AT28HC256-12UM/883 [MICROCHIP]

IC EEPROM 256KBIT 120NS 28CPGA;
AT28HC256-12UM/883
型号: AT28HC256-12UM/883
厂家: MICROCHIP    MICROCHIP
描述:

IC EEPROM 256KBIT 120NS 28CPGA

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器 ATM 异步传输模式 内存集成电路
文件: 总24页 (文件大小:467K)
中文:  中文翻译
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Features  
Fast Read Access Time – 70 ns  
Automatic Page Write Operation  
– Internal Address and Data Latches for 64 Bytes  
– Internal Control Timer  
Fast Write Cycle Times  
– Page Write Cycle Time: 3 ms or 10 ms Maximum  
– 1 to 64-byte Page Write Operation  
Low Power Dissipation  
256K (32K x 8)  
High-speed  
Parallel  
– 80 mA Active Current  
– 3 mA Standby Current  
Hardware and Software Data Protection  
DATA Polling for End of Write Detection  
High Reliability CMOS Technology  
– Endurance: 104 or 105 Cycles  
– Data Retention: 10 Years  
EEPROM  
Single 5V 10% Supply  
CMOS and TTL Compatible Inputs and Outputs  
JEDEC Approved Byte-wide Pinout  
Full Military and Industrial Temperature Ranges  
Green (Pb/Halide-free) Packaging Option  
AT28HC256  
1. Description  
The AT28HC256 is a high-performance electrically erasable and programmable read-  
only memory. Its 256K of memory is organized as 32,768 words by 8 bits. Manufac-  
tured with Atmel’s advanced nonvolatile CMOS technology, the AT28HC256 offers  
access times to 70 ns with power dissipation of just 440 mW. When the AT28HC256  
is deselected, the standby current is less than 5 mA.  
The AT28HC256 is accessed like a Static RAM for the read or write cycle without the  
need for external components. The device contains a 64-byte page register to allow  
writing of up to 64 bytes simultaneously. During a write cycle, the address and 1 to 64  
bytes of data are internally latched, freeing the addresses and data bus for other oper-  
ations. Following the initiation of a write cycle, the device will automatically write the  
latched data using an internal control timer. The end of a write cycle can be detected  
by DATA Polling of I/O7. Once the end of a write cycle has been detected a new  
access for a read or write can begin.  
Atmel’s 28HC256 has additional features to ensure high quality and manufacturability.  
The device utilizes internal error correction for extended endurance and improved  
data retention characteristics. An optional software data protection mechanism is  
available to guard against inadvertent writes. The device also includes an extra  
64 bytes of EEPROM for device identification or tracking.  
0007N–PEEPR–9/09  
2. Pin Configurations  
Pin Name  
A0 - A14  
CE  
Function  
Addresses  
Chip Enable  
Output Enable  
Write Enable  
Data Inputs/Outputs  
No Connect  
OE  
WE  
I/O0 - I/O7  
NC  
DC  
Don’t Connect  
2.3  
32-pad LCC, 32-lead PLCC Top View  
2.1  
28-lead TSOP Top View  
OE  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
A10  
CE  
A11  
A9  
2
A6  
A5  
A4  
A3  
A2  
5
6
7
8
9
29 A8  
28 A9  
27 A11  
26 NC  
25 OE  
24 A10  
23 CE  
22 I/O7  
21 I/O6  
3
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
GND  
I/O2  
I/O1  
I/O0  
A0  
A8  
4
A13  
WE  
VCC  
A14  
A12  
A7  
5
6
7
A1 10  
A0 11  
8
9
NC 12  
I/O0 13  
10  
11  
12  
13  
14  
A6  
A5  
A4  
A1  
A3  
A2  
Note:  
PLCC package pins 1 and 17 are Don’t Connect.  
2.4  
28-lead Cerdip/Flatpack/SOIC –  
Top View  
2.2  
28-lead PGA Top View  
A14  
A12  
A7  
1
2
3
4
5
6
7
8
9
28 VCC  
27 WE  
26 A13  
25 A8  
A6  
A5  
24 A9  
A4  
23 A11  
22 OE  
21 A10  
20 CE  
19 I/O7  
18 I/O6  
17 I/O5  
16 I/O4  
15 I/O3  
A3  
A2  
A1  
A0 10  
I/O0 11  
I/O1 12  
I/O2 13  
GND 14  
2
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
3. Block Diagram  
4. Device Operation  
4.1  
Read  
