

-40 ~ +100

℃

Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic

glove is recommended when handing these LED. All devices, equipment and machinery must be properly

grounded.

Typical Electrical & Optical Characteristics (Ta=25 ℃)

Forward

voltage

@20mA(V)

Viewing

angle

2θ 1/2

(deg)

Dominant

wave

length

Luminous

intensity

@20mA(mcd)

Spectral

halfwidth

△λnm

COLOR

MATERIAL

InGaAlP

PART NO

λDnm

Typ.

Max.

Min.

Emitted

Lens

Min.

1.7

Yellow Water Clear

592

2.6 6200 9500

LUYOS53133/L39-PF

Note : 1.The forward voltage data did not including ±0.1V testing tolerance.

2. The luminous intensity data did not including ±15% testing tolerance.

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

Page 3/5

PART NO. LUYOS53133/L39-PF

Typical Electro-Optical Characteristics Curve

UYOS CHIP

Fig.1 Forward current vs. Forward Voltage

Fig.2 Relative Intensity vs. Forward Current

3.0

2.5

2.0

1.5

1.0

60 70

1.8

2.0

2.2

2.4

2.6

Forward Current(mA)

Forward Voltage(V)

Fig.3 Forward Voltage vs. Temperature

Fig.4 Relative Intensity vs. Temperature

0.00

1.0

-0.01

-0.02

-0.03

-0.04

0.95

0.90

0.85

-0.05

-0.06

-0.07

-0.08

-0.09

Ambient Temperature(℃)

Fig.5 Relative Intensity vs. Wavelength

1.0

0.5

0.0

500

550

600

650

Wavelength (nm)

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

PART NO. LUYOS53133/L39-PF

Page 4/5

Soldering Condition(Pb-Free)

1.Iron:

Soldering Iron:30W Max

Temperature 350°C Max

Soldering Time:3 Seconds Max(One time only)

Distance:2mm Min(From solder joint to body)

2.Wave Soldering Profile

Dip Soldering

Preheat: 120°C Max

Preheat time: 60seconds Max

Ramp-up

2°C/sec(max)

Ramp-Down:-5°C/sec(max)

Solder Bath:260°C Max

Dipping Time:3 seconds Max

Distance:2mm Min(From solder joint to body)

Temp(°C)

260°C3sec Max

260°

5°/sec

max

120°

2°/sec

25°

0°

max

150

Time(sec)

100

Preheat

60 Seconds Max

Note: 1.Wave solder should not be made more than one time.

2.You can just only select one of the soldering conditions as above.

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

Page 5/5

PART NO. LUYOS53133/L39-PF

Reliability Test:

Reference

Standard

Description

Test Item

Test Condition

1.Under Room Temperature

2.If=20mA

3.t=1000 hrs (-24hrs, +72hrs)

This test is conducted for the purpose

of detemining the resistance of a part

in electrical and themal stressed.

MIL-STD-750: 1026

MIL-STD-883: 1005

JIS C 7021: B-1

Operating Life Test

The purpose of this is the resistance of

the device which is laid under condition

of high temperature for hours.

High Temperature

Storage Test

1.Ta=105 ℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

MIL-STD-883:1008

JIS C 7021: B-10

The purpose of this is the resistance

of the device which is laid under

condition of low temperature for hours.

Low Temperature

Storage Test

1.Ta=-40℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

JIS C 7021: B-12

1.Ta=65℃±5℃

2.RH=90%~95%

3.t=240hrs ±2hrs

High Temperature

High Humidity Test

The purpose of this test is the resistance

of the device under tropical for hours.

MIL-STD-202:103B

JIS C 7021: B-11

The purpose of this is the resistance of

the device to sudden extreme changes

in high and low temperature.

1.Ta=105 ℃±5℃&-40℃±5℃

(10min) (10min)

2.total 10 cycles

MIL-STD-202: 107D

MIL-STD-750: 1051

MIL-STD-883: 1011

Thermal Shock Test

This test intended to determine the

thermal characteristic resistance

of the device to sudden exposures

at extreme changes in temperature

when soldering the lead wire.

MIL-STD-202: 210A

MIL-STD-750: 2031

JIS C 7021: A-1

Solder Resistance

Test

1.T.Sol=260 ℃±5℃

2.Dwell time= 10 ±1sec.

MIL-STD-202: 208D

MIL-STD-750: 2026

MIL-STD-883: 2003

JIS C 7021: A-2

This test intended to see soldering well

performed or not.

1.T.Sol=230 ℃±5℃

2.Dwell time=5 ±1sec

Solderability Test

相关型号：