L29C520PC22 [LOGIC]

Pipeline Register ; 管线注册\n
L29C520PC22
型号: L29C520PC22
厂家: LOGIC DEVICES INCORPORATED    LOGIC DEVICES INCORPORATED
描述:

Pipeline Register
管线注册\n

文件: 总8页 (文件大小:190K)
中文:  中文翻译
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L29C520/521  
4 x 8-bit Multilevel Pipeline Register  
DEVICES INCORPORATED  
FEATURES  
DESCRIPTION  
The L29C520 and L29C521 are pin-  
for-pin compatible with the  
IDT29FCT520/IDT29FCT521 and  
AMD Am29520/Am29521, imple-  
mented in low power CMOS.  
The S1-0 select lines control a 4-to-1  
multiplexer which routes the contents  
of any of the registers to the Y output  
pins. The independence of the I and S  
controls allows simultaneous write  
and read operations on different  
registers.  
Four 8-bit Registers  
ImplementsDouble2-StagePipeline  
or Single 4-Stage Pipeline Register  
Hold, Shift, and Load Instructions  
Separate Data In and Data Out Pins  
The L29C520 and L29C521 contain  
four registers which can be configured  
as two independent, 2-level pipelines  
or as one 4-level pipeline.  
High-Speed,LowPowerCMOS  
Technology  
Three-State Outputs  
TABLE 1.  
L29C520 INSTRUCTION TABLE  
Replaces IDT29FCT520/IDT29FCT521  
and AMD Am29520/Am29521  
The Instruction pins, I1-0, control the  
loading of the registers. For either  
device, the registers may be config-  
ured as a four-stage delay line, with  
data loaded into R1 and shifted  
sequentially through R2, R3, and R4.  
Also, for the L29C520, data may be  
loaded from the inputs into either R1  
or R3 with only R2 or R4 shifting. The  
L29C521 differs from the L29C520 in  
that R2 and R4 remain unchanged  
during this type of data load, as  
shown in Tables 1 and 2. Finally, I1-0  
may be set to prevent any register  
from changing.  
Package Styles Available:  
I1 I0 Description  
• 24-pin PDIP  
L
L
L
H
L
DR1 R1R2 R2R3 R3R4  
• 28-pinPLCC, J-Lead  
HOLD HOLD  
DR3  
R3R4  
H
H
DR1 R1R2 HOLD  
HOLD  
H
ALL REGISTERS ON HOLD  
TABLE 2.  
L29C521 INSTRUCTION TABLE  
I1 I0 Description  
L
L
L
H
L
DR1 R1R2 R2R3 R3R4  
HOLD HOLD  
DR3  
HOLD  
HOLD  
H
H
DR1 HOLD  
HOLD  
L29C520/521 BLOCK DIAGRAM  
H
ALL REGISTERS ON HOLD  
TABLE 3. OUTPUT SELECT  
S1 S0 Register Selected  
8
L
L
L
H
L
Register 4  
Register 3  
Register 2  
Register 1  
D8-0  
REG 1  
H
H
8
REG 2  
Y
7-0  
H
REG 3  
REG 4  
OE  
2
S
1-0  
2
I
1-0  
CLK  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
1
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
MAXIMUM RATINGS Above which useful life may be impaired (Notes 1, 2, 3, 8)  
Storage temperature ........................................................................................................... –65°C to +150°C  
Operating ambient temperature........................................................................................... –55°C to +125°C  
VCC supply voltage with respect to ground ............................................................................ –0.5 V to +7.0 V  
Input signal with respect to ground ........................................................................................ –3.0 V to +7.0 V  
Signal applied to high impedance output ............................................................................... –3.0 V to +7.0 V  