The AT28HC256 is accessed like a Static RAM. When CE and OE are low and WE is high, the  
data stored at the memory location determined by the address pins is asserted on the outputs.  
The outputs are put in the high impedance state when either CE or OE is high. This dual-line  
control gives designers flexibility in preventing bus contention in their system.  
4.2  
Byte Write  
A low pulse on the WE or CE input with CE or WE low (respectively) and OE high initiates a  
write cycle. The address is latched on the falling edge of CE or WE, whichever occurs last.  
The data is latched by the first rising edge of CE or WE. Once a byte write has been started it  
will automatically time itself to completion. Once a programming operation has been initiated  
and for the duration of tWC, a read operation will effectively be a polling operation.  
4.3  
Page Write  
The page write operation of the AT28HC256 allows 1 to 64 bytes of data to be written into the  
device during a single internal programming period. A page write operation is initiated in the  
same manner as a byte write; the first byte written can then be followed by 1 to 63 additional  
bytes. Each successive byte must be written within 150 µs (tBLC) of the previous byte. If the  
tBLC limit is exceeded the AT28C256 will cease accepting data and commence the internal  
programming operation. All bytes during a page write operation must reside on the same page  
as defined by the state of the A6 - A14 inputs. That is, for each WE high to low transition dur-  
ing the page write operation, A6 - A14 must be the same.  
The A0 to A5 inputs are used to specify which bytes within the page are to be written. The  
bytes may be loaded in any order and may be altered within the same load period. Only bytes  
which are specified for writing will be written; unnecessary cycling of other bytes within the  
page does not occur.  
4.4  
DATA Polling  
The AT28HC256 features DATA Polling to indicate the end of a write cycle. During a byte or  
page write cycle an attempted read of the last byte written will result in the complement of the  
written data to be presented on I/O7. Once the write cycle has been completed, true data is  
valid on all outputs, and the next write cycle may begin. DATA Polling may begin at anytime  
during the write cycle.  
3
0007N–PEEPR–9/09  
4.5  
Toggle Bit  
In addition to DATA Polling the AT28HC256 provides another method for determining the end  
of a write cycle. During the write operation, successive attempts to read data from the device  
will result in I/O6 toggling between one and zero. Once the write has completed, I/O6 will stop  
toggling and valid data will be read. Testing the toggle bit may begin at any time during the  
write cycle.  
4.6  
Data Protection  
If precautions are not taken, inadvertent writes to any 5-volt-only nonvolatile memory may  
occur during transition of the host system power supply. Atmel® has incorporated both hard-  
ware and software features that will protect the memory against inadvertent writes.  
4.6.1  
Hardware Protection  
Hardware features protect against inadvertent writes to the AT28HC256 in the following ways:  
(a) VCC sense – if VCC is below 3.8V (typical) the write function is inhibited; (b) VCC power-on  
delay – once VCC has reached 3.8V the device will automatically time out 5 ms typical) before  
allowing a write; (c) write inhibit – holding any one of OE low, CE high or WE high inhibits write  
cycles; and (d) noise filter – pulses of less than 15 ns (typical) on the WE or CE inputs will not  
initiate a write cycle.  
4.6.2  
Software Data Protection  
A software controlled data protection feature has been implemented on the AT28HC256.  
