LMU18JC35 [LOGIC]

16 x 16-bit Parallel Multiplier; 16× 16位并行乘法器
LMU18JC35
型号: LMU18JC35
厂家: LOGIC DEVICES INCORPORATED    LOGIC DEVICES INCORPORATED
描述:

16 x 16-bit Parallel Multiplier
16× 16位并行乘法器

文件: 总7页 (文件大小:187K)
中文:  中文翻译
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LMU18  
16 x 16-bit Parallel Multiplier  
DEVICES INCORPORATED  
FEATURES  
DESCRIPTION  
The LMU18 is a high-speed, low by the ENA and ENB controls. When  
power 16-bit parallel multiplier. HIGH, these controls prevent appli-  
The LMU18 is an 84-pin device cation of the clock to the respective  
which provides simultaneous access register. The TCA and TCB controls  
35 ns Worst-Case Multiply Time  
Low Power CMOS Technology  
Full 32-bit Output Port —  
No Multiplexing Required  
to all outputs.  
specify the operands as two’s com-  
plement when HIGH, or unsigned  
magnitude when LOW.  
Two’s Complement, Unsigned, or  
Mixed Operands  
The LMU18 produces the 32-bit  
product of two 16-bit numbers.  
Three-State Outputs  
84-pin PLCC, J-Lead  
Data present at the A inputs, along RNDisloadedontherisingedgeofCLK,  
with the TCA control bit, is loaded providing either ENA or ENB are LOW.  
into the A register on the rising edge RND, when HIGH, adds ‘1’ to the  
of CLK. B data and the TCB control most significant bit position of the  
bit are similarly loaded. Loading of least significant half of the product.  
the A and B registers is controlled Subsequent truncation of the 16 least  
significant bits produces a result  
correctly rounded to 16-bit precision.  
LMU18 BLOCK DIAGRAM  
Attheoutput, theRightShiftcontrol(RS)  
selects either of two output formats. RS  
TCA  
A
15-0  
TCB  
B15-0  
LOW produces a 31-bit product with a  
copy of the sign bit inserted in the MSB  
postion of the least significant half. RS  
HIGH gives a full 32-bit product. Two  
16-bit output registers are provided to  
hold the most and least significant  
halves of the result (MSP and LSP) as  
definedbyRS. Theseregistersareloaded  
on the rising edge of CLK, subject to the  
ENRcontrol. WhenENRisHIGH, clock-  
ing of the result registers is prevented.  
16  
A REGISTER  
16  
B REGISTER  
CLK  
ENA  
ENB  
RND  
RS  
For asynchronous output these registers  
may be made transparent by setting the  
feed through control (FT) HIGH and  
ENR LOW.  
32  
FORMAT ADJUST  
The two halves of the product may be  
routed to a single 16-bit three-state  
output port (MSP) via a multiplexer.  
MSPSEL LOW causes the MSP outputs to  
be driven by the most significant half of  
the result. MSPSEL HIGH routes the  
least significant half of the result to the  
MSP pins. The MSB of the result is avail-  
able in both true and complemented  
form to aid implementation of higher  
precision multipliers.  