Output current into low outputs............................................................................................................. 25 mA  
Latchup current ............................................................................................................................... > 400 mA  
OPERATING CONDITIONS To meet specified electrical and switching characteristics  
Mode  
Temperature Range (Ambient)  
0°C to +70°C  
Supply Voltage  
4.75 V VCC 5.25 V  
4.50 V VCC 5.50 V  
Active Operation, Commercial  
Active Operation, Military  
–55°C to +125°C  
ELECTRICAL CHARACTERISTICS Over Operating Conditions (Note 4)  
Symbol Parameter  
Test Condition  
Min  
Typ  
Max Unit  
VOH  
VOL  
VIH  
Output High Voltage  
VCC = Min., IOH = –15.0 mA  
VCC = Min., IOL = 24.0 mA  
2.4  
V
Output Low Voltage  
Input High Voltage  
Input Low Voltage  
0.5  
VCC  
0.8  
V
V
2.0  
0.0  
VIL  
(Note 3)  
V
IIX  
Input Current  
Ground VIN VCC (Note 12)  
Ground VOUT VCC (Note 12)  
(Notes 5, 6)  
±20  
±20  
µA  
µA  
IOZ  
ICC1  
ICC2  
Output Leakage Current  
VCC Current, Dynamic  
VCC Current, Quiescent  
30 mA  
1.5 mA  
(Note 7)  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
2
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
SWITCHING CHARACTERISTICS  
COMMERCIAL OPERATING RANGE (0°C to +70°C) Notes 9, 10 (ns)  
L29C520/521–  
22  
14*  
Symbol Parameter  
Min  
Max  
Min  
Max  
tPD  
tSEL  
tPW  
tSI  
Clock to Output Delay  
22  
14  
Select to Output Delay  
20  
13  
Clock Pulse Width  
10  
10  
3
7
5
1
5
1
Instruction Setup Time  
tHI  
Instruction Hold Time  
tSD  
tHD  
tENA  
tDIS  
Data Setup Time  
10  
3
Data Hold Time  
Three-State Output Enable Delay (Note 11)  
Three-State Output Disable Delay (Note 11)  
21  
15  
15  
12  
MILITARY OPERATING RANGE (–55°C to +125°C) Notes 9, 10 (ns)  
L29C520/521–  
*
30  
*
24  
*
16  
Symbol Parameter  
Min  
Max  
Min  
Max  
Min  
Max  
tPD  
tSEL  
tPW  
tSI  
Clock to Output Delay  
30  
24  
16  
Select to Output Delay  
30  
22  
15  
Clock Pulse Width  
15  
15  
5
10  
10  
3
8
6
2
6
2
Instruction Setup Time  
tHI  
Instruction Hold Time  
tSD  
tHD  
tENA  
tDIS  
Data Setup Time  
15  
5
10  
3
Data Hold Time  
Three-State Output Enable Delay (Note 11)  
Three-State Output Disable Delay (Note 11)  
25  
20  
22  
16  
16  
13  
*DISCONTINUED SPEED GRADE  
SWITCHING WAVEFORMS  
I
1-0  
t
SI  
tHI  
D7-0  
t
SD  
tHD  
t
PW  
CLK  
tPW  
S1-0  
t
PD  
t
SEL  
OE  
tDIS  
tENA  
HIGH IMPEDANCE  
Y7-0  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
3
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
NOTES  
1. Maximum Ratings indicate stress 9. AC specifications are tested with  
specifications only. Functional oper- input transition times less than 3 ns, measured to the 1.5 V crossing point  
11. For the tENA test, the transition is  
ationoftheseproductsatvaluesbeyond output reference levels of 1.5 V (except  
those indicated in the Operating Condi-  
with datasheet loads. For the tDIS test,  
the transition is measured to the  
tDIS test), and input levels of nominally  
tions table is not implied. Exposure to 0 to 3.0 V. Output loading may be a ±200mV level from the measured  
maximum rating conditions for ex- resistive divider which provides for steady-state output voltage with  
tended periods may affect reliability.  