When enabled, the software data protection (SDP), will prevent inadvertent writes. The SDP  
feature may be enabled or disabled by the user; the AT28HC256 is shipped from Atmel with  
SDP disabled.  
SDP is enabled by the host system issuing a series of three write commands; three specific  
bytes of data are written to three specific addresses (refer to “Software Data Protection” algo-  
rithm). After writing the 3-byte command sequence and after tWC the entire AT28HC256 will be  
protected against inadvertent write operations. It should be noted, that once protected the host  
may still perform a byte or page write to the AT28HC256. This is done by preceding the data to  
be written by the same 3-byte command sequence.  
Once set, SDP will remain active unless the disable command sequence is issued. Power  
transitions do not disable SDP and SDP will protect the AT28HC256 during power-up and  
power-down conditions. All command sequences must conform to the page write timing spec-  
ifications. It should also be noted that the data in the enable and disable command sequences  
is not written to the device and the memory addresses used in the sequence may be written  
with data in either a byte or page write operation.  
After setting SDP, any attempt to write to the device without the three byte command  
sequence will start the internal write timers. No data will be written to the device; however, for  
the duration of tWC, read operations will effectively be polling operations.  
4.7  
Device Identification  
An extra 64 bytes of EEPROM memory are available to the user for device identification. By  
raising A9 to 12V 0.5V and using address locations 7FC0H to 7FFFH the additional bytes  
may be written to or read from in the same manner as the regular memory array.  
4.8  
Optional Chip Erase Mode  
The entire device can be erased using a 6-byte software code. Please see “Software Chip  
Erase” application note for details.  
4
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
5. DC and AC Operating Range  
AT28HC256-70  
AT28HC256-90  
-40°C - 85°C  
-55°C - 125°C  
5V 10%  
AT28HC256-12  
-40°C - 85°C  
-55°C - 125°C  
5V 10%  
Ind.  
Mil.  
-40°C - 85°C  
Operating  
Temperature (Case)  
VCC Power Supply  
5V 10%  
6. Operating Modes  
Mode  
CE  
VIL  
VIL  
VIH  
X
OE  
VIL  
VIH  
X(1)  
X
WE  
VIH  
VIL  
X
I/O  
DOUT  
DIN  
Read  
Write(2)  
Standby/Write Inhibit  
Write Inhibit  
Write Inhibit  
Output Disable  
High Z  
VIH  
X
X
VIL  
VIH  
X
X
High Z  
High Z  
(3)  
Chip Erase  
VIL  
VH  
VIL  
Notes: 1. X can be VIL or VIH.  
2. Refer to AC programming waveforms.  
3. VH = 12.0V 0.5V.  
7. Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect  
device reliability  
Temperature under Bias ................................ -55°C to +125°C  
Storage Temperature..................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground...................................-0.6V to +6.25V  
All Output Voltages  
with Respect to Ground.............................-0.6V to VCC + 0.6V  
Voltage on OE and A9  
with Respect to Ground...................................-0.6V to +13.5V  
8. DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Max  
10  
Units  
µA  
µA  
mA  
mA  
µA  
mA  
V
ILI  
Input Load Current  
Output Leakage Current  
VIN = 0V to VCC + 1V  
VI/O = 0V to VCC  
ILO  
10  
AT28HC256-90, -12  
AT28HC256-70  
3
ISB1  
VCC Standby Current TTL  
CE = 2.0V to VCC  
60  
ISB2  
ICC  
VCC Standby Current CMOS  
VCC Active Current  
CE = VCC - 0.3V to VCC AT28HC256-90, -12  
f = 5 MHz; IOUT = 0 mA  
300  
80  
VIL  
Input Low Voltage  
0.8  
VIH  
VOL  
VOH  
Input High Voltage  
2.0  
2.4  
V
Output Low Voltage  
Output High Voltage  
IOL = 6.0 mA  
IOH = -4 mA  
0.45  
V
V
5
0007N–PEEPR–9/09  
 