16  
16  
FT  
ENR  
RESULT  
REGISTER  
MSPSEL  
OEM  
OEL  
16  
16  
R
31  
R
31-16  
R15-0  
Multipliers  
08/16/2000–LDS.18-O  
1
LMU18  
DEVICES INCORPORATED  
16 x 16-bit Parallel Multiplier  
FIGURE 1A. INPUT FORMATS  
AIN  
BIN  
Fractional Two’s Complement (TCA, TCB = 1)  
15 14 13  
2
1
0
15 14 13  
2
1
0
–20 2–1 2–2  
2–13 2–14 2–15  
–20 2–1 2–2  
2–13 2–14 2–15  
(Sign)  
(Sign)  
Integer Two’s Complement (TCA, TCB = 1)  
15 14 13  
2
1
0
15 14 13  
2
1
0
–215 214 213  
22 21 20  
–215 214 213  
22 21 20  
(Sign)  
(Sign)  
Unsigned Fractional (TCA, TCB = 0)  
15 14 13  
2–1 2–2 2–3  
2
1
0
15 14 13  
2–1 2–2 2–3  
2
1
0
2–14 2–15 2–16  
2–14 2–15 2–16  
Unsigned Integer (TCA, TCB = 0)  
15 14 13  
215 214 213  
2
1
0
15 14 13  
215 214 213  
2
1
0
22 21 20  
22 21 20  
FIGURE 1B. OUTPUT FORMATS  
MSP  
LSP  
Fractional Two’s Complement (RS = 0)  
31 30 29  
18 17 16  
2–13 2–14 2–15  
15 14 13  
2
1
0
–20 2–1 2–2  
–20 2–16 2–17  
2–28 2–29 2–30  
(Sign)  
(Sign)  
Fractional Two’s Complement (RS = 1)  
31 30 29  
18 17 16  
2–12 2–13 2–14  
15 14 13  
2–15 2–16 2–17  
2
1
0
–21 20 2–1  
2–28 2–29 2–30  
(Sign)  
Integer Two’s Complement (RS = 1)  
31 30 29  
18 17 16  
218 217 216  
15 14 13  
215 214 213  
2
1
0
–231 230 229  
22 21 20  
(Sign)  
Unsigned Fractional (RS = 1)  
31 30 29  
2–1 2–2 2–3  
18 17 16  
2–14 2–15 2–16  
15 14 13  
2–17 2–18 2–19  
2
1
0
2–30 2–31 2–32  
Unsigned Integer (RS = 1)  
31 30 29  
231 230 229  
18 17 16  
218 217 216  
15 14 13  
215 214 213  
2
1
0
22 21 20  
Multipliers  
08/16/2000–LDS.18-O  
2
LMU18  
DEVICES INCORPORATED  
16 x 16-bit Parallel Multiplier  
MAXIMUM RATINGS Above which useful life may be impaired (Notes 1, 2, 3, 8)  
Storage temperature ........................................................................................................... –65°C to +150°C  
Operating ambient temperature........................................................................................... –55°C to +125°C  
VCC supply voltage with respect to ground ............................................................................ –0.5 V to +7.0 V  
Input signal with respect to ground ........................................................................................ –3.0 V to +7.0 V  
Signal applied to high impedance output ............................................................................... –3.0 V to +7.0 V  
Output current into low outputs............................................................................................................. 25 mA  
Latchup current ............................................................................................................................... > 400 mA  
OPERATING CONDITIONS To meet specified electrical and switching characteristics  
Mode  
Temperature Range (Ambient)  
0°C to +70°C  
Supply Voltage  
4.75 V VCC 5.25 V  
4.50 V VCC 5.50 V  
Active Operation, Commercial  
Active Operation, Military  
–55°C to +125°C  
ELECTRICAL CHARACTERISTICS Over Operating Conditions (Note 4)  
Symbol Parameter  
Test Condition  
Min  
Typ  
Max Unit  
VOH  
VOL  
VIH  
Output High Voltage  
VCC = Min., IOH = –2.0 mA  
VCC = Min., IOL = 8.0 mA  
2.4  
V
Output Low Voltage  
Input High Voltage  
Input Low Voltage  
0.5  
VCC  
0.8  
V
V
2.0  
0.0  
VIL  
(Note 3)  
V
IIX  
Input Current  
Ground VIN VCC (Note 12)  
Ground VOUT VCC (Note 12)  
(Notes 5, 6)  
±20  
±20  
µA  
µA  
IOZ  
ICC1  
ICC2  
Output Leakage Current  
VCC Current, Dynamic  
VCC Current, Quiescent  
25  
45 mA  
1.5 mA  
(Note 7)  
Multipliers  
08/16/2000–LDS.18-O  
3
LMU18  
DEVICES INCORPORATED  
16 x 16-bit Parallel Multiplier  
SWITCHING CHARACTERISTICS  
COMMERCIAL OPERATING RANGE (0°C to +70°C) Notes 9, 10 (ns)  
LMU18–  
*
65  
*
20  
45  
35  
Symbol Parameter  
Min Max Min Max Min Max Min Max  
tMC  
tMUC  
tPW  
tS  
Clocked Multiply Time  
Unclocked Multiply Time  
Clock Pulse Width  
65  