±10mA loads. The balancing volt-  
age, VTH, is set at 3.5 V for Z-to-0  
specified IOH and IOL at an output  
voltage of VOH min and VOL max  
2. The products described by this spec-  
ification include internal circuitry de-  
signedto protect the chipfrom damag-  
ing substrate injection currents and ac-  
cumulationsofstaticcharge. Neverthe-  
less, conventional precautions should  
be observed during storage, handling,  
and use of these circuits in order to This device has high-speed outputs ca-  
avoid exposure to excessive electrical pable of large instantaneous current  
respectively. Alternatively, a diode and 0-to-Z tests, and set at 0 V for Z-  
bridge with upper and lower current to-1 and 1-to-Z tests.  
sources of IOH and IOL respectively,  
12. These parameters are only tested at  
and a balancing voltage of 1.5 V may be  
the high temperature extreme, which is  
used. Parasitic capacitance is 30 pF  
the worst case for leakage current.  
minimum, and may be distributed.  
FIGURE A. OUTPUT LOADING CIRCUIT  
stress values.  
pulses and fast turn-on/turn-off times.  
Asaresult, caremustbeexercisedinthe  
testing of this device. The following  
measures are recommended:  
S1  
DUT  
3. Thisdeviceprovideshardclampingof  
transient undershoot and overshoot. In-  
put levels below ground or above VCC  
I
OL  
V
TH  
CL  
I
OH  
will be clamped beginning at –0.6 V and a. A 0.1 µF ceramic capacitor should be  
VCC + 0.6 V. The device can withstand installed between VCC and Ground  
indefinite operation with inputs in the leads as close to the Device Under Test  
range of –0.5 V to +7.0 V. Device opera- (DUT) as possible. Similar capacitors  
FIGURE B. THRESHOLD LEVELS  
t
ENA  
tDIS  
tion will not be adversely affected, how-  
ever, input current levels will be well in and the tester common, and device  
should be installed between device VCC  
OE  
0
1.5 V  
1.5 V  
excess of 100 mA.  
ground and tester common.  
Z
Z
3.5V Vth  
1.5 V  
1.5 V  
V
OL*  
0.2 V  
0.2 V  
0
1
Z
Z
4. Actualtestconditionsmayvaryfrom  
b. Ground and VCC supply planes  
those designated but operation is guar- must be brought directly to the DUT  
anteed as specified. socket or contactor fingers.  
V
OH*  
1
0V Vth  
VOL*  
Measured VOL with IOH = –10mA and IOL = 10mA  
V
OH*  
Measured VOH with IOH = –10mA and IOL = 10mA  
5. Supply current for a given applica- c. Input voltages should be adjusted to  
tioncanbeaccuratelyapproximatedby:  
compensateforinductivegroundand VCC  
noise to maintain required DUT input  
levels relative to the DUT ground pin.  
2
NCV F  
4
where  
10. Each parameter is shown as a min-  
imum or maximum value. Input re-  
quirements are specified from the point  
of view of the external system driving  
the chip. Setup time, for example, is  
specified as a minimum since the exter-  
nal system must supply at least that  
much time to meet the worst-case re-  
quirementsofallparts. Responsesfrom  
the internal circuitry are specified from  
the point of view of the device. Output  
delay, for example, is specified as a  
maximumsinceworst-caseoperationof  
anydevicealwaysprovidesdatawithin  
that time.  
N = total number of device outputs  
C = capacitive load per output  
V = supply voltage  
F = clock frequency  
6. Tested with all outputs changing ev-  
ery cycle and no load, at a 5 MHz clock  
rate.  
7. Tested with all inputs within 0.1 V of  
VCC or Ground, no load.  