 
 
9. AC Read Characteristics  
AT28HC256-70  
AT28C256-90  
AT28HC256-12  
Symbol  
tACC  
Parameter  
Address to Output Delay  
CE to Output Delay  
Min  
Max  
70  
Min  
Max  
90  
Min  
Max  
120  
120  
50  
Units  
ns  
(1)  
tCE  
tOE  
70  
90  
ns  
(2)  
OE to Output Delay  
0
0
35  
0
0
40  
0
0
ns  
(3)(4)  
tDF  
CE or OE to Output Float  
35  
40  
50  
ns  
Output Hold from OE, CE or Address,  
whichever occurred first  
tOH  
0
0
0
ns  
10. AC Read Waveforms(1)(2)(3)(4)  
Notes: 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC  
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change  
without impact on tACC  
.
.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).  
4. This parameter is characterized and is not 100% tested.  
6
AT28HC256  
0007N–PEEPR–9/09  
 
 
 
 
 
AT28HC256  
11. Input Test Waveforms and Measurement Level  
tR, tF < 5 ns  
12. Output Test Load  
13. Pin Capacitance  
f = 1 MHz, T = 25°C(1)  
Symbol  
CIN  
Typ  
4
Max  
6
Units  
pF  
Conditions  
VIN = 0V  
COUT  
8
12  
pF  
VOUT = 0V  
Note:  
1. This parameter is characterized and is not 100% tested.  
7
0007N–PEEPR–9/09  
 
14. AC Write Characteristics  
Symbol  
tAS, tOES  
tAH  
Parameter  
Min  
0
Max  
Units  
ns  
Address, OE Setup Time  
Address Hold Time  
Chip Select Setup Time  
Chip Select Hold Time  
Write Pulse Width (WE or CE)  
Data Setup Time  
50  
0
ns  
tCS  
ns  
tCH  
0
ns  
tWP  
100  
50  
0
ns  
tDS  
ns  
t
DH, tOEH  
Data, OE Hold Time  
ns  
tDV  
Time to Data Valid  
NR(1)  
Note:  
1. NR = No Restriction.  
15. AC Write Waveforms  
15.1 WE Controlled  
15.2 CE Controlled  
8
AT28HC256  
0007N–PEEPR–9/09  
 
AT28HC256  
16. Page Mode Write Characteristics  
Symbol  
Parameter  
Min  
Typ  
5
Max  
10  
3
Units  
ms  
ms  
ns  
AT28HC256  
tWC  
Write Cycle Time (option available)  
AT28HC256F  
2
tAS  
Address Setup Time  
Address Hold Time  
Data Setup Time  
0
50  
50  
0
tAH  
ns  
tDS  
ns  
tDH  
Data Hold Time  
ns  
tWP  
tBLC  
tWPH  
Write Pulse Width  
Byte Load Cycle Time  
Write Pulse Width High  
100  
ns  
150  
µs  
50  
ns  
17. Page Mode Write Waveforms(1)(2)  
Notes: 1. A6 through A14 must specify the same page address during each high to low transition of WE (or CE).  
2. OE must be high only when WE and CE are both low.  
18. Chip Erase Waveforms  
tS = tH = 5 µsec (min.)  
tW = 10 msec (min.)  
VH = 12.0V 0.5V  
9
0007N–PEEPR–9/09  
 
 
19. Software Data Protection  
Enable Algorithm(1)  
20. Software Data Protection  
Disable Algorithm(1)  
LOAD DATA AA  
TO  
LOAD DATA AA  
TO  
ADDRESS 5555  
ADDRESS 5555  
LOAD DATA 55  
TO  
LOAD DATA 55  
TO  
ADDRESS 2AAA  
ADDRESS 2AAA  
LOAD DATA A0  
TO  
LOAD DATA 80  
TO  
ADDRESS 5555  
ADDRESS 5555  
WRITES ENABLED(2)  
LOAD DATA XX  
TO  
ANY ADDRESS(4)  
LOAD DATA AA  
TO  
ADDRESS 5555  
LOAD LAST BYTE  
TO  
LOAD DATA 55  
TO  
LAST ADDRESS  
ENTER DATA  
ADDRESS 2AAA  
PROTECT STATE  
LOAD DATA 20  
TO  
Notes: 1. Data Format: I/O7 - I/O0 (Hex);  
Address Format: A14 - A0 (Hex).  
ADDRESS 5555  
EXIT DATA  
PROTECT STATE(3)  
2. Write Protect state will be activated at end of write  
even if no other data is loaded.  
LOAD DATA XX  
TO  
ANY ADDRESS(4)  
3. Write Protect state will be deactivated at end of write  
period even if no other data is loaded.  
4. 1 to 64 bytes of data are loaded.  
LOAD LAST BYTE  
TO  
LAST ADDRESS  
21. Software Protected Write Cycle Waveforms(1)(2)  
Notes: 1. A6 through A14 must specify the same page address during each high to low transition of WE (or CE) after the software  
code has been entered.  
2. OE must be high only when WE and CE are both low.  
10  
AT28HC256  
0007N–PEEPR–9/09  
 