85  
45  
65  
35  
55  
20  
30  
15  
15  
5
15  
15  
5
15  
12  
5
9
11  
1
Input Setup Time  
tH  
Input Hold Time  
tD  
Output Delay  
30  
25  
25  
24  
30  
25  
20  
20  
28  
25  
20  
20  
18  
18  
18  
18  
tSEL  
tENA  
tDIS  
Output Select Delay  
Three-State Output Enable Delay (Note 11)  
Three-State Output Disable Delay (Note 11)  
MILITARY OPERATING RANGE (–55°C to +125°C) Notes 9, 10 (ns)  
LMU18–  
*
75  
*
55  
*
45  
*
25  
Symbol Parameter  
Min Max Min Max Min Max  
tMC  
tMUC  
tPW  
tS  
Clocked Multiply Time  
75  
95  
55  
85  
45  
65  
25  
38  
Unclocked Multiply Time  
Clock Pulse Width  
20  
15  
5
15  
15  
5
15  
12  
5
10  
12  
2
Input Setup Time  
tH  
Input Hold Time  
tD  
Output Delay  
35  
30  
25  
24  
35  
30  
20  
20  
33  
30  
20  
20  
20  
20  
20  
20  
tSEL  
tENA  
tDIS  
Output Select Delay  
Three-State Output Enable Delay (Note 11)  
Three-State Output Disable Delay (Note 11)  
SWITCHING WAVEFORMS  
t
S
tH  
INPUT  
ENA, ENB  
ENR  
tS  
tH  
tPW  
tPW  
tPW  
CLOCK  
t
D
tMC  
t
MUC  
MSPSEL  
t
SEL  
OEM  
OEL  
t
DIS  
tENA  
HIGH IMPEDANCE  
R
31-0  
*DISCONTINUED SPEED GRADE  
Multipliers  
08/16/2000–LDS.18-O  
4
LMU18  
DEVICES INCORPORATED  
16 x 16-bit Parallel Multiplier  
NOTES  
1. Maximum Ratings indicate stress 9. AC specifications are tested with  
11. For the tENA test, the transition is  
specifications only. Functional oper- input transition times less than 3 ns, measured to the 1.5 V crossing point  
ationoftheseproductsatvaluesbeyond output reference levels of 1.5 V (except  
those indicated in the Operating Condi-  
with datasheet loads. For the tDIS test,  
the transition is measured to the  
tDIS test), and input levels of nominally  
tions table is not implied. Exposure to 0 to 3.0 V. Output loading may be a ±200mV level from the measured  
maximum rating conditions for ex- resistive divider which provides for steady-state output voltage with  
tended periods may affect reliability.  
±10mA loads. The balancing volt-  
age, VTH, is set at 3.5 V for Z-to-0  
specified IOH and IOL at an output  
voltage of VOH min and VOL max  
2. The products described by this spec-  
ification include internal circuitry de-  
signedto protect the chipfrom damag-  
ing substrate injection currents and ac-  
cumulationsofstaticcharge. Neverthe-  
less, conventional precautions should  
be observed during storage, handling,  
and use of these circuits in order to This device has high-speed outputs ca-  
avoid exposure to excessive electrical pable of large instantaneous current  
respectively. Alternatively, a diode and 0-to-Z tests, and set at 0 V for Z-  
bridge with upper and lower current to-1 and 1-to-Z tests.  
sources of IOH and IOL respectively,  
12. These parameters are only tested at  
and a balancing voltage of 1.5 V may be  
the high temperature extreme, which is  
used. Parasitic capacitance is 30 pF  
the worst case for leakage current.  
minimum, and may be distributed.  
FIGURE A. OUTPUT LOADING CIRCUIT  
stress values.  
pulses and fast turn-on/turn-off times.  
Asaresult, caremustbeexercisedinthe  
testing of this device. The following  
measures are recommended:  
S1  
DUT  
3. Thisdeviceprovideshardclampingof  
transient undershoot and overshoot. In-  
put levels below ground or above VCC  
I
OL  
V
TH  
CL  
I
OH  
will be clamped beginning at –0.6 V and a. A 0.1 µF ceramic capacitor should be  
VCC + 0.6 V. The device can withstand installed between VCC and Ground  
indefinite operation with inputs in the leads as close to the Device Under Test  
range of –0.5 V to +7.0 V. Device opera- (DUT) as possible. Similar capacitors  
FIGURE B. THRESHOLD LEVELS  
t
ENA  
tDIS  
tion will not be adversely affected, how-  
ever, input current levels will be well in and the tester common, and device  
should be installed between device VCC  
OE  
0
1.5 V  
1.5 V  
excess of 100 mA.  
ground and tester common.  