8. These parameters are guaranteed  
but not 100% tested.  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
4
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
L29C520 — ORDERING INFORMATION  
24-pin — 0.3" wide  
28-pin  
1
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
V
S
S
Y
Y
Y
Y
Y
Y
Y
Y
CC  
I
I
0
1
0
1
2
3
4
5
6
7
2
0
4
3
2
1
28 27 26  
25  
3
1
D
D
D
D
D
D
D
D
5
D
D
D
D
D
D
1
2
3
4
5
6
NC  
4
0
6
24  
23  
22  
21  
20  
19  
Y0  
Y1  
Y2  
Y3  
Y4  
Y5  
5
1
7
6
2
Top  
View  
8
7
3
9
8
4
10  
11  
9
5
NC  
10  
11  
12  
6
12 13 14 15 16 17 18  
7
CLK  
OE  
GND  
Plastic DIP  
(P2)  
Plastic J-Lead Chip Carrier  
(J4)  
Speed  
0°C to +70°C — COMMERCIAL SCREENING  
22 ns  
L29C520PC22  
L29C520JC22  
–55°C to +125°C — COMMERCIAL SCREENING  
–55°C to +125°C — MIL-STD-883 COMPLIANT  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
5
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
L29C520 — ORDERING INFORMATION  
24-pin  
24-pin — 0.209" wide  
1
2
3
4
5
6
7
8
9
24  
23  
22  
21  
20  
19  
18  
17  
16  
I
I
0
1
0
1
2
3
4
5
6
7
V
S
S
Y
Y
Y
Y
Y
Y
Y
Y
CC  
0
I
0
1
0
1
2
3
4
5
6
7
1
2
3
4
5
6
7
8
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
V
S
S
Y
Y
Y
Y
Y
Y
Y
Y
CC  
0
I
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
1
1
0
0
1
1
2
2
3
3
4
4
9
5
5
10  
11  
12  
6
10 15  
11 14  
12 13  
6
CLK  
GND  
7
CLK  
7
OE  
GND  
OE  
Discontinued Package  
Discontinued Package  
Ceramic Flatpack  
(M1)  
Plastic SSOP  
(S1)  
Speed  
0°C to +70°C — COMMERCIAL SCREENING  
–55°C to +125°C — COMMERCIAL SCREENING  
–55°C to +125°C — MIL-STD-883 COMPLIANT  
22 ns  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
6
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
L29C521 — ORDERING INFORMATION  
24-pin — 0.3" wide  
28-pin  
1
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
V
S
S
Y
Y
Y
Y
Y
Y
Y
Y
CC  
I
0
1
0
1
2
3
4
5
6
7
2
0
I
4
3
2
1
28 27 26  
25  
3
1
D
D
D
D
D
D
D
D
5
D
D
D
D
D
D
1
2
3
4
5
6
NC  
4
0
6
24  
23  
22  
21  
20  
19  
Y0  
Y1  
Y2  
Y3  
Y4  
Y5  
5
1
7
6
2
Top  
View  
8
7
3
9
8
4
10  
11  
9
5
NC  
10  
11  
12  
6
12 13 14 15 16 17 18  
7
CLK  
OE  
GND  
Discontinued Package  
Plastic DIP  
(P2)  
Plastic J-Lead Chip Carrier  
(J4)  
Speed  
0°C to +70°C — COMMERCIAL SCREENING  
22 ns  
L29C521PC22  
–55°C to +125°C — COMMERCIAL SCREENING  
–55°C to +125°C — MIL-STD-883 COMPLIANT  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
7
L29C520/521  
DEVICES INCORPORATED  
4 x 8-bit Multilevel Pipeline Register  
L29C521 — ORDERING INFORMATION  
24-pin  
I
0
1
0
1
2
3
4
5
6
7
1
2
3
4
5
6
7
8
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
V
S
S
Y
Y
Y
Y
Y
Y
Y
Y
CC  
0
I
D
D
D
D
D
D
D
D
1
0
1
2
3
4
9
5
10  
11  
12  
6
CLK  
GND  
7
OE  
Discontinued Package  
Ceramic Flatpack  
(M1)  
Speed  
0°C to +70°C — COMMERCIAL SCREENING  
–55°C to +125°C — COMMERCIAL SCREENING  
–55°C to +125°C — MIL-STD-883 COMPLIANT  
Pipeline Registers  
08/02/2000–LDS.520/1-P  
8

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