 
 
AT28HC256  
22. Data Polling Characteristics(1)  
Symbol  
Parameter  
Min  
0
Typ  
Max  
Units  
ns  
tDH  
Data Hold Time  
tOEH  
tOE  
OE Hold Time  
0
ns  
OE to Output Delay(2)  
Write Recovery Time  
ns  
tWR  
0
ns  
Notes: 1. These parameters are characterized and not 100% tested.  
2. See “AC Read Characteristics” on page 6.  
23. Data Polling Waveforms  
24. Toggle Bit Characteristics(1)  
Symbol  
Parameter  
Min  
10  
Typ  
Max  
Units  
ns  
tDH  
Data Hold Time  
tOEH  
tOE  
tOEHP  
tWR  
OE Hold Time  
10  
ns  
OE to Output Delay(2)  
OE High Pulse  
ns  
150  
0
ns  
Write Recovery Time  
ns  
Notes: 1. These parameters are characterized and not 100% tested.  
2. See “AC Read Characteristics” on page 6.  
25. Toggle Bit Waveforms  
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.  
2. Beginning and ending state of I/O6 will vary.  
3. Any address location may be used but the address should not vary.  
11  
0007N–PEEPR–9/09  
 
 
 
 
26. Normalized ICC Graphs  
12  
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
27. Ordering Information  
27.1 Military Dual Marked Package  
27.1.1  
AT28HC256  
ICC (mA)  
tACC  
(ns)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
AT28HC256-90DM/883  
5962-88634 03 XX  
28D6  
AT28HC256-90FM/883  
5962-88634 03 ZX  
28F  
32L  
90  
80  
0.3  
AT28HC256-90LM/883  
5962-88634 03 YX  
AT28HC256-90UM/883  
5962-88634 03 UX  
28U  
28D6  
28F  
32L  
Military/883C  
Class B, Fully Compliant  
(-55° C to 125°C)  
AT28HC256-12DM/883  
5962-88634 01 XX  
AT28HC256-12FM/883  
5962-88634 01 ZX  
120  
80  
0.3  
AT28HC256-12LM/883  
5962-88634 01 YX  
AT28HC256-12UM/883  
5962-88634 01 UX  
28U  
Package Type  
28D6  
28-lead, 0.600" Wide, Non-windowed, Ceramic Dual Inline Package (Cerdip)  
28-lead, Non-windowed, Ceramic Bottom-brazed Flat Package (Flatpack)  
32-pad, Non-windowed, Ceramic Leadless Chip Carrier (LCC)  
28-pin, Ceramic Pin Grid Array (PGA)  
28F  
32L  
28U  
Options  
Blank  
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms  
High Endurance Option: Endurance = 100K Write Cycles  
Fast Write Option: Write Time = 3 ms  
E
F
13  
0007N–PEEPR–9/09  
27.1.2  
tACC  
AT28HC256E(1)  
I
CC (mA)  
Standby  
(ns)  
Active  
Ordering Code  
Package  
28D6  
28F  
Operation Range  
AT28HC256E-90DM/883  
AT28HC256E-90FM/883  
AT28HC256E-90LM/883  
AT28HC256E-90UM/883  
AT28HC256E-12DM/883  
AT28HC256E-12FM/883  
AT28HC256E-12LM/883  
AT28HC256E-12UM/883  
90  
80  
80  
0.3  
0.3  
32L  
Military/883C  
Class B, Fully Compliant  
(-55° C to 125°C)  
28U  
28D6  
28F  
120  
32L  
28U  
Note:  
1. No dual marking for this device.  
27.1.3  
tACC  
AT28HC256F  
I
CC (mA)  
Standby  
(ns)  
Active  
Ordering Code  
Package  
Operation Range  
AT28HC256F-90DM/883  
5962-88634 04 XX  
28D6  
AT28HC256F-90FM/883  
5962-88634 04 ZX  
28F  
32L  
90  
80  
0.3  
AT28HC256F-90LM/883  
5962-88634 04 YX  
AT28HC256F-90UM/883  
5962-88634 04 UX  
28U  
28D6  
28F  
32L  
Military/883C  
Class B, Fully Compliant  
(-55° C to 125°C)  
AT28HC256F-12DM/883  
5962-88634 02 XX  
AT28HC256F-12FM/883  
5962-88634 02 ZX  
120  
80  
0.3  
AT28HC256F-12LM/883  
5962-88634 02 YX  
AT28HC256F-12UM/883  
5962-88634 02 UX  
28U  
Package Type  
28D6  
28-lead, 0.600" Wide, Non-windowed, Ceramic Dual Inline Package (Cerdip)  
28-lead, Non-windowed, Ceramic Bottom-brazed Flat Package (Flatpack)  
32-pad, Non-windowed, Ceramic Leadless Chip Carrier (LCC)  
28-pin, Ceramic Pin Grid Array (PGA)  
28F  
32L  
28U  
Options  
Blank  
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms  
High Endurance Option: Endurance = 100K Write Cycles  
Fast Write Option: Write Time = 3 ms  
E
F
14  
AT28HC256  
0007N–PEEPR–9/09  
 