Z
Z
3.5V Vth  
1.5 V  
1.5 V  
V
OL*  
0.2 V  
0.2 V  
0
1
Z
Z
4. Actualtestconditionsmayvaryfrom  
b. Ground and VCC supply planes  
those designated but operation is guar- must be brought directly to the DUT  
anteed as specified. socket or contactor fingers.  
V
OH*  
1
0V Vth  
VOL*  
Measured VOL with IOH = –10mA and IOL = 10mA  
V
OH* Measured VOH with IOH = –10mA and IOL = 10mA  
5. Supply current for a given applica- c. Input voltages should be adjusted to  
tioncanbeaccuratelyapproximatedby:  
compensateforinductivegroundand VCC  
noise to maintain required DUT input  
levels relative to the DUT ground pin.  
2
NCV F  
4
where  
10. Each parameter is shown as a min-  
imum or maximum value. Input re-  
quirements are specified from the point  
of view of the external system driving  
the chip. Setup time, for example, is  
specified as a minimum since the exter-  
nal system must supply at least that  
much time to meet the worst-case re-  
quirementsofallparts. Responsesfrom  
the internal circuitry are specified from  
the point of view of the device. Output  
delay, for example, is specified as a  
maximumsinceworst-caseoperationof  
anydevicealwaysprovidesdatawithin  
that time.  
N = total number of device outputs  
C = capacitive load per output  
V = supply voltage  
F = clock frequency  
6. Tested with all outputs changing ev-  
ery cycle and no load, at a 5 MHz clock  
rate.  
7. Tested with all inputs within 0.1 V of  
VCC or Ground, no load.  
8. These parameters are guaranteed  
but not 100% tested.  
Multipliers  
08/16/2000–LDS.18-O  
5
LMU18  
DEVICES INCORPORATED  
16 x 16-bit Parallel Multiplier  
ORDERING INFORMATION  
84-pin  
11 10  
12  
9 8 7 6 5 4 3 2 1 84 83 82 81 80 79 78 77 76 75  
B
B
B
B
B
B
10  
11  
12  
13  
14  
15  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
A
A
A
A
A
11  
12  
13  
14  
15  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
ENA  
RND  
TCA  
TCB  
ENB  
CLK  
OEL  
GND  
VCC  
Top  
View  
VCC  
GND  
GND  
MSPSEL  
FT  
R
0
1
2
3
4
5
6
7
8
9
R
R
R
R
R
R
R
R
R
RS  
OEM  
ENR  
R
R
R
R
31  
31  
30  
29  
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53  
Plastic J-Lead Chip Carrier  
(J3)  
Speed  
0°C to +70°C — COMMERCIAL SCREENING  
45 ns  
35 ns  
LMU18JC45  
LMU18JC35  
Multipliers  
08/16/2000–LDS.18-O  
6
LMU18  
DEVICES INCORPORATED  
16 x 16-bit Parallel Multiplier  
ORDERING INFORMATION  
84-pin  
1
2
3
4
5
6
7
8
9
10  
11  
A
B
C
D
E
F
G
H
J
B
9
B
7
B
6
8
B
4
B
1
2
0
B
3
1
0
A
2
3
4
A
5
6
A
7
9
A
8
A
11  
13  
14  
B
B
B
12  
13  
15  
B
B
B
10  
11  
14  
B
B5  
B
B
A
A
A
A
A
A
A
A
A
10  
12  
A
A
15 ENA  
Top View  
Through Package  
(i.e., Component Side Pinout)  
OEL CLK GND  
V
CC TCA TCB  
R
R
R
R
R
R
0
1
4
6
7
9
ENB  
VCC  
GND GND RND  
R
R
R
2
5
8
R
3
RS  
FT MSPSEL  
ENR OEM  
R17  
R18  
R22  
R21  
R20  
R
R
R
30  
29  
26  
R
R
R
31  
31  
28  
K
L
R
R
10  
12  
R
R
11  
13  
R
R
14 GND  
V
CC  
R
R
24  
23  
R
27  
25  
15  
R
16  
R19  
R
Discontinued Package  
Ceramic Pin Grid Array  
(G3)  
Speed  
0°C to +70°C — COMMERCIAL SCREENING  
–55°C to +125°C — COMMERCIAL SCREENING  
–55°C to +125°C — MIL-STD-883 COMPLIANT  
Multipliers  
08/16/2000–LDS.18-O  
7

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