AT28HC256  
27.2 Industrial Green Package Option (Pb/Halide-free)  
27.2.1  
AT28HC256  
ICC (mA)  
tACC  
(ns)  
Active  
Standby  
Ordering Code  
Package  
32J  
Operation Range  
AT28HC256-70JU  
AT28HC256-70SU  
AT28HC256-70TU  
AT28HC256-90JU  
AT28HC256-90SU  
AT28HC256-90TU  
AT28HC256-12JU  
AT28HC256-12SU  
AT28HC256-12TU  
70  
80  
80  
0.3  
28S  
28T  
32J  
Industrial  
90  
0.3  
0.3  
28S  
28T  
(-40°C to 85°C)  
32J  
120  
80  
28S  
28T  
27.2.2  
AT28HC256E  
I
CC (mA)  
tACC  
(ns)  
Active  
Standby  
Ordering Code  
Package  
32J  
Operation Range  
AT28HC256E-90JU  
AT28HC256E-90SU  
AT28HC256E-90TU  
AT28HC256E-12JU  
AT28HC256E-12SU  
AT28HC256E-12TU  
90  
80  
0.3  
28S  
28T  
Industrial  
(-40°C to 85°C)  
32J  
120  
80  
0.3  
28S  
28T  
27.2.3  
AT28HC256F  
I
CC (mA)  
tACC  
(ns)  
Active  
Standby  
Ordering Code  
Package  
32J  
Operation Range  
AT28HC256F-90JU  
AT28HC256F-90SU  
AT28HC256F-90TU  
Industrial  
90  
80  
0.3  
28S  
(-40°C to 85°C)  
28T  
Package Type  
32J  
32-lead, Plastic J-leaded Chip Carrier (PLCC)  
28-lead, 0.300" Wide, Plastic Gull Wing Small Outline (SOIC)  
28-lead, Plastic Thin Small Outline Package (TSOP)  
Options  
28S  
28T  
Blank  
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms  
High Endurance Option: Endurance = 100K Write Cycles  
Fast Write Option: Write Time = 3 ms  
E
F
27.3 Ordering Information Note  
Previous datasheets included the low power suffixes L, LE and LF on the AT28HC256 for 120 ns and 90 ns speeds.  
The low power parameters are now standard; therefore, the L, LE and LF suffixes are no longer required.  
15  
0007N–PEEPR–9/09  
27.4 Die Products  
Contact Atmel Sales for die sales options.  
16  
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
28. Packaging Information  
28.1 28D6 – Cerdip  
Dimensions in Millimeters and (Inches).  
Controlling dimension: Inches.  
MIL-STD 1835 D-10 Config A (Glass Sealed)  
37.85(1.490)  
36.58(1.440)  
PIN  
1
15.49(0.610)  
12.95(0.510)  
33.02(1.300) REF  
5.72(0.225)  
MAX  
0.127(0.005)MIN  
SEATING  
PLANE  
1.52(0.060)  
0.38(0.015)  
0.66(0.026)  
0.36(0.014)  
5.08(0.200)  
3.18(0.125)  
1.65(0.065)  
1.14(0.045)  
2.54(0.100)BSC  
15.70(0.620)  
15.00(0.590)  
0º~ 15º REF  
0.46(0.018)  
0.20(0.008)  
17.80(0.700) MAX  
10/23/03  
TITLE  
DRAWING NO. REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
28D6, 28-lead, 0.600" Wide, Non-windowed,  
Ceramic Dual Inline Package (Cerdip)  
28D6  
B
R
17  
0007N–PEEPR–9/09  
28.2 28F – Flatpack  
Dimensions in Millimeters and (Inches).  
Controlling dimension: Inches.  
MIL-STD 1835 F-12 Config B  
9.40(0.370)  
6.35(0.250)  
PIN #1 ID  
0.56(0.022)  
0.38(0.015)  
1.27(0.050) BSC  
18.49(0.728)  
18.08(0.712)  
1.14(0.045) MAX  
10.57(0.416)  
9.75(0.384)  
0.23(0.009)  
0.10(0.004)  
3.02(0.119)  
2.29(0.090)  
1.96(0.077)  
1.09(0.043)  
1.14(0.045)  
7.26(0.286)  
6.96(0.274)  
0.660(0.026)  
10/21/03  
DRAWING NO. REV.  
28F  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
28F, 28-lead, Non-windowed, Ceramic Bottom-brazed  
Flat Package (FlatPack)  
B
R
18  
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
28.3 32J – PLCC  
1.14(0.045) X 45˚  
PIN NO. 1  
IDENTIFIER  
1.14(0.045) X 45˚  
0.318(0.0125)  
0.191(0.0075)  
E2  
E1  
E
B1  
B
e
A2  
A1  
D1  
D
A
0.51(0.020)MAX  
45˚ MAX (3X)  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
MIN  
3.175  
1.524  
0.381  
12.319  
11.354  
9.906  
14.859  
13.894  
12.471  
0.660  
0.330  
MAX  
3.556  
2.413  
NOM  
NOTE  
SYMBOL  
A
D2  
A1  
A2  
D
12.573  
D1  
D2  
E
11.506 Note 2  
10.922  
Notes:  
1. This package conforms to JEDEC reference MS-016, Variation AE.  
2. Dimensions D1 and E1 do not include mold protrusion.  
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1  
and E1 include mold mismatch and are measured at the extreme  
material condition at the upper or lower parting line.  
15.113  
E1  
E2  
B
14.046 Note 2  
13.487  
0.813  
3. Lead coplanarity is 0.004" (0.102 mm) maximum.  
B1  
e
0.533  
1.270 TYP  
10/04/01  
TITLE  
DRAWING NO.  
REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)  
32J  
B
R
19  
0007N–PEEPR–9/09  
28.4 32L – LCC  
Dimensions in Millimeters and (Inches).  
Controlling dimension: Inches.  
MIL-STD 1835 C-12  
11.63(0.458)  
11.23(0.442)  
2.54(0.100)  
2.16(0.085)  
14.22(0.560)  
13.72(0.540)  
1.91(0.075)  
1.40(0.055)  
PIN 1  
1.40(0.055)  
1.14(0.045)  
INDEX CORNER  
2.41(0.095)  
1.91(0.075)  
0.635(0.025)  
X 45˚  
0.381(0.015)  
0.305(0.012)  
0.178(0.007)  
RADIUS  
10.16(0.400) BSC  
0.737(0.029)  
0.533(0.021)  
1.27(0.050) TYP  
1.02(0.040) X 45˚  
2.16(0.085)  
1.65(0.065)  
7.62(0.300) BSC  
10/21/03  
TITLE  
DRAWING NO. REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
32L, 32-pad, Non-windowed, Ceramic Lid, Leadless Chip  
Carrier (LCC)  
32L  
B
R
20  
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
28.5 28S – SOIC  
Dimensions in Millimeters and (Inches).  
Controlling dimension: Millimeters.  
0.51(0.020)  
0.33(0.013)  
7.60(0.2992)  
7.40(0.2914)  
10.65(0.419)  
10.00(0.394)  
PIN 1  
1.27(0.50) BSC  
TOP VIEW  
18.10(0.7125)  
17.70(0.6969)  
2.65(0.1043)  
2.35(0.0926)  
0.30(0.0118)  
0.10(0.0040)  
SIDE VIEWS  
0.32(0.0125)  
0.23(0.0091)  
0º ~ 8º  
1.27(0.050)  
0.40(0.016)  
8/4/03  
TITLE  
DRAWING NO. REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
28S, 28-lead, 0.300" Body, Plastic Gull Wing Small Outline (SOIC)  
JEDEC Standard MS-013  
28S  
B
R
21  
0007N–PEEPR–9/09  
28.6 28T – TSOP  
PIN 1  
0º ~ 5º  
c
Pin 1 Identifier Area  
D1  
D
L
b
L1  
e
A2  
E
GAGE PLANE  
A
SEATING PLANE  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
A1  
MIN  
MAX  
1.20  
0.15  
1.05  
13.60  
NOM  
NOTE  
SYMBOL  
A
A1  
A2  
D
0.05  
0.90  
13.20  
11.70  
7.90  
0.50  
1.00  
Notes:  
1. This package conforms to JEDEC reference MO-183.  
2. Dimensions D1 and E do not include mold protrusion. Allowable  
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.  
3. Lead coplanarity is 0.10 mm maximum.  
13.40  
11.80  
8.00  
D1  
E
11.90 Note 2  
8.10  
0.70  
Note 2  
L
0.60  
L1  
b
0.25 BASIC  
0.22  
0.17  
0.10  
0.27  
0.21  
c
e
0.55 BASIC  
12/06/02  
DRAWING NO. REV.  
28T  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline  
Package, Type I (TSOP)  
C
R
22  
AT28HC256  
0007N–PEEPR–9/09  
AT28HC256  
28.7 28U – PGA  
Dimensions in Millimeters and (Inches).  
Controlling dimension: Inches.  
7.26(0.286)  
6.50(0.256)  
13.74(0.540)  
13.36(0.526)  
2.57(0.101)  
2.06(0.081)  
1.40(0.055)  
1.14(0.045)  
0.58(0.023)  
0.43(0.017)  
15.24(0.600)  
14.88(0.586)  
3.12(0.123)  
2.62(0.103)  
1.83(0.072)  
1.57(0.062)  
14.17(0.558)  
13.77(0.542)  
2.54(0.100) TYP  
16.71(0.658)  
16.31(0.642)  
12.70(0.500) TYP  
2.54(0.100) TYP  
10.41(0.410)  
9.91(0.390)  
10/21/03  
TITLE  
DRAWING NO. REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
28U, 28-pin, Ceramic Pin Grid Array (PGA)  
28U  
B
R
23  
0007N–PEEPR–9/09  
Headquarters  
International  
Atmel Corporation  
2325 Orchard Parkway  
San Jose, CA 95131  
USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 487-2600  
Atmel Asia  
Atmel Europe  
Le Krebs  
Atmel Japan  
9F, Tonetsu Shinkawa Bldg.  
1-24-8 Shinkawa  
Chuo-ku, Tokyo 104-0033  
Japan  
Tel: (81) 3-3523-3551  
Fax: (81) 3-3523-7581  
Unit 1-5 & 16, 19/F  
BEA Tower, Millennium City 5  
418 Kwun Tong Road  
Kwun Tong, Kowloon  
Hong Kong  
8, Rue Jean-Pierre Timbaud  
BP 309  
78054 Saint-Quentin-en-  
Yvelines Cedex  
France  
Tel: (852) 2245-6100  
Fax: (852) 2722-1369  
Tel: (33) 1-30-60-70-00  
Fax: (33) 1-30-60-71-11  
Product Contact  
Web Site  
Technical Support  
Sales Contact  
www.atmel.com  
p_eeprom@atmel.com  
www.atmel.com/contacts  
Literature Requests  
www.atmel.com/literature  
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any  
intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN ATMELS TERMS AND CONDI-  
TIONS OF SALE LOCATED ON ATMELS WEB SITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY  
WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR  
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and product descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided  
otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel’s products are not intended, authorized, or warranted for use  
as components in applications intended to support or sustain life.  
© 2009 Atmel Corporation. All rights reserved. Atmel®, logo and combinations thereof, and others are registered trademarks or trademarks of  
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0007N–PEEPR–9/09  

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